CN108961234A - A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm - Google Patents

A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm Download PDF

Info

Publication number
CN108961234A
CN108961234A CN201810694749.9A CN201810694749A CN108961234A CN 108961234 A CN108961234 A CN 108961234A CN 201810694749 A CN201810694749 A CN 201810694749A CN 108961234 A CN108961234 A CN 108961234A
Authority
CN
China
Prior art keywords
phase
wavelength
light field
conditions
under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810694749.9A
Other languages
Chinese (zh)
Inventor
赵彦
吴永前
刘锋伟
肖向海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Optics and Electronics of CAS
Original Assignee
Institute of Optics and Electronics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Optics and Electronics of CAS filed Critical Institute of Optics and Electronics of CAS
Priority to CN201810694749.9A priority Critical patent/CN108961234A/en
Publication of CN108961234A publication Critical patent/CN108961234A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30148Semiconductor; IC; Wafer

Abstract

The invention discloses a kind of transmissive elements defect detecting devices and method based on multi-wavelength iterative algorithm.The present invention passes through in multi-wavelength gradient advanced iterative phase recovery algorithms experimental provision, 150nm or more is reached using adjustable band range and solid state laser of good performance forms seven kinds of different wave length incident lights, several scattered light intensity figures after defect transmission are acquired by detector;Incident optical input surface Wave-front phase face information is carried out using plot of light intensity of the multi-wavelength gradient advanced phase recovery iterative algorithm Phase Retrieve Algorithm to acquisition to restore;It obtains incident optical input surface Wave-front phase face information and then calculates to obtain width, the elevation information of defect.Algorithm resume speed is fast in the present invention, and detection accuracy is high, and fixed station acquisition diffraction pattern avoids mobile optical path, the defects detection suitable for transmissive elements.

Description

A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm
Technical field
The invention belongs to technical field of optical detection, especially a kind of transmissive elements based on multi-wavelength iterative algorithm are lacked Fall into detection device and method.
Background technique
As integrated circuit technique rapidly develops with rapid changepl. never-ending changes and improvementsly, the U.S., Europe, Japan, South Korea and Taiwan There are increasingly higher demands Deng to integrated circuit board groove minimum widith precision.In the manufacture production of integrated circuit board, i.e., The dust pollution of nm magnitude, impurity particle, bulge, pit is set to appear in substrate surface or be imbedded in inside multilayer film or mask table Face can all cause photoetching sample serious defect occur, generate waste product.The powder injection molding of integrated circuit board has been next-generation One of the bottleneck of photoetching technique development needs effective efficiently detection method.Therefore, road is commercialized in industries such as photoetching at present On, have detection and the imaging system of the defect of high speed, high resolution to guarantee that flawless mask is essential, institute It is also become more and more important with the research for defect detecting technique.
The phase recovery theory of non-interfering method refers to the diffraction theory using light, carries out Diffraction Calculation to input face light field, Output face optical field distribution is obtained, its intensity data is compared with actual measurement output face distribution of light intensity data, is converted and is imitated with energy Rate maximum, the minimum criterion of error are calculated by algorithm and find the phase distribution for being best suitable for input light field.Compared to conventional interference Detection method, non-interfering detection method have the advantage that (1) based entirely on intensity signal measurement;(2) only need to measure single light path without The superposition of multichannel space optical path need to be detected;(3) the resulting field information of non-interfering method is more smooth than interference fringe, therefore can reduce Instrumental resolution requires to belong to succinct, stable, feasible, effective method without losing relevant information.Iterative method is to apply at present Widest non-interfering phase recovery method, essence are constantly to convert between airspace and frequency domain, and utilize data measured (more For intensity signal) airspace, frequency domain are limited, control algolithm error is constantly decreased to phase information and moves closer to right value.
The present invention proposes a kind of kind of a transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm, uses The mode of non-contact measurement avoids the damage to spherical mirror surface to be measured under conditions of guaranteeing measurement accuracy.It is installed on Fixed station acquisition diffraction pattern avoids mobile optical path in measurement process.On the basis of conventional multi-wavelength iterative algorithm, angular spectrum is introduced Diffraction transmission theory and gradient advanced function propose the phase recovery that can carry out quick high accuracy to complex light field, realize accurate Detection.
Summary of the invention
The purpose of the present invention is to provide a kind of transmissive elements defect detecting device based on multi-wavelength iterative algorithm and It is defeated to carry out incident light using plot of light intensity of the multi-wavelength gradient advanced phase recovery iterative algorithm Phase Retrieve Algorithm to acquisition for method Phase face information is restored before entering surface wave;It obtains incident optical input surface Wave-front phase face information and then calculates to obtain the width of defect Degree, elevation information.Algorithm resume speed is fast in the present invention, and detection accuracy is high, and fixed station acquisition diffraction pattern avoids mobile light Road, the defects detection suitable for transmissive elements.
Realize the technical solution of the object of the invention are as follows:
A kind of transmissive elements defect detecting device based on multi-wavelength iterative algorithm, comprising: tunable solid laser, Laser alignment mirror, diaphragm, transmissive element to be measured, detector;All optical elements are coaxially contour relative to substrate, i.e., relatively It is coaxially contour in optical platform or instrument base;The fixed wave length light beam that tunable solid laser issues, through laser quasi direct expansion Shu Jing is extended to the collimation directional light of angle pencil of ray, after diaphragm limits, on the surface that projects transmissive element to be measured, through transmission member A distance is transmitted after part surface defect diffraction to be irradiated on detector, collects the intensity image of diffraction transmission.
The transmissive elements defect detecting device based on multi-wavelength iterative algorithm, wherein tunable solid laser Tunable formation different wave length incident light, the distribution of light intensity image that acquisition different wave length is detected in same position.
A kind of multi-wavelength gradient advanced iterative phase recovery algorithms introduce angle on the basis of conventional multi-wavelength iterative algorithm Diffraction transmission theory and gradient advanced function are composed, the phase recovery of quick high accuracy, implementation step can be carried out to complex light field It is as follows:
Step (1), known n wavelength are in same position output face optical field amplitude information A1, A2……An
Step (2) takes λ1Under the conditions of output light field amplitude known quantity A1, and initial phase φ is given at random1, exported Light field U1
Step (3), by λ1Under the conditions of output light field U1It is transmitted back to input face using angular spectrum transmission inverse operation, obtains λ1Condition Lower input light field Uo1
Step (4) updates phase in input faceo2, obtain λ2Under the conditions of input light field Uo2
Step (5) is transferred to output face using angular spectrum transmission operation, obtains λ2Under the conditions of output light field U2, and replace its vibration Width amount is known quantity A2, it is constant to retain phase mass;
Step (6) is successively transmitted to λnUnder the conditions of output light field Un
Step (7), by λnUnder the conditions of output light field UnIt is transmitted back to input face using angular spectrum transmission inverse operation, obtains λnCondition Lower input light field Uon;Phase is updated in input faceo(n-1), obtain λn_1Under the conditions of input light field Uo(n-1)
Step (8) is transferred to output face using angular spectrum transmission operation, obtains λn_1Under the conditions of output light field Un-1, and replace Its amplitude amount is known quantity An-1, it is constant to retain phase mass;
Step (9) is successively transmitted back to λ1, obtain the output light field U' after one cycle1, obtain its phaseReplacement Amplitude is known quantity A1
Step (10) will work as secondary phase iterative valueWith last iteration valueDifference hkAs gradient direction, by αkMake For iteration added value, λ after being updated1Under the conditions of output light field phaseAlgorithm gradient step is increased, to accelerate to restrain Speed;
Step (11) repeats step (2)-step (10), until the error of amplitude reaches design accuracy or reaches setting Maximum number of iterations when terminate iteration, the output light field U that will be finally obtainedk+1 1Being transmitted back to input face iteration terminates;It obtains defeated Enter its phase value of face, and use and it is calculated by the PhaseUnwrapQMG phase unwrapping function of matlab software programming, Finally obtain the phase distribution information of input face.
Transmissive elements defect inspection method based on multi-wavelength iterative algorithm is calculated using described based on multi-wavelength iteration The transmissive elements defect detecting device of method, transmissive elements defect detection procedure are as follows:
Step (A1), tunable solid laser difference generation wavelength are λ1, λ2……λ7Seven kinds of incident lights, by test Optical path obtains the 7 width diffraction intensity figures by object under test.
7 width diffraction intensity figures are converted to gray level image by RGB image by step (A2), are uniformly normalized to 0 To 1,7 kinds of wavelength are obtained in same position output face optical field amplitude information A1, A2……A7
Step (A3), by output face optical field amplitude information A1, A2……A7Bring the recovery of multi-wavelength gradient advanced iterative phase into Algorithm obtains the phase distribution information △ φ of object under testm(x)。
Step (A4), according to formula:
△φm(x)=2 π △ h (x)/λm(nobj-nair)
It can be calculated object under test dimension information △ h (x).N in formulaobjFor sample refractive index, nairFor air refraction.
Compared with prior art, the present invention its remarkable advantage:
(1) it by the way of non-contact measurement under conditions of guaranteeing measurement accuracy, avoids to spherical mirror table to be measured The damage in face.
(2) most optical superposition are not necessarily to using non-interfering detection method, low to optical system for testing coherence requirement, it is convenient to detect.
(3) it is installed on fixed station acquisition diffraction pattern, avoids mobile optical path in measurement process.
(4) on the basis of conventional multi-wavelength iterative algorithm, angular spectrum diffraction transmission theory and gradient advanced function are introduced, is proposed Multi-wavelength gradient advanced iterative phase recovery algorithms, compare with conventional multi-wavelength Iterative restoration algorithm, mention in convergence rate High 2 times or more, the opposite root-mean-square value of recovery accuracy reach 10-3The order of magnitude.
Detailed description of the invention
Fig. 1 is the transmissive elements defect detecting device figure based on multi-wavelength iterative algorithm;
Fig. 2 is multi-wavelength gradient advanced phase recovery iterative algorithm algorithm flow chart;
Fig. 3 is letter e load diffraction intensity figure in the embodiment of the present invention;
Fig. 4 is letter e load phase face restoration result in the embodiment of the present invention;
Fig. 5 is revised letter e load phase recovery result in the embodiment of the present invention.
In figure: 1 is tunable solid laser, and 2 be laser alignment mirror, and 3 be diaphragm, and 4 be transmissive element to be measured, 5 For detector.
Specific embodiment
With reference to the accompanying drawing and specific embodiment present invention is further described in detail.
As shown in Figure 1, a kind of transmissive elements defect detecting device based on multi-wavelength iterative algorithm, comprising: tunable Solid state laser 1, laser alignment mirror 2, diaphragm 3, transmissive element to be measured 4, detector 5;All optical elements are relative to base Bottom is coaxially contour, i.e., coaxially contour relative to optical platform or instrument base;The fixed wave length that tunable solid laser 1 issues Light beam is extended to the collimation directional light of angle pencil of ray through laser alignment mirror 2, after the limitation of diaphragm 3, projects transmission member to be measured On the surface of part 4, a distance is transmitted after transmissive element surface defect diffraction and is irradiated on detector 5, collect diffraction biography Defeated intensity image.
The transmissive elements defect detecting device based on multi-wavelength iterative algorithm, wherein tunable solid laser 1 tunable formation different wave length incident light, the distribution of light intensity image that acquisition different wave length is detected in same position.
A kind of multi-wavelength gradient advanced iterative phase recovery algorithms introduce angle on the basis of conventional multi-wavelength iterative algorithm Diffraction transmission theory and gradient advanced function are composed, the phase recovery of quick high accuracy, algorithm flow can be carried out to complex light field Figure is as shown in Figure 2, the specific steps are as follows:
Step (1), known n wavelength are in same position output face optical field amplitude information A1, A2……An
Step (2) takes λ1Under the conditions of output light field amplitude known quantity A1, and initial phase φ is given at random1, exported Light field U1
Step (3), by λ1Under the conditions of output light field U1It is transmitted back to input face using angular spectrum transmission inverse operation, obtains λ1Condition Lower input light field Uo1
Step (4) updates phase in input faceo2, obtain λ2Under the conditions of input light field Uo2
Step (5) is transferred to output face using angular spectrum transmission operation, obtains λ2Under the conditions of output light field U2, and replace its vibration Width amount is known quantity A2, it is constant to retain phase mass;
Step (6) is successively transmitted to λnUnder the conditions of output light field Un
Step (7), by λnUnder the conditions of output light field UnIt is transmitted back to input face using angular spectrum transmission inverse operation, obtains λnCondition Lower input light field Uon;Phase is updated in input faceo(n-1), obtain λn-1Under the conditions of input light field Uo(n-1)
Step (8) is transferred to output face using angular spectrum transmission operation, obtains λn-1Under the conditions of output light field Un-1, and replace Its amplitude amount is known quantity An-1, it is constant to retain phase mass;
Step (9) is successively transmitted back to λ1, obtain the output light field U' after one cycle1, obtain its phaseReplacement Amplitude is known quantity A1
Step (10) will work as secondary phase iterative valueWith last iteration valueDifference hkAs gradient direction, by αkMake For iteration added value, λ after being updated1Under the conditions of output light field phaseAlgorithm gradient step is increased, to accelerate to restrain Speed;
Step (11) repeats step (2)-step (10), until the error of amplitude reaches design accuracy or reaches setting Maximum number of iterations when terminate iteration, the output light field U that will be finally obtainedk+1 1Being transmitted back to input face iteration terminates;It obtains defeated Enter its phase value of face, and use and it is calculated by the PhaseUnwrapQMG phase unwrapping function of matlab software programming, Finally obtain the phase distribution information of input face.
Transmissive elements defect inspection method based on multi-wavelength iterative algorithm, transmissive elements defect detection procedure are as follows:
It is λ that step (A1) tunable solid laser, which distinguishes generation wavelength,1, λ2……λ7Seven kinds of incident lights, by test light Rood to pass through object under test 7 width diffraction intensity figures.
7 width diffraction intensity figures are converted to gray level image by RGB image by step (A2), are uniformly normalized to 0 To 1,7 kinds of wavelength are obtained in same position output face optical field amplitude information A1, A2……A7
Step (A3) is by output face optical field amplitude information A1, A2……A7Bring the recovery of multi-wavelength gradient advanced iterative phase into Algorithm obtains the phase distribution information △ φ of object under testm(x)。
Step (A4) is according to formula:
△φm(x)=2 π △ h (x)/λm(nobj-nair)
It can be calculated object under test dimension information △ h (x).N in formulaobjFor sample refractive index, nairFor air refraction.
Embodiment
To a transmissive element in the present embodiment --- alphabetical e load, which is coated with certain thickness on a glass, impermeable The alphabetical region e penetrated.The fixed wave length light beam that tunable solid laser issues, is extended to angle pencil of ray through laser alignment mirror Collimation directional light, after diaphragm limits, on the surface that projects letter e load to be measured, through transmissive element surface defect diffraction Transmission 15mm is irradiated on detector afterwards.
The measurement method of the transmissive elements defect detecting device based on multi-wavelength iterative algorithm, transmissive elements Defect detection procedure are as follows:
(1) tunable solid laser difference generation wavelength be 470nm, 500nm, 530nm, 550nm, 580nm, 600nm, Seven kinds of incident lights of 630nm obtain the 7 width diffraction intensity figures by object under test by optical system for testing, such as scheme shown in (3).
(2) 7 width diffraction intensity figures are converted into gray level image by RGB image, are uniformly normalized to 0 to 1, obtain To 7 kinds of wavelength in same position output face optical field amplitude information A1, A2……A7
(3) by output face optical field amplitude information A1, A2……A7Bring multi-wavelength gradient advanced iterative phase recovery algorithms into, Obtain the phase distribution information △ φ of object under testm(x).When for 470nm wavelength, using multi-wavelength gradient advanced phase recovery Iterative algorithm Phase Retrieve Algorithm is to input face phase shape recovery result as shown in figure (4).It subtracts obtained by the phase information of corrugated Revised resolving power test target phase information is as shown in figure (5).
(4) sample refractive index nobj=1.516, according to formula:
△φm(x)=2 π △ h (x)/λm(nobj-nair)
The thickness information that can be calculated alphabetical e is 0.325 μm.

Claims (4)

1. a kind of transmissive elements defect detecting device based on multi-wavelength iterative algorithm characterized by comprising tunable solid Body laser (1), laser alignment mirror (2), diaphragm (3), transmissive element to be measured (4), detector (5);Tunable solid swashs Light device (1), laser alignment mirror (2), diaphragm (3), transmissive element to be measured (4), detector (5) are coaxial etc. relative to substrate Height, i.e., it is coaxially contour relative to optical platform or instrument base;The fixed wave length light beam that tunable solid laser (1) issues, It is extended to the collimation directional light of angle pencil of ray through laser alignment mirror (2), after diaphragm (3) limitation, projects transmission member to be measured On the surface of part (4), a distance is transmitted after transmissive element surface defect diffraction and is irradiated on detector (5), collects and spreads out Penetrate the intensity image of transmission.
2. the transmissive elements defect detecting device according to claim 1 based on multi-wavelength iterative algorithm, feature exist In wherein the tunable formation different wave length incident light of tunable solid laser (1), acquisition different wave length are visited in same position The distribution of light intensity image of survey.
3. a kind of multi-wavelength gradient advanced iterative phase recovery algorithms, which is characterized in that on conventional multi-wavelength iterative algorithm basis On, angular spectrum diffraction transmission theory and gradient advanced function are introduced, the phase recovery of quick high accuracy can be carried out to complex light field, Realize that steps are as follows:
Step (1), known n wavelength are in same position output face optical field amplitude information A1, A2……An
Step (2) takes λ1Under the conditions of output light field amplitude known quantity A1, and initial phase φ is given at random1, obtain output light field U1
Step (3), by λ1Under the conditions of output light field U1It is transmitted back to input face using angular spectrum transmission inverse operation, obtains λ1Under the conditions of it is defeated Enter light field Uo1
Step (4) updates phase in input faceo2, obtain λ2Under the conditions of input light field Uo2
Step (5) is transferred to output face using angular spectrum transmission operation, obtains λ2Under the conditions of output light field U2, and replace its amplitude amount For known quantity A2, it is constant to retain phase mass;
Step (6) is successively transmitted to λnUnder the conditions of output light field Un
Step (7), by λnUnder the conditions of output light field UnIt is transmitted back to input face using angular spectrum transmission inverse operation, obtains λnUnder the conditions of it is defeated Enter light field Uon;Phase is updated in input faceo(n-1), obtain λn_1Under the conditions of input light field Uo(n-1)
Step (8) is transferred to output face using angular spectrum transmission operation, obtains λn_1Under the conditions of output light field Un_1, and replace its vibration Width amount is known quantity An_1, it is constant to retain phase mass;
Step (9) is successively transmitted back to λ1, obtain the output light field U' after one cycle1, obtain its phaseReplace amplitude For known quantity A1
Step (10) will work as secondary phase iterative valueWith last iteration valueDifference hkAs gradient direction, by αkAs repeatedly For added value, λ after being updated1Under the conditions of output light field phaseAlgorithm gradient step is increased, to accelerate convergence rate;
Step (11) repeats step (2)-step (10), until the error of amplitude reaches design accuracy or reaches setting most Terminate iteration when big the number of iterations, the output light field U that will be finally obtainedk+1 1Being transmitted back to input face iteration terminates;Obtain input face Its phase value, and using being calculated by the PhaseUnwrapQMG phase unwrapping function of matlab software programming it, finally Obtain the phase distribution information of input face.
4. the transmissive elements defect inspection method based on multi-wavelength iterative algorithm, using described in claim 1 or 3 based on more The transmissive elements defect detecting device of wavelength iterative algorithm, it is characterised in that: transmissive elements defect detection procedure are as follows:
Step (A1), tunable solid laser difference generation wavelength are λ1, λ2……λ7Seven kinds of incident lights, by optical system for testing Obtain the 7 width diffraction intensity figures by object under test;
7 width diffraction intensity figures are converted to gray level image by RGB image by step (A2), are uniformly normalized to 0 to 1, 7 kinds of wavelength are obtained in same position output face optical field amplitude information A1, A2……A7
Step (A3), by output face optical field amplitude information A1, A2……A7Multi-wavelength gradient advanced iterative phase is brought into restore to calculate Method obtains the phase distribution information △ φ of object under testm(x);
Step (A4), according to formula:
△φm(x)=2 π △ h (x)/λm(nobj-nair)
It can be calculated object under test dimension information △ h (x), n in formulaobjFor sample refractive index, nairFor air refraction.
CN201810694749.9A 2018-06-29 2018-06-29 A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm Pending CN108961234A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810694749.9A CN108961234A (en) 2018-06-29 2018-06-29 A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810694749.9A CN108961234A (en) 2018-06-29 2018-06-29 A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm

Publications (1)

Publication Number Publication Date
CN108961234A true CN108961234A (en) 2018-12-07

Family

ID=64487921

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810694749.9A Pending CN108961234A (en) 2018-06-29 2018-06-29 A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm

Country Status (1)

Country Link
CN (1) CN108961234A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112326601A (en) * 2020-10-15 2021-02-05 中国科学院上海光学精密机械研究所 Single exposure phase recovery imaging device and imaging method

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102089616A (en) * 2008-06-03 2011-06-08 焕·J·郑 Interferometric defect detection and classification
EP2508951A1 (en) * 2001-09-03 2012-10-10 Thomas Swan & Co. Ltd. Optical processing of multi-wavelengths signals
CN103487887A (en) * 2013-10-10 2014-01-01 核工业理化工程研究院 Device for integrating and transmitting different-wavelength multi-path lasers and use method thereof
CN104034257A (en) * 2014-06-14 2014-09-10 中国科学院光电技术研究所 Device and method for measuring synchronous phase shifting interference of Fizeau quasi-common optical path structure
US20150077760A1 (en) * 2013-09-03 2015-03-19 Universitat Stuttgart Robust One-Shot Interferometer and OCT Method for Material Measurement and Tumor Cell Recognition
CN104504735A (en) * 2015-01-15 2015-04-08 中南大学 Matter distribution detection method based on phase retrieval
CN107036711A (en) * 2017-03-20 2017-08-11 中国科学院上海光学精密机械研究所 Multi-wavelength is combined light field on-line measurement device and measuring method
CN107388959A (en) * 2017-07-19 2017-11-24 哈尔滨工程大学 Three wavelength digital holographic detection devices and method based on transmission-type point diffraction
CN107655405A (en) * 2017-08-29 2018-02-02 南京理工大学 The method that axial range error between object and CCD is eliminated using self-focusing iterative algorithm
CN108122797A (en) * 2016-11-29 2018-06-05 上海微电子装备(集团)股份有限公司 A kind of 3D detection devices

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2508951A1 (en) * 2001-09-03 2012-10-10 Thomas Swan & Co. Ltd. Optical processing of multi-wavelengths signals
CN102089616A (en) * 2008-06-03 2011-06-08 焕·J·郑 Interferometric defect detection and classification
US20150077760A1 (en) * 2013-09-03 2015-03-19 Universitat Stuttgart Robust One-Shot Interferometer and OCT Method for Material Measurement and Tumor Cell Recognition
CN103487887A (en) * 2013-10-10 2014-01-01 核工业理化工程研究院 Device for integrating and transmitting different-wavelength multi-path lasers and use method thereof
CN104034257A (en) * 2014-06-14 2014-09-10 中国科学院光电技术研究所 Device and method for measuring synchronous phase shifting interference of Fizeau quasi-common optical path structure
CN104504735A (en) * 2015-01-15 2015-04-08 中南大学 Matter distribution detection method based on phase retrieval
CN108122797A (en) * 2016-11-29 2018-06-05 上海微电子装备(集团)股份有限公司 A kind of 3D detection devices
CN107036711A (en) * 2017-03-20 2017-08-11 中国科学院上海光学精密机械研究所 Multi-wavelength is combined light field on-line measurement device and measuring method
CN107388959A (en) * 2017-07-19 2017-11-24 哈尔滨工程大学 Three wavelength digital holographic detection devices and method based on transmission-type point diffraction
CN107655405A (en) * 2017-08-29 2018-02-02 南京理工大学 The method that axial range error between object and CCD is eliminated using self-focusing iterative algorithm

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
MASAHIRO YOSHIMOTO等: "Defect detection in recrystallized ultra-shallow implanted silicon by multiwavelength-excited photoluminescence", 《AIP CONFERENCE PROCEEDINGS》 *
VLADIMIR KATKOVNIK 等: "Multiwavelength Absolute Phase Retrieval from Noisy Diffractive Patterns: Wavelength Multiplexing Algorithm", 《APPLIED SCIENCES》 *
刘锋伟等: "随机相移误差的Lissajous标定与校正", 《光电工程》 *
赵彦: "基于多波长迭代算法的极紫外光刻掩模检测关键技术研究", 《中国优秀博硕士学位论文全文数据库(硕士)_信息科技辑》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112326601A (en) * 2020-10-15 2021-02-05 中国科学院上海光学精密机械研究所 Single exposure phase recovery imaging device and imaging method

Similar Documents

Publication Publication Date Title
US8472013B2 (en) Refractive index distribution measurement method and apparatus that measure transmission wavefronts of a test object immersed in different media having refractive index lower than that of the test object
CN103335819B (en) A kind of apparatus and method for the optical detection of high precision prism of corner cube
CN102829733B (en) Fringe contrast ratio-adjustable large-numerical value bore diameter point-diffraction interference device and method
Zhang et al. Optical free-form surfaces testing technologies
CN103217126B (en) A kind of solar groove type condenser surface testing system and method
CN103134445A (en) Wide-range high-precision facial contour detection device and detection method thereof
CN102878935B (en) Device and method for measuring optical off-plane displacement field based on shearing speckle interference
CN105091769A (en) Strain measuring method based on Moire fringe phase analysis
CN103383247A (en) Optical detection system and device
CN110702026A (en) Flatness three-dimensional shape detection device based on complex beam angle adaptive optics and processing method thereof
CN108961234A (en) A kind of transmissive elements defect detecting device and method based on multi-wavelength iterative algorithm
CN111397634B (en) High-resolution interference detection device and method for thermal deformation of fixed end surface of star sensor
CN103529650B (en) A kind of height measuring device and measuring method thereof
CN103292730A (en) Detection method and device for high precision reference sphere
CN103439868A (en) Device and method for measuring numerical aperture of projection objective
CN106895784B (en) A kind of computed hologram and preparation method thereof based on liquid crystal material
CN103398666B (en) A kind of dislocation of the interlayer for double-deck periodic micro structure method of testing
Liu et al. Development of a nanometer resolution flatness measurement system for the ceramic surface by using Blue-ray optical pickup
CN201724658U (en) System for measuring three dimensional surface shape of an object by electronic speckle phase shift technology
CN103196390A (en) Method for eliminating circular symmetry phase computer-generated holography substrate fringe pattern distortion
Chang et al. Binary fringe pattern in infrared phase measuring deflectometry
CN114295203A (en) Vortex intensity measuring device and method for vortex light beam
CN108955546B (en) Triangle micro-displacement measuring device and method are interfered in laser phase shift
Wu et al. An in situ method to evaluate the waviness of rounded cutting edge of diamond tool
Shuqin et al. Experiment study on all-fiberized tandem pump broadband superfluorescent fiber source based on single stage Yb-doped fiber [J]

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20181207

WD01 Invention patent application deemed withdrawn after publication