CN108459023A - Biradical pseudo-capacitance appearance images detection method - Google Patents

Biradical pseudo-capacitance appearance images detection method Download PDF

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Publication number
CN108459023A
CN108459023A CN201810255942.2A CN201810255942A CN108459023A CN 108459023 A CN108459023 A CN 108459023A CN 201810255942 A CN201810255942 A CN 201810255942A CN 108459023 A CN108459023 A CN 108459023A
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CN
China
Prior art keywords
flaw
image
capacitance
biradical
pseudo
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201810255942.2A
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Chinese (zh)
Inventor
刘英杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electronic Devices Jiangmen Co Ltd
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Panasonic Electronic Devices Jiangmen Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Panasonic Electronic Devices Jiangmen Co Ltd filed Critical Panasonic Electronic Devices Jiangmen Co Ltd
Priority to CN201810255942.2A priority Critical patent/CN108459023A/en
Publication of CN108459023A publication Critical patent/CN108459023A/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/342Sorting according to other particular properties according to optical properties, e.g. colour
    • B07C5/3422Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras

Abstract

The invention discloses a kind of biradical pseudo-capacitance appearance images detection methods, include the following steps:The first step:Register the deep intensity reference image in each expression face to be measured of capacitance and shallow intensity reference image, setting detection flaw amount upper limit value;Second step:Sample to be tested is placed on a conveyor, and detection device indicates that face carries out capturing image to be checked to capacitance;Third walks:It extracts in image to be checked and is deeper partly used as flaw than deep intensity reference image, detect flaw amount;4th step:Part more shallow than shallow intensity reference image in the image to be checked is extracted as flaw, detects flaw amount;5th step:Measure sample maximum flaw detection values, comprehensive judgement result;6th step:According to judgement as a result, sample product have sorted storage by screening plant.It is compared respectively using sample image and two benchmark images with concentration difference, clarification in certain roles, on the basis of not influencing to differentiate defective products, eliminates the erroneous judgement that concentration difference is brought, effectively improve Detection accuracy.

Description

Biradical pseudo-capacitance appearance images detection method
Technical field
The present invention relates to capacitance appearance detection field more particularly to a kind of biradical pseudo-capacitance appearance images detection methods.
Background technology
When manufacturing capacitance, need to show the information such as capacitance size, operating voltage on capacitance shell, current printing Technique is to be carried out expression face by print using ink, and this mode of printing can have that expression face is incomplete, reprints, deviates or even nothing By bad printing phenomenons such as prints, cause message identification unclear, user is in use, be easy to cause misuse, so as to cause with this electricity The product of container production is unable to normal use or causes the damage of product, or even causes more serious consequence.
Visual inspection is used substantially currently, being detected to the printing of capacitance appearance, detection speed is slow, is easy error, Some producers then introduce intelligent checking system, can effectively improve detection efficiency and accuracy, what such existing detecting system used Sample image and a benchmark image are carried out black and white contrast to find out flaw amount by the comparison of single benchmark image, have in high precision, The ability of height identification, but since existing ink is by the horizontal instability of print, there are concentration difference between non-defective unit, but this concentration difference When the different difference for being more than non-defective unit with defective products, system is susceptible to erroneous judgement, cannot correctly detect and distinguish non-defective unit and defective products, influences Detection accuracy.
Invention content
In order to overcome the problems referred above, the present invention provides a kind of high biradical pseudo-capacitance appearance images detection methods of accuracy.
The technical solution adopted by the present invention is:
Biradical pseudo-capacitance appearance images detection method, includes the following steps:
The first step:The benchmark image in capacitance shell expression face to be measured is registered, it is each to indicate that deep intensity reference is registered in face respectively Image and shallow intensity reference image, setting detection flaw amount upper limit value;
Second step:Sample to be tested is placed on a conveyor, starts detection device and face, which carries out capture and waits, to be indicated to capacitance Examine image;
Third walks:It extracts than the darker part of deep intensity reference image in the image to be checked, and by extraction unit It is allocated as flaw, detecting flaw amount;
4th step:Extract part more shallow than the color of shallow intensity reference image in the image to be checked, and by extraction unit It is allocated as flaw, detecting flaw amount;
5th step:It obtains sample maximum flaw detection values, is compared with flaw amount upper limit value, and provide comprehensive judgement knot Fruit;
6th step:According to judgement as a result, sample product have sorted storage by screening plant.
Conveying device in the second step is set as endless belt conveyer.
Detection device in the second step includes the CCD camera mounted on conveying device side and top.
Further, it is fixedly installed lighting source above the conveying device.
Further, the CCD camera and lighting source are each attached in mounting bracket.
Screening plant in 6th step includes the bad output mechanism being arranged in conveying device side, described bad Output mechanism corresponding position is provided with defective product box, and the delivery device tip is provided with non-defective unit case.
The beneficial effects of the invention are as follows:
The biradical pseudo-capacitance appearance images detection method of the present invention is suitable for capacitance ink and is detected by print, using sample image It is compared respectively with two benchmark images with concentration difference, the two does not interfere with each other, clarification in certain roles, comprehensive judgement, in not shadow It rings on the basis of differentiating defective products, eliminates the erroneous judgement that concentration difference is brought, effectively improve Detection accuracy.
Description of the drawings
The biradical pseudo-capacitance appearance images detection method of the present invention is described further below in conjunction with attached drawing and example.
Fig. 1 is capacitive detection system structural schematic diagram.
Drawing reference numeral explanation:1, capacitance to be checked;2, endless belt conveyer;3, CCD camera;4, lighting source;5, mounting bracket; 6, bad output mechanism;7, defective product box;8, non-defective unit case.
Specific implementation mode
As shown in Figure 1, one of embodiment provided by the invention, biradical pseudo-capacitance appearance images detection method, including it is following Step:
The first step:The benchmark image in capacitance shell expression face to be measured is registered, it is each to indicate that deep intensity reference is registered in face respectively Image and shallow intensity reference image, setting detection flaw amount upper limit value;
Second step:Sample to be tested is placed on a conveyor, starts detection device and face, which carries out capture and waits, to be indicated to capacitance Examine image;
Third walks:It extracts than the darker part of deep intensity reference image in the image to be checked, and by extraction unit It is allocated as flaw, detecting flaw amount;
4th step:Extract part more shallow than the color of shallow intensity reference image in the image to be checked, and by extraction unit It is allocated as flaw, detecting flaw amount;
5th step:It obtains sample maximum flaw detection values, is compared with flaw amount upper limit value, and provide comprehensive judgement knot Fruit;
6th step:According to judgement as a result, sample product have sorted storage by screening plant.
Conveying device in the second step is set as endless belt conveyer.
Detection device in the second step includes the CCD camera mounted on conveying device side and top.
It is fixedly installed lighting source above the conveying device, for illuminating, substantial light is provided for the CCD camera Line, convenient for the CCD camera quickly, accurately capture image to be checked.
The CCD camera and lighting source are each attached in mounting bracket, say that CCD camera and lighting source position are relatively fixed Position provides the light of proper angle and brightness convenient for lighting source.
Screening plant in 6th step includes the bad output mechanism being arranged in conveying device side, described bad Output mechanism corresponding position is provided with defective product box, and the delivery device tip is provided with non-defective unit case.
When detection, the benchmark image in expression face to be measured registered in advance, each expression face to be measured register two in the detection system A benchmark image, respectively one deep intensity reference image and a shallow intensity reference image, after the completion of registration, the input setting flaw Defect amount upper limit value.
The conveying device of promising endless belt conveyer 2 is set in detecting system, and 2 both sides of the endless belt conveyer are provided with detection Device, the detection device are the CCD camera 3 mounted on 2 both sides of endless belt conveyer, and the CCD camera 3 of both sides is respectively used to shoot The printing image of capacitance side and top, 3 top of CCD camera are provided with lighting source 4, and CCD camera 3 and lighting source 4 are logical Cross the fixation of mounting bracket 5,3 downstream of the CCD camera is provided with screening plant, including set up separately 2 both sides of endless belt conveyer not Good output mechanism 6 and defective product box 7, and the non-defective unit case 8 in 2 end of endless belt conveyer is set.
Capacitance 1 to be checked is placed on and is set as on endless belt conveyer 2, under the movement of endless belt conveyer 2,1 quilt of capacitance to be checked Send the image zooming-out that capacitance 1 top and side to be checked are carried out to 3 lower section of CCD camera.
For printing the capacitance appearance images that ink is white, the image to be checked and the deep intensity reference image pair that extract Than only detecting the place whiter than deep intensity reference image, and regard it as flaw, exporting flaw amount, then to be checked by what is extracted Image and shallow intensity reference image comparison, only detect the place more black than shallow intensity reference image, and regard it as flaw, export the flaw Defect amount detects maximum flaw amount after comparison, by being compared with the flaw amount upper limit value of setting, comprehensive judgement is as a result, according to sentencing It is fixed that as a result, defective products can be fallen by bad output mechanism 6 in defective product box 7, non-defective unit then stays on endless belt conveyer 2, send to In the non-defective unit case 8 of end.
The above, only presently preferred embodiments of the present invention, the invention is not limited in the above embodiments, as long as It reaches the technique effect of the present invention with identical means, should all belong to the scope of protection of the present invention.

Claims (6)

1. biradical pseudo-capacitance appearance images detection method, which is characterized in that include the following steps:
The first step:The benchmark image in capacitance shell expression face to be measured is registered, it is each to indicate that deep intensity reference image is registered in face respectively With shallow intensity reference image, setting detection flaw amount upper limit value;
Second step:Sample to be tested is placed on a conveyor, starts detection device and face, which carries out capturing figure to be checked, to be indicated to capacitance Picture;
Third walks:It extracts than the darker part of deep intensity reference image in the image to be checked, and extraction unit is allocated as For flaw, flaw amount is detected;
4th step:Part more shallow than the color of shallow intensity reference image in the image to be checked is extracted, and extraction unit is allocated as For flaw, flaw amount is detected;
5th step:It obtains sample maximum flaw detection values, is compared with flaw amount upper limit value, and provide comprehensive judgement result;
6th step:According to judgement as a result, sample product have sorted storage by screening plant.
2. biradical pseudo-capacitance appearance images detection method according to claim 1, it is characterised in that:Conveying in second step Device is set as endless belt conveyer.
3. biradical pseudo-capacitance appearance images detection method according to claim 1, it is characterised in that:Detection in second step Device includes the CCD camera mounted on conveying device side and top.
4. biradical pseudo-capacitance appearance images detection method according to claim 3, it is characterised in that:In the conveying device Side is fixedly installed lighting source.
5. biradical pseudo-capacitance appearance images detection method according to claim 4, it is characterised in that:The CCD camera and Lighting source is each attached in mounting bracket.
6. biradical pseudo-capacitance appearance images detection method according to claim 1, it is characterised in that:Screening in 6th step Device includes the bad output mechanism being arranged in conveying device side, and the bad output mechanism corresponding position is provided with defective products Case, the delivery device tip are provided with non-defective unit case.
CN201810255942.2A 2018-03-27 2018-03-27 Biradical pseudo-capacitance appearance images detection method Withdrawn CN108459023A (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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CN1732682A (en) * 2002-12-27 2006-02-08 株式会社尼康 Image processing device and image processing program
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