CN109342871A - Insulated test device is connected in multichannel electric wiring - Google Patents
Insulated test device is connected in multichannel electric wiring Download PDFInfo
- Publication number
- CN109342871A CN109342871A CN201811395274.XA CN201811395274A CN109342871A CN 109342871 A CN109342871 A CN 109342871A CN 201811395274 A CN201811395274 A CN 201811395274A CN 109342871 A CN109342871 A CN 109342871A
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- China
- Prior art keywords
- circuit
- relay
- test
- source module
- voltage
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
- G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention proposes a kind of multichannel electric wirings, and insulated test device is connected.The device includes power-switching circuit, DC-DC power source, STM32 single-chip microcontroller, FPGA, digital isolator, DAC circuit, high pressure source module, constant current source module, excitation selection circuit, relay drive circuit, relay array, measuring circuit etc..The embodiment of the present invention can be independently operated, or easily be integrated into other equipment, and extend very convenient.The device forms 64 channel high-voltage power supplies or constant-current source output, any two can be configured to TCH test channel between channel, as Ch0 and Ch1 constitutes a tested channel, a measured channel can also be formed with Ch0 and Ch63, a test loop can be shared with multiple channels, such as Ch0 and Ch21, Ch1 and Ch21, Ch2 and Ch21, have been significantly greatly increased the flexibility of test in this way.
Description
Technical field
The present invention relates to the technical fields of test measurement, and Insulation test is connected more particularly, to a kind of multichannel electric wiring
Device.
Background technique
Electrical cable network is widely used in inside air weapon in aviation field, and between same test equipment
Electrical connection.Electric conducting state is presented between the pin of conducting wire connection in electrical cable network, the pin not connected by conducting wire
Between electric insulating state is presented.
The conducting insulation test method of traditional aircraft electric cable system is to measure conducting resistance using multimeter, is passed through
The resistance value measured judges whether be connected between two pins；Using measurement insulation resistance by megger, pass through the resistance value measured
Judge whether meet insulation performance requirement between two electric wirings.The test that the above method is measured by multimeter and megameter
Resistance is converted the conducting state of insulation to judge electrical cable network, and test and comparison is cumbersome and efficiency and reliability are low.
Summary of the invention
In consideration of it, the present invention provides a kind of multichannel electricity in order to solve at least one technical problem in the prior art
Gas line conduction insulated test device.The device includes:
Power-switching circuit, DC-DC power source, STM32 single-chip microcontroller, FPGA, digital isolator, DAC circuit, high-voltage power supply mould
Block, constant current source module, excitation selection circuit, relay drive circuit, relay array, measuring circuit etc..
Power-switching circuit, it is required for being provided for the chips such as STM32 single-chip microcontroller, FPGA, digital isolator or circuit
Working power, output voltage have three kinds of+3.3V ,+1.8V ,+1.2V；
DC-DC power source is the voltage-regulating circuit of isolated form, for being digital isolator, high pressure source module, constant-current source mould
Block, excitation selection circuit, relay drive circuit, relay array and measuring circuit provide working power；
STM32 single-chip microcontroller, for realizing the control, Measurement and Data Processing and data communication function of peripheral circuit；
FPGA realizes the functions such as the control of peripheral circuit for carrying out data interaction with STM32 single-chip microcontroller；
Digital isolator, is used for signal isolation, and FPGA controls measuring circuit, relay drive circuit by digital isolator
And DAC circuit, realize the number isolation of physics；
DAC circuit controls the output valve of high pressure source module for generating the DC voltage of 0~5V；
High pressure source module applies the high pressure activation of setting on test line when for Insulation test；
Constant current source module applies the constant current drive of setting on test line when for continuity test；
Selection circuit is motivated, the excitation for switching high pressure source module or constant-current source exports；
Relay drive circuit, for driving relay array；
Insulation test circuit switching is connected for realizing multichannel in relay array；
Measuring circuit, measured signal acquisition and processing when Insulation test is connected for realizing multichannel.
The embodiment of the present invention can be independently operated, or easily be integrated into other equipment, and extend very
It is convenient.The device forms 64 channel high-voltage power supplies or constant-current source output, any two can be configured to TCH test channel between channel,
If Ch0 and Ch1 constitutes a tested channel, a measured channel can also be formed with Ch0 and Ch63, it can be with multiple channels
A test loop, such as Ch0 and Ch21, Ch1 and Ch21, Ch2 and Ch21 are shared, the flexible of test has been significantly greatly increased in this way
Property.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, will make below to required in the embodiment of the present invention
Attached drawing is briefly described, it is therefore apparent that drawings described below is only some embodiments of the present invention, for this
For the technical staff in field, without creative efforts, it can also be obtained according to these attached drawings other attached
Figure.
Fig. 1 is the composition schematic diagram of the 64 channel electric wirings conducting insulated test device of one embodiment of the invention；
Fig. 2 is the control principle drawing of the 64 channel electric wirings conducting insulated test device of one embodiment of the invention.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described.Obviously, described embodiment is
A part of the embodiment of the present invention, rather than whole embodiments.Based on the embodiments of the present invention, those skilled in the art
Without making creative work, every other embodiment obtained, shall fall within the protection scope of the present invention.
The feature and illustrative examples of various aspects of the invention is described more fully below.In following detailed description
In, many details are proposed, in order to provide complete understanding of the present invention.But come for those skilled in the art
It says it will be apparent that the present invention can be implemented in the case where not needing some details in these details.Below to reality
The description of example is applied just for the sake of providing and better understanding to of the invention by showing example of the invention.The present invention is never
It is limited to any specific setting and method set forth below, but covering finishes under the premise of without departing from the spirit of the present invention
Structure, method, any improvement of device, substitutions and modifications.In the the accompanying drawings and the following description, well known structure and skill is not shown
Art is unnecessary fuzzy to avoid causing to the present invention.
It should be noted that in the absence of conflict, the feature in the embodiment of the present invention and embodiment can be tied mutually
It closes, each embodiment mutually can be referred to and be quoted.The present invention will be described in detail below with reference to the accompanying drawings and embodiments.
Fig. 1 is the composition schematic diagram of the 64 channel electric wirings conducting insulated test device of one embodiment of the invention.
As shown in Figure 1, the test device 100 includes power-switching circuit 101, DC-DC power source 102, STM32 single-chip microcontroller
103, FPGA104, digital isolator 105, DAC circuit 106, high pressure source module 107, constant current source module 108, excitation selection circuit
109, relay drive circuit 110, relay array 111, measuring circuit 112 etc..
Power-switching circuit 101, for being chips or the electricity such as STM32 single-chip microcontroller 103, FPGA104, digital isolator 105
Road provides required working power, and output voltage has three kinds of+3.3V ,+1.8V ,+1.2V；
DC-DC power source 102 is the voltage-regulating circuit of isolated form, for being digital isolator 105, high pressure source module
107, constant current source module 108, excitation selection circuit 109, relay drive circuit 110, relay array 111 and measuring circuit
112 provide working power；
STM32 single-chip microcontroller 103, for realizing the control, Measurement and Data Processing and data communication function of peripheral circuit；
FPGA104 realizes the functions such as the control of peripheral circuit for carrying out data interaction with STM32 single-chip microcontroller 103；
Digital isolator 105, be used for signal isolation, FPGA104 by digital isolator 105 control measuring circuit 112, after
Electrical apparatus driving circuit 110 and DAC circuit 106 realize the number isolation of physics；
DAC circuit 106 controls the output valve of high pressure source module 107 for generating the DC voltage of 0~5V；
High pressure source module 107 applies the high pressure activation of setting on test line when for Insulation test；
Constant current source module 108 applies the constant current drive of setting on test line when for continuity test；
Selection circuit 109 is motivated, the excitation for switching high pressure source module 107 or constant-current source 108 exports；
Relay drive circuit 110, for driving relay array 111；
Insulation test circuit switching is connected for realizing multichannel in relay array 111；
Measuring circuit 112, measured signal acquisition and processing when Insulation test is connected for realizing multichannel.
Fig. 2 is the control principle drawing of the 64 channel electric wirings conducting insulated test device of one embodiment of the invention.
As shown in Fig. 2, 100 application method of test device is as follows:
A) insulation measurement method:
Insulation measurement can on relay array (111) in this 64 ports P0~P63 any two port it
Between carry out, now illustrate to measure control principle so that the port P0 and P1 is one group of Measurement channel as an example.
Firstly, its 6-7,3-5 is connected in the low-voltage relay K4 of the control port P1, port is thoroughly broken with high pressure activation end
It opens；
Then, the low-voltage relay K3 for controlling the port P0 is connected its 6-8,3-4, then controls low-voltage relay K1 and K2
It is respectively turned on its 3-4；
Finally, controlling high-pressure electronic relay U1 again, turn it on, at this moment high pressure activation is loaded on the port P0, is led to
It crosses test line Rx to be connected on the port P1, Low-voltage Electronic switch U4 is disconnected, and route is connected to by the port P1 by divider resistance R11
On the ground, the voltage value on V6 is measured at this time, and V6 can calculate the electric current Ix on route divided by (R11+R10).Pass through high pressure again
Voltage value is divided by Ix, to the resistance value Rall in entire circuit, Rx=(Rall-R1-R5-R10-R11) at this time.
B) conducting resistance measurement method:
Conducting resistance measurement can on relay array (111) in this 64 ports P0~P63 any two port it
Between carry out, now illustrate measuring principle so that the port P0 and P1 is Measurement channel as an example.
Firstly, control high-pressure electronic relay U2, U1 disconnect high pressure activation end, the low-voltage relay K4 of the port P1 is controlled
Its 6-7,3-5 is connected, controls the Low-voltage Electronic switch U4 on divider resistance R11, it is connected over the ground；
Then, the low-voltage relay K3 for controlling the port P0 is connected its 6-8,3-4, then controls low-voltage relay K1 and K2
It is respectively turned on its 3-5, such constant current drive has been loaded on the port P0；
Finally, the voltage difference of measurement V2, V3, which obtains the value Iref of constant-current source divided by resistance value R4, then measures
Voltage on V4 and V6 obtains that (V4-V6) can be obtained to the Rx value of test line divided by Iref by the voltage at route both ends.
The benefit of such circuit design is that the measurement of conducting resistance and insulation resistance shares identical port, is being actually used
In program development process, low-voltage relay is first gated, then switches high-pressure electronic relay, to guarantee the safety of output；In order to
It prevents high pressure and is added in conductive line road, usually when measuring insulation resistance, conducting resistance should be first measured, if line resistance mistake
It is small, then it alarms, without megger test.
On the other hand, if checked for the conducting insulation of air weapon priming system power supply line, just in case there is high pressure load
Onto continuity test channel, due to the protective resistance R1 for the 1M Ω that connected in high-voltage power supply power supply line, even if test line resistance
Electric current maximum for 0 Ω, inflow is only 1mA, belongs to safe range.
Finally it should be noted that: the above embodiments are merely illustrative of the technical solutions of the present invention, but protection of the invention
Range is not limited thereto, and anyone skilled in the art in the technical scope disclosed by the present invention, can be thought easily
It is modified or replaceed to various equivalent, these, which are modified or replaceed, should all be included within the scope of the present invention.
Claims (4)
1. insulated test device is connected in a kind of multichannel electric wiring, which comprises the following steps:
Multichannel electric wiring conducting insulated test device (100) include: power-switching circuit (101), DC-DC power source (102),
STM32 single-chip microcontroller (103), FPGA (104), digital isolator (105), DAC circuit (106), high pressure source module (107), constant current
Source module (108), excitation selection circuit (109), relay drive circuit (110), relay array (111), measuring circuit
(112) etc..
The power-switching circuit (101), for being STM32 single-chip microcontroller (103), FPGA (104), digital isolator (105) etc.
Chip or circuit provide required working power, and output voltage has three kinds of+3.3V ,+1.8V ,+1.2V；
The DC-DC power source (102) is the voltage-regulating circuit of isolated form, for being digital isolator (105), high-voltage power supply mould
Block (107), constant current source module (108), excitation selection circuit (109), relay drive circuit (110), relay array (111)
Working power is provided with measuring circuit (112)；
The STM32 single-chip microcontroller (103), for realizing the control, Measurement and Data Processing and data communication function of peripheral circuit；
The FPGA (104) realizes the function such as the control of peripheral circuit for carrying out data interaction with STM32 single-chip microcontroller (103)
Energy；
The digital isolator (105), is used for signal isolation, and FPGA (104) controls measuring circuit by digital isolator (105)
(112), relay drive circuit (110) and DAC circuit (106) realize the number isolation of physics；
The DAC circuit (106) controls the output valve of high pressure source module (107) for generating the DC voltage of 0~5V；
The high pressure source module (107), applies the high pressure activation of setting on test line when for Insulation test；
The constant current source module (108), applies the constant current drive of setting on test line when for continuity test；
The excitation selection circuit (109), the excitation for switching high pressure source module (107) or constant-current source (108) export；
The relay drive circuit (110), for driving relay array (111)；
Insulation test circuit switching is connected for realizing multichannel in the relay array (111)；
The measuring circuit (112), measured signal acquisition and processing when Insulation test is connected for realizing multichannel.
2. the apparatus according to claim 1, which is characterized in that wherein:
The on-off switching circuit of high-voltage power module (107) uses high-pressure electronic relay, and maximum switching voltage is reachable
1500V。
3. the apparatus of claim 2, which is characterized in that wherein:
After the high pressure source module (107) switches on-off with the high-pressure electronic relay, the relay array (111) of rear class is then
It can be using conventional low voltage after device.
4. device described in any one of -3 according to claim 1, which is characterized in that wherein:
Relay array (111) selects pulse control twin coil locking type relay, in actual use, first gates low pressure relay
Device, then switch high-pressure electronic relay.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811395274.XA CN109342871A (en) | 2018-11-21 | 2018-11-21 | Insulated test device is connected in multichannel electric wiring |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811395274.XA CN109342871A (en) | 2018-11-21 | 2018-11-21 | Insulated test device is connected in multichannel electric wiring |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109342871A true CN109342871A (en) | 2019-02-15 |
Family
ID=65316787
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811395274.XA Pending CN109342871A (en) | 2018-11-21 | 2018-11-21 | Insulated test device is connected in multichannel electric wiring |
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| Country | Link |
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| CN (1) | CN109342871A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110531210A (en) * | 2019-09-24 | 2019-12-03 | 成都凯迪飞研科技有限责任公司 | The conducting of aviation harness and insulation intelligent checking system |
| CN112578316A (en) * | 2020-12-10 | 2021-03-30 | 上海航天精密机械研究所 | Portable multi-channel automatic conduction testing device and method |
| CN116754908A (en) * | 2023-07-04 | 2023-09-15 | 北京交通大学 | Multichannel conduction insulation test system and test method based on solid-state relay |
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| CN107991535A (en) * | 2017-12-01 | 2018-05-04 | 中国兵器装备集团自动化研究所 | Multichannel insulate and conducting resistance measuring system and its passageway switching method |
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| CN2599595Y (en) * | 2003-01-16 | 2004-01-14 | 中国航空工业第一集团公司航空动力控制系统研究所 | Line pencil detector |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110531210A (en) * | 2019-09-24 | 2019-12-03 | 成都凯迪飞研科技有限责任公司 | The conducting of aviation harness and insulation intelligent checking system |
| CN112578316A (en) * | 2020-12-10 | 2021-03-30 | 上海航天精密机械研究所 | Portable multi-channel automatic conduction testing device and method |
| CN116754908A (en) * | 2023-07-04 | 2023-09-15 | 北京交通大学 | Multichannel conduction insulation test system and test method based on solid-state relay |
| CN116754908B (en) * | 2023-07-04 | 2024-03-19 | 北京交通大学 | Multichannel conduction insulation test system and test method based on solid-state relay |
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Application publication date: 20190215 |