CN109342982B - Accelerated life test method for digital multimeter - Google Patents
Accelerated life test method for digital multimeter Download PDFInfo
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- CN109342982B CN109342982B CN201810744759.9A CN201810744759A CN109342982B CN 109342982 B CN109342982 B CN 109342982B CN 201810744759 A CN201810744759 A CN 201810744759A CN 109342982 B CN109342982 B CN 109342982B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
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Abstract
The invention provides an accelerated life test method for a digital multimeter, which comprises the following steps: the digital multimeter was subjected to a salt spray test and a wet heat test in this order. The salt spray test is firstly carried out on the digital multimeter, then the damp-heat test is carried out on the digital multimeter, and the service life loss of the digital multimeter is accelerated by adopting a method combining the salt spray test and the damp-heat test.
Description
Technical Field
The invention relates to the technical field of digital multimeters, in particular to an accelerated life test method for a digital multimeter.
Background
Digital multimeters are electronic instruments used in electrical measurements and have many special functions, but the main function is to measure voltage, resistance and current. The digital multi-purpose meter is also called a comprehensive watt-hour meter, has multiple purposes, and can measure parameters of each phase voltage, current, active power, reactive power, frequency, electric energy and the like of three phases at one time.
At present, the digital multimeter is generally tested by referring to the current test methods such as GB/T11463-89 reliability test of electronic measuring instruments, GB/T2423-2008 environmental test of electrical and electronic products, and the like, and the methods can only evaluate the functional characteristics of the digital multimeter under the specified environmental conditions. The prior art does not show any relevant technical content about the service life of the digital multimeter. At present, no relevant report on how to accelerate the life loss of the digital multimeter exists.
Disclosure of Invention
In view of the above, an object of the present invention is to provide an accelerated life test method for a digital multimeter, which has a higher rate of accelerating life loss of the digital multimeter, and a good match with the actual life loss of the digital multimeter, and can provide a certain basis for life expectancy or evaluation of the digital multimeter.
An accelerated life test method for a digital multimeter comprises the following steps:
the digital multimeter was subjected to a salt spray test and a wet heat test in this order.
In the present invention, the time of the salt spray test is preferably 1 to 3 hours, more preferably 1.5 to 2.5 hours, and most preferably 2 hours. A large amount of condensation phenomenon can occur in the salt spray test, the salt spray test is not consistent with the actual use/storage environment, in order to reflect the function of the salt spray, the salt spray test is carried out for about 2 hours in the initial stage of the test, salt spray particles are attached to each part of the digital multimeter, and the salt spray particles are naturally dried and then carried out with the subsequent damp-heat test. Under the action of high humidity in a damp-heat test, salt mist particles attached to the digital multimeter continuously act on the digital multimeter, so that the influence of salt mist is simulated in the test process, the digital multimeter cannot be directly damaged, and the aim of consistent with the actual storage effect can be fulfilled.
In the present invention, the reagent of the salt spray test is preferably a NaCl solution, more preferably an aqueous NaCl solution; the mass concentration of the reagent is preferably 4.5-5.5%, more preferably 4.8-5.2%, and most preferably 5%.
In the invention, the temperature of the salt spray test is preferably 33-37 ℃, more preferably 34-36 ℃, and most preferably 35 ℃.
In the invention, the salt spray sedimentation rate in the salt spray test process is preferably 1-2 mL/80cm2H, more preferably 1.2 to 1.8mL/80cm2H, most preferably 1.4 to 1.6mL/80cm2·h。
In the present invention, the salt spray condition for accelerated experiments was set based on the maximum salt spray condition encountered in the actual use/storage process of the digital multimeter.
The equipment of the salt spray test is not particularly limited by the invention, and the salt spray test box known to those skilled in the art can be adopted.
In the present invention, the digital multimeter is preferably placed in a standard environment to test its initial measurement accuracy prior to subjecting the digital multimeter to the salt spray test.
In the invention, the temperature of the standard environment is preferably 15-25 ℃, more preferably 18-22 ℃, and most preferably 20 ℃; the humidity of the standard environment is preferably 45-55%, more preferably 48-52%, and most preferably 50%; the humidity is relative humidity. In the invention, the time of the standing in the standard environment is preferably 1.5-2.5 hours, more preferably 1.8-2.2 hours, and most preferably 2 hours.
The method for detecting the measurement accuracy is not particularly limited, and the measurement accuracy can be detected according to the standard DL/T980 and 2205 digital multimeter verification procedure which is well known to those skilled in the art.
The inventor finds that the measurement accuracy of the digital multimeter degrades along with time, and through the grey correlation theory analysis of the observation data, the degradation trend of the measurement accuracy of the digital multimeter is influenced most by temperature, the relative humidity is second, and the influence of salt spray is smallest, so that the temperature condition is improved as much as possible in the acceleration experiment process to improve the acceleration.
In the present invention, the damp-heat test is a comprehensive test of temperature and humidity. In the invention, the temperature of the damp-heat test is preferably 58-72 ℃, more preferably 60-70 ℃, more preferably 62-68 ℃ and most preferably 64-66 ℃. The inventor finds that when the temperature is higher than 80 ℃, the function of the digital multimeter is damaged and is inconsistent with the actual situation, so that the temperature for accelerating the experiment is determined to be about 70 ℃.
The inventor finds that the temperature condition of the digital multimeter in the use/storage process changes in a cosine function rule with a period of one year, and the invention integrally increases the temperature to the maximum value of 70 ℃ and simplifies the temperature by sections on the basis of the temperature condition of one year in actual use/storage.
In the invention, the temperature change rule in the damp and hot test process is preferably a cosine function on an interval of [ -pi/2, pi/2 ]. In the present invention, it is preferable that the damp-heat test is divided into a plurality of stages having different temperatures in the time of the damp-heat test, and a curve having the time of the damp-heat test as an abscissa and the temperature of the damp-heat test as an ordinate is made to approximate a change law of a cosine function in an interval of [ -pi/2, pi/2 ]. In the present invention, the temperature of the damp-heat test is preferably gradually increased, then kept stable, and finally gradually decreased as the damp-heat test time is prolonged.
In the invention, the temperature of the damp-heat test of two adjacent stages is preferably increased or decreased by 3-7 ℃, more preferably 4-6 ℃ and most preferably 5 ℃. In the present invention, the temperature of the damp-heat test in the first and last stages is preferably 58 to 62 ℃, more preferably 59 to 61 ℃, and most preferably 60 ℃. In the invention, the temperature for keeping the temperature stable in the damp-heat test process is preferably 68-72 ℃, more preferably 69-71 ℃ and most preferably 70 ℃.
The inventor obtains a service life evaluation model of the digital multimeter through a great deal of research; in the invention, the time of the damp-heat test is calculated by a life evaluation model formula of a digital multimeter:
wherein, X (t) is the measurement precision of the digital multimeter;
x (0) is the initial measurement precision of the digital multimeter;
t is the test time of the accelerated experiment;
b0a parameter for controlling a time variable, 1E-6;
b1a parameter for controlling humidity variation, 6E-4;
b2a parameter for controlling a temperature variable, 3E-8;
b36E-5 is a parameter for controlling the salt spray variable;
w1(t) accelerated test relative humidity;
w2(t) is the accelerated test temperature (kelvin temperature);
w3(t) salt spray (settling amount of chloride ion, mg/100 cm) for accelerated experiment2·h)。
According to the formula, the 64-day accelerated test is equivalent to the life consumption effect of one year of practical use/storage of the digital multimeter.
In the invention, the total time of the damp-heat test is preferably 60 to 70 days, more preferably 62 to 68 days, and most preferably 64 to 66 days. In the invention, the damp-heat test is preferably divided into 6 to 10 stages, more preferably 7 to 9 stages, and most preferably 8 stages; the test time of each stage is preferably 6 to 10 days, more preferably 7 to 9 days, and most preferably 8 days.
The present invention preferably performs the damp-heat test of the first stage and the damp-heat test of the second stage continuously until the damp-heat test of the last stage is completed. In the present invention, it is most preferable to conduct 8 stages of the damp-heat test continuously, each stage being conducted for 8 days, for a total of 64 days.
In the invention, the temperature of the damp-heat test in the first stage is preferably 58-62 ℃, more preferably 59-61 ℃, and most preferably 60 ℃; the temperature of the damp-heat test in the second stage is preferably 63-67 ℃, more preferably 64-66 ℃, and most preferably 65 ℃; the temperature of the damp-heat test from the third stage to the sixth stage is preferably 68-72 ℃, more preferably 69-71 ℃, and most preferably 70 ℃; the temperature of the damp-heat test in the seventh stage is preferably 63-67 ℃, more preferably 64-66 ℃, and most preferably 65 ℃; the temperature of the damp-heat test in the eighth stage is preferably 58-62 ℃, more preferably 59-61 ℃, and most preferably 60 ℃.
In the invention, the heating or cooling rate in the damp-heat test process is preferably less than 1 ℃/min, more preferably 0.1-0.9 ℃/min, more preferably 0.3-0.7 ℃/min, and most preferably 0.4-0.5 ℃/min.
In the invention, the measurement precision of the digital multimeter is preferably tested after the damp-heat test of each stage is finished, and the test method of the measurement precision is consistent with the technical scheme, and is not repeated herein.
In the invention, the humidity (relative humidity) in the damp-heat test process is preferably 80-90%, more preferably 82-88%, and most preferably 84-86%.
In the present invention, the relative humidity condition for accelerating the experiment is set based on the maximum humidity (relative humidity) encountered during actual use/storage in the digital multimeter.
The equipment for the damp-heat test is not particularly limited by the present invention, and a damp-heat test chamber well known to those skilled in the art can be used.
In an embodiment of the present invention, a flow of a method for accelerating the lifetime consumption of a digital multimeter is preferably shown in fig. 1, and includes:
firstly, performing a salt spray test for 2 hours, wherein the salt spray is a NaCl aqueous solution with the mass concentration of 5 +/-0.5%; the damp heat test was then carried out for 64 additional days with a relative humidity of 85 + -5% during the damp heat test and the digital multimeter samples were examined and observed at 8 day intervals.
The key point of the invention is that the salt spray test is firstly carried out, then the damp-heat test is carried out, and the test method combines the salt spray test and the damp-heat test, and the invention sets specific test conditions in the damp-heat test process, so that the invention achieves the acceleration of the effect of equivalent to the life loss effect of actual use/storage for one year of 64-day acceleration test of a digital multimeter. The integral combination test mode provided by the invention can quickly and really simulate the service life of the digital multimeter.
The acceleration multiplying factor of the accelerated life test method for the digital multimeter provided by the invention is about 5.7, namely the time for performing accelerated test on the digital multimeter according to the method provided by the invention is equivalent to one year of actual use/storage of the digital multimeter.
The method provided by the invention can accurately evaluate the service life/storage life of the digital multimeter, is used for testing the service life of the digital multimeter by aiming at a special accelerated experiment method of the digital multimeter, and can carry out an examination test on the digital multimeter in the development or design acceptance process, so as to verify or evaluate the service life of the digital multimeter.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a flowchart of an accelerated life test method for a digital multimeter according to an embodiment of the present invention;
FIG. 2 is a graph showing the humidity and temperature conditions during the accelerated test conducted in example 1 of the present invention;
fig. 3 is detection data of the measurement accuracy of the digital multimeter obtained by the test in the accelerated experiment process in embodiment 1 of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The raw materials used in the following examples of the present invention are all commercially available products, and the adopted digital multimeter is Fluke product.
Example 1
The digital multimeter was placed in an environment of 20 ℃ and a relative humidity of 50% for 2 hours, and the initial measurement accuracy was measured (DL/T980-.
And then carrying out a salt spray test on the digital multimeter, placing the digital multimeter in a NaCl aqueous solution with the mass concentration of 5% for 2 hours at 35 ℃, then placing the digital multimeter in a standard environment with the temperature of 20 ℃ and the relative humidity of 50% for 24 hours, drying the moisture received by the digital multimeter in the process of the salt spray test, and then detecting the measurement accuracy of the digital multimeter.
The damp-heat test is carried out on the digital multimeter after the salt spray test, and the conditions and the method of the damp-heat test are shown in fig. 2 and table 1, and specifically comprise the following steps:
table 1 conditions and methods of damp heat test of example 1 of the invention
In the first stage of damp-heat test, the test time is 8 days, the temperature is 60 ℃, the relative humidity is 85 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the second stage damp-heat experiment, wherein the test time is 8 days, the temperature is 65 ℃, the relative humidity is 85%, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the third stage, wherein the test time is 8 days, the temperature is 70 ℃, the relative humidity is 85 percent, and the measurement precision of the digital multimeter is detected; continuing to perform a fourth-stage damp-heat test for 8 days at 70 ℃ and 85% relative humidity, and detecting the measurement precision of the digital multimeter; continuing to perform the damp-heat test of the fifth stage, wherein the test time is 8 days, the temperature is 70 ℃, the relative humidity is 85 percent, and the measurement precision of the digital multimeter is detected; continuing to perform a wet-heat test of the sixth stage, wherein the test time is 8 days, the temperature is 70 ℃, the relative humidity is 85 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the seventh stage, wherein the test time is 8 days, the temperature is 65 ℃, the relative humidity is 85 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the eighth stage, wherein the test time is 8 days, the temperature is 60 ℃, the relative humidity is 85 percent, and the measurement precision of the digital multimeter is detected; the temperature change rate is less than 1 ℃/min when the temperature is increased or decreased in the damp-heat test process.
The test is stopped after 64 days, the measurement precision test data of the digital multimeter detected in the test process is analyzed, the comparison of the test data obtained in 64 days provided by the embodiment 1 of the invention and the actual use/storage result of the digital multimeter is shown in fig. 3, as can be seen from fig. 3, at the characteristic time point, the measurement precision detected by the accelerated test has better correspondence to the measurement precision of the actual life loss, the accelerated test provided by the invention has good coincidence with the actual life loss of the digital multimeter, and the effect of the method provided by the invention for carrying out the test in 64 days is close to the actual use/storage effect of the digital multimeter in one year.
Example 2
The digital multimeter was placed in an environment of 20 ℃ and a relative humidity of 50% for 2 hours, and the initial measurement accuracy was measured (DL/T980-.
And then carrying out a salt spray test on the digital multimeter, placing the digital multimeter in a NaCl aqueous solution with the mass concentration of 4.5% for 1.5 hours at the temperature of 33 ℃, then placing the digital multimeter in a standard environment with the temperature of 20 ℃ and the relative humidity of 50% for 24 hours, drying the moisture received by the digital multimeter in the process of the salt spray test, and then detecting the measurement accuracy of the digital multimeter.
Carrying out a damp-heat test on the digital multimeter after the salt spray test, wherein the conditions and the method of the damp-heat test are as follows:
in the first stage of damp-heat test, the test time is 8 days, the temperature is 58 ℃, the relative humidity is 80 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the second stage damp-heat experiment, wherein the test time is 8 days, the temperature is 63 ℃, the relative humidity is 80%, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the third stage, wherein the test time is 8 days, the temperature is 68 ℃, the relative humidity is 80%, and the measurement precision of the digital multimeter is detected; continuing to perform a fourth-stage damp-heat test for 8 days at 68 ℃ and 80% relative humidity, and detecting the measurement precision of the digital multimeter; continuing to perform the damp-heat test of the fifth stage, wherein the test time is 8 days, the temperature is 68 ℃, the relative humidity is 80 percent, and the measurement precision of the digital multimeter is detected; continuing to perform a wet-heat test of the sixth stage, wherein the test time is 8 days, the temperature is 68 ℃, the relative humidity is 80%, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the seventh stage, wherein the test time is 8 days, the temperature is 63 ℃, the relative humidity is 80 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the eighth stage, wherein the test time is 8 days, the temperature is 58 ℃, the relative humidity is 80 percent, and the measurement precision of the digital multimeter is detected; the temperature change rate is less than 1 ℃/min when the temperature is increased or decreased in the damp-heat test process.
The test is stopped after 64 days, and the measurement precision test data of the digital multimeter detected in the test process is analyzed, so that the effect of the test for 64 days by the method is close to the effect of one year of actual use/storage of the digital multimeter, and the service life loss of the test is good in conformity with the actual service life loss of the digital multimeter.
Example 3
The digital multimeter was placed in an environment of 20 ℃ and a relative humidity of 50% for 2 hours, and the initial measurement accuracy was measured (DL/T980-.
And then carrying out a salt spray test on the digital multimeter, placing the digital multimeter in a NaCl aqueous solution with the mass concentration of 5.5% for 2 hours at 37 ℃, then placing the digital multimeter in a standard environment with the temperature of 20 ℃ and the relative humidity of 50% for 24 hours, drying the moisture received by the digital multimeter in the process of the salt spray test, and then detecting the measurement accuracy of the digital multimeter.
Carrying out a damp-heat test on the digital multimeter after the salt spray test, wherein the conditions and the method of the damp-heat test are as follows:
in the first stage of damp-heat test, the test time is 8 days, the temperature is 62 ℃, the relative humidity is 90 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the second stage damp-heat experiment, wherein the test time is 8 days, the temperature is 67 ℃, the relative humidity is 90%, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the third stage, wherein the test time is 8 days, the temperature is 72 ℃, the relative humidity is 90 percent, and the measurement precision of the digital multimeter is detected; continuing to perform a fourth-stage damp-heat test for 8 days at 72 ℃ and 90% relative humidity, and detecting the measurement precision of the digital multimeter; continuing to perform the damp-heat test of the fifth stage, wherein the test time is 8 days, the temperature is 72 ℃, the relative humidity is 90 percent, and the measurement precision of the digital multimeter is detected; continuing to perform a wet-heat test of the sixth stage, wherein the test time is 8 days, the temperature is 72 ℃, the relative humidity is 90 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the seventh stage, wherein the test time is 8 days, the temperature is 67 ℃, the relative humidity is 90 percent, and the measurement precision of the digital multimeter is detected; continuing to perform the damp-heat test of the eighth stage, wherein the test time is 8 days, the temperature is 62 ℃, the relative humidity is 90 percent, and the measurement precision of the digital multimeter is detected; the temperature change rate is less than 1 ℃/min when the temperature is increased or decreased in the damp-heat test process.
The test is stopped after 64 days, and the measurement precision test data of the digital multimeter detected in the test process is analyzed, so that the effect of the test for 64 days by the method is close to the effect of one year of actual use/storage of the digital multimeter, and the service life loss of the test is good in conformity with the actual service life loss of the digital multimeter.
From the above embodiments, the present invention provides an accelerated life test method for a digital multimeter, which includes: the digital multimeter was subjected to a salt spray test and a wet heat test in this order. The salt spray test is firstly carried out on the digital multimeter, then the damp-heat test is carried out on the digital multimeter, and the service life loss of the digital multimeter is accelerated by adopting a method combining the salt spray test and the damp-heat test.
Claims (1)
1. An accelerated life test method for a digital multimeter comprises the following steps:
sequentially carrying out a salt spray test and a damp-heat test on the digital multimeter;
the time of the salt spray test is 1.5-2.5 hours; the reagent of the salt spray test is NaCl solution; the mass concentration of the NaCl solution is 4.5-5.5%; the temperature of the salt spray test is 34-36 ℃; the salt spray sedimentation rate of the salt spray test is 1.4-1.6 mL/80cm2·h；
The temperature change rule in the damp and hot test process is similar to a cosine function in an interval of [ -pi/2, pi/2 ];
dividing the damp-heat test into 7-9 stages; the time of each stage is 7-9 days; the temperature of the damp-heat test in the first stage is 59-61 ℃, the temperature of the damp-heat test in the second stage is 64-66 ℃, the temperature of the damp-heat test in the third stage to the sixth stage is 69-71 ℃, the temperature of the damp-heat test in the seventh stage is 64-66 ℃, and the temperature of the damp-heat test in the eighth stage is 59-61 ℃;
the rate of temperature rise or temperature fall in the damp-heat test process is 0.4-0.5 ℃/min;
the humidity in the damp-heat test process is 84-86%;
placing the digital multimeter in a standard environment to test the initial measurement accuracy of the digital multimeter before performing a salt spray test on the digital multimeter; the temperature of the standard environment is 18-22 ℃, the humidity of the standard environment is 48-52%, and the time of placing the standard environment is 1.8-2.2 hours.
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| CN101206252A (en) * | 2006-12-22 | 2008-06-25 | 鸿富锦精密工业（深圳）有限公司 | System and method for measuring digital multimeter |
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| CN106772208B (en) * | 2016-12-30 | 2023-11-28 | 杭州海兴电力科技股份有限公司 | Single three-phase meter integrated reliability test board |
| CN107796580B (en) * | 2017-08-31 | 2019-06-21 | 海盐普博电机有限公司 | A kind of pilot system for electric instrument |
| CN108120949A (en) * | 2018-01-02 | 2018-06-05 | 国网上海市电力公司 | A kind of intelligent electric energy meter accelerated degradation test method |
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