CN208721366U - The defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice - Google Patents
The defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice Download PDFInfo
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Abstract
The utility model discloses the defects detections of photovoltaic solar crystal-silicon battery slice and colour sorting system, including industrial camera, seal box, LED light source, red backlight plate, light source controller, image pick-up card, industrial personal computer, host computer display and silicon slice under test；Described image capture card connects industrial camera, for acquiring the image of silicon slice under test under three kinds of light sources of RGB；The industrial personal computer is shown for controlling light source controller and Image Acquisition, while for data transmission, image procossing and control processing result image；The host computer display is for showing processing result image；Tthe utility model system is used to detect the front appearance defect generated after the printing of photovoltaic solar crystal-silicon battery slice and positive color grade divides, realize Poul Dorset Sheep, reduce fragment rate caused by artificial detection, improve detection quality, effectively reduce production cost, with the features such as detection accuracy height, stability is good.
Description
Technical field
The utility model relates to photovoltaic cell detection technique field, in particular to a kind of photovoltaic solar crystal-silicon battery slice
Defects detection and colour sorting system.
Background technique
With the continuous development of global economy society, energy-consuming also corresponding sustainable growth.Over time, change
The scarcity of the stone energy is more and more obvious.Under the background that fossil energy supply is becoming tight day, large-scale develop and utilize can
The renewable sources of energy have become the important component in following various countries' energy strategy.Solar energy is that the mankind are inexhaustible
Renewable energy, have sufficient spatter property, absolute safety, opposite popularity, certain long-life and maintenance-free feature,
The advantages that adequacy of resource and potential economy, has critical role in long-term energy strategy.The 1970s
Afterwards, domestic solar power generation is worldwide highly valued and makes significant progress.Solar photovoltaic technology
It as an important component of Solar use, and is considered as a kind of 21st century most potential power generation side
Formula.Research is convenient for popular family solar power system for alleviating energy crisis, reduces environmental pollution and reduce
Greenhouse effects have great importance.
Utility model content
The purpose of the utility model is to overcome shortcoming and deficiency in the prior art, provide photovoltaic solar crystal silicon battery
The defects detection and colour sorting system of piece, detect silicon wafer automatically, reduce breakage caused by artificial detection, promote detection
Standard consistency and detection efficiency.
In order to achieve the above object, the utility model adopts the following technical scheme:
The defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice, comprising: industrial camera, seal box, LED
Light source, red backlight plate, light source controller, image pick-up card, industrial personal computer, host computer display, silicon slice under test；The industrial personal computer
Connect light source controller, image pick-up card and host computer display；The LED light source is redgreenblue light source, the light
Source controller connects LED light source, for controlling three kinds of intensities of light source of RGB；Described image capture card connects industrial camera, uses
In the image for acquiring silicon slice under test under three kinds of light sources of RGB；The industrial personal computer is used to control light source controller and Image Acquisition,
It is shown simultaneously for data transmission, image procossing and control processing result image；The host computer display is used for image
Processing result is shown；The light that the seal box is used to that LED light source to be made to issue uniformly is reflected into silicon slice under test；It is described red
Color backlight is used for the background acquired as silicon chip image, so that silicon wafer and background have discrimination, is easy to interested silicon wafer
The extraction in region.
The system is when being used for continuous productive process as a preferred technical solution, also settable transport mechanism unit, movement
Control card and platform cabinet；The transport mechanism unit and seal box are arranged on the platform cabinet；The transport mechanism unit
Including bracket and rack-mount conveyer belt；The motion control card connects the PLC control of the industrial personal computer and continuous productive process
Device processed, the PLC controller connect a servo motor, and the motion control card passes through the PLC controller of continuous productive process and watches
Take the transmission speed that motor indirectly controls conveyer belt.
The industrial camera is arranged at the top of seal box as a preferred technical solution, and the LED light source setting is sealing
The red backlight plate is arranged in the underface in bottom portion and light source is upward, LED light source, and red backlight plate is inserted into be opened on bracket
If card slot；When silicon slice under test by the conveyer belt translatory movement to the surface of red backlight plate when stop, the LED light source
Interval issues three kinds of light of RGB, then the light projection of sending is uniformly reflected on silicon slice under test to sealing chamber interior wall, reaches
Make the more obvious easily distinguishable purpose of the textural characteristics on silicon slice under test, the industrial camera at the top of seal box acquires red green respectively
Image of the blue light according to lower silicon slice under test；By described image capture card by the image transmitting of acquisition to industrial personal computer, the industrial personal computer
Inside installation image processing software, and by the image deflects detection of image processing software progress silicon slice under test and colour sorting
Reason, finally by after image procossing as the result is shown in the host computer display.
The industrial camera uses CMOS black and white industrial camera as a preferred technical solution, and collecting image size is
5120*5120。
The utility model has the following advantages compared with the existing technology and effect:
(1) defects detection and colour sorting system of the photovoltaic solar crystal-silicon battery slice of the utility model are used for detection light
The front appearance defect and positive color grade generated after volt solar energy crystal-silicon battery slice printing divides, and realizes contactless inspection
It surveys, reduces fragment rate caused by artificial detection, improve detection quality, effectively reduce production cost, there is detection essence
The features such as degree is high, and stability is good.
(2) defects detection and colour sorting system of the photovoltaic solar crystal-silicon battery slice of the utility model use black and white work
Industry camera, colored disadvantage are the growths that data volume increase leads to image processing time, and colour is made of redgreenblue, every kind
Color is the image of width separation, and the information content of each image is three times of black white image, and more times is needed to handle,
More spaces are needed to store.Being produced into for equipment is not only reduced compared to colored industrial camera using black and white industrial camera
This, and the image in three channels is directly acquired, reduce the processing step of detection algorithm, improves detection efficiency.
Detailed description of the invention
Fig. 1 is the photovoltaic solar crystal-silicon battery slice automated optical defects detection and colour sorting system knot of the utility model
Structure schematic diagram；
Fig. 2 is the collected photovoltaic solar crystal-silicon battery slice red channel print of the utility model；
Fig. 3 is the photovoltaic solar crystal-silicon battery slice automated optical defects detection and colour sorting system mould of the utility model
Block figure；
Fig. 4 is the defects detection and colour sorting flow chart of the photovoltaic solar crystal-silicon battery slice of the utility model；
It is marked in attached drawing 1: 1, industrial camera；2, seal box；3, LED light source；4, red backlight plate；5, transport mechanism list
Member；6, light source controller；7, image pick-up card；8, industrial personal computer；9, host computer display；10, platform cabinet.
Specific embodiment
In order to which the purpose of this utility model, technical solution and advantage is more clearly understood, below in conjunction with attached drawing and reality
Example is applied, the utility model is described in further detail.It should be appreciated that specific embodiment described herein is only used for solving
Release the utility model, however it is not limited to the utility model.
Embodiment 1
As shown in Figure 1, the defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice, the defects detection and face
Color separation system includes: industrial camera 1, seal box 2, LED light source 3, red backlight plate 4, transport mechanism unit 5, light source control
Device 6, image pick-up card 7, industrial personal computer 8, host computer display 9, silicon slice under test, platform cabinet 10；The transport mechanism unit 5 includes
Bracket and rack-mount conveyer belt；The industrial personal computer 8 includes CPU, display, memory；It, will in the present embodiment 1
Seal box 2 and transport mechanism unit 5 are arranged on platform cabinet 10.
The industrial personal computer 8 connects light source controller 6, image pick-up card 7 and host computer display 9；The LED light source
For redgreenblue light source, the light source controller 6 connects LED light source 3, for controlling three kinds of intensities of light source of RGB；It is described
Image pick-up card 7 connects industrial camera 1, for acquiring the image of silicon slice under test under redgreenblue light source；The industrial personal computer 8 is used
In each controller of control or control card, while being used for data transmission and image procossing；The host computer display 9 is used for image
Processing result is shown；The light that the seal box 2 is used to that LED light source 3 to be made to issue uniformly is reflected into silicon slice under test；It is described
Red backlight plate 4 is used for the background acquired as silicon chip image, so that silicon wafer and background have good discrimination, is easy to feel emerging
The extraction of the area of silicon wafer of interest improves Defect and detects robustness.
The setting of industrial camera 1 is arranged in 2 top of seal box, the LED light source 3 in 2 bottom of seal box and light source court
On, the red backlight plate 4 is arranged in the underface of LED light source 3, and red backlight plate 4 is inserted into the card slot opened up on bracket；When
Silicon slice under test by the conveyer belt translatory movement to the surface of red backlight plate 4 when stop, the interval of LED light source 3 issues
Then the light projection of three kinds of light of RGB, sending is uniformly reflected on silicon slice under test to 2 inner wall of seal box, reaching makes silicon to be measured
The more obvious easily distinguishable purpose of the textural characteristics of on piece, and acquired under RGB illumination respectively using the industrial camera 1
The image of silicon slice under test；By described image capture card 7 by the image transmitting of acquisition to industrial personal computer 8, pacify inside the industrial personal computer 8
Image processing software is filled, and carries out the image deflects detection and colour sorting processing of silicon slice under test by image processing software, then
By after image procossing as the result is shown in the host computer display 9.
It is illustrated in figure 2 the silicon slice under test sample drawing by the collected red channel of black and white industrial camera, sample drawing packet
Plate containing red background and silicon slice under test on a moving belt is placed, is printed with grid line, including main grid and thin grid on silicon slice under test, this
The defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice described in embodiment 1 are mainly for detection of silicon slice under test
The defect and color grade of grid line and the area of silicon wafer in addition to grid line.
As shown in figure 3, the motion control card is also connected with the PLC controller of continuous productive process, the PLC controller connection one
A servo motor, the motion control card indirectly control the biography of conveyer belt by the PLC controller and servo motor of continuous productive process
Send speed.
In the present embodiment 1, the industrial camera uses CMOS black and white industrial camera, and collecting image size is 5120*
5120, under the conditions of identical accuracy and speed, manufacturing cost is advantageously reduced using black and white industrial camera, improves product itself
The market competitiveness.
The industrial personal computer generally selects i7 processor.
The light source controller be digitial controller type, output voltage 12V, control mode require select software and hand
Dynamic, output channel requires to select four tunnels.
Described image capture card, image transmitting format are black white image, it is generally the case that image grayscale grade can be divided into
It 256 grades, i.e., is indicated with 8；Resolution ratio is 5120*5120；Interface type is Gige interface.
The shape of the red backlight plate is inside and outside square, and side length is respectively pros' annular of 100cm and 200cm.
Embodiment 2
As shown in figure 4, the defects detection and color sorting process of photovoltaic solar crystal-silicon battery slice, include the following steps:
S1, acquisition silicon chip image, and pre-processed, specifically acquisition silicon wafer color under RGB light source is grey
Scaling board image, and illumination compensation is carried out to the image, color calibration is carried out to the image after illumination compensation later；It specifically includes
Following step:
S11, the luminous intensity that RGB light source is set by control light source controller；
S12, the scaling board image that color under RGB light source is grey is acquired respectively using industrial camera；
S13, illumination compensation is carried out to the scaling board image by acquiring the black white image of three kinds of colour light sources；
S14, carry out color calibration: the image after acquiring the illumination compensation under three kinds of light sources of different luminous intensities establishes three
Different colored light sources intensity of illumination and image averaging gray-scale relation curve, RGB light source point when obtaining fixed gray value
Other luminous intensity, at the same the black white image to shoot three Color Channels of RGB and by synthesis obtain color image,
Achieve the purpose that color calibration.
S2, defects detection is carried out to silicon chip image, specifically: silicon wafer positioning is carried out to the pretreated image of step S1,
Interested area of silicon wafer is obtained, then every detection is carried out to the area of silicon wafer；Specifically include the following steps:
S21, silicon wafer positioning: Threshold segmentation is carried out to the pretreated image of step S1, specifically to three face of RGB
The gray level image of chrominance channel carries out global threshold, segmented image, merges the region of three Color Channels, after opening operation, then into
Interested area of silicon wafer is obtained after row connected domain analysis；
S22, size detection: after the positioning of step S21 silicon wafer, the parameter setting of dimensional measurement is carried out to product, includes
Distance of the overall dimension and printing grid line of product apart from silicon chip edge；
S23, damage testing: carrying out damage testing after the completion of size detection, and damage testing utilizes red bottom plate and silicon wafer
Tonal range feature carries out threshold segmentation method using different threshold values to red blue channel image respectively and obtains damaged area, so
Closed operation processing is carried out to the damaged area afterwards, and damaged area threshold is set and is screened, obtain product periphery chipping,
Damaged and notch；
S24, grid line extract: carrying out grid line extraction after the completion of damage testing, specifically extract the institute on product surface
There is printing grid line, the position of grid line is obtained by template matching, if template matching score reaches threshold value, and by pre-set
Rectangle frame measurement grid line extract quantity compare judge whether the printing of grid line equal with template number；If template matching point
Number is too small, and explanation can not be matched in the presence of exception, then directly output is as a result, without carrying out subsequent detection；
S25, grid line detection: carrying out grid line detection after the completion of grid line extracts, specifically all on testing product surface
Thin grid line printing quality problem, it is thicker including grid line, attenuate or break, the defect of empty print；The grid line detection passes through preparatory
The rectangle measurement frame set prolongs rectilinear direction to grid line and measures each click-through line width of straight line, and sets corresponding threshold
Value distinguishes grid absolutely, thick grid, thin grid；If exception occurs in grid line detection, display mistake simultaneously marks specific errors present in original image,
Continue following detecting step；
S26, main grid detection: main grid detection is carried out after the completion of grid line detection, whether the main grid for specifically detecting printing is deposited
Undesirable defect is deviated in incomplete or printing；The main grid detection obtains the position of main gate line by template matching, extracts main grid
It compares to obtain possible defect area with the main grid size template of setting, and corresponding threshold value is set and is screened；If main
There is exception in grid detection, shows that error reason simultaneously marks specific errors present in original image, continues following detecting step；
S27, dust detection: carrying out dust detection, the specifically defect on testing product surface after the completion of main grid detection,
Including dirty, impression of the hand and the bad defect of watermark；The dust detection is then right by the grid region that shielding is pre-set
Three color channel images of silicon wafer carry out piecemeal respectively and seek average gray value, set corresponding threshold value by average gray value
Threshold segmentation is carried out to each grid region and obtains defect area, finally defect area is screened to obtain defective locations；If stain
There is exception in detection, shows that error reason simultaneously marks specific errors present in original image, continues following detecting step；
S28, color spot detection: carrying out color spot detection, the specifically color difference on testing product surface after the completion of dust detection,
Including color spot and the bad defect of spot；The grid region that the color spot detection is pre-set by shielding is then to the three of silicon wafer
A color channel image carries out piecemeal along color spot direction respectively and seeks average gray value, by the variation width for comparing average gray value
Degree obtains variation most significantly boundary, and corresponding threshold value is then arranged and is screened, if abnormal, display mistake occurs in color spot detection
Reason simultaneously marks specific errors present in original image；
S29, pass through step S21~step S28, detection obtains the defect area of product surface.
S3, to silicon chip image colour sorting, classification graduation specifically is carried out to the product different colours depth；
Carry out the color histogram of three Color Channels of RGB to the image for each color grade being collected respectively first
The extraction of figure learns, then by the color histogram of acquired image and study to template compare, score is higher, expression
The two is closer, and the color in color histogram is classified as corresponding color grade.
In the defects detection and color sorting process of above-mentioned photovoltaic solar crystal-silicon battery slice, the present embodiment 2 is used
Threshold segmentation, connected domain analysis, template matching, straight line fitting, the knowledge image processing method such as color histogram match.
The defects detection and color sorting process of the photovoltaic solar crystal-silicon battery slice of the utility model pass through hallon13
Version software and vs2015, which are developed jointly, to be realized.
Above-described embodiments merely represent several embodiments of the utility model, the description thereof is more specific and detailed,
But it should not be understood as limiting the scope of the patent of the utility model.It should be pointed out that for the common of this field
For technical staff, without departing from the concept of the premise utility, various modifications and improvements can be made, these all belong to
In the protection scope of the utility model.Therefore, the protection scope of the utility model patent should subject to the claims.
Claims (4)
1. the defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice characterized by comprising industrial camera,
Seal box, LED light source, red backlight plate, light source controller, image pick-up card, industrial personal computer, host computer display and to be measured
Silicon wafer；The industrial personal computer connection light source controller, image pick-up card and host computer display；The LED light source is RGB
Three-color light source, the light source controller connects LED light source, for controlling three kinds of intensities of light source of RGB；Described image capture card
Industrial camera is connected, for acquiring the image of silicon slice under test under three kinds of light sources of RGB；The industrial personal computer is for controlling light source control
Device processed and Image Acquisition, while being shown for data transmission, image procossing and control processing result image；The host computer
Display is for showing processing result image；The light that the seal box is used to that LED light source to be made to issue uniformly is reflected into
On silicon slice under test；The red backlight plate is used for the background acquired as silicon chip image, so that silicon wafer and background have discrimination,
It is easy to the extraction of interested area of silicon wafer.
2. the defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice according to claim 1, feature
It is, the system is when being used for continuous productive process, also settable transport mechanism unit, motion control card and platform cabinet；It is described
Transport mechanism unit and seal box are arranged on the platform cabinet；The transport mechanism unit includes bracket and rack-mount
Conveyer belt；The motion control card connects the PLC controller of the industrial personal computer and continuous productive process, the PLC controller connection
One servo motor, the motion control card indirectly control conveyer belt by the PLC controller and servo motor of continuous productive process
Transmission speed.
3. the defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice according to claim 2, feature
Be, the industrial camera is arranged at the top of seal box, the LED light source setting in seal box bottom and light source upward, LED light
The red backlight plate is arranged in the underface in source, and red backlight plate is inserted into the card slot opened up on bracket；When silicon slice under test by
Stopping when the conveyer belt translatory movement is to the surface of red backlight plate, the LED light source interval issues three kinds of light of RGB,
Then the light projection of sending is uniformly reflected on silicon slice under test to sealing chamber interior wall, reach the textural characteristics made on silicon slice under test
More obvious easily distinguishable purpose, the industrial camera at the top of seal box acquire the figure of silicon slice under test under RGB illumination respectively
Picture；By described image capture card by the image transmitting of acquisition to industrial personal computer, image processing software is installed in the industrial personal computer inside,
And the image deflects detection and colour sorting processing of silicon slice under test are carried out by image processing software, finally by the knot after image procossing
Fruit is shown in the host computer display.
4. the defects detection and colour sorting system of photovoltaic solar crystal-silicon battery slice according to claim 1, feature
It is, the industrial camera uses CMOS black and white industrial camera, and collecting image size is 5120*5120.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109084957A (en) * | 2018-08-31 | 2018-12-25 | 华南理工大学 | The defects detection and color sorting process and its system of photovoltaic solar crystal-silicon battery slice |
| CN111784666A (en) * | 2020-06-30 | 2020-10-16 | 深兰科技(达州)有限公司 | Learning and memory-based LED lamp bead defect detection method |
| CN112611460A (en) * | 2020-11-11 | 2021-04-06 | 西安隆基绿能建筑科技有限公司 | Method and system for determining color quality of photovoltaic product and terminal |
| CN112718555A (en) * | 2020-12-14 | 2021-04-30 | 张家港博佑光电科技有限公司 | Silicon solar cell sorting process test system |
| CN113178508A (en) * | 2021-05-28 | 2021-07-27 | 浙江爱旭太阳能科技有限公司 | Heat treatment method and system for improving acetic acid corrosion resistance of solar cell |
| CN113680710A (en) * | 2021-10-26 | 2021-11-23 | 江苏华兴激光科技有限公司 | Epitaxial wafer detection method and device |
| CN114522891A (en) * | 2022-02-17 | 2022-05-24 | 立川(无锡)半导体设备有限公司 | Silicon wafer sorting machine AOI method |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109084957A (en) * | 2018-08-31 | 2018-12-25 | 华南理工大学 | The defects detection and color sorting process and its system of photovoltaic solar crystal-silicon battery slice |
| CN109084957B (en) * | 2018-08-31 | 2024-03-19 | 华南理工大学 | Defect detection and color sorting method and system for photovoltaic solar crystalline silicon cell |
| CN111784666A (en) * | 2020-06-30 | 2020-10-16 | 深兰科技(达州)有限公司 | Learning and memory-based LED lamp bead defect detection method |
| CN112611460A (en) * | 2020-11-11 | 2021-04-06 | 西安隆基绿能建筑科技有限公司 | Method and system for determining color quality of photovoltaic product and terminal |
| CN112611460B (en) * | 2020-11-11 | 2024-04-05 | 隆基乐叶光伏科技有限公司 | Method, system and terminal for determining color quality of photovoltaic product |
| CN112718555A (en) * | 2020-12-14 | 2021-04-30 | 张家港博佑光电科技有限公司 | Silicon solar cell sorting process test system |
| CN113178508A (en) * | 2021-05-28 | 2021-07-27 | 浙江爱旭太阳能科技有限公司 | Heat treatment method and system for improving acetic acid corrosion resistance of solar cell |
| CN113680710A (en) * | 2021-10-26 | 2021-11-23 | 江苏华兴激光科技有限公司 | Epitaxial wafer detection method and device |
| CN114522891A (en) * | 2022-02-17 | 2022-05-24 | 立川(无锡)半导体设备有限公司 | Silicon wafer sorting machine AOI method |
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