CN108845902B - Method for checking ATE hardware configuration and test program configuration - Google Patents
Method for checking ATE hardware configuration and test program configuration Download PDFInfo
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- CN108845902B CN108845902B CN201810613309.6A CN201810613309A CN108845902B CN 108845902 B CN108845902 B CN 108845902B CN 201810613309 A CN201810613309 A CN 201810613309A CN 108845902 B CN108845902 B CN 108845902B
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2247—Verification or detection of system hardware configuration
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
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Abstract
The invention provides a method for checking ATE hardware configuration and test program configuration, which comprises the following steps: A. the test program acquires information stored in the EEPROM chip through the communication between the PC end and the EEPROM chip on the DUT test board; B. checking whether the hardware type of the ATE is matched with the hardware type information stored in the EEPROM chip, and checking whether the configuration of the called test program is the same as that stored in the EEPROM; C. checking whether the hardware configuration of the ATE is matched with the hardware configuration information stored in the EEPROM chip; D. and checking whether the hardware configuration required under the currently set test condition is matched with the configuration information of the hardware stored in the EEPROM chip. The invention can flexibly check whether the hardware configuration and the configuration file called by the test program meet the requirements of the current test conditions when the ATE tests the DUT.
Description
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to a method for checking ATE hardware configuration and test program configuration.
Background
The hardware of Automatic Test Equipment (ATE) is configurable, and when testing a Device Under Test (DUT) using ATE, the hardware configuration and the configuration of the test program required for different DUTs or different parameters of the same DUT may differ. If the hardware of the current ATE configuration does not match the hardware required for the current DUT test, it will lead to erroneous test results, so that the current ATE hardware configuration needs to be checked carefully before testing, which takes much time and is prone to errors for operators who are not very familiar with the testing principle. Similarly, before testing, the configuration information of the test program, including the version of the test program, the type of DUT test, or some encrypted content, must be checked to ensure that it matches the current ATE.
The existing relatively simple hardware configuration matching check is performed by using information set by a test program, and hardware required by the current DUT test is acquired through the information bound by the test program and then is compared with the current ATE hardware. However, this method can only simply check the type and number of the hardware according to the checking items listed in the testing program, and this method is only suitable for the exact matching of the two configurations, and cannot check the specific configuration of these hardware under the specific testing conditions.
If the DUT is tested only under certain conditions set by the test program, then the current hardware configuration of the ATE need only satisfy the hardware configuration required under the set conditions. Therefore, in this case, the simple hardware configuration matching checking method is not flexible enough, and cannot selectively check according to the test conditions, thereby limiting the application range and the test conditions of the ATE.
Disclosure of Invention
In view of this, in order to flexibly check the matching problem between the hardware configuration of the ATE and the hardware configuration required under the current test condition, the present invention provides a method for checking the matching between the hardware configuration of the ATE and the test program, which can check the overall hardware configuration and the test program configuration of the current ATE, and can also select a test condition to check whether the hardware configuration of the ATE meets the test requirement under the test condition.
The invention provides a method for checking ATE hardware configuration and test program configuration, which is characterized in that a DUT is assembled on a DUT test board of the ATE, the DUT test board is provided with an EEPROM chip, and configuration information required by testing the current DUT under various conditions is stored in the EEPROM chip;
further comprising the steps of:
A. loading a test program at a PC end, wherein the test program is communicated with an EEPROM chip on a DUT test board through the PC end to acquire information stored in the EEPROM chip;
B. the test program communicates with the ATE through a PC end, and checks whether the hardware type of the ATE is matched with the hardware type information stored in the EEPROM chip;
C. if the hardware type of the ATE is matched with the hardware type information stored in the EEPROM chip, the test program checks whether the hardware configuration of the ATE is matched with the hardware configuration information stored in the EEPROM chip;
D. and if at least one hardware configuration of the ATE is matched with the hardware configuration information stored in the EEPROM chip, the test program checks whether the hardware configuration required under the currently set test condition is matched with the hardware configuration information stored in the EEPROM chip, and if so, the check is finished.
Therefore, an EEPROM chip is welded on the DUT test board, software and hardware configuration information required by the DUT in testing under various conditions is stored in the EEPROM chip, and basic matching check can be carried out on the hardware configuration of the ATE by calling the information in the EEPROM chip every time a test program is loaded at the PC end. Furthermore, the test conditions can be manually set, and the hardware configuration of the ATE can be checked in detail according to the set test conditions, such as what type of board card is required under the test conditions, and the corresponding relationship between the position and the number of the type of board card in the ATE. The checking mode is more flexible, the requirement on the hardware configuration of the current ATE is not strict any more, the checking mode is not required to be completely the same as all information stored in the EEPROM chip, and only the current test conditions are met. Moreover, the automatic checking mode enables the checking content to be more comprehensive, consumes less time and is not easy to make mistakes, and the working efficiency is improved.
In a further improvement, the method further comprises a step E after the step A:
the test program is communicated with an EEPROM chip on a DUT board, and whether the configuration information of the test program is matched with the configuration information of the test program stored in the EEPROM chip is checked;
if the test program is matched with the test program, the configuration check of the test program is passed;
if not, the test program sends out prompt information.
Therefore, when the communication between the test program and the EEPROM chip in the step A is successful, the step B is executed to check the configuration of the hardware, and simultaneously the step E is executed to check the configuration of the test program, wherein the inherent configuration information in each test program is mainly checked, when the configuration information is completely matched with the configuration information of the test program stored in the EEPROM chip, the configuration check of the test program passes, otherwise, the configuration check of the test program fails, and the replacement of the correct test program is prompted.
Preferably, the step a includes:
and when the communication between the test program and the EEPROM chip on the DUT board fails or the information acquisition fails, the test program sends prompt information.
Therefore, after the test program is loaded, whether the EEPROM chip is welded on the DUT test board at present or not is detected, whether the relevant information is stored or not is detected, the first-step detection is realized, if the EEPROM chip is not welded on the DUT test board or the information is not stored in the EEPROM chip, an alarm command of 'no EEPROM chip is welded on the DUT test board or no information is stored in the EEPROM chip' can be generated, the failure of hardware configuration detection is prompted, and the detection process is stopped.
Preferably, the step B includes:
and when the ATE lacks a certain hardware type stored in the EEPROM chip, the test program sends out prompt information.
Therefore, when the hardware inspection is performed in the step B, the hardware type of the current system needs to be checked first, whether the required hardware type is lacked is judged, when the ATE hardware type includes all the hardware types stored in the EEPROM chip, the next inspection is performed, and if the ATE is lacked of a certain hardware type stored in the EEPROM chip, the test program jumps out of the alarm command of "the hardware type is lacked in the current test system", so that the failure of the hardware configuration inspection is prompted, and the detection process is stopped.
Preferably, the step C includes:
when the configuration of the same type of hardware of the ATE is not matched with the configuration information of the type of hardware stored in the EEPROM chip completely, the test program sends out prompt information;
if the step A, B, C check fails, the loading process can continue, but mass production is not possible.
In the above, after the hardware type of the ATE is successfully checked, the configuration of the hardware in the ATE is checked in step C, and compared with the hardware configuration information stored in the EEPROM chip, if at least one configuration of each type of hardware of the ATE is matched, the next step of checking is performed, and if the configuration of a certain type of hardware is completely unmatched with the configuration information of the type of hardware in the EEPROM chip, the test program jumps out of the alarm command of "the complete mismatch of the configuration of the current system and the EEPROM", and prompts that the hardware configuration check is failed, and the detection process is stopped.
Preferably, the step D includes:
d1, the test program checks whether the hardware configuration information required under the current set test condition is stored in the EEPROM, if not, the test program sends out prompt information, and if so, the test program acquires the stored information;
d2, the testing program checks whether the hardware type needed under the current set testing condition exists in the ATE, if not, the testing program sends out prompt information, if so, the step D3 is carried out for checking;
d3, checking whether the configuration of the hardware type needed under the current test condition in the ATE is the same as the hardware configuration information stored in the EEPROM chip, if not, sending out prompt information by the test program, and if so, finishing the check.
From the above, when the hardware configuration information is not stored in the EEPROM chip, it may be considered as a human-caused operation error, the hardware configuration information is omitted, when the hardware type does not exist in the current ATE, it is considered that the hardware type check fails, the test program pop box prompts a warning of "XX type required under XX condition does not exist in the system", and when the hardware configuration is not consistent with the hardware configuration information stored in the EEPROM chip, the test program pop box prompts a warning of "XX configuration required under XX condition does not match".
In a further improvement, the specific inspection result of each inspection step is recorded in an alarm file.
Therefore, the inspection results of all the steps are recorded in an alarm file, and error information of each step is recorded in the file in detail, so that the relevant operators can conveniently check the information in a subsequent mode.
In a further improvement, the ATE can perform mass production testing of the DUT if the hardware configuration and the test program configuration required under the currently set test conditions pass the check.
Therefore, when the hardware configuration and the test program configuration required under the current test condition meet the configuration requirements, the ATE meets the requirement of carrying out mass production test on the current DUT, and the normal test of the product can be carried out.
Further improved, if the hardware configuration check required under the currently set test condition fails, the test condition of the failure check is shielded in the test program, and the DUT test is carried out.
By above, the test condition can be set manually, and the hardware configuration check under the test condition is only carried out when the test is carried out for the first time, because the alarm information generated by each test is the same, and the frame flicking can block the production, therefore, when the hardware configuration check fails, the test can be stopped according to the test requirement, or the test is carried out for a single time, or the test condition is shielded to carry out the production.
In summary, according to the method for checking the matching between the ATE hardware configuration and the test program provided by the present invention, an EEPROM chip is soldered on a DUT test board, software and hardware configuration information required by the DUT during testing under various conditions is stored in the EEPROM chip, and during each test, the hardware configuration and the test program configuration of the current system are automatically obtained and compared with the information stored in the EEPROM chip, and the test conditions can be set independently.
The invention also provides a device for checking the matching of the ATE hardware configuration and the test program, which comprises:
the tester is connected with the PC end through a communication cable and receives an instruction of the PC end;
the DUT test board is connected with the tester and is provided with an EEPROM chip, and the EEPROM chip stores configuration information required by testing the current DUT under various conditions;
and the PC reads back the configuration information stored in the EEPROM chip and checks whether the configuration of the tester meets the configuration requirement of the current DUT test according to the configuration information.
The tester and the DUT test board are connected by a communication cable or a connector.
Therefore, the ATE device realizes the communication function between the PC end and the EEPROM chip on the DUT test board, can send an instruction to the tester through the PC machine, write the configuration information into the EEPROM chip of the DUT test board, and can check whether the configuration of the tester meets the configuration requirement of the current DUT test according to the configuration information by reading back the configuration information stored in the EEPROM chip.
Drawings
FIG. 1 is a flowchart of a method for checking the matching between the hardware configuration of ATE and a test program according to the present invention.
FIG. 2 is a diagram of an apparatus for ATE hardware configuration and test program match checking according to the present invention.
Detailed Description
In order to flexibly check the hardware configuration and the test program configuration of the ATE and the matching problem of the software and hardware configuration required under the current test condition, the invention provides a method for checking the matching of the hardware configuration and the test program of the ATE, which can check the whole hardware configuration and the test program configuration of the current ATE and check whether the hardware configuration of the ATE meets the test requirement under the specific test condition. The checking mode is more flexible and the application range is wider.
The invention provides a method for checking the matching of ATE hardware configuration and a test program, which is characterized in that an ATE is provided with a DUT test board for different DUT tests, an EEPROM chip is welded on the DUT test board, and the chip communicates with the test program of a PC end through an I2C protocol. Before testing, the configuration information required by the DUT in testing under various conditions is stored in the EEPROM chip, and the current hardware configuration and test program configuration of the ATE are automatically acquired and compared with the information stored in the EEPROM chip during each testing.
As shown in fig. 1, the method comprises the following steps:
s01: loading a test program for carrying out ATE software and hardware configuration inspection at a PC end;
s02: the test program communicates with the EEPROM chip on the DUT board through an I2C protocol to check whether information is stored in the EEPROM chip;
it should be noted that, in step S02, only whether an EEPROM chip is soldered to the DUT board and whether information is stored in the chip are checked, and the stored information content is not checked;
if no EEPROM chip is on the DUT board or no relevant information is stored in the EEPROM chip, the test program interface prompts the failure of hardware configuration check and the check program is terminated;
if there is an EEPROM chip on the DUT board and information is stored in the chip, then steps S03 and S09 are executed respectively to perform hardware configuration and test program configuration checks respectively.
Hardware configuration checking:
s03: the test program is communicated with the ATE to obtain the current hardware type of the ATE, such as the board card type or the model required by the test, and the hardware type information stored in the EEPROM chip is called for comparison;
step S03 is a hardware type check, that is, the current ATE tests the necessary hardware needed by the DUT, and the hardware type must include all the hardware types stored in the EEPROM chip, so as to ensure that when a certain piece of hardware is called in the subsequent test, the hardware exists in the current ATE;
if the hardware type stored in the EEPROM chip is absent in the current ATE, the hardware type check fails, a test program interface pop-up box prompts an alarm of 'absence of the hardware type in the current test system', and meanwhile, the information of the absent hardware type is recorded in an alarm file in detail;
if the current hardware type in the ATE comprises all the hardware types stored in the EEPROM chip, the hardware type check is passed, and S04 is carried out;
s04: the test program is communicated with the ATE to obtain the current ATE hardware configuration information, such as the position of a board card required by the test in the ATE or the connection relation of a corresponding number, and the hardware configuration information stored in the EEPROM chip is called for comparison;
if the configuration of certain type of hardware of the current ATE is not matched with the hardware configuration information of the type stored in the EEPROM chip completely, the hardware configuration check fails, a test program pops up a frame to prompt a warning that the configuration of the current system is not matched with the configuration of the EEPROM chip completely, and meanwhile, the unmatched detailed information is recorded in an alarm file in detail;
if the configuration of all types of hardware is matched with at least one item of configuration information of corresponding types of hardware stored in the EEPROM chip, the hardware configuration check is passed, and the next check can be performed according to specific test requirements, and S05 is performed;
in steps S02, S03, and S04, if the hardware configuration check fails, the test program may be loaded, but mass production cannot be performed.
S05: if at least one of the configurations of all types of hardware of the ATE is the same as the configuration information of the type of hardware corresponding to the EEPROM chip, the test program starts to acquire the specific hardware type and configuration required under the currently set test condition, and simultaneously executes the steps S06 and S07;
s06: the test program communicates with the EEPROM chip, and checks whether the hardware type information acquired in S05 is stored in the EEPROM chip;
if the hardware configuration information required under the currently set test condition is not stored in the EEPROM, the test program sends prompt information, namely the hardware type information is missed and is not stored in the EEPROM due to human-caused misoperation, so that the hardware does not perform subsequent hardware configuration check;
s07: checking whether the hardware type acquired in the step S05 exists in the current ATE;
if the hardware type does not exist in the current ATE, the hardware type check fails, and a test program pops a frame to prompt a warning that the XX type required under the XX condition does not exist in the system and records the warning in an alarm file;
step S08 is performed in a case where both of the steps S06 and S07 check pass;
s08: checking whether the configuration of the hardware type obtained in the step S05 in the current ATE is the same as the configuration information of the hardware in the EEPROM chip;
if the hardware configuration is different, the hardware configuration check fails, the test program pops up a frame to prompt a warning that the XX hardware configuration needed under the XX condition is not matched, and meanwhile, the unmatched information is recorded in an alarm file in detail;
if the hardware configuration is the same, the hardware configuration check is passed;
in this embodiment, in steps S05 to S08, the test conditions may be manually set, and the hardware configuration check under the test conditions is only performed during the first test, because if the hardware configuration check fails, the alarm information generated during each test is the same, and each frame flicking may hinder the mass production, so that when the hardware configuration check fails, the test may be immediately stopped to eliminate the error reporting information, or a single test may be performed to ignore the influence of the alarm. If the error report does not affect the actual mass production, the test condition causing the configuration check failure can be shielded, and the mass production test is continued.
Test program configuration checking:
s09: acquiring configuration information of a current test program;
s10: checking whether the configuration information of the test program is completely the same as the configuration information of the test program stored in the EEPROM;
if the test program configuration check fails, the test program popup box prompts a warning that the program information is not matched, and at the moment, the correct test program needs to be replaced;
if so, the test program configuration check passes.
The above steps S03 and S09 are performed simultaneously, S03 is a hardware check, and S09 is a program check. When the hardware configuration and the program configuration check are passed, normal test can be performed.
The present invention also provides a device for checking the matching between the ATE hardware configuration and the test program, as shown in fig. 2, the device includes:
a tester 200 connected to the PC100 via a communication cable and receiving an instruction from the PC 100;
a DUT test board 300 connected to the tester 100, the DUT test board having an EEPROM chip 310, the EEPROM chip 310 storing therein configuration information required for testing a current DUT under various conditions;
the tester 200 is connected to the DUT test board 300 by a communication cable or connector.
The device provided by this embodiment can implement the function of communication between the PC100 and the EEPROM chip 310 on the DUT test board 300, and can send an instruction to the tester through the PC100 to write the configuration information into the EEPROM chip 310 on the DUT test board, and can check whether the configuration of the tester 200 meets the configuration requirement of the current DUT test according to the configuration information by reading back the configuration information stored in the EEPROM chip 310.
The device provided by the embodiment is divided into two parts of configuration information writing and configuration information reading when in work;
the working principle of the configuration information writing part is as follows:
s01: when the configuration information needs to be written into the EEPROM chip 310 of the DUT test board 300, sending an instruction to the tester 200 through the PC100 to request to write the configuration information into the EEPROM chip 310 of the DUT test board 300;
s02: after receiving the instruction from the PC terminal 100, the tester 200 communicates with the EEPROM chip of the DUT test board, and writes configuration information required for testing the DUT under various conditions into the EEPROM chip 310.
The operation principle of the configuration information reading section is as follows:
s03: sending an instruction to the tester 200 through the PC100, requesting to read back the configuration information in the EEPROM chip 310 of the DUT test board 300;
s04: after receiving the instruction, the tester 200 communicates with the EEPROM chip 310 of the DUT test board 300, and transmits the read-back configuration information to the PC 100;
s05: the PC100 sends an instruction to the tester 200, and checks whether the configuration of the tester 200 meets the configuration requirements of the current DUT test according to the configuration information.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (7)
1. A method for checking the hardware configuration and the configuration of a test program of ATE,
assembling a DUT (device under test) on a DUT test board of an ATE (automatic test equipment), wherein the DUT test board is provided with an EEPROM (electrically erasable programmable read-only memory) chip, and configuration information required by testing the current DUT under various conditions is stored in the EEPROM chip;
further comprising the steps of:
A. loading a test program at a PC end, wherein the test program is communicated with an EEPROM chip on a DUT test board through the PC end to acquire information stored in the EEPROM chip;
B. the test program communicates with the ATE through a PC end, and checks whether the hardware type of the ATE is matched with the hardware type information stored in the EEPROM chip;
C. if the hardware type of the ATE comprises all hardware types stored in the EEPROM chip, the test program checks whether the hardware configuration of the ATE is matched with the hardware configuration information stored in the EEPROM chip;
D. if at least one of the configurations of all hardware types of the ATE is matched with the configuration information of the corresponding hardware type stored in the EEPROM chip, the test program checks whether the hardware configuration information required under the currently set test condition is stored in the EEPROM, if not, the test program sends out prompt information, and if so, the test program acquires the stored information;
the test program checks whether the hardware type required under the current set test condition exists in the ATE, if not, the test program sends out prompt information, and the configuration check fails;
if the hardware type is the same as the hardware configuration information stored in the EEPROM chip, the configuration of the hardware type required under the current test condition in the ATE is checked, if the hardware type is different from the hardware configuration information stored in the EEPROM chip, the test program sends out prompt information, the configuration check fails, and if the hardware type is the same as the hardware configuration information, the check is completed.
2. The method of claim 1, further comprising, after step a, step E:
the test program is communicated with an EEPROM chip on a DUT board, and whether the configuration information of the test program is matched with the configuration information of the test program stored in the EEPROM chip is checked;
if the test program is matched with the test program, the configuration check of the test program is passed;
if not, the test program sends out prompt information.
3. The method of claim 1, wherein step a comprises:
and when the communication fails or the information acquisition fails, the test program sends out prompt information.
4. The method of claim 1, wherein step B comprises:
and when the ATE lacks a certain hardware type stored in the EEPROM chip, the test program sends out prompt information.
5. The method of claim 1, wherein step C comprises:
and when the configuration of the same type of hardware of the ATE is not matched with the configuration information of the type of hardware stored in the EEPROM chip completely, the test program sends out prompt information.
6. The method of any one of claims 1 to 5, further comprising:
the ATE may perform mass production testing of the DUT if the hardware configuration and test program configuration required under the currently set test conditions pass the check.
7. The method of claim 6, further comprising:
and if the hardware configuration check required under the currently set test condition fails, shielding the test condition with the failed check in the test program, and testing the DUT.
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| WO2024067742A1 (en) * | 2022-09-29 | 2024-04-04 | 北京华峰测控技术股份有限公司 | Tester, and test control apparatus and method |
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| CN1892238A (en) * | 2005-06-29 | 2007-01-10 | 安捷伦科技有限公司 | Method and apparatus that provide for configuration of hardware resources specified in a test template |
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| US5634137A (en) * | 1995-01-17 | 1997-05-27 | International Business Machines Corporation | Method and apparatus for updating system configuration based on open/closed state of computer housing cover |
| CN1892238A (en) * | 2005-06-29 | 2007-01-10 | 安捷伦科技有限公司 | Method and apparatus that provide for configuration of hardware resources specified in a test template |
| CN104679619A (en) * | 2013-11-28 | 2015-06-03 | 英业达科技有限公司 | Server and detection method of server |
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