CN104515907A - Scattering parameter testing system and implementation method thereof - Google Patents
Scattering parameter testing system and implementation method thereof Download PDFInfo
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- CN104515907A CN104515907A CN201310461567.4A CN201310461567A CN104515907A CN 104515907 A CN104515907 A CN 104515907A CN 201310461567 A CN201310461567 A CN 201310461567A CN 104515907 A CN104515907 A CN 104515907A
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Abstract
The invention discloses a scattering parameter testing system. The scattering parameter testing system comprises a vector network analyzer, a waveguide switch and a device under test when used for measuring a reflection coefficient, wherein a first port of the vector network analyzer is connected with one end of the waveguide switch, the other end of the waveguide switch is connected with a port under test of the device under test, and the device under test has no other ports or has other ports in impedance matching. The scattering parameter testing system comprises the vector network analyzer, two waveguide switches and the device under test when used for measuring a transmission coefficient, wherein the first port of the vector network analyzer is connected with one end of the first waveguide switch, the other end of the first waveguide switch is connected with a first port of the device under test, a second port of the device under test is connected with one end of the second waveguide switch, and the device under test has no other ports or has other ports in impedance matching. A scattering parameter measurement method is implemented without system calibration and error correction. A testing process is performed in quasi real time, so that various system errors are eliminated, and quite high measurement precision is obtained.
Description
Technical field
The application relates to a kind of scattering parameter test macro of radio frequency microwave circuit.
Background technology
In radio frequency microwave circuit, traditional voltage, electric current concept are no longer applicable, and electromagnetic reflection and transmission mode must be adopted to analyze.Scattering parameter (scattering parameters, also claims S parameter) is based upon the parameter on incident wave, reflection wave relation basis, is particularly useful for the characteristic describing radio frequency microwave circuit.Reflection coefficient (reflection coefficient), transmission coefficient (transmission coefficient) are two kinds in scattering parameter, the former is used for each reflection of electromagnetic wave amount to external port of indication circuit and the ratio of amount of incident, the latter be used for indication circuit an electromagnetic wave exit dose to external port and another is to the ratio of the electromagnetic wave incident amount of external port.
Usual employing vector network analyzer (VNA, vector network analyzer) carrys out the scattering parameter of metering circuit.Vector network analyzer is a kind of testing tool of complexity, comprises multiple modules such as signal source, power divider, directional coupler, standing-wave ratio (SWR) bridge, width Phase Receiver machine, detecting device, processor, display.During use, part or all of module wherein can be selected as required.
Refer to Fig. 1, this is a kind of existing reflection coefficient test macro, is made up of a vector network analyzer and one to be measured (DUT, device under test).The modules such as the signal source in vector network analyzer, power divider, directional coupler, width Phase Receiver machine are wherein used.Directional coupler wherein as shown in Figure 2, has input end, output terminal, isolation end, coupled end four ports altogether.The output terminal of directional coupler connects the port to be measured of to be measured.Its measuring principle is: power divider is the output signal E of signal source
0be divided into two-way, the partition factor of power divider is respectively c
1and c
2.One road signal c
1e
0to width Phase Receiver machine as reference signal R, another road signal c
2e
0to the input end of directional coupler.The output terminal of directional coupler using the port to be measured of the signal transmission of input end to be measured as incident wave a
1.From the signal b that this port reflects to be measured is returned
1get back to the output terminal of directional coupler, b
1=S
11a
1, S
11for the reflection coefficient of the port to be measured of to be measured.This reflection wave b
1the isolation end inductive coupling being directed again coupling mechanism arrives, then by coupled end to width Phase Receiver machine as test signal T, T=c
3b
1, c
3it is the coupling coefficient of directional coupler.Due to
and coefficient c
1, c
2, c
3be constant, as long as thus measure the plural ratio (this can be obtained by the measurement of width Phase Receiver machine) of T/R, the reflection coefficient S of the port to be measured of to be measured can be obtained
11.
Refer to Fig. 3, this is a kind of existing transmission coefficient test macro, is made up of a vector network analyzer and one to be measured.Wherein used two ports of vector network analyzer, the port one of vector network analyzer connects the port one of to be measured, the port two of the port two connected vector network analyzer of to be measured.Its measuring principle is: power divider is the output signal E of signal source
0be divided into two-way, the partition factor of power divider is respectively c
1and c
2.One road signal c
1e
0to width Phase Receiver machine as reference signal R, another road signal c
2e
0to the port one of to be measured as incident wave a
1.From the signal b of port two outgoing of to be measured
2pass to width Phase Receiver machine as test signal T, T=b
2=S
21a
1, S
21for the port one of to be measured is to the transmission coefficient of port two.Due to
and coefficient c1, c2 are constant, as long as thus measure the plural ratio (this can be obtained by the measurement of width Phase Receiver machine) of T/R, the port one that can obtain to be measured is to the transmission coefficient S of port two
21.
When using the scattering parameter of vector network analyzer metering circuit, usually also need to get rid of the impact of every systematic error on measurement result.Therefore its concrete methods of realizing is: first calculate every system error, and this is called as system calibration (calibration).Then according to the measured value of vector network analyzer, calculate actual value with error model (error model) and every system error, this is called as error correction (error correction).Because scattering parameter is plural number, and be the function of frequency, therefore system calibration and error correction must be carried out on each Frequency point.Above content has detailed record in the 1st chapter of " modern network spectrum measurement technology " book (Lv Hongguo writes) of publishing house of Tsing-Hua University in June, 2000 publication.
Existing scattering parameter test macro, when carrying out the test of short period, can reach very high precision by system calibration.But some test process may reach a few hours.Time longer when tested, the shake, temperature variation etc. of test cable can make the test environment after calibration correction change, thus cause the phase place of vector network analyzer, amplitude drifts about, this drift can make test result inaccurate.The phenomenon that this stiffness of system declines increases along with the test duration and day by day obviously, does not have solution at present.
Existing vector network analyzer is when carrying out multiport circuit, and its phase test precision can only reach ± 2 °, if the test duration extends, it is poorer that measuring accuracy can become, as there is in Fig. 9 little triangle solid line shown in.How to meet high precision, for a long time testing requirement, just become a difficult problem in the application of current vector network analyzer.
Summary of the invention
Technical problems to be solved in this application are to provide a kind of scattering parameter test macro, the problem of measurement result precise decreasing that the degree of stability that can solve test macro in long-time test process is deteriorated and causes.
For solving the problems of the technologies described above, the application's scattering parameter test macro comprises vector network analyzer, a waveguide switch and to be measured when measuring reflection coefficient; Vector network analyzer only uses a port, and the port one of vector network analyzer connects one end of waveguide switch; The other end of waveguide switch connects the port to be measured of to be measured; To be measured or there is no other ports, or other ports are impedance matching;
Described scattering parameter test macro comprises vector network analyzer, two waveguide switches and to be measured when measuring transmission coefficient; Vector network analyzer only uses a port, and the port one of vector network analyzer connects one end of waveguide switch one; The other end of waveguide switch one connects the port one of to be measured; The port two of to be measured connects one end of waveguide switch two; To be measured or there is no other ports, or other ports are impedance matching.
Described waveguide switch has short circuit and conducting two states; Waveguide switch is equivalent to a short-circuiting device in short-circuit condition, and waveguide switch is equivalent to an open circuit device in conducting state.
The method that the application's scattering parameter test macro realizes measuring reflection coefficient is:
1st step, is placed in short-circuit condition by waveguide switch, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
41;
2nd step, is placed in conducting state by waveguide switch, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
42;
Or the order of the 1st step, the 2nd step is exchanged;
3rd step, vector network analyzer with
calculate the reflection coefficient of the port to be measured of to be measured;
The method that above-mentioned scattering parameter test macro realizes measuring transmission coefficient is:
1st ' step, is placed in short-circuit condition by waveguide switch one, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
41;
2nd ' step, is placed in conducting state by waveguide switch one, and waveguide switch two is placed in short-circuit condition, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
42;
Or the order of the 1st ' step, the 2nd ' step is exchanged;
3rd ' step, when being passive multi-port device for be measured, vector network analyzer with
calculate the transmission coefficient of port one to the port two of to be measured.
Traditional scattering parameter test macro is by selecting disparate modules in vector network analyzer, and carries out the actual measurement of scattering parameter with comparatively complicated system calibration, error correction scheme.The application does not do any change to vector network analyzer, has increased waveguide switch outside vector network analyzer newly, achieves a kind of multiport circuit method without the need to system calibration, error correction.Due to the ratio that test process is the measured value under the different conditions comparing waveguide switch, be quasi real time carry out, thus eliminate every systematic error, obtain high measuring accuracy.
Accompanying drawing explanation
Fig. 1 is the structural representation of existing reflection coefficient test macro;
Fig. 2 is the schematic diagram of four ports of directional coupler;
Fig. 3 is the structural representation of existing transmission coefficient test macro;
Fig. 4 a, Fig. 4 b are the structural representations of the first embodiment of the scattering parameter test macro of the application;
Fig. 5 a, Fig. 5 b are short circuit, the conducting schematic diagram of waveguide switch respectively;
Fig. 6 a, Fig. 6 b are the structural representations of the second embodiment of the scattering parameter test macro of the application;
Fig. 7 a, Fig. 7 b are the structural representations of the 3rd embodiment of the scattering parameter test macro of the application;
Fig. 8 a, Fig. 8 b are the structural representations of the 4th embodiment of the scattering parameter test macro of the application;
Fig. 9 is existing and the measuring accuracy schematic diagram of the scattering parameter test macro of the application.
Embodiment
Refer to Fig. 4 a and Fig. 4 b, this is the first embodiment of the application's scattering parameter test macro, for measuring reflection coefficient.It comprises vector network analyzer, a waveguide switch and to be measured.Described vector network analyzer only uses a port, shown in such as, vector network analyzer in Fig. 1.This port one of vector network analyzer connects one end of waveguide switch.The other end of waveguide switch connects the port to be measured of to be measured.Above annexation is all realized by the concentric cable being suitable for radio signal transmission.If to be measured also has other ports, then other ports are impedance matching (such as connecting 50 Ohmages).
Described waveguide switch has short circuit and conducting two states.Refer to Fig. 5 a, this is the short-circuit condition of waveguide switch, and waveguide switch is now equivalent to a short-circuiting device.Refer to Fig. 5 b, this is the conducting state of waveguide switch, and waveguide switch is now equivalent to an open circuit device.
First embodiment of above-mentioned scattering parameter test macro realizes measuring the method for reflection coefficient: set the port one of vector network analyzer to the electromagnetic wave power of waveguide switch as P
2.
1st step, refer to Fig. 4 a, waveguide switch is placed in short-circuit condition, the electromagnetic wave that a port enters all reflects back by waveguide switch now, do not export from another port completely, thus waveguide switch is also P to the reflected electromagnetic wave power of the port one of vector network analyzer
2.Vector network analyzer record is P from the electromagnetic wave power that port one receives
41, P
41=P
2.
2nd step, refers to Fig. 4 b, waveguide switch is placed in conducting state, and now waveguide switch allows electromagnetic wave enter from a port and all exported by another port, and thus waveguide switch is also P to the incoming electromagnetic wave power of the port to be measured of to be measured
2.Suppose that the reflection coefficient of the port to be measured of to be measured is S
11, then the port to be measured of to be measured is S to the reflection electromagnetic wave wave power of waveguide switch
11 2p
2, waveguide switch is also S to the electromagnetic wave power of the port one of vector network analyzer
11 2p
2.Vector network analyzer record is P from the electromagnetic wave power that port one receives
42, P
42=S
11 2p
2.
3rd step, vector network analyzer calculates the reflection coefficient of the port to be measured of to be measured
1st step of said method, the order of the 2nd step can be exchanged.
Refer to Fig. 6 a and Fig. 6 b, this is the second embodiment of the application's scattering parameter test macro, also for measuring reflection coefficient.It comprises vector network analyzer, independent of the directional coupler (hereinafter referred to as exterior orientation coupling mechanism) beyond vector network analyzer, a waveguide switch and to be measured.Described vector network analyzer has used two ports, shown in such as, vector network analyzer in Fig. 3.The port one of vector network analyzer, port two connect input end, the coupled end of exterior orientation coupling mechanism respectively.The output terminal of exterior orientation coupling mechanism connects one end of waveguide switch.The other end of waveguide switch connects the port to be measured of to be measured.Above annexation is all realized by the concentric cable being suitable for radio signal transmission.If to be measured also has other ports, then other ports are impedance matching (such as connecting 50 Ohmages).
Second embodiment of above-mentioned scattering parameter test macro realizes measuring the method for reflection coefficient: set the port one of vector network analyzer to the electromagnetic wave power of the input end of exterior orientation coupling mechanism as P
1, the output terminal of exterior orientation coupling mechanism is P to the electromagnetic wave power of waveguide switch
2.
1st step, refers to Fig. 6 a, waveguide switch is placed in short-circuit condition, and now waveguide switch is also P to the reflected electromagnetic wave power of the output terminal of exterior orientation coupling mechanism
2.Vector network analyzer record is P from the electromagnetic wave power coming from the coupled end of exterior orientation coupling mechanism that port two receives
41.So degree of coupling of exterior orientation coupling mechanism
2nd step, refers to Fig. 6 b, waveguide switch is placed in conducting state, and now waveguide switch is also P to the incoming electromagnetic wave power of the port to be measured of to be measured
2.Suppose that the reflection coefficient of the port to be measured of to be measured is S
11, then the port to be measured of to be measured is S to the reflected electromagnetic wave power of waveguide switch
11 2p
2, waveguide switch is also S to the electromagnetic wave power of the output terminal of exterior orientation coupling mechanism
11 2p
2.Vector network analyzer record is P from the electromagnetic wave power coming from the coupled end of exterior orientation coupling mechanism that port two receives
42.So degree of coupling of exterior orientation coupling mechanism
3rd step, makes two formulas equal, just obtains
vector network analyzer can calculate the reflection coefficient of the port to be measured of to be measured thus
1st step of said method, the order of the 2nd step can be exchanged.
In above-mentioned two embodiments, when waveguide switch is placed in short-circuit condition, vector network analyzer can be calibrated, namely make zero (0dB), now corresponding P '
41=1.So when waveguide switch is placed in conducting state, vector network analyzer is according to measuring the P ' obtained
42directly can calculate the reflection coefficient of the port to be measured of to be measured, namely
Due to the limitation of vector network analyzer self, when carrying out single port test as with the first embodiment, when the reflection coefficient of the port to be measured of to be measured is less than-26dB, the range error of generation is 3dB, and phase error is 20 °.But when carrying out dual-port test as with the second embodiment, even if when the transmission coefficient of exterior orientation coupling mechanism is less than-45dB, still can reach range error and be less than 0.1dB, and phase error is less than 1 °.Therefore, above-mentioned first embodiment is applicable to reflection coefficient S
11the port to be measured of to be measured of > 0.05.Second embodiment is then not limited, both can measure reflection coefficient S
11the port to be measured of to be measured of > 0.05, also can measure reflection coefficient S
11the port to be measured of to be measured of≤0.05.The measurement of the reflection coefficient of the port to be measured of to be measured is converted to the measurement of the transmission coefficient of exterior orientation coupling mechanism by the second embodiment, so the second embodiment has higher degree of accuracy than the first embodiment.
Refer to Fig. 7 a and Fig. 7 b, this is the 3rd embodiment of the application's scattering parameter test macro, for measuring transmission coefficient.It comprises vector network analyzer, two waveguide switches and to be measured.Described vector network analyzer only uses a port, shown in such as, vector network analyzer in Fig. 1.This port one of vector network analyzer connects one end of waveguide switch one.The other end of waveguide switch one connects the port one of to be measured.The port two of to be measured connects one end of waveguide switch two.Above annexation is all realized by the concentric cable being suitable for radio signal transmission.If to be measured also has other ports, then other ports are impedance matching (such as connecting 50 Ohmages).
The method that transmission coefficient is measured in the realization of the 3rd embodiment of above-mentioned scattering parameter test macro is: set the port one of vector network analyzer to the electromagnetic wave power of waveguide switch one as P
2.
1st step, refers to Fig. 7 a, and waveguide switch one is placed in short-circuit condition, and the state of waveguide switch two is random.Now waveguide switch one is also P to the reflected electromagnetic wave power of the port one of vector network analyzer
2.Vector network analyzer record is P from the electromagnetic wave power that port one receives
41, P
41=P
2.
2nd step, refers to Fig. 7 b, and waveguide switch one is placed in conducting state, and waveguide switch two is placed in short-circuit condition.Now waveguide switch one is also P to the incoming electromagnetic wave power of the port one of to be measured
2.Suppose that the port one of to be measured is S to the transmission coefficient of port two
21, port two is S to the transmission coefficient of port one
12, then the port two of to be measured is S to the outgoing electromagnetic wave power of waveguide switch two
21 2p
2.Now waveguide switch two is also S to the reflected electromagnetic wave power of the port two of to be measured
21 2p
2.The port one of to be measured is S to the outgoing electromagnetic wave power of waveguide switch one
12 2s
21 2p
2.Waveguide switch one is also S to the electromagnetic wave power of the port one of vector network analyzer
12 2s
21 2p
2.Vector network analyzer record is P from the electromagnetic wave power that port one receives
42, P
42=S
12 2s
21 2p
2.
3rd step, if to be measured is passive multi-port (two or more port) device, and all the other ports except port one and port two are all impedance matching, so S
12=S
21.The port one that vector network analyzer calculates to be measured is to the transmission coefficient of port two
1st step of said method, the order of the 2nd step can be exchanged.
Refer to Fig. 8 a and Fig. 8 b, this is the 4th embodiment of the application's scattering parameter test macro, also for measuring transmission coefficient.It comprises vector network analyzer, independent of the directional coupler (hereinafter referred to as exterior orientation coupling mechanism) beyond vector network analyzer, two waveguide switches and to be measured.Described vector network analyzer has used two ports, shown in such as, vector network analyzer in Fig. 3.The port one of vector network analyzer, port two connect input end, the coupled end of exterior orientation coupling mechanism respectively.The output terminal of exterior orientation coupling mechanism connects one end of waveguide switch one.The other end of waveguide switch one connects the port one of to be measured.The port two of to be measured connects one end of waveguide switch two.Above annexation is all realized by the concentric cable being suitable for radio signal transmission.If to be measured also has other ports, then other ports are impedance matching (such as connecting 50 Ohmages).
4th embodiment of above-mentioned scattering parameter test macro realizes measuring the method for transmission coefficient: set the port one of vector network analyzer to the electromagnetic wave power of the input end of exterior orientation coupling mechanism as P
1, the output terminal of exterior orientation coupling mechanism is P to the electromagnetic wave power of waveguide switch one
2.
1st step, refers to Fig. 8 a, and waveguide switch one is placed in short-circuit condition, and the state of waveguide switch two is random.Now waveguide switch one is also P to the reflected electromagnetic wave power of the output terminal of exterior orientation coupling mechanism
2.Vector network analyzer record is P from the electromagnetic wave power coming from the coupled end of exterior orientation coupling mechanism that port two receives
41.So degree of coupling of exterior orientation coupling mechanism
2nd step, refers to Fig. 8 b, and waveguide switch one is placed in conducting state, and waveguide switch two is placed in short-circuit condition.Now waveguide switch one is also P to the incoming electromagnetic wave power of the port one of to be measured
2.Suppose that the port one of to be measured is S to the transmission coefficient of port two
21, port two is S to the transmission coefficient of port one
12, then the port two of to be measured is S to the outgoing electromagnetic wave power of waveguide switch two
21 2p
2.Now waveguide switch two is also S to the reflected electromagnetic wave power of the port two of to be measured
21 2p
2.The port one of to be measured is S to the outgoing electromagnetic wave power of waveguide switch one
12 2s
21 2p
2, waveguide switch one is also S to the electromagnetic wave power of the output terminal of exterior orientation coupling mechanism
12 2s
21 2p
2.Vector network analyzer record is P from the electromagnetic wave power coming from the coupled end of exterior orientation coupling mechanism that port two receives
42.So degree of coupling of exterior orientation coupling mechanism
3rd step, makes two formulas equal, just obtains
if to be measured is passive multi-port (two or more port) device, and all the other ports except port one and port two are all impedance matching, so S
12=S
21.The port one that vector network analyzer can calculate to be measured is thus to the transmission coefficient of port two
1st step of said method, the order of the 2nd step can be exchanged.
In above-mentioned two embodiments, when waveguide switch is placed in short-circuit condition, vector network analyzer can be calibrated, namely make zero (0dB), now corresponding P '
41=1.So when waveguide switch is placed in conducting state, vector network analyzer is according to measuring the P ' obtained
42directly can calculate the reflection coefficient of the port to be measured of to be measured, namely
Similarly, the single port only using vector network analyzer due to the 3rd embodiment is measured, and the dual-port that the 4th embodiment only uses vector network analyzer is measured, and therefore the measuring accuracy of the 4th embodiment is higher, the scope of application is wider.
Transmission coefficient S between the input end and output terminal of directional coupler
21≤ 0.005(i.e.-45dB) time, above-mentioned second embodiment, the 4th embodiment still remain higher measuring accuracy, range error in below 0.1dB, phase error below 1 °.
In above-mentioned four embodiments, usually control vector network analyzer and waveguide switch by a computing machine (not shown).Computing machine not only controls the break-make of waveguide switch, also control vector network analyzer and produces and received RF signal, and the reading realized test signal and process, thus realize measuring reflection coefficient or transmission coefficient.
The application's scattering parameter test macro may be used for the reflection coefficient of arbitrary port measuring passive device, active device, also can be used for the transmission coefficient measured between any two ports of passive multi-port device.
For meeting testing requirement, the reflection coefficient of the waveguide switch that usual requirement uses when conducting is less than the reflection coefficient of to be measured connected port, requires that the electromagnetic wave that the waveguide switch used reflects when short circuit can be detected by vector network analyzer (the lowest detection thresholding being greater than vector network analyzer) simultaneously.
In order to improve measuring accuracy, preferably, the reflection coefficient of the waveguide switch used when conducting is less than 1/10th of the reflection coefficient of to be measured connected port, reflection coefficient >=50% of the waveguide switch used when short circuit.Now, the application's measuring error that each components and parts are introduced when measuring reflection coefficient, transmission coefficient is just negligible.
By selecting suitable waveguide switch, its switching time between short-circuit condition and conducting state can be made very short, such as, reach about 100ms.In the short period of time, the P that obtains of vector network analyzer measurement
41and P
42can think quasi real time.The application passes through P
42with P
41ratio, obtain the reflection coefficient S of the port to be measured of to be measured
11or the transmission coefficient S between to be measured two ports
21.This metering system has all carried out quasi real time correcting to all errors (comprise vector network analyzer, amplitude, phase drift etc. that directional coupler, cable bring due to temperature and motion) before waveguide switch.Test shows, more preferably, and the standing-wave ratio (SWR) VSWR < 1.1 when waveguide switch is in conducting, the reflection coefficient S when short circuit
11>-1.5dB, then the application can by vector network analyzer measure time phase stability rise to ± 0.35 ° within, as shown in the solid line not with little triangle in Fig. 9, thus meet long-time, high-precision testing requirement, solve a great problem of the application that annoying vector network analyzer.
These are only the preferred embodiment of the application, and be not used in restriction the application.For a person skilled in the art, the application can have various modifications and variations.Within all spirit in the application and principle, any amendment done, equivalent replacement, improvement etc., within the protection domain that all should be included in the application.
Claims (9)
1. a scattering parameter test macro, is characterized in that, comprises vector network analyzer, a waveguide switch and to be measured when measuring reflection coefficient; Vector network analyzer only uses a port, and the port one of vector network analyzer connects one end of waveguide switch; The other end of waveguide switch connects the port to be measured of to be measured; To be measured or there is no other ports, or other ports are impedance matching;
Vector network analyzer, two waveguide switches and to be measured is comprised when measuring transmission coefficient; Vector network analyzer only uses a port, and the port one of vector network analyzer connects one end of waveguide switch one; The other end of waveguide switch one connects the port one of to be measured; The port two of to be measured connects one end of waveguide switch two; To be measured or there is no other ports, or other ports are impedance matching;
Described waveguide switch has short circuit and conducting two states; Waveguide switch is equivalent to a short-circuiting device in short-circuit condition, and waveguide switch is equivalent to an open circuit device in conducting state.
2. scattering parameter test macro according to claim 1, is characterized in that, also comprises exterior orientation coupling mechanism when measuring reflection coefficient; Vector network analyzer only uses two ports, and the port one of vector network analyzer, port two connect input end, the coupled end of exterior orientation coupling mechanism respectively; The output terminal of exterior orientation coupling mechanism connects one end of waveguide switch; The other end of waveguide switch connects the port to be measured of to be measured; To be measured or there is no other ports, or other ports are impedance matching;
Exterior orientation coupling mechanism is also comprised when measuring transmission coefficient; Vector network analyzer only uses two ports, and the port one of vector network analyzer, port two connect input end, the coupled end of exterior orientation coupling mechanism respectively; The output terminal of exterior orientation coupling mechanism connects one end of waveguide switch one; The other end of waveguide switch one connects the port one of to be measured; The port two of to be measured connects one end of waveguide switch two; To be measured or there is no other ports, or other ports are impedance matching.
3. scattering parameter test macro according to claim 1 and 2, is characterized in that, all also comprises computing machine when measuring reflection coefficient or transmission coefficient; Described computing machine controls the short-circuit condition of waveguide switch and the switching of conducting state, also control vector network analyzer and produces and received RF signal.
4. an implementation method for scattering parameter test macro, is characterized in that, comprises the steps: when measuring reflection coefficient
1st step, is placed in short-circuit condition by waveguide switch, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
41;
2nd step, is placed in conducting state by waveguide switch, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
42;
Or the order of the 1st step, the 2nd step is exchanged;
3rd step, vector network analyzer with
calculate the reflection coefficient of the port to be measured of to be measured;
Comprise the steps: when measuring transmission coefficient
1st ' step, is placed in short-circuit condition by waveguide switch one, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
41;
2nd ' step, is placed in conducting state by waveguide switch one, and waveguide switch two is placed in short-circuit condition, and when vector network analyzer only uses a port, vector network analyzer record is P from the electromagnetic wave power that port one receives
42;
Or the order of the 1st ' step, the 2nd step ' is exchanged;
3rd ' step, when being passive double-end mouthpart part for be measured, vector network analyzer with
calculate the transmission coefficient of port one to the port two of to be measured.
5. the implementation method of scattering parameter test macro according to claim 4, is characterized in that,
Described method the 1st step changes into, and waveguide switch is placed in short-circuit condition, and when vector network analyzer only uses two ports, vector network analyzer record is P from the electromagnetic wave power that port two receives
41;
Described method the 2nd step changes into, and waveguide switch is placed in conducting state, and when vector network analyzer only uses two ports, vector network analyzer record is P from the electromagnetic wave power that port two receives
42;
Described method the 1st ' step changes into, and waveguide switch one is placed in short-circuit condition, and when vector network analyzer only uses two ports, vector network analyzer record is P from the electromagnetic wave power that port two receives
41;
Described method the 2nd ' step changes into, and waveguide switch one is placed in conducting state, and waveguide switch two is placed in short-circuit condition, and when vector network analyzer only uses two ports, vector network analyzer record is P from the electromagnetic wave power that port two receives
42.
6. the implementation method of scattering parameter test macro according to claim 4, is characterized in that,
In described method the 1st step, when waveguide switch is placed in short-circuit condition, vector network analyzer is calibrated, now corresponding P
41=1;
In described method the 3rd step, vector network analyzer with
calculate the reflection coefficient of the port to be measured of to be measured;
Described method the 1st ' in step, when waveguide switch one is placed in short-circuit condition, vector network analyzer is calibrated, now corresponding P
41=1;
Described method the 3rd ' in step, vector network analyzer with
the port one calculating to be measured is to the transmission coefficient of port two.
7. the implementation method of scattering parameter test macro according to claim 4, it is characterized in that, the reflection coefficient of waveguide switch when conducting is less than the reflection coefficient of to be measured connected port, and the electromagnetic wave that waveguide switch reflects when short circuit is greater than the lowest detection thresholding of vector network analyzer.
8. the implementation method of scattering parameter test macro according to claim 7, is characterized in that, the reflection coefficient of waveguide switch when conducting is less than 1/10th of the reflection coefficient of to be measured connected port, reflection coefficient >=50% of waveguide switch when short circuit.
9. the implementation method of scattering parameter test macro according to claim 8, is characterized in that, the standing-wave ratio (SWR) VSWR < 1.1 of waveguide switch when conducting, the reflection coefficient S when short circuit
11>-1.5dB.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310461567.4A CN104515907B (en) | 2013-09-30 | 2013-09-30 | A kind of scattering parameter test system and its implementation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310461567.4A CN104515907B (en) | 2013-09-30 | 2013-09-30 | A kind of scattering parameter test system and its implementation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104515907A true CN104515907A (en) | 2015-04-15 |
| CN104515907B CN104515907B (en) | 2017-09-22 |
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Cited By (11)
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| CN105652091A (en) * | 2015-12-29 | 2016-06-08 | 重庆微标科技股份有限公司 | RFID product standing-wave ratio automatic testing system |
| CN107167668A (en) * | 2017-05-25 | 2017-09-15 | 中国电子科技集团公司第十三研究所 | 1 40GHz is in piece S parameter measuring method |
| CN107800443A (en) * | 2017-11-06 | 2018-03-13 | 中北大学 | RF passive resonance sensor characteristic solution adjusts translation circuit |
| CN108414990A (en) * | 2018-02-27 | 2018-08-17 | 北京环境特性研究所 | A kind of target scattering characteristics measuring system and method |
| CN108627696A (en) * | 2018-01-08 | 2018-10-09 | 深圳市鼎阳科技有限公司 | A kind of measuring device and its measurement method of vector network |
| CN109498010A (en) * | 2018-11-30 | 2019-03-22 | 中国人民解放军陆军军医大学 | Data processing system applied to the diagnosis closed injury of brain of continuous wave spectrum scan |
| CN110470871A (en) * | 2019-09-20 | 2019-11-19 | 西安电子科技大学 | Based on the multi-mode material electromagnetic parameter test device and method of single port |
| CN110995544A (en) * | 2019-12-19 | 2020-04-10 | 四川经纬达科技集团有限公司 | S parameter single-port differential test equipment and test method thereof |
| CN111273110A (en) * | 2020-03-19 | 2020-06-12 | 中国振华集团云科电子有限公司 | Full-temperature automatic testing system and method for S parameter of microwave component |
| CN111579869A (en) * | 2020-04-21 | 2020-08-25 | 中国电子科技集团公司第十三研究所 | Reciprocal two-port network S parameter measuring method and device and terminal equipment |
| CN111766455A (en) * | 2020-09-02 | 2020-10-13 | 上海霍莱沃电子系统技术股份有限公司 | Phased array antenna directional pattern prediction method and system based on aperture current method |
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| CN105652091B (en) * | 2015-12-29 | 2018-12-04 | 重庆微标科技股份有限公司 | RFID product standing-wave ratio Auto-Test System |
| CN105652091A (en) * | 2015-12-29 | 2016-06-08 | 重庆微标科技股份有限公司 | RFID product standing-wave ratio automatic testing system |
| CN107167668A (en) * | 2017-05-25 | 2017-09-15 | 中国电子科技集团公司第十三研究所 | 1 40GHz is in piece S parameter measuring method |
| CN107800443B (en) * | 2017-11-06 | 2020-02-18 | 中北大学 | Radio frequency passive resonance sensing characteristic demodulation and conversion circuit |
| CN107800443A (en) * | 2017-11-06 | 2018-03-13 | 中北大学 | RF passive resonance sensor characteristic solution adjusts translation circuit |
| CN108627696A (en) * | 2018-01-08 | 2018-10-09 | 深圳市鼎阳科技有限公司 | A kind of measuring device and its measurement method of vector network |
| CN108414990A (en) * | 2018-02-27 | 2018-08-17 | 北京环境特性研究所 | A kind of target scattering characteristics measuring system and method |
| CN109498010A (en) * | 2018-11-30 | 2019-03-22 | 中国人民解放军陆军军医大学 | Data processing system applied to the diagnosis closed injury of brain of continuous wave spectrum scan |
| CN110470871A (en) * | 2019-09-20 | 2019-11-19 | 西安电子科技大学 | Based on the multi-mode material electromagnetic parameter test device and method of single port |
| CN110470871B (en) * | 2019-09-20 | 2024-03-29 | 西安电子科技大学 | Single-port multi-state-based material electromagnetic parameter testing device and method |
| CN110995544A (en) * | 2019-12-19 | 2020-04-10 | 四川经纬达科技集团有限公司 | S parameter single-port differential test equipment and test method thereof |
| CN111273110A (en) * | 2020-03-19 | 2020-06-12 | 中国振华集团云科电子有限公司 | Full-temperature automatic testing system and method for S parameter of microwave component |
| CN111579869A (en) * | 2020-04-21 | 2020-08-25 | 中国电子科技集团公司第十三研究所 | Reciprocal two-port network S parameter measuring method and device and terminal equipment |
| CN111766455A (en) * | 2020-09-02 | 2020-10-13 | 上海霍莱沃电子系统技术股份有限公司 | Phased array antenna directional pattern prediction method and system based on aperture current method |
| CN111766455B (en) * | 2020-09-02 | 2020-11-17 | 上海霍莱沃电子系统技术股份有限公司 | Phased array antenna directional pattern prediction method and system based on aperture current method |
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