CN104515907B - A kind of scattering parameter test system and its implementation - Google Patents
A kind of scattering parameter test system and its implementation Download PDFInfo
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- CN104515907B CN104515907B CN201310461567.4A CN201310461567A CN104515907B CN 104515907 B CN104515907 B CN 104515907B CN 201310461567 A CN201310461567 A CN 201310461567A CN 104515907 B CN104515907 B CN 104515907B
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Abstract
This application discloses a kind of scattering parameter test system, include vector network analyzer, a waveguide switch and part to be measured when measuring reflectance factor；The port one of vector network analyzer connects one end of waveguide switch；The other end of waveguide switch connects the port to be measured of part to be measured；Part to be measured is either impedance matching without other ports or other ports.Include vector network analyzer, two waveguide switches and part to be measured when measuring transmission coefficient；The port one of the vector network analyzer connects one end of waveguide switch one；The other end of waveguide switch one connects the port one of part to be measured；The port two of part to be measured connects one end of waveguide switch two；Part to be measured is either impedance matching without other ports or other ports.The application realizes a kind of without system calibration, the multiport circuit method of error correction.Because test process is carried out near real-time, so as to eliminate every systematic error, high measurement accuracy is obtained.
Description
Technical field
The application is related to a kind of scattering parameter test system of radio frequency microwave circuit.
Background technology
In radio frequency microwave circuit, traditional voltage, electric current concept are no longer applicable, and must use the reflection of electromagnetic wave
And transmission mode is analyzed.Scattering parameter (scattering parameters, also referred to as S parameter) is built upon incidence wave, reflection
Parameter on the basis of ripple relation, the characteristic for the description radio frequency microwave circuit that is particularly suitable for use in.Reflectance factor (reflection
Coefficient), transmission coefficient (transmission coefficient) is two kinds in scattering parameter, and the former is used for table
Show the ratio of each reflection of electromagnetic wave amount and amount of incident to external port of circuit, the latter is used for one of indication circuit externally
The electromagnetic wave exit dose of port and the ratio of another electromagnetic wave incident amount to external port.
Generally carry out the scattering ginseng of measuring circuit using vector network analyzer (VNA, vector network analyzer)
Number.Vector network analyzer is a kind of complicated tester, including signal source, power divider, directional coupler, standing-wave ratio
Multiple modules such as bridge, width Phase Receiver machine, detector, processor, display.In use, part therein can be selected as needed
Or whole modules.
Referring to Fig. 1, this is a kind of existing reflectance factor test system, treated by a vector network analyzer and one
Part (DUT, device under test) is surveyed to be constituted.Signal source, the power distribution in vector network analyzer are wherein used
The modules such as device, directional coupler, width Phase Receiver machine.Directional coupler therein as shown in Fig. 2 with input, output end, every
From end, coupled end total of four port.The output end of directional coupler connects the port to be measured of part to be measured.Its measuring principle is：
Output signal E of the power divider signal source0It is divided into two-way, the distribution coefficient of power divider is respectively c1And c2.Believe all the way
Number c1E0Reference signal R, another road signal c are used as to width Phase Receiver machine2E0Input to directional coupler.Directional coupler
Output end the signal of input be transferred to the port to be measured of part to be measured be used as incidence wave a1.Reflected from the port to be measured
Signal b1Return to the output end of directional coupler, b1=S11a1, S11For the reflectance factor of the port to be measured of part to be measured.The reflection
Ripple b1The isolation end inductive coupling for being directed coupler again is arrived, then to width Phase Receiver machine is used as test signal T, T=by coupled end
c3b1, c3It is the coefficient of coup of directional coupler.Due toAnd coefficient c1、c2、c3It is constant, as long as thus measuring
T/R plural ratio (this can be obtained by width Phase Receiver machine measurement), you can obtain the reflectance factor S of the port to be measured of part to be measured11。
Referring to Fig. 3, this is a kind of existing transmission coefficient test system, treated by a vector network analyzer and one
Part is surveyed to be constituted.Two ports of vector network analyzer are wherein used, the port one of vector network analyzer connects to be measured
The port one of part, the port two of the connected vector Network Analyzer of port two of part to be measured.Its measuring principle is：Power divider handle
The output signal E of signal source0It is divided into two-way, the distribution coefficient of power divider is respectively c1And c2.Signal c all the way1E0Give width phase
Receiver is used as reference signal R, another road signal c2E0Port one to part to be measured is used as incidence wave a1.From the port of part to be measured
The signal b of two outgoing2Width Phase Receiver machine is passed to as test signal T, T=b2=S21a1, S21Arrived for the port one of part to be measured
The transmission coefficient of port two.Due toAnd coefficient c1、c2It is constant, as long as thus measuring T/R plural ratio (this
Can be obtained by width Phase Receiver machine measurement), you can the port one of part to be measured is obtained to the transmission coefficient S of port two21。
In the scattering parameter using vector network analyzer measuring circuit, generally also need to exclude every systematic error pair
The influence of measurement result.Therefore its concrete methods of realizing is：Every system error is calculated first, and this is referred to as system calibration
(calibration).Then according to the measured value of vector network analyzer, with error model (error model) and each term system
System error amount calculates actual value, and this is referred to as error correction (error correction).Because scattering parameter is plural number, and
And be the function of frequency, therefore system calibration and error correction must be carried out on each Frequency point.Above content is big in Tsing-Hua University
Learn what publishing house published in June, 2000《Modern network spectrum measurement technology》Have in 1st chapter of one book (Lv Hongguo writes) detailed
Record to the greatest extent.
Existing scattering parameter test system can be reached very high when carrying out the test of short period by system calibration
Precision.But some test process may be up to a few hours.When longer between when tested, test the shake of cable, temperature and become
Change etc. can cause the test environment after calibration correction to change, so as to cause the phase of vector network analyzer, amplitude
Drift about, this drift can cause test result inaccurate.The phenomenon that this stiffness of system declines increases with the testing time
Plus and it is increasingly apparent, currently without solution.
Existing vector network analyzer is when being scattered parameter measurement, and its phase test precision can only achieve ± 2 °,
If the testing time extends, it is worse that measuring accuracy can become, and has the shown in solid of small triangle in such as Fig. 9.How to meet
High accuracy, prolonged testing requirement, just turn into a problem during current vector network analyzer is applied.
The content of the invention
Technical problems to be solved in this application are to provide a kind of scattering parameter test system, can solve to survey in long-time
Caused by the stability of test system is deteriorated during examination the problem of measurement result precise decreasing.
In order to solve the above technical problems, the application scattering parameter test system includes vector network when measuring reflectance factor
Analyzer, a waveguide switch and part to be measured；Vector network analyzer only uses a port, the port one of vector network analyzer
Connect one end of waveguide switch；The other end of waveguide switch connects the port to be measured of part to be measured；Part to be measured or other no ends
Mouthful, or other ports are impedance matching；
The scattering parameter test system measure transmission coefficient when include vector network analyzer, two waveguide switches and
Part to be measured；Vector network analyzer only uses a port, and the port one of vector network analyzer connects one end of waveguide switch one；
The other end of waveguide switch one connects the port one of part to be measured；The port two of part to be measured connects one end of waveguide switch two；It is to be measured
Part is either impedance matching without other ports or other ports.
The waveguide switch has two states；Waveguide switch is whole in the electromagnetic wave that first state enters a port
Reflect back, waveguide switch all exports the electromagnetic wave that a port enters from another port in the second state.
The application scattering parameter test system realizes that the method for measurement reflectance factor is：
1st step, first state is placed in by waveguide switch, when vector network analyzer only uses a port, vector network
The electromagnetic wave power that analyzer record is received from port one is P41；
2nd step, the second state is placed in by waveguide switch, when vector network analyzer only uses a port, vector network
The electromagnetic wave power that analyzer record is received from port one is P42；
Or, the 1st step, the order of the 2nd step are exchanged；
3rd step, vector network analyzer withCalculate the reflectance factor of the port to be measured of part to be measured；
Above-mentioned scattering parameter test system realizes that the method for measurement transmission coefficient is：
1st ' step, first state is placed in by waveguide switch one, when vector network analyzer only uses a port, vector net
The electromagnetic wave power that network analyzer record is received from port one is P41；
2nd ' step, the second state is placed in by waveguide switch one, and waveguide switch two is placed in first state, works as vector network analysis
When instrument only uses a port, the electromagnetic wave power that vector network analyzer record is received from port one is P42；
Or, the 1st ' step, the order of the 2nd ' step are exchanged；
3rd ' step, when part to be measured be passive multi-port device when, vector network analyzer withCalculate part to be measured
The transmission coefficient of port one to port two.
Traditional scattering parameter test system is by selecting disparate modules in vector network analyzer, and with more multiple
Miscellaneous system calibration, error correction scheme are scattered the actual measurement of parameter.The application does not appoint to vector network analyzer
What change, increased waveguide switch newly outside vector network analyzer, realize it is a kind of without system calibration, error correction dissipate
Penetrate measurement method of parameters.It is the ratio of the measured value under the different conditions for comparing waveguide switch due to test process, is quasi real time
Ground is carried out, so as to eliminate every systematic error, obtains high measurement accuracy.
Brief description of the drawings
Fig. 1 is the structural representation of existing reflectance factor test system；
Fig. 2 is the schematic diagram of four ports of directional coupler；
Fig. 3 is the structural representation of existing transmission coefficient test system；
Fig. 4 a, Fig. 4 b are the structural representations of the first embodiment of the scattering parameter test system of the application；
Fig. 5 a, Fig. 5 b are the first state of waveguide switch, the second view respectively；
Fig. 6 a, Fig. 6 b are the structural representations of the second embodiment of the scattering parameter test system of the application；
Fig. 7 a, Fig. 7 b are the structural representations of the 3rd embodiment of the scattering parameter test system of the application；
Fig. 8 a, Fig. 8 b are the structural representations of the fourth embodiment of the scattering parameter test system of the application；
Fig. 9 is the measurement accuracy schematic diagram of existing and the application scattering parameter test system.
Embodiment
Fig. 4 a and Fig. 4 b are referred to, this is the first embodiment of the application scattering parameter test system, for measuring reflection
Coefficient.It includes vector network analyzer, a waveguide switch and part to be measured.The vector network analyzer only uses an end
Mouthful, such as shown in the vector network analyzer in Fig. 1.The port one of vector network analyzer connects one end of waveguide switch.
The other end of waveguide switch connects the port to be measured of part to be measured.Above annexation is all by the coaxial electrical suitable for radio signal transmission
Cable is realized.If part to be measured also has other ports, other ports are impedance matching (for example connecting 50 Ohmic resistances).
The waveguide switch has two states.Fig. 5 a are referred to, this is the first state of waveguide switch, waveguide now
Switch all reflects back the electromagnetic wave that a port enters.Fig. 5 b are referred to, this is the second state of waveguide switch, now
The waveguide switch electromagnetic wave that enters a port all exported from another port.
The first embodiment of above-mentioned scattering parameter test system realizes that the method for measurement reflectance factor is：If vector network point
The port one of analyzer is P to the electromagnetic wave power of waveguide switch2。
1st step, refers to Fig. 4 a, and waveguide switch is placed in into first state, and waveguide switch now enters a port
Electromagnetic wave all reflect back, do not exported completely from another port, thus end of the waveguide switch to vector network analyzer
The reflection electromagnetic wave power of mouth one is also P2.The electromagnetic wave power that vector network analyzer record is received from port one is P41, P41
=P2。
2nd step, refers to Fig. 4 b, and waveguide switch is placed in into the second state, and now waveguide switch allows electromagnetic wave from one
Port enters and all exported by another port, thus incoming electromagnetic wave power of the waveguide switch to the port to be measured of part to be measured
Also it is P2.Assuming that the reflectance factor of the port to be measured of part to be measured is S11, then reflection of the port to be measured of part to be measured to waveguide switch
Electromagnetic wave wave power is S11 2P2, waveguide switch is also S to the electromagnetic wave power of the port one of vector network analyzer11 2P2.Vector
The electromagnetic wave power that Network Analyzer record is received from port one is P42, P42=S11 2P2。
3rd step, vector network analyzer calculates the reflectance factor of the port to be measured of part to be measured
The 1st step, the order of the 2nd step of the above method can be exchanged.
Fig. 6 a and Fig. 6 b are referred to, this is the second embodiment of the application scattering parameter test system, be also used for measurement anti-
Penetrate coefficient.It includes vector network analyzer, (hereinafter referred to as outside independently of the directional coupler beyond vector network analyzer
Directional coupler), a waveguide switch and part to be measured.The vector network analyzer has been used in two ports, such as Fig. 3
Shown in vector network analyzer.Port one, the port two of vector network analyzer connect the input of exterior orientation coupler respectively
End, coupled end.The output end of exterior orientation coupler connects one end of waveguide switch.The other end of waveguide switch connects part to be measured
Port to be measured.Above annexation is all realized by the coaxial cable suitable for radio signal transmission.If part to be measured also has it
His port, then other ports are impedance matching (for example connecting 50 Ohmic resistances).
The second embodiment of above-mentioned scattering parameter test system realizes that the method for measurement reflectance factor is：If vector network point
The port one of analyzer is P to the electromagnetic wave power of the input of exterior orientation coupler1, the output end of exterior orientation coupler gives
The electromagnetic wave power of waveguide switch is P2。
1st step, refers to Fig. 6 a, and waveguide switch is placed in into first state, and now waveguide switch gives exterior orientation coupler
Output end reflection electromagnetic wave power also be P2.Vector network analyzer record comes from exterior orientation from what port two was received
The electromagnetic wave power of the coupled end of coupler is P41.So degree of coupling of exterior orientation coupler
2nd step, refers to Fig. 6 b, and waveguide switch is placed in into the second state, and now waveguide switch gives the end to be measured of part to be measured
The incoming electromagnetic wave power of mouth is also P2.Assuming that the reflectance factor of the port to be measured of part to be measured is S11, then the end to be measured of part to be measured
Mouth is S to the reflection electromagnetic wave power of waveguide switch11 2P2, electromagnetic wave of the waveguide switch to the output end of exterior orientation coupler
Power is also S11 2P2.The coupled end for coming from exterior orientation coupler that vector network analyzer record is received from port two
Electromagnetic wave power is P42.So degree of coupling of exterior orientation coupler
3rd step, makes two formulas equal, just obtainsThus vector network analyzer can calculate part to be measured
Port to be measured reflectance factor
The 1st step, the order of the 2nd step of the above method can be exchanged.
In above-mentioned two embodiment, school can be carried out to vector network analyzer when waveguide switch is placed in first state
Standard, that is, be zeroed (0dB), now corresponding P '41=1.So when waveguide switch is placed in the second state, vector network analyzer root
The P ' obtained according to measurement42The reflectance factor of the port to be measured of part to be measured can be directly calculated, i.e.,
Due to the limitation of vector network analyzer itself, when carrying out single port test as with the first embodiment,
In the case that the reflectance factor of the port to be measured of part to be measured is less than -26dB, the range error of generation is 3dB, and phase error is
200.But as with the second embodiment carry out dual-port test when, even if the transmission coefficient of exterior orientation coupler be less than-
In the case of 45dB, it is still able to reach that range error is less than 0.1dB, and phase error is less than 10.Therefore, above-mentioned first implements
Example is applied to reflectance factor S11The port to be measured of ＞ 0.05 part to be measured.And second embodiment is then not limited, it can both survey
Measure reflectance factor S11The port to be measured of ＞ 0.05 part to be measured, can also measure reflectance factor S11≤ 0.05 part to be measured is treated
Survey port.Second embodiment by the measures conversion of the reflectance factor of the port to be measured of part to be measured be exterior orientation coupler transmission
The measurement of coefficient, so second embodiment has higher accuracy than first embodiment.
Fig. 7 a and Fig. 7 b are referred to, this is the 3rd embodiment of the application scattering parameter test system, for measuring transmission
Coefficient.It includes vector network analyzer, two waveguide switches and part to be measured.The vector network analyzer only uses an end
Mouthful, such as shown in the vector network analyzer in Fig. 1.The one of the port one connection waveguide switch one of vector network analyzer
End.The other end of waveguide switch one connects the port one of part to be measured.The port two of part to be measured connects one end of waveguide switch two.With
Upper annexation is all realized by the coaxial cable suitable for radio signal transmission.If part to be measured also has other ports, other
Port is impedance matching (for example connecting 50 Ohmic resistances).
The 3rd embodiment of above-mentioned scattering parameter test system realization measurement transmission coefficient method be：If vector network
The port one of analyzer is P to the electromagnetic wave power of waveguide switch one2。
1st step, refers to Fig. 7 a, and waveguide switch one is placed in into first state, and the state of waveguide switch two is random.Now ripple
It is also P that switch one, which is led, to the reflection electromagnetic wave power of the port one of vector network analyzer2.Vector network analyzer is recorded from end
The electromagnetic wave power that mouth one is received is P41, P41=P2。
2nd step, refers to Fig. 7 b, and waveguide switch one is placed in into the second state, and waveguide switch two is placed in first state.Now
Waveguide switch one is also P to the incoming electromagnetic wave power of the port one of part to be measured2.Assuming that the port one of part to be measured to port two
Transmission coefficient is S21, the transmission coefficient of port two to port one is S12, then outgoing of the port two of part to be measured to waveguide switch two
Electromagnetic wave power is S21 2P2.Now waveguide switch two is also S to the reflection electromagnetic wave power of the port two of part to be measured21 2P2.It is to be measured
The port one of part is S to the outgoing electromagnetic wave power of waveguide switch one12 2S21 2P2.Waveguide switch one is to vector network analyzer
The electromagnetic wave power of port one is also S12 2S21 2P2.Vector network analyzer records the electromagnetic wave power received from port one
P42, P42=S12 2S21 2P2。
3rd step, if part to be measured is passive multi-port (two or more port) device, and except port one and port two with
Remaining outer port is all impedance matching, then S12=S21.Vector network analyzer calculates the port one to port of part to be measured
Two transmission coefficient
The 1st step, the order of the 2nd step of the above method can be exchanged.
Fig. 8 a and Fig. 8 b are referred to, this is the fourth embodiment of the application scattering parameter test system, be also used for measurement and pass
Defeated coefficient.It includes vector network analyzer, (hereinafter referred to as outside independently of the directional coupler beyond vector network analyzer
Directional coupler), two waveguide switches and part to be measured.The vector network analyzer has been used in two ports, such as Fig. 3
Shown in vector network analyzer.Port one, the port two of vector network analyzer connect the input of exterior orientation coupler respectively
End, coupled end.The output end of exterior orientation coupler connects one end of waveguide switch one.The other end connection of waveguide switch one is treated
Survey the port one of part.The port two of part to be measured connects one end of waveguide switch two.Above annexation is all by suitable for radiofrequency signal
The coaxial cable of transmission is realized.If part to be measured also has other ports, other ports are that impedance matching (for example connects 50 Europe
Nurse resistance).
The fourth embodiment of above-mentioned scattering parameter test system realizes that the method for measurement transmission coefficient is：If vector network point
The port one of analyzer is P to the electromagnetic wave power of the input of exterior orientation coupler1, the output end of exterior orientation coupler gives
The electromagnetic wave power of waveguide switch one is P2。
1st step, refers to Fig. 8 a, and waveguide switch one is placed in into first state, and the state of waveguide switch two is random.Now ripple
It is also P that switch one, which is led, to the reflection electromagnetic wave power of the output end of exterior orientation coupler2.Vector network analyzer is recorded from end
The electromagnetic wave power for the coupled ends for coming from exterior orientation coupler that mouth two is received is P41.So coupling of exterior orientation coupler
It is right
2nd step, refers to Fig. 8 b, and waveguide switch one is placed in into the second state, and waveguide switch two is placed in first state.Now
Waveguide switch one is also P to the incoming electromagnetic wave power of the port one of part to be measured2.Assuming that the port one of part to be measured to port two
Transmission coefficient is S21, the transmission coefficient of port two to port one is S12, then outgoing of the port two of part to be measured to waveguide switch two
Electromagnetic wave power is S21 2P2.Now waveguide switch two is also S to the reflection electromagnetic wave power of the port two of part to be measured21 2P2.It is to be measured
The port one of part is S to the outgoing electromagnetic wave power of waveguide switch one12 2S21 2P2, waveguide switch one is to exterior orientation coupler
The electromagnetic wave power of output end is also S12 2S21 2P2.Vector network analyzer record comes from exterior orientation from what port two was received
The electromagnetic wave power of the coupled end of coupler is P42.So degree of coupling of exterior orientation coupler
3rd step, makes two formulas equal, just obtainsIf part to be measured is passive multi-port (two or more
Port) device, and remaining port in addition to port one and port two is all impedance matching, then S12=S21.Vector network
Thus analyzer can calculate the port one of part to be measured to the transmission coefficient of port two
The 1st step, the order of the 2nd step of the above method can be exchanged.
In above-mentioned two embodiment, school can be carried out to vector network analyzer when waveguide switch is placed in first state
Standard, that is, be zeroed (0dB), now corresponding P '41=1.So when waveguide switch is placed in the second state, vector network analyzer root
The P ' obtained according to measurement42The reflectance factor of the port to be measured of part to be measured can be directly calculated, i.e.,
Similarly, because the single port that 3rd embodiment only uses vector network analyzer is measured, and the 4th implements
The dual-port that example only uses vector network analyzer is measured, therefore the measurement accuracy of fourth embodiment is higher, the scope of application
It is wider.
Transmission coefficient S between the input and output end of directional coupler21When≤0.005 (i.e. -45dB), above-mentioned
Two embodiments, fourth embodiment still remain higher measurement accuracy, and range error is in below 0.1dB, phase error 10With
Under.
In aforementioned four embodiment, generally vector network analyzer and waveguide is controlled to open by a computer (not shown)
Close.Computer not only controls waveguide to switch on-off, and also control vector network analyzer and produces and receive radiofrequency signal, and in fact
Now to the reading and processing of test signal, so as to realize measurement reflectance factor or transmission coefficient.
The application scattering parameter test system can be used for measurement passive device, the reflection system of the arbitrary port of active device
Number, it may also be used for the transmission coefficient between any two port of measurement passive multi-port device.
To meet testing requirement, usually require that reflectance factor of the used waveguide switch in the second state is less than and connect
The reflectance factor of the part port to be measured connect, while the electromagnetic wave that waveguide switch used in requiring reflects in first state can
Detected (i.e. more than the lowest detection thresholding of vector network analyzer) by vector network analyzer.
In order to improve measurement accuracy, it is preferable that reflectance factor of the used waveguide switch in the second state is less than institute
/ 10th of the reflectance factor of the part port to be measured of connection, reflectance factor of the used waveguide switch in first state >=
50%.Now, the application introduced measurement error of each component when measuring reflectance factor, transmission coefficient can just be ignored not
Meter.
By selecting suitable waveguide switch, its switching time between the first state and a second state can be made very
It is short, for example reach 100ms or so.In the short period of time, the P that vector network analyzer measurement is obtained41And P42It may be considered
Quasi real time.The application passes through P42With P41Ratio, come the reflectance factor S of the port to be measured that obtains part to be measured11It is either to be measured
Transmission coefficient S between two ports of part21.This metering system is to all errors (including vector net before waveguide switch
Amplitude, phase drift that network analyzer, directional coupler, cable are brought due to temperature and motion etc.) all carry out quasi real time
Ground is corrected.Experiment shows, it is highly preferred that the standing-wave ratio VSWR ＜ 1.1 when waveguide switch is in the second state, in first state
Reflectance factor S11>- 1.5dB, then the application can by vector network analyzer measurement when phase stability lifting to ±
Within 0.35 °, without the shown in solid of small triangle in such as Fig. 9, so as to meet long-time, high-precision testing requirement, solve
Annoying a great problem of the application of vector network analyzer.
The preferred embodiment of the application is these are only, is not used to limit the application.Come for those skilled in the art
Say, the application there can be various modifications and variations.It is all any modifications within spirit herein and principle, made, equivalent
Replace, improve etc., it should be included within the protection domain of the application.
Claims (9)
1. a kind of scattering parameter test system, it is characterized in that, include vector network analyzer, a ripple when measuring reflectance factor
Lead switch and part to be measured；Vector network analyzer only uses a port, the connection of port one waveguide switch of vector network analyzer
One end；The other end of waveguide switch connects the port to be measured of part to be measured；Part to be measured is either without other ports or other ends
Mouth is impedance matching；
Include vector network analyzer, two waveguide switches and part to be measured when measuring transmission coefficient；Vector network analyzer is only
With a port, the port one of vector network analyzer connects one end of waveguide switch one；The other end connection of waveguide switch one
The port one of part to be measured；The port two of part to be measured connects one end of waveguide switch two；Part to be measured either without other ports or
Other ports are impedance matching；
The waveguide switch has two states；Waveguide switch all reflects the electromagnetic wave that a port enters in first state
Go back, waveguide switch all exports the electromagnetic wave that a port enters from another port in the second state.
2. scattering parameter test system according to claim 1, it is characterized in that, also include outside when measuring reflectance factor
Directional coupler；Vector network analyzer is only with two ports, and port one, the port two of vector network analyzer connect outer respectively
The input of portion's directional coupler, coupled end；The output end of exterior orientation coupler connects one end of waveguide switch；Waveguide switch
The other end connect the port to be measured of part to be measured；Part to be measured is either impedance matching without other ports or other ports；
Also include exterior orientation coupler when measuring transmission coefficient；Vector network analyzer is only with two ports, vector network
Port one, the port two of analyzer connect input, the coupled end of exterior orientation coupler respectively；Exterior orientation coupler it is defeated
Go out one end of end connection waveguide switch one；The other end of waveguide switch one connects the port one of part to be measured；The port two of part to be measured
Connect one end of waveguide switch two；Part to be measured is either impedance matching without other ports or other ports.
3. scattering parameter test system according to claim 1 or 2, it is characterized in that, in measurement reflectance factor or transmission system
Also include computer during number；The switching of the first state and the second state of the computer control waveguide switch, also control
Vector network analyzer produces and received radiofrequency signal.
4. a kind of implementation method of scattering parameter test system, it is characterized in that, comprise the following steps when measuring reflectance factor：
1st step, first state is placed in by waveguide switch, when vector network analyzer only uses a port, vector network analysis
The electromagnetic wave power that instrument record is received from port one is P41；
2nd step, the second state is placed in by waveguide switch, when vector network analyzer only uses a port, vector network analysis
The electromagnetic wave power that instrument record is received from port one is P42；
Or, the 1st step, the order of the 2nd step are exchanged；
3rd step, vector network analyzer withCalculate the reflectance factor of the port to be measured of part to be measured；
Comprise the following steps when measuring transmission coefficient：
1st ' step, first state is placed in by waveguide switch one, when vector network analyzer only uses a port, vector network point
The electromagnetic wave power that analyzer record is received from port one is P41；
2nd ' step, the second state is placed in by waveguide switch one, and waveguide switch two is placed in first state, when vector network analyzer only
When using a port, the electromagnetic wave power that vector network analyzer record is received from port one is P42；
Or, the 1st ' step, the 2nd step ' order exchange；
3rd ' step, when part to be measured be passive double-end mouthpart part when, vector network analyzer withCalculate the port of part to be measured
One to port two transmission coefficient.
5. the implementation method of scattering parameter test system according to claim 4, it is characterized in that,
The step of methods described the 1st is changed to, and waveguide switch is placed in into first state, when vector network analyzer is only with two ports,
The electromagnetic wave power that vector network analyzer record is received from port two is P41；
The step of methods described the 2nd is changed to, and waveguide switch is placed in into the second state, when vector network analyzer is only with two ports,
The electromagnetic wave power that vector network analyzer record is received from port two is P42；
The step of methods described the 1st ' is changed to, and waveguide switch one is placed in into first state, when vector network analyzer is only with two ports
When, the electromagnetic wave power that vector network analyzer record is received from port two is P41；
The step of methods described the 2nd ' is changed to, and waveguide switch one is placed in into the second state, and waveguide switch two is placed in first state, works as vector
When Network Analyzer is only with two ports, the electromagnetic wave power that vector network analyzer record is received from port two is P42。
6. the implementation method of scattering parameter test system according to claim 4, it is characterized in that,
In the step of methods described the 1st, when waveguide switch is placed in first state, vector network analyzer is calibrated, it is now right
The P answered41=1；
In the step of methods described the 3rd, vector network analyzer withCalculate the reflectance factor of the port to be measured of part to be measured；
In the step of methods described the 1st ', when waveguide switch one is placed in first state, vector network analyzer is calibrated, now
Corresponding P41=1；
In the step of methods described the 3rd ', vector network analyzer withThe port one of part to be measured is calculated to the transmission system of port two
Number.
7. the implementation method of scattering parameter test system according to claim 4, it is characterized in that, waveguide switch is in the second shape
Reflectance factor during state is less than the reflectance factor of the part port to be measured connected, the electromagnetism that waveguide switch reflects in first state
Ripple is more than the lowest detection thresholding of vector network analyzer.
8. the implementation method of scattering parameter test system according to claim 7, it is characterized in that, waveguide switch is in the second shape
Reflectance factor during state is less than 1/10th of the reflectance factor of the part port to be measured connected, and waveguide switch is in first state
Reflectance factor >=50%.
9. the implementation method of scattering parameter test system according to claim 8, it is characterized in that, waveguide switch is in the second shape
Standing-wave ratio VSWR ＜ 1.1 during state, the reflectance factor S in first state11＞ -1.5dB.
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| CN110470871B (en) * | 2019-09-20 | 2024-03-29 | 西安电子科技大学 | Single-port multi-state-based material electromagnetic parameter testing device and method |
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| CN111579869B (en) * | 2020-04-21 | 2023-05-30 | 中国电子科技集团公司第十三研究所 | Method and device for measuring S parameters of reciprocal two-port network and terminal equipment |
| CN111766455B (en) * | 2020-09-02 | 2020-11-17 | 上海霍莱沃电子系统技术股份有限公司 | Phased array antenna directional pattern prediction method and system based on aperture current method |
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