CN110244112A - A kind of measuring device and measuring method of time domain dielectric material polarization transient state - Google Patents
A kind of measuring device and measuring method of time domain dielectric material polarization transient state Download PDFInfo
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- 239000003989 dielectric material Substances 0.000 title claims abstract description 202
- 230000010287 polarization Effects 0.000 title claims abstract description 180
- 230000001052 transient effect Effects 0.000 title claims abstract description 43
- 238000000034 method Methods 0.000 title claims description 28
- 238000012360 testing method Methods 0.000 claims abstract description 123
- 239000003990 capacitor Substances 0.000 claims abstract description 93
- 238000013480 data collection Methods 0.000 claims abstract description 53
- 238000005259 measurement Methods 0.000 claims abstract description 41
- 238000000691 measurement method Methods 0.000 claims abstract description 38
- 230000008859 change Effects 0.000 claims abstract description 21
- 239000000203 mixture Substances 0.000 claims abstract description 12
- -1 resistance R0 Substances 0.000 claims abstract description 7
- 230000002999 depolarising effect Effects 0.000 claims description 38
- 230000008569 process Effects 0.000 claims description 20
- 239000000463 material Substances 0.000 claims description 13
- 230000005611 electricity Effects 0.000 claims description 12
- 230000028161 membrane depolarization Effects 0.000 claims description 6
- 239000002305 electric material Substances 0.000 claims description 5
- 210000001367 artery Anatomy 0.000 claims description 4
- 238000005070 sampling Methods 0.000 claims description 4
- 210000003462 vein Anatomy 0.000 claims description 4
- 229920006395 saturated elastomer Polymers 0.000 claims description 3
- 238000011160 research Methods 0.000 abstract 1
- 229920006254 polymer film Polymers 0.000 description 18
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 239000012141 concentrate Substances 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005621 ferroelectricity Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/08—Measuring current density
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
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Abstract
The present invention provides a kind of measuring device of time domain dielectric material polarization transient state, including sample circuit, the data acquisition unit for providing driving pulse voltage to the signal output system of sample circuit and for acquiring sample circuit data；Sample circuit is by test dielectric material, resistance R0, capacitor C1、C2And C3And three switch connection compositions；The data acquisition unit includes four and measures resistance R respectively0Both end voltage and capacitor C1、C2And C3The data collection system of both end voltage is realized by measuring resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, come calculate test dielectric material polarization intensity change with time, with one-shot measurement obtain in time domain test dielectric material polarization transient state.The present invention also provides a kind of measurement methods of time domain dielectric material polarization transient state.When the present invention can be realized field width up to the polarization transient states more than ten orders of magnitude one-shot measurement, thus quickly and effectively research dielectric material electrical properties.
Description
Technical field
The present invention relates to a kind of measuring device and measuring method of time domain dielectric material polarization transient state.
Background technique
Dielectric material has a wide range of applications in field of electronic devices.The electrical properties of dielectric material are to influence dielectric material
Using an important factor for.The electrical properties for studying dielectric material can be by measuring the dielectric constant of dielectric material frequently in a frequency domain
Spectrum and the polarization current for measuring dielectric material in the time domain change with time.For linear dielectric material, in frequency domain
Data and time domain in data can be converted mutually by Fourier transformation.Measurement in a frequency domain, needs system each
Fixed frequency could start to measure respectively after reaching stable state, and the time required for the measurement especially for low frequency is longer.In time domain
In Measurement principle on all data can be obtained by one-shot measurement.Therefore, the measurement phase in the measurement and frequency domain in time domain
Than advantageously.In general, the electrical properties for measuring dielectric material in the time domain are by measuring sample under driving pulse voltage
Polarization current changes with time.However, the polarization current of dielectric material under the electric field change with time generally follow it is pervasive
Law, that is, polarization current is in power function decaying at any time, and varied number grade is up to ten or more.The dynamic change model of polarization current
Enclose it is too big so that one-shot measurement polarization current changes with time and is difficult to realize in wide time domain.Currently, still without commercial instrument
It polarization current can change with time in the wide time domain of one-shot measurement.
Sayer-Tower circuit is the typical circuit for measuring ferroelectric materials electric hysteresis loop wire.In Sayer-Tower circuit,
Test sample and a standard capacitance series connection, by the voltage at measurement standard capacitor both ends, obtain the quantity of electric charge in circuit, thus
Calculate the polarization intensity of sample.In general, the variation range of the polarization intensity of dielectric material in the time domain does not polarize electricity
The variation range of stream is big.Therefore, it can be changed with time by polarization intensity in the wide time domain of one-shot measurement, it is then strong to polarizing
Degree takes differential to obtain polarization current.Measurement for Long time scale is general to be measured using the electrometer with high input impedance
The RC constant that the voltage at standard capacitance both ends, the input impedance of electrometer and the product of standard capacitance are constituted need to be more than time of measuring
Self discharge greatly to prevent capacitor.However, the commercial electrostatic meter with high input impedance generally has the longer rise time, because
This is not capable of measuring the signal of short time range.Similarly, it is inadequate to typically enter impedance for the data acquisition unit with high sampling rate
Height can occur self discharge in Long time scale measurement capacitor, therefore not be capable of measuring the signal of Long time scale.
Summary of the invention
It is an object of the invention to overcome shortcoming and deficiency in the prior art, a kind of time domain dielectric material polarization is provided
The measuring device and measuring method of transient state, when can be realized field width up to the polarization transient states more than ten orders of magnitude one-shot measurement,
Such as from 10-8S to 103S, to quickly and to effectively study the electrical properties of dielectric material.Further, the present invention can measure
Ferroelectric material polarization intensity in Polarization Reversal Process changes with time.
In order to achieve the above object, the technical scheme is that: a kind of time domain dielectric material pole
Change the measuring device of transient state, it is characterised in that: including sample circuit, for providing driving pulse voltage to the signal of sample circuit
Output system and data acquisition unit for acquiring sample circuit data；
The sample circuit is by test dielectric material, resistance R0, capacitor C1、C2And C3And three switch connection compositions；
The data acquisition unit includes four and measures resistance R respectively0Both end voltage and capacitor C1、C2And C3The data of both end voltage
Acquisition system is realized by measuring resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, come calculate survey
Examination dielectric material polarization intensity changes with time, and the polarization transient state that dielectric material is tested in time domain is obtained with one-shot measurement.
The signal output system includes sequentially connected computer, data collecting card one and voltage amplifier；The electricity
Pressure amplifier is connect with sample circuit.
The sample circuit is by test dielectric material, resistance R0, capacitor C1、C2And C3And three switch connection compositions are
Refer to: test dielectric material, resistance R0And capacitor C1、C2And C3It is in parallel with signal output system after series connection；Wherein, resistance R0, electricity
Hold C1And C2It is connected respectively with three switches.
Measure resistance R0The data collection system of both end voltage, which is connected by ondograph with computer, to be formed, and has sampling
Rate is high, the high feature of input impedance.
Measure capacitor C1And C2The data collection system of both end voltage is respectively by preamplifier, data collecting card two and meter
Calculation machine connection composition, and it is respectively provided with input impedance R1And R2；With sample rate height, the lower feature of input impedance；
Measure capacitor C3The data collection system of both end voltage connects group with computer by electrometer, data collecting card three
At, and there is input impedance R3, have sample rate lower, high resolution, the high feature of input impedance.
A kind of measurement method of time domain dielectric material polarization transient state, it is characterised in that: dielectric material, resistance will be tested
R0, capacitor C1、C2And C3And three switch connection composition sample circuits；It is arranged and uses circuit and be used to provide driving pulse
Data acquisition unit of the voltage to the signal output system of sample circuit and for acquiring sample circuit data；The data acquisition
Unit includes four and measures resistance R respectively0Both end voltage and capacitor C1、C2And C3The data collection system of both end voltage；
The first measurement method are as follows: when signal output system applies pulse, survey calculation obtains test dielectric material polarization
Intensity changes with time, and realizes that one-shot measurement obtains the polarization transient state of dielectric material in the time domain；
Or second of measurement method are as follows: signal output system applies pulse and withdraws after one section of waiting time first
The pulse voltage of signal output system, survey calculation obtain test dielectric material depolarising intensity and change with time, and realize one
Secondary measurement obtains the depolarising transient state of dielectric material in the time domain；
Or the third measurement method are as follows: signal output system, which applies a negative pulse, first makes the pole for testing dielectric material
Change state and be inverted to negative saturated mode, after one section of waiting time, applying first positive pulse is inverted to test dielectric material
Positive polarization state, survey calculation obtain test dielectric material polarization intensity and change with time；Then signal output system is withdrawn
Pulse voltage, after one section of waiting time, signal output system apply second positive pulse be inverted to dielectric material just
Polarization state, second positive pulse and first positive pulse voltage having the same, survey calculation obtains under second positive pulse
It changes with time to test dielectric material polarization intensity；
In same time period, the polarization intensity that survey calculation under first positive pulse obtains test dielectric material is subtracted
Survey calculation obtains the polarization intensity of test dielectric material under second positive pulse, then obtains test dielectric material in polarization reversal
Polarization intensity changes with time in the process, and realization obtains polarization wink of the dielectric material in Polarization Reversal Process in the time domain
State；Second of measurement method dielectric material is ferroelectric material.
Survey calculation obtains test dielectric material polarization intensity/depolarising intensity and changes with time and refer to: by three
The period that switch is closed respectively measures resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, with calculate
Polarization intensity/depolarising intensity changes with time test dielectric material in the time domain.
Specifically includes the following steps:
The first step, when calculating the polarization intensity value of test dielectric material, after connecting data collecting card one by computer
Voltage amplifier is accessed again as signal output system, applies pulse voltage to sample circuit；
When calculating the depolarising intensity value of test dielectric material, accessed again after connecting data collecting card one by computer
Voltage amplifier applies pulse voltage as signal output system, to sample circuit；After one section of waiting time, pulse is withdrawn
Voltage；
Second step, three switches are respectively in t0、t1And t2When moment closes, four data collection systems measure resistance simultaneously
R0Both end voltage and capacitor C1、C2And C3Both end voltage:
(1) in t < t0In time, polarization intensity value/depolarising intensity value of dielectric material is tested are as follows:
Wherein, URResistance R is measured for data collection system0The voltage at both ends, A are the effective area for testing dielectric material；
(2) pass through t0After moment, resistance R is connected0Switch close, three data collection systems measure capacitor C respectively1、C2
And C3Both end voltage；
In t0≤t<t1In time, polarization intensity value/depolarising intensity value of dielectric material is tested are as follows:
Wherein, U1Capacitor C is measured for data collection system1The voltage at both ends, A are the effective area for testing dielectric material；
(3) pass through t1After moment, capacitor C is connected1Switch close, two data collection systems measure capacitor C respectively2With
C3Both end voltage；
In t1≤t<t2In time, polarization intensity value/depolarising intensity value of dielectric material is tested are as follows:
Wherein U2Capacitor C is measured for data collection system2The voltage at both ends；
(4) using t2Moment connects capacitor C2Switch close, data collection system measures capacitor C3Both ends
Voltage；
As t >=t2When, test polarization intensity value/depolarising intensity value of dielectric material are as follows:
Wherein U3For the capacitor C of data collection system measurement3The voltage at both ends；
Above-mentioned polarization intensity/depolarising intensity that dielectric material is then tested for each period, as test dielectric material exist
Polarization intensity/depolarising intensity changes with time in time domain.
Calculate each period test dielectric material polarization current/depolarization current density:
In the first measurement method, the polarization intensity of each period test dielectric material is calculated to the time by above-mentioned formula
Differential, obtain the density of each period test dielectric material polarization current, realize that one-shot measurement obtains dielectric material in the time domain
The polarization transient state of material；
In second of measurement method, the depolarising intensity clock synchronization of each period test dielectric material is calculated by above-mentioned formula
Between differential, obtain the density of each period test dielectric material depolarization current, realize that one-shot measurement is situated between in the time domain
The depolarising transient state of electric material；
In the third measurement method, in same time period, survey calculation under first positive pulse is obtained into test dielectric
The polarization intensity of material subtracts survey calculation under second positive pulse and obtains the polarization intensity of test dielectric material, then is tested
Dielectric material polarization intensity in Polarization Reversal Process changes with time；Finally, calculating each period survey by above-mentioned formula
Dielectric material polarization intensity time differential in Polarization Reversal Process is tried, each period test dielectric material polarization electricity is obtained
The density of stream, realization obtain polarization transient state of the dielectric material in Polarization Reversal Process in the time domain.
Test dielectric material, the resistance R of the sample circuit0And capacitor C1、C2And C3After series connection, system is exported with signal
The voltage amplifier of system is in parallel；Wherein, resistance R0, capacitor C1And C2It is connected respectively with three switches；
The resistance R0Resistance value be 50 Ω；The capacitor C1、C2And C3Capacitance at least test dielectric material electricity
100 times of capacitance.
Compared with prior art, the invention has the advantages that with the utility model has the advantages that
1, the present invention makes to test dielectric material and resistance R0And three standard capacitance series connection, resistance R0Resistance value be 50 Ω,
Standard capacitor-value is at least 100 times of test dielectric material capacitance, it is ensured that the accuracy of measurement result.R in sample circuit0、C1
And C2Three switches are separately connected, are successively closed by the software program control switch of computer, four different data acquisitions
Section is effectively measured system in different times respectively, thus realize when field width up to the polarization transient states more than ten orders of magnitude
One-shot measurement, such as from 10-8S to 103s。
2, the data acquisition unit of measuring device measurement short time period of the invention has that sample rate is high, input impedance compared with
Low, the data acquisition unit for measuring long period has sample rate lower, the high feature of input impedance, sample rate in measurement process
It changes, total amount of data is reduced.
3, the present invention can be by taking differential to obtain polarization current polarization intensity, for linear dielectric material, to time domain
In polarization current make the dielectric constant in the available frequency domain of Fourier transformation.In conjunction with three impulse methods, ferroelectricity material can be measured
Material polarization intensity in Polarization Reversal Process changes with time.
Detailed description of the invention
Fig. 1 is the improved Sayer-Tower sample circuit of the present invention；Test sample is to test dielectric material in figure；
Fig. 2 is that polarization intensity is in the time domain under pulse voltage with a thickness of P (VDF-TrFE) thin polymer film of 300nm
Change and withdraw the variation schematic diagram of the depolarising intensity of sample after pulse voltage in the time domain；Pulse voltage intensity is 30V；
Fig. 3 is three impulse method schematic diagrames in the third measurement method of embodiment three；
Fig. 4 is P (VDF-TrFE) thin polymer film with a thickness of 90nm obtained using the third measurement method of the invention
Polarization intensity variation schematic diagram in the time domain；
Fig. 5 is the polarization electricity of P (VDF-TrFE) thin polymer film with a thickness of 300nm for taking differential to obtain by polarization intensity
The variation schematic diagram of stream in the time domain.
Specific embodiment
The present invention is described in further detail with specific embodiment with reference to the accompanying drawing.
Embodiment one
As shown in Figure 1, the measuring device of time domain dielectric material polarization transient state of the present invention includes sample circuit, for providing
Data acquisition unit of the driving pulse voltage to the signal output system of sample circuit and for acquiring sample circuit data.Its
In, sample circuit is by test dielectric material, resistance R0, capacitor C1、C2And C3And three switch connection compositions, and data acquire
Unit includes four and measures resistance R respectively0Both end voltage and capacitor C1、C2And C3The data collection system of both end voltage, it is real
Now by measuring resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, come calculate test dielectric material pole
Change intensity to change with time, the polarization transient state for testing dielectric material in time domain is obtained with one-shot measurement.
Signal output system of the invention includes sequentially connected computer, data collecting card one and voltage amplifier, electricity
Pressure amplifier is connect with sample circuit.
Above-mentioned sample circuit is by test dielectric material, resistance R0, capacitor C1、C2And C3And three switch connection compositions are
Refer to: test dielectric material, resistance R0And capacitor C1、C2And C3It is in parallel with signal output system after series connection；Wherein, resistance R0, electricity
Hold C1And C2It is connected respectively with three switches.
The present invention measures resistance R0The data collection system of both end voltage, which is connected by ondograph with computer, to be formed, tool
There are sample rate height, the high feature of input impedance.Measure capacitor C1And C2The data collection system of both end voltage is respectively by preposition amplification
Device, data collecting card two connect composition with computer, and are respectively provided with input impedance R1And R2；With sample rate height, input impedance
Lower feature.Measure capacitor C3The data collection system of both end voltage is connected by electrometer, data collecting card three with computer
Composition, and there is input impedance R3, have sample rate lower, high resolution, the high feature of input impedance.
A kind of measurement method of time domain dielectric material polarization transient state of the present invention is such that signal output system applies arteries and veins
When rushing, survey calculation obtains test dielectric material polarization intensity and changes with time, and realizes that one-shot measurement is situated between in the time domain
The polarization transient state of electric material.
Wherein, resistance R is measured by the period that three switches are closed respectively respectively0Both end voltage and capacitor C1、C2
And C3Both end voltage, with calculate test dielectric material in the time domain polarization intensity change with time.
Specifically includes the following steps:
The first step, when calculating the polarization intensity value of test dielectric material, after connecting data collecting card one by computer
Voltage amplifier is accessed again as signal output system, applies pulse voltage to sample circuit；Resistance R of the invention0Resistance
Value is 50 Ω, capacitor C1、C2And C3Capacitance be at least and test 100 times of dielectric material capacitance, therefore voltage pulse output
Almost all concentrates on test dielectric material.
Second step, three switches are respectively in t0、t1And t2When moment closes, four data collection systems measure resistance simultaneously
R0Both end voltage and capacitor C1、C2And C3Both end voltage:
(1) in t < t0In time, the polarization intensity value of dielectric material is tested are as follows:
Wherein, URResistance R is measured for data collection system0The voltage at both ends, A are the effective area for testing dielectric material；
(2) pass through t0After moment, resistance R is connected0Switch close, three data collection systems measure capacitor C respectively1、C2
And C3Both end voltage；
In t0≤t<t1In time, the polarization intensity value of dielectric material is tested are as follows:
Wherein, U1Capacitor C is measured for data collection system1The voltage at both ends, A are the effective area for testing dielectric material；
(3) pass through t1After moment, capacitor C is connected1Switch close, two data collection systems measure capacitor C respectively2With
C3Both end voltage；
In t1≤t<t2In time, the polarization intensity value of dielectric material is tested are as follows:
Wherein U2Capacitor C is measured for data collection system2The voltage at both ends；
(4) using t2Moment connects capacitor C2Switch close, data collection system measures capacitor C3Both ends
Voltage；
As t >=t2When, test the polarization intensity value of dielectric material are as follows:
Wherein U3For the capacitor C of data collection system measurement3The voltage at both ends；
The above-mentioned polarization intensity that dielectric material is then tested for each period, as test dielectric material polarize by force in the time domain
Degree changes with time.
The present invention calculates the density of each period test dielectric material polarization current:
In the measurement method of embodiment one, the polarization intensity pair of each period test dielectric material is calculated by above-mentioned formula
The differential of time obtains the density of each period test dielectric material polarization current, realizes that one-shot measurement is situated between in the time domain
The polarization transient state of electric material.
Embodiment two
The measuring device that the present embodiment uses is the same as example 1, the measurement method of the present embodiment are as follows: signal is defeated first
System application pulse withdraws the pulse voltage of signal output system after one section of waiting time out, and survey calculation is tested
Dielectric material depolarising intensity changes with time, and realizes that one-shot measurement obtains the depolarising transient state of dielectric material in the time domain.
Wherein, survey calculation obtains testing dielectric material depolarising intensity and changing with time referring to: being switched by three
The period closed respectively measures resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, with calculate test
Dielectric material depolarizes intensity in the time domain and changes with time.
Specifically includes the following steps:
The first step connects data collecting card one by computer when calculating the depolarising intensity value of test dielectric material
Voltage amplifier is accessed again afterwards as signal output system, applies pulse voltage to sample circuit；After one section of waiting time,
Withdraw pulse voltage.Resistance R of the invention0Resistance value be 50 Ω, capacitor C1、C2And C3Capacitance at least test dielectric
100 times of material capacitance, therefore voltage pulse output almost all concentrates on test dielectric material.
Second step, three switches are respectively in t0、t1And t2When moment closes, four data collection systems measure resistance simultaneously
R0Both end voltage and capacitor C1、C2And C3Both end voltage:
(1) in t < t0In time, the depolarising intensity value of dielectric material is tested are as follows:
Wherein, URResistance R is measured for data collection system0The voltage at both ends, A are the effective area for testing dielectric material；
(2) pass through t0After moment, resistance R is connected0Switch close, three data collection systems measure capacitor C respectively1、C2
And C3Both end voltage；
In t0≤t<t1In time, the depolarising intensity value of dielectric material is tested are as follows:
Wherein, U1Capacitor C is measured for data collection system1The voltage at both ends, A are the effective area for testing dielectric material；
(3) pass through t1After moment, capacitor C is connected1Switch close, two data collection systems measure capacitor C respectively2With
C3Both end voltage；
In t1≤t<t2In time, the depolarising intensity value of dielectric material is tested are as follows:
Wherein U2Capacitor C is measured for data collection system2The voltage at both ends；
(4) using t2Moment connects capacitor C2Switch close, data collection system measures capacitor C3Both ends
Voltage；
As t >=t2When, test the depolarising intensity value of dielectric material are as follows:
Wherein U3For the capacitor C of data collection system measurement3The voltage at both ends；
The above-mentioned depolarising intensity that dielectric material is then tested for each period, as test dielectric material go to pole in the time domain
Change intensity to change with time.
The present invention calculates the density of each period test dielectric material depolarization current:
In the measurement method of embodiment two, the depolarising intensity of each period test dielectric material is calculated by above-mentioned formula
Time differential obtains the density of each period test dielectric material depolarization current, realizes that one-shot measurement is obtained in time domain
The depolarising transient state of dielectric material.
The present embodiment is respectively adopted with a thickness of the P of 300nm (VDF-TrFE) thin polymer film as test dielectric material
One measurement method of embodiment measures under pulse voltage, and to withdraw pulse voltage laggard using two measurement method of embodiment
Row measurement.P (VDF-TrFE) the thin polymer film electrode area with a thickness of 300nm is 9 × 10-8m2, driving pulse voltage is strong
Degree is 30V, width 100s, capacitance 20pF, and the standard capacitor-value of sample circuit is 2nF, output voltage almost all
It is added on P (VDF-TrFE) thin polymer film.P (VDF-TrFE) thin polymer film is obtained according to the measurement method of embodiment one to exist
The variation of polarization intensity in the time domain under driving pulse, and after withdrawing driving pulse, P (VDF-TrFE) thin polymer film is gone
The variation of polarization intensity in the time domain, as shown in Figure 2.The pulse voltage intensity is 30V.
Embodiment three
The measuring device that the present embodiment uses is the same as example 1, and dielectric material is tested in the present embodiment measurement method and is
Ferroelectric material, this method are as follows: as shown in figure 3, one negative pulse of signal output system application makes the pole for testing dielectric material first
Change state and be inverted to negative saturated mode, after one section of waiting time, applying first positive pulse is inverted to test dielectric material
Positive polarization state, survey calculation obtain test dielectric material polarization intensity and change with time.It is measured under first positive pulse
Obtained polarization intensity includes both sides contribution: the polarization intensity as caused by ferroelectric material polarization reversal changes and by other pair
The variation of effect polarization intensity as caused by relaxation and conductance.Then the pulse voltage for withdrawing signal output system, by one section
After waiting time, signal output system, which applies second positive pulse, makes dielectric material be inverted to positive polarization state, second positive arteries and veins
Punching and first positive pulse voltage having the same, it is strong to obtain test dielectric material polarization for survey calculation under second positive pulse
Degree changes with time；At this point, the polarization intensity measured under second positive pulse only has caused by other seondary effects
Polarization intensity variation.
In same time period, the polarization intensity that survey calculation under first positive pulse obtains test dielectric material is subtracted
Survey calculation obtains the polarization intensity of test dielectric material under second positive pulse, then obtains test dielectric material in polarization reversal
Polarization intensity changes with time in the process, and realization obtains polarization wink of the dielectric material in Polarization Reversal Process in the time domain
State；Second of measurement method dielectric material is ferroelectric material.
Wherein, survey calculation obtains testing dielectric material polarization intensity and changing with time referring to: by three switches point
The period that do not close measures resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, with calculate test be situated between
Polarization intensity changes with time electric material in the time domain.
Specifically includes the following steps:
The first step, when calculating the polarization intensity value of test dielectric material, after connecting data collecting card one by computer
Voltage amplifier is accessed again as signal output system, applies pulse voltage to sample circuit；Resistance R of the invention0Resistance
Value is 50 Ω, capacitor C1、C2And C3Capacitance be at least and test 100 times of dielectric material capacitance, therefore voltage pulse output
Almost all concentrates on test dielectric material.
Second step, three switches are respectively in t0、t1And t2When moment closes, four data collection systems measure resistance simultaneously
R0Both end voltage and capacitor C1、C2And C3Both end voltage:
(1) in t < t0In time, the polarization intensity value of dielectric material is tested are as follows:
Wherein, URResistance R is measured for data collection system0The voltage at both ends, A are the effective area for testing dielectric material；
(2) pass through t0After moment, resistance R is connected0Switch close, three data collection systems measure capacitor C respectively1、C2
And C3Both end voltage；
In t0≤t<t1In time, the polarization intensity value of dielectric material is tested are as follows:
Wherein, U1Capacitor C is measured for data collection system1The voltage at both ends, A are the effective area for testing dielectric material；
(3) pass through t1After moment, capacitor C is connected1Switch close, two data collection systems measure capacitor C respectively2With
C3Both end voltage；
In t1≤t<t2In time, the polarization intensity value of dielectric material is tested are as follows:
Wherein U2Capacitor C is measured for data collection system2The voltage at both ends；
(4) using t2Moment connects capacitor C2Switch close, data collection system measures capacitor C3Both ends
Voltage；
As t >=t2When, test the polarization intensity value of dielectric material are as follows:
Wherein U3For the capacitor C of data collection system measurement3The voltage at both ends；
The above-mentioned polarization intensity that dielectric material is then tested for each period, as test dielectric material polarize by force in the time domain
Degree changes with time.
The present invention calculates the density of each period test dielectric material polarization current:
In the measurement method of embodiment three, in same time period, survey calculation under first positive pulse is tested
The polarization intensity of dielectric material subtracts survey calculation under second positive pulse and obtains the polarization intensity of test dielectric material, then obtains
Test dielectric material polarization intensity in Polarization Reversal Process changes with time；Finally, calculating each time by above-mentioned formula
Section test dielectric material polarization intensity time differential in Polarization Reversal Process obtains each period test dielectric material pole
The density of galvanic current, realization obtain polarization transient state of the dielectric material in Polarization Reversal Process in the time domain.
The present invention is surveyed with a thickness of P (VDF-TrFE) thin polymer film of 90nm using the measurement method of embodiment three
Amount, the variation schematic diagram of polarization intensity in the time domain are as shown in Figure 4.In figure: black line is to measure under first positive pulse
The polarization intensity arrived, square hollow line are the polarization intensity measured under second positive pulse, and hollow round wire is the two
Difference, wherein the intensity of negative pulse, first positive pulse and second positive pulse is 15V.
The present embodiment will use with a thickness of the ferroelectric polymer film P (VDF-TrFE) of 90nm as test dielectric material real
Three measurement method of example is applied to measure.Ferroelectric polymer film P (VDF-TrFE) electrode area with a thickness of 90nm is 9 ×
10-8m2, driving pulse intensity is 15V, width 100s, capacitance 100pF, and the standard capacitor-value of sample circuit is
10nF, output voltage almost all are added on ferroelectric polymer film P (VDF-TrFE).It is obtained according to the measurement method of embodiment three
It changes with time (the open circles in Fig. 4 to ferroelectric polymer film P (VDF-TrFE) polarization intensity in Polarization Reversal Process
Shape).Black line in Fig. 4 is the polarization that ferroelectric polymer film P (VDF-TrFE) is measured in the case where first positive pulse motivates
Intensity changes with time, comprising inverting caused polarization intensity variation by iron electric polarization and by other seondary effects such as relaxation and electricity
Lead caused polarization intensity variation.Square hollow in Fig. 4 is ferroelectric polymer film P (VDF-TrFE) in second positive arteries and veins
Impulse encourages the lower obtained polarization intensity that measures and changes with time, as produced by other seondary effects.
The present embodiment will use with a thickness of the ferroelectric polymer film P (VDF-TrFE) of 300nm as test dielectric material
Three measurement method of embodiment measures.Ferroelectric polymer film P (VDF-TrFE) electrode area with a thickness of 300nm is 9
×10-8m2, driving pulse intensity is 30V, width 10s.Ferroelectric polymer film P is obtained according to the measurement method of embodiment three
(VDF-TrFE) polarization intensity changes with time in Polarization Reversal Process, takes differential to polarization intensity, obtains polarization current
It changes with time, as shown in Figure 5.
The above embodiment is a preferred embodiment of the present invention, but embodiments of the present invention are not by above-described embodiment
Limitation, other any changes, modifications, substitutions, combinations, simplifications made without departing from the spirit and principles of the present invention,
It should be equivalent substitute mode, be included within the scope of the present invention.
Claims (10)
1. a kind of measuring device of time domain dielectric material polarization transient state, it is characterised in that: including sample circuit, sharp for providing
Pulse voltage is encouraged to the signal output system of sample circuit and the data acquisition unit for acquiring sample circuit data；
The sample circuit is by test dielectric material, resistance R0, capacitor C1、C2And C3And three switch connection compositions；The number
Include four according to acquisition unit and measures resistance R respectively0Both end voltage and capacitor C1、C2And C3The data of both end voltage acquire system
System is realized by measuring resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, to calculate test dielectric
Material polarization intensity changes with time, and the polarization transient state that dielectric material is tested in time domain is obtained with one-shot measurement.
2. the measuring device of time domain dielectric material polarization transient state according to claim 1, it is characterised in that: the signal
Output system includes sequentially connected computer, data collecting card one and voltage amplifier；The voltage amplifier and sampling electricity
Road connection.
3. the measuring device of time domain dielectric material polarization transient state according to claim 1, it is characterised in that: the sampling
Circuit is by test dielectric material, resistance R0, capacitor C1、C2And C3And three switch connection compositions refer to: test dielectric material,
Resistance R0And capacitor C1、C2And C3It is in parallel with signal output system after series connection；Wherein, resistance R0, capacitor C1And C2Respectively with three
A switch connection.
4. the measuring device of time domain dielectric material polarization transient state according to claim 1, it is characterised in that: measurement resistance
R0The data collection system of both end voltage, which is connected by ondograph with computer, to be formed.
5. the measuring device of time domain dielectric material polarization transient state according to claim 1, it is characterised in that: measurement capacitor
C1And C2The data collection system of both end voltage is connected with computer and is formed by preamplifier, data collecting card two respectively, and point
It Ju You not input impedance R1And R2；
Measure capacitor C3The data collection system of both end voltage is connected with computer and is formed, and had by electrometer, data collecting card three
There is input impedance R3。
6. a kind of measurement method of time domain dielectric material polarization transient state, it is characterised in that: dielectric material, resistance R will be tested0, electricity
Hold C1、C2And C3And three switch connection composition sample circuits；It is arranged and uses circuit and be used to provide driving pulse voltage
Signal output system to sample circuit and the data acquisition unit for acquiring sample circuit data；The data acquisition unit
Resistance R is measured respectively including four0Both end voltage and capacitor C1、C2And C3The data collection system of both end voltage；
The first measurement method are as follows: when signal output system applies pulse, survey calculation obtains test dielectric material polarization intensity
It changes with time, realizes that one-shot measurement obtains the polarization transient state of dielectric material in the time domain；
Or second of measurement method are as follows: signal output system application pulse withdraws signal after one section of waiting time first
The pulse voltage of output system, survey calculation obtain test dielectric material depolarising intensity and change with time, and realize primary survey
Measure the depolarising transient state of dielectric material in the time domain；
Or the third measurement method are as follows: signal output system, which applies a negative pulse, first makes the polarization state for testing dielectric material
Be inverted to negative saturated mode, after one section of waiting time, apply first positive pulse make test dielectric material be inverted to it is positive
Polarization state, survey calculation obtain test dielectric material polarization intensity and change with time；Then the arteries and veins of signal output system is withdrawn
Voltage is rushed, after one section of waiting time, signal output system, which applies second positive pulse, makes dielectric material be inverted to positive pole
Change state, second positive pulse and first positive pulse voltage having the same, survey calculation is surveyed under second positive pulse
Examination dielectric material polarization intensity changes with time；
In same time period, the polarization intensity that survey calculation under first positive pulse obtains test dielectric material is subtracted second
Survey calculation obtains the polarization intensity of test dielectric material under a positive pulse, then obtains test dielectric material in Polarization Reversal Process
Middle polarization intensity changes with time, and realization obtains polarization transient state of the dielectric material in Polarization Reversal Process in the time domain；The
Two kinds of measurement method dielectric materials are ferroelectric material.
7. the measurement method of time domain dielectric material polarization transient state according to claim 6, it is characterised in that: survey calculation
Obtain test dielectric material polarization intensity/depolarising intensity change with time and refer to: by three switch close respectively when
Between section measure resistance R respectively0Both end voltage and capacitor C1、C2And C3Both end voltage, with calculate test dielectric material when
Polarization intensity/depolarising intensity changes with time in domain.
8. the measurement method of time domain dielectric material polarization transient state according to claim 7, it is characterised in that: including following
Step:
The first step connects after connecting data collecting card one by computer again when calculating the polarization intensity value of test dielectric material
Enter voltage amplifier as signal output system, applies pulse voltage to sample circuit；
When calculating the depolarising intensity value of test dielectric material, voltage is accessed again after connecting data collecting card one by computer
Amplifier applies pulse voltage as signal output system, to sample circuit；After one section of waiting time, pulse electricity is withdrawn
Pressure；
Second step, three switches are respectively in t0、t1And t2When moment closes, four data collection systems measure resistance R simultaneously0Two
Hold voltage and capacitor C1、C2And C3Both end voltage:
(1) in t < t0In time, polarization intensity value/depolarising intensity value of dielectric material is tested are as follows:
Wherein, URResistance R is measured for data collection system0The voltage at both ends, A are the effective area for testing dielectric material；
(2) pass through t0After moment, resistance R is connected0Switch close, three data collection systems measure capacitor C respectively1、C2And C3
Both end voltage；
In t0≤t<t1In time, polarization intensity value/depolarising intensity value of dielectric material is tested are as follows:
Wherein, U1Capacitor C is measured for data collection system1The voltage at both ends, A are the effective area for testing dielectric material；
(3) pass through t1After moment, capacitor C is connected1Switch close, two data collection systems measure capacitor C respectively2And C3Two
Hold voltage；
In t1≤t<t2In time, polarization intensity value/depolarising intensity value of dielectric material is tested are as follows:
Wherein U2Capacitor C is measured for data collection system2The voltage at both ends；
(4) using t2Moment connects capacitor C2Switch close, data collection system measures capacitor C3Both end voltage；
As t >=t2When, test polarization intensity value/depolarising intensity value of dielectric material are as follows:
Wherein U3For the capacitor C of data collection system measurement3The voltage at both ends；
Above-mentioned polarization intensity/depolarising intensity that dielectric material is then tested for each period, as test dielectric material is in time domain
Middle polarization intensity/depolarising intensity changes with time.
9. the measurement method of time domain dielectric material polarization transient state according to claim 8, it is characterised in that: when calculating each
Between section test dielectric material polarization current/depolarization current density:
In the first measurement method, calculating each period by above-mentioned formula, to test the polarization intensity of dielectric material micro- to the time
Point, the density of each period test dielectric material polarization current is obtained, realizes that one-shot measurement obtains dielectric material in the time domain
Polarize transient state；
In second of measurement method, the depolarising intensity versus time of each period test dielectric material is calculated by above-mentioned formula
Differential obtains the density of each period test dielectric material depolarization current, realizes that one-shot measurement obtains dielectric material in the time domain
The depolarising transient state of material；
In the third measurement method, in same time period, survey calculation under first positive pulse is obtained into test dielectric material
Polarization intensity subtract survey calculation under second positive pulse obtain test dielectric material polarization intensity, then obtain test dielectric
Material polarization intensity in Polarization Reversal Process changes with time；It is situated between finally, calculating each period test by above-mentioned formula
Electric material polarization intensity time differential in Polarization Reversal Process obtains each period test dielectric material polarization current
Density, realization obtain polarization transient state of the dielectric material in Polarization Reversal Process in the time domain.
10. the measurement method of time domain dielectric material polarization transient state according to claim 8, it is characterised in that: described to adopt
Test dielectric material, the resistance R of sample circuit0And capacitor C1、C2And C3Voltage amplifier after series connection, with signal output system
It is in parallel；Wherein, resistance R0, capacitor C1And C2It is connected respectively with three switches；
The resistance R0Resistance value be 50 Ω；The capacitor C1、C2And C3Capacitance at least test dielectric material capacitance
100 times.
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