CN110111384B - Calibration method, device and system of TOF (time of flight) depth module - Google Patents
Calibration method, device and system of TOF (time of flight) depth module Download PDFInfo
- Publication number
- CN110111384B CN110111384B CN201910290128.9A CN201910290128A CN110111384B CN 110111384 B CN110111384 B CN 110111384B CN 201910290128 A CN201910290128 A CN 201910290128A CN 110111384 B CN110111384 B CN 110111384B
- Authority
- CN
- China
- Prior art keywords
- distance value
- depth module
- tof depth
- calibration
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Abstract
The application discloses a calibration method, a calibration device and a calibration system of a TOF depth module. Acquiring a measured distance value from each test point on a test panel to a TOF depth module, wherein the measured distance value is acquired by an acquisition unit of the TOF depth module by acquiring an image of the test panel; acquiring an actual distance value from each test point on the test panel to the TOF depth module; and calibrating a correction function for correcting the measured distance value of the TOF depth module by taking the actual distance value and the measured distance value corresponding to the same test point as calibration samples. This application can carry out TOF degree of depth module's demarcation under the prerequisite that need not remove the test panel, can acquire each measuring distance value fast, very big improvement efficiency of software testing.
Description
Technical Field
The application relates to the technical field of TOF imaging, in particular to a calibration method of a TOF depth module, a calibration device of the TOF depth module and a calibration system of the TOF depth module.
Background
TOF depth module: the TOF module is similar to the visual imaging process of a common machine and comprises a light source, an optical component, a sensor, a control circuit, a processing circuit and other parts of units. TOF cameras have fundamentally different 3D imaging mechanisms compared to binocular measurement systems which are very similar to those belonging to the field of non-invasive three-dimensional detection and application. Binocular stereo measurement is performed by matching left and right stereo pairs and then performing stereo detection through a triangulation method, and a TOF camera acquires a target distance acquired through incident light and reflected light detection.
The TOF depth module calculates depth information according to the time of measuring laser flight, so that according to the characteristics of a laser transmitter, the fact that the laser transmitter transmits towards the periphery is equivalent to the fact that one point in space transmits straight lines towards the periphery to form a spherical surface with the spherical center and the radius of R, wherein the laser transmitter can only transmit towards one direction, so that the distances of all points on the hemispherical surface with the radius of R are identical and are R.
The current TOF module performs a next coordinate transformation before outputting depth data, transforms points on a plane into points on a curved surface, and when the depth module tests a plane, if the plane is parallel to the plane of the depth module lens, the depth data of each point of the plane are all equal.
The existing calibration methods based on the TOF depth module are all tested based on the converted depth data.
By adopting the method, the depth data under different distances needs to be acquired, the correction function is calibrated through the depth data and the corresponding actual distance value, the current test flow is to sequentially move the test panel to the distance point to be tested and then acquire the corresponding depth information, but more test time is spent due to more distance points to be tested, and the test efficiency is influenced.
Content of application
An object of the embodiments of the present application is to provide a new technical solution for a calibration method of a TOF depth module.
According to a first aspect of the application, a calibration method of a TOF depth module is provided, which comprises the steps of obtaining a measured distance value from each test point on a test panel to the TOF depth module, wherein the measured distance value is obtained by a collecting unit of the TOF depth module through collecting an image of the test panel, the test panel comprises a plurality of test points, and the measured distance value from each test point to the TOF depth module is different; acquiring an actual distance value from each test point on the test panel to the TOF depth module; and calibrating a correction function for correcting the measured distance value of the TOF depth module by taking the actual distance value and the measured distance value corresponding to the same test point as calibration samples.
Optionally, detecting whether the calibrated correction function meets a set requirement; and under the condition that the set requirement is not met, executing the operation of obtaining the measured distance value from each test point on the test panel to the TOF depth module again to obtain a new calibration sample.
Optionally, the detecting whether the calibrated correction function meets a set requirement includes: obtaining a corrected measured distance value of each test point according to the measured distance value of each test point and the corrected function obtained by calibration; obtaining an error value between the calibrated measurement distance value and the actual distance value corresponding to the same test point; and detecting whether the error value is within a preset error range, and if so, determining that the correction function meets the set requirement.
Optionally, calibrating a correction function for correcting the measured distance value of the TOF depth module includes: acquiring a preset function expression of the correction function; and calibrating the constant coefficient in the function expression according to the function expression and the calibration sample.
Optionally, wherein the calibrating the constant coefficient in the functional expression according to the functional expression and the calibration sample includes: obtaining each distance interval to be calibrated; according to the distance intervals to which the actual distance values of the calibration samples belong, grouping the calibration samples to obtain calibration samples corresponding to each distance interval; and for each distance interval, calibrating the constant coefficient in the function expression by using the corresponding calibration sample to obtain a correction function of the corresponding distance interval.
According to a second aspect of the present application, there is provided a calibration apparatus for a TOF depth module, including: the device comprises a measurement distance value acquisition unit, a TOF depth module and a display unit, wherein the measurement distance value acquisition unit is used for acquiring a measurement distance value from each test point on a test panel to the TOF depth module, the measurement distance value is acquired by the TOF depth module through collecting images of the test panel, the test panel comprises a plurality of test points, and the measurement distance value from each test point to the TOF depth module is different; the actual distance value acquisition unit is used for acquiring an actual distance value from each test point on the test panel to the TOF depth module; and the calibration unit is used for calibrating a correction function for correcting the measured distance value of the TOF depth module by taking the actual distance value and the measured distance value corresponding to the same test point as calibration samples.
According to a third aspect of the present application, there is provided an electronic device, comprising a memory, a processor, and a computer program stored in the memory and capable of running on the processor, wherein the processor, when executing the computer program, implements the calibration method of the TOF depth module as described above.
According to a fourth aspect of the present application, there is provided a calibration system for a TOF depth module, the calibration system for the TOF depth module comprising: the TOF depth module comprises a calibration device of the TOF depth module and an acquisition unit, the acquisition unit is connected with the calibration device of the TOF depth module, and the calibration device of the TOF depth module is used for executing the calibration method of the TOF depth module; the TOF depth module is arranged on the fixing frame; the test panel is arranged at a position away from the TOF depth module by a preset distance, and a plurality of test points are arranged on the test panel.
Optionally, the calibration system of the TOF depth module includes: the test panel is arranged on the slide rail and can move on the slide rail.
Optionally, the predetermined distance is: the TOF depth module is used for calibrating the minimum distance in the distance range.
The TOF depth module is used for measuring the distance between the measuring point and the TOF depth module, and the TOF depth module is used for calibrating the TOF depth module.
Further features of the present application and advantages thereof will become apparent from the following detailed description of exemplary embodiments thereof, which is to be read in connection with the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the application and together with the description, serve to explain the principles of the application.
FIG. 1 is a flow chart of one embodiment of a method for calibrating a TOF depth module according to the present application;
fig. 2 is a block schematic diagram of an implementation structure of a calibration apparatus of a TOF depth module according to the present application.
FIG. 3 is a system diagram illustrating an exemplary configuration of a calibration system for a TOF depth module according to the present disclosure.
FIG. 4 is another system diagram illustrating an exemplary configuration of a calibration system for a TOF depth module according to the present disclosure.
FIG. 5 is an exemplary block diagram of a computing device capable of implementing a calibration method for a TOF depth module provided according to an embodiment of the present application.
Detailed Description
Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present application unless specifically stated otherwise.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the application, its application, or uses.
Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate.
In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
In order to solve the problem in the prior art that a calibration method of a TOF depth module comprises the following steps:
step 1: and acquiring a measured distance value from each test point on the test panel to the TOF depth module, wherein the measured distance value is acquired by an acquisition unit of the TOF depth module through acquiring an image of the test panel.
In this embodiment, the test panel includes a plurality of test points, and the measurement distance value from each test point to the TOF depth module is different. It is understood that in other embodiments, the actual distance value of each test point may be also, and due to the measurement error, there may be a case where the actual distance values of two or more test points in each test point are different but the measured distance values are the same at a certain measurement time.
In this embodiment, the measured distance value refers to a linear distance value from the acquisition unit of the TOF depth module to any one measurement point.
Prior art prior to this application, the straight-line distance value was usually calibrated by converting it to a depth value, and when in a plane, the depth value of each point on the plane was the same, therefore, the prior art could not calibrate by not moving the test panel. The distance value is measured, and on a plane (the plane is theoretically parallel to the acquisition plane of the acquisition unit, the acquisition plane usually refers to the plane where the emission source is located, such as a laser emitter), the measurement distance values from the test points with different distances from the center of the plane to the TOF depth module are different, so that a plurality of measurement distance values with different values can be acquired on the premise of not moving the test panel as long as a plurality of test points with different distances from the center of the plane are obtained from the test points.
For example, referring to fig. 4, the test panel of fig. 4 has 7 test points of S0, S1, S2, S3, and S3, where S3 may be regarded as a midpoint of the test panel, where the straight-line distance from S3 to S3, and the straight-line distance from S3 to S3 are all different, and due to the difference, the respective measured distance values are different, for example, the measured distance value d3 from S3 to the acquisition unit, and the measured distance value d3 from S3 to the acquisition unit are all different.
In this embodiment, step 1: obtaining the measured distance value from each test point on the test panel to the TOF depth module includes:
step 101: obtaining the measured value from each test point to the TOF depth module for multiple times;
step 102: and adding the measured values of the test points, averaging the measured values, and taking each average value as the measured distance value of the test point corresponding to the average value.
For example, multiple measurements from S0 to the TOF depth module, d01、d02、d03、d04、d05、d06And d01、d02、d03、d04、d05、d06After the addition, an average value is taken, thereby obtaining d 0.
In this embodiment, 10 measurements are taken for any one test point. It will be appreciated that the number of acquisitions may be set on its own as desired, for example, 6, 8 or other acquisitions for any one test point.
It will be appreciated that the number of measurements taken may vary from site to site as desired, for example, 10 measurements are taken for the S0 test site and only 6 measurements are taken for the S6 test site.
Referring to fig. 1, in the present embodiment, step 2: and acquiring an actual distance value from each test point on the test panel to the TOF depth module.
It will be appreciated that the actual distance value may be obtained by way of measurement.
In this embodiment, step 3: and calibrating a correction function for correcting the measured distance value of the TOF depth module by taking the actual distance value and the measured distance value corresponding to the same test point as calibration samples.
For example, as shown in fig. 3, we obtain measured distance values d0, d1, d2, d3, d4, d5 and d6 of 7 test points of S0, S1, S2, S3, S4, S5 and S6, and obtain actual distance values T0, T1, T2, T3, T4, T5 and T6 of 7 test points of S0, S1, S2, S3, S4, S5 and S6. The measured distance value of each test point and the actual distance value of the test point are used as a set of calibration samples, that is, d0 and T0 are used as a set of calibration samples, d1 and T1 are used as a set of calibration samples, d2 and T2 are used as a set of calibration samples, d3 and T3 are used as a set of calibration samples, d4 and T4 are used as a set of calibration samples, d5 and T5 are used as a set of calibration samples, and d6 and T6 are used as a set of calibration samples. From these six sets of calibration samples, a correction function for correcting the measured distance values of the TOF depth module is calibrated.
In this embodiment, step 3: and calibrating a correction function for correcting the measured distance value of the TOF depth module by taking the actual distance value and the measured distance value corresponding to the same test point as calibration samples.
In one example, the step 3 of calibrating the correction function for correcting the measured distance value of the TOF depth module may include:
step 301: and acquiring a function expression of a preset correction function.
Step 302: and calibrating the constant coefficient in the function expression according to the function expression and the calibration sample.
In this example, the predetermined function expression is, for example:
x ═ 1/Ki) (Y-Ci); (i ═ 1,2,3 …); wherein the content of the first and second substances,
x is the actual distance value of the i test point, Y represents the measured distance value of the i test point, and Ki and Ci are constant coefficients to be calibrated.
According to the function expression, the obtained measured distance value and the obtained actual distance value of each different measuring point, the constant coefficients Ki and Ci can be calibrated.
It will be appreciated that other functional expressions may be used, depending on the needs of the user. For example, a more accurate functional expression is self-fitted with sufficient data (either data provided by others or data obtained through a large number of experiments).
In this embodiment, step 3: according to the function expression and the calibration sample, the constant coefficient in the calibration function expression comprises:
step 31: obtaining each distance interval to be calibrated;
step 32: according to the distance intervals to which the actual distance values of the calibration samples belong, grouping the calibration samples to obtain calibration samples corresponding to each distance interval;
step 33: and aiming at each distance interval, calibrating the constant coefficient in the function expression by using the corresponding calibration sample to obtain the correction function of the corresponding distance interval.
For example, assuming that the current calibration required interval is 1 meter to 2 meters, each distance interval to be calibrated is obtained between 1 meter and 2 meters, for example, two intervals of 1 meter to 1.5 meters and 1.5 meters to 2 meters;
according to the distance intervals to which the actual distance values of the calibration samples belong, grouping the calibration samples to obtain calibration samples corresponding to each distance interval; for example, there are a total of 4 calibration samples, where 2 sets have actual distance values between 1 and 1.5 meters and 2 other sets between 1.5 and 2 meters, so that the calibration of the constant coefficients in the 1 to 1.5 meter functional expression is performed by two sets between 1 and 1.5 meters, and the calibration of the constant coefficients in the 1.5 to 2 meter functional expression is performed by two sets between 1.5 and 2 meters.
Referring to fig. 1, after calibrating the constant coefficients Ki and Ci, in this embodiment, the method for calibrating the TOF depth module further includes:
and 4, step 4: and detecting whether the correction function obtained by calibration meets the set requirement.
In an example, the step 4 of detecting whether the calibrated correction function meets the setting requirement may include:
step 401: and obtaining the corrected measured distance value of each test point according to the measured distance value of each test point and the correction function obtained by calibration.
Step 402: and obtaining an error value between the calibrated measurement distance value and the actual distance value corresponding to the same test point.
Step 403: and detecting whether the error value is within a preset error range, and if so, determining that the correction function meets the set requirement.
Referring to fig. 3, for example, we first obtain each measured distance value d0, d1, d2, d3, d4, d5, d6 of each test point of S0, S1, S2, S3, S4, S5, S6, and then bring each measured distance value into a correction function (i.e., the above function formula of calibration completion coefficient), so as to obtain corrected measured distance values H0, H1, H2, H3, H4, H5, H6 of each test point.
We compare the corrected measured distance values H0, H1, H2, H3, H4, H5, H6 with the actual distance values corresponding to the same test point, specifically, obtain an error value between H0 and T0, an error value between H1 and T1, an error value between H2 and T2, an error value between H3 and T3, an error value between H4 and T4, an error value between H5 and T5, and an error value between H6 and T6.
And finally, presetting an error range, judging whether each error value is in the error range, if so, considering that the correction function meets the set requirement, and if not, considering that the correction function does not meet the requirement.
It will be appreciated that in other alternative embodiments, several of the error values may be set to be satisfactory, i.e. considered satisfactory, e.g. an error value greater than 80% may be satisfactory. For example, if there are 6 error values, 5 of the error values can satisfy the requirement. It will be appreciated that the setting can be self-setting as required, for example, greater than 90%, 95% or both.
And 5: and under the condition that the set requirements are not met, the operation of obtaining the measured distance value from each test point on the test panel to the TOF depth module is performed again to obtain a new mark sample.
It can be understood that, after the operation of obtaining the measured distance value from each test point on the test panel to the TOF depth module is performed again, the newly obtained measured distance value, the actual distance value and the measured distance value corresponding to the same test point are used as calibration samples, and the correction function for correcting the measured distance value of the TOF depth module is recalibrated.
It can be understood that, because the sensitivity of the TOF depth module is strong, i.e. it is easily interfered by the external environment, the measured distance values obtained each time usually have a slight difference, which is not the same as that obtained before, however, if the measured distance values of the test points are determined to be the same as that obtained last time, the obtaining of the distance values is abandoned this time, the operation of obtaining the measured distance values from each test point on the test panel to the TOF depth module is performed again, and if the measured distance values obtained more than 3 times are all the same, the operation is stopped.
It is understood that when the retrieved calibration constant is still not sufficient, the above steps may be repeated. It will be appreciated that a specific number of cycles may be set, for example, only 3, 5 or other cycles may be provided, and the cycle may be stopped if the number of cycles is exceeded.
Step 6: in the case of satisfying the setting requirement, the correction function is stored.
The present application further provides a calibration apparatus of a TOF depth module, and referring to fig. 2, in an embodiment, the calibration apparatus 100 of the TOF depth module may include a measured distance value obtaining unit 11, an actual distance value obtaining unit 12, and a calibration unit 13.
The measurement distance value obtaining unit 11 is configured to obtain a measurement distance value from each test point on the test panel to the TOF depth module, where the measurement distance value is obtained by the TOF depth module by collecting an image of the test panel, the test panel includes a plurality of test points, and the measurement distance value from each test point to the TOF depth module is different.
The actual distance value obtaining unit 12 is configured to obtain an actual distance value from each test point on the test panel to the TOF depth module.
The calibration unit 13 is configured to calibrate a correction function for correcting the measured distance value of the TOF depth module, using the actual distance value and the measured distance value corresponding to the same test point as calibration samples.
In an embodiment, the calibration apparatus 100 may further include a detecting unit, configured to detect whether the calibrated correction function meets the setting requirement, and if the calibrated correction function does not meet the setting requirement, notify the measured distance value obtaining unit 11 to perform the operation of obtaining the measured distance value from each test point on the test panel to the TOF depth module again to obtain a new calibration sample.
In one embodiment, the detecting unit, when detecting whether the calibrated correction function meets the set requirement, is configured to: obtaining a corrected measured distance value of each test point according to the measured distance value of each test point and the corrected function obtained by calibration; obtaining an error value between the calibrated measurement distance value and an actual distance value corresponding to the same test point; and detecting whether the error value is within a preset error range, and if so, determining that the correction function meets the set requirement.
In an embodiment, the calibration unit 13, when calibrating the correction function for correcting the measured distance values of the TOF depth module, is configured to: acquiring a function expression of a preset correction function; and calibrating the constant coefficient in the function expression according to the function expression and the calibration sample.
In one embodiment, the calibration unit 13, when calibrating the constant coefficients in the functional expression according to the functional expression and the calibration sample, is configured to: obtaining each distance interval to be calibrated; according to the distance intervals to which the actual distance values of the calibration samples belong, grouping the calibration samples to obtain calibration samples corresponding to each distance interval; and for each distance interval, calibrating a constant coefficient in the function expression by using the corresponding calibration sample to obtain a correction function of the corresponding distance interval.
In one embodiment, the measured distance value obtaining unit 11, when obtaining the measured distance value from each test point on the test panel to the TOF depth module, is configured to: obtaining the measured value from each test point to the TOF depth module for multiple times; and adding the measured values of the test points and taking the average value, and taking each average value as the measured distance value of the test point corresponding to the average value.
It should be noted that the foregoing explanations of the method embodiments also apply to the apparatus of this embodiment, and are not repeated herein.
The present application further provides an electronic device, which in one embodiment may include the calibration apparatus 100 according to any embodiment of the present application.
In another embodiment, the electronic device may further include a memory, a processor, and a computer program stored in the memory and capable of running on the processor, and the processor, when executing the computer program, implements the calibration method of the TOF depth module as described above.
Fig. 5 is an exemplary structural diagram of an electronic device capable of implementing a calibration method of a TOF depth module according to an embodiment of the present application.
As shown in fig. 5, the electronic device includes an input device 501, an input interface 502, a central processor 503, a memory 504, an output interface 505, and an output device 506. The input interface 502, the central processing unit 503, the memory 504 and the output interface 505 are connected to each other through a bus 507, and the input device 501 and the output device 506 are connected to the bus 507 through the input interface 502 and the output interface 505, respectively, and further connected to other components of the electronic device. Specifically, the input device 504 receives input information from the outside and transmits the input information to the central processor 503 through the input interface 502; the central processor 503 processes input information based on computer-executable instructions stored in the memory 504 to generate output information, temporarily or permanently stores the output information in the memory 504, and then transmits the output information to the output device 506 through the output interface 505; the output device 506 outputs the output information to the outside of the electronic device for use by the user.
That is, the electronic device shown in fig. 5 may also be implemented to include: a memory storing computer-executable instructions; and one or more processors which, when executing the computer executable instructions, may implement the calibration method of the TOF depth module described in connection with fig. 1-3.
In one embodiment, the electronic device shown in fig. 5 may be implemented to include: a memory 504 configured to store executable program code; one or more processors 503 configured to execute executable program code stored in the memory 504 to perform the calibration method of the TOF depth module in the embodiments described above.
Referring to fig. 4, the present application further provides a calibration system of a TOF depth module, which includes a TOF depth module 1, a fixing frame 2, a test panel 3 and a slide rail 4, wherein,
the TOF depth module 1 comprises a calibration device and an acquisition unit, the acquisition unit is connected with the calibration device of the TOF depth module, and the calibration device of the TOF depth module is used for executing the calibration method of the TOF depth module; TOF degree of depth module sets up on the mount, and the test panel setting is provided with a plurality of test points apart from TOF degree of depth module predetermined distance position on the test panel.
It can be understood that the fixing frame 2 is a fixing frame capable of lifting and rotating, for example, in an embodiment, the fixing frame comprises a base, a first rod and a second rod, one end of the first rod is arranged on the base, the first rod is hollow inside, an inner thread is arranged on the inner wall of the first rod, an outer thread is arranged on the outer wall of the second rod, and the second rod can go deep into the inner wall of the first rod and lift in a threaded manner. By adopting the mode, the position of the TOF depth module can be adjusted, and the use by a user is facilitated.
In the present embodiment, the test panel 3 is disposed on the slide rail 4, and the test panel 3 is movable on the slide rail 4. It will be appreciated that the distance of movement of the test panel should include the distance to which the TOF depth module needs to be calibrated.
For example, if the distance to be calibrated by the TOF depth module is 1 meter to 5 meters, the length of the slide rail may be 5 meters, i.e. the movable distance of the test panel on the slide rail is 5 meters.
In this embodiment, the predetermined distance is the smallest distance in the range of distances that the TOF depth module needs to calibrate. To the extent that the distance that the TOF depth module needs to be calibrated is 1 meter to 5 meters, the test panel should be set at a position of 1 meter, and at this time, the distance from the center point of the test panel to one test point of the edge portion of the test panel should be at least equal to the actual distance value from the TOF depth module to the center point of the test panel when the test panel is set at 5 meters.
Referring to fig. 3, in the present embodiment, each test point on the test panel is located on a virtual line passing through a center point of the test panel, for example, each test point is located on a virtual line extending along a horizontal direction (or a vertical direction), and is symmetrically distributed with respect to the center point, which can form a calibration sample by calculating an average value of measured distance values of two test points symmetrically distributed, so as to improve accuracy of the calibration sample. It is understood that, according to the requirement, the test points may be arranged on the test panel in an unordered manner, which is not limited herein.
The embodiments in the present disclosure are described in a progressive manner, and the same and similar parts among the embodiments can be referred to each other, and each embodiment focuses on the differences from the other embodiments, but it should be clear to those skilled in the art that the embodiments described above can be used alone or in combination with each other as needed. In addition, for the device embodiment, since it corresponds to the method embodiment, the description is relatively simple, and for relevant points, refer to the description of the corresponding parts of the method embodiment. The system embodiments described above are merely illustrative, in that modules illustrated as separate components may or may not be physically separate.
The present application may be an apparatus, method and/or computer program product. The computer program product may include a computer-readable storage medium having computer-readable program instructions embodied thereon for causing a processor to implement various aspects of the present application.
The computer readable storage medium may be a tangible device that can hold and store the instructions for use by the instruction execution device. The computer readable storage medium may be, for example, but not limited to, an electronic memory device, a magnetic memory device, an optical memory device, an electromagnetic memory device, a semiconductor memory device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a Static Random Access Memory (SRAM), a portable compact disc read-only memory (CD-ROM), a Digital Versatile Disc (DVD), a memory stick, a floppy disk, a mechanical coding device, such as punch cards or in-groove projection structures having instructions stored thereon, and any suitable combination of the foregoing. Computer-readable storage media as used herein is not to be construed as transitory signals per se, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through a waveguide or other transmission medium (e.g., optical pulses through a fiber optic cable), or electrical signals transmitted through electrical wires.
The computer-readable program instructions described herein may be downloaded from a computer-readable storage medium to a respective computing/processing device, or to an external computer or external storage device via a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers and/or edge servers. The network adapter card or network interface in each computing/processing device receives computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in a computer-readable storage medium in the respective computing/processing device.
The computer program instructions for carrying out operations of the present application may be assembler instructions, Instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source code or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer-readable program instructions may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, the electronic circuitry can execute computer-readable program instructions to implement aspects of the present application by utilizing state information of the computer-readable program instructions to personalize the electronic circuitry, such as a programmable logic circuit, a Field Programmable Gate Array (FPGA), or a Programmable Logic Array (PLA).
Various aspects of the present application are described herein with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer-readable program instructions.
These computer-readable program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks. These computer-readable program instructions may also be stored in a computer-readable storage medium that can direct a computer, programmable data processing apparatus, and/or other devices to function in a particular manner, such that the computer-readable medium storing the instructions comprises an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.
The computer readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the instructions which execute on the computer, other programmable apparatus or other devices implement the functions/acts specified in the flowchart and/or block diagram block or blocks.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of instructions, which comprises one or more executable instructions for implementing the specified logical function(s). In some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions. It is well known to those skilled in the art that implementation by hardware, by software, and by a combination of software and hardware are equivalent.
Having described embodiments of the present application, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terms used herein were chosen in order to best explain the principles of the embodiments, the practical application, or technical improvements to the techniques in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein. The scope of the application is defined by the appended claims.
Claims (11)
1. A calibration method of a TOF depth module is characterized by comprising the following steps:
acquiring a measured distance value from each test point on a test panel to a TOF depth module, wherein the test panel is a plane, the measured distance value is acquired by an acquisition unit of the TOF depth module by acquiring an image of the test panel, the measured distance value is a straight-line distance value from the acquisition unit of the TOF depth module to any one measurement point, and the measured distance values from the test points with different distances from the center of the plane to the TOF depth module are different;
acquiring an actual distance value from each test point on the test panel to the TOF depth module;
and calibrating a correction function for correcting the measured distance value of the TOF depth module by taking the actual distance value and the measured distance value corresponding to the same test point as calibration samples.
2. The calibration method according to claim 1, further comprising:
detecting whether the correction function obtained by calibration meets the set requirement or not;
and under the condition that the set requirement is not met, executing the operation of obtaining the measured distance value from each test point on the test panel to the TOF depth module again to obtain a new calibration sample.
3. The calibration method according to claim 2, wherein the detecting whether the correction function obtained by calibration meets a set requirement includes:
obtaining a corrected measured distance value of each test point according to the measured distance value of each test point and the corrected function obtained by calibration;
obtaining an error value between the calibrated measurement distance value and the actual distance value corresponding to the same test point;
and detecting whether the error value is within a preset error range, and if so, determining that the correction function meets the set requirement.
4. The calibration method according to claim 1, wherein calibrating the correction function for correcting the measured distance value of the TOF depth module comprises:
acquiring a preset function expression of the correction function;
and calibrating the constant coefficient in the function expression according to the function expression and the calibration sample.
5. The calibration method according to claim 4, wherein calibrating the constant coefficients in the functional expression according to the functional expression and the calibration samples comprises:
obtaining each distance interval to be calibrated;
according to the distance intervals to which the actual distance values of the calibration samples belong, grouping the calibration samples to obtain calibration samples corresponding to each distance interval;
and for each distance interval, calibrating the constant coefficient in the function expression by using the corresponding calibration sample to obtain a correction function of the corresponding distance interval.
6. The calibration method according to any one of claims 1 to 5, wherein the obtaining of the measured distance value from each test point on the test panel to the TOF depth module comprises:
obtaining the measured value from each test point to the TOF depth module for multiple times;
and adding the measured values of the test points, averaging the measured values, and taking each average value as the measured distance value of the test point corresponding to the average value.
7. A calibration device for a TOF depth module is characterized by comprising:
the device comprises a measurement distance value acquisition unit, a TOF depth module and a measurement distance value acquisition unit, wherein the measurement distance value acquisition unit is used for acquiring a measurement distance value from each test point on a test panel to the TOF depth module, the test panel is a plane, the measurement distance value is acquired by the TOF depth module through collecting images of the test panel, the test panel comprises a plurality of test points, the measurement distance value from each test point to the TOF depth module is different, the measurement distance value refers to a linear distance value from an acquisition unit of the TOF depth module to any one measurement point, and the measurement distance value from the test point with different distances from the center of the plane to the TOF depth module is different;
the actual distance value acquisition unit is used for acquiring an actual distance value from each test point on the test panel to the TOF depth module;
and the calibration unit is used for calibrating a correction function for correcting the measured distance value of the TOF depth module by taking the actual distance value and the measured distance value corresponding to the same test point as calibration samples.
8. An electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, implements a calibration method for a TOF depth module according to any one of claims 1 to 6.
9. A calibration system for a TOF depth module, the calibration system comprising:
a TOF depth module (1) comprising means for calibrating the TOF depth module and an acquisition unit connected to the means for calibrating the TOF depth module, the means for calibrating the TOF depth module being adapted to perform the method of calibrating the TOF depth module according to any one of claims 1 to 6;
the TOF depth module (1) is arranged on the fixing frame (2);
the test panel (3), the test panel (3) sets up apart from TOF degree of depth module predetermined distance position, be provided with a plurality of test points on the test panel (3).
10. The system for calibrating a TOF depth module according to claim 9, comprising:
the test device comprises a sliding rail (4), wherein the test panel (3) is arranged on the sliding rail (4), and the test panel (3) can move on the sliding rail (4).
11. The system for calibrating a TOF depth module according to claim 9 wherein the predetermined distance is:
the TOF depth module is used for calibrating the minimum distance in the distance range.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910290128.9A CN110111384B (en) | 2019-04-11 | 2019-04-11 | Calibration method, device and system of TOF (time of flight) depth module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910290128.9A CN110111384B (en) | 2019-04-11 | 2019-04-11 | Calibration method, device and system of TOF (time of flight) depth module |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110111384A CN110111384A (en) | 2019-08-09 |
| CN110111384B true CN110111384B (en) | 2021-11-26 |
Family
ID=67485350
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910290128.9A Active CN110111384B (en) | 2019-04-11 | 2019-04-11 | Calibration method, device and system of TOF (time of flight) depth module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110111384B (en) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110794422B (en) * | 2019-10-08 | 2022-03-29 | 歌尔光学科技有限公司 | Robot data acquisition system and method with TOF imaging module |
| CN110807813B (en) * | 2019-10-22 | 2022-09-23 | 歌尔光学科技有限公司 | TOF module calibration method, device and system |
| CN110609269A (en) * | 2019-10-22 | 2019-12-24 | 歌尔股份有限公司 | TOF module calibration device and method |
| CN110988910A (en) * | 2019-11-26 | 2020-04-10 | 深圳奥比中光科技有限公司 | ToF camera calibration device and calibration method |
| CN111077512B (en) * | 2019-11-26 | 2023-12-26 | 歌尔光学科技有限公司 | TOF module calibration method and system |
| CN111562562B (en) * | 2020-04-28 | 2023-04-14 | 重庆市天实精工科技有限公司 | 3D imaging module calibration method based on TOF |
| CN112985772B (en) * | 2021-02-04 | 2023-08-11 | Oppo广东移动通信有限公司 | Depth map detection apparatus, depth map detection method, electronic device, and computer-readable storage medium |
| CN114355321B (en) * | 2022-03-18 | 2022-07-05 | 深圳市欢创科技有限公司 | Laser radar calibration method, device and system, laser radar and robot |
| CN117395772B (en) * | 2023-12-11 | 2024-03-01 | 辽宁科大物联科技有限公司 | UWB positioning distance calibration method and device, electronic equipment and storage medium |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105699982A (en) * | 2015-05-25 | 2016-06-22 | 北京雷动云合智能技术有限公司 | Dual laser calibration high-precision camera chip multipoint range finding device and method |
| CN107861113A (en) * | 2017-11-06 | 2018-03-30 | 深圳市杉川机器人有限公司 | Scaling method and device |
| CN108881898A (en) * | 2018-06-07 | 2018-11-23 | 歌尔股份有限公司 | The test method of depth of field mould group nonlinear calibration |
| CN109146978A (en) * | 2018-07-25 | 2019-01-04 | 南京富锐光电科技有限公司 | A kind of high speed camera image deformation calibrating installation and method |
| CN109544645A (en) * | 2018-11-27 | 2019-03-29 | 苏州杰锐思自动化设备有限公司 | The method of camera module group lens inclination angle calibration |
-
2019
- 2019-04-11 CN CN201910290128.9A patent/CN110111384B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105699982A (en) * | 2015-05-25 | 2016-06-22 | 北京雷动云合智能技术有限公司 | Dual laser calibration high-precision camera chip multipoint range finding device and method |
| CN107861113A (en) * | 2017-11-06 | 2018-03-30 | 深圳市杉川机器人有限公司 | Scaling method and device |
| CN108881898A (en) * | 2018-06-07 | 2018-11-23 | 歌尔股份有限公司 | The test method of depth of field mould group nonlinear calibration |
| CN109146978A (en) * | 2018-07-25 | 2019-01-04 | 南京富锐光电科技有限公司 | A kind of high speed camera image deformation calibrating installation and method |
| CN109544645A (en) * | 2018-11-27 | 2019-03-29 | 苏州杰锐思自动化设备有限公司 | The method of camera module group lens inclination angle calibration |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110111384A (en) | 2019-08-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110111384B (en) | Calibration method, device and system of TOF (time of flight) depth module | |
| CN110197615B (en) | Method and device for generating map | |
| JP2016001982A (en) | Device and method for compensating resolver position error | |
| CN105030331A (en) | Position sensor and three-dimension laparoscope camera calibration device and method | |
| CN107967701B (en) | Calibration method, device and equipment of depth camera equipment | |
| Nguyen et al. | A high-definition LIDAR system based on two-mirror deflection scanners | |
| CN101629822B (en) | Multi-camera movable photography measuring method in vibration environment | |
| CN105496436B (en) | For the time-correcting method and device of PET device | |
| EP3548838B1 (en) | Wire rope measuring device and wire rope measuring method | |
| US10732284B2 (en) | Live metrology of an object during manufacturing or other operations | |
| WO2018026532A1 (en) | Testing 3d imaging systems | |
| Olivka et al. | Calibration of short range 2D laser range finder for 3D SLAM usage | |
| CN103559708A (en) | Industrial fixed-focus camera parameter calibration device based on square target model | |
| WO2018156224A1 (en) | Three-dimensional imager | |
| CN111750804A (en) | Object measuring method and device | |
| CN108286946B (en) | Method and system for sensor position calibration and data splicing | |
| CN105043304A (en) | Novel calibration plate and calibration method for performing length measurement by using calibration plate | |
| CN109682398B (en) | Method, device and system for calibrating orientation elements in complete machine of stereo mapping camera | |
| KR20120058802A (en) | Apparatus and method for calibrating 3D Position in 3D position/orientation tracking system | |
| CN109982074B (en) | Method and device for obtaining inclination angle of TOF module and assembling method | |
| CN114049401A (en) | Binocular camera calibration method, device, equipment and medium | |
| CN111025339B (en) | Method, device, equipment and computer readable storage medium for determining positioning delay | |
| CN111412939B (en) | Real-time correction method and system for encoder | |
| RU2018110302A (en) | SYSTEM AND METHOD FOR MEASURING USING A POCKET ELECTRONIC DEVICE | |
| CN110646134A (en) | Calibration method and calibration device for air pressure sensor |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20201010 Address after: 261031 north of Yuqing street, east of Dongming Road, high tech Zone, Weifang City, Shandong Province (Room 502, Geer electronic office building) Applicant after: GoerTek Optical Technology Co.,Ltd. Address before: 261031 Dongfang Road, Weifang high tech Development Zone, Shandong, China, No. 268 Applicant before: GOERTEK Inc. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |