CN210720473U - Multichannel insulation voltage withstand test automatic switching control equipment - Google Patents
Multichannel insulation voltage withstand test automatic switching control equipment Download PDFInfo
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- CN210720473U CN210720473U CN201920868869.6U CN201920868869U CN210720473U CN 210720473 U CN210720473 U CN 210720473U CN 201920868869 U CN201920868869 U CN 201920868869U CN 210720473 U CN210720473 U CN 210720473U
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Abstract
The multichannel insulation voltage withstand test automatic switching device is provided with a singlechip unit, a drive circuit and a channel interface; one end of a driving circuit is connected with the single chip microcomputer unit, a longitudinal power supply channel H and a transverse protection channel G in the driving circuit are respectively connected with a chip U2 in the single chip microcomputer unit, and transverse interface channels L in the driving circuit are correspondingly connected with interfaces in the channel interfaces one by one; the insulation withstand voltage tester and the tested device are respectively inserted into corresponding interfaces in the channel interfaces, the insulation withstand voltage tester is connected with the tested device through the channel interfaces, and a chip U1 in the single chip microcomputer unit is in serial port communication connection with an upper computer. The method achieves the purposes of automatic testing and switching selection among the testing channels, can greatly simplify the selection process of the testing loops of the channel testing of the insulation withstand voltage tester and the tested equipment, saves the testing time and ensures the safety of testing personnel.
Description
Technical Field
The utility model relates to an insulation and voltage resistance test field, in particular to multichannel insulation and voltage resistance test automatic switching control equipment.
Background
The voltage withstand test refers to a test of voltage withstand capability of various electrical devices, insulating materials, and insulating structures. The process of applying a high voltage to an insulating material or an insulating structure without destroying the performance of the insulating material is called a withstand voltage test. Generally, the main purpose of the voltage resistance test is to check the ability of the insulation to withstand operating voltage or overvoltage, and then to check whether the insulation performance of the product equipment meets safety standards.
In the field of safety test, the insulation and voltage resistance test is a very important item, and is an index for whether electrical equipment is safe or not, and the reliability of the equipment and the personal safety of a user are related. In GB1498.27-2017, there is a clear regulation on the test site of the dielectric breakdown voltage: between the individual circuits, circuits not involved in the test should be connected together and grounded. Because the insulation withstand voltage tester can only output two channels, if the tested device is provided with 6 independent loops, the insulation withstand voltage test needs to be completed by 2C6 2In the secondary test, the tester needs to perform 30 wire changing operations in the test process, and the mode is not only complicatedTime is consumed, the working efficiency is reduced, and electric shock risks exist in the test.
Therefore, it is necessary to provide an automatic switching device for multi-channel voltage and insulation tests to solve the deficiencies of the prior art.
SUMMERY OF THE UTILITY MODEL
The utility model aims to avoid prior art's weak point and provide a multichannel insulation withstand voltage test automatic switching control equipment is necessary very in order to solve prior art not enough. The multichannel insulation and voltage resistance test automatic switching device has the advantages of saving test time and guaranteeing personnel safety.
The above object of the present invention is achieved by the following technical means.
An automatic switching device for a multi-channel insulation and voltage resistance test is provided with a single chip microcomputer unit, a driving circuit and a channel interface;
one end of the driving circuit is connected with the single chip microcomputer unit, and the other end of the driving circuit is connected with the channel interface;
the channel interface is respectively connected with the insulation withstand voltage tester and the tested device, the single chip microcomputer unit is connected with the upper computer, and the upper computer is further connected with the insulation withstand voltage tester.
Preferably, the driving circuit is provided with a longitudinal power channel H for providing power, a transverse protection channel G for providing circuit protection, transverse interface channels L for one-to-one connection with the interfaces, and a switch S for performing positive loop control on the longitudinal power channel Hh is justSwitch S for negative loop control of the longitudinal power supply channel Hh is minusSwitch S for loop control of transverse protection channel Gg，
The longitudinal power supply channel H is respectively connected with the transverse interface channel L and the transverse protection channel G in a one-to-one corresponding mode;
two ends of the longitudinal power supply channel H are respectively connected with the high-voltage output + and the high-voltage output-, and one end of the transverse protection channel G is grounded;
the single chip microcomputer unit is respectively connected with one end of the longitudinal power supply channel H, one end of the transverse protection channel G and one end of the transverse interface channel L.
Preferably, the channel interface is provided with an interface for one-to-one corresponding and matching connection with the transverse interface channel L.
Preferably, n longitudinal power supply channels H, n transverse protection channels G and n transverse interface channels L are provided, where n is greater than or equal to 2 and is a positive integer;
defining n of the above-mentioned vertical power channels H as H respectively1、H2、H3、……、Hi、……、Hn；
N of the above-mentioned transverse protection channels G are respectively defined as G1、G2、G3、……、Gi、……、Gn；
Defining n of the above-mentioned horizontal interface channels L as L respectively1、L2、L3、……、Li、……、Ln；
Wherein i is more than or equal to 1 and less than or equal to n;
the transverse protective channel G1And a transverse interface channel L1Respectively connected with the longitudinal power supply channel H1Connecting;
transverse protection channel G2And a transverse interface channel L2Respectively connected with the longitudinal power supply channel H2Connecting;
transverse protection channel G3And a transverse interface channel L3Respectively connected with the longitudinal power supply channel H3Connecting;
……；
transverse protection channel GiAnd a transverse interface channel LiRespectively connected with the longitudinal power supply channel HiConnecting;
……；
transverse protection channel GnAnd a transverse interface channel LnRespectively connected with the longitudinal power supply channel HnAnd (4) connecting.
Preferably, the switch S ish is justSwitch Sh is minusSwitch SgN are respectively arranged;
n of the above-mentioned switches Sh is justAre respectively defined as Sh1 is、Sh2 is、Sh3 is、……、Shi Zheng (medicine for treating hypertension)、……、Shn just；
N of the above-mentioned switches Sh is minusAre respectively defined as Sh1 negative、Sh2 negative、Sh3 negative、……、SHi negative、……、Shn negative；
N of the above-mentioned switches SgAre respectively defined as Sg1、Sg2、Sg3、……、Sgi、……、Sgn(ii) a Wherein i is more than or equal to 1 and less than or equal to n;
switch Sh1 isThrough a longitudinal power supply channel H1One end of and a switch Sh1 negativeIs connected to one end of a switch Sh1 isAnd the other end of (1) and a switch Sh1 negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch Sg1Is passed through a transverse protection channel G1One end of the switch S is connected with one end of the singlechip unitg1Is passed through a transverse protection channel G1And the other end of the longitudinal power supply channel H1Connecting;
switch Sh2 isThrough a longitudinal power supply channel H2One end of and a switch Sh2 negativeIs connected to one end of a switch Sh2 isAnd the other end of (1) and a switch Sh2 negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch Sg2Is passed through a transverse protection channel G2One end of the switch S is connected with one end of the singlechip unitg2Is passed through a transverse protection channel G2And the other end of the longitudinal power supply channel H2Connecting;
switch Sh3 isThrough a longitudinal power supply channel H3One end of and a switch Sh3 negativeIs connected to one end of a switch Sh3 isAnd the other end of (1) and a switch Sh3 negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch Sg3Is passed through a transverse protection channel G3One end of the switch S is connected with one end of the singlechip unitg3Is passed through a transverse protection channel G3And the other end of the longitudinal power supply channel H3Connecting;
……；
switch Shi Zheng (medicine for treating hypertension)Through a longitudinal power supply channel HiOne end of and a switch SHi negativeIs connected to one end of a switch Shi Zheng (medicine for treating hypertension)And the other end of (1) and a switch SHi negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch SgiIs passed through a transverse protection channel GiOne end of the switch S is connected with one end of the singlechip unitgiIs passed through a transverse protection channel GiAnd the other end of the longitudinal power supply channel HiConnecting;
……；
switch Shn justThrough a longitudinal power supply channel HnOne end of and a switch Shn negativeIs connected to one end of a switch Shn justAnd the other end of (1) and a switch Shn negativeThe other end of the switch S is respectively connected with one end of the singlechip unitgnIs passed through a transverse protection channel GnOne end of the switch S is connected with one end of the singlechip unitgnIs passed through a transverse protection channel GnAnd the other end of the longitudinal power supply channel HnAnd (4) connecting.
Preferably, the number of the interfaces is plural.
Preferably, the single chip microcomputer unit is provided with a chip U1, a resistor R0, a resistor R1, a resistor R2, a resistor R3, a resistor R4, a resistor R5, a resistor R6, a resistor R7, a resistor R8, a polar capacitor C1 and a chip U2;
a pin 1 of the chip U1 is connected to one end of a resistor R1, the other end of the resistor R1 is connected to a pin 1 of the chip U2, a pin 2 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 2 of the chip U2, a pin 3 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 3 of the chip U2, a pin 4 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 4 of the chip U2, a pin 5 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 5 of the chip U2, the other end of the resistor U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 6 of the chip U2, the resistor R2 is connected to one end of the chip U2, and the other end of the resistor R2 is connected to the pin 2, the chip R2 is connected to the pin of the chip U, the pin 9 of the chip U1 is grounded, and the pin 17 of the chip U1 is in communication connection with an upper computer through a serial port;
Preferably, 1 chip U2 is provided;
longitudinal power supply channel H, horizontal protection channel G, horizontal interface channel L are provided with 2 respectively in the circuit channel, promptly: l is1、L2、G1、G2、H1、H2Switch Sh is justSwitch Sh is minusSwitch SgAre respectively provided with 2, namely Sh1 is、Sh2 is、Sh1 negative、Sh2 negative、Sg1、Sg2；
Chip U2 pin 18 and vertical power channel H1Is connected to pin 17 of chip U2 and vertical power channel H1Is connected to the other end of the chip U2 with the 16 pins of the chip U2 and the transverse protection channel G1Is connected to pin 15 of chip U2 and vertical power channel H2Is connected to pin 14 of chip U2 and vertical power channel H2Is connected with the other end of the chip U2 pin 13 and the transverse protection channel G2Is connected at one end.
Preferably, the 18 pin of the chip U2, the 17 pin of the chip U2, the 16 pin of the chip U2, the 15 pin of the chip U2, the 14 pin of the chip U2, the 13 pin of the chip U2, the 12 pin of the chip U2 and the 11 pin of the chip U2 are respectively and correspondingly connected with one end of the longitudinal power channel H, the other end of the longitudinal power channel H and one end of the transverse protection channel G in sequence;
preferably, M chips U2 are provided, M is more than or equal to 2, and M is a positive integer;
defining M of the above chips U2 as U2(1), U2(2), U2(3), … …, U2(i), … …, U2 (M);
wherein i is more than or equal to 1 and less than or equal to M;
longitudinal power supply channel H, horizontal protection channel G, horizontal interface channel L are provided with 3 respectively in the circuit channel, promptly: l is1、L2、L3、G1、G2、G3、H1、H2、H3Switch Sh is justSwitch Sh is minusSwitch SgAre respectively provided with 3, namely Sh1 is、Sh2 is、Sh3 is、Sh1 negative、Sh2 negative、Sh3 negative、Sg1、Sg2、Sg3；
The chip U2 is U2(1) and U2 (2);
a resistor R9, a resistor R10, a resistor R11, a resistor R12, a resistor R13, a resistor R14, a resistor R15, a resistor R16 and a resistor R17 which are in one-to-one correspondence with the 1 pin of the chip U2(2), the 2 pin of the chip U2(2), the 3 pin of the chip U2(2), the 4 pin of the chip U2(2), the 5 pin of the chip U2(2), the 6 pin of the chip U2(2), the 7 pin of the chip U2(2) and the 8 pin of the chip U2(2) are also arranged;
chip U2(1) pin 18 and vertical power channel H1Is connected to pin 17 of chip U2(1) and longitudinal power channel H1Is connected with the other end of the chip U2(1), and the 16 pins of the chip U2(1) are connected with the transverse protection channel G1Is connected with the 15 pins of the chip U2(1) and the longitudinal power channel H2Is connected to the 14 pin of the chip U2(1) and the longitudinal power channel H2Is connected with the other end of the chip U2(1), and the 13 feet of the chip U2(1) are connected with the transverse protection channel G2Is connected to the 12 pins of the chip U2(1) and the longitudinal power channel H3Is connected with the 11 pins of the chip U2(1) and the longitudinal power channel H3Is connected with the other end of the chip U2(2) pin 18 and the transverse protection channel G3Pin 1 of the chip U2(2) is connected to pin 9 of the chip U1 through a resistor R9, pin 2 of the chip U2(2) is connected to pin 10 of the chip U1 through a resistor R10, and pin 3 of the chip U2(2)The pin is connected with the 11 pin of the chip U1 through a resistor R11, the 4 pin of the chip U2(2) is connected with the 12 pin of the chip U1 through a resistor R12, the 5 pin of the chip U2(2) is connected with the 13 pin of the chip U1 through a resistor R13, the 6 pin of the chip U2(2) is connected with the 14 pin of the chip U1 through a resistor R14, the 7 pin of the chip U2(2) is connected with the 15 pin of the chip U1 through a resistor R15, the 8 pin of the chip U2(2) is connected with the 16 pin of the chip U1 through a resistor R16, the 9 pin of the chip U2(2) is grounded, and the 10 pin of the chip U2(2) is connected with a power supply VCC through a resistor R17.
Preferably, when the number of the longitudinal power supply channels H, the number of the transverse protection channels G and the number of the transverse interface channels L are more than or equal to 6, the number of the single chip microcomputer units is multiple;
the model of the chip U1 is STM32, STC89C52 or AT89C51, and the model of the chip U2 is TD62083APG, HPBL400 or SPBL 400.
The multichannel insulation voltage withstand test automatic switching device is provided with a singlechip unit, a drive circuit and a channel interface; one end of a driving circuit is connected with the single chip microcomputer unit, a longitudinal power supply channel H and a transverse protection channel G in the driving circuit are respectively connected with a chip U2 in the single chip microcomputer unit, and transverse interface channels L in the driving circuit are correspondingly connected with interfaces in the channel interfaces one by one; the insulation withstand voltage tester and the tested device are respectively inserted into corresponding interfaces in the channel interfaces, the insulation withstand voltage tester is connected with the tested device through the channel interfaces, and a chip U1 in the single chip microcomputer unit is in serial port communication connection with an upper computer. When the insulation and voltage resistance test is carried out, a test command is provided to the chip U1 in the single chip microcomputer unit through the upper computer, the GPIO of the chip U1 of the single chip microcomputer unit outputs a low level to control the on/off of switches of all channels in the driving circuit through the chip U2, and therefore the purposes of automatic test and switching selection among test channels are achieved.
Drawings
The present invention will be further described with reference to the accompanying drawings, but the contents in the drawings do not constitute any limitation to the present invention.
Fig. 1 is a schematic structural diagram of the multichannel withstand voltage automatic switching device of the present invention.
Fig. 2 is a schematic view of the working principle of the multi-channel switching device of the present invention.
Fig. 3 is a schematic structural diagram of the single chip unit according to embodiment 1 of the present invention.
Fig. 4 is a schematic structural diagram of the single chip unit in embodiment 2 of the present invention.
In fig. 1 to 4, the following are included:
the device comprises a single chip microcomputer unit 100, a driving circuit 200, a channel interface 300, an insulation withstand voltage tester 400, a device to be tested 500 and an upper computer 600.
Detailed Description
The invention will be further described with reference to the following examples.
Example 1.
An automatic switching device for a multi-channel insulation and voltage resistance test is provided with a single chip microcomputer unit 100, a driving circuit 200 and a channel interface 300 as shown in fig. 1 to 3;
one end of the driving circuit 200 is connected with the single chip microcomputer unit 100, and the other end of the driving circuit 200 is connected with the channel interface 300;
the channel interface 300 is respectively connected with the insulation withstand voltage tester 400 and the tested device 500, the single chip microcomputer unit 100 is connected with the upper computer 600 through serial port communication, and the upper computer is further connected with the insulation withstand voltage tester 400.
The driving circuit 200 is provided with a longitudinal power channel H for providing power, a transverse protection channel G for providing circuit protection, a transverse interface channel L for one-to-one connection with the interface, and a switch S for performing positive loop control on the longitudinal power channel Hh is justSwitch S for negative loop control of the longitudinal power supply channel Hh is minusSwitch S for loop control of transverse protection channel GgAnd the pin 18 of the chip U2 to the pin 11 of the chip U2 in the single chip microcomputer unit are respectively connected with one end of the longitudinal power supply channel H, the other end of the longitudinal power supply channel H and one end of the transverse protection channel G.
The longitudinal power supply channel H is respectively connected with the transverse interface channel L and the transverse protection channel G in a one-to-one corresponding mode;
two ends of the longitudinal power supply channel H are respectively connected with the high-voltage output + and the high-voltage output-, and one end of the transverse protection channel G is grounded;
the single chip microcomputer unit is respectively connected with one end of the longitudinal power supply channel H, one end of the transverse protection channel G and one end of the transverse interface channel L.
The channel interface is provided with an interface which is used for being correspondingly matched with the transverse interface channels L one by one.
N longitudinal power supply channels H, transverse protection channels G and transverse interface channels L are arranged, wherein n is more than or equal to 2 and is a positive integer;
defining n of the above-mentioned vertical power channels H as H respectively1、H2、H3、……、Hi、……、Hn；
N of the above-mentioned transverse protection channels G are respectively defined as G1、G2、G3、……、Gi、……、Gn；
Defining n of the above-mentioned horizontal interface channels L as L respectively1、L2、L3、……、Li、……、Ln；
Wherein i is more than or equal to 1 and less than or equal to n;
transverse protection channel G1And a transverse interface channel L1Respectively connected with the longitudinal power supply channel H1Connecting;
transverse protection channel G2And a transverse interface channel L2Respectively connected with the longitudinal power supply channel H2Connecting;
transverse protection channel G3And a transverse interface channel L3Respectively connected with the longitudinal power supply channel H3Connecting;
……；
transverse protection channel GiAnd a transverse interface channel LiRespectively connected with the longitudinal power supply channel HiConnecting;
……；
transverse protection channel GnAnd a transverse interface channel LnRespectively communicated with longitudinal power supplyRoad HnAnd (4) connecting.
Switch Sh is justSwitch Sh is minusSwitch SgN are respectively arranged;
n of the above-mentioned switches Sh is justAre respectively defined as Sh1 is、Sh2 is、Sh3 is、……、Shi Zheng (medicine for treating hypertension)、……、Shn just；
N of the above-mentioned switches Sh is minusAre respectively defined as Sh1 negative、Sh2 negative、Sh3 negative、……、SHi negative、……、Shn negative；
N of the above-mentioned switches SgAre respectively defined as Sg1、Sg2、Sg3、……、Sgi、……、Sgn；
Wherein i is more than or equal to 1 and less than or equal to n;
switch Sh1 isThrough a longitudinal power supply channel H1One end of and a switch Sh1 negativeIs connected to one end of a switch Sh1 isAnd the other end of (1) and a switch Sh1 negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch Sg1Is passed through a transverse protection channel G1One end of the switch S is connected with one end of the singlechip unitg1Is passed through a transverse protection channel G1And the other end of the longitudinal power supply channel H1Connecting;
switch Sh2 isThrough a longitudinal power supply channel H2One end of and a switch Sh2 negativeIs connected to one end of a switch Sh2 isAnd the other end of (1) and a switch Sh2 negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch Sg2Is passed through a transverse protection channel G2One end of the switch S is connected with one end of the singlechip unitg2Is passed through a transverse protection channel G2And the other end of the longitudinal power supply channel H2Connecting;
switch Sh3 isThrough a longitudinal power supply channel H3One end of and a switch Sh3 negativeIs connected to one end of a switch Sh3 isAnd the other end of (1) and a switch Sh3 negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch Sg3Is passed through a transverse protection channel G3One end of the switch S is connected with one end of the singlechip unitg3Is passed through a transverse protection channel G3And the other end of the longitudinal power supply channel H3Connecting;
……；
switch Shi Zheng (medicine for treating hypertension)Through a longitudinal power supply channel HiOne end of and a switch SHi negativeIs connected to one end of a switch Shi Zheng (medicine for treating hypertension)And the other end of (1) and a switch SHi negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch SgiIs passed through a transverse protection channel GiOne end of the switch S is connected with one end of the singlechip unitgiIs passed through a transverse protection channel GiAnd the other end of the longitudinal power supply channel HiConnecting;
……；
switch Shn justThrough a longitudinal power supply channel HnOne end of and a switch Shn negativeIs connected to one end of a switch Shn justAnd the other end of (1) and a switch Shn negativeThe other end of the switch is respectively connected with one end of the singlechip unit, and a switch SgnIs passed through a transverse protection channel GnOne end of the switch S is connected with one end of the singlechip unitgnIs passed through a transverse protection channel GnAnd the other end of the longitudinal power supply channel HnAnd (4) connecting.
Specifically, the interfaces are arranged in a plurality of numbers, and the interfaces are respectively used for plugging an insulation withstand voltage tester and for plugging tested equipment.
The single chip microcomputer unit 100 is provided with a chip U1, a resistor R0, a resistor R1, a resistor R2, a resistor R3, a resistor R4, a resistor R5, a resistor R6, a resistor R7, a resistor R8, a polar capacitor C1 and a chip U2;
a pin 1 of the chip U1 is connected to one end of a resistor R1, the other end of the resistor R1 is connected to a pin 1 of the chip U2, a pin 2 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 2 of the chip U2, a pin 3 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 3 of the chip U2, a pin 4 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 4 of the chip U2, a pin 5 of the chip U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 5 of the chip U2, the other end of the resistor U2 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to a pin 6 of the chip U2, the resistor R2 is connected to one end of the chip U2, and the other end of the resistor R2 is connected to the pin 2, the chip R2 is connected to the pin of the chip U, the 9 pins of the chip are grounded;
in this embodiment, 1 chip U2 is provided, and the range of the corresponding test loop can test at most 1-2 independent loops of the device under test.
When there are 1 test loops:
when the device under test has 2 independent loops, pins 13-15 of the chip U2 need to be connected to the remaining vertical power channel H and the horizontal protection channel G for testing.
Such as: pin 15 of chip U2 and vertical power channel H2Is connected to pin 14 of chip U2 and vertical power channel H2Is connected with the other end of the chip U2 pin 13 and the transverse protection channel G2Is connected, and the pin 17 of the chip U1 is in communication connection with an upper computer through a serial port.
The model of the chip U1 is STM32, and the model of the chip U2 is TD62083 APG.
It should be noted that, in the automatic switching device for multi-channel withstand voltage testing of this embodiment, an appropriate chip type may be selected according to specific needs in practical use, and as common general knowledge of those skilled in the art, the specific structure is not described herein again.
The multichannel insulation withstand voltage test automatic switching device in this embodiment uses STM32 as the use of chip U1, has high performance and low-cost characteristics, and simultaneously, TD62083APG has stronger drive performance, can drive the closure and the disconnection of switch.
The multichannel insulation voltage withstand test automatic switching device is provided with a singlechip unit, a drive circuit and a channel interface; one end of a driving circuit is connected with the single chip microcomputer unit, a longitudinal power supply channel H and a transverse protection channel G in the driving circuit are respectively connected with a chip U2 in the single chip microcomputer unit, and transverse interface channels L in the driving circuit are correspondingly connected with interfaces in the channel interfaces one by one; the insulation withstand voltage tester and the tested device are respectively inserted into corresponding interfaces in the channel interfaces, the insulation withstand voltage tester is connected with the tested device through the channel interfaces, and a chip U1 in the single chip microcomputer unit is in serial port communication connection with an upper computer. When the insulation and voltage resistance test is carried out, a test command is provided to the chip U1 in the single chip microcomputer unit through the upper computer, the GPIO of the chip U1 of the single chip microcomputer unit outputs a low level to control the on/off of switches of all channels in the driving circuit through the chip U2, and therefore the purposes of automatic test and switching selection among test channels are achieved.
Example 2.
The other structures of the automatic switching device for the multichannel insulation and voltage resistance test are the same as those of the embodiment 1, and the difference is that: as shown in fig. 4, when the device under test has 4 independent loops, i.e. 2 chips U2 are provided, the corresponding chips U2 are U2(1) and U2(2),
the longitudinal power supply channel H, the transverse protection channel G and the transverse interface channel L in the circuit channel are provided with 4, namely: l is1、L2、L3、L4、G1、G2、G3、G4、H1、H2、H3、H4Said switch Sh is justThe switch Sh is minusThe switch SgAre respectively provided with 4, namely Sh1 is、Sh2 is、Sh3 is、Sh4 is、Sh1 negative、Sh2 negative、Sh3 negative、Sh4 negative、Sg1、Sg2、Sg3、Sg4；
Chip U2(1) pin 18 and vertical power channel H1Is connected to pin 17 of chip U2(1) and longitudinal power channel H1Is connected with the other end of the chip U2(1), and the 16 pins of the chip U2(1) are connected with the transverse protection channel G1Is connected with the 15 pins of the chip U2(1) and the longitudinal power channel H2Is connected to pin 14 of chip U2 and vertical power channel H2Is connected with the other end of the chip U2(1), and the 13 feet of the chip U2(1) are connected with the transverse protection channel G2Is connected to the 12 pins of the chip U2(1) and the longitudinal power channel H3Is connected with the 11 pins of the chip U2(1) and the longitudinal power channel H3Is connected with the other end of the chip U2(2) pin 18 and the transverse protection channel G3Is connected to pin 17 of chip U2(2) and vertical power channel H4Is connected to the 16 pins of the chip U2(2) and the longitudinal power channel H4Is connected with the other end of the chip U2(2), and the 15 feet of the chip U2(2) are connected with the transverse protection channel G4Is connected with one end of the connecting rod;
respectively connecting 4 loops into a channel 1, a channel 2, a channel 3 and a channel 4, and closing a switch S when the channel 1 and the channel 2 exist in specific useh1 isClosing switch Sh2 negativeClosing switch Sg3Closing switch Sg4The channel 1 and the channel 2 form a closed loop test;
when there are channel 1 and channel 3, switch S is closedh1 isClosing switch Sh3 negativeClosing switch Sg2Closing switch Sg4The channel 1 and the channel 3 form a closed loop test;
when there are channel 1 and channel 4, switch S is closedh1 isClosing switch Sh4 negativeClosing switch Sg2Closing switch Sg3Channel 1 and channel 4 form a closed loop test;
when there are channel 2 and channel 3, switch S is closedh2 isClosing switch Sh3 negativeClosing switch Sg1Closing switch Sg4Channel 2 and channel 3 form a closed loop test;
when there is aChannel 2 and channel 4, closing switch Sh2 isClosing switch Sh4 negativeClosing switch Sg1Closing switch Sg3And channel 2 and channel 4 form a closed loop test.
By arranging 2 chips U2 at the same time, the loop test of the tested device can be increased, and the test capability of the device is further enhanced.
It should be noted that the pins 11-18 of the chip U2 and the channels in the driving circuit can be connected alternatively, but in this technology, for the convenience of clear understanding of the technical solution and for the convenience of description, the chip U2 is defined separately, and can be adjusted as needed during the actual use.
Example 3.
The other structures of the automatic switching device for the multichannel insulation and voltage resistance test are the same as those of the embodiment 1 or 2, and the difference is that:
when the tested device has 9 independent loops, that is, 4 chips U2 are needed to be provided, which are U2(1), U2(2), U2(3), and U2(4),
the 18 pins, the 17 pins, the 16 pins, the 15 pins, the 14 pins, the 13 pins, the 12 pins and the 11 pins of the three chips U2(1), U2(2) and U2(3) and the 18 pins, the 17 pins, the 16 pins, the 15 pins and the 14 pins of U2(4) are respectively and sequentially connected with one end of the longitudinal channel H, the other end of the longitudinal power channel H and one end of the transverse protection channel G in a one-to-one correspondence mode;
when in use, 9 independent loops are respectively connected into a channel 1, a channel 2, a channel 3, a channel … … and a channel 9, and when the channels 1 and 2 exist, the switch S is closedh1 isClosing switch Sh2 negativeClosing switch Sg3Closing switch Sg4Closing switch Sg5Closing switch Sg6Closing switch Sg7Closing switch Sg8Closing switch Sg9The channel 1 and the channel 2 form a closed loop test;
when there are channel 1 and channel 3, switch S is closedh1 isClosing switch Sh3 negativeClosing switch Sg2Closing switch Sg4Closing switch Sg5Closing and opening deviceClosing switch Sg6Closing switch Sg7Closing switch Sg8Closing switch Sg9The channel 1 and the channel 3 form a closed loop test; … …, respectively; when there are channels 8 and 9, switch S is closedh8 isClosing switch Sh9 negativeClosing switch Sg1Closing switch Sg2Closing switch Sg3Closing switch Sg4Closing switch Sg5Closing switch Sg6Closing switch Sg7And the channel 8 and the channel 9 form a closed loop test.
This multichannel insulation and voltage resistance test automatic switching control equipment connects experimental return circuit on channel interface, and the cooperation host computer can accomplish all insulation and voltage resistance's automatic testing, very big simplification insulation and voltage resistance test's flow, not only saved test time, also ensured tester's safety.
Example 4.
The other structures of the automatic switching device for the multichannel insulation and voltage resistance test are the same as those of the embodiment 1, 2 or 3, and the difference is that:
when the tested device has 12 independent loops, that is, 5 chips U2 are needed to be provided, which are U2(1), U2(2), U2(3), U2(4) and U2(5),
the chip U2(1), the chip U2(2), the chip U2(3) and the chip U2(4) are respectively connected with 18 pins, 17 pins, 16 pins, 15 pins, 14 pins, 13 pins, 12 pins and 11 pins of 4 chips and 18 pins, 17 pins, 16 pins and 15 pins of the chip U2(5) in sequence in a one-to-one correspondence manner with one end of a longitudinal power supply channel H, the other end of the longitudinal power supply channel H and one end of a transverse protection channel G;
when in use, 12 independent loops are respectively connected into a channel 1, a channel 2, a channel 3, a channel … … and a channel 12, and when the channel 1 and the channel 2 exist, the switch S is closedh1 isClosing switch Sh2 negativeClosing switch Sg3Closing switch Sg4Closing switch Sg5Closing switch Sg6Closing switch Sg7Closing switch Sg8Closing switch Sg9Closing switch Sg10Closing switch Sg11Closing switch Sg12Channel 1 andthe channel 2 forms a closed loop test;
when there are channel 1 and channel 3, switch S is closedh1 isClosing switch Sh3 negativeClosing switch Sg2Closing switch Sg4Closing switch Sg5Closing switch Sg6Closing switch Sg7Closing switch Sg8Closing switch Sg9Closing switch Sg10Closing switch Sg11Closing switch Sg12The channel 1 and the channel 3 form a closed loop test; … …, respectively; when there are channels 11 and 12, switch S is closedh11 isClosing switch Sh12 negativeClosing switch Sg1Closing switch Sg2Closing switch Sg3Closing switch Sg4Closing switch Sg5Closing switch Sg6Closing switch Sg7Closing switch Sg8Closing switch Sg9Closing switch Sg10Closing switch Sg11Closing switch Sg12And the channel 11 and the channel 12 form a closed loop test.
This multichannel insulation and voltage resistance test automatic switching control equipment connects experimental return circuit on channel interface, and the cooperation host computer can accomplish all insulation and voltage resistance's automatic testing, very big simplification insulation and voltage resistance test's flow, not only saved test time, also ensured tester's safety.
It should be noted that when there are more test loops, the corresponding test can be completed only by increasing the number of the chips U2 and the number of the single chip units according to the number of the test loops.
It should be finally noted that the above embodiments are only intended to illustrate the technical solutions of the present invention and not to limit the scope of the present invention, and although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention can be modified or replaced with equivalents without departing from the spirit and scope of the technical solutions of the present invention.
Claims (10)
1. The utility model provides a multichannel insulation withstand voltage test automatic switching control equipment which characterized in that: the device is provided with a singlechip unit, a drive circuit and a channel interface;
one end of the driving circuit is connected with the single chip microcomputer unit, and the other end of the driving circuit is connected with the channel interface;
the channel interface is respectively connected with the insulation withstand voltage tester and the tested equipment, the single chip microcomputer unit is connected with the upper computer, and the upper computer is further connected with the insulation withstand voltage tester.
2. The automatic switching device for the multichannel withstand voltage test according to claim 1, characterized in that: the driving circuit is provided with a longitudinal power supply channel H for providing power supply, a transverse protection channel G for providing circuit protection, a transverse interface channel L for one-to-one connection with the interface, and a switch S for performing positive circuit control on the longitudinal power supply channel Hh is justSwitch S for negative loop control of the longitudinal power supply channel Hh is minusSwitch S for loop control of transverse protection channel Gg；
The longitudinal power supply channel H is respectively connected with the transverse interface channel L and the transverse protection channel G in a one-to-one corresponding manner;
two ends of the longitudinal power supply channel H are respectively connected with a high-voltage output + and a high-voltage output-, and one end of the transverse protection channel G is grounded;
and the single chip microcomputer unit is respectively connected with one end of the longitudinal power supply channel H, one end of the transverse protection channel G and one end of the transverse interface channel L.
3. The automatic switching device for the multichannel withstand voltage test according to claim 2, characterized in that: the channel interface is provided with interfaces which are used for being in one-to-one corresponding matching connection with the transverse interface channels L, and the interfaces are respectively connected with the tested equipment and the insulation withstand voltage tester.
4. The automatic switching device for the multichannel withstand voltage test according to claim 3, characterized in that: n longitudinal power supply channels H, the transverse protection channels G and the transverse interface channels L are arranged, wherein n is more than or equal to 2 and is a positive integer;
defining n longitudinal power channels H as H1、H2、H3、……、Hi、……、Hn；
Defining n transverse protection channels G as G respectively1、G2、G3、……、Gi、……、Gn；
Respectively defining n transverse interface channels L as L1、L2、L3、……、Li、……、Ln；
Wherein i is more than or equal to 1 and less than or equal to n;
the transverse protective channel G1And said transverse interface channel L1Respectively connected with the longitudinal power supply channel H1Connecting;
the transverse protective channel G2And said transverse interface channel L2Respectively connected with the longitudinal power supply channel H2Connecting;
the transverse protective channel G3And said transverse interface channel L3Respectively connected with the longitudinal power supply channel H3Connecting;
……；
the transverse protective channel GiAnd said transverse interface channel LiRespectively connected with the longitudinal power supply channel HiConnecting;
……；
the transverse protective channel GnAnd said transverse interface channel LnRespectively connected with the longitudinal power supply channel HnAnd (4) connecting.
5. The automatic switching device for the multichannel withstand voltage test according to claim 4, wherein: the switch Sh is justThe switch Sh is minusThe switch SgN are respectively arranged;
n of the switches Sh is justAre respectively defined as Sh1 is、Sh2 is、Sh3 is、……、Shi Zheng (medicine for treating hypertension)、……、Shn just；
N of the switches Sh is minusAre respectively defined as Sh1 negative、Sh2 negative、Sh3 negative、……、SHi negative、……、Shn negative；
N of the switches SgAre respectively defined as Sg1、Sg2、Sg3、……、Sgi、……、Sgn；
Wherein i is more than or equal to 1 and less than or equal to n;
the switch Sh1 isThrough said longitudinal power supply channel H1And one end of the switch Sh1 negativeIs connected to one end of the switch Sh1 isAnd said switch Sh1 negativeThe other end of the switch S is respectively connected with one end of the singlechip unitg1Is passed through the transverse protection channel G1One end of the switch S is connected with one end of the singlechip unitg1Is passed through the transverse protection channel G1And the other end of the longitudinal power supply channel H1Connecting;
the switch Sh2 isThrough said longitudinal power supply channel H2And one end of the switch Sh2 negativeIs connected to one end of the switch Sh2 isAnd said switch Sh2 negativeThe other end of the switch S is respectively connected with one end of the singlechip unitg2Is passed through the transverse protection channel G2One end of the switch S is connected with one end of the singlechip unitg2Is passed through the transverse protection channel G2And the other end of the longitudinal power supply channel H2Connecting;
the switch Sh3 isThrough said longitudinal power supply channel H3And one end of the switch Sh3 negativeIs connected to one end of the switch Sh3 isAnd said switch Sh3 negativeThe other end of the switch is respectively connected with one end of the singlechip unitOff Sg3Is passed through the transverse protection channel G3One end of the switch S is connected with one end of the singlechip unitg3Is passed through the transverse protection channel G3And the other end of the longitudinal power supply channel H3Connecting;
……；
the switch Shi Zheng (medicine for treating hypertension)Through said longitudinal power supply channel HiAnd one end of the switch SHi negativeIs connected to one end of the switch Shi Zheng (medicine for treating hypertension)And said switch SHi negativeThe other end of the switch S is respectively connected with one end of the singlechip unitgiIs passed through the transverse protection channel GiOne end of the switch S is connected with one end of the singlechip unitgiIs passed through the transverse protection channel GiAnd the other end of the longitudinal power supply channel HiConnecting;
……；
the switch Shn justThrough said longitudinal power supply channel HnAnd one end of the switch Shn negativeIs connected to one end of the switch Shn justAnd said switch Shn negativeThe other end of the switch S is respectively connected with one end of the singlechip unitgnIs passed through the transverse protection channel GnOne end of the switch S is connected with one end of the singlechip unitgnIs passed through the transverse protection channel GnAnd the other end of the longitudinal power supply channel HnAnd (4) connecting.
6. The automatic switching device for the multichannel withstand voltage test according to claim 5, wherein: the interface is provided in a plurality.
7. The automatic switching device for the multichannel withstand voltage test according to claim 6, wherein: the single chip microcomputer unit is provided with a chip U1, a resistor R0, a resistor R1, a resistor R2, a resistor R3, a resistor R4, a resistor R5, a resistor R6, a resistor R7, a resistor R8, a polar capacitor C1 and a chip U2;
the pin 1 of the chip U1 is connected to one end of the resistor R1, the other end of the resistor R1 is connected to the pin 1 of the chip U2, the pin 2 of the chip U1 is connected to one end of the resistor R2, the other end of the resistor R2 is connected to the pin 2 of the chip U2, the pin 3 of the chip U1 is connected to one end of the resistor R3, the other end of the resistor R3 is connected to the pin 3 of the chip U2, the pin 4 of the chip U1 is connected to one end of the resistor R4, the other end of the resistor R4 is connected to the pin 4 of the chip U2, the pin 5 of the chip U1 is connected to one end of the resistor R5, the other end of the resistor R5 is connected to the pin 5 of the chip U2, the pin 6 of the chip U1 is connected to one end of the resistor R6, the other end of the resistor R6 is connected to the pin 6 of the chip U2, and the pin 6 of the resistor R1 is connected to one end of the pin 7, the other end of the resistor R7 is connected with a pin 7 of the chip U2, a pin 8 of the chip U1 is connected with one end of the resistor R8, the other end of the resistor R8 is connected with a pin 8 of the chip U2, a pin 9 of the chip U1 is grounded, and a pin 17 of the chip U1 is in communication connection with the upper computer through a serial port;
the 18 pins of the chip U2 and the longitudinal power channel H1Is connected with one end of the chip U2, pin 17 of the chip U2 and the longitudinal power channel H1Is connected with the other end of the chip U2, and the 16 feet of the chip U2 are connected with the transverse protection channel G1Is connected with one end of the chip U2, and the 15 feet of the chip U2 are connected with the longitudinal power supply channel H2Is connected with one end of the chip U2, the 14 feet of the chip U2 and the longitudinal power supply channel H2Is connected with the other end of the chip U2, and the 13 feet of the chip U2 are connected with the transverse protection channel G2Is connected with one end of the chip U2, the 12 feet of the chip U2 and the longitudinal power supply channel H3Is connected with one end of the chip U2, the pin 11 of the chip U2 is connected with the longitudinal power supply channel H3The other end of the connecting rod is connected.
8. The automatic switching device for the multichannel withstand voltage test according to claim 7, wherein: 1 chip U2 is arranged;
the longitudinal electricity in the circuit channelThe source channel H, the transverse protection channel G and the transverse interface channel L are respectively provided with 2, namely: l is1、L2、G1、G2、H1、H2Said switch Sh is justThe switch Sh is minusThe switch SgAre respectively provided with 2, namely Sh1 is、Sh2 is、Sh1 negative、Sh2 negative、Sg1、Sg2；
The 18 pin of the chip U2 is connected to one end of the H1 power channel, and the 17 pin of the chip U2 is connected to the H power channel1Is connected with the other end of the chip U2, and the 16 feet of the chip U2 are connected with the transverse protection channel G1Is connected with one end of the chip U2, and the 15 feet of the chip U2 are connected with the longitudinal power supply channel H2Is connected with one end of the chip U2, the 14 feet of the chip U2 and the longitudinal power supply channel H2Is connected with the other end of the chip U2, and the 13 feet of the chip U2 are connected with the transverse protection channel G2Is connected at one end.
9. The automatic switching device for the multichannel withstand voltage test according to claim 7, wherein: the 18 pin of the chip U2, the 17 pin of the chip U2, the 16 pin of the chip U2, the 15 pin of the chip U2, the 14 pin of the chip U2, the 13 pin of the chip U2, the 12 pin of the chip U2 and the 11 pin of the chip U2 are respectively and sequentially connected with one end of the longitudinal power supply channel H, the other end of the longitudinal power supply channel H and one end of the transverse protection channel G in a one-to-one correspondence mode;
m chips U2 are arranged, M is more than or equal to 2, and M is a positive integer;
defining M of said chips U2 as U2(1), U2(2), U2(3), … …, U2(i), … …, U2 (M);
wherein i is more than or equal to 1 and less than or equal to M;
in the circuit channel, the longitudinal power supply channel H, the transverse protection channel G and the transverse interface channel L are respectively provided with 3 channels, namely: l is1、L2、L3、G1、G2、G3、H1、H2、H3Said switch Sh is justThe switch Sh is minusThe switch SgAre respectively provided with 3, namely Sh1 is、Sh2 is、Sh3 is、Sh1 negative、Sh2 negative、Sh3 negative、Sg1、Sg2、Sg3；
The chip U2 is U2(1) and U2 (2);
a resistor R9, a resistor R10, a resistor R11, a resistor R12, a resistor R13, a resistor R14, a resistor R15, a resistor R16 and a resistor R17 which are in one-to-one correspondence with the 1 pin of the chip U2(2), the 2 pin of the chip U2(2), the 3 pin of the chip U2(2), the 4 pin of the chip U2(2), the 5 pin of the chip U2(2), the 6 pin of the chip U2(2), the 7 pin of the chip U2(2) and the 8 pin of the chip U2(2) are also arranged;
the 18 pins of the chip U2(1) and the longitudinal power channel H1Is connected with one end of the chip U2(1), the pin 17 of the chip U2(1) is connected with the longitudinal power supply channel H1Is connected with the other end of the chip U2(1), and the 16 feet of the chip U2(1) are connected with the transverse protection channel G1Is connected with one end of the chip U2(1), and the 15 feet of the chip U2(1) are connected with the longitudinal power supply channel H2Is connected with one end of the chip U2(1), the 14 feet of the chip U2(1) are connected with the longitudinal power supply channel H2Is connected with the other end of the chip U2(1), and the 13 feet of the chip U2(1) are connected with the transverse protection channel G2Is connected with one end of the chip U2(1), 12 pins of the chip U2(1) are connected with the longitudinal power supply channel H3Is connected with one end of the chip U2(1), and the 11 feet of the chip U2(1) are connected with the longitudinal power supply channel H3Is connected with the other end of the chip U2(2), and the 18 feet of the chip U2(2) are connected with the transverse protection channel G3Is connected to the first terminal of the chip U2(2), the pin 1 of the chip U2(2) is connected to the pin 9 of the chip U1 through the resistor R9, the pin 2 of the chip U2(2) is connected to the pin 10 of the chip U1 through the resistor R10, the pin 3 of the chip U2(2) is connected to the pin 11 of the chip U1 through the resistor R11, the pin 4 of the chip U2(2) is connected to the pin 12 of the chip U1 through the resistor R12, the pin 5 of the chip U2(2) is connected to the pin 13 of the chip U1 through the resistor R13, the pin 6 of the chip U2(2) is connected to the pin 14 of the chip U1 through the resistor R14, the pin 7 of the chip U2(2) is connected to the pin 15 of the chip U1 through the resistor R15, the pin 8 of the chip U2(2) is connected to the pin 16 of the chip U1 through the resistor R16, and the chip U1 is connected toThe 9 pins of the chip U2(2) are grounded, and the 10 pins of the chip U2(2) are connected with a power supply VCC through a resistor R17.
10. The automatic switching device for the multichannel withstand voltage test according to claim 9, wherein: when the number of the longitudinal power supply channels H, the number of the transverse protection channels G and the number of the transverse interface channels L are more than or equal to 6, the number of the single chip microcomputer units is multiple;
the model of the chip U1 is STM32, STC89C52 or AT89C51, and the model of the chip U2 is TD62083APG, HPBL400 or SPBL 400.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113533920A (en) * | 2021-09-13 | 2021-10-22 | 广东电网有限责任公司中山供电局 | Automatic withstand voltage test device and method for insulating partition plate |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113533920A (en) * | 2021-09-13 | 2021-10-22 | 广东电网有限责任公司中山供电局 | Automatic withstand voltage test device and method for insulating partition plate |
| CN113533920B (en) * | 2021-09-13 | 2022-01-25 | 广东电网有限责任公司中山供电局 | Automatic withstand voltage test device and method for insulating partition plate |
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