CN108956945B - Chip stack structure analysis test equipment - Google Patents
Chip stack structure analysis test equipment Download PDFInfo
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- CN108956945B CN108956945B CN201810666240.3A CN201810666240A CN108956945B CN 108956945 B CN108956945 B CN 108956945B CN 201810666240 A CN201810666240 A CN 201810666240A CN 108956945 B CN108956945 B CN 108956945B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/24—Earth materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N2015/0288—Sorting the particles
Abstract
The invention discloses a chip stacking body structure analysis test device, which comprises a sampling tube, a tube seal and a rubber ring; the tube seal and the rubber ring are used for sealing the tube orifice of the sampling tube after sampling; the device also comprises an iron connecting piece, a magnet and a transparent plate; the lower part of the iron connecting piece is connected to the upper part of the sampling tube; the magnetite is located the upper surface of transparent plate, with the upper portion centre gripping of iron connecting piece at the lower surface of transparent plate. The method has the beneficial effects that the blank of fine accumulation structure analysis of the clastic bodies in landslide physical model tests is filled, and the deep discussion of the accumulation mechanism of the clastic bodies in the type of physical model tests is possible. The device has simple structure and convenient assembly and disassembly, and greatly simplifies the manufacturing and operation difficulty of the device while meeting the test operation. The test equipment has high cost performance and high operation flexibility, can meet the functional requirements of the test with low cost, and is convenient for mass production and widely popularized and used.
Description
Technical Field
The invention relates to the technical field of landslide geological disaster related tests, in particular to a piece accumulation body structure analysis test device.
Background
The giant rock collapse-chip flow belongs to one of landslide disasters, a high-steep rock mountain body is subjected to rock mass instability damage under the induction of external factors such as earthquake, rainfall or manual damage, and is broken in the process of moving downwards at a high speed under the action of gravity to form chip flow, and the chip flow is finally accumulated at the slope toe of the mountain body, so that great threat is often formed to important structures and personnel safety at the downstream, and a catastrophic event is caused. The accumulation process of the high-speed chip flow is always a research hotspot of scholars at home and abroad, and the physical model test is an important means for revealing the accumulation mechanism of the chip body at present, however, the implementation of the test technology is greatly limited by equipment, and effective and reasonable test equipment is particularly important for test results.
The research results of the existing giant karst collapse-chip flow show that the chip flow interacts with a movement path in a high-speed remote process and is influenced by the topographic relief of a stacking area to form different stacking landforms and stacking structures, and the difference of the internal structures of the stacking bodies is important geological evidence for researching the movement mechanism of the chip flow and has important influence on the evolution of subsequent secondary disasters. For example, an inverted particle order structure of "fine lower particles and coarse upper particles" in the crumb body may promote greater distance of movement of the crumb flow; for example, the debris flow often blocks the valley to form a landslide dam, so that the river is interrupted to form a barrier lake, and the internal structures such as particle sizes, particle size grading and the like of different depths of the debris flow accumulation bodies at different positions directly control the stability of the landslide dam, so that the seepage field and the dam-break mode in the dam body are affected. Therefore, it is particularly important to sample the vertical stack structure of the debris flow stack at various critical locations.
In the current indoor chute test, the analysis of the scrap stacking body in the scrap flow simulation mainly comprises the steps of carrying out naked eye observation on the surface of the stacking body, roughly dividing the stacking body into areas and screening the stacking body in layers to obtain the grain size grading of the stacking body, and the characteristics of the real stacking structure and the vertical grain size distribution in the stacking body can not be directly observed. And rough zoning and layered screening can not obtain internal structural characteristics of a pile body, fine sampling and particle size analysis can not be carried out on chips at key positions, and the test requirements can not be met far. Therefore, a reasonable device is urgently needed for the chip flow physical model test to effectively sample the chip stacking body and directly observe the internal stacking structure, and meanwhile, the grain size grading of the key position is obtained, so that the analysis requirement of the real structure in the chip stacking body is met, and the precision and the rationality of the test structure are improved.
Disclosure of Invention
The invention aims to provide test equipment for analyzing the microstructure of a chip stacking body in a landslide physical model test, so as to solve the problem of how to effectively collect a chip body sample and intuitively display the vertical stacking structural characteristics in the chip body, and further accurately obtain the grain size grading of different positions of the chip body.
The technical scheme for realizing the purpose of the invention is as follows:
a chip stack structure analysis test device comprises a sampling tube, a tube seal and a rubber ring; the tube seal and the rubber ring are used for sealing the tube orifice of the sampling tube after sampling; the device also comprises an iron connecting piece, a magnet and a transparent plate; the lower part of the iron connecting piece is connected to the upper part of the sampling tube; the magnetite is located the upper surface of transparent plate, with the upper portion centre gripping of iron connecting piece at the lower surface of transparent plate.
Further, the device also comprises a strengthening magnet; the magnetism of the reinforced magnet is opposite to that of the magnet, and the lower part of the reinforced magnet is connected to the upper part of the iron connecting piece; the magnet is used for clamping the upper part of the reinforced magnet on the lower surface of the transparent plate.
Further, the tube seal comprises a sealing piece matched with the tube orifice of the sampling tube, and the edge of the sealing piece is connected with a semicircular fixing piece matched with the side face of the sampling tube.
Further, the iron connecting piece is provided with a vent hole.
Further, the sampling tube and the transparent plate are provided with scale marks; the upper part of the iron connecting piece is closed, and the upper surface is a plane and is provided with a cross-shaped standard center; the middle part of the magnet is provided with an opening. If the reinforced magnet is provided, an opening is also arranged in the middle of the reinforced magnet.
Further, at least one pair of non-ferrous material handles are symmetrically arranged on the side edges of the transparent plate.
Further, the sampling tube and the transparent plate are both made of glass materials.
The invention has the advantages that,
(1) Fills the blank of fine accumulation structure analysis of the crumb body in landslide physical model test, and provides possibility for deep discussion of crumb body accumulation mechanism in the type of physical model test.
(2) The test equipment has simple structure and convenient assembly and disassembly, and greatly simplifies the equipment manufacture and operation difficulty while meeting the test operation.
(3) The cost performance of the test equipment is high, the adopted raw materials are common low-price materials, the materials are convenient to obtain, the self-control is easy, the repeated use is realized, the operation flexibility is high, the functional requirements of the test can be met with low cost, and the test equipment is convenient for mass production and widely popularized and used.
Drawings
Fig. 1 is a top isometric view of the overall structure of the present invention.
Fig. 2 is a bottom isometric view of the overall structure of the present invention.
Fig. 3 is an exploded view of the present invention.
Fig. 4 is a schematic structural view of the iron connecting member.
Fig. 5-1, 5-2 and 5-3 are schematic illustrations of the sampling device being freely adjustable in a horizontal position.
In the figure: 1-sampling device, 11-sampling tube (with scale), 12-tube seal, 13-rubber ring (rib), 2-connecting device, 21-iron connecting piece, 211-rectangular vent hole 1, 212-rectangular vent hole 2, 213-threaded bolt hole, 22-bolt, 23-strong magnet, 3-sampling point control device, 31-glass plate (with scale), 32-handle, 33-bolt (with rubber washer), 34-nut.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the following description of the embodiments of the present invention will be given with reference to the accompanying drawings.
Referring to fig. 1 and 2, the invention provides a fine structural analysis test device for a chip accumulation body, which comprises three component units of a sampling device 1, a connecting device 2 and a sampling point control device 3, wherein the detailed structures of the three component units are as follows:
referring to fig. 3, the sampling device 1 includes a sampling tube (containing graduations) 11, a tube seal 12, and a rubber band (bead) 13. The tube seal 12 is horizontally inserted into the tube orifice and is closed, and the sampling tube (containing scales) 11 and the tube seal 12 are fastened by a rubber ring (rib) 13, so that the tube seal 12 cannot fall off. The top of the sampling tube (with scales) 11 is provided with a bolt hole which is connected with the connecting device 2 through a bolt 22.
The tube seal in the sampling device is horizontally inserted into the tube bottom, the optimal shape of the circular ring at the upper part of the tube seal is a semicircle, and the full contact area between the tube seal and the rubber ring can be ensured when the tube seal is horizontally inserted into the tube bottom. The tube seals are stainless steel sheets of higher strength and height but less mass.
The rubber band comprises two kinds of high-strength rubber bands or high-strength rubber bands: the rubber ring can be sleeved at the top of the sampling tube in advance, and after the sampling tube is sampled and horizontally inserted into the tube seal, the rubber ring is moved from the top to the bottom so as to fix the tube seal; the rubber band is used for winding the tube seal for a plurality of times and knotting after the tube seal is inserted, so that the tube seal is fastened at the tube orifice of the sampling tube.
Referring to fig. 3 and 4, the connecting device 2 includes a ferrous connecting member 21, a bolt 22, and a strong magnet 23. The iron joint 21 includes 2 pairs of rectangular vent holes 211 and 212 (4 in total), and the center lines of the two pairs of rectangular vent holes are perpendicular to each other and no longer coplanar, and are vertically offset in the tube axis direction. The two pairs of rectangular holes can realize air pressure intercommunication between the inside and the outside of the sampling tube, ensure that gas in the sampling tube can be timely discharged when the sampling tube is pressed down, and reduce the pressing resistance. The central connecting lines of the two pairs of rectangular holes are mutually perpendicular but not on the same plane, and are in a vertically staggered state, so that the strength of the position of the opening of the connecting piece can be prevented from being greatly reduced.
The iron connecting piece 21 contains 4 screw thread form bolt holes 213, and the position one-to-one of bolt hole 213 and sampling tube (including scale) 11 top bolt hole, and the screw thread of bolt hole 213 and bolt 22 assorted, accessible screwdriver rotation installation and dismantlement. The screw connection hole of the iron connecting piece needs to be set into a thread shape, the thread is matched with the screw, the glass sampling tube can be provided with no thread, and local fracture of the sampling tube is avoided.
The top of the iron connecting piece is a closed entity, a large suction contact surface is guaranteed between the iron connecting piece and the strong magnet, and if the suction force is insufficient, the magnet with the opposite magnetic pole to the strong magnet can be installed at the top of the connecting piece to increase the suction force, so that the connecting piece is guaranteed to be effectively connected with the sampling point control device.
The top of the iron connecting piece is provided with a cross-shaped standard center, and the iron connecting piece can be accurately positioned with scale marks on a glass plate with scales.
Referring to fig. 3, the sampling point control device 3 is composed of a glass plate (containing graduations) 31, a handle 32, a bolt (containing rubber washers) 33, and a nut 34. One sampling point control device 3 contains at least a pair of symmetrically arranged handles (2), a single handle 32 contains 4 bolt holes, and the bolt holes correspond one-to-one to the bolt hole positions on the glass plate 31. A bolt (rubber-containing washer) 33 works in cooperation with a nut 34 to connect the handle 32 with the glass plate 31.
The sampling point control device at least comprises 2 handles, the handles are symmetrically arranged in pairs, and the specific number of the handles depends on the size of the glass plate. The handle and the glass plate are preferably bolted by bolts, and rubber gaskets are arranged at the upper and lower positions of the glass plate, so that the glass plate is prevented from being locally damaged due to bolt fastening. The handle and the bolt are made of non-ferrous materials (such as wood and ceramics) so as to avoid interaction with the strong magnets in the connecting device.
The sampling tube comprises the following steps: firstly, taking out the tube seal 12, vertically inserting the transparent sampling tube 11 into the chip stacking body, after inserting the sampling tubes at all key positions, connecting the sampling tube 11 with the sampling point control device 3 through the connecting device 2, then removing the chip outside the sampling tube, horizontally and transversely inserting the tube seal 12 into the lower end of the sampling tube 11, and fastening a closed port by using the rubber band 13 to finish the sampling.
The sampling point position control and adjustment operation in the test equipment is as follows: the iron connecting piece 21 is fastened at a certain design position of a glass plate (containing scales) 31 by utilizing the suction force between the iron connecting piece 21 and the strong magnet 23, and then the sampling device 1 is tightly connected with the connecting device 2 by utilizing the bolts 22, so that the specific sampling point position of the sampling device 1 in the chip accumulation body can be controlled; when the sampling point position changes, the powerful magnet 23 is moved to drive the iron connecting piece 21 to freely move in the range of the glass plate (containing scales) 31, so that the sampling requirement of the chip stacking body with different stacking characteristics is met. As shown in fig. 5-1, 5-2 and 5-3, the free horizontal movement and any shape arrangement of the sampling device 1 within the glass plate (with graduations) 31 can be achieved. Of course, the achievable arrangement states are not limited to the 3 states shown in fig. 5.
According to the technical scheme, the main functions of the invention are as follows:
(1) Fixed point sampling of the crumb stack: and chip body samples at key position points can be selected at fixed points for different chip stacks through a sampling point control device, so that basic data is provided for fine analysis of a stacking structure.
(2) Intuitively display the fine structure of the crumb stack: the sampling tube is provided with scales, the scale size can be selected according to the grading of the test particle size, and the vertical microscopic structure of the piled body at a certain point can be directly presented to a tester, recorded by utilizing technologies such as shooting and the like, and can be further deeply analyzed by an electron microscope technology.
(3) Precisely analyzing the grain size grading of the crumb aggregate: after the direct analysis of the microscopic structure of the chip stacking body is completed, the chip body in the sampling tube can be equally divided into a plurality of parts in height by controlling the sampling tube seal, and then screening analysis is carried out on each part, so that the grain size grading distribution rule of each key point of the chip stacking body in the vertical direction is deeply analyzed.
The main technical innovation points of the invention include: the position of the sampling point can be freely adjusted, the pipe orifice of the sampling pipe can be effectively closed, the sampling pipe can be conveniently assembled and disassembled, and the method is as follows:
(1) The positions of sampling points can be freely adjusted, and for stacking bodies in different forms, sampling points focused by test staff are different, so that the glass plate in a sample point control device is required to realize horizontal free movement, and the magnet and iron connecting piece have stronger suction force, so that the glass plate can be separated to realize effective fixed connection of the sampling points and realize free movement;
(2) The sampling pipe orifice can be effectively sealed, and because the friction force between the chip body and the side wall of the sampling pipe is small, effective sealing treatment is required after the sampling is finished, the pipe seal is horizontally inserted in the sampling device, so that excessive leakage of the chip body is avoided as much as possible, and the chip body is fastened by using a strong rubber band;
(3) The sampling tube can be conveniently assembled and disassembled, and can be integrally inserted or independently inserted when being inserted, and finally can be integrally lifted or independently lifted after the sampling is finished, so that the sampling tube and the connecting device are required to be conveniently assembled and disassembled.
Claims (5)
1. The chip stack structure analysis test device is characterized by comprising a sampling tube, a tube seal and a rubber ring; the tube seal and the rubber ring are used for sealing the tube orifice of the sampling tube after sampling; the device also comprises an iron connecting piece, a magnet and a transparent plate; the lower part of the iron connecting piece is connected to the upper part of the sampling tube; the magnet is positioned on the upper surface of the transparent plate, and the upper part of the iron connecting piece is clamped on the lower surface of the transparent plate; the device also comprises a strengthening magnet; the magnetism of the reinforced magnet is opposite to that of the magnet, and the lower part of the reinforced magnet is connected to the upper part of the iron connecting piece; the upper part of the reinforcing magnet is clamped on the lower surface of the transparent plate by the magnet; the tube seal comprises a sealing piece matched with the tube orifice of the sampling tube, and the edge of the sealing piece is connected with a semicircular fixing piece matched with the side face of the sampling tube.
2. A crumb stack structure analysis test device according to claim 1, wherein said iron connection is provided with a vent.
3. The debris accumulation body structure analysis test apparatus as claimed in claim 1, wherein said sampling tube and said transparent plate are each provided with graduation marks; the upper part of the iron connecting piece is closed, and the upper surface is a plane and is provided with a cross-shaped standard center; openings are formed in the middle of the magnet and the middle of the strengthening magnet.
4. A crumb stack structure analysis test device according to claim 1, wherein said transparent plate is further provided symmetrically on its sides with at least one pair of handles of non-ferrous material.
5. The debris accumulation body structure analysis test apparatus of claim 1, wherein said sampling tube and transparent plate are both of glass material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201810666240.3A CN108956945B (en) | 2018-06-22 | 2018-06-22 | Chip stack structure analysis test equipment |
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| CN201810666240.3A CN108956945B (en) | 2018-06-22 | 2018-06-22 | Chip stack structure analysis test equipment |
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| CN108956945A CN108956945A (en) | 2018-12-07 |
| CN108956945B true CN108956945B (en) | 2023-06-27 |
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| CN113591409B (en) * | 2021-08-04 | 2023-12-26 | 中国科学院、水利部成都山地灾害与环境研究所 | Method for determining natural stacking morphological characteristic parameters of chip flow by considering particle composition |
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