CN108400786A - ADC typical statics parameter test device based on Current integrating method and method - Google Patents
ADC typical statics parameter test device based on Current integrating method and method Download PDFInfo
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- CN108400786A CN108400786A CN201810060658.XA CN201810060658A CN108400786A CN 108400786 A CN108400786 A CN 108400786A CN 201810060658 A CN201810060658 A CN 201810060658A CN 108400786 A CN108400786 A CN 108400786A
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- precision
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- adc
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- parameter test
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/109—Measuring or testing for dc performance, i.e. static testing
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- Theoretical Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a kind of ADC typical statics parameter test device and method based on Current integrating method, including simulation signal generator, polypropylene capacitor and signal pickup assembly：The simulation signal generator provides high-precision input current；The polypropylene capacitor carries out current integration to the high-precision input current, converts the high-precision input current to high-precision ramp voltage, and the high-precision ramp voltage is inputted to the input end of analog signal of measured device；The signal pickup assembly acquires the output signal of the measured device, and carries out analysis to the output signal and calculate to obtain test result.The present invention realizes the test of high-precision adc typical static parameter using Current integrating method by the superperformance of polypropylene capactive, and this method is relatively low to the hardware requirement of test equipment, has very strong application value.
Description
Technical field
The present invention relates to testing fields, particularly relate to a kind of ADC typical static parameter testings dress based on Current integrating method
It sets and method.
Background technology
The dominant static parameter index of ADC (analog-digital converter) include differential nonlinearity (DNL), integral nonlinearity (INL),
Offset error and full scale gain error etc..It is to the input of ADC for the basic skills that the static parameter of ADC is tested
One ideal signal of end input, generally use high-precision A WG (arbitrary waveform generator) are generated, and then by DCI, (number is caught
Catch instrument) analysis is acquired to the transformed data of ADC, finally by test result specifically is calculated.
Test for high-precision ADC needs test equipment to provide high-precision voltage signal.However in the prior art
Many test equipments can not provide high-precision voltage signal, cause device that can not test.
Invention content
In view of this, it is an object of the invention to propose a kind of ADC typical static parameter testings based on Current integrating method
Apparatus and method provide test of the high-precision voltage signal completion to ADC static parameters.
Based on a kind of above-mentioned purpose ADC typical static parameter test devices based on Current integrating method provided by the invention,
Including simulation signal generator, polypropylene capacitor and signal pickup assembly：
The simulation signal generator provides high-precision input current；
The polypropylene capacitor carries out current integration to the high-precision input current, by the high-precision input current
It is converted into high-precision ramp voltage, and the high-precision ramp voltage is inputted to the input end of analog signal of measured device；
The signal pickup assembly acquires the output signal of the measured device, and carries out analysis meter to the output signal
It calculates to obtain test result.
Preferably, the first buffer stock is connected between the polypropylene capacitor and the input end of analog signal of measured device
Device.
Preferably, further include reference voltage source, the reference voltage source is used for defeated to the reference voltage of the measured device
Enter to hold input reference voltage.
Preferably, the second buffering of connection is posted between the reference voltage source and the reference voltage input terminal of the measured device
Storage.
Preferably, filter is connected between second buffer and the reference voltage input terminal of the measured device.
Preferably, the model OPA627 of first buffer register and the second buffer register.
A kind of ADC typical static parameter test methods based on Current integrating method, using described based on Current integrating method
ADC typical static parameter test devices, the method includes：
High-precision input current is provided by the simulation signal generator；
Current integration is carried out to the high-precision input current using the polypropylene capacitor, the high-precision is inputted
Electric current is converted into high-precision ramp voltage, and inputs the high-precision ramp voltage to the input end of analog signal of measured device；
The output signal of the measured device is acquired using the signal pickup assembly, and the output signal is divided
Analysis calculates.
From the above it can be seen that a kind of ADC typical static parameters based on Current integrating method provided by the invention are surveyed
It is electrically static to realize high-precision adc by means of the superperformance of polypropylene capactive using Current integrating method for examination apparatus and method
Parameter testing；The apparatus and method are abandoned using the voltage of precision not easy to control as the input source of analog signal, but will be easy
High-precision ramp voltage is converted by polypropylene capactive in the electric current of control accuracy, it is high so as to be realized on conventional equipment
The static parameter test of Precision A/D C；Device structure is simple used by the apparatus and method, and hardware cost is relatively low, is suitable for big
Most tester tables, easy to spread and use.
Description of the drawings
Fig. 1 is a kind of test block of the ADC typical static parameter test devices based on Current integrating method of the embodiment of the present invention
Figure；
Fig. 2 is that a kind of circuit of ADC typical static parameter test devices based on Current integrating method of the embodiment of the present invention connects
Map interlinking；
Fig. 3 is a kind of test stream of the ADC typical static parameter test methods based on Current integrating method of the embodiment of the present invention
Cheng Tu.
Specific implementation mode
To make the objectives, technical solutions, and advantages of the present invention clearer, below in conjunction with specific embodiment, and reference
Attached drawing, the present invention is described in more detail.
It should be noted that all statements for using " first " and " second " are for differentiation two in the embodiment of the present invention
The non-equal entity of a same names or non-equal parameter, it is seen that " first " " second " only for the convenience of statement, does not answer
It is interpreted as the restriction to the embodiment of the present invention, subsequent embodiment no longer illustrates this one by one.
For test equipment, the precision controlling to voltage will be far easy to the precision controlling of electric current.Therefore the present invention
Inventor after carefully studying, it was found that polypropylene capactive has relative to conventional capacitive at the linear aspect of current integration very big
Advantage.
Polypropylene capactive is after being overlapped it from both ends with polypropylene film, to be wound into cylinder using metal foil as electrode
The capacitor of shape.Such capacitance is nonpolarity, relative to using X5R capacitances for the conventional capacitive of representative, insulation impedance higher,
Frequency characteristic is excellent, and dielectric loss is much lower, therefore its capacitance is hardly influenced by terminal voltage.
And for most capacitances, if its capacitance C is fixed, electricity between the electricity Q and end of capacitor storage
Pressure U has following relational expression：
The electric current i of capacitance is flowed through with the electricity Q of its storage just like lower integral relational expression：
Q=∫ idt (2)
From (1) and (2)：
From above-mentioned formula it can be seen that：Voltage is proportional with the current integration for flowing through capacitance between capacitor end.This hair
Bright inventor has found in the course of the study：If charged to capacitor with the electric current of a constant high-precision low noise,
If the capacitor specific characteristics are good, such as polypropylene capactive, then the excellent high-precision of a linearity can be obtained at capacitor both ends
Ramp voltage.
Therefore, the present inventor is excellent in terms of current integration is linear relative to conventional capacitive based on polypropylene capactive
Polypropylene capactive is applied to testing field, is especially applied in the test for ADC typical static parameters by gesture, invention
A kind of ADC typical statics parameter test device and method based on Current integrating method.
Attached drawing 1 is a kind of test of the ADC typical static parameter test devices based on Current integrating method of the embodiment of the present invention
Block diagram.The embodiment of the invention discloses a kind of ADC typical static parameter test devices based on Current integrating method, including simulation letter
Number source 3, polypropylene capacitor 2 and signal pickup assembly 4.Wherein, the simulation signal generator 3 provides high-precision for the test device
Spend input current；The polypropylene capacitor 2 carries out current integration to the high-precision input current, and the high-precision is inputted
Electric current is converted into high-precision ramp voltage；Later, the high-precision ramp voltage of generation is entered the simulation letter of measured device 1
Number input terminal；The signal pickup assembly 4 acquires the output signal of the measured device 1, and divides the output signal
Analysis calculates, and finally obtains test result.
Attached drawing 2 is a kind of circuit of the ADC typical static parameter test devices based on Current integrating method of the embodiment of the present invention
Connection figure.In the ADC typical static parameter test devices based on Current integrating method described in the embodiment of the present invention, described poly- third
Alkene capacitor 2 is set between the simulation signal generator 3 and the input end of analog signal of the measured device 1, and being used for will be described
The electric current for the constant high-precision low noise that simulation signal generator 3 provides carries out current integration, and is converted into high-precision ramp voltage.It
The high-precision ramp voltage is input into the measured device 1 afterwards, is tested.The signal pickup assembly 4 and the quilt
It surveys device 1 to connect, the output signal for acquiring the measured device 1, and analysis calculating is carried out to the output signal, finally
Obtain test result.
Preferably, the simulation signal generator is the SPU100 port modules of test system, the SPU100 of the test equipment
Port module is capable of providing the electric current of constant high-precision low noise.
In one embodiment of the invention, the input end of analog signal of the polypropylene capacitor 2 and measured device 1 it
Between connect the first buffer register 5.First buffer register 5 avoids the integral electricity of polypropylene capactive 2 for electric current to be isolated
Pressure is influenced by load end measured device 1, to ensure the accurate of ramp voltage that the input terminal of measured device 1 is inputted
Property.
In another embodiment of the present invention, the ADC typical static parameter test devices based on Current integrating method
Further include reference voltage source 6, the reference voltage source 6 is used for the reference voltage input terminal VREF inputs to the measured device 1
Reference voltage.Wherein, the reference voltage source is the ports APU12 of test system.
Preferably, the second buffering of connection between the reference voltage source 6 and the reference voltage input terminal of the measured device 1
Register 7.
Preferably, the model OPA627 of first buffer register, 5 and second buffer register 7.
In another embodiment of the present invention, second buffer 7 and the reference voltage of the measured device 1 input
Filter 8 is connected between end.Second buffer register 7 is used to improve the reference voltage of the test equipment with filter 8
The precision for the reference voltage that source provides.
Optionally, the ADC that the measured device 1 is one 14.
On the other hand, the present invention also provides a kind of ADC typical static parameter test methods based on Current integrating method.It should
Method applies the ADC typical static parameter test devices based on Current integrating method as described in above-described embodiment, to realize
State the ADC typical static parameter test methods based on Current integrating method.
With reference to shown in attached drawing 3, the embodiment of the invention discloses a kind of, and the ADC typical static parameters based on Current integrating method are surveyed
Method for testing includes the following steps：
S1：High-precision input current is provided by the simulation signal generator；
S2：Current integration is carried out to the high-precision input current using the polypropylene capacitor, by the high-precision
Input current is converted into high-precision ramp voltage, and inputs the high-precision slope electricity to the input end of analog signal of measured device
Pressure；
S3：Acquire the output signal of the measured device using the signal pickup assembly, and to the output signal into
Row analysis calculates.
A kind of ADC typical statics parameter test device and method based on Current integrating method of the present invention, by means of
The superperformance of polypropylene capactive realizes the electrical static parameter test of high-precision adc using Current integrating method；The device and side
Method is abandoned using the voltage of precision not easy to control as the input source of analog signal, but the electric current for being readily able to control accuracy passes through
Polypropylene capactive is converted into input source of the high-precision ramp voltage as analog signal, so as to real in common test equipment
The static parameter test of existing high-precision adc；Device structure is simple used by the apparatus and method, and hardware cost is relatively low, is applicable in
In most of tester table, easy to spread and use.
Those of ordinary skills in the art should understand that：The discussion of any of the above embodiment is exemplary only, not
It is intended to imply that the scope of the present disclosure (including claim) is limited to these examples；Under the thinking of the present invention, above example
Or can also be combined between the technical characteristic in different embodiments, step can be realized with random order, and be existed such as
Many other variations of the different aspect of the upper present invention, for simplicity, they are not provided in details.
The embodiment of the present invention be intended to cover fall within the broad range of appended claims it is all it is such replace,
Modifications and variations.Therefore, all within the spirits and principles of the present invention, any omission, modification, equivalent replacement, the improvement made
Deng should all be included in the protection scope of the present invention.
Claims (7)
1. a kind of ADC typical static parameter test devices based on Current integrating method, which is characterized in that including simulation signal generator,
Polypropylene capacitor and signal pickup assembly：
The simulation signal generator provides high-precision input current；
The polypropylene capacitor carries out current integration to the high-precision input current, and the high-precision input current is converted
For high-precision ramp voltage, and the high-precision ramp voltage is inputted to the input end of analog signal of measured device；
The signal pickup assembly acquires the output signal of the measured device, and to the output signal carry out analysis calculate with
Obtain test result.
2. the ADC typical static parameter test devices according to claim 1 based on Current integrating method, which is characterized in that
The first buffer register is connected between the polypropylene capacitor and the input end of analog signal of measured device.
3. the ADC typical static parameter test devices according to claim 2 based on Current integrating method, which is characterized in that
Further include reference voltage source, the reference voltage source is used to input with reference to electricity to the reference voltage input terminal of the measured device
Pressure.
4. the ADC typical static parameter test devices according to claim 3 based on Current integrating method, which is characterized in that
The second buffer register is connected between the reference voltage source and the reference voltage input terminal of the measured device.
5. the ADC typical static parameter test devices according to claim 4 based on Current integrating method, which is characterized in that
Filter is connected between second buffer and the reference voltage input terminal of the measured device.
6. the ADC typical static parameter test devices according to claim 5 based on Current integrating method, which is characterized in that
The model OPA627 of first buffer register and the second buffer register.
7. a kind of ADC typical static parameter test methods based on Current integrating method, which is characterized in that using such as claim 1-
The ADC typical static parameter test devices based on Current integrating method described in 6 any one, the method includes：
High-precision input current is provided by the simulation signal generator；
Current integration is carried out to the high-precision input current using the polypropylene capacitor, by the high-precision input current
It is converted into high-precision ramp voltage, and the high-precision ramp voltage is inputted to the input end of analog signal of measured device；
The output signal of the measured device is acquired using the signal pickup assembly, and analysis meter is carried out to the output signal
It calculates, obtains test result.
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| CN201810060658.XA CN108400786A (en) | 2018-01-22 | 2018-01-22 | ADC typical statics parameter test device based on Current integrating method and method |
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|---|---|---|---|
| CN201810060658.XA CN108400786A (en) | 2018-01-22 | 2018-01-22 | ADC typical statics parameter test device based on Current integrating method and method |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102723950A (en) * | 2012-07-03 | 2012-10-10 | 航天科工防御技术研究试验中心 | Test adapter and test method for analog-to-digital converter nonlinear parameters |
| CN103163435A (en) * | 2013-03-15 | 2013-06-19 | 上海华力微电子有限公司 | Wafer acceptance test (WAT) breakdown voltage test device and method |
| CN106257838A (en) * | 2015-06-22 | 2016-12-28 | 飞思卡尔半导体公司 | Ramp generator and the method being used for testing A/D converter |
| CN107228986A (en) * | 2017-06-20 | 2017-10-03 | 上海华力微电子有限公司 | A kind of capacitor mismatch detection circuit and method |
-
2018
- 2018-01-22 CN CN201810060658.XA patent/CN108400786A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102723950A (en) * | 2012-07-03 | 2012-10-10 | 航天科工防御技术研究试验中心 | Test adapter and test method for analog-to-digital converter nonlinear parameters |
| CN103163435A (en) * | 2013-03-15 | 2013-06-19 | 上海华力微电子有限公司 | Wafer acceptance test (WAT) breakdown voltage test device and method |
| CN106257838A (en) * | 2015-06-22 | 2016-12-28 | 飞思卡尔半导体公司 | Ramp generator and the method being used for testing A/D converter |
| CN107228986A (en) * | 2017-06-20 | 2017-10-03 | 上海华力微电子有限公司 | A kind of capacitor mismatch detection circuit and method |
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