CN109358001B - Fixing device, measuring system and measuring method for bendable sample - Google Patents
Fixing device, measuring system and measuring method for bendable sample Download PDFInfo
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- CN109358001B CN109358001B CN201811251434.3A CN201811251434A CN109358001B CN 109358001 B CN109358001 B CN 109358001B CN 201811251434 A CN201811251434 A CN 201811251434A CN 109358001 B CN109358001 B CN 109358001B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
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Abstract
The application discloses a fixing device of a bendable sample based on a terahertz spectrometer, which comprises: the first clamp assembly and the second clamp assembly, wherein the first clamp assembly includes at least a first fixation clamp, the second clamp assembly includes at least a second fixation clamp, the first fixation clamp and the second fixation clamp are configured to: the first fixing clamp and the second fixing clamp move in the first horizontal direction to bend the sample to be tested. In addition, the application also discloses a measuring system comprising the terahertz time-domain spectrometer and the fixing device and a measuring method, wherein the measuring method adopts the measuring system to measure, and the measuring method comprises the following steps: clamping and fixing the sample to be measured by adopting a fixing device, and adjusting the bending degree of the sample to be measured according to the requirement; and a transmitting end of the terahertz time-domain spectrometer is adopted to transmit terahertz signals, and a receiving end of the terahertz time-domain spectrometer is adopted to receive the terahertz signals penetrating through the sample to be detected and analyze the terahertz signals.
Description
Technical Field
The application relates to the technical field of terahertz application, in particular to a device, a system and a method for measuring by utilizing terahertz time-domain spectroscopy.
Background
Terahertz (THz for short) spectroscopic technology is one of the most important application directions in THz technology, electromagnetic spectroscopic technology is an important tool for human to recognize the world, so that the observation capability of human to the world is expanded, the properties such as vibration and rotation of substance molecules can be known through spectroscopic technology, and the structural information of substances can also be known, and the THz technology has a great effect on human to recognize the microscopic world, so that the THz technology is considered as one of ten technologies for changing the future world.
Terahertz time-domain spectroscopy (THz-TDS) technology is a typical representation of terahertz spectroscopy technology, a very effective technique for detecting spectra. The signal-to-noise ratio of the time domain spectrum technology between 0.2 and 3THz is up to 80dB, and the measurement stability is good. Through THz-TDS technology, substances can be effectively characterized, and the method has an important role in identifying the substances. In addition, nondestructive testing can be realized by testing through the THz-TDS technology, the test sample does not need to contact the sample, the influence of other factors is avoided, and the sample is not damaged. The THz-TDS technology is used for testing the sample, so that the information such as the amplitude, the phase and the like of the material can be conveniently obtained, the information such as the absorptivity, the refractive index and the like can be further obtained through Fourier transformation, and the parameters have important roles in the characterization and the identification of the sample. In some conductors, THz radiation may reflect carrier information, and its transient characteristics may be tested. In addition, the THz-TDS technology has the characteristics of wide bandwidth, high sensitivity, high measurement speed and stable operation at normal temperature.
However, the THz-TDS test system in the prior art can only test the transmission spectrum or the reflection spectrum of a flat sample, and is difficult to test for a bendable sample, especially, some samples with adjustable bending rate, such as some carbon fiber films and micro-structure-based metamaterial samples, have some changes in internal structures when being bent, but the THz-TDS test system cannot test such samples.
Based on this, it is desirable to have a terahertz spectrometer based device that can be used to test bendable samples with optimal test results.
Disclosure of Invention
One of the purposes of the application is to provide a fixing device for a bendable sample based on a terahertz spectrometer, wherein the fixing device is used for fixing the sample to be tested through a first fixing clamp and a second fixing clamp, and the bending degree of the sample to be tested is changed through changing the clamping force of the first fixing clamp and the second fixing clamp. In addition, the fixing device can freely and conveniently adjust the relative position of the sample to be measured in space, so that time domain spectrum measurement on different positions of the sample to be measured is realized, the types of samples which can be measured by the terahertz time domain spectrometer are expanded, and the measurement flexibility is improved.
According to the above object, the present application proposes a fixing device for a bendable sample based on a terahertz spectrometer, comprising: a first clamp assembly and a second clamp assembly, wherein the first clamp assembly includes at least a first fixation clamp and the second clamp assembly includes at least a second fixation clamp, the first fixation clamp and the second fixation clamp being configured to: the first fixing clamp and the second fixing clamp can move in a first horizontal direction so as to bend the sample to be tested.
When the sample to be tested needs to be tested, the first end and the second end of the sample to be tested are clamped through the first fixing clamp and the second fixing clamp, so that the sample to be tested is fixed. Then, the sample to be measured is bent by the movement of the first and second fixing clips in the first horizontal direction, and the degree of bending of the sample to be measured is controlled by the displacement variation of the relative position between the first and second fixing clips. And finally, carrying out transmission spectrum measurement on the bendable sample to be measured on a terahertz time-domain spectrometer.
Further, in the fixing device for a bendable sample based on a terahertz spectrometer of the present application, the first fixing clip and/or the second fixing clip are configured to: being movable in a second horizontal direction and/or being movable in a vertical direction; the second horizontal direction is perpendicular to the first horizontal direction.
In the scheme, the first fixing clamp and the second fixing clamp can move in the first horizontal direction, the second horizontal direction and/or the vertical direction, so that the relative position change of the sample to be tested in any direction in the space is realized, the measurable range of the sample to be tested is greatly increased, and the limitation of the test range is favorably broken through.
Further, in the fixing device for the bendable sample based on the terahertz spectrometer, the first fixture assembly further comprises a first moving platform, and the first moving platform is arranged to be capable of moving in a first horizontal direction so as to drive the first fixing clamp to move in the first horizontal direction; the second clamp assembly further comprises a second moving platform which is arranged to be capable of moving in the first horizontal direction so as to drive the second fixing clamp to move in the first horizontal direction.
Further, in the fixing device for the bendable sample based on the terahertz spectrometer, the first clamp assembly further comprises a third moving platform, and the third moving platform is arranged to be capable of moving in the second horizontal direction so as to drive the first fixing clamp to move in the second horizontal direction; the second clamp assembly further comprises a fourth moving platform which is arranged to be capable of moving in a second horizontal direction so as to drive the second fixing clamp to move in the second horizontal direction; and/or
The first fixed end of the first fixing clamp is connected with a first fixing rod, and the first fixing rod is arranged on the first moving platform; the second fixed end of the second fixing clamp is connected with a second fixing rod, and the second fixing rod is arranged on the second moving platform.
Further, in the fixing device for the bendable sample based on the terahertz spectrometer, the first moving platform and/or the second moving platform are/is provided with a screw rod structure.
In the above scheme, the rotary motion of the screw rod structure is converted into the linear motion of the rod piece through the rotation of the screw rod structure, so that the first moving platform and/or the second moving platform are driven to move in the first horizontal direction. The moving distance can be accurately adjusted due to the screw rod structure.
Further, in the fixing device for the bendable sample based on the terahertz spectrometer, the third moving platform and/or the fourth moving platform are/is provided with a screw rod structure.
In the above scheme, the rotation of the screw rod structure converts the rotation motion of the screw rod structure into the linear motion of the rod piece, so that the third moving platform and/or the fourth moving platform are driven to move in the second horizontal direction. The moving distance can be accurately adjusted due to the screw rod structure.
Further, in the fixing device for the bendable sample based on the terahertz spectrometer, displacement scales are respectively arranged on the first clamp assembly and the second clamp assembly.
In order to obtain a more accurate test result and easily understand the bending degree of a sample to be tested, in the fixing device provided by the application, displacement scales are arranged on the first clamp assembly and the second clamp assembly so as to facilitate the understanding of the displacement distance change of the first fixing clamp and the second fixing clamp.
Further, in the fixing device for the bendable sample based on the terahertz spectrometer, the clamping end of the first fixing clamp is provided with a U-shaped groove for accommodating the first end of the sample to be measured, and/or the clamping end of the second fixing clamp is provided with a U-shaped groove for accommodating the second end of the sample to be measured.
Accordingly, another object of the present application is to provide a measurement system for a bendable sample based on a terahertz spectrometer, which can fix a sample to be measured by a fixing device, and change the bending degree of the sample to be measured by changing the clamping force of the fixing device, so as to increase the measurement range of the measurement system. In addition, the measuring system can freely and conveniently adjust the relative position of the sample to be measured in space, so that time domain spectrum measurement on different positions of the sample to be measured is realized, the types of samples which can be measured by the terahertz time domain spectrometer are expanded, and the measuring flexibility is improved.
According to the above object, the present application proposes a measurement system for a bendable sample based on a terahertz spectrometer, comprising a terahertz time-domain spectrometer and the above-mentioned fixing device.
In the measuring system, the sample to be measured is clamped and fixed through the fixing device, the sample to be measured is bent, then the transmission spectrum measurement is carried out on the bent sample to be measured through the terahertz time-domain spectrometer, and finally the implementation effect of measuring the bendable sample is achieved.
Further, it is another object of the present application to provide a method for measuring a bendable sample based on a terahertz spectrometer, by which a sample to be measured can be bent by a fixing device, and then transmission spectrum measurement is performed on the bent sample to be measured using the terahertz time-domain spectrometer.
According to the above object, the present application provides a method for measuring a bendable sample based on a terahertz spectrometer, which adopts the above measurement system for measurement, comprising the steps of:
clamping and fixing the sample to be tested by adopting the fixing device, and adjusting the bending degree of the sample to be tested according to the requirement;
and a transmitting end of the terahertz time-domain spectrometer is adopted to transmit terahertz signals, and a receiving end of the terahertz time-domain spectrometer is adopted to receive the terahertz signals penetrating through the sample to be detected and analyze the terahertz signals.
Compared with the prior art, the fixing device for the bendable sample based on the terahertz spectrometer has the following advantages and beneficial effects:
(1) The fixing device overcomes the defects of the prior art, can test the bendable sample to be tested, and can freely and conveniently adjust the relative position of the sample to be tested in the space, thereby controlling the bending degree of the sample and greatly increasing the measurable range of the sample to be tested.
(2) The fixing device disclosed by the application greatly breaks through the limitation that the bendable sample is difficult to test on the terahertz time-domain spectrometer, provides a spectrum-dependent measuring device and method for measuring the spectrum of the bendable sample, and has important significance for the development of terahertz spectrum technology.
In addition, the measuring system for the bendable sample based on the terahertz spectrometer has the advantages and beneficial effects that the sample to be measured is fixedly clamped through the fixing device.
In addition, the measuring method of the bendable sample based on the terahertz spectrometer adopts the measuring system to measure, so the measuring method also has the advantages and beneficial effects.
Drawings
Fig. 1 is a schematic structural diagram of a measurement system for a bendable sample based on a terahertz spectrometer according to the present application in one embodiment.
Fig. 2 schematically shows time signal curves of a sample to be measured in different states, obtained when the measurement system for a bendable sample based on a terahertz spectrometer according to the present application is tested in one embodiment.
Fig. 3 schematically shows frequency domain signal curves of a sample to be measured in different states, which are obtained when the measurement system for a bendable sample based on a terahertz spectrometer according to the present application is tested in one embodiment.
Detailed Description
The fixing device, the measuring system and the measuring method for the bendable sample based on the terahertz spectrometer according to the present application will be further described below according to specific embodiments of the present application and accompanying drawings, but the description is not meant to unduly limit the present application.
Fig. 1 is a schematic structural diagram of a measurement system for a bendable sample based on a terahertz spectrometer according to the present application in one embodiment.
As shown in fig. 1, in this embodiment, a terahertz-spectrometer-based measurement system 1 for a bendable sample includes a terahertz time-domain spectrometer and a fixture. The terahertz time-domain spectrometer may employ a TERAK15 of MenloSystems company, which may include a femtosecond laser 31, a transmitting antenna 32, a first terahertz lens 33, a second terahertz lens 34, a third terahertz lens 35, a fourth terahertz lens 36, a receiving antenna 37, and a processor 38. It should be noted that, the terahertz time-domain spectrometer is a device known in the art, and a specific structure thereof is known to those skilled in the art, so that a detailed description thereof is omitted herein.
With further reference to fig. 1, it can be seen that the securing means comprises a first clamp assembly 21 and a second clamp assembly 22.
The first fixture assembly 21 includes a first fixing clamp 211, a first U-shaped groove 2110 for accommodating a first end of the sample 4 to be tested may be provided at a clamping end of the first fixing clamp 211, and the first fixing clamp 211 is connected to a first fixing rod 212 at the other end of the non-clamping end, the first fixing rod 212 is disposed on a first moving platform 213, and a third moving platform 214 is disposed below the first moving platform 213 in a vertical direction.
In the present embodiment, the first fixing clip 211 may adjust a spatial relative position of the first fixing clip 211 in the vertical direction by movement of the first fixing lever 212 in the vertical direction, and fix the adjusted position thereof by a first lock nut 215 provided on the third moving platform 214.
Of course, in some other embodiments, the spatial relative position of the first fixing clip 211 in the vertical direction may also be adjusted by adjusting the distance between the first moving platform 213 and the third moving platform 214 in the vertical direction.
In addition, the first fixing clip 211 adjusts its movement in the first horizontal direction and the second horizontal direction by the first screw 2130 on the first moving platform 213 and the third screw 2140 on the third moving platform 214, respectively. The second horizontal direction is perpendicular to the first horizontal direction.
Accordingly, the second clamp assembly 22 includes a second fixing clip 221, a second U-shaped groove 2210 for receiving the second end of the sample 4 to be measured may be provided at the clamping end of the second fixing clip 221, and the second fixing rod 222 is connected to the second fixing clip 221 at the other end of the non-clamping end, the second fixing rod 222 is disposed on the second moving platform 223, and the fourth moving platform 224 is disposed below the second moving platform 223 in the vertical direction.
In the present embodiment, the second fixing clip 221 may adjust a spatial relative position of the second fixing clip 221 in the vertical direction by movement of the second fixing lever 222 in the vertical direction, and fix the adjusted position thereof by the second lock nut 225 provided on the fourth moving platform 224.
Of course, in some other embodiments, the spatial relative position of the second fixing clip 221 in the vertical direction may also be adjusted by adjusting the distance between the second moving platform 223 and the fourth moving platform 224 in the vertical direction.
In addition, the second fixing clip 221 adjusts its movement in the first horizontal direction and the second horizontal direction by the second screw rod 2230 on the second moving platform 223 and the fourth screw rod 2240 on the fourth moving platform 224, respectively.
In order to make it easier to understand the moving distance of the first fixing clip 211 and the second fixing clip 221 and thereby obtain the bending degree of the sample 4 to be measured, displacement scales may be provided on the first fixing clip 211 and the second fixing clip 221, respectively.
In this embodiment, the sample 4 to be measured is a metamaterial based on a microstructure, the shape of the metamaterial is a square of 2cm×2cm, the thickness of the metamaterial is 200 μm, and the metamaterial structure is a metal microstructure with the thickness of 200 nm. Of course, the person skilled in the art may select the sample to be tested according to the specific circumstances of the embodiment, and is not particularly limited herein.
During testing, the sample 4 to be tested is clamped and fixed through the fixing device of the measuring system 1, and the bending degree of the sample 4 to be tested is adjusted according to the requirement, wherein the bending degree can be between 50 and 60 degrees. Adjusting the bending of the sample 4 to be measured can adjust the spatial position of the sample 4 to be measured in the vertical direction through the first fixing rod 212 and the second fixing rod 222. In addition, in some embodiments, the spatial position of the sample 4 to be measured in the first horizontal direction may be adjusted by the first moving platform 213 and the second moving platform 223, and/or the spatial position of the sample 4 to be measured in the second horizontal direction may be adjusted by the third moving platform 214 and the fourth moving platform 224.
The terahertz signal is transmitted by the transmitting antenna 32 of the terahertz time-domain spectrometer, and the terahertz signal penetrating the sample 4 to be measured is received by the receiving antenna 37 of the terahertz time-domain spectrometer and analyzed.
The analysis results are shown in fig. 2 and 3.
Fig. 2 schematically shows time signal curves of a sample to be measured in different states, obtained when the measurement system for a bendable sample based on a terahertz spectrometer according to the present application is tested in one embodiment.
As shown in fig. 2, a curve I represents the terahertz time signal of the sample 4 to be measured in an unbent state, and a curve II represents the terahertz time signal of the sample to be measured in a bent state.
Fig. 3 schematically shows frequency domain signal curves of a sample to be measured in different states, which are obtained when the measurement system for a bendable sample based on a terahertz spectrometer according to the present application is tested in one embodiment.
As shown in fig. 3, a curve III represents the terahertz frequency-domain signal of the sample 4 to be measured in an unbent state, and a curve IV represents the terahertz frequency-domain signal of the sample to be measured in a bent state.
As can be seen from fig. 2 and 3, the sample 4 to be measured is obviously changed in the unbent state and the bent state, which means that the internal molecular structure is changed, and the measurement system 1 in the embodiment can measure the terahertz spectrum signal of the sample 4 to be measured, which is bent, and can measure the samples to be measured with different bending rates, so that the measurement range of the terahertz time-domain spectroscopy technology on the measurement substance is greatly increased.
It should be noted that the prior art part in the protection scope of the present application is not limited to the embodiments given in the present document, and all prior art that does not contradict the scheme of the present application, including but not limited to the prior patent document, the prior publication, the prior disclosure, the use, etc., can be included in the protection scope of the present application.
In addition, the combination of the features described in the present application is not limited to the combination described in the claims or the combination described in the embodiments, and all the features described in the present application may be freely combined or combined in any manner unless contradiction occurs between them.
It should also be noted that the above-recited embodiments are merely specific examples of the present application. It is apparent that the present application is not limited to the above embodiments, and similar changes or modifications will be apparent to those skilled in the art from the present disclosure, and it is intended to be within the scope of the present application.
Claims (10)
1. A device for fixing a bendable sample based on a terahertz spectrometer, the device comprising: a first clamp assembly and a second clamp assembly, wherein the first clamp assembly includes at least a first fixation clamp and the second clamp assembly includes at least a second fixation clamp, the first fixation clamp and the second fixation clamp being configured to: the first fixing clamp and the second fixing clamp can move in a first horizontal direction so as to bend the sample to be tested.
2. The terahertz-spectrometer-based bendable sample fixing apparatus according to claim 1, wherein the first fixing clip and/or the second fixing clip is provided as: being movable in a second horizontal direction and/or being movable in a vertical direction; the second horizontal direction is perpendicular to the first horizontal direction.
3. The terahertz-spectrometer-based bendable sample fixing apparatus according to claim 1, wherein: the first clamp assembly further comprises a first moving platform, wherein the first moving platform is arranged to be capable of moving in a first horizontal direction so as to drive the first fixing clamp to move in the first horizontal direction; the second clamp assembly further comprises a second moving platform which is arranged to be capable of moving in the first horizontal direction so as to drive the second fixing clamp to move in the first horizontal direction.
4. The terahertz-spectrometer-based bendable sample fixing apparatus according to claim 2, wherein:
the first clamp assembly further comprises a third moving platform which is arranged to be capable of moving in a second horizontal direction so as to drive the first fixing clamp to move in the second horizontal direction; the second clamp assembly further comprises a fourth moving platform which is arranged to be capable of moving in a second horizontal direction so as to drive the second fixing clamp to move in the second horizontal direction; and/or
The first fixed end of the first fixing clamp is connected with a first fixing rod, and the first fixing rod is arranged on the first moving platform; the second fixed end of the second fixing clamp is connected with a second fixing rod, and the second fixing rod is arranged on the second moving platform.
5. The terahertz-spectrometer-based bendable sample fixing apparatus according to claim 3, wherein the first moving platform and/or the second moving platform is provided with a screw rod structure.
6. The terahertz-spectrometer-based bendable sample fixing apparatus according to claim 4, wherein the third moving platform and/or the fourth moving platform is provided with a screw structure.
7. The terahertz-spectrometer-based bendable sample fixing apparatus according to claim 1, wherein displacement scales are provided on the first clamp assembly and the second clamp assembly, respectively.
8. The fixing device for a bendable sample based on a terahertz spectrometer according to claim 1, wherein the clamping end of the first fixing clip is provided with a U-shaped groove for accommodating a first end of a sample to be measured, and/or the clamping end of the second fixing clip is provided with a U-shaped groove for accommodating a second end of the sample to be measured.
9. A terahertz spectrometer based measurement system for a bendable sample comprising a terahertz time-domain spectrometer and a fixture as claimed in any one of claims 1-8.
10. A method of measuring a bendable sample based on a terahertz spectrometer using the measurement system of claim 9, comprising the steps of:
clamping and fixing the sample to be tested by adopting the fixing device, and adjusting the bending degree of the sample to be tested according to the requirement;
and a transmitting end of the terahertz time-domain spectrometer is adopted to transmit terahertz signals, and a receiving end of the terahertz time-domain spectrometer is adopted to receive the terahertz signals penetrating through the sample to be detected and analyze the terahertz signals.
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| CN201811251434.3A CN109358001B (en) | 2018-10-25 | 2018-10-25 | Fixing device, measuring system and measuring method for bendable sample |
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| CN201811251434.3A CN109358001B (en) | 2018-10-25 | 2018-10-25 | Fixing device, measuring system and measuring method for bendable sample |
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| CN109358001B true CN109358001B (en) | 2023-09-08 |
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| CN109358001A (en) | 2019-02-19 |
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