CN108490333B - Nonlinear S parameter inspection device - Google Patents

Nonlinear S parameter inspection device Download PDF

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CN108490333B
CN108490333B CN201810148412.8A CN201810148412A CN108490333B CN 108490333 B CN108490333 B CN 108490333B CN 201810148412 A CN201810148412 A CN 201810148412A CN 108490333 B CN108490333 B CN 108490333B
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amplifier
variable attenuator
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陈婷
程春悦
李莹
邓姝沛
杨初
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Beijing Institute of Radio Metrology and Measurement
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    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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Abstract

The invention discloses a nonlinear S parameter inspection device, which solves the problem that the existing device cannot verify the S parameter measurement capability of a nonlinear network analyzer. The apparatus, comprising: the device comprises a directional coupler, a front stage variable attenuator, a driving amplifier, a front stage filter, a Schottky diode, a matching structure, a rear stage filter, a first buffer amplifier, an attenuator, a second buffer amplifier, a power amplifier, an isolator, a rear stage variable attenuator, an analog-to-digital converter and a power detector. The directional coupler receives an input signal, one path of the input signal passes through the power detector to the analog-to-digital converter, and the other path of the input signal passes through the front-stage variable attenuator; the output signal of the front stage variable attenuator passes through a driving amplifier, a front stage filter, a Schottky diode, a matching structure, a rear stage filter, a first buffer amplifier, an attenuator, a second buffer amplifier, a power amplifier, an isolator and reaches a rear stage variable attenuator. The invention realizes the verification of the amplitude phase of each subharmonic.

Description

Nonlinear S parameter inspection device
Technical Field
The invention relates to the field of microwave radio frequency, in particular to a nonlinear S parameter inspection device.
Background
The nonlinear network analyzer is a measuring device for measuring nonlinear characteristic parameters of devices such as a power amplifier and the like, and can completely represent the nonlinear parameters of the amplifier, so that rapid modeling and simulation are performed, the design flow of the amplifier is thoroughly improved, and the power amplifier is simulated and designed more efficiently and accurately. The most important metrological characteristic of the nonlinear network analyzer is its nonlinear measurement capability, and in order to ensure this measurement capability, it is necessary to calibrate it with a higher-order metrological standard, so as to perform calibration verification of the nonlinear network analyzer. The prior art can only realize verification of S parameter indexes of a linear network analyzer, and usually adopts a reflection amplitude standard, a transmission amplitude standard and a transmission phase standard to realize calibration verification of the S parameters of the reflection amplitude, the transmission amplitude and the transmission phase of the S parameters. The linear network analyzer can only measure linear S parameters, and the existing S parameter inspection device is used on the nonlinear network analyzer, which can only verify the S parameters of the fundamental frequency signals of the nonlinear network analyzer and can not verify harmonic measurement capability, namely nonlinear S parameter measurement capability.
Disclosure of Invention
The invention provides a nonlinear S parameter inspection device, which solves the problem that the existing device can not be used for verifying the S parameter measurement capability of a nonlinear network analyzer.
A nonlinear S-parameter verification apparatus, comprising: the device comprises a directional coupler, a front-stage variable attenuator, a driving amplifier, a front-stage filter, a Schottky diode, a matching structure, a rear-stage filter, a first buffer amplifier, an attenuator, a second buffer amplifier, a power amplifier, an isolator, a rear-stage variable attenuator, an analog-to-digital converter and a power detector; the directional coupler is used for receiving an input signal, one path of the input signal passes through the power detector to the analog-to-digital converter, and the other path of the input signal is transmitted to the preceding-stage variable attenuator; one end of the power detector, which is connected with the analog-to-digital converter, is grounded; the analog-to-digital converter is used for receiving the signals transmitted by the power detector and transmitting a front-stage attenuation control signal and a rear-stage attenuation control signal to the front-stage variable attenuator and the rear-stage variable attenuator respectively; the signal output by the preceding stage variable attenuator is transmitted to the Schottky diode through the driving amplifier and the preceding stage filter; the Schottky diode is used for receiving the signal output by the pre-filter and generating a harmonic signal; the matching structure is used for receiving the harmonic signal and generating a matching signal; and the matching signal is transmitted to the rear-stage variable attenuator through the rear-stage filter, the first buffer amplifier, the attenuator, the second buffer amplifier, the power amplifier and the isolator.
Further, the apparatus further comprises: a voltage control circuit; the voltage control circuit is used for providing bias voltage for the preceding stage variable attenuator, the driving amplifier, the Schottky diode, the first buffer amplifier, the second buffer amplifier and the power amplifier.
Preferably, the sensitivity of the harmonics of the device to the terminal load is:
Figure BDA0001579347480000021
Figure BDA0001579347480000022
Figure BDA0001579347480000023
wherein FOM is the sensitivity of the harmonic to a terminal load, N is the total number of the harmonic, M is the matching number of the terminal load, N is the number of the harmonic, M is the matching serial number of the terminal load, Γ M is a reflection coefficient, B is the total number of the harmonic2For 2-port output signal voltage, A1The signal voltage is input to the 1 port.
Preferably, the schottky diode is HSMS8101 of Avago, and the matching structure is a short pin matching structure.
Furthermore, the front-stage variable attenuator and the rear-stage variable attenuator are HMC939LP4E of Hittite, the driving amplifier adopts a two-stage low-noise amplifier cascade mode, and the two-stage low-noise amplifiers are VMMK-3803 of Avago.
Further, the front-stage filter is a 2.5GHz ceramic low-pass filter, and the rear-stage filter is a 10GHz microstrip open-circuit short-pin low-pass filter.
Preferably, the first buffer amplifier and the second buffer amplifier are respectively selected from HMC462LP5E and HMC606LC5 of Hittite corporation.
Preferably, the power amplifier is HMC998LP5E from Hittite.
Further, the analog-to-digital converter adopts a two-channel 12-bit AD9238, and the power detector is TILMV221 SD.
Preferably, the device is provided with a copper shielding layer outside the circuit board.
The beneficial effects of the invention include: the nonlinear S parameter inspection device designed by the invention is composed of a Schottky diode and a peripheral circuit, and the nonlinear characteristic is kept constant when the device is changed within a certain range of input power through the feedback control of the variable attenuator at the input end and the output end; through the action of buffer amplifiers and isolators at all stages on a link, signals are insensitive to impedance change of an output end, and therefore stable harmonic signals are generated. The rich and stable harmonic signals can be accurately measured by a nonlinear network analyzer and used as a measurement standard to carry out the detection of nonlinear S parameters of the nonlinear network analyzer. The nonlinear S parameter standard device designed by the invention solves the problems that the existing linear S parameter standard device does not generate new frequency components, can only verify the amplitude phase of a fundamental wave signal and cannot verify the amplitude phase of each subharmonic except the fundamental wave.
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The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is an embodiment of a nonlinear S-parameter inspection apparatus;
FIG. 2 is an embodiment of a non-linear S-parameter verification device including a voltage control circuit.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the specific embodiments of the present invention and the accompanying drawings. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Radio frequency microwave systems are generally composed of active devices and passive devices, and the active devices often have nonlinear characteristics, i.e., new frequency components are generated. The study and design of such high performance rf active devices presents challenges to designers, where the key issue is how to characterize the non-linearity of the device, thereby reducing the adverse effects of the non-linearity of the device, or to make use of it, providing a linear, efficient high power solution. An amplifier is an indispensable element in the field of wireless communication, and frequency spectrum waste is often caused due to the nonlinear characteristic of the amplifier; if the power amplifier is designed to operate only in its linear region in order to take into account the efficiency of the spectrum utilization, this will result in a waste of available power. In practical engineering, the amplifier is often driven to a nonlinear region in which it operates, and then linearized near an operating point in the nonlinear region. Therefore, it becomes more important to know the nonlinear characteristics of rf active devices such as power amplifiers and frequency multipliers, and it becomes important to accurately measure the nonlinear characteristics of the devices. Since all active devices exhibit nonlinear characteristics to varying degrees, nonlinear measurements can more fully characterize the true characteristics of active and even some passive devices.
According to a nonlinear S parameter expression measured by a nonlinear network analyzer:
Figure BDA0001579347480000041
Figure BDA0001579347480000042
wherein, BefVoltage wave being f harmonic at port e, A11Voltage wave being fundamental signal at port 1, aghIs the incident small signal of the h harmonic at port g,
Figure BDA0001579347480000043
is the conjugate of the incident small signal of the h harmonic at port g,
Figure BDA0001579347480000044
is A11Signal to BefThe transfer function of (a) is selected,
Figure BDA0001579347480000045
respectively is composed of agh、
Figure BDA0001579347480000046
To BefThe transfer function of (2).
The nonlinear S parameter inspection piece designed by the invention should have rich harmonic components, when a large signal A11 is excited at an input port, each harmonic component is generated at each port, each harmonic component has stable signal amplitude and stable phase, and a standard value can be obtained by measuring with a nonlinear network analyzer. When the nonlinear device is excited, the nonlinear device generates harmonic waves, the input impedance and the output impedance of the nonlinear device influence the output harmonic wave signal components of the nonlinear device, and the change of the termination impedance causes the incident wave signals of the input port and the output port to change and causes the output signal to change nonlinearly. In order to obtain a stable nonlinear signal, the input and output impedance matching conditions of the nonlinear device are required to be reasonably designed, the device can still output a stable and unchangeable signal under the conditions that the amplitude of an input fundamental wave signal changes and the impedance of harmonic waves changes, and finally the sensitivity of nonlinear harmonic waves to the impedance change of a terminal is reasonably evaluated for the designed device.
The technical solutions provided by the embodiments of the present invention are described in detail below with reference to the accompanying drawings.
Fig. 1 is a schematic diagram of an embodiment of a nonlinear S-parameter testing apparatus, according to the present invention, the nonlinear S-parameter testing apparatus includes: the directional coupler 1, the front stage variable attenuator 2, the driver amplifier 3, the front stage filter 4, the schottky diode 5, the matching structure 6, the rear stage filter 7, the first buffer amplifier 8, the attenuator 9, the second buffer amplifier 10, the power amplifier 11, the isolator 12, the rear stage variable attenuator 13, the analog-to-digital converter 14, and the power detector 15.
The directional coupler is used for receiving an input signal, one path of the input signal passes through the power detector to the analog-to-digital converter, and the other path of the input signal is transmitted to the preceding-stage variable attenuator; one end of the power detector, which is connected with the analog-to-digital converter, is grounded; the analog-to-digital converter is used for receiving the signals transmitted by the power detector and transmitting a front-stage attenuation control signal and a rear-stage attenuation control signal to the front-stage variable attenuator and the rear-stage variable attenuator respectively; the signal output by the preceding stage variable attenuator is transmitted to the Schottky diode through the driving amplifier and the preceding stage filter; the Schottky diode is used for receiving the signal output by the pre-filter and generating a harmonic signal; the matching structure is used for receiving the harmonic signal and generating a matching signal; and the matching signal is transmitted to the rear-stage variable attenuator through the rear-stage filter, the first buffer amplifier, the attenuator, the second buffer amplifier, the power amplifier and the isolator.
Preferably, the sensitivity of the harmonics of the device to the terminal load is:
Figure BDA0001579347480000061
Figure BDA0001579347480000062
Figure BDA0001579347480000063
wherein FOM is the sensitivity of the harmonic to a terminal load, N is the total number of the harmonic, M is the matching number of the terminal load, N is the number of the harmonic, M is the matching serial number of the terminal load, Γ M is a reflection coefficient, B is the total number of the harmonic2For 2-port output signal voltage, A1The signal voltage is input to the 1 port.
Preferably, the schottky diode is HSMS8101 of Avago, the output end of the schottky diode is connected with a short pin matching structure, the SPICE model of the schottky diode is used for establishing a simulation model, in order to realize the matching of the back-end circuit, the matching structure is the short pin matching structure, and the length and the position of the short pin matching structure can be obtained through simulation software.
Furthermore, the front-stage variable attenuator and the rear-stage variable attenuator are HMC939LP4E of Hittite company, and have 5-bit stepping broadband of 1dB, the attenuation of the front-stage variable attenuator is controlled by the analog-to-digital converter, so that when the input signal power is between-20 dBm and 10dBm, the output signal power is always about-25 dBm; since the signal strength of-25 dBm is much less than the signal power capable of driving a nonlinear device, i.e., 10dBm, two Avago VMMK-3803 low noise amplifiers are cascaded at the back end of the attenuator to serve as the driving amplifier. One VMMK-3803 has 17.5dB of small signal gain at a frequency point of 2GHz, and the 1dB compression output power under the drive of 5V is 11 dBm.
Further, the front-stage filter is a 2.5GHz ceramic low-pass filter, and the rear-stage filter is a 10GHz microstrip open-circuit short-pin low-pass filter. It should be noted that the ceramic low-pass filter of 2.5GHz behind the driver amplifier serves two purposes, first, preventing harmonic signals generated by the driver circuit from entering the nonlinear device; second, harmonic signals generated by the nonlinear device are prevented from changing the characteristics of the driver amplifier. A10 GHz microstrip open stub (stub) low pass filter, i.e. a post-stage filter, is arranged after the nonlinear amplifier to reduce harmonic signal levels above 10GHz and prevent the post-amplifier from entering a compression region.
Preferably, the first buffer amplifier and the second buffer amplifier are respectively selected from HMC462LP5E and HMC606LC5 of Hittite corporation. Their 1dB compression points have an output power of 15dBm with a gain of 13dB in the operating band. Between these two buffer amplifiers there is a fixed attenuator of the pi type, which can be used to adjust the power level.
Preferably, the power amplifier is HMC998LP5E from Hittite. It has an output power of 31dBm and a linear gain of 11 dB. This amplifier is used to guarantee the required level of output power.
Furthermore, the analog-to-digital converter adopts a dual-channel 12-bit AD9238, the clock of the analog-to-digital converter is 10MHz, and the power detector is TILMV221 SD.
In the embodiment of the invention, the frequency of an input fundamental wave signal is 2GHz, an output port can generate fundamental waves and 1-4 harmonic components, the output port fundamental waves and harmonic vector signals are insensitive to load mismatch, and the reflection coefficient gamma isL(nω0)|<N is more than or equal to 0.5 and less than or equal to 1 and less than or equal to 5, the power of an input signal is between-20 dBm and 10dBm, and the amplitude difference between an output fundamental wave and a harmonic wave is not more than 15dB at most.
To achieve a flatter spectrum, i.e. not exceeding 15dB at maximum, a suitable input-output filter and termination is required. Since the non-linear characteristics of the device are strongly dependent on the input power, a suitable power control module is used to keep the input power of the non-linear device within a certain range. The nonlinear device and the input-output filter and the terminal circuit thereof are the core of the whole circuit. The actual transmission power is much less than the input power due to losses on the link, etc., and the flat spectrum of the output is likely to be very sensitive to the terminal load. In order to prevent the above problems, a multi-stage buffer amplifier and a power amplifier are used in the circuit. To achieve isolation, these amplifiers must operate under strict linearity conditions, otherwise the harmonics they generate disturb the flat spectrum and increase the sensitivity of the output signal to the load.
It should be noted that, in the embodiments of the present invention, the power of the input signal varies from-20 dBm to 10dBm, the attenuation value ranges of the front stage variable attenuator and the rear stage variable attenuator are 5dB to 35dB and 35dB to 5dB, respectively, and the attenuator has a nominal insertion loss of 5 dB. One path of the input signal is coupled to the power detector through the directional coupler, and the attenuation amount of the two variable attenuators is controlled through the analog-to-digital converter, so that the power input to the nonlinear part and the final output port power are kept in a constant range.
It should be noted that the selection of the model of each component in the device may be the model in the embodiment of the present invention, or may be other models, and the model of each component needs to be selected according to the index of the device, which is not particularly limited herein.
The embodiment of the invention provides a design of a nonlinear S parameter checking device, which can generate a standard nonlinear S parameter signal which has rich harmonic components and stable harmonic amplitude and phase. The nonlinear S parameter standard can be used as a quantity transmission standard to carry out the detection of the nonlinear S parameters of the nonlinear network analyzer. In addition, a schottky diode is used as a core nonlinear device, the schottky diode is excited to generate a harmonic signal, and in order to obtain a stable nonlinear signal with a flat power spectrum, a variable attenuator control circuit, a buffer amplifier circuit and the like are respectively designed in front of and behind the schottky diode, so that the device can output a stable output signal with a flat power spectrum under the conditions of the amplitude change of an input fundamental wave signal and the harmonic impedance change.
FIG. 2 is a schematic diagram of an embodiment of a non-linear S-parameter verification apparatus including a voltage control circuit, the apparatus including: the device comprises a directional coupler 1, a front stage variable attenuator 2, a driving amplifier 3, a front stage filter 4, a Schottky diode 5, a matching structure 6, a rear stage filter 7, a first buffer amplifier 8, an attenuator 9, a second buffer amplifier 10, a power amplifier 11, an isolator 12, a rear stage variable attenuator 13, an analog-to-digital converter 14, a power detector 15 and a voltage control circuit 16.
The directional coupler is used for receiving an input signal, one path of the input signal passes through the power detector to the analog-to-digital converter, and the other path of the input signal is transmitted to the preceding-stage variable attenuator; one end of the power detector, which is connected with the analog-to-digital converter, is grounded; the analog-to-digital converter is used for receiving the signals transmitted by the power detector and transmitting a front-stage attenuation control signal and a rear-stage attenuation control signal to the front-stage variable attenuator and the rear-stage variable attenuator respectively; the signal output by the preceding stage variable attenuator is transmitted to the Schottky diode through the driving amplifier and the preceding stage filter; the Schottky diode is used for receiving the signal output by the pre-filter and generating a harmonic signal; the matching structure is used for receiving the harmonic signal and generating a matching signal; the matching signal is transmitted to the rear-stage variable attenuator through the rear-stage filter, the first buffer amplifier, the attenuator, the second buffer amplifier, the power amplifier and the isolator; a voltage control circuit; the voltage control circuit is used for providing bias voltage for the preceding stage variable attenuator, the driving amplifier, the Schottky diode, the first buffer amplifier, the second buffer amplifier and the power amplifier.
It should be noted that, in order to increase stability and reduce noise, the voltage control circuit selects the HMC860LP3E chip as the voltage regulation circuit, selects the HMC980LP4E as the active bias chip, and selects the TPS63700 chip of TI corporation to provide the-5V reverse voltage
Preferably, the device is provided with a copper shielding layer outside the circuit board. In order to shield external interference and internal mutual interference, a copper shielding layer is additionally arranged outside the circuit board. In order to reduce thermal drift, the floor of the shielding box is a thick copper plate to improve the heat dissipation efficiency.
The nonlinear S parameter inspection device provided by the embodiment of the invention can evaluate the sensitivity of harmonic waves to terminal loads, can better guide design according to the evaluation value, and reduces the sensitivity of the harmonic waves to the terminal loads by improving the matching on a link.
It is to be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above description is only an example of the present invention, and is not intended to limit the present invention. Various modifications and alterations to this invention will become apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the scope of the claims of the present invention.

Claims (9)

1. A nonlinear S-parameter verification apparatus, comprising: the device comprises a directional coupler, a front-stage variable attenuator, a driving amplifier, a front-stage filter, a Schottky diode, a matching structure, a rear-stage filter, a first buffer amplifier, an attenuator, a second buffer amplifier, a power amplifier, an isolator, a rear-stage variable attenuator, an analog-to-digital converter and a power detector;
the directional coupler is used for receiving an input signal, one path of the input signal passes through the power detector to the analog-to-digital converter, and the other path of the input signal is transmitted to the preceding-stage variable attenuator;
one end of the power detector, which is connected with the analog-to-digital converter, is grounded;
the analog-to-digital converter is used for receiving the signals transmitted by the power detector and transmitting a front-stage attenuation control signal and a rear-stage attenuation control signal to the front-stage variable attenuator and the rear-stage variable attenuator respectively;
the signal output by the preceding stage variable attenuator is transmitted to the Schottky diode through the driving amplifier and the preceding stage filter;
the Schottky diode is used for receiving the signal output by the pre-filter and generating a harmonic signal;
the matching structure is used for receiving the harmonic signal and generating a matching signal;
and the matching signal is transmitted to the rear-stage variable attenuator through the rear-stage filter, the first buffer amplifier, the attenuator, the second buffer amplifier, the power amplifier and the isolator.
2. The nonlinear S-parameter verification apparatus of claim 1, wherein the apparatus further comprises: a voltage control circuit;
the voltage control circuit is used for providing bias voltage for the preceding stage variable attenuator, the driving amplifier, the Schottky diode, the first buffer amplifier, the second buffer amplifier and the power amplifier.
3. The nonlinear S-parameter testing device according to any one of claims 1-2, wherein the Schottky diode is HSMS8101 of Avago, and the matching structure is a short pin matching structure.
4. The nonlinear S-parameter inspection device according to any one of claims 1-2, characterized in that the former stage variable attenuator and the latter stage variable attenuator are HMC939LP4E from Hittite, the driving amplifier adopts a two-stage low-noise amplifier cascade mode, and the two-stage low-noise amplifiers are VMMK-3803 from Avago.
5. The nonlinear S-parameter inspection apparatus of any one of claims 1-2, wherein the former stage filter is a 2.5GHz ceramic low-pass filter, and the latter stage filter is a 10GHz microstrip open-circuited stub low-pass filter.
6. The nonlinear S-parameter verification device according to any one of claims 1-2, wherein the first buffer amplifier and the second buffer amplifier are respectively HMC462LP5E and HMC606LC5 of Hittite.
7. The nonlinear S-parameter verification device according to any one of claims 1-2, wherein the power amplifier is HMC998LP5E from Hittite.
8. The nonlinear S-parameter verification apparatus of claim 1, wherein the analog-to-digital converter employs a two-channel 12-bit AD9238, and the power detector is TILMV221 SD.
9. The nonlinear S-parameter verification apparatus of claim 1, wherein a copper shield is applied to an exterior of a circuit board of the apparatus.
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