CN109375093A - 一种硬件电路安全性检测方法和装置 - Google Patents
一种硬件电路安全性检测方法和装置 Download PDFInfo
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- CN109375093A CN109375093A CN201811045809.0A CN201811045809A CN109375093A CN 109375093 A CN109375093 A CN 109375093A CN 201811045809 A CN201811045809 A CN 201811045809A CN 109375093 A CN109375093 A CN 109375093A
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- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000001514 detection method Methods 0.000 claims abstract description 32
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims abstract description 25
- 238000004458 analytical method Methods 0.000 claims abstract description 24
- 238000007405 data analysis Methods 0.000 claims description 7
- 230000000630 rising effect Effects 0.000 claims description 4
- 230000015654 memory Effects 0.000 description 10
- 238000013461 design Methods 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000009781 safety test method Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000012938 design process Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
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- General Engineering & Computer Science (AREA)
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- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
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CN201811045809.0A CN109375093B (zh) | 2018-09-07 | 2018-09-07 | 一种硬件电路安全性检测方法和装置 |
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CN201811045809.0A CN109375093B (zh) | 2018-09-07 | 2018-09-07 | 一种硬件电路安全性检测方法和装置 |
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CN109375093A true CN109375093A (zh) | 2019-02-22 |
CN109375093B CN109375093B (zh) | 2021-04-30 |
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4801870A (en) * | 1985-06-24 | 1989-01-31 | International Business Machines Corporation | Weighted random pattern testing apparatus and method |
CN1181683A (zh) * | 1996-10-31 | 1998-05-13 | 三星电子株式会社 | 用于测试数字视频设备成品状态下dspic的测试装置及方法 |
CN1454320A (zh) * | 2000-04-24 | 2003-11-05 | 陆放 | 集成电路实时检测的系统结构及其测试方法 |
CN101131409A (zh) * | 2006-08-22 | 2008-02-27 | 京元电子股份有限公司 | 集成电路测试系统及方法 |
CN101163977A (zh) * | 2005-03-18 | 2008-04-16 | 英沛科技公司 | 集成电路测试模块 |
CN101796630A (zh) * | 2007-09-10 | 2010-08-04 | 富士通株式会社 | 集成电路以及噪声测量方法 |
CN105116317A (zh) * | 2015-07-14 | 2015-12-02 | 工业和信息化部电子第五研究所 | 集成电路测试系统与方法 |
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2018
- 2018-09-07 CN CN201811045809.0A patent/CN109375093B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4801870A (en) * | 1985-06-24 | 1989-01-31 | International Business Machines Corporation | Weighted random pattern testing apparatus and method |
CN1181683A (zh) * | 1996-10-31 | 1998-05-13 | 三星电子株式会社 | 用于测试数字视频设备成品状态下dspic的测试装置及方法 |
CN1454320A (zh) * | 2000-04-24 | 2003-11-05 | 陆放 | 集成电路实时检测的系统结构及其测试方法 |
CN101163977A (zh) * | 2005-03-18 | 2008-04-16 | 英沛科技公司 | 集成电路测试模块 |
CN101131409A (zh) * | 2006-08-22 | 2008-02-27 | 京元电子股份有限公司 | 集成电路测试系统及方法 |
CN101796630A (zh) * | 2007-09-10 | 2010-08-04 | 富士通株式会社 | 集成电路以及噪声测量方法 |
CN105116317A (zh) * | 2015-07-14 | 2015-12-02 | 工业和信息化部电子第五研究所 | 集成电路测试系统与方法 |
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CN109375093B (zh) | 2021-04-30 |
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Address after: 100095 room 135, 1st floor, building 15, Chuangke Town, Wenquan Town, Haidian District, Beijing Applicant after: Beijing Zhongke Ruixin Technology Group Co.,Ltd. Address before: 1 wensong Road, Zhongguancun environmental protection park, Beiqing Road, Haidian District, Beijing 100095 Applicant before: SMARTCORE (BEIJING) Co.,Ltd. |
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Denomination of invention: A hardware circuit safety detection method and device Effective date of registration: 20210811 Granted publication date: 20210430 Pledgee: Zhongxin Suzhou Industrial Park Venture Capital Co.,Ltd. Pledgor: Beijing Zhongke Ruixin Technology Group Co.,Ltd. Registration number: Y2021990000709 |
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Effective date of registration: 20230717 Address after: 215125 11-303, creative industrial park, No. 328, Xinghu street, Suzhou Industrial Park, Suzhou City, Jiangsu Province Patentee after: Suzhou Ruixin integrated circuit technology Co.,Ltd. Address before: 100095 room 135, 1st floor, building 15, Chuangke Town, Wenquan Town, Haidian District, Beijing Patentee before: Beijing Zhongke Ruixin Technology Group Co.,Ltd. |
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