CN111551792A - Dielectric infinite high frequency relative dielectric constant measuring principle - Google Patents

Dielectric infinite high frequency relative dielectric constant measuring principle Download PDF

Info

Publication number
CN111551792A
CN111551792A CN202010461190.2A CN202010461190A CN111551792A CN 111551792 A CN111551792 A CN 111551792A CN 202010461190 A CN202010461190 A CN 202010461190A CN 111551792 A CN111551792 A CN 111551792A
Authority
CN
China
Prior art keywords
potential
dielectric constant
high frequency
dielectric
short
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202010461190.2A
Other languages
Chinese (zh)
Other versions
CN111551792B (en
Inventor
索长友
李忠华
陈宇
郭文敏
郑欢
韩永森
孙云龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Harbin University of Science and Technology
Original Assignee
Harbin University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Harbin University of Science and Technology filed Critical Harbin University of Science and Technology
Priority to CN202010461190.2A priority Critical patent/CN111551792B/en
Publication of CN111551792A publication Critical patent/CN111551792A/en
Application granted granted Critical
Publication of CN111551792B publication Critical patent/CN111551792B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention discloses a dielectric medium infinite high frequency relative dielectric constant measuring principle, which solves the technical problem that the dielectric medium infinite high frequency relative dielectric constant cannot be accurately measured. The basic principle of the invention is as follows: the method comprises the steps of polarizing a tested dielectric by adopting a high-voltage direct-current power supply, then realizing acquisition and recording of a short-circuit current and a replying potential time domain spectrum of the tested insulating dielectric by adopting an acquisition system consisting of an electrometer, an electrostatic voltmeter and a computer, accurately acquiring the change rate of the replying potential at the initial moment by least square fitting, and acquiring the change rate of the replying potential at the initial moment by the change rate of the replying potential at the initial moment
Figure DDA0002510967960000011
And short-circuit current Id(t1‑) By the formula
Figure DDA0002510967960000012
Realizing the achievement of infinite high frequency relative dielectric constant∞The measurement of (2).

Description

Dielectric infinite high frequency relative dielectric constant measuring principle
Technical Field
The invention relates to the field of dielectric parameter measurement of insulating dielectrics, in particular to an infinite high-frequency relative dielectric constant measurement principle of the insulating dielectrics.
Background
Insulating dielectrics are materials that make up the insulation of electronic devices and electrical equipment and serve as electrical insulation, mechanical support, and external encapsulation. Relative dielectric constant at a given frequency: (r) Is one of the important technical indexes for expressing the insulation performance of an insulating dielectric medium under the action of a determined frequency electric field, and is defined as the dielectric constant of the insulating dielectric medium and the dielectric constant in vacuum under a given frequency (0) In which the vacuum dielectric constant: (0) Is a constant, and is also a unit conversion coefficient. Dielectric physics establishes the relative permittivity of an insulating dielectric at a given frequency for a particular insulating dielectric (satisfying a single Debye relaxation polarization mechanism) ((r) And relative dielectric constant of infinite high frequency: (∞) Static relative dielectric constant: (s) And frequency (f). Wherein, the relative dielectric constant of infinite high frequency is the appearance of instantaneous displacement polarization; static relative dielectric constant: (s) The external manifestation after polarization is fully established under the action of a direct current electric field is the sum of instantaneous displacement polarization and all relaxation polarization. Theoretically for a particular insulating dielectric, the relative permittivity at known infinite frequency of (∞) And static relative dielectric constant: (s) The relative permittivity at any given frequency can be calculated under the conditions. All insulating dielectrics inevitably generate instantaneous displacement polarization under the action of an electric field, and the research on the polarization mechanism is based on the instantaneous displacement polarization behavior, so that the measurement and the conjecture of the infinite high-frequency relative dielectric constant have important theoretical significance and engineering significance.
For gas, transparent liquid and transparent solid insulating dielectric medium, the refractive index (n) of light can be measured, and then the relative dielectric constant (n) can be calculated according to the infinite high frequency∞) Relation to the photorefractive coefficient n (∞＝n2) Realizing the relative dielectric constant of infinite high frequency: (∞) The measurement of (2). For insulating dielectrics that fail optical testing,the infinite high frequency relative permittivity can generally be achieved by measuring and inferring the high frequency relative permittivity(s) ((s))∞) Presumably, e.g. Novocontrol Concept80 model broadband dielectrophoresis tests up to 107Measurement of relative permittivity at Hz frequency. For neutral insulating dielectrics, there is no relaxation polarization, and the infinite high frequency relative permittivity can be obtained relatively accurately by measuring the high frequency relative permittivity (∞) And (4) information. For dielectric materials containing relaxed polarization, a higher frequency relative permittivity measurement is required to obtain the infinite high frequency relative permittivity (R) ((R))∞) More precise speculation, e.g. using hundreds of GHz (10)9Hz) was measured with a vector analyzer. Using hundreds of GHz (10)9Hz) is relatively expensive and the measured result is not truly infinite high frequency relative permittivity.
SUMMARY OF THE PATENT FOR INVENTION
In order to overcome the technical problem that the infinite high frequency relative dielectric constant of the insulating dielectric medium cannot be accurately measured, the invention provides a measuring principle of the infinite high frequency relative dielectric constant of the insulating dielectric medium, and aims to conveniently and accurately measure the infinite high frequency relative dielectric constant.
The above purpose is realized by the following technical scheme:
the principle is characterized in that a measuring switch is switched from a short-circuit state to a surface potential test state, the short-circuit current before the switch acts and the recovery potential after the switch acts are recorded, and the change rate of the recovery potential at the initial moment is measured
Figure BDA0002510967940000021
And short-circuit current Id(t1-) By the formula
Figure BDA0002510967940000022
Calculating to obtain infinite high-frequency relative dielectric constant∞The test results of (1).
Further, the influence of noise on the return potential measurement is eliminated through a least square fitting method, and the change rate of the return potential of the insulating dielectric medium at the initial moment is obtained through a fitting function.
Further, under the action of direct current voltage, the short-circuit current and the time domain spectrum of the return potential of the insulation dielectric medium to be detected are collected and recorded through an electrometer, an electrostatic voltmeter and a computer collection system.
Compared with the prior art, the invention has the following beneficial effects: the invention fully utilizes the information contained in the time domain spectrum of the polarization, short circuit depolarization current and the time domain spectrum of the return potential of the insulating dielectric medium to calculate and obtain the infinite high-frequency relative dielectric constant∞The dielectric constant measurement method has the advantages that the dielectric constant measurement method realizes the measurement of the infinite high frequency relative dielectric constant and the displacement polarizability of the insulating dielectric for the first time, compared with the traditional method of extrapolating the dielectric spectrum test result to obtain the infinite high frequency relative dielectric constant result, the test method is simple, convenient and feasible, the test equipment is relatively low in manufacturing cost, and a research means is provided for the dielectric mechanism research of the insulating dielectric.
Drawings
FIG. 1 is a schematic diagram of a short circuit current and surface potential time domain spectroscopy joint test system for insulating dielectrics;
FIG. 2 is a test result of the insulating dielectric short-circuit current time domain spectrum in the example;
FIG. 3 shows the time domain spectrum test result of the insulation dielectric in the embodiment.
In the figure: 1-a direct current high voltage power supply; 2-a switch; 3-measured insulating dielectric; 4-a high voltage electrode; 5-a guard electrode; 6-a measuring electrode; 7-high voltage electrostatic measuring probe; 8-an electrostatic voltmeter; 9-data communication line 1 connected to computer; 10-an electrometer; 11-a data communication line 2 connected to a computer;
Detailed Description
The present invention will be described in detail with reference to the following embodiments and examples. It should be emphasized that this summary is intended to be illustrative, and not limiting, of the invention.
Detailed description of the invention
The dielectric infinite high frequency relative dielectric constant measuring principle includes switching the measuring switch from short circuit state to surface potential test state and recording the switch motionShort-circuit current before operation and recovery potential after operation, from initial time change rate of recovery potential
Figure BDA0002510967940000031
And short-circuit current Id(t1-) By the formula
Figure BDA0002510967940000032
Calculating to obtain infinite high-frequency relative dielectric constant∞The test results of (1).
Detailed description of the invention
On the basis of the first embodiment, specifically, the initial time rate of change of the return potential of the insulating dielectric is obtained from the fitting function.
Detailed description of the invention
On the basis of the first specific embodiment, specifically, the short-circuit current and the time domain spectrum of the return potential of the insulating dielectric medium to be tested are collected and recorded by an electrometer, an electrostatic voltmeter and a computer collection system under the action of the direct-current voltage.
Detailed description of the invention
Based on the first embodiment, the rate of change of the recovery potential of the tested insulating dielectric causes the current Ihd(t) is calculated by the formula
Figure BDA0002510967940000033
In particular, C in said formula∞Is an infinite high-frequency capacitor, and is,∞is a relative dielectric constant of an infinite high frequency,0s is the area of the insulating dielectric and d is the thickness of the insulating dielectric, for a vacuum dielectric constant.
Detailed description of the invention
In the first and fifth embodiments, the short circuit is switched to the open circuit instant (time t ═ t)1) Short-circuit current I flowing through the measured insulating dielectricd(t1-) And rate of change of return potential dU (t)1+) The equivalent relation of current caused by dt is
Figure BDA0002510967940000034
Detailed description of the invention
Based on the first embodiment and the sixth embodiment, in particular, the infinite high frequency relative permittivity of the measured insulating dielectric∞Is calculated by the formula
Figure BDA0002510967940000035
Detailed description of the invention
On the basis of the second embodiment, specifically, the least square fitting formula of the reply potential is
U(t)＝A0+A1exp(-t/τ1)-A2exp(-t/τ2)+A3exp(-t/τ3)-A4exp(-t/τ4)
Specifically, the parameter A in the fitting formula0、A1、A2、A3And A4Are respectively constant, parameter tau1、τ2、τ3And τ4Respectively the relaxation time constant
Detailed description of the invention
On the basis of the third specific embodiment, specifically, the direct-current voltage is generated by a direct-current voltage-stabilizing high-voltage direct-current power supply, the electrometer is provided with a data interface communicated with a computer, the input end of the electrostatic voltmeter is connected with the high-voltage electrostatic probe, and the output end of the electrostatic voltmeter is connected with the computer.
Examples
The insulating dielectric of this example is a 10 wt% silicon carbide/polyethylene composite insulating dielectric, and the electrode area S is 452.16mm2And the thickness d is 0.2mm, and a direct-current high voltage of 5kV is applied to the tested insulating dielectric by using a polarization current spectrum testing system shown in FIG. 1. After 1800s the samples were short-circuited and the short-circuit current through the tested dielectric was recorded by a Keithley6517B electrometer, as shown in fig. 2Shown in the figure. The short circuit obtained in this embodiment is switched to the open circuit time (t)11811s) of short-circuit depolarized current I (t) flowing through the insulating dielectric to be tested1-)＝422.32pA。
After the short circuit is switched to the open circuit, the measured time domain spectrum of the insulation dielectric return potential obtained in the example is shown in FIG. 3, and the fitting parameter A0＝140.52V，A1＝-34.40V，A2＝37.50V，A3＝-35.14V，A4＝31.84V，τ1＝767.14s，τ2＝3.65s，τ3＝129.96s，τ420.96s, short circuit transitions to open circuit time (t)11810s) rate of change dU (t) of the return potential of the measured insulating dielectric1+) (dt) ═ 12.13V/s, relative dielectric constant at high frequency∞Is 2.18.

Claims (3)

1. The principle is characterized in that a measuring switch is switched from a short-circuit state to a surface potential test state, the short-circuit current before the switch acts and the recovery potential after the switch acts are recorded, and the change rate of the recovery potential at the initial moment is measured
Figure FDA0002510967930000011
And short-circuit current Id(t1-) By the formula
Figure FDA0002510967930000012
Calculating to obtain infinite high-frequency relative dielectric constant∞The test results of (1).
2. In claim 1, the influence of noise on the measurement of the return potential is removed by a least square fitting method, and the rate of change of the return potential of the insulating dielectric at the initial time is obtained from a fitting function.
3. The method of claim 1, wherein the short-circuit current and the time domain spectrum of the back potential of the insulating dielectric to be measured under the action of the direct-current voltage are collected and recorded by an electrometer, an electrostatic voltmeter and a computer collection system.
CN202010461190.2A 2020-05-27 2020-05-27 Dielectric infinite high frequency relative dielectric constant measuring method Active CN111551792B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010461190.2A CN111551792B (en) 2020-05-27 2020-05-27 Dielectric infinite high frequency relative dielectric constant measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010461190.2A CN111551792B (en) 2020-05-27 2020-05-27 Dielectric infinite high frequency relative dielectric constant measuring method

Publications (2)

Publication Number Publication Date
CN111551792A true CN111551792A (en) 2020-08-18
CN111551792B CN111551792B (en) 2022-05-31

Family

ID=72003631

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010461190.2A Active CN111551792B (en) 2020-05-27 2020-05-27 Dielectric infinite high frequency relative dielectric constant measuring method

Country Status (1)

Country Link
CN (1) CN111551792B (en)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626773A (en) * 1984-10-26 1986-12-02 Exxon Production Research Co. Method and means for determining rock properties using time-domain dielectric spectroscopy
CN1066121A (en) * 1991-04-25 1992-11-11 海德罗-格伯 Utilize capacitive transducer to displacement or specific inductive capacity carry out dynamically and non-cpntact measurement
CN101013146A (en) * 2007-03-05 2007-08-08 徐缓 Test method for relative dielectric constant Epsilon of high-frequency microwave printed board
CN102129145A (en) * 2010-01-12 2011-07-20 马克西姆综合产品公司 Micro electro-me-chanical systems driver with a capacitance measuring circuit
CN104360169A (en) * 2014-10-30 2015-02-18 昆山金鹏电子有限公司 Dielectric constant measuring method for high-frequency microwave printed board
CN104730344A (en) * 2015-03-27 2015-06-24 西交利物浦大学 Semiconductor device transient-state capacitance testing method and system
CN105116201A (en) * 2015-09-29 2015-12-02 广东电网有限责任公司佛山供电局 Measuring device and method for return voltage parameter
CN106443129A (en) * 2016-09-26 2017-02-22 哈尔滨理工大学 Numerical computation method for recovery voltage of electrical equipment and insulating material
CN107621597A (en) * 2017-09-11 2018-01-23 哈尔滨理工大学 A kind of cable semi-conductive shield material AC/DC dielectric properties test system and method
CN110244112A (en) * 2019-06-19 2019-09-17 佛山科学技术学院 A kind of measuring device and measuring method of time domain dielectric material polarization transient state

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626773A (en) * 1984-10-26 1986-12-02 Exxon Production Research Co. Method and means for determining rock properties using time-domain dielectric spectroscopy
CN1066121A (en) * 1991-04-25 1992-11-11 海德罗-格伯 Utilize capacitive transducer to displacement or specific inductive capacity carry out dynamically and non-cpntact measurement
CN101013146A (en) * 2007-03-05 2007-08-08 徐缓 Test method for relative dielectric constant Epsilon of high-frequency microwave printed board
CN102129145A (en) * 2010-01-12 2011-07-20 马克西姆综合产品公司 Micro electro-me-chanical systems driver with a capacitance measuring circuit
CN104360169A (en) * 2014-10-30 2015-02-18 昆山金鹏电子有限公司 Dielectric constant measuring method for high-frequency microwave printed board
CN104730344A (en) * 2015-03-27 2015-06-24 西交利物浦大学 Semiconductor device transient-state capacitance testing method and system
CN105116201A (en) * 2015-09-29 2015-12-02 广东电网有限责任公司佛山供电局 Measuring device and method for return voltage parameter
CN106443129A (en) * 2016-09-26 2017-02-22 哈尔滨理工大学 Numerical computation method for recovery voltage of electrical equipment and insulating material
CN107621597A (en) * 2017-09-11 2018-01-23 哈尔滨理工大学 A kind of cable semi-conductive shield material AC/DC dielectric properties test system and method
CN110244112A (en) * 2019-06-19 2019-09-17 佛山科学技术学院 A kind of measuring device and measuring method of time domain dielectric material polarization transient state

Non-Patent Citations (12)

* Cited by examiner, † Cited by third party
Title
CHANGYOU SUO: "Application of L1 Trend Filtering Technology on the Current Time Domain Spectroscopy of Dielectrics", 《ELECTRONICS》 *
CHANGYOU SUO: "Application of L1 Trend Filtering Technology on the Current Time Domain Spectroscopy of Dielectrics", 《ELECTRONICS》, 18 September 2019 (2019-09-18) *
UNO GAFVERT: "Modelling Return Voltage Measurements of multi-layer insulation systems", 《PROCEEDINGS OF THE 4TH INTERNATIONAL CONFERENCE ONPROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS》 *
UNO GAFVERT: "Modelling Return Voltage Measurements of multi-layer insulation systems", 《PROCEEDINGS OF THE 4TH INTERNATIONAL CONFERENCE ONPROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS》, 8 July 1994 (1994-07-08) *
刘骥: "基于PDC分析的时频混合绝缘诊断方法研究", 《中国博士学位论文全文数据库》 *
刘骥: "基于PDC分析的时频混合绝缘诊断方法研究", 《中国博士学位论文全文数据库》, 15 July 2015 (2015-07-15) *
吴慧莹: "油纸绝缘系统弛豫响应极化谱函数建模研究", 《福州大学学报》 *
吴慧莹: "油纸绝缘系统弛豫响应极化谱函数建模研究", 《福州大学学报》, no. 5, 30 October 2014 (2014-10-30), pages 714 - 718 *
李忠华: "非线性绝缘电介质介电特性表征与测试", 《电气工程学报》 *
李忠华: "非线性绝缘电介质介电特性表征与测试", 《电气工程学报》, vol. 13, no. 11, 30 November 2018 (2018-11-30) *
索长友: "方波电压下非线性绝缘介质暂态介电特性与表征", 《中国博士学位论文全文数据库》 *
索长友: "方波电压下非线性绝缘介质暂态介电特性与表征", 《中国博士学位论文全文数据库》, 15 January 2021 (2021-01-15) *

Also Published As

Publication number Publication date
CN111551792B (en) 2022-05-31

Similar Documents

Publication Publication Date Title
US20140300374A1 (en) Method and apparatus for measurement of a dc voltage
David et al. Low-frequency dielectric response of epoxy-mica insulated generator bars during multi-stress aging
CN110909497B (en) Transient electric field calculation method of high-voltage switch equipment under impulse voltage
Sonerud et al. Dielectric response measurements utilizing semi-square voltage waveforms
Bartnikas et al. Electrical Properties of Solid Insulating Materials
Kundert Modeling dielectric absorption in capacitors
Abdul-Malek A new method to extract the resistive component of the metal oxide surge arrester leakage current
CN111551792B (en) Dielectric infinite high frequency relative dielectric constant measuring method
Linde et al. Comparison of Dielectric Loss Measuring Methods on Epoxy Samples under Harmonic Distorted Voltages
Wang et al. Capacitive voltage sensor array for detecting transient voltage distribution in transformer windings
JP2789066B2 (en) Diagnosis method for insulation deterioration of power cable
CN111579909B (en) Method for measuring stable relaxation polarizability and electric field characteristic of nonlinear insulating dielectric medium
CN111913046B (en) Method for measuring steady-state relaxation polarizability of insulating dielectric
CN111579879B (en) Dielectric infinite high frequency relative dielectric constant measuring method
Li et al. Modeling of stored charge in metallized biaxially oriented polypropylene film capacitors based on charging current measurement
Xie et al. Development of the 10 kV Wideband Combined Resistance-capacitance Voltage Divider Unit
CN111398697A (en) Space charge test system and test method under periodic pulse electric field
Li et al. Measurement of dynamic potential distribution during the propagation of a local arc along a polluted surface
Wang et al. Space charge behavior in oil-paper insulation under polarity reversed voltage
CN112698115B (en) Electric field distribution determination method and system in multilayer composite medium transient process
Sargazi et al. On Investigating the Effect of DC Biased Ripple Voltages over the Insulation of Bus Capacitor of Power Inverters: Possibility and Limitations
CN111579880B (en) Method for measuring steady-state relaxation polarizability of linear insulating dielectric
Chen et al. An equivalent circuit model for partial discharge occuring in transformer oil bubbles
Das et al. A simple and low cost Sawyer-Tower ferro-electric loop tracer with variable frequency and compensation circuit
Sonerud et al. Dielectric response measurements utilizing non-sinusoidal waveforms

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant