CN112718555A - Silicon solar cell sorting process test system - Google Patents
Silicon solar cell sorting process test system Download PDFInfo
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- CN112718555A CN112718555A CN202011467050.2A CN202011467050A CN112718555A CN 112718555 A CN112718555 A CN 112718555A CN 202011467050 A CN202011467050 A CN 202011467050A CN 112718555 A CN112718555 A CN 112718555A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/38—Collecting or arranging articles in groups
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Abstract
The invention discloses a silicon solar cell sorting process testing system, and particularly relates to the technical field of clean energy monitoring, wherein the testing system comprises a silicon solar cell sorting process testing system S1: establishing a monitoring system and an ECM analysis model; s2: monitoring current and output voltage values; s3: collecting current and output voltage values for analysis and comparison; s4: and when the difference is more than +/-5%, locating a fault point and giving an alarm prompt to a worker. According to the invention, through setting the monitoring system and the ECM analysis model, the monitoring system carries out fault monitoring on electrical elements applied to the photovoltaic power generation equipment, such as fragmentation of a photovoltaic cell panel and aging damage of a photovoltaic array, and the ECM analysis model monitors battery short circuit, battery open circuit, assembly short circuit, assembly open circuit and the like in the photovoltaic power generation equipment, so that fault monitoring and diagnosis are effectively carried out on the electrical elements and electrical transmission nodes of the photovoltaic power generation equipment, and the practicability is good.
Description
Technical Field
The invention relates to the technical field of silicon solar cell sorting, in particular to a silicon solar cell sorting procedure testing system.
Background
The silicon solar cell refers to a solar cell using silicon as a base material, and can be divided into a single crystal silicon solar cell, a polycrystalline silicon solar cell and an amorphous silicon solar cell according to the crystalline form of a silicon material;
the earliest silicon solar cells were due to interest in using silicon for point contact rectifiers, the rectifying properties of sharp metal contacts on various crystals were discovered as early as 1874, and in the early days of radio technology such crystal rectifiers were widely used as detectors in radio receiver equipment, but with the development of thermionic tubes, such crystal rectifiers have been replaced by thermionic tubes, in addition to being used in the ultra high frequency regime, the most typical example of such rectifiers being point contact of tungsten on the silicon surface, which technology has promoted improvements in silicon purity and has made it desirable to understand the properties of silicon even further.
The prior art has the following defects: various defects can be generated in the production and preparation process of the crystalline silicon solar cell, the defects can greatly influence the photoelectric conversion efficiency of the cell, so that the detection and screening of defect pieces are necessary, some defects can be distinguished by manual visual inspection, AOI (automated optical inspection) detection and other methods, however, some internal defects cannot be detected by the methods, the method for detecting the internal defects of the crystalline silicon solar cell by utilizing the electroluminescence principle is increasingly popularized, but the existing EL test system can only realize the offline spot inspection of the cell pieces and components, and is difficult to meet the production requirements.
Disclosure of Invention
In order to overcome the above-mentioned defects in the prior art, embodiments of the present invention provide a silicon solar cell sorting process testing system to solve the above-mentioned problems in the background art.
In order to achieve the purpose, the invention provides the following technical scheme: a silicon solar cell sorting procedure test system comprises the following steps,
s1: the method comprises the following steps that after solar cells are produced, the solar cells are conveyed to testing equipment through a belt, and original images of the solar cells are obtained after cameras at specified positions take pictures;
s2: after the original image is preprocessed, calculating the accurate position coordinates of the battery piece, and then comparing the accurate position coordinates with a set reference position to calculate the real-time pose of the battery piece;
s3: calculating corresponding adjustment quantity of the alignment platform through correction algorithm processing, and controlling the alignment platform to move correspondingly through motor driving, so that the alignment platform moves correspondingly to move and rotate, and the probe device is driven to move correspondingly;
s4: the battery piece enters a probe testing area through a belt, a probe is aligned with a main grid of the battery piece and clamps the main grid, two ends of the probe are connected with a constant-current stabilized voltage supply, the battery piece emits near infrared light, and a defect detection camera right above the battery piece captures the near infrared light to obtain an infrared light emitting image of the battery piece;
s5: and preprocessing the image and further processing the image by a defect detection algorithm to detect whether the battery has defects or not and the defect type, classifying the battery pieces according to the detection result, and placing the battery pieces in corresponding sorting machine material boxes by a manipulator.
Preferably, in step S1: the hardware system of the test equipment comprises two industrial cameras, a lens, a precise alignment platform, a probe device, an electroluminescent power supply, an image acquisition card and a camera bellows.
Preferably, the industrial camera is a CCD camera, the industrial camera is installed at an inlet of the testing equipment and is positioned right above the cell, the real-time pose of the cell is acquired by collecting images, the crystalline silicon solar cell is in a static state during shooting, and an area array black and white camera is adopted to acquire the images.
Preferably, the industrial camera lens is a Basler M0814-MP2 lens, the distance between the battery piece and the lens is S, the image distance between the industrial camera and the lens is S1, the focal length is F, the size of the battery piece is H1, the size of the short side of the image sensor is H2, the magnification ratio M is H1/H2, the calculation is simplified, and the basic equation is as follows:
from the similar triangular relationship, and the above M ═ H1/H2, the following equation can be derived:
the focal length of the BaslerM0814-MP2 lens is calculated to be 8mm through the calculation.
Preferably, the size of the dark box is 400mm x 700mm, the material is an aluminum plate with the thickness of 5mm, and the inner surface of the dark box is coated with black rough substances so as to reduce the influence of visible light.
Preferably, the electroluminescence power supply is a power supply of QJE-PS6010E model, provides a soft on-off adjustable constant current stabilized power supply of 0-l0A and 0-60V, the precision is 0.1A, the image acquisition card is a gigabit network image acquisition card of Intel I350-T4, the network port transmission rate is 100MB/S, the interface is based on a GigE type, the probe device is installed with a parallel platform, the probe device mainly comprises a probe support and probe banks, the probe banks are driven to move up and down by two motors installed on the probe support, each probe bank comprises a plurality of probes, the probes are aligned with the coarse grids of each main grid, and the probes are made of flexible soft metal materials.
Preferably, in step S1: the test equipment software system comprises an image acquisition module, an image processing module, a motion control module, an alignment algorithm module, a communication module and a data processing module.
Preferably, the image acquisition module includes camera initialization, image acquisition and image storage function, the image processing module includes image preprocessing, defect feature extraction and defect detection algorithm function, motion control module includes camera trigger, motor control and light source control function, counterpoint algorithm module includes silicon chip positioning algorithm and platform algorithm function of rectifying, communication module includes motor drive, PLC communication, image acquisition card and light source controller, data processing module includes data processing, data display and data storage function.
The invention has the technical effects and advantages that:
the invention develops an electroluminescence test system for detecting defects in a crystalline silicon solar cell, detects the defects such as grid breakage, hidden cracks, black spots and the like in the production and preparation process of the solar cell, overcomes the defects of the test and sorting indexes of the conventional system, can analyze the places needing to be improved in the production process according to the difference of the defects, optimizes the production process, and simultaneously, in order to improve the detection accuracy and meet the online test requirement, the subject also researches a visual alignment platform, and provides a correction method aiming at platform alignment to meet the online test and production requirement, thereby optimizing the production process and flow of the crystalline silicon solar cell and improving the test and sorting efficiency and accuracy of the cell.
In order to more clearly illustrate the embodiments of the present application or technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present invention, and other drawings can be obtained by those skilled in the art according to the drawings.
FIG. 1 is a general architecture diagram of the software system of the present invention.
Fig. 2 is a general architecture diagram of the hardware system of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention provides a silicon solar cell sorting process test system with reference to the accompanying drawings of the specification 1-2, comprising the following steps,
s1: the method comprises the following steps that after solar cells are produced, the solar cells are conveyed to testing equipment through a belt, and original images of the solar cells are obtained after cameras at specified positions take pictures;
s2: after the original image is preprocessed, calculating the accurate position coordinates of the battery piece, and then comparing the accurate position coordinates with a set reference position to calculate the real-time pose of the battery piece;
s3: calculating corresponding adjustment quantity of the alignment platform through correction algorithm processing, and controlling the alignment platform to move correspondingly through motor driving, so that the alignment platform moves correspondingly to move and rotate, and the probe device is driven to move correspondingly;
s4: the battery piece enters a probe testing area through a belt, a probe is aligned with a main grid of the battery piece and clamps the main grid, two ends of the probe are connected with a constant-current stabilized voltage supply, the battery piece emits near infrared light, and a defect detection camera right above the battery piece captures the near infrared light to obtain an infrared light emitting image of the battery piece;
s5: and preprocessing the image and further processing the image by a defect detection algorithm to detect whether the battery has defects or not and the defect type, classifying the battery pieces according to the detection result, and placing the battery pieces in corresponding sorting machine material boxes by a manipulator.
Further, in the above technical solution, in step S1: the hardware system of the test equipment comprises two industrial cameras, a lens, a precise alignment platform, a probe device, an electroluminescent power supply, an image acquisition card and a camera bellows.
Example 1: the precision alignment platform selects the parallel platform, is the platform that constitutes based on the design philosophy of coplane, has only one deck structure, has three axle as drive unit on the same plane, is not independent between the motion of three direction, reaches anticipated motion effect through the motion of three axle of simultaneous control, is the parallelly connected adjustment platform of coplane, and the simple and quick response ability of structure has been guaranteed in its coplanar design, and has following advantage:
1. the precision is high: the motion of each axis of the parallel platform is not independent, so that the error accumulation of each layer of structure like a serial platform and a parallel platform is avoided, and the parallel platform can be used as an actuating mechanism in a precise visual positioning system of the system;
2. the rigidity is large: the platform consists of a plurality of moving branched chains, the bearing capacity is strong, the structural rigidity is high, the probe device in the system has certain mass, the platform with high rigidity is required to bear, and the stability and the reliability of the system can be ensured;
3. the sports performance is good: each moving branch chain of the parallel platform is controlled by a respective motor, so that the independence of the mechanism is ensured, and the motors can be fixed on the base, thereby reducing the mass of the whole platform, reducing the load and the inertia of the system, and ensuring that the system has good moving performance;
4. the structure is compact: because the parallel platform is on a plane, the occupied space is obviously reduced compared with the serial platform and the parallel platform.
Further, in the technical scheme, the industrial camera is a CCD camera, the industrial camera is installed at an inlet of the testing equipment and is positioned right above the cell, the real-time pose of the cell is acquired by collecting images, the silicon solar cell is in a static state during shooting, and an area array black and white camera is adopted to acquire the images.
Further, in the above technical solution, the industrial camera lens is a Basler M0814-MP2 lens, the distance between the cell and the lens is S, the image distance between the industrial camera and the lens is S1, the focal length is F, the size of the cell is H1, the size of the short side of the image sensor is H2, the magnification M is H1/H2, the calculation is simplified, and the basic equation is:
from the similar triangular relationship, and the above M ═ H1/H2, the following equation can be derived:
the focal length of the BaslerM0814-MP2 lens is calculated to be 8mm through the calculation.
Furthermore, in the above technical solution, the size of the dark box is 400mm x 700mm, the material is an aluminum plate with a thickness of 5mm, and the inner surface of the dark box is coated with black rough substances to reduce the influence of visible light.
Further, in the above technical solution, the electroluminescence power supply is a power supply model QJE-PS6010E, and provides a soft on-off adjustable constant current regulated power supply with a precision of 0.1A in a range of 0-l0A and 0-60V, the image acquisition card is a gigabit network image acquisition card of Intel I350-T4, the network port transmission rate is 100MB/S, the interface is based on GigE type, the probe apparatus is installed with a parallel platform, the probe apparatus mainly comprises a probe support and a probe bar, the probe bar is driven to move up and down by two motors installed on a probe frame, each probe bar comprises a plurality of probes, the probes are aligned with the coarse grids of each main grid, and the probes are made of flexible soft metal materials.
Further, in the above technical solution, in step S1: the test equipment software system comprises an image acquisition module, an image processing module, a motion control module, an alignment algorithm module, a communication module and a data processing module.
Further, in the above technical solution, the image acquisition module includes camera initialization, image acquisition and image storage functions, the image processing module includes image preprocessing, defect feature extraction and defect detection algorithm functions, the motion control module includes camera triggering, motor control and light source control functions, the alignment algorithm module includes silicon wafer positioning algorithm and platform rectification algorithm functions, the communication module includes a motor driver, PLC communication, an image acquisition card and a light source controller, and the data processing module includes data processing, data display and data storage functions.
Example 2:
1. an image acquisition module: the two industrial cameras are used for silicon wafer positioning and defect detection respectively, and the collection of high-quality images is the primary premise of two functions, and the collection of images needs devices such as a light source and a camera to work together, so that an image collection module needs to be responsible for the initialization of the industrial cameras, the adjustment and setting of parameters such as a camera frame rate, an exposure value, a trigger mode and the like, and a simple and effective image storage mechanism needs to be established after the images are collected;
2. an image processing module: the image processing is the core content of a visual system of the testing equipment and comprises image preprocessing, camera calibration, defect feature extraction and defect detection, wherein the image preprocessing comprises preprocessing for acquiring images by a plate feeding machine and preprocessing for acquiring images by an electroluminescence defect detection camera, the camera calibration part is used for calculating internal and external parameters of the camera and unifying the camera and a world coordinate system, and the defect feature extraction and detection are used for detecting internal defects of the battery plate by using a plurality of algorithms;
3. a motion control module: the detection process of the test equipment relates to the transmission of the crystalline silicon solar cell on a belt, the motion of an alignment platform, the up-and-down movement of a probe energy device and the like and light source control, the module aims to effectively execute the motions, the key point of the module is motor drive control, on one hand, a motor is controlled to drive the belt to transport the cell, and more importantly, a drive motor of the motion platform is controlled to finish the deviation correction of the platform and finish the precise visual alignment;
4. and an alignment algorithm module: the module comprises a silicon wafer positioning algorithm, namely a method for finally determining the accurate position of a battery piece after the battery piece is subjected to image acquisition by a plate feeding machine, and a platform deviation correction algorithm, which is the core content of a visual alignment system, and finally realizes the precise alignment of the platform by analyzing the platform and combining machine vision and image processing;
5. a communication module: the automatic system needs each part to establish effective communication, the communication module mainly has the function of establishing a synchronous protocol among different devices to achieve the purpose of coordinating production, and the communication module establishes the connection among a camera, a driving motor, an image acquisition card, a light source controller and an industrial personal computer through a PLC (programmable logic controller) to realize the control of the devices;
6. a data processing module: the test equipment is long-term real-time test equipment, the system classifies the crystalline silicon solar cells according to defects through EL test, a large amount of data can appear in the whole process, how to efficiently manage the data is an important aspect for embodying system intellectualization, the module comprises data processing, data storage and data display, data such as machine parameters and the like are processed in a text file mode, data and signals obtained in real time are accessed in an array variable mode, and data generated by test results are stored in a database so as to be classified and processed at a later period.
Example 3: the results of the black spot, grid breakage and subfissure detection on the cell are shown in the following table:
as can be seen from the table, the accuracy rate of the judgment of the existence of the defects is 99%, and the accuracy rate of the detection algorithm is high.
The points to be finally explained are: first, in the description of the present application, it should be noted that, unless otherwise specified and limited, the terms "mounted," "connected," and "connected" should be understood broadly, and may be a mechanical connection or an electrical connection, or a communication between two elements, and may be a direct connection, and "upper," "lower," "left," and "right" are only used to indicate a relative positional relationship, and when the absolute position of the object to be described is changed, the relative positional relationship may be changed;
secondly, the method comprises the following steps: in the drawings of the disclosed embodiments of the invention, only the structures related to the disclosed embodiments are referred to, other structures can refer to common designs, and the same embodiment and different embodiments of the invention can be combined with each other without conflict;
and finally: the above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that are within the spirit and principle of the present invention are intended to be included in the scope of the present invention.
Claims (8)
1. The utility model provides a silicon solar cell selects separately process test system which characterized in that: comprises the following steps of (a) carrying out,
s1: the method comprises the following steps that after solar cells are produced, the solar cells are conveyed to testing equipment through a belt, and original images of the solar cells are obtained after cameras at specified positions take pictures;
s2: after the original image is preprocessed, calculating the accurate position coordinates of the battery piece, and then comparing the accurate position coordinates with a set reference position to calculate the real-time pose of the battery piece;
s3: calculating corresponding adjustment quantity of the alignment platform through correction algorithm processing, and controlling the alignment platform to move correspondingly through motor driving, so that the alignment platform moves correspondingly to move and rotate, and the probe device is driven to move correspondingly;
s4: the battery piece enters a probe testing area through a belt, a probe is aligned with a main grid of the battery piece and clamps the main grid, two ends of the probe are connected with a constant-current stabilized voltage supply, the battery piece emits near infrared light, and a defect detection camera right above the battery piece captures the near infrared light to obtain an infrared light emitting image of the battery piece;
s5: and preprocessing the image and further processing the image by a defect detection algorithm to detect whether the battery has defects or not and the defect type, classifying the battery pieces according to the detection result, and placing the battery pieces in corresponding sorting machine material boxes by a manipulator.
2. The silicon solar cell sorting process testing system of claim 1, wherein: in the step S1: the hardware system of the test equipment comprises two industrial cameras, a lens, a precise alignment platform, a probe device, an electroluminescent power supply, an image acquisition card and a camera bellows.
3. The silicon solar cell sorting process testing system of claim 2, wherein: the industrial camera is a CCD (charge coupled device) camera, is arranged at an inlet of the testing equipment and is positioned right above the cell, the real-time pose of the cell is acquired by acquiring images, the crystalline silicon solar cell is in a static state during shooting, and the images are acquired by adopting an area array black and white camera.
4. The silicon solar cell sorting process testing system of claim 3, wherein: the industrial camera lens adopts a Basler M0814-MP2 lens, the distance between a battery piece and the lens is S, the image distance between the industrial camera and the lens is S1, the focal length is F, the size of the battery piece is H1, the size of the short side of an image sensor is H2, the magnification ratio M is H1/H2, the calculation is simplified, and the basic equation is as follows:
from the similar triangular relationship, and the above M ═ H1/H2, the following equation can be derived:
the focal length of the BaslerM0814-MP2 lens is calculated to be 8mm through the calculation.
5. The silicon solar cell sorting process testing system of claim 2, wherein: the size of the dark box is 400mm 700mm, the material is an aluminum plate with the thickness of 5mm, and black rough substances are smeared on the inner surface of the dark box so as to reduce the influence of visible light.
6. The silicon solar cell sorting process testing system of claim 2, wherein: the electroluminescence power supply is a power supply of QJE-PS6010E model, provides a soft on-off adjustable constant current stabilized power supply with the accuracy of 0.1A in the range of 0-l0A and 0-60V, the image acquisition card is a gigabit network image acquisition card of Intel I350-T4, the network port transmission rate is 100MB/S, the interface is based on a GigE type, the probe device is installed with a parallel platform, the probe device mainly comprises a probe support and probe rows, the probe rows are driven to move up and down by two motors installed on the probe support, each probe row comprises a plurality of probes, the probes are aligned with the coarse grids of each main grid, and the probes are made of flexible soft metal materials.
7. The silicon solar cell sorting process testing system of claim 1, wherein: in the step S1: the test equipment software system comprises an image acquisition module, an image processing module, a motion control module, an alignment algorithm module, a communication module and a data processing module.
8. The silicon solar cell sorting process testing system of claim 7, wherein: the image acquisition module includes camera initialization, image acquisition and image storage function, the image processing module includes image preprocessing, defect feature extraction and defect detection algorithm function, motion control module includes camera trigger, motor control and light source control function, counterpoint algorithm module includes silicon chip positioning algorithm and platform algorithm function of rectifying a deviation, communication module includes motor drive, PLC communication, image acquisition card and light source controller, data processing module includes data processing, data display and data storage function.
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Application publication date: 20210430 |