CN108845902A - A kind of ATE hardware configuration and test program check method and apparatus - Google Patents
A kind of ATE hardware configuration and test program check method and apparatus Download PDFInfo
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- CN108845902A CN108845902A CN201810613309.6A CN201810613309A CN108845902A CN 108845902 A CN108845902 A CN 108845902A CN 201810613309 A CN201810613309 A CN 201810613309A CN 108845902 A CN108845902 A CN 108845902A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2247—Verification or detection of system hardware configuration
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Abstract
Method is checked the present invention provides a kind of ATE hardware configuration and test program, is included the following steps：A, the information stored in eeprom chip is obtained with the communication of the eeprom chip on the DUT test board test program by the end PC；B, check whether the type of hardware information that stores matches in the type of hardware and eeprom chip of ATE, and check stored in the configuration and EEPROM of the test program of calling it is whether identical；C, check whether the hardware configuration information stored in the hardware configuration and eeprom chip of ATE matches；D, check whether the hardware configuration needed under the test condition currently set and the configuration information of the hardware stored in eeprom chip match.Through the invention, whether the configuration file that can flexibly check that hardware configuration and test program call when ATE tests DUT meets the needs of current test strip part.
Description
Technical field
The present invention relates to ic test technique field more particularly to a kind of of ATE hardware configuration and test program
With inspection method and device.
Background technique
The hardware of automatic test equipment (ATE) is configurable, different when using ATE test measured device (DUT)
The configuration of hardware configuration and test program required for the different parameters of DUT or DUT of the same race all may be different.If current ATE
Hardware needed for the hardware of configuration and current DUT test mismatches, and will lead to test result mistake, so needing son before testing
Thin verification checks current ATE hardware configuration, can expend many times in this way, and the operative employee for not being familiar with test philosophy
For people, it is easy to malfunction.Equally, the configuration information of test program is had to check for before test, includes test program version, DUT
Test-types or certain encrypted contents etc., guarantee and current ATE is matched.
Existing fairly simple hardware configuration, which checks, to be carried out using the information of test program setting, and survey is passed through
The hardware that the current DUT test of acquisition of information of programmatic binding needs is tried, then the hardware with current ATE compares.But this method
Can only be according to the inspection item listed in test program, type and number to type of hardware are simply checked, and this side
Method is only applicable in the two configuration exact matching, can not check concrete configuration of these hardware in fc-specific test FC.
If DUT only test program setting it is certain under the conditions of tested when, then the hardware configuration of current ATE only needs
Meet the hardware configuration required under this condition of setting.So in this case, above-mentioned simple hardware configuration
It is inflexible with inspection method, it cannot selectively be checked according to test condition, limit the scope of application and survey of ATE
Strip part.
Summary of the invention
In view of this, in order to flexibly check ATE hardware configuration and current test strip part under the hardware configuration that needs
Matching problem, check method the present invention provides a kind of ATE hardware configuration and test program, can check current
The whole hardware configuration and test program of ATE configures, moreover it is possible to select a kind of test condition, check under the test condition, ATE's is hard
Whether part configuration meets test request.
A kind of ATE hardware configuration provided by the invention and test program check method, and DUT is assembled to ATE's
On DUT test board, which has an eeprom chip, and corresponding current DUT is stored in the eeprom chip each
Required configuration information is tested under the conditions of a；
It is further comprising the steps of：
A, in the end PC load test program, which is communicated by the end PC with the eeprom chip on DUT test board,
Obtain the information stored in eeprom chip；
B, the test program is communicated by the end PC with the ATE, checks the type of hardware and eeprom chip of ATE
Whether the type of hardware information of middle storage matches；
If C, the type of hardware information matches stored in the type of hardware of the ATE and eeprom chip, the test journey
Whether the hardware configuration information stored in the hardware configuration and eeprom chip of sequence inspection ATE matches；
If D, the hardware configuration of the ATE at least one and the hardware configuration information phase that is stored in eeprom chip
Match, this stored in the hardware configuration and eeprom chip needed under the test condition that the test program inspection is currently set is hard
Whether the configuration information of part matches, if matching, has checked.
By upper, by welding an eeprom chip on DUT test board, DUT is stored in the eeprom chip each
Under the conditions of when testing required software-hardware configuration information can pass through every time in the end PC load test program and call EEPROM
Information in chip carries out basic check to the hardware configuration of ATE.Also, it can also manually set test condition, then root
According to the hardware configuration of the test condition detailed inspection ATE of setting, as needed what kind of board under the test condition and being somebody's turn to do
Type plates card position in the ate and number corresponding relationship etc..This test mode is more flexible, to the hardware configuration of current ATE
It is required that no longer so stringent, it is not necessary to it is completely identical with all information stored in eeprom chip, as long as meeting current test strip
Part.Moreover, the test mode of this automation makes the scope of examination more comprehensively, and it is time-consuming less and not easy to make mistakes, improve work
Make efficiency.
It is further improved, further includes step E after the step A：
The test program is communicated with the eeprom chip in DUT board, checks the configuration information of the test program
Whether matched with the configuration information of the test program stored in eeprom chip；
If matching, the configuration inspection of test program pass through；
If mismatching, test program issues prompt information.
By upper, when in step A test program communicate with eeprom chip successfully, execute step B to the configuration of hardware into
It is also synchronous to execute step E while row checks, the configuration of test program is checked, wherein mainly checking each test journey
Intrinsic configuration information in sequence, when the configuration information of the test program stored in configuration information and eeprom chip exactly matches
When, the configuration inspection of test program passes through, and the configuration inspection of test program otherwise can be prompted to fail, and prompt to replace correct survey
Try program.
Preferably, the step A includes：
When the eeprom chip communication failure on the test program and DUT board or the information failure is obtained, then institute
It states test program and issues prompt information.
By upper, after the completion of load test program, can detect whether weld EEPROM core on current DUT test board first
Piece, and check whether storage relevant information realizes first step detection, if do not have on DUT test board eeprom chip or
Not stored information in eeprom chip can then occur " not having on DUT test board without welding eeprom chip or eeprom chip
The alarm command of storage information ", prompts hardware configuration inspection failure, and detection process stops.
Preferably, the step B includes：
When lacking certain type of hardware stored in eeprom chip in the ATE, then the test program issues prompt letter
Breath.
By upper, in step B when carrying out hardware check, need to first check for the type of hardware of current system, judge whether
Lack required type of hardware, when ATE type of hardware includes all hardware type stored in eeprom chip, then will do it
It checks in next step, if lacking certain type of hardware of EEPROM storage in above-mentioned ATE, test program jumps out " current test system
Middle type of hardware lacks " alarm command, prompt hardware configuration inspection failure, detection process stop.
Preferably, the step C includes：
When the configuration information of the type hardware stored in the configuration of the ATE same type hardware and eeprom chip is complete
Complete to mismatch, then the test program issues prompt information；
If described step A, B, C check failure, loading procedure can be continued, but be unable to volume production.
By upper, after the type of hardware inspection success of ATE, step C checks the configuration of these hardware in ATE,
It is compared with the hardware configuration information stored in eeprom chip, if all at least one, each type of hardware of ATE configuration
Match, then carry out next step inspection, the type hardware is matched in the configuration of some type of hardware and eeprom chip if it exists
Confidence breath mismatches completely, then test program jumps out the alarm command of " configuration of current system and EEPROM mismatches completely ",
Hardware configuration inspection failure is prompted, detection process stops.
Preferably, the step D includes：
The hardware configuration information needed under the test condition that D1, the test program inspection are currently set is in EEPROM
No to be stored, if not stored, test program issues prompt information, if storage, test program obtains the information of storage；
The type of hardware needed under the test condition that D2, the test program inspection are currently set whether there is in the ate,
If it does not exist, then test program issues prompt information, and if it exists, then carries out step D3 inspection；
It is stored in the configuration in the ate of D3, the type of hardware that is needed under current test strip part of inspection and eeprom chip
Hardware configuration information it is whether identical, if it is different, then test program issue prompt information then checked if they are the same.
By upper, when hardware configuration information does not store in eeprom chip, it is believed that it is artificial origin's operation error,
The hardware configuration information is missed, in the absence of the type of hardware is in current ATE, then it is assumed that type of hardware inspection failure,
Test program bullet frame prompt " the XX type needed under the conditions of XX is not present in systems " warning, when the hardware configuration with
When the hardware configuration information stored in eeprom chip is inconsistent, test program bullet frame prompt " the XX configuration needed under the conditions of XX
The warning of mismatch ".
It is further improved, the particular exam result of each checking step is recorded in an alert files.
By upper, the result that each step checks is recorded in an alert files, and each step error information all can be detailed
It is carefully recorded in file, carries out subsequent check convenient for relevant operation personnel.
It is further improved, if the inspection of hardware configuration and the test program configuration needed under the test condition currently set is logical
Out-of-date, the ATE can carry out the volume production test to DUT.
By upper, when hardware configuration and the test program configuration required under current test strip part all reaches configuration requirement, then should
ATE reaches the requirement that volume production test is carried out to current DUT, can carry out the proper testing of product.
It is further improved, if the hardware configuration inspection needed under the test condition currently set fails, in the test
Shielding checks the test condition of failure in program, carries out DUT test.
By upper, test condition can manually be set, and the hardware under the test condition is only carried out when testing for the first time
Configuration inspection, the reason is that, the warning message that test generates every time is identical, and bullet frame can hinder the progress of volume production every time, therefore,
When hardware configuration inspection failure, it can determine to be off according to the demand of test to test perhaps single test or shield and test
Condition carries out volume production.
In conclusion a kind of ATE hardware configuration provided by the invention and test program check method, by
An eeprom chip is welded on DUT test board, is stored in the eeprom chip required when DUT is tested under the conditions of each
Software-hardware configuration information, and in each test, the automatic hardware configuration for obtaining current system and test program configuration with
The information stored in eeprom chip compares, and test condition can be individually set, Current hardware type and configuration
The requirement of current test strip part need to only be met, do not need with all exact matchings for being stored in eeprom chip, therefore,
, can be more flexible and vdiverse in function in actual use, it does not need when changing test condition every time, also wants corresponding change whole
Body hardware configuration.
The present invention also provides the devices that a kind of ATE hardware configuration and test program check, including：
Test machine is connect with the end PC by communication cable, and the instruction at the end PC is received；
DUT test board is connect with the test machine, which has an eeprom chip, in the eeprom chip
It is stored with corresponding current DUT and tests required configuration information under the conditions of each；
The PC passes through the configuration information stored in readback eeprom chip, and checks matching for test machine according to configuration information
The configuration requirement for whether meeting current DUT test set.
Wherein, it is connected between the test machine and DUT test board using communication cable or connector.
By upper, this ATE device realizes the function of the eeprom chip communication on the end PC and DUT test board, can both lead to
It crosses PC machine and sends instruction to test machine, by the eeprom chip of configuration information write-in DUT test board, readback can also be passed through
The configuration information stored in eeprom chip checks whether the configuration of test machine meets current DUT test according to configuration information
Configuration requirement.
Detailed description of the invention
Fig. 1 is the flow chart for checking method of ATE hardware configuration of the present invention and test program.
Fig. 2 is the schematic diagram for the device that ATE hardware configuration of the present invention is checked with test program.
Specific embodiment
In order to flexibly check ATE hardware configuration and test program configuration and current test strip part under need it is soft or hard
The matching problem of part configuration checks method the present invention provides a kind of ATE hardware configuration and test program, can check
The whole hardware configuration and test program configuration of current ATE, moreover it is possible to check in fc-specific test FC, the hardware configuration of ATE is
It is no to meet test request.This test mode is more flexible, and the scope of application is also wider.
Method is checked the present invention provides a kind of ATE hardware configuration and test program, since ATE is for different
DUT test is all configured with one piece of oneself DUT test board, and an eeprom chip is welded on DUT test board, which passes through
I2C agreement is communicated with the test program at the end PC.Before testing, required when DUT being tested under the conditions of each to match confidence
Breath storage into the eeprom chip, every time test when, obtain automatically current ATE hardware configuration and test program configuration with
The information of eeprom chip storage compares.
As shown in Figure 1, including the following steps：
S01：The test program for carrying out ATE software and hardware configuration inspection is loaded at the end PC；
S02：Above-mentioned test program is communicated by I2C agreement with the eeprom chip in DUT board, checks EEPROM core
Whether information is stored in piece；
It should be noted that step S02 only checks whether to weld whether deposit in DUT board in eeprom chip and the chip
Information is stored up, the information content of storage is not checked；
If not having not stored in eeprom chip or eeprom chip to have relevant information, test program interface in DUT board
Hardware configuration inspection failure is prompted, checks program determination；
If having in eeprom chip and the chip in DUT board and storing information, step S03 and S09 are executed respectively, respectively
Carry out hardware configuration and test program configuration inspection.
Hardware configuration inspection：
S03：Above-mentioned test program is communicated with ATE, obtains the type of hardware of current ATE, the board needed for such as testing
Type or model, and the type of hardware information stored in eeprom chip is called to compare；
Step S03 is type of hardware inspection, i.e., current ATE tests required necessary hardware, the type of hardware when DUT
It must include all hardware type stored in eeprom chip, when guaranteeing to call a certain item hardware in test later,
The hardware exists in current ATE；
If lacking the type of hardware stored in eeprom chip in current ATE, type of hardware inspection failure, test program
Interface bullet frame prompts the alarm of " type of hardware lacks in current test system ", while the type of hardware information lacked will be remembered in detail
Record is in alert files；
If the type of hardware in current ATE includes all hardware type stored in eeprom chip, type of hardware inspection
It looks into and passes through, carry out S04；
S04：Above-mentioned test program is communicated with ATE, obtains current ATE hardware configuration information, and the board needed for such as testing exists
The connection relationship of position or reference numeral in ATE, and the hardware configuration information stored in eeprom chip is called to compare；
If the configuration of certain type of hardware of current ATE and the hardware configuration information of the type that eeprom chip stores are complete
It mismatches, then hardware configuration inspection fails, and " configuration of current system and eeprom chip is completely not for the prompt of test program bullet frame
With " warning, while unmatched details will be recorded in alert files in detail；
If the configuration information of the corresponding types hardware of the configuration of all types hardware and eeprom chip storage is all at least
One matches, then hardware configuration inspection passes through, and can carry out next step inspection for specific testing requirement, carry out S05；
, can be with load test program if hardware configuration inspection fails in step S02, S03 and S04, but the not amount of can be carried out
It produces.
S05：If the configuration all at least one of ATE all types hardware and the configuration of eeprom chip corresponding types hardware
Information is identical, and test program starts to obtain required specific type of hardware and configuration under the test condition currently set, together
Shi Zhihang step S06 and S07；
S06：Above-mentioned test program is communicated with eeprom chip, and whether the type of hardware information obtained in inspection S05
It is stored in eeprom chip；
If required hardware configuration information does not store in EEPROM under the test condition currently set, test program
Prompt information is issued, that is, is considered due to artificial origin's operation error, which is missed, and is not stored in
In EEPROM, so the hardware no longer carries out subsequent hardware configuration inspection；
S07：Check that the type of hardware obtained in S05 whether there is in current ATE；
If the type of hardware is not present in current ATE, type of hardware inspection failure, test program bullet frame prompts " XX
Under the conditions of the XX type that needs be not present in systems " warning, while being recorded in alert files；
Step S06 and S07 all check by the case where carry out step S08；
S08：Check the configuration of the type of hardware hardware in the configuration of current ATE and eeprom chip obtained in S05
Whether information is identical；
If it is different, then hardware configuration inspection fails, " the XX hardware configuration needed under the conditions of XX is or not the prompt of test program bullet frame
The warning of matching ", while unmatched information will be recorded in alert files in detail；
If they are the same, then hardware configuration inspection passes through；
In the present embodiment, in step S05~S08, test condition can manually be set, and only be carried out when testing for the first time
Hardware configuration inspection under the test condition, the reason is that, if hardware configuration inspection fails, the warning message that test generates every time
It is identical, and bullet frame can hinder the progress of volume production every time, therefore, when hardware configuration inspection failure, can stop testing immediately, arrange
Except error information, or single test is carried out, ignores the influence that alarm generates.If this, which reports an error, does not influence practical volume production, maskable to lead
The test condition for causing configuration inspection failure continues volume production test.
Test program configuration inspection：
S09：Obtain the configuration information of current test program；
S10：Check whether the configuration information of test program is identical with the test program configuration information of EEPROM storage；
If it is different, test program configuration inspection fails, the unmatched warning of test program bullet frame attention program information, at this time
Correct test program must be replaced；
If they are the same, test program configuration inspection passes through.
Above-mentioned steps S03 is synchronous with S09 to be executed, and S03 is hardware check, and S09 is program checkout.When above-mentioned hardware configuration and
After program configuration inspection all passes through, proper testing can be carried out.
The present invention also provides the devices that a kind of ATE hardware configuration and test program check, as shown in Fig. 2, the present apparatus
Including：
Test machine 200 is connect with PC 100 by communication cable, and the instruction of PC 100 is received；
DUT test board 300 is connect with the test machine 100, which has an eeprom chip 310, should
It is stored with corresponding current DUT in eeprom chip 310 and tests required configuration information under the conditions of each；
Wherein, it is connected between the test machine 200 and DUT test board 300 using communication cable or connector.
Device provided in this embodiment, the eeprom chip 310 that may be implemented on PC 100 and DUT test board 300 communicate
Function, both can by PC 100 to test machine send instruct, by configuration information write-in DUT test board eeprom chip
In 310, test machine 200 can also be checked according to configuration information by the configuration information stored in readback eeprom chip 310
Whether configuration meets the configuration requirement of current DUT test.
Device provided in this embodiment is divided into configuration information write-in at work and configuration information reads two parts；
Wherein, the working principle of configuration information write-in part is as follows：
S01：When need by configuration information be written DUT test board 300 eeprom chip 310 in when, by PC 100 to
Test machine 200 sends instruction, and request will be in the eeprom chip 310 of configuration information write-in DUT test board 300；
S02：After test machine 200 receives the instruction at the end PC 100, communicated with the eeprom chip of DUT test board, it will
Corresponding current DUT tests required configuration information under the conditions of each and is written in eeprom chip 310.
The working principle that configuration information reads part is as follows：
S03：It is sent and is instructed to test machine 200 by PC100, request the eeprom chip 310 of readback DUT test board 300
In configuration information；
S04：It after test machine 200 receives instruction, is communicated, will be returned with the eeprom chip 310 of DUT test board 300
The configuration information of reading sends PC100 to；
S05：The PC100 sends to test machine 200 and instructs, and according to configuration information, whether the configuration of inspection test machine 200
Meet the configuration requirement of current DUT test.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Within mind and principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of ATE hardware configuration and test program check method, which is characterized in that
DUT is assembled on the DUT test board of ATE, which has an eeprom chip, deposits in the eeprom chip
It contains corresponding current DUT and tests required configuration information under the conditions of each；
It is further comprising the steps of：
A, in the end PC load test program, which is communicated by the end PC with the eeprom chip on DUT test board, is obtained
The information stored in eeprom chip；
B, the test program is communicated by the end PC with the ATE, is checked in the type of hardware and eeprom chip of ATE and is deposited
Whether the type of hardware information of storage matches；
If C, the type of hardware information matches stored in the type of hardware of the ATE and eeprom chip, the test program inspection
Look into whether the hardware configuration information stored in the hardware configuration and eeprom chip of ATE matches；
If D, the hardware configuration of the ATE at least one matches with the hardware configuration information stored in eeprom chip, institute
State the hardware configuration needed under the test condition that test program inspection is currently set and the hardware stored in eeprom chip
Whether configuration information matches, if matching, has checked.
2. the method according to claim 1, wherein further including step E after step A：
The test program is communicated with the eeprom chip in DUT board, check the configuration information of the test program with
Whether the configuration information of the test program stored in eeprom chip matches；
If matching, the configuration inspection of test program pass through；
If mismatching, test program issues prompt information.
3. the method according to claim 1, wherein the step A includes：
When the communication failure or the information failure is obtained, then the test program issues prompt information.
4. the method according to claim 1, wherein the step B includes：
When lacking certain type of hardware stored in eeprom chip in the ATE, then the test program issues prompt information.
5. the method according to claim 1, wherein the step C includes：
When the type hardware stored in the configuration of the ATE same type hardware and eeprom chip configuration information completely not
Matching, then the test program issues prompt information.
6. the method according to claim 1, wherein the step D includes：
The hardware configuration information needed under the test condition that D1, the test program inspection are currently set in EEPROM whether by
Storage, if not stored, test program issues prompt information, if storage, test program obtains the information of storage；
The type of hardware needed under the test condition that D2, the test program inspection are currently set whether there is in the ate, if not
In the presence of then test program issues prompt information, configuration inspection failure, and if it exists, then carry out step D3 inspection；
It is stored in the configuration in the ate of D3, the type of hardware that is needed under current test strip part of inspection and eeprom chip hard
Whether part configuration information is identical, if it is different, then test program issues prompt information, configuration inspection failure if they are the same, is then checked out
At.
7. the test method of the method according to claim 1, which is characterized in that further include：
If the inspection of hardware configuration and the test program configuration needed under the test condition currently set passes through, the ATE can
Carry out the volume production test to DUT.
8. the test method of the method according to claim 11, which is characterized in that further include：
If when the hardware configuration inspection failure needed under the test condition currently set, shielding, which checks, in the test program is lost
The test condition lost carries out DUT test.
9. the device that a kind of ATE hardware configuration and test program check, which is characterized in that including：
Test machine is connect with the end PC by communication cable, and the instruction at the end PC is received；
DUT test board is connect with the test machine, which has an eeprom chip, is stored in the eeprom chip
There is corresponding current DUT to test required configuration information under the conditions of each；
The PC passes through the configuration information stored in readback eeprom chip, and is according to the configuration of configuration information inspection test machine
The no configuration requirement for meeting current DUT test.
10. device according to claim 9, which is characterized in that use connection between the test machine and DUT test board
Cable or connector connection.
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| CN112764392B (en) * | 2021-04-07 | 2021-08-03 | 成都飞机工业（集团）有限责任公司 | Method for preventing numerical control program calling error in numerical control machining |
| WO2024067742A1 (en) * | 2022-09-29 | 2024-04-04 | 北京华峰测控技术股份有限公司 | Tester, and test control apparatus and method |
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