CN109253801B - Near-infrared polarization spectrum testing device and method - Google Patents
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Abstract
The invention discloses a near-infrared polarization spectrum testing device and method, and particularly relates to the field of near-infrared band optical communication. The method solves the problem that the existing channel modulation technology cannot meet the polarization spectrum test of narrow-band optical signals such as a laser light source, a DWDM combined light source and the like in high-speed optical communication. The near-infrared polarization spectrum testing device comprises a collimating objective lens, a high-speed polarization modulation assembly, a converging objective lens and an infrared scanning monochromator which are sequentially placed along a light path direction, the high-speed polarization modulation assembly and the infrared scanning monochromator are connected with a control and data processing system, the high-speed polarization modulation assembly comprises a first liquid crystal modulation phase retarder, a second liquid crystal modulation phase retarder and a near-infrared polarizing film which are sequentially arranged along an optical axis, and the infrared scanning monochromator comprises an incident slit, a polarization beam splitter, a wide-spectrum quarter wave plate, a reflective collimating objective lens, a planar holographic grating, a rotary stepping motor, a reflective converging objective lens, a reflective slit and a single-point detector which are sequentially arranged along the optical axis.
Description
Technical Field
The invention relates to the field of near-infrared band optical communication, in particular to a near-infrared polarization spectrum testing device and method.
Background
In the field of near-infrared band optical communication, with the development of wavelength division multiplexing, polarization multiplexing and orthogonal frequency division multiplexing technologies, the optical wave modulation technology is more complex, the difference of optical wave carriers corresponding to each path of signals is more subdivided, and the difference of spectral frequency is developed into the difference of polarization spectral frequency. This puts demands on polarization spectrum testing of the optical wave. The existing detection equipment such as a spectrum analyzer, an extinction ratio tester, a polarimeter and the like can only test single-dimensional light wave information, and test data can only reflect spectrum information or polarization state information, so that a more precise polarization spectrum form cannot be effectively tested.
The development of the polarization spectrum testing technology provides a new technical approach for near-infrared band optical communication testing, but the traditional modulation mode of the rotary polarization element has the defects of long testing time, complex control system, low modulation precision and the like, and the requirement for rapid polarization spectrum testing cannot be met. The Oka modulation component is adopted in the channel polarization modulation technology, so that the wide-spectrum Stokes polarization spectrum synchronous test can be realized, the method becomes a research hotspot of polarization spectrum modulation, and the method is widely applied to polarization spectrum tests of visible light and infrared bands. However, the channel modulation technology can only test the Stokes polarization spectrum information of a wide spectrum band, and cannot realize the narrow-bandwidth polarization spectrum information test, so that the polarization spectrum test of narrow-band optical signals such as a laser light source and a DWDM combined light source in high-speed optical communication cannot be met.
Disclosure of Invention
The invention aims to provide a near-infrared polarization spectrum testing device and a near-infrared polarization spectrum testing method capable of detecting spectrum information of a near-infrared band and polarization information of each spectrum band.
The invention specifically adopts the following technical scheme:
the utility model provides a near-infrared polarization spectrum testing arrangement, includes collimation objective, high-speed polarization modulation subassembly, convergence objective and the infrared scanning monochromator that place in proper order along the light path direction, high-speed polarization modulation subassembly and infrared scanning monochromator connection control and data processing system, high-speed polarization modulation subassembly includes first liquid crystal modulation phase retarder, second liquid crystal modulation phase retarder and the near infrared ray polaroid that sets gradually along the optical axis, and the infrared scanning monochromator includes incident slit, polarization beam splitter, wide-spectrum section quarter, reflective collimation objective, the holographic wave plate grating of plane, rotatory step motor, reflective convergence objective, reflection slit and the single point detector that set gradually along the optical axis.
Preferably, a light beam to be detected guided in by the optical fiber firstly passes through the collimating objective to form a parallel light beam, passes through the first liquid crystal modulation phase retardation plate, the second liquid crystal modulation phase retardation plate and the near infrared polarizing plate, is converged by the converging objective and then enters an incident slit in the infrared scanning monochromator, stray light is filtered out, and then the diverging light beam sequentially passes through the polarization beam splitter, the wide-spectrum quarter-wave plate, the reflective collimating objective, the planar holographic grating and the reflective converging objective, is converged on the reflective slit, is reflected by the reflective slit, and then sequentially passes through the reflective converging objective, the planar holographic grating, the reflective collimating objective, the wide-spectrum quarter-wave plate and the polarization beam splitter to enter the single-point detector.
Preferably, the first liquid crystal modulation phase retarder and the second liquid crystal modulation phase retarder realize the adjustment of the phase from 0 to pi in the detected near infrared band by changing the magnitude of the applied voltage or current.
Preferably, an included angle between the fast axis direction of the first liquid crystal modulation phase retarder in the high-speed polarization modulation assembly and the reference direction x is 0 °, an included angle between the fast axis direction of the second liquid crystal modulation phase retarder and the reference direction x is 45 °, and an included angle between the light passing axis direction of the near-infrared polarizing plate and the reference direction x is 0 °.
A near-infrared polarization spectrum testing method adopts the near-infrared polarization spectrum testing device, and comprises the following steps:
the method comprises the following steps: the light beam to be measured guided in by the optical fiber firstly passes through the collimating objective to form a parallel light beam and enters the high-speed polarization modulation component;
step two: after entering the high-speed polarization modulation assembly, the parallel light beams sequentially pass through a first liquid crystal modulation phase retarder, a second liquid crystal modulation phase retarder and a near infrared polarizing film; under the action of a control and data processing system, the phase delay amounts of the first liquid crystal modulation phase delay sheet and the second liquid crystal modulation phase delay sheet sequentially generate (0, 0), (0, pi/2) and (pi/2 );
step three: the emergent light beam of the high-speed polarization modulation component is converged by the convergent objective lens and then enters the infrared scanning monochromator, passes through the incident slit, the polarization beam splitter, the wide-spectrum quarter-wave plate, the reflective collimating objective lens, the planar holographic grating and the reflective convergent objective lens, is converged on the reflective slit, is reflected by the reflective slit, then sequentially passes through the reflective convergent objective lens, the planar holographic grating, the reflective collimating objective lens, the wide-spectrum quarter-wave plate and the polarization beam splitter, enters the single-point detector, and the wavelength lambda is obtained0Lower four polarized light intensity values I1(λ0)，I2(λ0)，I3(λ0) And I4(λ0) Corresponding to the phases of the first and second LC modulated phase retardersThe bit delay amounts are (0, 0), (0, pi/2) and (pi/2 );
step four: the control and data processing system controls a rotary stepping motor in the infrared scanning monochromator and controls the precise stepping rotation of the planar holographic grating, and the single-point detector sequentially obtains four polarized light intensity numerical values I corresponding to different wavelengths1(λ)，I2(λ)，I3(lambda) and I4(lambda)), the phase retardation amounts respectively corresponding to the first liquid crystal modulation phase retardation plate and the second liquid crystal modulation phase retardation plate are combined into (0, 0), (0, pi/2), (pi/2 ), and the polarization spectrum information S of the test light beam is calculated according to the formula (1) from the obtained four groups of polarized light intensity values0(λ)，S1(λ)，S2(lambda) and S3(λ)：
The invention has the following beneficial effects:
the testing method based on the near-infrared polarization spectrum testing device can quickly test the spectrum polarization information of the optical communication waveband, can realize quick polarization modulation, and can realize high-speed detection of the polarization information under the condition of single wavelength; complete polarization spectrum information in a near infrared wide spectrum band can be obtained.
Drawings
Fig. 1 is a schematic structural diagram of a near-infrared polarization spectrum testing device.
Wherein: the system comprises a collimating objective lens 1, a high-speed polarization modulation component 2, a first liquid crystal modulation phase retarder 21, a second liquid crystal modulation phase retarder 22, a near infrared polarizing plate 23, a converging objective lens 3, an infrared scanning monochromator 4, an incident slit 41, a polarization beam splitter 42, a wide-band quarter-wave plate 43, a reflective collimating objective lens 44, a planar holographic grating 45, a rotary stepping motor 46, a reflective converging objective lens 47, a reflective slit 48, a single-point detector 49 and a control and data processing system 5.
Detailed Description
The following description of the embodiments of the present invention will be made with reference to the accompanying drawings:
as shown in fig. 1, a near-infrared polarization spectrum testing device includes a collimating objective 1, a high-speed polarization modulation component 2, a converging objective 3, and an infrared scanning monochromator 4, which are sequentially disposed along a light path direction, the high-speed polarization modulation component 2 and the infrared scanning monochromator 4 are connected to a control and data processing system 5, the high-speed polarization modulation component 2 includes a first liquid crystal modulation phase retarder 21, a second liquid crystal modulation phase retarder 22, and a near-infrared polarizing plate 23, which are sequentially disposed along an optical axis, and the infrared scanning monochromator 4 includes an incident slit 41, a polarization beam splitter 42, a wide-spectrum quarter-wave plate 43, a reflective collimating objective 44, a planar holographic grating 45, a rotary stepping motor 46, a reflective converging objective 47, a reflective slit 48, and a single-point detector 49, which are sequentially disposed along the optical axis.
The light beam to be detected guided by the optical fiber firstly passes through the collimating objective 1 to form a parallel light beam, passes through the first liquid crystal modulation phase retarder 21, the second liquid crystal modulation phase retarder 22 and the near infrared polarizing plate 23, is converged by the converging objective 3, then enters the incident slit 41 in the infrared scanning monochromator 4, and is filtered of stray light, and then the diverging light beam sequentially passes through the polarization beam splitter 42, the wide-spectrum quarter-wave plate 43, the reflective collimating objective 44, the planar holographic grating 45 and the reflective converging objective 47, is converged on the reflective slit 48, is reflected by the reflective slit 48, and then sequentially passes through the reflective converging objective 47, the planar holographic grating 45, the reflective collimating objective 44, the wide-spectrum quarter-wave plate 43 and the polarization beam splitter 42, and enters the single-point detector 49.
The first liquid crystal modulation phase retarder 21 and the second liquid crystal modulation phase retarder 22 realize the adjustment of the phase from 0 to pi in the detected near infrared band by changing the magnitude of the applied voltage or current.
In the high-speed polarization modulation assembly, an included angle between the fast axis direction of the first liquid crystal modulation phase retarder 21 and the reference direction x is 0 degree, an included angle between the fast axis direction of the second liquid crystal modulation phase retarder 21 and the reference direction x is 45 degrees, and an included angle between the fast axis direction of the near infrared polarizing plate 23 and the reference direction x is 0 degree.
A near-infrared polarization spectrum testing method adopts the near-infrared polarization spectrum testing device, and comprises the following steps:
the method comprises the following steps: the detection light beam guided in by the optical fiber firstly passes through a collimating objective to form a parallel light beam and enters a high-speed polarization modulation component;
step two: after entering the high-speed polarization modulation assembly, the parallel light beams sequentially pass through a first liquid crystal modulation phase retarder, a second liquid crystal modulation phase retarder and a near infrared polarizing film; under the action of a control and data processing system, the phase delay amounts of the first liquid crystal modulation phase delay sheet and the second liquid crystal modulation phase delay sheet sequentially generate (0, 0), (0, pi/2) and (pi/2 );
step three: the light beam emitted by the high-speed polarization modulation component 2 is converged by the converging objective lens 3 and enters the infrared scanning monochromator, is converged on the reflecting slit 48 through the incident slit 41, the polarization beam splitter 42, the wide-spectrum quarter-wave plate 43, the reflective collimator objective lens 44, the planar holographic grating 44 and the reflective converging objective lens 45, is reflected by the reflecting slit 48, sequentially passes through the reflective converging objective lens 47, the planar holographic grating 45, the reflective collimator objective lens 44, the wide-spectrum quarter-wave plate 43 and the polarization beam splitter 42, enters the single-point detector, and the wavelength lambda is obtained0Lower four polarized light intensity values I1(λ0)，I2(λ0)，I3(λ0) And I4(λ0) The phase retardation combinations respectively corresponding to the first liquid crystal modulation phase retardation plate and the second liquid crystal modulation phase retardation plate are (0, 0), (0, pi/2) and (pi/2 );
step four: the control and data processing system 5 controls a rotary stepping motor in the infrared scanning monochromator and controls the precise stepping rotation of the planar holographic grating, and the single-point InGaAs detector sequentially acquires four polarized light intensity numerical values I corresponding to different wavelengths1(λ)，I2(λ)，I3(lambda) and I4(λ)), the phase retardation amounts corresponding to the first liquid crystal modulation phase retardation plate and the second liquid crystal modulation phase retardation plate are respectively combined to be (0, 0), (0, pi/2), (pi/2 ), and the phase retardation amounts are obtained byThe Stokes polarization spectrum information S of the test light beam is calculated according to the formula (1) by the four groups of polarized light intensity values0(λ)，S1(λ)，S2(lambda) and S3(λ)：
It is to be understood that the above description is not intended to limit the present invention, and the present invention is not limited to the above examples, and those skilled in the art may make modifications, alterations, additions or substitutions within the spirit and scope of the present invention.
Claims (2)
1. A near-infrared polarization spectrum testing device is characterized by comprising a collimating objective lens, a high-speed polarization modulation assembly, a converging objective lens and an infrared scanning monochromator which are sequentially arranged along a light path direction, wherein the high-speed polarization modulation assembly and the infrared scanning monochromator are connected with a control and data processing system;
the light beam to be detected guided in by the optical fiber firstly passes through the collimating objective to form a parallel light beam, the parallel light beam passes through the first liquid crystal modulation phase retarder, the second liquid crystal modulation phase retarder and the near infrared polarizing film, then is converged by the converging objective and enters an incidence slit in the infrared scanning monochromator, stray light is filtered out, and then the diverging light beam sequentially passes through the polarization beam splitter, the wide-spectrum-segment quarter-wave plate, the reflective collimating objective, the plane holographic grating and the reflective converging objective, is converged on the reflection slit, is reflected by the reflection slit, and then sequentially passes through the reflective converging objective, the plane holographic grating, the reflective collimating objective, the wide-spectrum-segment quarter-wave plate and the polarization beam splitter to enter the single-point detector;
the first liquid crystal modulation phase delay piece and the second liquid crystal modulation phase delay piece realize the adjustment of the phase from 0 to pi in the detected near-infrared band by changing the magnitude of the applied voltage or current;
the included angle between the fast axis direction of the first liquid crystal modulation phase retarder and the reference direction x in the high-speed polarization modulation assembly is 0 degree, the included angle between the fast axis direction of the second liquid crystal modulation phase retarder and the reference direction x is 45 degrees, and the included angle between the light transmission axis direction of the near infrared polarizing film and the reference direction x is 0 degree.
2. A near-infrared polarization spectrum test method using the near-infrared polarization spectrum test apparatus according to claim 1, comprising:
the method comprises the following steps: the light beam to be measured guided in by the optical fiber firstly passes through the collimating objective to form a parallel light beam and enters the high-speed polarization modulation component;
step two: after entering the high-speed polarization modulation assembly, the parallel light beams sequentially pass through a first liquid crystal modulation phase retarder, a second liquid crystal modulation phase retarder and a near infrared polarizing film; under the action of a control and data processing system, the phase delay amounts of the first liquid crystal modulation phase delay sheet and the second liquid crystal modulation phase delay sheet sequentially generate (0, 0), (0, pi/2) and (pi/2 );
step three: the emergent light beam of the high-speed polarization modulation component is converged by the convergent objective lens and then enters the infrared scanning monochromator, passes through the incident slit, the polarization beam splitter, the wide-spectrum quarter-wave plate, the reflective collimating objective lens, the planar holographic grating and the reflective convergent objective lens, is converged on the reflective slit, is reflected by the reflective slit, then sequentially passes through the reflective convergent objective lens, the planar holographic grating, the reflective collimating objective lens, the wide-spectrum quarter-wave plate and the polarization beam splitter, enters the single-point detector, and the wavelength lambda is obtained0Lower four polarized light intensity values I1(λ0)，I2(λ0)，I3(λ0) And I4(λ0) Corresponding to the phases of the first and second LC modulated phase retardersThe bit delay amounts are (0, 0), (0, pi/2) and (pi/2 );
step four: the control and data processing system controls a rotary stepping motor in the infrared scanning monochromator and controls the precise stepping rotation of the planar holographic grating, and the single-point detector sequentially obtains four polarized light intensity numerical values I corresponding to different wavelengths1(λ)，I2(λ)，I3(lambda) and I4(lambda)), the phase retardation amounts respectively corresponding to the first liquid crystal modulation phase retardation plate and the second liquid crystal modulation phase retardation plate are combined into (0, 0), (0, pi/2), (pi/2 ), and the polarization spectrum information S of the test light beam is calculated according to the formula (1) from the obtained four groups of polarized light intensity values0(λ)，S1(λ)，S2(lambda) and S3(λ)：
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| CN113340424B (en) * | 2021-06-18 | 2022-09-27 | 上海国科航星量子科技有限公司 | Device and method for detecting performance of polarized light |
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