CN108663070A - Digital sensor system - Google Patents

Digital sensor system Download PDF

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Publication number
CN108663070A
CN108663070A CN201810259850.1A CN201810259850A CN108663070A CN 108663070 A CN108663070 A CN 108663070A CN 201810259850 A CN201810259850 A CN 201810259850A CN 108663070 A CN108663070 A CN 108663070A
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China
Prior art keywords
wake
sensor
signal
digital
microcontroller
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Granted
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CN201810259850.1A
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CN108663070B (en
Inventor
M·莫茨
C·伯德纳
T·克兰兹
W·谢尔
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Infineon Technologies AG
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Infineon Technologies AG
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Priority claimed from US15/470,267 external-priority patent/US9959128B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G01D5/249—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using pulse code
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16—Constructional details or arrangements
    • G06F1/1613—Constructional details or arrangements for portable computers
    • G06F1/1633—Constructional details or arrangements of portable computers not specific to the type of enclosures covered by groups G06F1/1615 - G06F1/1626
    • G06F1/1656—Details related to functional adaptations of the enclosure, e.g. to provide protection against EMI, shock, water, or to host detachable peripherals like a mouse or removable expansions units like PCMCIA cards, or to provide access to internal components for maintenance or to removable storage supports like CDs or DVDs, or to mechanically mount accessories
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16—Constructional details or arrangements
    • G06F1/1613—Constructional details or arrangements for portable computers
    • G06F1/1633—Constructional details or arrangements of portable computers not specific to the type of enclosures covered by groups G06F1/1615 - G06F1/1626
    • G06F1/1675—Miscellaneous details related to the relative movement between the different enclosures or enclosure parts
    • G06F1/1679—Miscellaneous details related to the relative movement between the different enclosures or enclosure parts for locking or maintaining the movable parts of the enclosure in a fixed position, e.g. latching mechanism at the edge of the display in a laptop or for the screen protective cover of a PDA
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16—Constructional details or arrangements
    • G06F1/1613—Constructional details or arrangements for portable computers
    • G06F1/1633—Constructional details or arrangements of portable computers not specific to the type of enclosures covered by groups G06F1/1615 - G06F1/1626
    • G06F1/1684—Constructional details or arrangements related to integrated I/O peripherals not covered by groups G06F1/1635 - G06F1/1675
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/16—Constructional details or arrangements
    • G06F1/1613—Constructional details or arrangements for portable computers
    • G06F1/1633—Constructional details or arrangements of portable computers not specific to the type of enclosures covered by groups G06F1/1615 - G06F1/1626
    • G06F1/1684—Constructional details or arrangements related to integrated I/O peripherals not covered by groups G06F1/1635 - G06F1/1675
    • G06F1/1694—Constructional details or arrangements related to integrated I/O peripherals not covered by groups G06F1/1635 - G06F1/1675 the I/O peripheral being a single or a set of motion sensors for pointer control or gesture input obtained by sensing movements of the portable computer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
    • G06F1/3206—Monitoring of events, devices or parameters that trigger a change in power modality
    • G06F1/3215—Monitoring of peripheral devices
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/82—Protecting input, output or interconnection devices
    • G06F21/83—Protecting input, output or interconnection devices input devices, e.g. keyboards, mice or controllers thereof

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Computer Security & Cryptography (AREA)
  • Software Systems (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electronic Switches (AREA)

Abstract

This disclosure relates to digital sensor system.System may include digital sensor system, and digital sensor system includes sensor element and digital interface.Digital interface can be based on being executed by sensor element to sensor operation later by digital sensor system detectio in predefined event and providing wake-up signal.The system may include microcontroller, to receive the wake-up signal provided by digital interface, and be waken up from suspend mode based on the wake-up signal provided by digital interface is received.

Description

Digital sensor system
Cross reference
The application is that the U.S. Patent application No.14/926,602 submitted on October 29th, 2015 (is now United States Patent (USP) No.9,606,603) part continuation application, the U.S. Patent application are required according to 35U.S.C. § 119 on November 6th, 2014 The priority of the German patent application No.102014222651.1 of submission, the German patent application are whole simultaneously with it by quoting Enter herein.
Technical field
The embodiment of the present invention is related to sensor field, relates more specifically to digital sensor system regions.
Background technology
Sensor uses in multiple fields, and some of fields require low power sensor.Sensor may be used as using In the detector of user's interaction, such as detecting opening/closing for mobile phone/tablet computer, for the control in vehicle System, for control stick etc..Sensor is also used as anti-tamper detector, such as measures fields such as (e-metering) in electrostatic In.Sensor may be also used in position and motion detector, such as in the household electrical appliance of such as washing machine etc..
Several solutions can use non-contact type magnetic solution due to their durability.It is previously mentioned Field in requirement can be related to one-dimensional sensor (1D sensors) use and multidimensional sensor (2D sensors or 3D are passed Sensor) use.In magnetic solution, one-dimensional or multidimensional sensor can be realized using Hall sensor.Routinely, Such sensor only provides limited function, such as only provides single switch function.However, it is now desired to it is provided by sensor Additional feature, and it is inadequate only to provide single switch function.For example, it is desirable to which linear sense sets to cope with sensing system The inaccuracy set, the inaccuracy of such as magnetic setting.This inaccuracy can be for example originating from using in sensing system The use of inexpensive component.This inaccuracy is handled by following：Using microcontroller and realize specific function, such as The function of some Signal's behavior (such as 50Hz buzzs) of magnetic background in electrometer is measured, rather than only detection has some The field of intensity whether there is.Under identical characterization, diversity may be implemented in sensing system, to realize in safety-critical application Higher level of security or diagnosis covering, such as the functional safety of motor vehicles requirement.
Invention content
The embodiment provides a kind of digital sensor system, which includes sensor member Part, the analog-digital converter for being coupled to sensor element and predefined event is configured to respond to activate sensor element and mould The wake-up circuit of number converter.
Description of the drawings
For the more complete understanding present invention and its advantage, it is described below referring now to what is carried out in conjunction with attached drawing, wherein：
Fig. 1 shows the block diagram for the exemplary simulated sensing system for realizing low cost and low power switch solution；
Fig. 2 shows the schematic block diagrams of digital sensor system according to an embodiment of the invention；
Fig. 3 shows one embodiment of digital sensor system according to the present invention, and wherein wake-up circuit includes to meter Number device provides the low frequency of low frequency clock signal, low-power oscillator；
Fig. 4 shows the additional embodiment of the digital sensor system of the present invention of the embodiment similar to Fig. 3, wherein calling out Circuit of waking up exports triggering or activation signal via interface；
Fig. 5 shows that another embodiment of the digital sensor system of the present invention, wherein microcontroller do not have and its phase Associated oscillator；
Fig. 6 shows the digital sensor system according to the present invention operated in digital data format and switching mode Additional embodiment；
Fig. 7 show using multiple sensors and provided via single output multidimensional switch (logical combination of judgement) with And one embodiment of the digital sensor system of the present invention of one-dimensional PWM outputs and one-dimensional linear output；
Fig. 8 shows the multidimensional digital sensor system of the sensing system based on Fig. 3；
Fig. 9 shows another embodiment, and according to this embodiment, digital sensor system of the invention includes on piece number letter Number processor；
Figure 10 shows low-power control and the number being used to switch with PWM operations without unnecessary hardware spending One embodiment of comparator concept；
Figure 11 shows the exemplary realization of the analog/digital converter as that can use according to an embodiment of the invention Mode；
Figure 12 shows the simplified block diagram of the integrated circuit die for realizing digital sensor system according to the embodiment；
Figure 13 shows that the embodiment of the digital sensor systematic difference circuit for invention, wherein Figure 13 (a) are shown Wherein sensor chip and microcontroller receive the embodiment of different electrical power voltage, and Figure 13 (b) is shown in which to sense Device chip and microcontroller receive the embodiment of different electrical power voltage；
Figure 14 shows the additional embodiment of the digital sensor system for the invention for realizing 3D sensor chips；
Figure 15 shows the embodiment for the application circuit that can be used for the sensor chips of the IC as described in Figure 14, wherein Figure 15 (a) realization method using six pins is shown, and Figure 15 (b) shows the realization method using eight pins；
Figure 16 shows the conversion plan in " low-power mode " of the sensor IC described about Figure 14；
Figure 17 shows the conversion plans when IC sensors shown in Figure 14 are operated in quick mode；
Figure 18 shows and is touched after the transmission that the permission main equipment for carrying out autonomous device controller controls sampling time point The conversion plan of hair；
Figure 19 shows one embodiment of event detector circuit, can be implemented in the wake-up circuit of Fig. 2；
Figure 20 illustrates one embodiment of the area-optimized comparator circuit for fixing limit value, can be in Figure 19 Circuit in use；And
Figure 21 illustrates the behavior of the circuit of Figure 19 of the area-optimized comparator circuit using Figure 20.
Specific implementation mode
The embodiment of the present invention is discussed in detail below, it should be appreciated, however, that present invention offer can be various The many applicable concept of the invention particularly hereinafter implemented.The specific embodiment discussed only illustrates to manufacture and use this hair Bright concrete mode, does not limit the scope of the invention.In to being described below of embodiment, it is with the same function identical or Similar components have same reference mark associated there, and will not repeat retouching for such element for each embodiment It states.
The present invention will be described about the embodiment in the context of Magnetic Sensor (such as Hall sensor), however this Invention can also be applied to other sensors, as mechanical pick-up device (such as MEMS pressure sensor, accelerometer and actuator), Or environmental sensor (such as temperature sensor, humidity sensor etc.).
Fig. 1 is the block diagram for the exemplary simulated sensing system for realizing low cost and low power switch solution.Sensing Device system may include Hall sensor element 100, in response to magnetic field, the sensing of output expression magnetic field intensity on online 102 Device signal.Analog sensor signal is applied to analog comparator/latch circuit 104, the sensing that will be received via line 102 Device signal is compared with reference value.Result of the comparison is latched in comparator/latch circuit 104, and comparator/lock The output signal of latch circuit 104 is exported to output driver 108 via line 106.Output driver 108 is provided in output line The output signal of the sensing system provided on 110.Sensing system shown in Fig. 1 further includes such as low cost and low-power The pierce circuit 112 of pierce circuit provides clock signal on online 114 to counter 116, and counter 116 is via line 118 enable circuit 120 to biasing provides count signal, biases and enables circuit 120 then on online 122 to comparator/latch Circuit 104 provides enable signal, for controlling its operation.Drive circuit 108 may also include DfT blocks 124, and (DfT=" is used for The design of test "), provide such as by line 126 indicate for example during the production of chip test can in co-used chip shape At sensing system one or more elements possibility.
The sensing system described about Fig. 1 is implemented in analog domain.During operation, sensing system senses magnetic , magnetic field intensity is compared with switching point by means of comparator/latch circuit 104, and in each operational phase End switching output.Biasing enables circuit 120 and provides for operating Hall sensor element 100 (referring to the dotted line 123 in Fig. 1) With the electric current of other active components (such as comparator/latch circuit 104).Driver 108 may be implemented as from comparator/lock Output latch in latch circuit 104 receives open-drain (open drain) output transistor of output signal.
The sensing system of Fig. 1 is realized in analog domain using sensor element and analog comparator.Such simulation side Method carrys out bi-directional scaling usually as " linear " function, and the advantages of do not allow using update method, such as " secondary power refers to Number (power-of-two exponential) " function carrys out the use of the digital method of bi-directional scaling.Furthermore, it is possible to by using Analog compensation principle it is relatively uncertain, because of their inaccuracies dependent on simulation.Moreover, DfT ratios based on simulation are based on The DfT of number is more into the innovation.Simulated implementation mode other is the disadvantage is that mixed switch/linear work(can not possibly be provided Energy.In addition, when be implemented to performance, such as when for providing numeral output, simulation solution (is not deposited using continuous operation In duty cycle operation) several ADC design.Moreover, analogy method realizes different functions in separated block, and such mould Block concept has increased power demand and cannot provide the power-efficient realization of more complicated function.Other defect is, Analogy method is not unusual area efficient, i.e., floor space is high, such as it is in 4mm2-6mm2Range in.In addition, not closing Note ultra low power application.
Therefore, it is necessary to improved and more efficient sensing systems, are, for example, more area efficient and more energy Efficiently, it and can provide more multi-functional.
The present invention provides a kind of digital sensor system, which includes sensor element, is coupled to The analog-digital converter of sensor element activates sensor element and analog-digital converter with predefined event is configured to respond to Wake-up circuit.
According to embodiment, predefined event includes at least one event selected from the following group：Time predefined makes a reservation for The passage of adopted time interval, the signal with predefined value, reset signal and diagnostic signal from other sensor element.
According to embodiment, digital sensor system further includes being coupled to the digital signal processor of analog-digital converter.
According to embodiment, digital sensor system is configured as：Meet in the digital signal generated by analog-digital converter pre- In the case of definition standard, activation in response to sensor element and analog-digital converter or in response to predefining event activates number Word signal processor.
According to embodiment, predefined standard is set when manufacturing or initializing digital sensor system, and wherein, grasping During work, predefined standard is fixed, or can be changed in response to setting signal.
According to embodiment, digital signal processor is configured as：In response to the digital signal that is generated by analog-digital converter and Modification predefined standard replaces current predefined standard to obtain new predefined standard by new predefined standard.
According to embodiment, digital signal processor is configured as：Whether the determining digital signal generated by analog-digital converter In predefined scope, determined except predefined scope potentially in the digital signal generated by analog-digital converter Interference or the presence of failure, and cause the change of predefined event and/or predefined standard so that wake-up circuit is more frequently When activating sensor element and analog-digital converter, or sensor element and analog-digital converter being made to be operated continuously predefined Between section.
According to embodiment, digital sensor system further includes being coupled to the memory of analog-digital converter, wherein memory quilt It is configured to storage predefined standard.
According to embodiment, digital signal processor is configured as being in suspend mode when not being activated.
According to embodiment, digital signal processor is configured as：It is provided to wake-up circuit while in suspend mode The signal of indicating predetermined justice event, and be maintained in suspend mode or return to suspend mode, until activation.
According to embodiment, digital signal processor includes being coupled to the digital comparator of analog-digital converter and being coupled to number The signal processing circuit of comparator.
According to embodiment, digital sensor system includes the first oscillator, first oscillator be configurable to generate including First clock signal of at least predefined event.
According to embodiment, digital sensor system includes the second oscillator, when which is configured as by first The second clock signal of clock signal activation and generation for operating analog-digital converter, second clock signal have than the first clock The high clock frequency of signal, wherein the second oscillator is configured as working as by analog-digital converter to the sensor from sensor element The processing of signal is deactivated (deactivated) when completing.
According to embodiment, digital signal processor is configured as by the first clock activating signal and generates for operating mould The second clock signal of number converter, second clock signal have the clock frequency higher than the first clock signal.
According to embodiment, at least sensor element, analog-digital converter and wake-up circuit is formed IC chip, collection At circuit chip include that sensor element, analog-digital converter and wake-up circuit are formed circuit board on or in which, and It is coupled to one or more external contacts of sensor element, analog-digital converter and wake-up circuit.
According to embodiment, IC chip further includes at least part of digital signal processor.
According to embodiment, IC chip further includes the interface for being coupled with external digital signal processor.
According to embodiment, digital sensor system includes controller, and wherein controller is configured such that wake-up circuit quilt It activates or is deactivated, wherein digital sensor system is configured as：When wake-up circuit is deactivated, in response to external trigger Signal and continuously or intermittently operate.
According to embodiment, sensor element includes one or more Magnetic Sensors, as xMR sensors, Hall sensor or Spinning current Hall sensor, or in order to finely tune or diagnostic purpose and measure the sensing such as voltage, temperature, the physical quantity of electric current Device.
According to embodiment, wake-up circuit is configured as output wake-up signal.In the embodiment of reference switch function, switch Output signal can also be used as wake-up signal.
According to embodiment, wake-up signal may include pulse or pulse code.
The embodiment of the present invention is advantageous, because they provide the new digital sensing more much smaller than known sensor system Device system, (it has such as 4mm to e.g. above-mentioned analog sensor system (referring to Fig. 1)2-6mm2Area consumption) very One of, while embodiment allows the much smaller realization method in 0.35 μm of low-cost technologies, such as with about 0.6mm2 Maximum target size.The embodiment provides the solutions in sensor field, are focusing on a design In switch and the combination of linear function, resource-sharing in the case of allow low-power design, cost-effective realization method, Thus the wider target that covers emerging application, the focusing to better bi-directional scaling digital function, and the implementation of the present invention Example introduces the concept for providing digital microcontroller input and digital value function (linear transducer data).In addition, embodiment is It is advantageous, because they provide the high efficiency realization method in the case where that need not be used for the expense of production test, Yi Jishe It counts block and is used for high resource-sharing of the cost estimate to product feature.For example, the above-mentioned property of digital sensor system allows also to use The redundant sensor for acting on functional safety design, without adding many or sizable cost to total system.
Fig. 2 shows the schematic block diagrams of digital sensor system according to an embodiment of the invention.Digital sensor system System includes Hall sensor element 200.According to other embodiment, other sensors, such as other kinds of magnetic can also be used Sensor (such as xMR sensors), or sense the sensor of other physical properties.The sensing provided by Hall sensor element 200 Device signal is output to analog-digital converter (ADC) 204 via line 202, and analog sensor signal is converted to sensor signal Digital representation, which is output to interface circuit 208 via line 206, in the output 210 of digital sensor system Place provides digital signal.
Digital sensor system includes being respectively coupled to calling out for sensor element 200 and ADC 204 via line 214 and 216 Awake circuit 212.Wake-up circuit 212 is provided, to supply wake-up signal 214,216, for being activated in response to predefined event Hall sensor element 200 and ADC 204.Wake-up circuit 212 can for example provide clock signal to ADC 204, and make Electric current is provided to Hall sensor element 200 to allow the measurement to magnetic field.
So that wake-up circuit 212 provide signal 214,216 predetermined event for example can be one of the following or It is multiple：Predefine or time predefined, the passage of predefined time interval, from other sensor element (sensor member Part be located at the digital sensor system of Fig. 2 inside either external sensor element) signal, external reset signal or outside Diagnostic signal.In addition, for multidimensional sensor (such as 2D or 3D magnetic field sensors), sensor 200 can be replicated, and Multiplexing or parallel ADC 204 and interface 208 can be used, can be controlled by wake-up circuit 212.Wake-up circuit can also make It is parameterized with an interface in the interface (being not shown in Fig. 2) or interface 208 of its own.Following embodiment explanation may Combination in some.
According to embodiment, digital sensor system is formed as IC chip or bare die 218 comprising circuit board is (such as Substrate appropriate) and one or more pads or pin for limiting external contacts.In fig. 2,210 schematic tables are exported Show one in such pads/pins.Hall sensor element, ADC converters and wake-up circuit are implemented as in circuit board In/on integrated circuit, and total can be packaged.
Fig. 3 shows one embodiment of digital sensor system according to the present invention, and wherein wake-up circuit 212 includes the One oscillator 220 can be operated with low frequency and when providing low frequency to counter circuit 224 on output line 222 The low-power oscillator of clock signal.Output signal from counter circuit 224 is provided to ADC triggers/match via line 226 Circuits 228 provide the configuration signal for operating the second oscillator 232 in ADC triggers/configuration circuit 228 online 230, Second clock signal with the frequency higher than the first clock signal is provided on the second oscillator 232 online 216.Clock signal can For operating ADC 204.In addition it is shown that external microcontroller 234, is coupled to digital sensor core via output 210 Piece 218, and it is with third oscillator 236 associated there.External microcontroller 234 may include microprocessor.
Sensing system can also include DfT (" for test design ") circuit 238, be coupled to interface 208 and It is coupled to ADC triggers/configuration circuit 228 and ADC 204 via line 240 and 242 respectively.DfT circuits 238 allow for example in life Test chip 218 between term.Test may include for diagnostic purpose during production or at the scene to sensor chip 218 The analog and/or digital of the function of element is tested.
In the fig. 3 embodiment, digital sensor system includes providing the first oscillator 220 of arousal function, such as by Any rising edge for the clock signal that first (slow) oscillator 220 provides can be counted by counter 224, and arrived After predefined Counter Value, trigger signal is exported on online 226, for executing sensor operation is caused via circuit 228 The wake-up of two oscillators 232.Sensor operation may include single measurement or repeatedly measure, such as in predefined interval or period On multiple measurement.Multiple measurement in interval can be carried out periodically.Sensor operation may include using ADC to coming from sensing The conversion of one or more measured values of device element.Additional measuring signal processing circuit can be provided to allow the knowledge of threshold value Not, to determine the average value of sensor signal or to allow the fine tuning of sensor output signal.After the completion of sensor operation, Second oscillator 232 can be turned off again, and external microcontroller or digital signal processing unit 234 can use third Oscillator 236 and be activated (such as from suspend mode wake up).
According to embodiment, can depend on by the ADC sensor operations executed as a result, for example depending on by sensing system The value of the signal exported on online 206, to trigger the wake-up of external microcontroller 234 so that be regarded only as indicating it is expected to measure The signal of value is further processed in microcontroller 234.Data transfer to microcontroller 234 can be via interface.According to Embodiment, microcontroller 234 can be turned off/deactivate after completing to handle received signal.
In some implementations, waking up for microcontroller 234 can be by the output offer in sensor chip 218 Wake-up signal triggers, and is such as triggered by the digital signal provided at output 210.In some implementations, letter is waken up Number may include single pulse or composite pulse (for example, the pulse with multiple level, has a system of one or more level Row single pulse etc.).Here, if microcontroller 234 has to description wake-up signal format (for example, the pulse of single pulse Length, the format etc. of composite pulse) information access right, then microcontroller 234 received signal can be identified as and be called out It wakes up signal (for example, when the format of received signal and wake-up signal format match), and/or by wake-up signal from following It is distinguished in signal, which is originated from for example so that Electro Magnetic Compatibility (EMC) event that signal is provided at output 210.
In some implementations, such as when wake-up signal is single pulse, wake-up signal can be so-called " interrupts Signal " makes microcontroller 234 poll (poll) digital sensor system (for example, wake-up circuit 212), so as to determine with The associated information of wake events (for example, information of the threshold value of mark triggering wake events).
In some implementations, such as when wake-up signal is composite pulse, composite pulse can be used for microcontroller Device 234 sends information, this can eliminate the needs of 234 poll digital sensor system of microcontroller after waking up.This In the case of, load and/or delay (for example, time quantum for making a response to event) in bus can be reduced.One In a little realization methods, it may include such as code identifier to be included in the information in wake-up signal, and code identifier includes and thing It is the associated information of part (for example, identifying the information which threshold level is spanned in which direction), related to sensor values The information etc. of connection.
Compared with sensor-slave interface (for example, Serial Peripheral Interface (SPI) (SPI)), some sensor interfaces can allow Sensor chip 218 is used as main equipment in bus associated with sensor chip 218 and microcontroller 234.Such association The example of view includes short pulse duration modulating-coding (SPC), peripheral sensors interface 5 (PSI5), UART Universal Asynchronous Receiver Transmitter (UART) etc.. In some implementations, allow in a bi-directional way use same communication line (such as so that the component of sensor chip 218 can To take over the communication with microcontroller 234) any interface and agreement can be used for one in implementations described herein Or it is multiple.
In some implementations, microcontroller 234 may be coupled to multiple digital sensor systems (for example, respectively packet Include multiple sensor chips 218 of sensor 200 including the single sensor chip 218 of multiple sensors 200 etc.), multiple numbers Each in word sensing system can provide information individually to microcontroller 234.In some implementations, microcontroller Device 234 can be provided to distinguish by each digital sensor based on the identification code being for example included in the transmission of sensing data Information.In some implementations, microcontroller 234 can individually trigger digital sensor system execute sensor operation (that is, Microcontroller 234 may be used as main equipment).
In the case where microcontroller 234 is in suspend mode, microcontroller 234 can not individually trigger multiple numbers and pass Sensor system, but the wake-up of respective sensor 200 can be individually arranged so that sensor operation is performed.Such In the case of, microcontroller 234 is used as the slave equipment in bus, and the digital sensor for detecting wake events is set as master automatically Standby take over bus.In this scene, when digital sensor system can be for example, by be supplied to the pulse of microcontroller 234 Coding information form provides the information of reference numbers sensing system come when identifying its own, the load in bus and/or delay It can be reduced.
In some implementations, this pulse code can be similar to the agreement used in bus.In some realization sides In formula, digital sensor system can provide the triggering wake-up association that microcontroller 234 wakes up using its interface 208.
Other than allowing information associated with the event waken up is caused to be transferred to microcontroller 234, this is also eliminated Additional wake-up signal (for example, "/INT " signal) is sent to the needs of microcontroller 234.
Therefore, the letter in addition to being described above with respect to individual digit sensing system (e.g., including single sensor 200) Except breath, other information can be provided, and the information of the digital sensor system of such as label detection to wake events is similar to Coding wake-up signal of conventional sensors agreement etc..
Although microcontroller 234 and third oscillator 236 are shown as outer member by Fig. 3, according to embodiment, microcontroller Device 234 is also used as sensor chip or the other integrated component of sensor die 218 is implemented in sensor chip 218 On, for providing " on piece " data processing to the digital representation of the measured value provided by adc circuit 204.
Fig. 4 is shown similar to the additional embodiment of the digital sensor system of the present invention of the embodiment of Fig. 3.Structure is slightly Difference is that wake-up circuit 212 includes the first oscillator 220 and counter 224, and exports triggering via interface 208 or swash Signal living.From it is different in figure 3, trigger signal is output to external treatment via the pads/pins 244 of bare die 218 from chip 218 Unit 246, external processing unit 246 include the second oscillator 232 and microcontroller 234.Outer treatment circuit 246 is coupled to naked Clock pad/pin 247 of piece 218, to provide activation signal to ADC 204 via digital interface 208 on online 216.Fig. 4's Sensing system place substantially the same with the function of the sensing system of Fig. 3 is that the first oscillator 220 and counter 224 carry For arousal function, unlike Fig. 3, arousal function wakes up/activates external microcontroller 234.Outer treatment circuit 246 wraps Include the external clock for executing sensor operation mentioned above.Outer treatment circuit 246 can be by drawing via outside control Foot 248, control line 248a and digital interface 208 provide control signal to control sensor die 218.According to embodiment, control Can be two-way so that signal can also be exported from sensor die 218 to outer treatment circuit 246.According to embodiment, call out Awake signal and/or digital measured value can be exported via such bidirectional interface, without being to provide 210 He of dedicated pin 244 and exported.Control can cause to convert one or more measured values from sensor and/or as described above to measuring The additional treatments of value.
During sensor operation or after completing sensor operation, such as meets one or more in measurement result and predefine In the case of standard, the numerical data obtained can be transferred to microcontroller 234.The data are received in microcontroller 234 Afterwards, it can be operated independently of the operation of chip 218, chip 218 can be deactivated, and work as signal processing When being completed, microcontroller 234 can also be deactivated/turn off again, such as by making microcontroller 234 or external circuit 246 enter suspend mode.As in the embodiment of Fig. 3, in the fig. 4 embodiment, external processing unit 246 is according to embodiment It can also be implemented as the integration section of sensor chip 218.
The embodiment of Fig. 4 is advantageous, and is that it requires less hardware compared to the embodiment of Fig. 3, however, it may Little more electric current is consumed, and also requires additional pads/pins (external contacts), such as 244 He of activation signal pin Clock pins 247.
Fig. 5 show the present invention digital sensor system another embodiment, wherein microcontroller 234 do not have and its Associated oscillator.Microcontroller 234 in response to by the second oscillator 232 via line 249 and via the weldering of bare die 218 Disk/pin 250 is waken up/activates to the clock signal that microcontroller 234 provides.Wake-up circuit 212 has and counter 224 The first oscillator 220 of arousal function is provided together, and counter 224 starts the second oscillator 232.Second oscillator 232 can be with For executing sensor operation mentioned above, and at the same time it can be used for waking up microcontroller 234.According to embodiment, second Oscillator 232 can be turned off after the processing that microcontroller 234 completes data, and it can be logical with signal via line 249 Know the second oscillator 232：Oscillator can be turned off again to return to suspend mode.
Fig. 5 shows that microcontroller 234 relative to sensor die 218 is outer member, however in some other implementations In example, microcontroller 234 can be integrated into bare die identical with the other elements of sensing system shown in Fig. 5.Fig. 5 Embodiment require nothing more than two oscillators, and to consume few electric current same as electric current in the system as shown in fig. 3, together Additional output contact or pin needed for communication between Shi Yaoqiu microcontrollers 234 and the second oscillator 232 (are also claimed For " additional clock pins " 250).
Fig. 3 and 5 shows the embodiment of the digital sensor system including the first oscillator 220 and the second oscillator 232. According to some other embodiments, substitutes using separated oscillator 220 and 223 (one of them is that slow (low clock frequency) is low Power oscillator and the other is the fast oscillator with high current consumption), some other embodiments can use can With the oscillator operated in different mode.In the first mode, output low frequency rate clock signal, and for example by means of counting Device is after the predetermined period has passed, then oscillator is switched in second mode, and second mode, which provides, to be had than first The clock signal of the high frequency of clock signal, for operating the ADC for executing sensor operation.
About above-described oscillator, it is noted that the clock signal provided by pierce circuit can be directly from oscillation Device obtain clock signal or its can be by being multiplied by or divided by come the output of self-oscillator according to predefined multiple or divisor Signal and the clock signal obtained.
In the embodiment described above with respect to Fig. 3, Fig. 4 and Fig. 5, already here it should be pointed out that, microcontroller 234 is activated, with For executing data processing to the digital data signal provided by sensor chip 218.In the embodiment of Fig. 4 and Fig. 5, calling out Trigger signal (see Fig. 4) is provided on awake circuit 212 online 226 afterwards or after the second oscillator 232 has been activated (see Fig. 5), Then microcontroller 234 is automatically activated.In the sensing system of Fig. 3, microcontroller 234 have it is associated there its own Oscillator 236, this allows operation independently of sensor chip 218 to operate microcontroller 234.According to embodiment, in order to Reduce the power consumption of overall system, once the signal that microcontroller 234 can have been handled only via sensor die 218 is predefined It is then switched on or activates in range, such as if signal is more than threshold value or falls into below threshold value or in the predefined window of value It is switched on or activates.Otherwise, microcontroller 234 can keep being deactivated, such as it is maintained in suspend mode.
In the above description to the embodiment of digital sensing system, already here it should be pointed out that, by providing internal oscillator 220 To execute arousal function (see Fig. 3 to Fig. 5).However, the other embodiment of the present invention can alternatively or additionally use other (such as external) trigger signal causes the wake-up of the sensor and ADC of chip 218.For example, sensor can be in response to coming from Another inside (inside bare die 218) or external sensor are (for example, survey sensor chip 218 is disposed in environment therein Temperature sensor or other sensors) signal and be activated.For example, be only satisfied in the predefined conditions about environment In the case of (this is determined require using digital sensor system measurement), system will be activated.Alternately or in addition Outer triggering signal, can to circuit die 218 provide the activation/deactivation signal from overall controller.For example, when making When circuit die 218 in automotive environment, the activation/deactivation of sensing system can be by the central control unit of vehicle (such as ECU) is managed.The another possibility of external wake or trigger signal can be carried to wake-up signal by microcontroller 234 For.According to some other embodiments, when it is expected the diagnosis to sensing system, overall controller or microcontroller 234 can With the wake-up of trigger sensor bare die 218, to check whether it reacts, i.e., whether work, and/or predefined to execute some Function is measured, is based on this, the function of sensor die 218 can be evaluated.
The other embodiment of digital sensor system according to the present invention will be described about Fig. 6 now.The implementation of Fig. 6 Example allows to operate digital sensing system in digital data format and switching mode simultaneously, and switching mode can be used for calling out Awake external microcontroller (microcontroller or alternatively, integrated with other sensors element), then by sensor It is arranged in numeral output pattern or is arranged to PWM mode (PWM=pulsewidth modulations), to execute more detailed measure.It is detailed Measure the fine tuning of the average value or sensor output signal that can include determining that sensor signal.The digital sensing then described Device system is advantageous, because it provides three outputs, i.e. switch, PWM and digital value.Integrated solution have with it is pure The about the same size of switch solution based on simulation and similar performance, however, the switch for being based purely on simulation solves Scheme only provides individual feature, i.e. switching function.Therefore, the digitized inventive concept of sensing system is solved when with pure simulation Allow when certainly scheme is compared using advanced technology and allows to keep design more efficiently and general.As the embodiment of the present invention Basis inventive concept therefore will be counted as the chip size with Hall switch it is single design in formed tool There are low-power oscillator, counter, low-power ADC, the number of the general Hall sensor of switch, PWM and digital value output function The combination of word comparator and low-complexity digital interface.
It further includes being coupled to ADC 204 and via the number of 206 receiving sensor signal of line that the implementation of Fig. 6, which is illustrated, The digital sensor system of the digital comparator 252 of version (that is, digital representation).The interface described in embodiment can be with above It is implemented as the part of digital comparator 252.Wake-up circuit 212 is similar to the wake-up circuit in Fig. 3, however, 232 quilt of oscillator It is shown as optional element.In the case where being provided, wake-up circuit 212 has with Fig. 3 identical structure, however, as carried above It arrives, the function of the first oscillator 220 and the second oscillator 232 can be by can soon run in the first slow operational mode with second The single oscillator that switches between pattern provides.In this case, the second oscillator 232 will be not present, and circuit block 228 are directly connected to ADC 204.In such scene, the clock signal for operating ADC 204 will be directly from oscillator 220 are provided via line 254.Oscillator 220 will be set to for providing the second of upper frequency clock signal to ADC 204 In pattern.According to some other embodiments, the single of the low-power oscillator signal with low clock frequency is provided when using When oscillator, such as " relatively slow " when only providing oscillator 220 or via the correspondence external timing signal of clock pins, will be used Clock signal controls ADC, this will reduce current drain using slightly higher processing time as cost.
Digital sensor system can also include the sluggishness for the output for being coupled to digital comparator 252 via line 262 (hysteresis) circuit 260 is arranged in threshold value.Additionally, it is provided switch 264, for selectively by the output of counter 224 It is coupled to the other input of digital comparator 252 via line 266, or the output of circuit 260 is arranged via line 266 in hysteresis threshold It is coupled to the second input of digital comparator 252.Switch 264 can be controlled by external selection signal, to allow in PWM mode It is selected between switching mode, which is received via the other controlling switch of bare die 218, and control in addition is drawn Foot is exemplarily shown at reference marker 268.
Low-power oscillator 220 and low power counter 224 are used according to the digital sensor system of the embodiment of Fig. 6, Note, however, according to some other embodiments, oscillator can be omitted, and clock signal can be via by chip 218 Additional clock pins formed digital interface provided by external source.According to embodiment, sensor 200 can be hall sensing Device, and ADC 204 can be SAT (Approach by inchmeal tracker) ADC operated by faster second oscillator 232.According to reality Example is applied, others ADC concepts can also be applied.
Digital comparator 252 is provided, by ADC results and constant or with the LP counters that are exported by counter 224 Value is compared.When ADC results to be compared with constant, sensing system is switched to switching mode (" ON/OFF Output ") in, and constant value can be stored in memory 270.Memory can be circuit 260 as shown in fig. 6 Part.Alternatively, additional sensor element can be formed in sensor die 218/on.In this mode, it switchs 264 are activated in response to the switching signal at external contacts 268, to allow the output of circuit 260 to be connected to number Second input of comparator 252, to provide the constant value being compared for the output with ADC 204.When will be on line 206 When ADC results are compared with LP Counter Values, PWM functions " linear convergent rate " are provided, and in this mode, 264 quilt of switch Switching so that the output of counter is connected to the second input of digital comparator 252.
It is parallel as the alternative of digital comparator 252 or with digital comparator 252, can also provide low-power, it is low at Originally, the digital interface of low pin count, such as i2c, SICI, for adc data is transmitted directly to external microcontroller.In number In the case that word sensing system includes DfT blocks, such interface can be typically already existing and can be easily reused, It is also used for passing data to the external microcontroller for realizing digital comparator function.In other words, in the embodiment in fig 6, quilt Be shown as the integration section of sensing system digital comparator can also with the microcontroller that is described about Fig. 3, Fig. 4 and Fig. 5 Device similar mode is implemented as outer member.
During operation, ADC 204 is triggered by second clock signal, compared with the clock signal for arousal function, the Two clock signals have higher frequency.The clock signal of second higher frequency can by the second oscillator 232 provide or by It is provided in the first oscillator 220 of second mode.Alternatively, as previously described, which can also be by external source (referring to figure 4) it provides.ADC 204 is triggered using the given duty ratio provided by low power counter 224, mentioned above to provide Switching function.In order to execute PWM functions, ADC is usually triggered using the slope provided by low-power oscillator 220.Alternatively, As described with respect to FIG 4, ADC can also be triggered by the external signal received from external microcontroller.
Although the embodiment being described above uses single sensor, however, it is noted that more than one sensor can also be by It provides on IC chip 218.Multiple sensors can be re-used in ADC inputs, and digitized signal can be with It is sequentially exported via digital interface.Digitized signal can share digital comparator and on separated output pin It provides as a result, for example a pin is used to switch for PWM and pin.Alternatively, signal can be provided as comparing Compared with the logical combination of device result.
Fig. 7 show using multiple sensors and provided via single output multidimensional switch (logical combination of judgement) with And the embodiment of the digital sensor system of the present invention of one-dimensional PWM outputs and one-dimensional linear output.It is compared when with Fig. 6 When, the embodiment of Fig. 7 include be coupling between digital comparator 252 and the output 210 of digital sensor system demultiplexing/it is defeated Go out latch cicuit 272.Further it is provided that multiple sensors 2001To 200N, export and selectively coupled to by means of switch 274 The input of ADC 204.Demultiplexing/output latch circuit 272 controls both switch 274 and circuit 228 via line 276.Solution is provided Multiplexing/output latch circuit 272 permission sequence executes the measurement from multiple sensors.A bulk measurement from respective sensor It is identical as what is be described above.In the figure 7, further it is shown that external microcontroller 234 and external third oscillator 236, basis Some other embodiments can also be integrated as the part of sensor chip 216.Although being described about figure about Fig. 7 6 and describe digital sensor concept can be extended to multiple sensors in order to provide multidimensional sensor system, however, it is noted that The other embodiment being described above can be used for realizing multidimensional linear transducer, such as the digital sensor about Fig. 3 descriptions System.
Another embodiment can use multiple sensors, with physical property (such as temperature, voltage in sensor based system Or electric current) obtain additional diagnostic message.This tittle can reflect state/ADC signal biasing of sensor, internal supply item Part, on piece stress effect or other distortions that faulty sensors system may be caused.
Fig. 8 shows the multidimensional digital sensor system of the sensing system based on Fig. 3.When being compared with Fig. 3, figure 8 include multiple sensors 2001To 200NAnd demultiplexing/output latch circuit of control switch 274 and ADC control circuit 238 272.Switch 274 allows the input that the output selectivity of respective sensor is connected to ADC 204.Demultiplexing/output is latched Circuit 272 is connected between the output of ADC and the input of interface 208, and provides the multiple outputs for the input for being connected to interface Line.Circuit 238 also exports the end of conversion signal via line 278 to interface, just interface to be made to deactivate after converting Or enter suspend mode, to reduce power consumption.
Fig. 9 shows another embodiment, and according to this embodiment, digital sensor system of the invention includes being connected to demultiplex With/on piece digital signal processor 280 between output latch circuit 272 and interface 208.When the embodiment with Fig. 8 is compared Compared with when, additionally provide firmware memory 282, be operably coupled to DSP 280, must for operate DSP to provide Want firmware information.Moreover, when being compared with Fig. 8, the end 278 of conversion signal is applied to DSP rather than interface, with to The end and it can return to the time in deactivation status/suspend mode thereafter that DSP instructions are converted.Additional digital signal The offer of processing circuit 280 allows to be further processed them before exporting the signal generated by ADC to microcontroller 234, example As measurement result can be trimmed off or can apply the data processing of some type.Further, it is also possible to execute using processing.Although Fig. 9 shows the embodiment that DSP is used in multidimensional sensor system, however, it is noted that according to other embodiment, DSP also may be used To be used in one-dimensional sensor arrangement, for example, by the embodiments of figure 3 by DSP provide ADC output and interface it is defeated Between entering.
Figure 10 shows that the low-power for switching and PWM is operated without inessential hardware spending controls and digital ratio Compared with the embodiment of device concept, because it can be used in digital comparator in the above-cited embodiment being wherein implemented In any embodiment.Low power counter 224 is via line 224 from low-power oscillator 220 (being not shown in Figure 10) or from integrated The external clock pin of circuit receives clock signal.On output line 216, counter 224 compares via selector 264 to number The input and output corresponding counter value of device 252.Selector 264 is controlled by the mode signal applied via pin 268, and online There is provided Counter Value to the input of digital comparator to realize PWM functions on 216, or when being placed in switching mode, to than Input compared with device 252 provides the switch level input signal of the digital comparator output signal 210 depending on timing to form tool There is the switching function of lag function.
In the illustrated embodiment, it can provide and be opened for four of two positive ADC input values and two negative ADC input values It is powered-down flat, additionally selected by the MSB (i.e. ADC (8)) for serving as the ADC results 206 of the sign bit for the value.Without In another embodiment of lag function, it may not be necessary to these multiple level and comparator output signal, and can only provide Fixed switch level, one is used for positive ADC values, and a negative ADC value 206 for being determined by the MSB for serving as sign bit. In additional embodiment, single level can be only detected, and therefore only one level can be passed to digital comparator, and And ADC (8) inputs can not be needed yet.In this embodiment, digital comparator 252 is formed by adder 284, adder 284 The ADC results on line 206 are received in the first input and receive signal via selector 264 in its second input.Later It is described compared with the intensive comparator function of small area with reference to figure 20, however other digital comparator structures can also be used.Adder 284 Output be connected to flip-flop (flip-flop) 286, using can be the low-power oscillator clock provided on online 254 The clock signal of signal carrys out timing.Alternatively, when providing the second oscillator or when external oscillator signal, can use second, Upper frequency clock signal is come to flip-flop timing.The output of flip-flop 286 is output to output or the pin of sensor die 210.It should be mentioned that above-mentioned principle may be also used in the embodiment with more than one ADC signal, according to the implementation Example, can in parallel or sequentially provide ADC signal.In such embodiments, ADC input signals, switch level and output letter Number (such as when using for 3D sensors three channels when) can be re-used.In addition, other other embodiment can make With fewer or more positions for ADC results and switch level.
In the above-described embodiments, ADC 204 is generally described.According to embodiment, using low-power SAT (Approach by inchmeal with Track device) ADC realizes ADC 204.However, it is also possible to other concepts of application for analog/digital conversion.Figure 11 shows mould The example implementations of quasi-/digital quantizer, because it can be used according to an embodiment of the invention.More specifically, figure 11 show low-power SAT (Approach by inchmeal tracker) ADC as the analog/digital in the digital sensor system for invention The possibility realization method of converter.ADC shown in Figure 11 is for example described in detail in U. S. application 14/319,177, the Shen Content please is incorporated herein by reference.The ADC of Figure 11 (can initially be forced using smaller big binary system ladder is become to operate Plesiotype).Finally, ADC can enter tracing mode, and wherein ladder is limited to 1.In addition to the realization method described in Figure 11 Except, other known realization methods of analog/digital converter can also be applied in combination with concept of the invention described in this application.
Figure 12 shows for realizing according to the letter of the integrated circuit die 218 of the digital sensor system of one embodiment Change block diagram.Digital sensor system includes Hall sensor 200, and it is arranged to sense perpendicular to being assumed to be arranged in x/ The magnetic field on the surface of the chip in y plane so that in the embodiments described, can be sensed in a z-direction by sensor 200 Magnetic field detection.Sensor signal is exported to multiplexer 203 via line 202, is connected to analog/digital converter 204. Analog/digital converter 204 is connected to digital comparator 252 via average circuit 290.The output of digital comparator 252 via Realize that the interface 208 of output driver is supplied to the output pin 210 of chip 218.Wake-up circuit 212 is by low-power oscillator 220 and cycle counter 224 formation.The output of cycle counter 224 is coupled to finite state machine (FSM) 292 via line 216. FSM 292 is coupled to analog/digital converter 204 and average circuit 290, and can provide the control to these circuits.It passes Sensor chip 218 further includes the second oscillator 232, will be believed with the clock of the high frequency of the clock signal than oscillator 220 It number is supplied to ADC 204, average circuit 290 and is also provided to digital comparator 252 and FSM 292.Based on clock signal, just The digital circuit just mentioned is operated.
Sensing system chip 218 further includes that the zero current indicated such as at reference marker 294 powers on function of reset and mould Formula selection function 296.Model selection block 296 refers to via 300 reception pattern selection signal of interface 298 and line, mode select signal Show that chip 218 is operated using switch output, numerical data output or PWM outputs.Interface can be SICI interfaces (referring to Such as US2013/0094373A1, content are incorporated herein by reference).According to some other embodiments, root can be used According to another interface of digital protocol, such as LIN, SPC, PSI5, I2C.Interface 298 is coupled to output driver, and such as by defeated Go out the double-headed arrow instruction between driver and pin 210, provides I/O contacts so that be used for the selection signal of interface 298 It can also be provided via the pin.Level definition block 302 is connected to digital comparator 252, in switchgear distribution It provides for the reference value with ADC results contrasts.According to embodiment, circuit block 302 may include depositing for reference value stored Storage unit.Reference value can additionally depend on last comparator and export to form lag function so that be supplied to and compare The level of device 252 changes the conducting state and the off-state that are exported based on comparator between two predefined level, with It is allowed for the window for avoiding switching caused by noise signal, as explained for Figure 10.Be not shown in Figure 12 from Comparator 252 defines the 302 required signal wire for lag function to level.Counter 224 for PWM configurations is defeated Go out and be connected to digital comparator, and depend on selected operation mode, Counter Value or steady state value are applied to digital ratio Compared with the numeral input of device.In addition, in some other embodiments, comparator 252 may be implemented as given switching electricity Flat more complicated event detector, as will be explained later with reference to figure 19 to Figure 21.
Circuit chip 218 further includes biasing circuit 304, reference circuit 306 and reset circuit 308.Biasing circuit and reference Circuit is coupled to ADC 204, and reset circuit 308 is coupled to FSM 292.Biasing circuit 304 is via 310 coupling of temperature sensor Close sensor element 200.Circuit includes the Hall biasing circuit 312 for Hall sensor element 200.For realizing spin The FSM 292 of operation is also coupled to Hall biasing circuit 312.The output coupling of cycle counter 224 biases 312 Hes to sensor Biasing 304, to cause startup/power down of system.
Additionally, the diagnostic system for being incorporated to diagnosis unit 360 can be provided, control multiplexer 203 is with by alternative amount It is directed to ADC 204.This can be the measurement of on piece temperature, voltage measurement or any other amount that will be examined during operation. In this case, for the fine tune temperature of hall probe 200 additionally convey PTAT voltage (PTAT=and absolute temperature at than Example), to ensure that sensor operates in its operational temperature conditions, and resitstance voltage divider 362 checks sensor in its operation electricity Operation in the voltage conditions of source.
As about the IC chip including digital sensor system described in Figure 12 by digital comparator 252 Suitable control allows sensor to be operated in three different modes.In PWM mode, comparator is by practical ADC values and counter Value is compared, to form PWM outputs.In switching mode, comparator 252 by practical ADC values with can be set via interface 298 The threshold value set is compared.Threshold value can be fixed value or can be based on the last judgement from comparator, to realize sluggishness Function.In order to allow based on the setting to threshold value finally judged, the output of comparator 252 is also connected to interface 208, such as Figure 12 It is shown.Interface 298 can be also used for providing the external wake signal for activating sensor and ADC and other processing circuits, Emergent wake-up such as in the case of the failure diagnosed by unit 260.In interface modes, comparator 252 may be used as waking up, And ADC 204 can directly be read via interface.
Function of the circuit of Figure 12 in PWM mode and switching mode will be described in more detail now.In PWM mode, follow The output of inner loop counter 224 is connected to the input of digital comparator, and in the configuration, and there are three main for the tool of integrated circuit 218 Functional unit is wanted, with following structure block：
Power management section, including the resetting of PWM finite state machines 292, low-power oscillator 220, zero current (powering on) 294,304, bandgap reference 306, accurate resetting 308 and fast oscillator 232 are biased substantially.
Sensing part, including Hall biasing 312, hall probe 200 and with the average summation for Hall spinning cycle The gradually tracking ADC 204 of register 290 (it is optionally controlled by FSM 292) together.
Interface section, including digital comparator 252, open-drain interface 208 and pin 210.
Power distribution in integrated circuit shown in power management system control figure 12, and zero current is provided and powers on weight Set function and the low-power oscillator 220 as clock source.Power management measures cycle based on processing and starts the cycle of behavior Counter 224 is run.At startup (being reset via zero current), power management section activation biasing 304 and 306, accurate weight Detector 308 and fast oscillator 232 are set, and initializes and is measured for the first of the first PWM cycle.During operation, low 220 control loop counter 224 of power oscillator causes the activation of biasing 304,306, Hall to bias 312 activation, accurately Reset the activation of detector 308 and fast oscillator 232.It also controls the beginning of the conversion of hall probe voltage, if it is high In accurate replacement level, and after ADC measurements, it causes to store the value by for next PWM cycle, and then it into Enter power-down mode, only low-power oscillator 220 is being run in power-down mode.
Sensing part executes the measurement in magnetic field.According to embodiment, hall probe 200 is connected to 9 ADC, and using special It is measured using spin and copped wave to be sequentially performed with finite state machine 292.ADC 204 using include DAC and comparator by It is secondary to approach tracker mechanism (SAT converters).Each cycle includes the following steps：
It starts the hall probe output on line 202 being compared with centre DAC settings (MSB settings),
Comparator 252 judges that hall probe value is less than and is also above DAC value, this makes next bit (MSB-1) be added It value or is subtracted to the end from last value, compares and add/subtract and be directed to until all positions of LSB continue.
Hereafter, SAT converters 204 to LSB continuing with the comparison of another eight dock cycles, with average hall probe 200 noise,
Four cycles are executed, while switching in electric current of all four directions by hall probe, to average out Hall spy First 200 offset.Optionally, double spinning techniques can also be enabled, reduce power consumption with the purpose for offset accuracy.
Temperature-compensating can execute in analog domain.Alternatively, the temperatures of the sensitivity of sensor can also be changed, To deal with certain magnet types, such as pass through " metal-programming " with derivative design.
Interface section includes PWM comparators 252 and interface 208, and fast oscillator 232 is not needed according to embodiment, this Make its function very power-efficient, simultaneously because the use of low-power oscillator 220 and limit speed on a small quantity.Comparator 252 will ADC results are compared with the cycle counter 224 driven by low-power oscillator 220, this leads to 6 PWM outputs.PWM packets Clamp is included so that PWM ratios are restricted to 1/64 and 63/64 respectively.PWM ratios without magnetic field are about 32/64, and should Ratio linearly changes towards the clamp limit just mentioned with the magnetic field applied.About resetting, it is noted that in the ADC transition periods Between the resetting event of accurate reset cell that operates will not reset ADC values, also do not reset cycle counter and comparator results, and It is only to inhibit ADC conversions.The complete supply fault only detected by zero current resetting block 294 will reset cycle counter.
When the IC chip of operation diagram 12 in switching mode, to digital comparator input by being stored in block Value in 302 limits, and does not use the output signal from counter 224.The Main functional units of integrated circuit in this mode It is as follows：
Power management system, including the resetting of PMU finite state machines 292, low-power oscillator 220, zero current (powering on) 294, biasing and bandgap reference 304,306, accurate resetting 308 and fast oscillator 232 substantially.
Sensing part, including Hall bias 312, hall probe 200 and are posted with the summation for average Hall spinning cycle The gradually tracking ADC 204 of storage 290 together, it is all to be controlled by FSM 292.
Interface section, including digital comparator, comparative level selection, open-drain interface 208 and pad 210 with sluggishness.
Power management system controls the power distribution in IC 218, and provides zero current and power on function of reset and conduct The low-power oscillator 220 of clock source.Power management system is on the cycle counter 224 that processing measures cycle and startup behavior Operation.On startup, it is reset via zero current, power management unit activation biasing 304,306, accurate resetting detector and quickly Oscillator 232.First measurement and first comparator judgement are also initialised.During operation, low-power oscillator control loop Counter 224, activation biasing 304,306, Hall biasing 312, accurate resetting detector 308 and fast oscillator 232.Separately Outside, hall probe voltage is converted, if it is higher than accurate replacement level, and after ADC measurements, it causes cutting for output It changes.After this, power-down mode is reentered so that only low-power oscillator 220 is being run.
Sensing part executes the measurement in magnetic field.Hall probe is connected to ADC 204, and uses special finite state machine FSM executes measurement.In the case of multiple sensors, sequence executes measurement, and in single sensor and multiple sensors Two kinds in the case of, execute measurement using spin and copped wave using FSM 292.According to embodiment, ADC can use include The Approach by inchmeal tracker mechanism above for Figure 12 descriptions of DAC and comparator, and during cycle, following steps can be with It is performed：
Compare the comparison of hall probe output and centre DAC settings,
Comparator 252 judges that hall probe value is less than and is also above DAC value, this makes next bit (MSB-1) be added It value or is subtracted to the end from last value,
Compare and adds/subtract for until all positions of LSB continue.
- SAT converters to LSB continuing with the comparison of another eight dock cycles, with making an uproar for average hall probe 200 Sound, and
Four cycles are executed, while switching the electric current by hall probe and all four directions, to average out Hall spy First 200 offset.It is alternatively possible to enable double spinning techniques, reduce power consumption with the purpose for offset accuracy.
Based on the output from temperature sensor 310, temperature-compensating can execute in analog domain.It alternatively, can be with The temperatures of the sensitivity of sensor are changed to deal with certain magnet types, such as pass through the " metal _ volume with derivative design Journey ".
Interface section is provided with comparator 252 and interface 208, can not need fast oscillator 232, this keeps it non- Normal power-efficient, simultaneously because low-power oscillator 220 provide clock cycle limitation and slightly reduce speed.Depending on working as The output state of digital comparator when realization lag function, comparator carry out ADC results and the fixed level for switch Compare.In fig. 12, the output of comparator is fed back to block 302 via interface 298.
To not reset ADC values in the resetting event for the accurate reset cell that the ADC transition periods operate, also do not reset cycle and Comparator results, but only inhibit ADC conversions.The complete supply fault only detected by zero current resetting block 294 recycles resetting Counter.
Figure 13 shows the embodiment of the digital sensor systematic difference circuit for invention.In fig. 13 it is shown that Application circuit for the sensor IC as described in about Figure 12.In Figure 13 (a), there is sensor element 200 and retouch above The sensor chip 218 for the add ons (being not shown in Figure 13) stated is attached to corresponding contact 316a, 316b, 316c Circuit board or lead frame 314.Other than the contact 210 for providing input and/or output, integrated circuit sensor Chip further includes contact 211a and 211b, and contact 211a therein is for receiving the corresponding active member in sensor chip The supply voltage VDD supplied in part (in order to maintain the clear of attached drawing, corresponding wiring line is not shown in FIG. 12).Contact 211b For the internal circuit of IC sensor chips 218 to be connected to ground or is connected to reference potential (again, in order to maintain the clear of attached drawing The corresponding wiring line for ground terminal 211b to be connected to the respective element inside IC is not shown in Chu).It such as can from Figure 13 (a) Go out, corresponding external contacts 210 and 211a and 211b connect 318a to 318c by engagement and be connected to corresponding contact 316a to 316c.In some other embodiments, IC chip 218 can be connected to corresponding terminal 316a extremely in different ways 316c, such as pass through flip-chip bond or other known methods.Application circuit shown in Figure 13 (a) further includes power supply 320 And microcontroller 234.Power supply provides the electricity that sensor chip 218 is applied to via contact 316a and contact pad 211a Source voltage VDD.Power supply 320 also provides supply voltage to microcontroller 234.The i/o pads 210 of IC chip are via engagement Connection 718a and external contacts 316b and be connected to the input/output of microcontroller 234, and contact 316c is coupled to ginseng Current potential is examined, as.In the embodiment of Figure 13 (a), application circuit is provided for total interface option, and sensor is supplied It is supplied equal to interface.
Figure 13 (b) shows that additional embodiment, wherein sensor chip 218 and the reception of microcontroller 234 are provided by power supply Different electrical power voltage VDD_1 and VDD_2, this confession of microcontroller 234 in requisition for be cut off to save power in the case of It is useful.In the case that the power as expectation is saved, external pull-up resistor device R or internal microcontroller pullup resistor It needs to be omitted, is less than sensor for passing through the electric current of pullup resistor at once to avoid when the second supply.In fig. 13, it integrates Circuit 218 is provided with internal, active pull up open-drain output, this is eliminated to the external resistor as shown in Figure 13 (a) Needs.Inside pull-up also allows on the output pin using more higher than using the sensor of external pull-up resistor device to supply Voltage, as shown in Figure 13 (b), wherein electric current flowing in this case, which can pass through, provides internal Schottky diode To prevent.
As the signal shown in Figure 13 (a) and Figure 13 (b) between sensor 218 and microcontroller 234 can take It certainly is connected to input pin, input/output pin or special interrupt pin in the ability of microcontroller, and special Wake up configuration in the case of, in the market multiple existing microcontroller implementation modes (signal for including them) or microcontroller Poll or interrupt function are required for device, and other peripheral hardware is required for the application.Output intent option can be required, To control the parameter of sensor, the switch level such as arousal function or transmission diagnostic command.Alternatively, in some other implementations The configuration in example, shown in Figure 13 (a) and Figure 13 (b) including sensor 218, power supply 320 and microcontroller 234 can be to appoint What combination is completely or partially integrated on single silicon bare die.
About Figure 14, the additional embodiment of the digital sensor system for the invention for realizing 3D sensor chips is shown.It passes Sensor chip is provided there are one lateral and two vertical Hall sensors, and three hall probes and three are come from for conversion The signal of axis.Additionally, it is provided temperature sensing, and the signal from respective sensor is provided to microcontroller.According to figure The sensor chip of 14 embodiment does not include digital comparator when the embodiment with Figure 12 is compared, and opposite provide is posted Storage/fuse block 322, and other than supplying with ground pad 211a and 211b, provide multiple I/O pads 210a and 210d. Integrated circuit 218 includes three Main functional units, i.e.,：
Power management section, including PMU finite state machines 224, low-power oscillator 220, zero current (powering on) reset block 294, biasing and bandgap reference 304,306, accurate resetting 308 and quick or the second oscillator 232 substantially.
Sensing part, including Hall biasing 312, the hall probe together with the multiplexer indicated by " switch " 274 200x, 200y and 200z and with the summation register 290 for average Hall spinning cycle together and both by limited shape The gradually tracking ADC 204 that state machine 292 controls.
Interface section, including IIC interfaces 208, register file/fuse block 322 and I/O pads 210a to 210d.
Power management system controls the power distribution in integrated circuit 218, provides zero current and powers on function of reset and conduct The low-power oscillator 220 of clock source.Power management section is in processing power pattern as follows and starts the special limited of behavior It is run on state machine 224.When starting or resetting soft via IIC, power management unit activation biasing 304,306, accurate resetting Detector 308 and oscillator 232 read fuse and are arranged and latch ADDR pin 210b, into the power mould being arranged by fuse Formula.Default setting can be that all biasings 304,306,312 and oscillator 332 are turned off.Depending on selected power mould Formula regularly executes power management.It will be performed when activating, biasing 304,306, accurate resetting detector 308 and oscillation Device 322 and Hall biasing 312 are activated.Then, optional turn of PTAT voltage (temperature from sensor 310 measures) is utilized It brings and sequentially converts three hall probe channel outputs.After a measurement, power management section makes system be again introduced into low work( Rate pattern, such as by returning to default setting.According to embodiment, if supply voltage is sufficiently high, power mentioned above The function of administrative section is performed, and otherwise accurate reset circuit is by hold mode machine, until the level of required supply voltage It is continued their operations with until reaching and later.If resetting event occurs therebetween, function if, is also restarted.
Sensing part executes the measurement to magnetic field.Hall probe 200x、200yWith 200zIt is connected to multiplexer 274, multiplexer 274 are also connected to ADC 204.The measurement in three channels is sequentially performed using special finite state machine (FSM) 292.According to figure 14 embodiment, ADC can use Approach by inchmeal tracker mechanism (the SAT conversions for including DAC and comparator (referring to Figure 11) Device).Each cycle may comprise steps of：
Hall probe output and centre DAC settings (MSB settings) are compared,
It is less than by comparator judgement hall probe value and is also above DAC value, this so that next bit (MSB-1) is added It is added to last value or is subtracted from last value,
For until all positions of LSB continue to compare and add/subtract,
Using ASD converters to LSB continuing with the comparison of another eight dock cycles, with making an uproar for average hall probe Sound,
It executes the cycle four times, while switching in electric current of all four sides upwardly through hall probe, to average out suddenly The offset of your probe.It executes temperature in the same manner to measure, however, instead of hall probe, the input of the first multiplexer is connected to Carry out PTAT (with absolute temperature proportional) voltage of auto bias circuit.
Two pins of IIC interface requirements, i.e. SCL input pin 210c and DSA the input/output pins in open-drain configuration 210a.In addition, according to discribed embodiment, two pins that can be shared with the IIC pins in specific encapsulation are provided, i.e., Interrupt output pin/INT 210d in the open-drain configuration that can be shared with SCL pins, and can also be shared with SDA pins Address choice input pin ADDR 210b.
It is movable that interface section, which does not require internal oscillator, so that it can be in any power mould of sensor IC 218 It is operated in formula.IIC interfaces can execute the chip resetting initialized by main equipment independently of the used addresses IIC.It comes from The measured value of all three axis is stored in separated register, and after powering on reset or in use IIC interfaces After soft resetting, these registers will be read to be zero.There may be additional temperature value registers, are also powering on or soft resetting It reads to be zero afterwards.Stored value will not be reset in the resetting event for the accurate reset cell that the ADC transition periods operate, and only inhibited ADC is converted.Only it will be reset the register by the complete supply fault of zero current resetting block detection and initialized and will be performed New power-up cycle.
Figure 15 shows can be used for the embodiment of the application circuit of the IC sensor chips as described in Figure 14.Depending on envelope Dress, iic bus are shared with additional address choice and interruption pad or are not shared.It is described now for possible Encapsulation Change Concrete application circuit, and in the case of described below two, the use of interrupt line is optional, however, providing in this way Interrupt line with ensure sensing data it is appropriate and efficient reading be preferred.
In fig.15, with similar mode in Figure 13, sensor IC 218 is mounted to circuit board or lead frame 314, circuit board or lead frame 314 have that there are six pins (pin 1 to 6) in the embodiment of Figure 15 (a), or such as in Figure 15 (b) there are eight pins (pin 1 to 8) like that shown in embodiment.The corresponding contact pad of IC circuits 218 passes through engagement It connects or other suitably connects and are connected to respective pins, as described in fig.15.In Figure 15 (a), ADDR pads It is connected to pin number 1 with SDA pads (pad 210a and 210b), for being connected to microcontroller 234.Interrupt pad and SCL Pad (pad 210c and 210d) is connected to pin number 6 and is also connected to the other input of external microcontroller 234.In Figure 15 (b) in, SDA pads and ADDR pads may be coupled to different pins (pin number 7 and number 8), and SCL pads and interrupt pad Different pins (pin number 6 and 5) can also be connected to.About Figure 15, it is noted that ADDR may be coupled to SDA, VDD or GND.Separately Outside ,/INT line can be shared with open-drain/INT outputs of other sensors.
Figure 16 shows the conversion plan in " low-power mode " of the sensor IC described about Figure 14.In low-power In pattern, interrupt signal/INT is generated by low-power oscillator and low power counter, and is triggered ADC and measured and wake up outside Microcontroller.
Figure 17 shows the conversion plans when IC sensors shown in Figure 14 operate in quick mode.Signal/INT It is generated at the end of continuous ADC samplings, and wakes up external microcontroller.If main equipment/microcontroller wakes up at it It is expected to measure some signal using higher bandwidth later, then the pattern can be enabled.
Figure 18 shows and is touched after the transmission that the permission main equipment for carrying out autonomous device controller controls sampling time point The conversion plan of hair.
The above description of the embodiment of the present invention is made about Hall sensor, however, the present invention is not limited to this The sensor of sample type.Other magnetic field sensors can also be used, such as xMR sensors or shunting Hall sensor.In others In some embodiments, the sensor for measuring other properties can be used, such as measure such as other physics of voltage, temperature, electric current The sensor of amount.The combination of such sensor can also be integrated in the sensor die of invention.In some other implementations In example, additional sensor can be used for diagnosis or the fine tuning purpose of Magnetic Sensor.Moreover, up to the present described embodiment Using only single ADC, however instead of using the analog-digital converter of the multiplexing for multiple sensors, can also use for separating Measurement channel or Measurement channel for different groups separated analog-digital converter.The method of invention, which can be applied to use, to be had Any kind of sensing system of source sensor, such as need the sensor being activated to allow them to make measurement.
As described above, integrated circuit sensor chip may include memory component (such as volatile memory), with In reception by ADC converters or by digital comparator or by another digital processing dress for handling the measuring signal from probe Set the value used.For example, threshold value can by microcontroller provide and can by IC sensor chips volatile memory (such as Register or RAM) storage.Alternatively, IC sensor chips may include the nonvolatile memory for keeping threshold value, such as EEPROM or flash memory.Preferably, nonvolatile memory can be repeatedly written so that for example can be changed or be corrected later just Beginning threshold value, such as by overriding them by the new value from microcontroller.
According to the embodiment for using the Hall sensor using two or four phase spinning current systems, by threshold value and two or four It is relatively preferred that a summation or average digital ADC results, which carry out number,.In the reality using xMR sensors or other sensors It applies in example, additional digital/analog converter can be used for digital measuring signal being converted to analog domain again, and use mould Quasi- comparator executes the threshold value comparison in analog domain.This allows using DAC and comparator unit twice, because they are additionally operable to ADC functions, such as form SAR-ADC by being followed by the DAC of comparator and SAR registers (referring to Figure 11).
Threshold value can be superimposed by hysteresis or by covering the +/- signal added, to meet desired function, such as threshold value 1= Threshold value-sluggishness/2 and threshold value 2=threshold values+sluggishness/2.It is alternatively possible to which two threshold values are used for each channel to be measured (such as each axis to be measured for magnetic field), i.e., lower and upper threshold value can be stored directly.Furthermore, it is possible to using asymmetric The sluggish or window comparator with additional sluggishness.
In order to save the space for the register in the IC chip for keeping sensing system, it may be preferred that deposit Threshold value of the storage for each channel, but only single hysteresis or single window comparator value, and final effective threshold value can Then to calculate from original threshold and the absolute or relative superposition of sluggishness or window value.Window value can also be applied to sensing Device sense, such as positive flux field signal, or alternatively it is applied to positive and negative sensor signal.Fixed or relatively sluggish or window Mouth comparator threshold can be fixed storage in the sensor so that for 3 channel sensors, it is only necessary to three threshold values deposits Device.
According to embodiment, when using high voltage applications (such as using 18V or 24V VDD application) when, can provide attached The high voltage depleted transistor added operates voltage for limitation, is vibrated especially for digital register and for low-power For device.This allows few power control of high voltage protection.
Other embodiment can also realize the function of house dog (watch dog) in systems.
According to embodiment, wake-up circuit output can be the wake-up signal of certain pulses or certain pulses coding.In this way Embodiment in, in the case of not operation sensing system, wake-up signal will be not only continuous low or high level signal, on the contrary There are wake-up signal certain pulses or certain pulses to encode so that for example peripheral control unit can by wake-up signal from for example due to The failure of clock generator and export only low or high level signal complete not operation sensing system and distinguish.
Hereinafter, it will be described in the embodiment for realizing event detector.Event detector may be implemented as The part (referring to Fig. 3 to Fig. 9) of ADC triggers/configuration circuit 228, and can be based on the Counter Value from counter 224 To operate.In the case of other events of such as external event, indicate that the digital signal of event can be provided by event detector And processing.In such scene, wake-up circuit 212 shown in Figure 2 may include event detector, without oscillator And counter.
Figure 19 shows one embodiment of event detector circuit 400, can be based on fixed or variable 401 quilt of limit It realizes in wake-up circuit 212 (referring to Fig. 2).The ADC values 404 of expression event can by two digital comparators 406 with give Fixed limit degree 402 is compared.Obtained comparison can be with masked 408, this will disable it in further detection process.Thing Part storage 410 can include Previous results 412 (for example, last event l or last event 2), can be by using storage member Part postpones practical comparison result 414 (new events l and new events 2 are designated as in figure) to complete, and memory element is such as by enabled letter The flip-flops of numbers 416 controls, enable signal have given ADC renewal rates or any other speed suitable for some application Rate.It then can be by decomposer 418 older event and new events, to generate new wake events 420.For thing will be used as Each ADC channel in part source can provide such circuit 400.
Figure 20 illustrates the embodiment of the area-optimized comparator circuit for fixing limit value, can be used in Figure 19 Circuit 400 in.Its detection based on level, level are under the positive full scale range 422 of complement of two's two's complement binary system ADC values Two n times power (two-power-N) or negative full scale range 424 on two n times power.Practical embodiments are existed using offer 4LSB and 5 ADC values M of the threshold value of 4LSB and 3 on lower full scale range (- 16) under upper full scale range (+15) Compare N, in some other embodiments, number can change, as long as ADC bit widths are more than and compare bit width and (otherwise compare Reality is always matched, this is no longer useful).Obtained logic 426 only includes logic gate, does not require adder or subtraction circuit To determine the difference between ADC values and given limit.
Figure 21 illustrates the behavior of the circuit 400 of Figure 19 of the circuit 426 using Figure 20.Figure 21 illustrates wherein ADC values Times of 404 (referring to the Figure 21 (a) and Figure 21 (b)) across the limit 428 for generating 1 signal 414 (referring to Figure 21 (c)) of new events Point.Because 1 signal 412 of last event is still different from 1 signal 414 (referring to Figure 21 (c) and Figure 21 (d)) of new events, therefore raw At wake events signal 420 (referring to Figure 21 (e)).Follow renewal rate 235 (referring to Figure 21 (f)), 1 signal 412 of last event It will become new events signal at next event 430, and cause the two signals identical, therefore wake events will be disabled again. Certainly, if desired, the wake events signal can using can use clock source another embodiment in by further pulse at Shape.
10056 although the present invention and its advantages have been described in detail, but it is to be understood that various changes, replacement and replacement can be with It makes herein, without departing from the spirit and scope of the present invention as defined by the appended claims.
In addition, scope of the present application is not limited to the process described in the description, machine, producer, material composition, dress It sets, the particular embodiment of method and steps.As those of ordinary skill in the art will be easy to recognize from present disclosure , using substantially the same function is executed with corresponding embodiment described herein or it can realize substantially phase according to the present invention With result presently, there are or later by the process developed, machine, manufacture, material composition, device, method or step.Phase Ying Di, appended claims are intended to include such process, machine, manufacture, material composition, device and step within its scope Method.

Claims (20)

1. a kind of system, including：
Digital sensor system, including：
Sensor element；And
Digital interface is used for：
Based in predefined event, by the digital sensor system detectio, the sensor operation after is held by the sensor element Row, provides wake-up signal；And
Microcontroller is used for：
The wake-up signal provided by the digital interface is provided, and
Based on the wake-up signal that reception is provided by the digital interface, wake up from suspend mode.
2. system according to claim 1, wherein the microcontroller is additionally operable to：
Determine the information of description wake-up signal format；
The format and the wake-up signal format for determining the wake-up signal match；And
Wherein, when waking up from the suspend mode, the microcontroller is additionally operable to：
Matched with the wake-up signal format based on the format of the determination wake-up signal, is waken up from the suspend mode.
3. system according to claim 1, wherein the wake-up signal includes letter associated with the predefined event Breath or information associated with sensor values.
4. system according to claim 1, wherein the digital sensor system is as associated with the system total Main equipment on line.
5. system according to claim 1, wherein the microcontroller is used as in bus associated with the system From equipment.
6. system according to claim 1, wherein the digital sensor system and the microcontroller use short pulse duration Modulating-coding (SPC) agreement, (PSI5) agreement of peripheral sensors interface 5 or UART Universal Asynchronous Receiver Transmitter (UART) agreement are led to Letter.
7. system according to claim 1, wherein the microcontroller is additionally operable to：
The suspend mode is returned to after handling signal associated with the sensor operation.
8. system according to claim 7, wherein the sensor element is first sensor element, and the number Interface is the first digital interface, and
The wherein described digital sensor system further includes：
Second sensor element；And
Second digital interface, is used for：
Based on another predefined event by the digital sensor system detectio to after another sensor operation by described second Sensor element executes, and provides another wake-up signal；And the wherein described microcontroller is additionally operable to：
Other wake-up signals provided by second digital interface are provided, and
Based on other wake-up signals described in second digital interface offer are received, wake up from the suspend mode.
9. system according to claim 1, wherein the wake-up signal includes the letter for identifying the digital sensor system Breath.
10. system according to claim 1, wherein the wake-up signal includes composite pulse.
11. a kind of system, including：
Sensor element, for executing sensor operation based on predefined event is detected；And
Digital interface provides wake-up signal for being executed by the sensor element based on the sensor operation；And
Microcontroller is used for：
The wake-up signal provided by the digital interface is provided, and
Based on the wake-up signal that reception is provided by the digital interface, wake up from suspend mode.
12. system according to claim 11, wherein the microcontroller is additionally operable to：
Determine information associated with wake-up signal format；
The format and the wake-up signal format for determining the wake-up signal match；And
Wherein, when waking up from the suspend mode, the microcontroller is additionally operable to：
Matched with the wake-up signal format based on the format of the determination wake-up signal, is waken up from the suspend mode.
13. system according to claim 11, wherein the wake-up signal includes associated with the predefined event Information or information associated with sensor values.
14. system according to claim 11 is passed including the number of the sensor element and the digital interface Sensor is used as the main equipment in bus associated with the system, and the wherein described microcontroller is used as and the system phase Slave equipment in the associated bus.
15. system according to claim 11, wherein the digital interface and the microcontroller are modulated according to short pulse duration Coding (SPC) agreement, (PSI5) agreement of peripheral sensors interface 5 or UART Universal Asynchronous Receiver Transmitter (UART) agreement are communicated.
16. system according to claim 11, wherein the microcontroller is additionally operable to：
The suspend mode is returned to after handling signal associated with the sensor operation.
17. system according to claim 16, wherein the sensor element is first sensor element, and the number Word interface is the first digital interface, and
Wherein the system also includes：
Second sensor element, for executing another sensor operation based on another predefined event is detected；And
Second digital interface is believed for being executed by the second sensor element based on other sensor operations to provide another wake-up Number；And
The wherein described microcontroller is additionally operable to：
The wake-up signal provided by second digital interface is provided, and
Based on other wake-up signals that reception is provided by the digital interface, wake up from the suspend mode.
18. system according to claim 11, wherein the wake-up signal includes that mark is related to the sensor element The information of the digital sensor system of connection.
19. system according to claim 11, wherein the wake-up signal includes single pulse.
20. a kind of digital sensor system, including：
Sensor element is used for：
Sensor operation is executed based on predefined event is detected；And
Digital interface is used for：
It is executed by the sensor element to provide wake-up signal based on the sensor operation,
The wherein described wake-up signal makes microcontroller associated with the digital sensor system wake up from suspend mode, and And
The wherein described wake-up signal includes information associated with the predefined event.
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