CN108872279B - 一种四晶单色仪的光路校准方法及校准装置 - Google Patents
一种四晶单色仪的光路校准方法及校准装置 Download PDFInfo
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- CN108872279B CN108872279B CN201810432509.1A CN201810432509A CN108872279B CN 108872279 B CN108872279 B CN 108872279B CN 201810432509 A CN201810432509 A CN 201810432509A CN 108872279 B CN108872279 B CN 108872279B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
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- Crystallography & Structural Chemistry (AREA)
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CN201810432509.1A CN108872279B (zh) | 2018-05-08 | 2018-05-08 | 一种四晶单色仪的光路校准方法及校准装置 |
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CN201810432509.1A CN108872279B (zh) | 2018-05-08 | 2018-05-08 | 一种四晶单色仪的光路校准方法及校准装置 |
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CN108872279A CN108872279A (zh) | 2018-11-23 |
CN108872279B true CN108872279B (zh) | 2020-12-01 |
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Families Citing this family (1)
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CN111141771B (zh) * | 2020-01-15 | 2024-05-17 | 南京大学 | 一种x射线衍射仪悬丝光井支架及其使用方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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KR20050037086A (ko) * | 2003-10-17 | 2005-04-21 | 삼성전자주식회사 | X선 회절 분석기 및 이 분석기의 측정 위치 보정방법 |
CN104749162B (zh) * | 2015-04-17 | 2018-03-27 | 江苏天瑞仪器股份有限公司 | 共聚焦拉曼光谱仪及其光路装置 |
JP2016205893A (ja) * | 2015-04-17 | 2016-12-08 | 三菱重工業株式会社 | 結晶方位測定装置の校正方法 |
CN105301025B (zh) * | 2015-10-26 | 2017-11-14 | 中国工程物理研究院上海激光等离子体研究所 | 一种多波段晶体谱仪及其调节方法 |
CN205306988U (zh) * | 2016-01-08 | 2016-06-15 | 刘利锋 | X射线成像系统调准对中组件及光路调整套件 |
CN107315022A (zh) * | 2017-07-21 | 2017-11-03 | 中国地质大学(武汉) | 一种x射线准直定位调节装置及系统 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: An optical path calibration method and calibration device for four crystal monochromator Effective date of registration: 20211029 Granted publication date: 20201201 Pledgee: Bank of China Limited Zhangjiagang branch Pledgor: SUZHOU JUZHEN PHOTOELECTRIC Co.,Ltd. Registration number: Y2021980011576 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20221018 Granted publication date: 20201201 Pledgee: Bank of China Limited Zhangjiagang branch Pledgor: SUZHOU JUZHEN PHOTOELECTRIC Co.,Ltd. Registration number: Y2021980011576 |