CN108919086B - Method and device for programming key value based on 1553B bus circuit - Google Patents
Method and device for programming key value based on 1553B bus circuit Download PDFInfo
- Publication number
- CN108919086B CN108919086B CN201711448956.8A CN201711448956A CN108919086B CN 108919086 B CN108919086 B CN 108919086B CN 201711448956 A CN201711448956 A CN 201711448956A CN 108919086 B CN108919086 B CN 108919086B
- Authority
- CN
- China
- Prior art keywords
- key value
- programming
- circuit
- key
- retesting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
Abstract
A1553B bus circuit-based method for programming key values sequentially comprises the following steps of searching key values, retesting the key values, fine-tuning the key values, programming the key values and retesting the key values: searching for an amplitude key value, searching for a rising and falling time key value, searching for and outputting a symmetrical key value, retesting an amplitude key value, fine-tuning an amplitude key value, searching for a threshold key value, retesting an amplitude key value, retesting a rising and falling time key value, retesting an output symmetrical key value, retesting a threshold key value, burning an amplitude key value, burning a rising and falling time key value, burning an output symmetrical key value, burning a writing threshold key value, retesting a burning amplitude key value, retesting a rising and falling time key value, retesting a burning output symmetrical key value, and retesting a burning threshold key value. The invention also comprises a device for programming the key value based on the 1553B bus circuit.
Description
Technical Field
The invention relates to a method for burning key values by a 1553B bus circuit, in particular to a method and a device for realizing automatic anti-fuse key value burning based on the 1553B bus circuit.
Background
The 1553B bus circuit is concerned by people with the advantages of high speed, high reliability and the like, and has wide application prospect in the fields of weapon systems, aerospace, modern national defense and the like. In recent years, with the enhancement of the requirement of the localization of 1553B bus circuits, urgent needs are brought to the reduction of cost and the improvement of test efficiency.
However, the 1553B bus circuit has more test parameters, and the parameters are correlated with each other, which increases the test complexity, and at present, each parameter mainly takes manual test as a main parameter, and the test efficiency is low and the cost is high. The method is particularly obvious in the aspect of searching for antifuse burning key values, 32-bit key values are involved in the antifuse test writing process, and the key values can affect four parameter indexes such as circuit symmetry, rising and falling time, amplitude, threshold value and the like. Although each parameter corresponds to a different key value, the change of the key value of one parameter can correspondingly affect the change of other parameters, and the work needs to be manually carried out after a large amount of data is fumbled. The search and programming of the antifuse key values of the 1 1553B bus circuit are completed at present, and about 30 minutes of simultaneous work of three persons is needed.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the defects of the prior art are overcome, and a method for programming key values based on a 1553B bus circuit is provided. First, given an initial key value that ensures that a functional 1553B circuit has an amplitude output, and also allows the search algorithm to optimize, if there is no amplitude output, indicating that the circuit is malfunctioning. And secondly, respectively searching the key values corresponding to the four parameters according to a certain sequence, after the searching is finished, retesting the key values, if indexes exceeding the required range are found, carrying out corresponding fine tuning and retesting, if the retesting meets the requirement, carrying out programming test, and if the retesting does not meet the requirement, judging as a failure circuit. Meanwhile, the invention also provides a device for programming key values based on the 1553B bus circuit.
The purpose of the invention is realized by the following technical scheme:
A1553B bus circuit-based method for programming key values sequentially comprises the following steps of searching key values, retesting the key values, fine-tuning the key values, programming the key values and retesting the key values: searching for an amplitude key value, searching for a rising and falling time key value, searching for and outputting a symmetrical key value, retesting an amplitude key value, fine-tuning an amplitude key value, searching for a threshold key value, retesting an amplitude key value, retesting a rising and falling time key value, retesting an output symmetrical key value, retesting a threshold key value, burning an amplitude key value, burning a rising and falling time key value, burning an output symmetrical key value, burning a writing threshold key value, retesting a burning amplitude key value, retesting a rising and falling time key value, retesting a burning output symmetrical key value, and retesting a burning threshold key value.
In the method for programming the key value based on the 1553B bus circuit, the specific steps of searching the key value are as follows:
step one, setting an initial key value, then trying to write the initial key value, and then measuring the initial key value; if the initial key value is larger than or equal to 10V, switching to the step II; otherwise, judging that the circuit is abnormal in function, and turning to the third step;
step two, comparing the initial key value measured in the step one with a set index requirement; if the measured initial key value does not meet the set index requirement, adjusting the trial writing key value by using a dichotomy until the key value meeting the set index requirement is found, and then switching to the third step; otherwise, judging that the circuit is invalid or unqualified, and turning to the third step;
and step three, searching key values.
The method for programming the key value based on the 1553B bus circuit comprises the following steps of: the searched key values are subjected to test writing, and whether the output symmetry, the rising and falling time, the amplitude and the threshold are qualified or not is respectively tested and judged; and if the circuit is qualified, programming can be carried out, otherwise, the circuit is judged to be unqualified.
The method for programming the key value based on the 1553B bus circuit comprises the following steps of: respectively testing and judging whether the output symmetry, the rising and falling time, the amplitude and the threshold are qualified or not by sending an excitation signal to a circuit to be tested; if the circuit is qualified, the programming work is finished, otherwise, the circuit is judged to be unqualified.
In the above method for programming a key value based on a 1553B bus circuit, the initial key value in the first step is 0XBEFB5F 7F.
In the method for programming the key value based on the 1553B bus circuit, the initial key value in the first step is 32 bits, the amplitude value corresponds to B13-B18 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b13, B15, B16, B17, B14, B18.
In the method for programming key values based on the 1553B bus circuit, the initial key value in the first step is 32 bits, the rising and falling time corresponds to B7-B12 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b8, B7, B9, B10, B11, B12.
In the method for programming key values based on the 1553B bus circuit, in the first step, the initial key value is 32 bits, the output symmetry corresponds to the B1-B6 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b1, B2, B3, B4, B5, B6.
In the method for programming key values based on the 1553B bus circuit, the initial key value in the first step is 32 bits, the threshold corresponds to B19-B24 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b19, B20, B21, B22, B23, B24.
In the method for programming the key values based on the 1553B bus circuit, each key value is programmed for 5 times; the first three times of programming voltage is 9V, the programming time is 3ms, the circuit working voltage is 5V, the second two times of programming voltage is 9.5V, the programming time is 3ms, and the circuit working voltage is 5.2V.
A device based on 1553B bus circuit programming key values is used for searching key values, retesting key values, fine tuning key values, programming key values and retesting programming key values and comprises a main control computer, a BT module, an FM module, an oscilloscope and a UUT module; the UUT module comprises a circuit to be tested;
the main control computer is used for issuing an excitation signal instruction to the BT module, issuing a trial writing key value instruction to the FM module and issuing a measurement excitation signal instruction to the oscilloscope, and simultaneously acquiring data measured by the oscilloscope; the BT module outputs an excitation signal to a circuit to be tested on the UUT module according to an excitation signal instruction issued by the main control computer; the FM module outputs a trial-writing key value to a circuit to be tested on the UUT module according to a trial-writing key value instruction issued by the main control computer; and the oscilloscope measures the excitation signal of the circuit to be tested on the UUT module according to the measurement excitation signal instruction issued by the main control computer.
Compared with the prior art, the invention has the following beneficial effects:
(1) the invention provides an operation sequence of a method for realizing automatic anti-fuse programming key values based on a 1553B bus circuit, in particular to search key values, retest key values, programming key values and retest key values;
(2) according to the invention, an initial key value is given, the initial value can ensure that the 1553B circuit with the function has amplitude output, and the search algorithm can achieve the optimal effect;
(3) the invention summarizes the summarized full-automatic key value searching and test writing method on the basis of a large amount of practical experience, thereby avoiding errors generated in manual test work and improving the reliability of the test;
(4) the automatic search testing method needs about 10 minutes to complete the search and programming of the whole A, B channel, and the efficiency is improved by about 2 times compared with the manual search and programming of the whole A, B channel, which needs about 30 minutes; the manual trial writing needs three people to cooperate to complete searching and programming work, and a platform embedded with the improved automatic trial writing method can simultaneously control a plurality of devices by 1 person, so that manpower is liberated. The invention reduces time cost and labor cost to a great extent.
Drawings
FIG. 1 is a system diagram of a method for implementing automatic antifuse key-value programming based on a 1553B bus circuit according to the present invention;
FIG. 2 is a flow chart of an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
Fig. 1 is a system block diagram of an implementation method for automatically programming key values based on a 1553B bus circuit in an anti-fuse manner, wherein a main control computer implements functions of issuing commands, communicating data, and the like, and a BT module (bus test module) is used for receiving commands from the main control computer and generating different excitation signals to a circuit to be tested on a UUT module (circuit unit module to be tested) according to the commands issued by the main control computer; the UUT module is a circuit module comprising a circuit to be tested and peripheral devices of the circuit to be tested; the FM module (anti-fuse programming module) is an anti-fuse circuit excitation signal generation module, can receive an instruction issued by the main control computer, and outputs different trial writing key values to a circuit to be tested on the UUT module according to the instruction issued by the main control computer.
The specific working process is explained by taking the search trial writing of the output symmetric key value as an example, in the process of the key value trial writing, firstly, the main control computer can send a trial writing instruction of the key value to the FM module, the FM module sends the key value to the circuit to be tested on the UUT module, after the trial writing of the key value is finished, the main control computer can send measurement instructions of the output symmetry and the like to the BT module, the BT module generates a corresponding excitation signal to the circuit to be tested on the UUT module, the main control computer controls the oscilloscope to complete the measurement of the circuit to be tested under the output symmetric excitation signal and collects data of the oscilloscope, the main control computer judges the collected output symmetric data, if the requirement is met, the trial writing of the key value of the next parameter is carried out, otherwise, the next trial writing key value is adjusted according to a dichotomy according to the test result. If the measurement results corresponding to all the key values of the dichotomy do not meet the requirements, the circuit is judged to fail because the circuit cannot find the key value which meets the requirements and outputs symmetry.
The trial writing of the key values of the rising and falling time, the amplitude and the threshold parameter is the same as the trial writing method of the key value of the output symmetry, and the detailed description is omitted here.
The sequence of the search key value, the retest key value, the fine adjustment key value, the programming key value and the retest programming key value is as follows: searching for an amplitude key value, searching for a rising and falling time key value, searching for and outputting a symmetrical key value, retesting an amplitude key value, fine-tuning an amplitude key value, searching for a threshold key value, retesting an amplitude key value, retesting a rising and falling time key value, retesting an output symmetrical key value, retesting a threshold key value, burning an amplitude key value, burning a rising and falling time key value, burning an output symmetrical key value, burning a writing threshold key value, retesting a burning amplitude key value, retesting a rising and falling time key value, retesting a burning output symmetrical key value, and retesting a burning threshold key value.
Fig. 2 is a flowchart illustrating an embodiment of the present invention, which includes the following steps:
(1) setting a 32-bit initial key value, testing the amplitude parameter under the key value, and setting the key value, in combination with circuit parameters and manual test experience, as follows: 0XBEFB5F7F, which ensures that the algorithm search efficiency is optimal and that functional circuits must have waveforms generated. After setting the initial value, trial writing an initial value key value, measuring the amplitude of the initial value key value, if the amplitude is less than 10V, stopping searching, otherwise, proving that the basic function of the circuit is normal, and continuing to execute the step (2);
(2) searching and trial writing of the amplitude key value is carried out; comparing the measurement results under different trial writing key values with the index requirement range, if the test writing key values are not qualified, adjusting the trial writing key values according to the measurement results by using a dichotomy method until the key values meeting the requirements are found, or the key values meeting the requirements are not found after the key values are traversed; if the amplitude key value meeting the requirement is not found until the search is completed, judging that the circuit is invalid, otherwise, executing the step (3);
(3) after finding the amplitude key value meeting the qualified conditions, performing trial writing of the ascending and descending time key value, wherein the specific steps are the same as the step (2);
(4) after finding the rising and falling time key value meeting the qualified conditions, carrying out trial writing of outputting a symmetry key value, wherein the specific steps are the same as the step (2);
(5) carrying out magnitude key value retest, if the magnitude key value is still in the required range, executing the step (6), otherwise, searching the magnitude key value again, and if the magnitude key value still does not meet the requirements, judging that the circuit is unqualified;
(6) performing trial writing of the threshold value key value, wherein the specific steps are the same as the step (2);
(7) before programming, retesting the found key value before programming, namely performing test writing on the found final key value, respectively testing parameters such as output symmetry, rise-fall time, amplitude, threshold value and the like, judging whether the parameters are qualified or not, if so, performing programming work, otherwise, judging that the circuit is unqualified;
(8) and after the key value is retested before being programmed and meets the requirement, performing value-robust programming. The main control computer sends the programming key value to the FM module, the FM module performs 5 times of programming on each key value at most, the programming conditions corresponding to the first three times are programming voltage 9V, circuit working voltage 5V, the programming voltage corresponding to the last two times is 9.5V, and the working voltage is 5.2V, if the low level is not programmed below 0.4V after the 5 times of programming, the shutdown programming is performed, and the corresponding key value programming failure is prompted. If the programming is successful, executing the step (9);
(9) after the key value is successfully programmed, the key value needs to be retested after being programmed. The method comprises the steps that a main control computer sends test instructions of output symmetry, rise-fall time, amplitude, threshold values and the like to a BT module, the BT module generates corresponding excitation to a circuit to be tested on a UUT module, then the main control computer controls an oscilloscope to measure the output symmetry, the rise-fall time, the amplitude and the threshold values of the circuit to be tested and judges whether the measurement results meet requirements or not, and if the measurement results of four parameters after programming all meet the qualified conditions, the circuit successfully completes key value test writing programming work. Otherwise, judging that the key value retest does not meet the qualified condition and the circuit is unqualified.
The amplitude value of the 32-bit key value corresponds to B13-B18 bits, and the bit sequence with successively weakened adjustment degrees is as follows: b13, B15, B16, B17, B14, B18. And coding according to the adjusted sequence, determining a search range [ A, B ] of the dichotomy algorithm, wherein the values of A, B are all represented in a binary form, the value A corresponding to the minimum amplitude is 000000 in the case of all adjustments, and the value B corresponding to the maximum amplitude is 111111 in the case of no adjustment.
The rising and falling time of the 32-bit key value corresponds to B7-B12 bits, the index can only be adjusted to be large, and the bit sequence with sequentially weakened adjustment degrees is as follows: b8, B7, B9, B10, B11 and B12, coding according to the adjusted sequence, and determining the search range [ A, B ] of the dichotomy algorithm, wherein A is 000000 and corresponds to the maximum rise-fall time, and B is 111111 and corresponds to the minimum rise-fall time.
B1-B6 bits correspond to symmetry in 32-bit key values, wherein B1 is adjusted towards a larger direction, B2-B6 are adjusted towards a smaller direction, and the adjustment degrees are reduced in sequence. Before symmetry trial writing, trial writing is carried out by using key values after amplitude searching and rising and falling time are carried out to determine the size of a symmetry index so as to determine the search range, wherein if the value of symmetry is smaller than the lower limit of the range of the symmetry qualified index, A is 000000, and B is 011111; if the value of symmetry is greater than the upper limit of the symmetry-passing index range, a is 100000 and B is 111111.
The threshold value in the 32-bit key value corresponds to B19-B24 bits, the threshold voltage can only be adjusted to be small, and the bit sequence with sequentially weakened adjustment degrees is as follows: b19, B20, B21, B22, B23, B24. And (4) according to the adjusted sequence codes, determining a search range [ A, B ] of the dichotomy algorithm, wherein A is 000000 and corresponds to the minimum threshold voltage, and B is 111111 and corresponds to the maximum threshold voltage.
A device for automatically programming key values of anti-fuses based on a 1553B bus circuit is used for searching key values, retesting key values, programming key values and retesting key values and comprises a main control computer, a BT (bit rate control) module, an FM (frequency modulation) module, an oscilloscope and a UUT (unmanned underwater terminal) module; the UUT module comprises a circuit to be tested;
the main control computer is used for issuing an excitation signal instruction to the BT module, issuing a trial writing key value instruction to the FM module and issuing a measurement excitation signal instruction to the oscilloscope, and simultaneously acquiring data measured by the oscilloscope; the BT module outputs an excitation signal to a circuit to be tested on the UUT module according to an excitation signal instruction issued by the main control computer; the FM module outputs a trial-writing key value to a circuit to be tested on the UUT module according to a trial-writing key value instruction issued by the main control computer; and the oscilloscope measures the excitation signal of the circuit to be tested on the UUT module according to the excitation signal measuring instruction issued by the main control computer.
Those skilled in the art will appreciate that those matters not described in detail in the present specification are well known in the art.
Claims (10)
1. A method for programming key values based on a 1553B bus circuit is characterized by comprising the following steps: the sequence of the search key value, the retest key value, the fine adjustment key value, the programming key value and the retest programming key value is as follows: searching for an amplitude key value, searching for a rising and falling time key value, searching for and outputting a symmetrical key value, finely adjusting the amplitude key value, searching for a threshold key value, retesting the amplitude key value, retesting the rising and falling time key value, retesting the symmetrical key value, retesting the threshold key value, burning the amplitude key value, burning the rising and falling time key value, retesting the burning amplitude key value, retesting the rising and falling time key value, and retesting the burning symmetrical key value;
the specific steps of searching the key value are as follows:
step one, setting an initial key value, then trying to write the initial key value, and then measuring the initial key value; if the initial key value is larger than or equal to 10V, switching to the step II; otherwise, judging that the circuit is abnormal in function, and turning to the third step;
step two, comparing the initial key value measured in the step one with a set index requirement; if the measured initial key value does not meet the set index requirement, adjusting the trial writing key value by using a dichotomy until the key value meeting the set index requirement is found, and then switching to the third step; otherwise, judging that the circuit is invalid or unqualified, and turning to the third step;
and step three, searching key values.
2. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: the method for retesting the write key value comprises the following steps: the searched key values are subjected to test writing, and whether the output symmetry, the rising and falling time, the amplitude and the threshold are qualified or not is respectively tested and judged; and if the circuit is qualified, programming can be carried out, otherwise, the circuit is judged to be unqualified.
3. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: the method for retesting the programming key value comprises the following steps: respectively testing and judging whether the output symmetry, the rising and falling time, the amplitude and the threshold are qualified or not by sending an excitation signal to a circuit to be tested; if the circuit is qualified, the programming work is finished, otherwise, the circuit is judged to be unqualified.
4. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: the initial key value in the first step is 0XBEFB5F 7F.
5. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: the initial key value of the first step is 32 bits, the amplitude value corresponds to B13-B18 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b13, B15, B16, B17, B14, B18.
6. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: the initial key value of the first step is 32 bits, the rising and falling time corresponds to B7-B12 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b8, B7, B9, B10, B11, B12.
7. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: the initial key value of the first step is 32 bits, the output symmetry corresponds to B1-B6 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b1, B2, B3, B4, B5, B6.
8. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: the initial key value of the first step is 32 bits, the threshold value corresponds to B19-B24 bits, and the bit sequence with sequentially weakened adjustment degrees is as follows: b19, B20, B21, B22, B23, B24.
9. The method for programming key values based on a 1553B bus circuit as claimed in claim 1, wherein: each bit key value is programmed for 5 times; the first three times of programming voltage is 9V, the programming time is 3ms, the circuit working voltage is 5V, the second two times of programming voltage is 9.5V, the programming time is 3ms, and the circuit working voltage is 5.2V.
10. A device based on 1553B bus circuit programming key value is used for searching key values, retesting key values, fine-tuning key values, programming key values and retesting key values, and is characterized in that: the system comprises a main control computer, a BT module, an FM module, an oscilloscope and a UUT module; the UUT module comprises a circuit to be tested;
the main control computer is used for issuing an excitation signal instruction to the BT module, issuing a trial writing key value instruction to the FM module and issuing a measurement excitation signal instruction to the oscilloscope, and simultaneously acquiring data measured by the oscilloscope; the BT module outputs an excitation signal to a circuit to be tested on the UUT module according to an excitation signal instruction issued by the main control computer; the FM module outputs a trial-writing key value to a circuit to be tested on the UUT module according to a trial-writing key value instruction issued by the main control computer; and the oscilloscope measures the excitation signal of the circuit to be tested on the UUT module according to the measurement excitation signal instruction issued by the main control computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711448956.8A CN108919086B (en) | 2017-12-27 | 2017-12-27 | Method and device for programming key value based on 1553B bus circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711448956.8A CN108919086B (en) | 2017-12-27 | 2017-12-27 | Method and device for programming key value based on 1553B bus circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108919086A CN108919086A (en) | 2018-11-30 |
| CN108919086B true CN108919086B (en) | 2021-01-08 |
Family
ID=64402675
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711448956.8A Active CN108919086B (en) | 2017-12-27 | 2017-12-27 | Method and device for programming key value based on 1553B bus circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108919086B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103149526A (en) * | 2011-12-07 | 2013-06-12 | 深圳市汇川技术股份有限公司 | Printed circuit board assembly (PCBA) board testing system and PCBA board testing method |
| CN203365629U (en) * | 2013-05-27 | 2013-12-25 | 上海与德通讯技术有限公司 | Automatic test device for performance of keyboard circuit of mobile phone main board |
| CN203849592U (en) * | 2014-04-04 | 2014-09-24 | 杭州九固科技有限公司 | Servo driver parameter burning apparatus based on RS-485 |
| US8977917B2 (en) * | 2012-10-16 | 2015-03-10 | Lattice Semiconductor Corporation | Highly secure and extensive scan testing of integrated circuits |
| CN106370996A (en) * | 2016-08-30 | 2017-02-01 | 无锡中微腾芯电子有限公司 | Fuse trimming realization method through iteration method |
| CN106970318A (en) * | 2017-04-25 | 2017-07-21 | 金卡智能集团股份有限公司 | Measuring instrument circuit board intelligent test system and intelligent test method |
-
2017
- 2017-12-27 CN CN201711448956.8A patent/CN108919086B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103149526A (en) * | 2011-12-07 | 2013-06-12 | 深圳市汇川技术股份有限公司 | Printed circuit board assembly (PCBA) board testing system and PCBA board testing method |
| US8977917B2 (en) * | 2012-10-16 | 2015-03-10 | Lattice Semiconductor Corporation | Highly secure and extensive scan testing of integrated circuits |
| CN203365629U (en) * | 2013-05-27 | 2013-12-25 | 上海与德通讯技术有限公司 | Automatic test device for performance of keyboard circuit of mobile phone main board |
| CN203849592U (en) * | 2014-04-04 | 2014-09-24 | 杭州九固科技有限公司 | Servo driver parameter burning apparatus based on RS-485 |
| CN106370996A (en) * | 2016-08-30 | 2017-02-01 | 无锡中微腾芯电子有限公司 | Fuse trimming realization method through iteration method |
| CN106970318A (en) * | 2017-04-25 | 2017-07-21 | 金卡智能集团股份有限公司 | Measuring instrument circuit board intelligent test system and intelligent test method |
Non-Patent Citations (1)
| Title |
|---|
| TMS320C6701自动加载及程序烧写的简化设计;夏金桥 等;《单片机与嵌入式系统应用》;20141031;第18-21页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108919086A (en) | 2018-11-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107478455B (en) | Timing truncation reliability test method suitable for Weibull distribution type product | |
| CN102169846B (en) | Method for writing multi-dimensional variable password in parallel in process of testing integrated circuit wafer | |
| CN103197230B (en) | Integrated circuit fault detection method based on feature extraction | |
| CN106888060B (en) | Anti-interference test method and system for wireless communication module | |
| CN103855045A (en) | Adjustment method for parameters of chips on wafer | |
| CN114528172A (en) | Wafer chip testing method and device, electronic equipment and storage medium | |
| CN103245871B (en) | A kind of wire harness tester and the wire harness method of testing based on this wire harness tester | |
| US20120117432A1 (en) | Test apparatus | |
| CN108919086B (en) | Method and device for programming key value based on 1553B bus circuit | |
| CN104614659A (en) | Automatic test system and automatic test method | |
| CN113341296B (en) | ATE-based SOC chip testing method | |
| CN115616374B (en) | Semiconductor chip testing system based on machine learning | |
| CN106990343B (en) | The test method and system of electronic component | |
| CN113608089B (en) | SOA test method, system and device for switching power supply MOS tube and readable storage medium | |
| CN105510688B (en) | A kind of voltage detector for realizing CP tests | |
| CN109375121B (en) | Automatic test system and method | |
| Igual et al. | Evaluation of automatic power quality classification in microgrids operating in islanded mode | |
| CN113539350A (en) | ATE equipment self-checking based method and system | |
| Gao et al. | An eye diagram parameters measurement method based on K-means clustering algorithm | |
| CN112231920A (en) | Method and system for determining parameters of micro-grid simulation model | |
| CN110749813B (en) | Test system and method for generating adaptive test recipe | |
| CN113219286B (en) | Multistage electromagnetic disturbance measurement system, method and equipment of electric intelligent equipment and storage medium | |
| US20230086626A1 (en) | System and method for detection of anomalies in test and measurement results of a device under test (dut) | |
| CN116087692B (en) | Distribution network tree line discharge fault identification method, system, terminal and medium | |
| CN116859210A (en) | Communication chip reliability test method, device and system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |