CN108881898A - The test method of depth of field mould group nonlinear calibration - Google Patents

The test method of depth of field mould group nonlinear calibration Download PDF

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Publication number
CN108881898A
CN108881898A CN201810581479.0A CN201810581479A CN108881898A CN 108881898 A CN108881898 A CN 108881898A CN 201810581479 A CN201810581479 A CN 201810581479A CN 108881898 A CN108881898 A CN 108881898A
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mould group
mode
calibration
far
scaling board
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徐振宾
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Goertek Optical Technology Co Ltd
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Goertek Inc
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/002Diagnosis, testing or measuring for television systems or their details for television cameras

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  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
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Abstract

The present invention provides a kind of test method of depth of field mould group nonlinear calibration, including being tested by the way of the two-way calibration of Three models, initial position is arranged to A, B mould group, scaling board is mobile with guide rail according to the preset sampling interval, A, B Mo Zu acquires the image information of scaling board respectively, obtain the range information of the Near mode of A mould group, the range information of the Far mode of B mould group;Scaling board is inversely moved according to the preset sampling interval with guide rail, position where A mould group is its Far mode, position where B mould group is its Near mode, A, B Mo Zu acquires the image information of scaling board respectively, obtain the range information of the Far mode of A mould group, the range information of the Near mode of B mould group;Initial position is reset to A, B mould group, A, B Mo Zu acquire the image information of scaling board respectively, obtain the range information of the Mid mode of A, B mould group.Using the present invention, it is able to solve the problems such as calibration mode precision based on horizontal guide rail depth of field mould group is high at high cost.

Description

The test method of depth of field mould group nonlinear calibration
Technical field
The present invention relates to depth of field mould technical group fields, more specifically, are related to a kind of survey of depth of field mould group nonlinear calibration Method for testing.
Background technique
Depth of field mould group (TOF) due to Stimulated Light-emission power influence, test it is different apart from when, power can decay, So being not linear relationship the phenomenon that showing when testing far and near distance.So to depth of field mould group carry out away from When from calibration, it can also be segmented and be demarcated, segmentation carries out the calibration of far and near distance, in this way can be more acurrate to the result of calibration It is some.
When being demarcated to depth of field mould group, if being based on horizontal guide rail, samples multiple range points and carry out apart from mark It is fixed.Wherein, the longer flatness requirement of guide rail is higher, and the error requirements of the distance of depth of field mould group are in the other precision of grade, cost Cost is relatively high.
Summary of the invention
In view of the above problems, the object of the present invention is to provide a kind of test methods of depth of field mould group nonlinear calibration, with solution The problems such as calibration mode precision certainly based on horizontal guide rail depth of field mould group is high at high cost.
The present invention provides a kind of test method of depth of field mould group nonlinear calibration, including using the two-way calibration of Three models Mode is tested, wherein Three models are respectively Near mode, Mid mode, Far mode;It is two-way to be demarcated as simultaneously to two Depth of field mould group is demarcated, and two Mo Zu are A mould group and B mould group respectively, when A mould group carries out the calibration of Near mode, B mould The calibration of group while the Far mode carried out, when A mould group carries out the calibration of Far mode, B mould group while the Near mould carried out The calibration of formula;Specific test method is as follows:
Initial position is arranged to A mould group, B mould group, wherein the initial position of its Near mode, B mould group are arrived in the playback of A mould group It playbacks to the initial position of its Far mode, scaling board is mobile with guide rail according to the preset sampling interval, A mould group, B Mo Zu difference The image information of scaling board is acquired, the distance letter of the range information of the Near mode of A mould group and the Far mode of B mould group is obtained Breath;
The scaling board is inversely moved according to the preset sampling interval with guide rail, and the position where A mould group is its Far mould Formula, the position where B mould group are its Near mode, and A mould group, B Mo Zu acquire the image information of scaling board respectively, obtain A mould group Far mode range information and B mould group Near mode range information;
Initial position is reset to A mould group, B mould group, wherein A mould group, B Mo Zu are playbacked respectively to the starting of Mid mode Position, scaling board is mobile according to the preset sampling interval, and A mould group, B Mo Zu acquire the image information of scaling board respectively, obtains A mould The range information of the Mid mode of the range information and B mould group of the Mid mode of group.
Furthermore it is preferred that scheme be, to A mould group, B mould group setting initial position during, the zero point of calibration is not It is absolute zero position, there is an initial calibration position between mould group and scaling board, wherein
A mould group, B mould group playback to initial position, A mould group playback to the initial position of Near mode, B-mode playback are arrived The initial position of Far mode;
The initial position of A mould group Near mode:It is the minimum distance of the Near mode of A mould group, B mould group Far mode rises Beginning position:It is the maximum distance of the Far mode of B mould group.
Furthermore it is preferred that scheme be, A mould group carry out Near mode calibration when, B mould group simultaneously carry out Far mould The calibration of formula, wherein
Near mode is:[N_Lmin, N_Lmax] mm;
Mid mode is:[M_Lmin, M_Lmax] mm;
Far mode is:[F_Lmin, F_Lmax] cm;
Wherein, Lmin indicates that the minimum distance demarcated in three modes, Lmax indicate the most long distance demarcated in three modes From.
Furthermore it is preferred that scheme be that the interval of the calibration of Near mode, Mid mode, Far mode in mould group is identical , if being one distance of calibration at interval of Xmm, under Near mode, then the position demarcated is:
The position of first calibration:Offset+Lmin+X,
The position of second calibration:Offset+Lmin+2X,
The position of the last one calibration:offset+Lmin+nX<=Lmax.
Furthermore it is preferred that scheme be that mobile according to the preset sampling interval in scaling board, A mould group, B Mo Zu are acquired respectively During the image information of scaling board,
At the position of maximum distance for reaching the Near mode of A mould group of calibration, A mould group stops Image Acquisition;
The scaling board continues to move to, and B mould group continues to acquire image information, reaches the Far mode for the B mould group demarcated When minimum distance position, B mould group stops acquisition image information.
Furthermore it is preferred that scheme be inversely to be moved according to the preset sampling interval with guide rail in the scaling board, A mould group The position at place is its Far mode, and the position where B mould group is its Near mode, and A mould group, B Mo Zu acquire scaling board respectively During image information,
At the position of maximum distance for reaching the Near mode of B mould group of calibration, B mould group stops Image Acquisition;
The scaling board continues reverse mobile, and A mould group continues to acquire image information, until A mould group Far mode it is nearest Distance stops acquisition image information.
It can be seen from the above technical scheme that the test method of depth of field mould group nonlinear calibration provided by the invention, by adopting It is tested with the mode of the two-way calibration of Three models, this test method, can reduce testing cost, improve depth of field mould group Testing efficiency.
To the accomplishment of the foregoing and related purposes, one or more aspects of the present invention includes the spy being particularly described below Sign.Certain illustrative aspects of the invention is described in detail in the following description and the annexed drawings.However, these aspect instructions are only It is that some of the various ways in the principles of the present invention can be used.In addition, the present invention is intended to include all such aspects with And their equivalent.
Detailed description of the invention
By reference to the explanation below in conjunction with attached drawing, and with a more complete understanding of the present invention, of the invention is other Purpose and result will be more clearly understood and understood.In the accompanying drawings:
Fig. 1 is the test method flow diagram according to the depth of field mould group nonlinear calibration of the embodiment of the present invention;
Fig. 2 is the test device schematic diagram according to the depth of field mould group nonlinear calibration of the embodiment of the present invention.
Identical label indicates similar or corresponding feature or function in all the appended drawings.
Specific embodiment
In the following description, for purposes of illustration, it in order to provide the comprehensive understanding to one or more embodiments, explains Many details are stated.It may be evident, however, that these embodiments can also be realized without these specific details.
For aforementioned proposition the existing calibration mode precision based on horizontal guide rail depth of field mould group it is high at high cost the problems such as, The present invention provides a kind of test method of depth of field mould group nonlinear calibration, by using the two-way calibration of Three models mode into Row test, to solve the above problems.
Hereinafter, specific embodiments of the present invention will be described in detail with reference to the accompanying drawings.
In order to illustrate the test method process of depth of field mould group nonlinear calibration provided by the invention, Fig. 1 is shown according to this The test method process of the depth of field mould group nonlinear calibration of inventive embodiments.
As shown in Figure 1, the test method of depth of field mould group nonlinear calibration provided by the invention, including:Depth of field mould group is non-thread Property calibration test method, including being tested by the way of the two-way calibration of Three models, wherein Three models are respectively Near mode, Mid mode, Far mode;Two-way to be demarcated as simultaneously demarcating two depth of field mould groups, two Mo Zu are A respectively Mould group and B mould group, when A mould group carries out the calibration of Near mode, the calibration for the Far mode that B mould group carries out simultaneously, when A mould When group carries out the calibration of Far mode, the calibration for the Near mode that B mould group carries out simultaneously;
Specific test method is as follows:
S110:Initial position is arranged to A mould group, B mould group, wherein the initial position of its Near mode, B are arrived in the playback of A mould group The initial position of its Far mode is arrived in the playback of mould group, and scaling board is according to the preset sampling interval with guide rail movement, A mould group, B mould group Respectively acquire scaling board image information, obtain A mould group Near mode range information and B mould group Far mode away from From information;
S120:Scaling board is inversely moved according to the preset sampling interval with guide rail, and the position where A mould group is its Far mould Formula, the position where B mould group are its Near mode, and A mould group, B Mo Zu acquire the image information of scaling board respectively, obtain A mould group Far mode range information and B mould group Near mode range information;
S130:Initial position is reset to A mould group, B mould group, wherein A mould group, B Mo Zu are playbacked respectively to Mid mode Initial position, scaling board is mobile according to the preset sampling interval, and A mould group, B Mo Zu acquire the image information of scaling board respectively, Obtain the range information of the range information of the Mid mode of A mould group and the Mid mode of B mould group.
Further include lighting mould group in above-mentioned specific test method, lights die trial group to be measured.In implementation of the invention In example, if the farthest calibration distance of depth of field test is at 6 meters or so, then guide rail just needs 7 meters or so.Guide rail itself, which needs to protect, to be opened It closes, will increase stroke at the both ends of guide rail and open the light and protect, in order to demarcate depth of field mould group in the exact position of different distance point, When practical calibration, the calibration that multiple location points carry out corresponding actual range is sampled to the several modes of segmentation.Pass through mark To theoretical value and measured value after fixed, a modified parameter is done, as correction parameter, is written in every mould group.
Fig. 2 shows the test device structures of depth of field mould group nonlinear calibration according to an embodiment of the present invention, such as such as 2 institutes Show, the position of M, N are respectively the depth of field mould group to be demarcated.Position between Oc, Zc is the position where guide rail, and P point is calibration The position of plate picture centre, the purpose reflection laser of image calculate progressive error.During the test, by process control guide rail It is mobile, while lighting for mould set product is controlled, test each position for needing to demarcate.
Referring to figs. 1 and 2, specific test method is as follows:Wherein, mould group calibration process is substantially as follows:A mould group into When row Near mode is demarcated, the calibration for the Far mode that B mould group carries out simultaneously;
Near mode is:[N_Lmin, N_Lmax] mm,
Mid mode is:[M_Lmin, M_Lmax] mm,
Far mode is:[F_Lmin, F_Lmax] cm,
Wherein, Lmin, Lmax are the minimum distance and maximum distance demarcated in three modes.
Carrying out practically process is as follows;
1) mould group is lighted:
Light A, B mould group of M, N point position.
2) calibration zero
A, B mould group has an initial position before starting calibration.At the beginning of A mould group and the distance of scaling board (has one The movement of zero, mould group and scaling board are unlikely to be abutting, so the zero point for starting calibration is not 0 absolute position, are In order to demarcate conveniently, there is an initial calibration position of an offset between mould group and calibration).
A, B mould group has the process of a playback, i.e. A mould group playback to the initial position of Near mode, and B-mode playback is arrived The initial position of Far mode, the initial position of A mould group Near mode:It is the minimum distance of the Near mode of this mould group, and B The initial position of mould group Far mode:It is the maximum distance of the Far mode of this mould group.
3) mobile scaling board, acquisition image information calculates distance, and (mode at this time is:A mould group Near mode, B mould group Far Mode)
System sends move to guide rail, and the image of P point is mobile according to the sampling interval, while A mould group, B Mo Zu distinguish Image information is acquired, records corresponding range information (range information obtained by Tof mould group), wherein in A mould group to up to standard When the fixed position N_Lmax, stop Image Acquisition, and the range information for the A mould group Near mode that will acquire is recorded in A mould group. The image of P point is continued to move to along guide rail, and B mould group continues to acquire image information, the most low coverage of the Far mode until reaching B mould group It offs normal and sets, stop acquisition image information, and the range information for the B mould group Far mode that will acquire is recorded in B mould group.
4) A mould group and B mould group mode are converted
Mode at this time is:B mould group Near mode, A mould group Far mode, i.e.,:A tests Far mode, and B tests Near mould The image of formula, P point is inversely moved along guide rail.
A, B mould group acquires image information simultaneously, and the position where B mould group is the proximal most position of Near mode, while being A mould The maximum distance of group Far mode, B mould group arrive first at the position of N_Lmax, stop Image Acquisition, and A mould group continues to acquire image Information stops acquisition image information until the minimum distance of Far mode.That is, in the Near for the B mould group for reaching calibration When the position of the maximum distance of mode, B mould group stops Image Acquisition;Scaling board continues reverse movement, and A mould group continues to acquire image Information stops acquisition image information until the minimum distance of the Far mode of A mould group.
The Near of all mould groups, Far mode are all made of aforesaid way with this loop test.
Wherein, it should be noted that if the cost and degree of balance problem of guide rail are not considered, in A mould group and B mould group mode Conversion can be tested in the following way in test process:Scaling board is continued to move to according to the preset sampling interval, Position where A mould group is its Far mode, and the position where B mould group is its Near mode, and A mould group, B Mo Zu acquire mark respectively The image information of fixed board.
Wherein, at the position of minimum distance for reaching the Far mode of A mould group of calibration, A mould group stops Image Acquisition; Scaling board continues to move to, and B mould group continues to acquire image information, in the minimum distance position of the Near mode for the B mould group for reaching calibration When setting, B mould group stops acquisition image information.
5) test of Mid mode
A mould group tests Mid mode, and B mould group tests Mid mode.
Initial position is reset to A mould group, B mould group, wherein A mould group, B Mo Zu are playbacked respectively to the starting of Mid mode Position, scaling board is mobile according to the preset sampling interval, and A mould group, B Mo Zu acquire the image information of scaling board respectively, obtains A mould The range information of the Mid mode of the range information and B mould group of the Mid mode of group.
That is, B mould group zero, zero point can be identical as the zero of previous pattern, can also not first again to A It together, can be depending on actual state in corresponding design.The Near of practical calibration process and top, Far mode are calibrated Cheng Xiangtong.
In a specific embodiment, it is assumed that at interval of Xmm to demarcate a distance, either which kind of mode, calibration Interval be it is identical, i.e.,:The interval of the calibration of Near mode, Mid mode, Far mode in mould group is identical.
By taking Near mode as an example, the position for the point for needing to demarcate is:
The position of first calibration point:Offset+Lmin+X,
The position of second calibration point:Offset+Lmin+2X,
The position of the last one calibration point:offset+Lmin+nX<=Lmax.
Depth mould group grabs image, in order to which noise reduction can be averaged a few frame figures, obtains the center of image depth mould group Depth distance.According to the spacing distance set, corresponding calibration position is demarcated, the depth distance for calibrating and is obtained.The depth of field It is poor that the depth distance that the initial position of mould group and the actual range of image and depth of field module image calibrate is made, as calibration Parameter, and be written under the corresponding mode of depth of field mould group, in normal use, modified ginseng is read out under corresponding mode Number increases the measurement accuracy of depth of field mould group.
The situation of the point of mode A calibration:
Practical calibration distance range [300,1500] mm contains offset distance.
In addition, in an embodiment of the present invention, the vertical direction that can be demarcated again increases a channel, with A, B mould group institute Channel, light source do not influence each other.It is all infrared light supply since TOF is laser.It, can be by the influence factor of the calibration of Tof The influence of extraneous infrared light supply.So A, light source not influence in the channel where mould group up and down with increased channel.
By above embodiment as can be seen that the test method of depth of field mould group nonlinear calibration provided by the invention, leads to It crosses by the way of the two-way calibration of Three models and is tested, this test method can reduce testing cost, improve depth of field mould The testing efficiency of group.
Describe the survey of the depth of field mould group nonlinear calibration proposed according to the present invention in an illustrative manner above with reference to attached drawing Method for testing.It will be understood by those skilled in the art, however, that the depth of field mould group nonlinear calibration proposed for aforementioned present invention Test method can also make various improvement on the basis of not departing from the content of present invention.Therefore, protection scope of the present invention is answered It is determined when by the content of appended claims.

Claims (6)

1. a kind of test method of depth of field mould group nonlinear calibration, including being surveyed by the way of the two-way calibration of Three models Examination, wherein Three models are respectively Near mode, Mid mode, Far mode;It is two-way be demarcated as simultaneously to two depth of field mould groups into Rower is fixed, and two Mo Zu are A mould group and B mould group respectively, and when A mould group carries out the calibration of Near mode, B mould group carries out simultaneously Far mode calibration, when A mould group carry out Far mode calibration when, B mould group simultaneously carry out Near mode calibration;Tool The test method of body is as follows:
Initial position is arranged to A mould group, B mould group, wherein the initial position of its Near mode, the playback of B mould group are arrived in the playback of A mould group To the initial position of its Far mode, scaling board is mobile with guide rail according to the preset sampling interval, and A mould group, B Mo Zu are acquired respectively The image information of scaling board obtains the range information of the range information of the Near mode of A mould group and the Far mode of B mould group;
The scaling board is inversely moved according to the preset sampling interval with guide rail, and the position where A mould group is its Far mode, B mould Position where group is its Near mode, and A mould group, B Mo Zu acquire the image information of scaling board respectively, obtains the Far mould of A mould group The range information of the Near mode of the range information and B mould group of formula;
Initial position is reset to A mould group, B mould group, wherein A mould group, B Mo Zu are playbacked respectively to the start bit of Mid mode It sets, scaling board is mobile according to the preset sampling interval, and A mould group, B Mo Zu acquire the image information of scaling board respectively, obtains A mould group Mid mode range information and B mould group Mid mode range information.
2. the test method of depth of field mould group nonlinear calibration as described in claim 1, wherein
During to A mould group, B mould group setting initial position, the zero point of calibration is not absolute zero position, mould group and mark There is an initial calibration position between fixed board, wherein
A mould group, B mould group playback to initial position, A mould group playback to the initial position of Near mode, B-mode playback to Far mould The initial position of formula;
The initial position of A mould group Near mode:It is the minimum distance of the Near mode of A mould group, the start bit of B mould group Far mode It sets:It is the maximum distance of the Far mode of B mould group.
3. the test method of depth of field mould group nonlinear calibration as claimed in claim 2, wherein
When A mould group carries out the calibration of Near mode, the calibration for the Far mode that B mould group carries out simultaneously, wherein
Near mode is:[N_Lmin, N_Lmax] mm;
Mid mode is:[M_Lmin, M_Lmax] mm;
Far mode is:[F_Lmin, F_Lmax] cm;
Wherein, Lmin indicates that the minimum distance demarcated in three modes, Lmax indicate the maximum distance demarcated in three modes.
4. the test method of depth of field mould group nonlinear calibration as claimed in claim 3, wherein
The interval of the calibration of Near mode, Mid mode, Far mode in mould group is identical, if being calibration at interval of Xmm One distance, under Near mode, then the position demarcated is:
The position of first calibration:Offset+Lmin+X,
The position of second calibration:Offset+Lmin+2X,
The position of the last one calibration:offset+Lmin+nX<=Lmax.
5. the test method of depth of field mould group nonlinear calibration as described in claim 1, wherein
Mobile according to the preset sampling interval in scaling board, A mould group, B Mo Zu acquire the process of the image information of scaling board respectively In,
At the position of maximum distance for reaching the Near mode of A mould group of calibration, A mould group stops Image Acquisition;
The scaling board continues to move to, and B mould group continues to acquire image information, reaches the nearest of the Far mode for the B mould group demarcated When distance and position, B mould group stops acquisition image information.
6. the test method of depth of field mould group nonlinear calibration as described in claim 1, wherein
It is inversely moved according to the preset sampling interval with guide rail in the scaling board, the position where A mould group is its Far mode, B Position where mould group is its Near mode, during A mould group, B Mo Zu acquire the image information of scaling board respectively,
At the position of maximum distance for reaching the Near mode of B mould group of calibration, B mould group stops Image Acquisition;
The scaling board continues reverse movement, and A mould group continues to acquire image information, until the most low coverage of the Far mode of A mould group From stopping acquisition image information.
CN201810581479.0A 2018-06-07 2018-06-07 The test method of depth of field mould group nonlinear calibration Pending CN108881898A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110111384A (en) * 2019-04-11 2019-08-09 歌尔股份有限公司 A kind of scaling method, the apparatus and system of TOF depth mould group
CN111077512A (en) * 2019-11-26 2020-04-28 歌尔股份有限公司 TOF module calibration method and system
CN111385558A (en) * 2018-12-28 2020-07-07 浙江舜宇智能光学技术有限公司 TOF camera module precision measurement method and system thereof

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101226638A (en) * 2007-01-18 2008-07-23 中国科学院自动化研究所 Method and apparatus for standardization of multiple camera system
CN101661617A (en) * 2008-08-30 2010-03-03 深圳华为通信技术有限公司 Method and device for camera calibration
CN101673397A (en) * 2009-09-30 2010-03-17 青岛大学 Digital camera nonlinear calibration method based on LCDs
CN101929844A (en) * 2009-06-25 2010-12-29 (株)赛丽康 Distance measuring apparatus having dual stereo camera
CN104766291A (en) * 2014-01-02 2015-07-08 株式会社理光 Method and system for calibrating multiple cameras
CN105787913A (en) * 2014-12-19 2016-07-20 宁波舜宇光电信息有限公司 Calibration method of projection module set
CN106537907A (en) * 2014-09-05 2017-03-22 英特尔公司 Multi-target camera calibration
CN107358633A (en) * 2017-07-12 2017-11-17 北京轻威科技有限责任公司 Join scaling method inside and outside a kind of polyphaser based on 3 points of demarcation things
CN107645659A (en) * 2017-08-11 2018-01-30 江西盛泰光学有限公司 Camera module optics depth of field test device
CN107644442A (en) * 2016-07-21 2018-01-30 宁波舜宇光电信息有限公司 Double space position calibration methods for taking the photograph module

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101226638A (en) * 2007-01-18 2008-07-23 中国科学院自动化研究所 Method and apparatus for standardization of multiple camera system
CN101661617A (en) * 2008-08-30 2010-03-03 深圳华为通信技术有限公司 Method and device for camera calibration
CN101929844A (en) * 2009-06-25 2010-12-29 (株)赛丽康 Distance measuring apparatus having dual stereo camera
CN101673397A (en) * 2009-09-30 2010-03-17 青岛大学 Digital camera nonlinear calibration method based on LCDs
CN104766291A (en) * 2014-01-02 2015-07-08 株式会社理光 Method and system for calibrating multiple cameras
CN106537907A (en) * 2014-09-05 2017-03-22 英特尔公司 Multi-target camera calibration
CN105787913A (en) * 2014-12-19 2016-07-20 宁波舜宇光电信息有限公司 Calibration method of projection module set
CN107644442A (en) * 2016-07-21 2018-01-30 宁波舜宇光电信息有限公司 Double space position calibration methods for taking the photograph module
CN107358633A (en) * 2017-07-12 2017-11-17 北京轻威科技有限责任公司 Join scaling method inside and outside a kind of polyphaser based on 3 points of demarcation things
CN107645659A (en) * 2017-08-11 2018-01-30 江西盛泰光学有限公司 Camera module optics depth of field test device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111385558A (en) * 2018-12-28 2020-07-07 浙江舜宇智能光学技术有限公司 TOF camera module precision measurement method and system thereof
CN111385558B (en) * 2018-12-28 2021-12-31 浙江舜宇智能光学技术有限公司 TOF camera module precision measurement method and system thereof
CN110111384A (en) * 2019-04-11 2019-08-09 歌尔股份有限公司 A kind of scaling method, the apparatus and system of TOF depth mould group
CN110111384B (en) * 2019-04-11 2021-11-26 歌尔光学科技有限公司 Calibration method, device and system of TOF (time of flight) depth module
CN111077512A (en) * 2019-11-26 2020-04-28 歌尔股份有限公司 TOF module calibration method and system
CN111077512B (en) * 2019-11-26 2023-12-26 歌尔光学科技有限公司 TOF module calibration method and system

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