CN108319516A - A kind of test system and test method - Google Patents
A kind of test system and test method Download PDFInfo
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- CN108319516A CN108319516A CN201711459755.8A CN201711459755A CN108319516A CN 108319516 A CN108319516 A CN 108319516A CN 201711459755 A CN201711459755 A CN 201711459755A CN 108319516 A CN108319516 A CN 108319516A
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- 238000012360 testing method Methods 0.000 title claims abstract description 352
- 238000010998 test method Methods 0.000 title claims abstract description 18
- 230000010354 integration Effects 0.000 claims abstract description 74
- 230000003750 conditioning effect Effects 0.000 claims abstract description 46
- 230000006978 adaptation Effects 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims description 15
- 238000012546 transfer Methods 0.000 claims description 7
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 238000003786 synthesis reaction Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 14
- 238000005516 engineering process Methods 0.000 abstract description 6
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- 238000001514 detection method Methods 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 4
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- 238000004458 analytical method Methods 0.000 description 2
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- 238000011835 investigation Methods 0.000 description 2
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- 239000011159 matrix material Substances 0.000 description 2
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/008—Reliability or availability analysis
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
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Abstract
The present embodiments relate to automatic control technology field, a kind of test system and test method are disclosed.Test system in the present invention includes：Integration test computer, universal tester and interface adapter；Integration test computer generates the first test signal to measured piece, moreover it is possible to generate control instruction to control universal tester and generate the second test signal；Interface adapter is used to carry out the adaptation of signal condition and interface, and the test signal after conditioning is transferred to measured piece；Measured piece receives the test signal after conditioning, generates actual feedback data and is transferred to interface adapter；Interface adapter improves actual feedback data, and the actual feedback data after conditioning are transferred to universal tester or integration test computer.Integration test computer carries out Comparative result, and obtains test result, generates test report.The test system realizes the automatic test to measured piece, improves production efficiency, stability in use and the maintenanceability of measured piece.
Description
Technical field
The present embodiments relate to automatic control technology field, more particularly to a kind of test system and test method.
Background technology
Embedded device plays more and more important work in automation control, industry manufacture, national defense construction etc. at present
With.And accuracy, the accuracy and reliability of embedded device are critically important in practical applications.Therefore, it is applied in input
Producer generally requires to test the embedded device produced before, to detect the accuracy, accurate of embedded device
Property and reliability.And traditional test to embedded device is mainly based on manual testing.
Following problem exists in the prior art in inventor, with electronic technology, microelectric technique and computer technology
Deng development and its application on embedded device, the performance of embedded device is increasingly advanced, and up-to-dateness is increasingly
It is high.The test of traditional embedded device based on manual testing cannot meet the needs of production.And it is surveying manually
In examination or semi-automatic test, test equipment is substantially single instrument, instrument, cannot high speed, efficiently solve insertion
Formula device systems test event is more, test parameter complexity problem.And the inefficient and inaccuracy of original test method influences
Production, subsequent use, the investigation of failure and the maintenance process of embedded device.
Invention content
Embodiment of the present invention is designed to provide a kind of test system and test method, can realize to measured piece
Automatic test course simultaneously obtains test report, fast and accurately to carry out the detection of function and performance to measured piece, improves quilt
Survey production efficiency, stability in use and the maintenanceability of part.
In order to solve the above technical problems, embodiments of the present invention provide a kind of test system, including：Integration test meter
Calculation machine, universal tester and interface adapter；Integration test computer is used for the input and output by internal configuration and bus
Interface board generates the first test signal to measured piece, and the first test signal is transferred to interface adapter；Integration test
Computer is additionally operable to generate control instruction, and by control instruction by testing bus transfer to universal tester；
Universal tester generates according to control instruction and believes the second test of measured piece for receiving control instruction
Number；
Interface adapter is used to carry out the adaptation of signal condition and interface according to the first test signal or the second test signal,
And by after conditioning the first test signal or the second test signal be transferred to measured piece；Wherein, measured piece receives the after conditioning
One test signal or the second test signal generate actual feedback data, and actual feedback data are transferred to interface adapter；
Interface adapter is additionally operable to improve actual feedback data, the actual feedback data after conditioning is transferred to logical
With test equipment, integration test computer is transferred to after so that universal tester is acquired actual feedback data, or, will adjust
Actual feedback data after reason are transferred directly to integration test computer；
Integration test computer be additionally operable to acquisition conditioning after actual feedback data, by after conditioning actual feedback data with
The desired value of setting is compared to obtain test result, and generates test report according to test result.
Embodiments of the present invention additionally provide a kind of test method, including integration test computer passes through inside configuration
Input and output and bus interface board generate the first test signal to measured piece, and the first test signal is transferred to interface and is fitted
Orchestration；Integration test computer is additionally operable to generate control instruction, and by control instruction by testing bus transfer to universal test
Instrument；
Universal tester generates the second test signal to measured piece according to control instruction；
Interface adapter carries out the adaptation of signal condition and interface according to the first test signal or the second test signal, and will
The first test signal or the second test signal after conditioning are transferred to measured piece；Wherein, measured piece receives the first survey after conditioning
Trial signal or the second test signal generate actual feedback data, and actual feedback data are transferred to interface adapter；
Interface adapter improves actual feedback data, and the actual feedback data after conditioning are transferred to universal test
Instrument is transferred to integration test computer after so that universal tester is acquired actual feedback data, or, by after conditioning
Actual feedback data are transferred directly to integration test computer；
Integration test computer is additionally operable to acquisition actual feedback data, and actual feedback data and the desired value of setting are carried out
Comparison obtains test result, and generates test report according to test result.
Embodiment of the present invention is in terms of existing technologies, a set of comprising integration test computer, general by designing
The test system of test equipment, interface adapter and measured piece can realize the automatic test course to measured piece and obtain
Test report fast and accurately carries out measured piece the detection of function and performance, improves the production efficiency of measured piece, using steady
Qualitative and maintenanceability.
In addition, the number of universal tester is matched with test event, different universal testers is for testing
Different test events.It in practical applications can be according to the number for needing flexible configuration universal tester of actual test project
Mesh.The number of universal tester is matched with test event, multiple and different projects can be carried out at a high speed, efficiently
Test solves the problems, such as that test event during the test is mostly complicated with test parameter.
In addition, integration test computer is specifically used for according to the actual feedback after each corresponding conditioning of the test event
Data generate the test report.Integration test computer can by after the conditioning of each project actual feedback data with set
Fixed desired value carries out comparison and obtains test result, and generates test report according to test result.
In addition, integration test computer is connected by testing bus with universal tester.
In addition, after generating test report according to test result, further include：Integration test computer according to test report,
Determine the fault condition of measured piece, and maintenance program determined according to fault condition, and in the form of a list show conditioning after
Actual feedback data.According to the test report of integration test computer, user can judge existing fault condition according to report,
To facilitate the follow-up investigation for quickly carrying out failure and maintenance, and actual feedback data are shown, is allowed users to more straight
That sees analyzes test result.
In addition, before integration test computer selects test case according to testing requirement, further include：Judge whether to receive
The self-checking command of user checks the software and hardware function of integration test computer if receiving self-checking command；Otherwise
Skip first test signal and control instruction of the self-test generation to measured piece.
Description of the drawings
One or more embodiments are illustrated by the picture in corresponding attached drawing, these exemplary theorys
The bright restriction not constituted to embodiment, the element with same reference numbers label is expressed as similar element in attached drawing, removes
Non- to have special statement, composition does not limit the figure in attached drawing.
Fig. 1 is a kind of structure chart of test system of first embodiment of the invention；
Fig. 2 is a kind of structure chart of test system of second embodiment of the invention；
Fig. 3 is a kind of flow chart of test method of third embodiment of the invention；
Fig. 4 is a kind of flow chart of test method of four embodiment of the invention.
Specific implementation mode
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with attached drawing to the present invention
Each embodiment be explained in detail.However, it will be understood by those skilled in the art that in each embodiment party of the present invention
In formula, in order to make the reader understand this application better, many technical details are proposed.But even if without these technical details
And various changes and modifications based on the following respective embodiments, it can also realize the application technical solution claimed.
The first embodiment of the present invention is related to a kind of test systems.Detailed process is as shown in Figure 1, specifically include：It is comprehensive
Test computer 11, universal tester 12 and interface adapter 13.Also, measured piece 14 is suitable with the interface in test system
What orchestration 13 was directly connected to.
Wherein, integration test computer 11 is used to generate to quilt by the input and output and bus interface board of internal configuration
The first test signal of part 14 is surveyed, and the first test signal is transferred to interface adapter 13；Integration test computer 11 is also used
In generating 14 control instructions, and by control instruction by testing bus transfer to universal tester 12.Universal tester 12
The second test signal to measured piece 14 is generated for receiving control instruction, and according to control instruction.Interface adapter 13 is used for
The adaptation of signal condition and interface is carried out according to the first test signal or the second test signal, and the first test after conditioning is believed
Number or the second test signal be transferred to measured piece 14；Wherein, measured piece 14 receives the first test signal after conditioning or the second survey
Trial signal generates actual feedback data, and actual feedback data are transferred to interface adapter 13.Interface adapter 13 is additionally operable to pair
Actual feedback data are improved, and the actual feedback data after conditioning are transferred to universal tester 12, make universal tester
Device 12 is transferred to integration test computer 11 after being acquired to actual feedback data, or, by the actual feedback data after conditioning
It is transferred directly to integration test computer 11.Integration test computer 11 is additionally operable to the actual feedback data after acquisition conditioning, will
Actual feedback data after conditioning are compared to obtain test result with the desired value of setting, and are generated and tested according to test result
Report.
It should be noted that integration test computer 11 is the test and management, running software and human-computer interaction of this system
There is modularized design can cut for platform, the test synthesis management software run thereon, and clearly operation is flexible at interface, collects user
Rights management, System self-test, automatic test, excitation transmission, signal acquisition, data processing, display, storage and fault diagnosis point
Analysis and test report systematic function are in one.Also, it is tested according to specified in testing requirement in integration test computer 11
The correct data of part feedback and preset in advance has got well desired value, integration test computer 11 each project is improved after reality
Feedback data and the desired value of setting are compared, if actual feedback data and desired value that measured piece 14 is generated by test
It is identical, illustrate that the function items that measured piece is tested are correct, otherwise measured piece 14 is problematic.And it is formed according to the result of test
Test report, in order to which user checks.The fault condition of measured piece is determined by test report, and is determined according to fault condition
Maintenance program allows users to fast and accurately repair measured piece, therefore improves the efficiency of production and use steady
It is qualitative.
Wherein, the test bus between integration test computer 11 and universal tester 12 is Ethernet or general-purpose interface
Bus or other kinds of bus, not doing restriction herein can be selected according to actual conditions.Therefore integration test computer
11 be that will test required arrange parameter caused by testing results use-case by Ethernet or interface bus to be transferred to general survey
On test instrument 12.In addition, the connection that integration test computer 11 is adapted to interface between 13 can also be by Ethernet or
General purpose interface bus is attached.
It should be noted that this set test system is mainly the test being applied to embedded device, so quilt here
It surveys part 14 and is generally referred to as embedded device.
In addition, the interface of integration test computer 11 includes general-purpose interface and custom interface.Wherein, general-purpose interface is standard
Input and output (Input Output, IO) interface or bus interface, custom interface be customized according to the demand of user
Interface, so that test process more focuses on the actual demand of user, more hommization.There are many common interface protocols,
Such as：1553B bus inferface protocols, RS-232/422/485 interface protocols, controller local area network (ControllerArea
Network, CAN) interface protocol, digital IO (Digital in and out, DIO) interface protocol, analog-to-digital conversion
(Analog to digital, AD) interface protocol, digital-to-analogue conversion (Digital to analog, DA) interface protocol, high speed are defeated
Enter output (Rapid in and out, Rapid IO) interface protocol, avionic full-duplex switched-type Ethernet (Avionics
Full Switched Ethernet, AFDX) interface protocol etc..
It should be noted that being also equipped with interface on universal tester 12, interface can export or gathered data, because
The interface of universal tester is also comprising a plurality of types of, it is therefore desirable to be adapted to the interface of universal tester by interface
Device 13 is converted into type identical with the interface of measured piece 14, in order to the transmission of signal.
In addition, the adapter 13 of interface adaptation has the interface conversion equipments such as switch matrix, pass through software such as integration test
11 defining interface configuration mode of computer, control harness switching, simplifies the process of wiring, thread-changing.And since interface is adapted to
Device 13 is designed with reinforced portable, therefore disclosure satisfy that the demand of outfield adverse circumstances test.
Compared with prior art, it includes integration test computer that the test system in the present embodiment is a set of by design, logical
With the test system of test equipment and interface adapter, it can realize the automatic test course to measured piece and obtain test report
Accuse, the detection of function and performance fast and accurately carried out to measured piece, improve the production efficiency of measured piece, stability in use and
Maintenanceability.
Second embodiment of the present invention is related to a kind of test system.Second embodiment and first embodiment substantially phase
Together, specifically the structure chart of test system is as shown in Figure 2.Second implements to be the materialization to first embodiment, present embodiment
In test system in include at least two universal testers, be the first general survey respectively in the present embodiment for three
Test instrument 121, the second universal tester 122, third universal tester 123.
Wherein, the first universal tester 121, the second universal tester 122, third universal tester 123 are distinguished
The arrange parameter of the test disparity items to be come according to test bus transfer tests different test events.Pass through setting
It is multiple test disparity items universal testers, can high speed, efficiently multiple and different projects is tested, solve exist
Problem of the test event mostly with test parameter complexity in test process.
It should be noted that the number of universal tester is matched with test event, different universal testers
For testing different test events.Flexible configuration universal tester can be needed according to actual test project in practical applications
The number of device.
Compared with prior art, it includes integration test computer that the test system in the present embodiment is a set of by design, logical
With the test system of test equipment, interface adapter and measured piece, it can realize the automatic test course to measured piece and obtain
Go out test report, the detection of function and performance is fast and accurately carried out to measured piece, improves the production efficiency of measured piece, uses
Stability and maintenanceability.And multiple projects are tested simultaneously using multiple universal testers so that test process
It is more at a high speed and efficient, solve the problems, such as that test event during the test is mostly complicated with test parameter.
It is noted that each module involved in present embodiment is logic module, and in practical applications, one
A logic unit can be a physical unit, can also be a part for a physical unit, can also be with multiple physics lists
The combination of member is realized.In addition, in order to protrude the innovative part of the present invention, it will not be with solution institute of the present invention in present embodiment
The technical issues of proposition, the less close unit of relationship introduced, but this does not indicate that there is no other single in present embodiment
Member.
Third embodiment of the invention is related to a kind of test method, which operates in first or second embodiment
In described test system, detailed process is as shown in Figure 3.
Step 301, integration test computer generates the first test signal and control instruction.
Wherein, integration test computer is used to generate to tested by the input and output and bus interface board of internal configuration
First test signal of part, and the first test signal is transferred to interface adapter；Integration test computer is additionally operable to generate control
System instruction, and by control instruction by testing bus transfer to universal tester.Also, when universal tester is multiple
When, integration test part calculates the arrange parameter that machine transmits test disparity items into different universal testers respectively.Therefore, make
It obtains test process more high speed and efficiently, solves the problems, such as that test event during the test is mostly complicated with test parameter.
In addition, the test bus between integration test computer and universal tester is that Ethernet or general-purpose interface are total
Line or other kinds of bus, not doing restriction herein can be selected according to actual conditions.Therefore integration test computer is
Control instruction is transferred on test equipment by Ethernet or interface bus.Integration test computer can also be by with
Too the first test signal is transferred to interface adapter by net or general purpose interface bus.Here the first test signal is specially quilt
The pumping signal of part is surveyed, measured piece starts to test according to pumping signal.
Step 302, universal tester generates the second test signal according to control instruction.
Wherein, after universal tester receives the control instruction of integration test computer, the is generated according to control instruction
Two test signals, and the second test signal is similar to the effect of the first test signal, and effect is tested measured piece,
It is transmitted directly on universal tester the difference is that the first test signal is the generation of integration test computer, second surveys
Trial signal be generated after universal tester receives the control instruction of integration test computer, therefore the first test signal and
The producing method of second test signal is different, and but the role is the same contributes to test measured piece, therefore embodies
The diversity of test method.
Step 303, after interface adapter carries out conditioning and interface adaptation to test signal, the test signal after conditioning is sent out
Measured piece is given, measured piece is made to generate actual feedback data.
Wherein, interface adapter is used to carry out signal condition and interface according to the first test signal or the second test signal
Adaptation, and by after conditioning the first test signal or the second test signal be transferred to measured piece；Wherein, after measured piece receives conditioning
The first test signal or the second test signal generate actual feedback data, and by actual feedback data be transferred to interface adaptation
Device.
The interface of universal tester is adapted to by interface adapter with the interface of measured piece, and interface adapter, which has, to be opened
The interface conversion equipments such as matrix are closed, by software such as test main frame subsystem defining interface configuration mode, generate control instruction control
Harness switching processed, simplifies the process of wiring, thread-changing.It is completed at the same time the conditioning of test signal so that measured piece can accurately connect
Receive the signal that interface adapter transmits.
Step 304, comprehensive survey is transferred to by different modes after interface adapter improves actual feedback data
Try computer.
Wherein, interface adapter is after receiving actual feedback data, can to actual feedback data that measured piece returns into
Row conditioning, and the actual feedback data after conditioning are transferred to universal tester, universal tester is to actual feedback number
The actual feedback data after conditioning are directly transmitted according to integration test computer or interface adapter is transferred to after being acquired
Pass through actual feedback data caused by test to integration test computer both modes to transmit measured piece.
Step 305, after the actual feedback data after integration test computer acquisition conditioning, test report is generated.
Wherein, integration test computer is additionally operable to the actual feedback data after acquisition conditioning, by the actual feedback after conditioning
Data are compared to obtain test result with the desired value of setting, and generate test report according to test result.Integration test meter
Calculation machine according to specified in testing requirement measured piece feed back correct data and preset in advance has got well desired value, integration test meter
Calculation machine compares the desired value of actual test data and setting after the conditioning of each project, if measured piece is produced by test
Raw actual feedback data are identical as desired value, illustrate that the function items that measured piece is tested are correct, otherwise measured piece is asked
Topic.And test report is formed according to the result of test, in order to which user checks.The failure of measured piece is determined by test report
Situation, and maintenance program is determined according to fault condition, it allows users to fast and accurately repair, therefore improve production
Efficiency and the stability used.
It should be noted that it just for test event can also be for more that the test report obtained, which can be,
A test event, different results is obtained according to the user's choice.For example, a test case be finished after software meeting
Test data is managed to and is filed preservation.Continue to execute next test use if selection carries out the next item down test if user
Example can rerun this item test case one time, if selection is to repeat this item test if the test knot of selection
Beam, then this test execution finish, be directly entered report generation interface.After desired all test cases are finished, report
Test report can be generated according to this test case by accusing generation module.
Compared with prior art, the test method in the present embodiment can be realized to the automatic test course of measured piece simultaneously
It obtains test report, the detection of function and performance is fast and accurately carried out to measured piece, the production efficiency of measured piece is improved, makes
With stability and maintenanceability.And multiple projects are tested simultaneously using multiple universal testers so that tested
Cheng Gengjia is at a high speed and efficient, solves the problems, such as that test event during the test is mostly complicated with test parameter.
Four embodiment of the invention is related to a kind of test method.The test method operates in first or second embodiment
In described test system, detailed process is as shown in Figure 4.Step 402 is to step 406 and third embodiment party in present embodiment
Step 301 in formula has newly increased the process for judging whether self-test and step 407 of step 400 to 401 to 305 roughly the same
Obtain the operating process after test report.
Step 400, judge whether to receive the self-checking command of user.
Wherein, before starting to select test case, integration test computer is judged first, it is determined whether is received
The self-checking command of user.If receiving self-checking command thens follow the steps 401, otherwise, step 402 is executed.
Step 401, self-test is executed.
Wherein, it executes self-test and then enters the self-test that System self-test interface carries out system, include to integration test computer
Software and hardware function is checked, is not finally that test system itself exists to the test result problem of measured piece to confirm
Problem and caused by.
Step 402 is executed after step 401 to 406, wherein step 402 to 406 and the step 301 in 3rd embodiment to
305 is roughly the same, and details are not described herein again.
Step 407, integration test computer determines fault condition and maintenance program according to test report.
Wherein, integration test computer can divide report result while obtaining test report according to test result
Analysis, determine the failure problems present in measured piece, for there are the problem of make a set of rational maintenance program, be supplied to
User.This improves the production efficiency of measured piece, the speed of malfunction elimination, stability in use and maintenanceabilities.
Compared with prior art, the test method in the present embodiment can be realized to the automatic test course of measured piece simultaneously
It obtains test report, the detection of function and performance is fast and accurately carried out to measured piece, the production efficiency of measured piece is improved, makes
With stability and maintenanceability.And multiple projects are tested simultaneously using multiple universal testers so that tested
Cheng Gengjia is at a high speed and efficient, solves the problems, such as that test event during the test is mostly complicated with test parameter.Pass through simultaneously and is
Unite self-test can influence of the removal system built-in problem to result, fault condition and repair side are determined by test report
Case is simultaneously supplied to user, can improve the production efficiency of measured piece, the speed of malfunction elimination, stability in use and maintenanceability.
It will be understood by those skilled in the art that the respective embodiments described above are to realize specific embodiments of the present invention,
And in practical applications, can to it, various changes can be made in the form and details, without departing from the spirit and scope of the present invention.
Claims (9)
1. a kind of test system, which is characterized in that including：Integration test computer, universal tester and interface adapter；
The integration test computer is used to generate to measured piece by the input and output and bus interface board of internal configuration
First test signal, and first test signal is transferred to the interface adapter；The integration test computer is also used
In generation control instruction, and by the control instruction by testing bus transfer to the universal tester；
The universal tester is generated for receiving the control instruction, and according to the control instruction to the measured piece
Second test signal；
The interface adapter is used to carry out signal condition according to first test signal or second test signal and connect
Mouthful adaptation, and by after conditioning first test signal or second test signal be transferred to the measured piece；Wherein,
The measured piece receives first test signal after conditioning or second test signal generates actual feedback data, by institute
It states actual feedback data and is transferred to the interface adapter；
The interface adapter is additionally operable to improve the actual feedback data, by the actual feedback data after conditioning
It is transferred to the universal tester, institute is transferred to after so that the universal tester is acquired the actual feedback data
Integration test computer is stated, or, the actual feedback data after conditioning are transferred directly to the integration test computer；
The integration test computer is additionally operable to acquire the actual feedback data, by the phase of the actual feedback data and setting
Prestige value is compared to obtain test result, and generates test report according to the test result.
2. test system according to claim 1, which is characterized in that the number and test event of the universal tester
It is matched, the different universal testers is for testing different test events.
3. test system according to claim 1 or 2, which is characterized in that the integration test computer is additionally operable to institute
The software and hardware function of stating measured piece checked, according to the test report, determines the fault condition of the measured piece, and according to
The fault condition determines maintenance program, and shows the actual feedback data after conditioning in the form of a list.
4. testing system according to claim 2, which is characterized in that the integration test computer is specifically used for：According to every
The actual feedback data after the corresponding conditioning of a test event, generate the test report.
5. test system according to claim 1, which is characterized in that the integration test computer by test bus with
The universal tester is connected.
6. test system according to claim 5, which is characterized in that the test bus includes：Industry ethernet and logical
Use interface bus.
7. a kind of test method, which is characterized in that be applied to the test system described in claim 1 to 6 any one, the survey
Method for testing includes：
The integration test computer is generated by the input and output and bus interface board of inside configuration to the first of measured piece
Test signal, and first test signal is transferred to the interface adapter；The integration test computer is additionally operable to produce
Raw control instruction, and by the control instruction by testing bus transfer to the universal tester；
The universal tester generates the second test signal to the measured piece according to the control instruction；
The interface adapter carries out signal condition and interface according to first test signal or second test signal
Adaptation, and by after conditioning first test signal or second test signal be transferred to the measured piece；Wherein, described
Measured piece receives first test signal after conditioning or second test signal generates actual feedback data, by the reality
Border feedback data is transferred to the interface adapter；
The interface adapter improves the actual feedback data, and the actual feedback data after conditioning are transferred to
The universal tester is transferred to the synthesis after so that the universal tester is acquired the actual feedback data
Test computer, or, the actual feedback data after conditioning are transferred directly to the integration test computer；
The integration test computer is additionally operable to the actual feedback data after acquisition conditioning, and the reality after conditioning is anti-
Feedback data are compared to obtain test result with the desired value of setting, and generate test report according to the test result.
8. test method according to claim 7, which is characterized in that according to the test result generate test report it
Afterwards, further include：The integration test computer determines the fault condition of the measured piece according to the test report, and according to
The fault condition determines maintenance program, and shows the actual feedback data after conditioning in the form of a list.
9. test method according to claim 7, which is characterized in that the integration test computer passes through inside configuration
Before input and output and bus interface board are generated to the first test signal of measured piece, further include：Judge whether to receive use
The self-checking command at family examines the software and hardware function of the integration test computer if receiving the self-checking command
It looks into；Otherwise first test signal and the control instruction of the self-test generation to the measured piece are skipped.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711459755.8A CN108319516B (en) | 2017-12-28 | 2017-12-28 | Test system and test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711459755.8A CN108319516B (en) | 2017-12-28 | 2017-12-28 | Test system and test method |
Publications (2)
| Publication Number | Publication Date |
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| CN108319516A true CN108319516A (en) | 2018-07-24 |
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