CN108693405A - A kind of two line test devices and method eliminated multichannel switching circuit and influenced - Google Patents
A kind of two line test devices and method eliminated multichannel switching circuit and influenced Download PDFInfo
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- CN108693405A CN108693405A CN201710223531.0A CN201710223531A CN108693405A CN 108693405 A CN108693405 A CN 108693405A CN 201710223531 A CN201710223531 A CN 201710223531A CN 108693405 A CN108693405 A CN 108693405A
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- channel
- test
- tch test
- tch
- resistance value
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- 238000012360 testing method Methods 0.000 title claims abstract description 136
- 238000000034 method Methods 0.000 title claims abstract description 7
- 230000008030 elimination Effects 0.000 description 3
- 238000003379 elimination reaction Methods 0.000 description 3
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Abstract
The invention belongs to observation and control technology fields, and in particular to a kind of two line test devices and method eliminated multichannel switching circuit and influenced.The device includes the first TCH test channel and the second TCH test channel, and the first TCH test channel and the second TCH test channel include upper channel and lower channel, and four channels are both provided with internal switching relay;Inside switching relay on the upper channel and lower channel of first TCH test channel is connect with the test core point x1 of TCH test channel external terminal connector, and the inside switching relay on the upper channel and lower channel of the second TCH test channel is connect with the test core point x2 of TCH test channel external terminal connector;It is connected between two terminals of tested measuring resistance termination plug-in unit and is tested measuring resistance.The present invention can be applicable in the system of the automatic continuous low-resistance test of multichannel, and higher accuracy is realized while reducing cost, completely eliminate influence of the conducting resistance of the switching relay of TCH test channel to test accuracy.
Description
Technical field
The invention belongs to observation and control technology fields, and in particular to a kind of two lines test dress eliminated multichannel switching circuit and influenced
It sets and method.
Background technology
When being tested using resistance value of the multichannel cable system tester between cable steel wire rack point, the resistance value between core point is mostly
Ω grades of m, in order to obtain accurate resistance value generally require use " test of four lines ", each TCH test channel need occupancy two core points,
For the cable system of same scale, it is one using " test of two lines " to need the channel core points occupied using " test of four lines "
Times, cost also doubles, and because the sampled point of " test of two lines " is in internal system, the resistance value of test switches comprising channel
Relay conducting resistance, inner lead resistance etc. influence the accuracy of test, how to eliminate the shadow of inner passage convert resistance
Ring, realize the accuracy of " test of two lines " reach " test of four lines " it is horizontal, obtain accurate cable resistance value be at present there is an urgent need to
It solves the problems, such as.
Invention content
The purpose of the present invention is to provide it is a kind of elimination multichannel switching circuit influence two line test devices and method, with
It solves the above problems.
In order to achieve the above objectives, the technical solution used in the present invention is:
A kind of two line test devices eliminated multichannel switching circuit and influenced, including the first TCH test channel and the second test are led to
Road, the first TCH test channel and the second TCH test channel include upper channel and lower channel, four channels be both provided with internal switching after
Electric appliance;Inside switching relay on the upper channel and lower channel of first TCH test channel is patched with TCH test channel external terminal
The test core point x1 connections of part, the inside switching relay on the upper channel and lower channel of the second TCH test channel is and TCH test channel
The test core point x2 connections of external terminal connector;It is connected between two terminals of tested measuring resistance termination plug-in unit tested
Measuring resistance.
A kind of two wire testing methods of the two line test devices influenced based on the elimination multichannel switching circuit are as follows:
(a) it connects TCH test channel external terminal connector and terminates plug-in unit with tested measuring resistance, connect outside TCH test channel
The test core point x1 of line terminal connector is connected to the terminals y1 of tested measuring resistance termination plug-in unit;TCH test channel external terminal
The test core point x2 of connector is connected to the terminals y2 of tested measuring resistance termination plug-in unit;
(b) lower channel of the upper channel and the second TCH test channel of the first TCH test channel is connected, if the resistance value that test obtains
For RT12, formula is as follows:
RT12=r1+Rx+r4 (1)
(c) lower channel of the upper channel and the first TCH test channel of the second TCH test channel is connected, if the resistance value that test obtains
For RT21, formula is as follows:
RT21=r3+Rx+r2 (2)
(d) upper channel and lower channel of the first TCH test channel are connected, if the resistance value that test obtains is RT1, formula is such as
Under:
RT1=r1+r2 (3)
(e) upper channel and lower channel of the second TCH test channel are connected, if the resistance value that test obtains is RT2, formula is such as
Under:
RT2=r3+r4 (4)
(f) tested standard electric resistance value can be obtained by formula (1), formula (2), formula (3) and formula (4):
Wherein, the resistance value of switching relay is r1, the first TCH test channel lower channel inside the first TCH test channel upper channel
The resistance value of inside switching relay is r2, and the resistance value of switching relay is r3 inside the second TCH test channel upper channel, second
The resistance value of switching relay is r4 inside TCH test channel lower channel, and it is Rx to be tested standard electric resistance value.
It is obtained by the present invention to have the beneficial effect that:
The present invention can be applicable in the system of the automatic continuous low-resistance test of multichannel, be realized while reducing cost higher
Accuracy completely eliminates influence of the conducting resistance of the switching relay of TCH test channel to test accuracy.
Description of the drawings
Fig. 1 is the two line test device structure charts eliminated multichannel switching circuit and influenced;
In figure:H:The upper channel being arranged when test;L:The lower channel being arranged when test;T1:First TCH test channel, T2:The
Two TCH test channels can be set as upper channel H or lower channel L by system CPU respectively;r1:It is cut inside first TCH test channel upper channel
Change the resistance value of relay;r2:The resistance value of switching relay inside first TCH test channel lower channel;r3:Second TCH test channel
The resistance value of switching relay inside upper channel;r4:The resistance value of switching relay inside second TCH test channel lower channel;A:It surveys
External terminal connector is pinged, tested measuring resistance can be connected;x1,x2:The test core point of connector A;B:Tested standard
Resistance terminal connector;y1,y2:Tested measuring resistance terminals;Rx:Tested measuring resistance.
Specific implementation mode
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.
As shown in Figure 1, the two line test devices of the present invention for eliminating the influence of multichannel switching circuit include the first test
Channel T1 and the second TCH test channel T2, the first TCH test channel T1 and the second TCH test channel T2 includes upper channel H and lower channel L,
Four channels are both provided with internal switching relay, and the resistance value for switching relay inside the first TCH test channel upper channel is r1,
The resistance value of switching relay is r2 inside first TCH test channel lower channel, switches relay inside the second TCH test channel upper channel
Resistance value be r3, the resistance value of switching relay is r4 inside the second TCH test channel lower channel;First TCH test channel T1's is upper
Inside switching relay on channel H and lower channel L connects with the test core point x1 of TCH test channel external terminal connector A
It connects, the inside switching relay on the upper channel H and lower channel L of the second TCH test channel T2 is terminated with TCH test channel external cabling
The test core point x2 connections of plug-in unit A;It is connected between tested measuring resistance the terminals y1 and y2 of tested measuring resistance termination plug-in unit B
Tested measuring resistance Rx.
Two wire testing methods of the two line test devices based on the influence of above-mentioned elimination multichannel switching circuit are as follows:
(a) TCH test channel external terminal connector A and tested measuring resistance are connected and terminates plug-in unit B, outside TCH test channel
The test core point x1 of terminals connector A is connected to the terminals y1 of tested measuring resistance termination plug-in unit B;It is connect outside TCH test channel
The test core point x2 of line terminal connector A is connected to the terminals y2 of tested measuring resistance termination plug-in unit B;
(b) the lower channel L of the upper channel H and the second TCH test channel T2 of the first TCH test channel T1 are connected, if what test obtained
Resistance value is RT12, formula is as follows:
RT12=r1+Rx+r4 (1)
(c) the lower channel L of the upper channel H and the first TCH test channel T1 of the second TCH test channel T2 are connected, if what test obtained
Resistance value is RT21, formula is as follows:
RT21=r3+Rx+r2 (2)
(d) the upper channel H and lower channel L of the first TCH test channel T1 are connected, if the resistance value that test obtains is RT1, formula
It is as follows:
RT1=r1+r2 (3)
(e) the upper channel H and lower channel L of the second TCH test channel T2 are connected, if the resistance value that test obtains is RT2, formula
It is as follows:
RT2=r3+r4 (4)
(f) tested standard electric resistance value can be obtained by formula (1), formula (2), formula (3) and formula (4):
Claims (2)
1. a kind of two line test devices eliminated multichannel switching circuit and influenced, it is characterised in that:Including the first TCH test channel and
Second TCH test channel, the first TCH test channel and the second TCH test channel include upper channel and lower channel, and four channels are both provided with
Inside switching relay;On the upper channel and lower channel of first TCH test channel inside switching relay with outside TCH test channel
The test core point x1 connections of terminals connector, the inside switching relay on the upper channel and lower channel of the second TCH test channel are equal
It is connect with the test core point x2 of TCH test channel external terminal connector;Two terminals of tested measuring resistance termination plug-in unit it
Between connect be tested measuring resistance.
2. a kind of based on the two line test sides for eliminating the two line test devices that multichannel switching circuit influences described in claim 1
Method, it is characterised in that:This method is as follows:
(a) it connects TCH test channel external terminal connector and terminates plug-in unit, TCH test channel external terminal with tested measuring resistance
The test core point x1 of connector is connected to the terminals y1 of tested measuring resistance termination plug-in unit;TCH test channel external terminal patches
The test core point x2 of part is connected to the terminals y2 of tested measuring resistance termination plug-in unit;
(b) lower channel of the upper channel and the second TCH test channel of the first TCH test channel is connected, if the resistance value that test obtains is
RT12, formula is as follows:
RT12=r1+Rx+r4 (1)
(c) lower channel of the upper channel and the first TCH test channel of the second TCH test channel is connected, if the resistance value that test obtains is
RT21, formula is as follows:
RT21=r3+Rx+r2 (2)
(d) upper channel and lower channel of the first TCH test channel are connected, if the resistance value that test obtains is RT1, formula is as follows:
RT1=r1+r2 (3)
(e) upper channel and lower channel of the second TCH test channel are connected, if the resistance value that test obtains is RT2, formula is as follows:
RT2=r3+r4 (4)
(f) tested standard electric resistance value can be obtained by formula (1), formula (2), formula (3) and formula (4):
Wherein, switch the resistance value of relay inside the first TCH test channel upper channel for r1, inside the first TCH test channel lower channel
The resistance value for switching relay is r2, and the resistance value for switching relay inside the second TCH test channel upper channel is r3, the second test
The resistance value of switching relay is r4 inside the lower channel of channel, and it is Rx to be tested standard electric resistance value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710223531.0A CN108693405A (en) | 2017-04-07 | 2017-04-07 | A kind of two line test devices and method eliminated multichannel switching circuit and influenced |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710223531.0A CN108693405A (en) | 2017-04-07 | 2017-04-07 | A kind of two line test devices and method eliminated multichannel switching circuit and influenced |
Publications (1)
| Publication Number | Publication Date |
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| CN108693405A true CN108693405A (en) | 2018-10-23 |
Family
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| CN201710223531.0A Pending CN108693405A (en) | 2017-04-07 | 2017-04-07 | A kind of two line test devices and method eliminated multichannel switching circuit and influenced |
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Citations (8)
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|---|---|---|---|---|
| JPH06123751A (en) * | 1992-10-09 | 1994-05-06 | Advantest Corp | Connection test method for four-wire resistance measurement and four-wire resistance measuring unit capable of employing the method |
| JP2005069727A (en) * | 2003-08-28 | 2005-03-17 | Kyowa Electron Instr Co Ltd | Multi-channel strain measuring circuit |
| CN201945637U (en) * | 2010-12-31 | 2011-08-24 | 房慧龙 | Resistance tester with wide temperature range, wide measuring range, high precision and low cost |
| CN104614589A (en) * | 2015-01-19 | 2015-05-13 | 浙江中控自动化仪表有限公司 | Lead-resistance-removed resistance signal source and resistance measuring circuit thereof |
| CN104849559A (en) * | 2015-06-01 | 2015-08-19 | 绵阳市维博电子有限责任公司 | Apparatus and method for testing contact resistance of conductive slip ring automatically |
| CN106199475A (en) * | 2015-03-02 | 2016-12-07 | 罗德施瓦兹两合股份有限公司 | Calibration steps and calibrating installation |
| CN106383272A (en) * | 2015-07-30 | 2017-02-08 | 北京电子工程总体研究所 | High-precision small resistor resistance measurement circuit |
| CN206671421U (en) * | 2017-04-07 | 2017-11-24 | 北京航天计量测试技术研究所 | A kind of two line test devices for eliminating multichannel switching circuit and influenceing |
-
2017
- 2017-04-07 CN CN201710223531.0A patent/CN108693405A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06123751A (en) * | 1992-10-09 | 1994-05-06 | Advantest Corp | Connection test method for four-wire resistance measurement and four-wire resistance measuring unit capable of employing the method |
| JP2005069727A (en) * | 2003-08-28 | 2005-03-17 | Kyowa Electron Instr Co Ltd | Multi-channel strain measuring circuit |
| CN201945637U (en) * | 2010-12-31 | 2011-08-24 | 房慧龙 | Resistance tester with wide temperature range, wide measuring range, high precision and low cost |
| CN104614589A (en) * | 2015-01-19 | 2015-05-13 | 浙江中控自动化仪表有限公司 | Lead-resistance-removed resistance signal source and resistance measuring circuit thereof |
| CN106199475A (en) * | 2015-03-02 | 2016-12-07 | 罗德施瓦兹两合股份有限公司 | Calibration steps and calibrating installation |
| CN104849559A (en) * | 2015-06-01 | 2015-08-19 | 绵阳市维博电子有限责任公司 | Apparatus and method for testing contact resistance of conductive slip ring automatically |
| CN106383272A (en) * | 2015-07-30 | 2017-02-08 | 北京电子工程总体研究所 | High-precision small resistor resistance measurement circuit |
| CN206671421U (en) * | 2017-04-07 | 2017-11-24 | 北京航天计量测试技术研究所 | A kind of two line test devices for eliminating multichannel switching circuit and influenceing |
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| 王颖: "提高工业铂热电阻检定效率的技术措施", 中国计量, pages 96 - 98 * |
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