CN108761205B - Cable path and insulation testing method and tester - Google Patents
Cable path and insulation testing method and tester Download PDFInfo
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- CN108761205B CN108761205B CN201810491208.6A CN201810491208A CN108761205B CN 108761205 B CN108761205 B CN 108761205B CN 201810491208 A CN201810491208 A CN 201810491208A CN 108761205 B CN108761205 B CN 108761205B
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- 238000009413 insulation Methods 0.000 title claims abstract description 52
- 238000012360 testing method Methods 0.000 title claims abstract description 43
- 238000001514 detection method Methods 0.000 claims abstract description 26
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- 238000002955 isolation Methods 0.000 claims description 10
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
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Abstract
The invention discloses a testing method and a tester for cable paths and insulation, comprising a path detection module and an insulation detection module; when a cable passage is tested, one ends of two cable core wires are short-circuited by a short-circuit ring, a measuring end is led out from the other ends of the core wires to the adapter box, and a Wheatstone bridge on a passage detection module is used for detecting the passage resistance between the two core wires; when the cable insulation test is performed, the two ends of A, B of each cable core wire are connected with IGBT modules, a keyboard is used for selecting a certain core wire to be detected, a processor isolates the core wire through the IGBT modules, short-circuits all other core wires, and the insulation resistance between the core wire and all other core wires can be read after the direct-current power supply module applies test voltage through the IGBT modules; the invention improves the overall test speed, reduces the workload and completes the multiple measurement of the tested cable in a short time.
Description
Technical field:
The present invention relates to a cable testing method, and more particularly, to a cable passage and insulation testing method and apparatus.
The background technology is as follows:
the power cable is commonly used for urban underground power grids, power station leading-out lines, power supply in industrial and mining enterprises and power transmission lines under sea water passing through the river. In the electric power line, the proportion of the cable is gradually increasing. Power cables are cable products used in the main line of power systems to transmit and distribute high power electrical energy, including various voltage classes of 1-500KV and above, and various insulated power cables.
Along with the gradual improvement of the automation level of equipment, the used multicore cables are gradually increased in the electric energy transmission process of large-scale equipment such as missiles, satellites, airplanes, ships, power stations and the like. Multicore cables are often used for the transmission of electrical energy and the transmission of control signals over short distances. Because the cable is influenced by external bad factors, part of the cable is laid in a movable way, and faults are inevitably generated in the using process. Statistical studies have shown that over 20% of the system failures in the above fields are due to cable failures. As can be seen, the failure of the multi-core cable has become an extremely important factor affecting the overall reliability of the system. On-resistance and insulation resistance testing of the cable in the device and its control accessories is one of the important items of control system testing. The on-resistance reflects the on-off relation between two points of the circuit, the insulation resistance reflects the insulation degree between independent loops of the circuit, and whether the values of the insulation resistance are qualified or not directly influences the reliability of a control system and the success or failure of a control result.
Mature high-voltage power supply products exist in the market at present, but power supplies outputting 500V high voltage often have large output power (more than 100W), so that the price of the whole product can be high. In the cable insulation test, the high voltage (100 to 1000V) and the small current (generally within 10 mA) are adopted, the output power of the whole power supply is between a few watts and tens of watts, in this case, if a high-power product is selected to be purchased, larger waste can occur, the existing product is inconvenient to purchase for the program-controlled stepping output of the power supply, and human intervention is required in the operation process, so that the reliability of the system is reduced.
The invention comprises the following steps:
the technical problems to be solved by the invention are as follows: the cable path and the insulation test method and the tester can automatically complete the conduction relation and insulation resistance measurement tasks of the electric wires and the cables under the condition that the equipment is not connected with a power supply and have the functions of later data analysis and result preservation.
A cable path and insulation test method comprises the following steps: A. selecting the type or number of the tested cable and the selected test type through a keyboard and a display of the man-machine interaction module, and setting the voltage output level and the display test state;
B. One end of a plurality of cable cores comprising the cable core to be tested is short-circuited through a short-circuit ring, each core is regarded as a resistor, a measuring end is led out from the other end of the core to a transfer box of the tester, and a Wheatstone bridge on a passage detection module is used for detecting voltages at two ends of an external resistor so as to calculate the passage resistance between the two cores;
C. the two ends of the cable core wire are connected to the IGBT module through the adapter, and the insulation resistance is detected by the control of the singlechip, and the steps are as follows:
a. the two ends of A, B of each cable core wire are connected with IGBTs, wherein the IGBTs at the end A are connected with a power supply, and the IGBTs at the end B are connected with the ground;
b. selecting a certain core wire to be detected by using a keyboard, and sending an instruction for conducting the IGBT connected with the end A of the core wire, turning off the IGBTs connected with all other ends A of the core wire, turning off the IGBTs connected with the end B of the core wire and conducting the IGBTs connected with all other ends B of the core wire by using a singlechip;
c. After the power module applies test voltage through the IGBT, a current-voltage method detection circuit on the insulation detection module is used for reading insulation resistance between the core wire and all other core wires according to the measured voltage of the external resistor end;
D. The signals to be tested in the step A and the step B are led out, amplified and filtered to different degrees, input into an ADC module and conditioned to an acceptable range of the ADC module of the singlechip, and then data acquisition is directly carried out through the singlechip;
E. The single chip microcomputer sends the acquired voltage calculation path and insulation resistance to the upper computer, and the upper computer software can process the data and store the data into a database to analyze, model and predict historical data.
In the step C, the power supply module outputs at least three voltage levels for testing insulation resistance, the IGBT module comprises an IGBT switch and an IGBT drive, terminals such as all needed signals and power supplies are led out and are connected to the singlechip, one row of IGBTs of the IGBT module is connected with the core wire A end, the other row of IGBTs is connected with the core wire B end, the IGBTs of the A end are connected with the power supply, the IGBTs of the B end are connected with the ground, a gating decoder is arranged at the IGBT array end of the IGBT module, and for n-core cables, 2^x different states can be output after decoding by using x I/O ports, wherein 2 x > n is satisfied, and the switching on and switching off of the IGBT array can be controlled.
The IGBT module is driven by an IGBT driving circuit, the driving circuit is divided into two stages, and the first stage is an optocoupler isolator for realizing the isolation of a singlechip signal and a test signal and ensuring the stable operation of an embedded system; the second stage is a transistor driving circuit, is also in the true sense of IGBT driving, and provides reliable driving voltage and driving power for the IGBT grid electrode, and the working process is as follows; the singlechip outputs a control on or off signal, the signal is Ug after being decoded by the decoder, and the signal is driven by the transistor through optocoupler isolation, so that the on or off of the IGBT is controlled, and the gating of the cable core wire is finally realized.
The cable channel and insulation tester comprises an upper computer, a single chip microcomputer, a detection main board, a direct current power supply module and an IGBT module, wherein the upper computer is communicated with the single chip microcomputer through a serial port or a USB;
and the singlechip is used for: the device can receive the instruction sent by the upper computer and also transmit the detected data to the upper computer;
The upper computer: the data can be processed, such as stored in a database, and historical data can be analyzed, modeled and predicted;
Direct current power supply module: the multi-way switch is gated through the singlechip and the decoder, so that the stepping output of voltages at all levels is realized;
and the man-machine interaction module is used for: the device comprises a keyboard and a display, wherein the keyboard is used for setting related functions, switching a passage and an insulation test and displaying detection information;
IGBT module: the IGBT driving circuit comprises an IGBT switch and an IGBT driving circuit; the IGBT switch is used for leading out all needed signal terminals, power supply terminals and the like and is connected to the singlechip;
IGBT driving circuit: the drive circuit can be divided into two stages, wherein the first stage is an optical coupler isolator, so that the isolation of a singlechip signal and a test signal is realized, the stable operation of an embedded system is ensured, and the second stage is a transistor drive circuit, is also an IGBT drive in a true sense, and provides reliable drive voltage and drive power for an IGBT grid electrode;
The transfer box comprises: for directly connecting the cable to the junction box through the connector;
the detection main board comprises a passage detection module and an insulation detection module.
One row of IGBTs of the IGBT module is used for being connected with the core wire A end, the other row of IGBTs is used for being connected with the core wire B end, wherein the IGBTs of the A end are all connected with a power supply, and the IGBTs of the B end are all connected with the ground
The IGBT driving circuit outputs a control on-off signal through the singlechip, is Ug after being decoded by the decoder, is driven by the transistor through optocoupler isolation, and further controls the on-off of the IGBT.
The direct current power supply module adopts an integrated power supply driving chip TL494 as a switching power supply controller.
The beneficial effects of the invention are as follows:
1. The invention is suitable for testing cables of equipment of different types, can automatically complete the conduction relation and insulation resistance measurement tasks of the wires and the cables under the condition that the equipment is not connected with a power supply, has the functions of later data analysis and result storage, and effectively saves time and labor.
2. The invention designs the measured connector of the measured cable into a switching mode, integrates the measured connector on one module, and directly connects the cable to the switching box through the connector when the measured cable needs to be tested, thereby not only improving the overall test speed, but also reducing the workload and completing the repeated measurement of the measured cable in a short time.
3. After the tested signal is led out, the tested signal is required to be amplified and filtered to different degrees and then is input into the ADC module, and as a plurality of 10 or 12-bit ADC modules are integrated in the singlechip, the tested signal is conditioned to the acceptable range of the singlechip ADC module, and then the data acquisition can be directly carried out; only 64 or 128 IGBT switches are arranged on each circuit board, all needed terminals such as signals and power supply are led out, and the circuit board can be connected to a tester main board when needed, so that the circuit board is convenient to expand.
4. According to the invention, three voltage gears of 500V, 250V and 100V are set through an upper computer or man-machine interaction, direct current voltages with different grades are required for different tested cables or insulating materials, and according to actual requirements, the power supply can program-control output three voltage grades of 100V,250V and 500V for insulation test.
5. In the aspect of measurement, the insulation resistance measurement network and the cable conduction relation measurement network are integrated, so that the volume and the power consumption of the system are reduced; in the aspects of communication and data processing, a singlechip embedded design technology, an object-oriented software design method, a communication interface and a computer communication technology are integrated, so that the degree of automation of the system is greatly improved, and one tester can complete all testing operations, thereby saving manpower, material resources and financial resources.
6. The invention realizes rapid and automatic intelligent test, so that the cable to be tested can be measured for multiple times in a short time, the measurement time is saved, and the accuracy of the measurement result can be further improved by comparing and comprehensively analyzing the data of the multiple measurement results.
Description of the drawings:
FIG. 1 is a schematic diagram of a cable pathway test strobe circuit;
FIG. 2 is a schematic diagram of a wire path resistance measurement using a Wheatstone bridge method;
FIG. 3 is a schematic diagram of an insulation test strobe circuit;
FIG. 4 is a schematic diagram of the current-voltage method for measuring insulation resistance;
Fig. 5 is an IGBT drive schematic;
FIG. 6 is a circuit diagram of a DC power module;
Fig. 7 is a block diagram of the cable pathway and insulation tester.
The specific embodiment is as follows:
examples: see fig. 1, 2,3,4, 5, 6, and 7.
The invention will be described in more detail with reference to examples.
The specific structure of the cable passage and the insulation tester is shown in fig. 7, and the cable passage and the insulation tester comprise the following modules: the control power supply output module adopts an integrated power supply driving chip TL494 as a switching power supply controller, and realizes the stepping output of each stage of direct-current voltage by gating a multi-way switch through a singlechip (circuit schematic diagram is shown in figure 6); the man-machine interaction module comprises a keyboard and a display; the IGBT array module comprises an IGBT switch and an IGBT driver, wherein the IGBT switch is used for leading out all needed signals, power supplies and other wiring ends and is connected to a tester main board, one row of IGBTs of the IGBT array module are connected with a core wire A end, the other row of IGBTs are connected with a core wire B end, the IGBTs of the A end are connected with the power supply, the IGBTs of the B end are connected with the ground, the IGBT driver is divided into two stages, the first stage is an optical coupling isolator, isolation of a singlechip signal and a channel and insulation test signal is realized, and stable operation of an embedded system is ensured; the second stage is a transistor driving circuit, which is also an IGBT driving in a true sense, and provides reliable driving voltage and driving power for the IGBT gate. The working principle of IGBT driving is that a singlechip outputs a control on-off signal, the signal is Ug after decoding, and the signal is driven by a transistor through optocoupler isolation, so that the on-off of the IGBT is controlled, and finally, the gating of a cable core wire is realized; the cable is connected to the adapter box of the tester through the connector; the embedded system comprises a singlechip and a detection main board, wherein the detection main board comprises a passage detection module and an insulation detection module.
The three-gear programmable direct current power supply at least comprises 100V,250V and 500V programmable direct current power supply modules: for different cables or insulating materials to be tested, direct current voltages with different grades are needed, and according to actual requirements, the power supply can program-control output three voltage grades of 100V,250V and 500V for insulation test.
The man-machine interaction module comprises a keyboard and a display. Through the man-machine interaction module, basic settings such as selecting the type (number) of the cable to be tested, selecting the type (path or insulation) of the test, setting the voltage output level, displaying the state of the tester, etc. can be carried out. The upper computer can communicate (serial port or USB) with the processor, the processor can receive some instructions sent by the upper computer, and can transmit detected data to the upper computer, and the upper computer software can process the data, such as storing the data into a database, analyzing, modeling, predicting the historical data and the like. And the power output control module can set three voltage gears of 500V, 250V and 100V of power output through upper computer software or man-machine interaction.
For an n-core cable, an IGBT module consisting of 2n IGBT switches is needed, for such a large-scale IGBT switch array, as the I/O resources of a singlechip are limited, the direct control on or off of the I/O ports is impossible, so that a decoder is considered, the n-core cable can output 2^x different states after decoding by using x I/O ports, wherein the requirements of 2 x > n are met, such as a 400-core cable, and 9I/O ports can output 2^9 =512 different states after decoding, so that the on/off of the IGBT array can be controlled.
After the tested signal is led out, the tested signal is amplified, filtered and then input into an ADC module. Considering that a plurality of 10 or 12-bit ADC modules are integrated in most single-chip microcomputer at present, the data acquisition can be directly carried out after the measured signal is conditioned to the acceptable range of the single-chip microcomputer ADC module. Only 64 or 128 IGBT switches are arranged on each circuit board, all needed terminals such as signals and power supply are led out, and the circuit board can be connected to a tester main board when needed. Thus, the expansion of the system is also facilitated.
Referring to fig. 1, when the cable path is tested and gated, one end of a plurality of cable core wires including core wires to be tested is shorted by a shorting ring, then each core wire can be regarded as a resistor Ri for an n-core cable, after one end is shorted, a measuring end is led out from the other end, if n is even, n/2 times of measurement are needed, and if n is odd, n+1/2 times of measurement are needed (one core wire can be measured twice). As shown in the figure 1, two lines can be led out from the ends R1 and R2, and can be used as measuring ends, and the test can be carried out until R399 and R400 are reached.
When the path resistance test is carried out, the path resistance is detected by using a Wheatstone bridge method, and the circuit schematic diagram is shown in figure 2.
The deduction can be carried out:
Wherein R x is the to-be-detected path resistance, R c is the limiting resistance, R i is close to R x+Rc, and the rest resistances are external resistances.
With this method, the influence of supply voltage fluctuations on the test accuracy can be effectively reduced as compared with Uo2 and Uo1, but the disadvantage is that two parameters are read per test.
If the power supply voltage is very stable, the two resistances of the left bridge arm are equal, the precision and the temperature drift coefficient are very close, and only Uo1 can be read, the formula can be simplified as follows:
Where u is the V supply voltage Vcc.
When the cable insulation test is gated, for example, when the core wire 1 in fig. 3 (core wire 1) is to be detected, an instruction can be sent to turn on the IGBT switch Z1A, turn off all other IGBT switches ZiA, turn off the IGBT switch Z1B, turn on all other IGBT switches ZiB, wherein the IGBT at the a end is connected with a power supply, the IGBT at the B end is connected with the ground, the core wire 1 is isolated, all other core wires are short-circuited, and insulation resistance between the core wire 1 and all other core wires can be read after the test voltage is applied.
The cable insulation test adopts a current-voltage method, and the principle is as shown in fig. 4:
The measured resistance Rx after deduction is:
Wherein Rx1 is an insulation resistor, and the rest resistors are external resistors.
The IGBT driving circuit is shown in fig. 5. Considering that the number of IGBTs in the system is large, but the functions to be realized are very simple (switching functions), if the integrated IGBT driving module is used, the design is properly simplified, but many functions are not used, so that the resource waste is caused, the cost is high, and therefore, the discrete components are decided to be used for forming the IGBT driving circuit. The circuit can be divided into two stages, wherein the first stage is an optical coupler isolator, so that the isolation of a singlechip signal and a channel/insulation test signal is realized, and the stable operation of an embedded system is ensured; the second stage is a transistor driving circuit, which is also an IGBT driving in a true sense, and provides reliable driving voltage and driving power for the IGBT gate.
The working process of the driving circuit is as follows: the singlechip outputs a control on or off signal, the signal is Ug after decoding, and the signal is driven by a transistor through optocoupler isolation, so that the on or off of the IGBT is controlled, and finally the gating of the cable core wire is realized.
The above description is only of the preferred embodiments of the present invention, and is not intended to limit the present invention in any way, and any simple modification, equivalent variation and modification made to the above embodiments according to the technical principles of the present invention still fall within the scope of the technical solutions of the present invention.
Claims (2)
1. A cable path and insulation test method, its step is: the method is carried out on the basis of a cable passage and an insulation tester;
The tester is as follows: the upper computer is communicated with the singlechip through a serial port or a USB, the singlechip is connected with the detection main board, the direct-current power supply module and the IGBT module, and the detection main board is connected with the transfer box;
and the singlechip is used for: the device can receive the instruction sent by the upper computer and also transmit the detected data to the upper computer;
The upper computer: processing the data;
Direct current power supply module: the multi-way switch is gated through the singlechip and the decoder, so that the stepping output of voltages at all levels is realized;
And the man-machine interaction module is used for: the device comprises a keyboard and a display, wherein the keyboard is used for setting functions, switching a passage and an insulation test and displaying detection information;
IGBT module: the IGBT driving circuit comprises an IGBT switch and an IGBT driving circuit; the IGBT switch is used for leading out all needed signals and power supply terminals and is connected to the singlechip;
IGBT driving circuit: the drive circuit is divided into two stages, wherein the first stage is an optical coupler isolator, so that the isolation of a singlechip signal and a test signal is realized, the stable operation of an embedded system is ensured, and the second stage is a transistor drive circuit which is also an IGBT drive in a true sense and provides reliable drive voltage and drive power for an IGBT grid electrode;
The transfer box comprises: for directly connecting the cable to the junction box through the connector;
The detection main board comprises a passage detection module and an insulation detection module;
the cable passage and insulation test method comprises the following steps:
A. Selecting the type or number of the tested cable according to the test type through a keyboard and a display of the man-machine interaction module, and setting the voltage output level and the display test state;
B. One end of a multi-core cable core wire containing a cable core wire to be tested is short-circuited through a short-circuit ring, each core wire is regarded as a resistor, a measuring end is led out from the other end of the core wire to an adapter box of the tester, and a Wheatstone bridge on a passage detection module is used for detecting voltages at two ends of an external resistor so as to calculate a passage resistance between the two core wires;
C. the two ends of the cable core wire are connected to the IGBT module through the adapter, and the insulation resistance is detected by the control of the singlechip, and the steps are as follows:
a. the two ends of A, B of each cable core wire are connected with IGBTs, wherein the IGBTs at the end A are connected with a power supply, and the IGBTs at the end B are connected with the ground;
b. selecting a certain core wire to be detected by using a keyboard, and sending an instruction for conducting the IGBT connected with the end A of the core wire, turning off the IGBTs connected with all other ends A of the core wire, turning off the IGBTs connected with the end B of the core wire and conducting the IGBTs connected with all other ends B of the core wire by using a singlechip;
c. After the DC power supply module applies test voltage through IGBT, the current-voltage method detection circuit on the insulation detection module is used for reading the insulation resistance between the core wire and all other core wires according to the measured voltage of the external resistance end;
D. C and B, after the detection signals in the step C and the step B are led out, the detection signals are amplified and filtered to different degrees, are input into an ADC module and conditioned to an acceptable range of the ADC module of the singlechip, and are directly subjected to data acquisition through the singlechip;
E. The voltage acquired by the singlechip calculates the path and the insulation resistance, the calculated path and insulation resistance are sent to the upper computer, the upper computer software can process the data and store the data into a database, and historical data is analyzed, modeled and predicted;
In the step C, the power supply module outputs at least three voltage levels for testing insulation resistance, one row of IGBTs of the IGBT module is used for being connected with the core wire A end, the other row of IGBTs is used for being connected with the core wire B end, the IGBTs of the A end are all connected with a power supply, the IGBTs of the B end are all connected with the ground, a gating decoder is arranged at the IGBT array end of the IGBT module, and for n-core cables, 2^x different states can be output after decoding by using x I/O ports, wherein 2 x > n is satisfied, and the switching on and switching off of the IGBT array are sufficiently controlled;
The IGBT module is driven by an IGBT driving circuit, and the working process is as follows: the singlechip outputs a control on or off signal, the signal is Ug after being decoded by the decoder, and the signal is driven by the transistor through optocoupler isolation, so that the on or off of the IGBT is controlled, and the gating of the cable core wire is finally realized.
2. The cable pathway and insulation testing method of claim 1, wherein: the direct current power supply module adopts an integrated power supply driving chip TL494 as a switching power supply controller.
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| CN109725243B (en) * | 2018-11-16 | 2020-09-29 | 湖北江山重工有限责任公司 | Multi-core cable insulation automatic measuring device |
| CN109342805B (en) * | 2018-11-21 | 2020-12-22 | 陕西电器研究所 | High-precision microampere current detection circuit |
| CN110988483A (en) * | 2019-12-10 | 2020-04-10 | 北京航天自动控制研究所 | Cable insulation tester based on inspection file rapid generation method |
| CN114236302B (en) * | 2020-09-09 | 2024-04-30 | 上海电缆研究所有限公司 | Testing method and system for cable state |
| CN112858790B (en) * | 2021-01-19 | 2023-11-07 | 西安西电光电缆有限责任公司 | Single-end connection test method for direct-current resistor of multi-core cable |
| CN113534016B (en) * | 2021-05-31 | 2024-06-11 | 北京航天光华电子技术有限公司 | Self-learning test system and method suitable for tester |
| CN113687186B (en) * | 2021-08-30 | 2024-02-13 | 上海歆广数据科技有限公司 | Portable multi-core cable tester of distributing type |
| CN116773986A (en) * | 2023-08-18 | 2023-09-19 | 中国科学院深海科学与工程研究所 | System and method for detecting insulation and conductivity of deep sea equipment cable |
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