TWI344584B - - Google Patents
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- TWI344584B TWI344584B TW95137874A TW95137874A TWI344584B TW I344584 B TWI344584 B TW I344584B TW 95137874 A TW95137874 A TW 95137874A TW 95137874 A TW95137874 A TW 95137874A TW I344584 B TWI344584 B TW I344584B
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Description
1344584 九、發明說明: 【發明所屬之技術領域】 本發明涉及一種測試方法與系統,尤其是—種取代人工 輸入之量測方法與系統。 【先前技術】1344584 IX. Description of the Invention: [Technical Field] The present invention relates to a test method and system, and more particularly to a measurement method and system for replacing manual input. [Prior Art]
在許多電腦設備的測試中,需要對眾多相關参數、瞬間 訊息進行快速、即時、連續、準確的捕捉與測量,而且需要完 成繁複的資料處理工作。這些測試工作目前大部分需要藉由手 動或人工測試才能完成,換言之,在設備測試方面需要耗費大 量的人力資源。尤其是在新產品測試時’更需要進行大量的基 礎參數測試,也因此大幅降低了工作的效率。 第一 A圖為—種典型傳統測試環境,由測試平台13斑量 測儀器14所組成。測試平台13連接輪入設備12,可供操作 平台”裳設受測_,並依據操 由▲備Μ來!測’操作人員 判斷測試絲。對設置單—受顺備13 ^=, 往往可能斷_入·⑽ 輪 種或多次的數據。 Hi命术取付夕 在測試的過程中, 如果手動或人 工測試的操作非常頻 0608D-A41551tw-100225·完整版 f 5 1344584 繁’通常必須有專人料設備咖應,叫行下—赌的操 作,形成了“人等設備,,的情形,而浪費了人力資源。但是,如 果在某些測試項目的測試過程中要求操作人員的参與度很In the testing of many computer equipment, it is necessary to quickly, immediately, continuously and accurately capture and measure many related parameters and instant messages, and it is necessary to complete complicated data processing work. Most of these tests are currently done by manual or manual testing. In other words, a large amount of human resources is required for equipment testing. Especially in the testing of new products, a lot of basic parameter testing is needed, which greatly reduces the efficiency of the work. The first picture A is a typical traditional test environment consisting of a test platform 13 spot measuring instrument 14. The test platform 13 is connected to the wheel-in device 12, and the operating platform can be used for the operation of the platform. According to the operation, the operator judges the test wire. For the setting list, it is often possible to receive 13 ^=. Broken_in·(10) Round or multiple data. Hi life is in the process of testing, if the manual or manual test operation is very frequent 0608D-A41551tw-100225·Full version f 5 1344584 Traditional 'usually must have someone The equipment and equipment should be called, and the operation of gambling would form a situation of "people and other equipment," and wasted human resources. However, if the test personnel are required to participate in the testing process of some test items,
隨著技術的進步,—些自動測試系統逐漸被應用於上述 之測試流程中。如第—B圖所示,特殊的硬體與軟體⑶可 被加入測試平台13中,並且職平台13可藉由—些適配器 15的速接’從量測設備14得到受測訊號或得到量測設備14 依據文測訊號所產生的量測資料。 傳統的自動測試系統需要在測試平台13運行某些特殊的 常駐程式(軟體133) ’並結合特殊的量測硬體,以期模擬出真 實的運行環境。例如’將需要人1操作之輸人加以程序化以As technology advances, some automated test systems are increasingly being used in the above test procedures. As shown in Fig. B, special hardware and software (3) can be added to the test platform 13, and the platform 13 can obtain the measured signal or the amount from the measuring device 14 by the quick connection of the adapters 15 The measuring device 14 measures the data according to the measurement signal. Traditional automated test systems require certain special resident programs (software 133) to be run on test platform 13 combined with special measurement hardware to simulate a realistic operating environment. For example, 'programming the loser who needs the operation of person 1 to
高,而操作人員的素質不足,往往會造成“設備等人,,的問題, 降低了设傭的利用率。 執行軟體運算來施行;然而測試過程中尚有一些受測訊號需 要里測’因此將需要額外的硬體設備來處理這些受測訊號並回 饋給測試平台。因此’測試平台13除了需要測試受測設備131 外,還需要接收量測資料、執行測試軟體之運算,其中任何一 個環節出錯都可能影響量測結果,而且難以察覺在測試過程中 所產生的非預期錯誤。總而言之,這樣的自動量測系統所模擬 的環境並不是實際真實的環境。 此外,這類的自動量測系統也有著許多的限制,例如傳 0608D-A41551 tw· 100225-完整版 f 6High, and the lack of quality of the operators often leads to "equipment, etc., the problem, reducing the utilization of the commission. Performing software operations to perform; however, some test signals need to be tested during the test" Additional hardware devices will be required to process these tested signals and feed back to the test platform. Therefore, in addition to testing the device under test 131, the test platform 13 needs to receive measurement data and perform test software operations, any of which can be performed. Errors can affect the measurement results, and it is difficult to detect unexpected errors during the test. In summary, the environment simulated by such automatic measurement systems is not the actual real environment. In addition, such automatic measurement systems There are also many restrictions, such as transmission 0608D-A41551 tw· 100225-full version f 6
統的測试方法無法以常駐程式關閉測試平台後,再重新啟動測 、平σ因此,人工的介入還是無可避免的。在需要人工介入 、月形下見式平台將需要另外力口入一些通知操作人員的機 制讓操作人員能及時進行處理,以減少“機器等人,,的情形。 測減平台也有可能在測試過程中發生死機的狀 、要讓處於虽機狀態的測試平台執行通知操作人員的動作並 不合易。因為測試平台一旦當機,所有運算皆會停止,更遠論 通知操作人員。 根據上述魏以及所衍生關題,賴赠要其他減少 需要人工介入的改良,以盡量避免“人等設備,,或“設備等人,,的 2形二另—方面’相關的改良也應該盡量在不需要變動測試平 台的前提下發展’關減_試平针級或罐戦平台這類 工作上的時間與成本。 【發明内容】 、馨於上述之發财景中,為了符合產業上某些利益之需 求,本發明提供-種自動測試方法與系統可用以解決上述傳統 之自動測試方法與系統未能達成之標的。 本發明之-目的係降低人I参與度,本發明之自動測試 方法與线改良了錄㈣人工手動量·備(如示波器) 二由人為判斷測试結果之傳統測試方法,將測試步驟完全簡單 0608D-A41551 tw-100225-完整版 f 7 化、程序化,具有良好的可重複性。 本發明之另一目的係採用一種純外部的方法,對測試平 台不引入任何的外部干擾,以確保量測結果的真實性。 此外,本發明由於採用計算機通用的輸出/輸入介面,因 此只要根财同的賴修改控料算機上錄體。系統所 需要的時職短’並具有良好的升級性及擴紐,可以用於大 夕數计舁機插卡電性能的測試。 據此’本發明之一具體實施例提出一種鍵盤/滑鼠模擬 器’可用以模擬-鍵盤或一滑鼠,或者同時模擬兩者。並且在 本發明之自_試方法⑽、統中,具有上述之鍵盤/滑鼠 模擬器之功能的模擬設備,做為計算機控制測試平台之輸入設 備,以控細m料戦受戦備錄體。雜由量測設備量 測測試平台或受測設備之受測訊號後產生量測資料給計算 機,計算機可依據量職料調整量測設備之量測範圍。 【實施方式】 本發明在此所探討的方向為__種自動賴方法與系統。 為了能徹底地瞭解本發明’將在下列的描述中提出詳盡的步驟 及其組成。賴地’本發_施行並未限定於自_試方法斑 系統之技藝者所熟習的特殊細節。另一方面,眾所周知的組成 或步驟並未描述於細節中,以避免造成本發明不必要之限制。 0608D-A41551 tw-100225-完整版 f 8 1344584 本發明的較佳實施例會詳細描述如下,然而除了這些詳細描述 之外’本發㈣可以廣泛地施行在其_實施辦,且本發明 的範圍不受限定,其以之後的專利範圍為準。 參考第二A圖所示,本發明之—具體實施例係一種自動 測試系統’包含—控制計算機2】…模擬設備22、-測試平 台23、一量測設備24。The system test method can't restart the test platform with the resident program, and then restart the test and level σ. Therefore, manual intervention is inevitable. In the case of manual intervention, the moon-shaped platform will require additional mechanisms to notify the operator to enable the operator to process in time to reduce the situation of “machines, etc.. The platform may also be in the process of testing. In the event of a crash, it is not easy to let the test platform in the state of the machine perform the notification to the operator. Because the test platform is down, all calculations will stop, and the operator will be notified further. Regarding the issue, I would like to make other improvements that require manual intervention to try to avoid "people and other equipment, or "equipment, etc., the 2 shape and the other - aspects" related improvements should also try not to change the test platform. Under the premise of the development of 'cutting down _ flattening needle level or canned platform such work time and cost. [Summary of the content], Xin in the above-mentioned financial scene, in order to meet the needs of certain interests in the industry, this The invention provides an automatic test method and system that can be used to solve the above-mentioned problems of the conventional automatic test method and system. - The purpose is to reduce the participation of human I, the automatic test method and the line improvement of the present invention (4) manual manual quantity and preparation (such as an oscilloscope) 2. The traditional test method for judging the test result by human beings, the test step is completely simple 0608D- A41551 tw-100225-full version is well-programmed and has good repeatability. Another object of the present invention is to use a pure external method to introduce no external interference to the test platform to ensure measurement results. In addition, the present invention adopts a computer-wide output/input interface, so as long as the roots of the same money are modified to control the recording on the computer, the system requires a short job and has a good upgradeability and expansion. The button can be used for the test of the electrical performance of the card. According to this embodiment of the present invention, a keyboard/mouse simulator can be used to simulate a keyboard or a mouse, or simultaneously simulate And in the self-test method (10) of the present invention, the analog device having the function of the keyboard/mouse simulator described above is used as an input device of the computer controlled test platform. The control unit is used to measure the measurement volume of the test platform or the device under test, and the measurement data is generated by the measurement device to the computer. The computer can adjust the measurement range of the measurement device according to the quantity of the material. [Embodiment] The present invention is directed to a method and system for automatic immersion. In order to fully understand the present invention, detailed steps and compositions thereof will be presented in the following description. The implementation is not limited to the specific details familiar to those skilled in the art from the method of the method. On the other hand, well-known components or steps are not described in detail to avoid unnecessarily limiting the present invention. 0608D-A41551 Tw-100225-Full version f 8 1344584 The preferred embodiment of the present invention will be described in detail below, however, in addition to these detailed descriptions, 'the present invention (4) can be widely implemented in its implementation, and the scope of the present invention is not limited, It is subject to the scope of the patents that follow. Referring to Figure 2A, the embodiment of the present invention is an automatic test system 'includes - control computer 2'... analog device 22, test platform 23, and measurement device 24.
模擬設備22分別連接控制計算機21與測試平台23,負 責將控制計算機21輸出之命料號212解譯為輸入訊號咖 鍵盤輸人介面、滑·人介面、㈣埠(如印表鱗)、序列蜂 (如廳2蟫、顧5埠)、聰蟑、赃⑽璋、紅外線谭、The simulation device 22 is connected to the control computer 21 and the test platform 23, respectively, and is responsible for interpreting the serial number 212 outputted by the control computer 21 into an input signal coffee keyboard input interface, a sliding human interface, (4) 埠 (such as a printed scale), a sequence. Bees (such as the hall 2 蟫, Gu 5 埠), Cong 蟑, 赃 (10) 璋, infrared Tan,
並將輸入訊號222輸入至測試平台23。換言之,模擬設備^ 係測試平台23之輸入裝置,其連接於職平台23之輸出/輸 入介面,此輸入介面可以是任何算機之輸出/輸入介面,例如: 網路連接料等。藉此,顯設備22可賴触何連接於這 些輸出/輸人介爾置’例如:鍵盤、滑鼠、印表機、數據 機、網路設備等等。 模擬設備22可以控制測試平台23之電源開關。 換5之’杈擬設備22可依據命令訊號212開糊_試平台^。 入同樣地,模擬設備22連接於控制計算機21之輪織入 "面上述之輸出/輸入介面亦可以是任一種類之計算機輸出/ 0608D-A4】551 tw-100225-完整版 f 9The input signal 222 is input to the test platform 23. In other words, the analog device is an input device of the test platform 23, which is connected to the output/input interface of the platform 23, and the input interface can be an output/input interface of any computer, such as: a network connection material. Thereby, the display device 22 can be connected to these output/input devices, such as a keyboard, a mouse, a printer, a data machine, a network device, and the like. Analog device 22 can control the power switch of test platform 23. For the 5th device, the device 22 can be opened according to the command signal 212. Similarly, the analog device 22 is connected to the wheel weaving of the control computer 21. The above-mentioned output/input interface can also be any kind of computer output / 0608D-A4] 551 tw-100225-full version f 9
制計算機21接受命令訊號212與輸出該輸入訊號瓜至測試 平台23。 1344584 在本具體實施例之-較佳範例中,模擬設備22係一鍵盤 核擬盗’可連接於計算機之鍵盤輸入介面,例如:ps/2介面或 USB界面’輯賴擬n輸人能輸出—趣對難輸入介面 之所有輸人賴;。在本具體實關之另—較佳範例中,模擬設 備22係-滑鼠模擬器’可連接於計算機之滑鼠輸入介面,例 如:PS/2介面或聰界面,此滑鼠模擬器輸入能輸出一滑鼠 對滑鼠輸入介面之所有輸入訊號。在本具體實施例之又一較佳 範例中’類設備m難及滑鼠模㈣,魏盤及滑鼠 模擬器可睛連接或部份連接上述之鍵盤輸人介©或滑鼠輸 入"面’並因應所連接之輸人界面達成上狀鍵雜擬器及滑 鼠模擬器之全部或部份功能’亦即該鍵盤及滑鼠模擬器可依據 命令訊號模擬鍵盤或滑鼠之訊號。 第二B圖為一種上述之鍵盤/滑鼠模擬器之示意圖,包含 口p 7訊號輸入接π 22卜-可編程微控制|| 223、_鍵盤/滑 鼠接口 225、-採樣器227。命令訊號輸入接〇 221用來接收 上述之"Ρ令訊號212 ’所接收之命令訊號212經由可編程微控 10The computer 21 accepts the command signal 212 and outputs the input signal to the test platform 23. 1344584 In the preferred embodiment of the present embodiment, the analog device 22 is a keyboard core pirate interface that can be connected to a computer, such as a ps/2 interface or a USB interface. - Interesting in all the input of the difficult input interface; In another embodiment of the present invention, the analog device 22-mouse simulator can be connected to a mouse input interface of a computer, such as a PS/2 interface or a smart interface, and the mouse simulator can input Outputs all input signals from the mouse to the mouse input interface. In another preferred embodiment of the present embodiment, the 'device type m is difficult and the mouse mode (4), the Wei disk and the mouse simulator are connected or partially connected to the above keyboard input or mouse input " The face 'and all or part of the functions of the upper key simulator and the mouse simulator are connected according to the connected input interface'. That is, the keyboard and mouse simulator can simulate the keyboard or mouse signal according to the command signal. Figure 2B is a schematic diagram of a keyboard/mouse simulator as described above, including port p 7 signal input π 22 - programmable micro control | | 223, _ keyboard / mouse interface 225, - sampler 227. The command signal input port 221 is configured to receive the command signal 212 received by the above-mentioned "decryption signal 212' via the programmable micro control 10
制器223轉譯為輸入訊號222並傳送至測試平台23。採樣器 227可用來接收並反應測試平台23所回饋之訊號,例如測試 平台23可藉由回饋訊號的電位表示鍵盤上的“Num L〇ck,,(數 字鍵鎖定功能鍵)是否啟動。 如上述,模擬設備22可由控制計算機21接收一命令訊 號212,將命令訊號212轉譯為一輸入訊號222後輸出至測試 平台23之輸入介面。據此,模擬設備22可具有一轉譯元件, 該轉譯元件負貴將上述之命令訊號212轉譯為輸入訊號222。 因此轉譯元件可以利用硬體或軟體來達成上述之轉譯功 能。例如,轉譯元件可以利用一查表(1〇〇kuptabIe)電路,該查 表電路依據命令訊號212輸出輸入訊號u222。又例如轉譯元件 可以運算-軟體’該軟體湘—查表索引出相應於命令訊號 212之輸入訊號222 ’該軟體與查表可以儲存於一儲存元件。 上述之儲存元件可財—_躲記賴、—唯讀記憶體、一 韌體、-快閃記憶體、一磁碟(包含軟碟或硬碟)、一光碟或其 他相關之電子儲存媒體。 在本具體實_之—較佳範财,上述之查表電路或查 表可以有複數個’亦即轉譯元件有複數個查表電路或查表可供 k擇。其選擇方式可以由_切換電路或命令訊號扣來達成。 2如’切換電路可以是—多工器(multipl叫,由多工器選擇 、中一個查表電路或查表。多工器可由一切換開關或命令訊號 608D-A41551 tw-100225-^^j® fThe controller 223 translates into an input signal 222 and transmits it to the test platform 23. The sampler 227 can be used to receive and reflect the signal fed back by the test platform 23. For example, the test platform 23 can indicate whether the "Num L〇ck," (digital key lock function key) on the keyboard is activated by the potential of the feedback signal. The analog device 22 can receive a command signal 212 from the control computer 21, and translate the command signal 212 into an input signal 222 and output it to the input interface of the test platform 23. Accordingly, the analog device 22 can have a translation component, and the translation component is negative. The above-mentioned command signal 212 is translated into the input signal 222. Therefore, the translation component can use hardware or software to achieve the above-mentioned translation function. For example, the translation component can utilize a look-up table (1〇〇kuptabIe) circuit, the look-up circuit The input signal u222 is output according to the command signal 212. For example, the translation component can be operated-software. The software-inspection index indexes the input signal 222 corresponding to the command signal 212. The software and the look-up table can be stored in a storage component. Storage components can be wealth--hidden, - read-only memory, a firmware, - flash memory, a disk (including soft Or a hard disk), a compact disc or other related electronic storage medium. In this embodiment, the above-mentioned look-up circuit or look-up table may have a plurality of 'that is, the translated component has a plurality of look-up tables or The lookup table can be selected. The selection method can be achieved by the _switching circuit or the command signal button. 2 For example, the 'switching circuit can be multiplexer (multipl called, selected by multiplexer, one of the table lookup circuits or check) Table. The multiplexer can be switched by a switch or command signal 608D-A41551 tw-100225-^^j® f
212來决定所要選擇的查表電路或查表。切換開關可以是轉譯 7L件之一電子元件,可藉由手動設定或命令訊號212來設定。 另外’上述之命令訊號可包含一查表代碼,轉譯元件依據查表 代碼所相應之查表電路或查表將命令訊號212轉譯為輸入訊 號 222。 上述之命令訊號212可以是一連串字元或滑鼠命令訊 號。因此在命令訊號與輸入訊號222的轉譯上可以是以一個字 元或滑鼠命令訊號對映一個輸入訊號,或是以該一連串字元或 滑鼠命令訊號轉譯為一輸入訊號或一連串的輸入訊號,本發明 並不加以限制。 因此,測試平台23由模擬設備22所收到輸入訊號222 便如同人工手動操作一般,其優點為人工輸入的過程可以完全 由控制計魏21紐模擬設備22所取代。财之,根據本說 明書所揭露之技術,賴平纟23錢行職加⑷、關機 (shutdown)、系統復位(reset)、輸入資料或其他相關之操作時, 完全避免了測試平台等待人工輸入的時間,進而可大幅增加工 作效率’並避免因人工輸入所造成的延誤。 測試平台23可用以測試一受測標的,該受測標的可以是 受測ax備231、一受測軟體233或同時包含測試受測設備μ 1 與受測軟體233,當受測標的為受測軟體233或同時包含測試 受測設備231與受測軟體233時’受測軟體233係由測試平台 0608D-A41551tw-100225-完整版 f 12212 to determine the look-up circuit or look-up table to be selected. The switch can be one of the electronic components of the 7L, which can be set by manually setting or commanding the signal 212. In addition, the above command signal may include a lookup table code, and the translation component translates the command signal 212 into the input signal 222 according to the lookup circuit or lookup table corresponding to the lookup table code. The command signal 212 described above may be a series of character or mouse command signals. Therefore, in the translation of the command signal and the input signal 222, an input signal can be mapped by a character or a mouse command signal, or the serial signal or the mouse command signal can be translated into an input signal or a series of input signals. The invention is not limited. Therefore, the input signal 222 received by the test platform 23 by the analog device 22 is similar to manual manual operation. The advantage is that the manual input process can be completely replaced by the control device Wei 21 New Analog Device 22. According to the technology disclosed in this specification, when Lai Pingyi 23 money service (4), shutdown, system reset (reset), input data or other related operations, the test platform is completely avoided from waiting for manual input. Time, which in turn can greatly increase work efficiency' and avoid delays caused by manual input. The test platform 23 can be used to test a test target, which can be the measured test device 231, a test software 233 or both the test device under test μ 1 and the test software 233, when the test object is tested. When the software 233 or both the test device 231 and the software to be tested 233 are included, the software 233 under test is tested by the platform 0608D-A41551tw-100225-full version f 12
23執行運算。此外’受測軟體233係經由測試平台23與受測 設備231進行通訊。再者’受測軟體233可以是受測設備23! 之驅動程式或應用程式。 受測設備231與測試平台23的連接可以為接觸式或非接 觸式’亦即叉測设備231可以連接於測試平台23所提供之介 面(如上述之輸出/輸入介面或任何匯流排介面),或是以無線傳 輸方式與測试平台23通訊。換言之,受測設備231與測試平 〇 23在/1 以過程巾可以達成訊朗的通訊,無論是接觸式或 非接觸式,本發明並不加以關。上述之匯流排介面可以是 PCI匯流排、EISA匯流排、ISA匯流排或其他規格之匿流排。 在測試過程中,量測設備24會量測測試平台23或受測 设備231之一個或多個受測訊號232,受測訊號232可以是由 測試平台23產生,亦可以是由受測設備231所產生。換言之, 里測设備24可由測試平台23或受測設備231之一條或多條線 路量測受測訊號。因此本具體實施例之量測設備24可能有一 個或多個,每一個量測設備24可同時量測一個或多個受測訊 號232,本發明不限制受測訊號232、量測設備24以及單一量 測設備24可量測之受測訊號232的種類與數量。 量測設備24依據受測訊號232產生量測資料242,並且 將量測資料242傳送至控制計算機21 ’控制計算機21便可以 依據量測資料242發出命令訊號212進行下一階段之測試。因 0608D-A41551tw-100225·完整版 f 13 mmm 此,量測設備24可以是以探針(PR〇BE)、量測接腳、非接觸 式(如紅外線測溫)來量測受測訊號232。同樣地,量測設備 24與控制計算機21 _連接亦可以是朝接口總線(G_]23 performs the operation. Further, the software 233 under test communicates with the device under test 231 via the test platform 23. Furthermore, the tested software 233 may be a driver or application of the device under test 23!. The connection between the device under test 231 and the test platform 23 can be contact or non-contact, that is, the device 231 can be connected to the interface provided by the test platform 23 (such as the output/input interface or any bus interface described above). Or communicate with the test platform 23 by wireless transmission. In other words, the device under test 231 and the test pad 23 can achieve communication with the process towel in the process towel, whether in contact or non-contact, the invention is not related. The bus interface described above may be a PCI bus, an EISA bus, an ISA bus, or other specifications. During the test, the measuring device 24 measures one or more of the tested signals 232 of the test platform 23 or the device under test 231. The measured signal 232 may be generated by the test platform 23 or by the device under test. 231 produced. In other words, the measuring device 24 can measure the measured signal by one or more lines of the test platform 23 or the device under test 231. Therefore, the measuring device 24 of the specific embodiment may have one or more, each measuring device 24 may simultaneously measure one or more measured signals 232, and the present invention does not limit the measured signal 232, the measuring device 24, and The single measurement device 24 can measure the type and quantity of the signal 232 under test. The measuring device 24 generates the measurement data 242 according to the signal to be tested 232, and transmits the measurement data 242 to the control computer 21'. The control computer 21 can issue the command signal 212 according to the measurement data 242 for the next stage of testing. Since 0608D-A41551tw-100225·full version f 13 mmm, the measuring device 24 can measure the signal to be tested 232 by probe (PR〇BE), measuring pin, non-contact type (such as infrared temperature measurement). . Similarly, the measuring device 24 and the control computer 21_ can also be connected to the interface bus (G_]
Pmpose Interface Bus; Gpffi)25、或上述之輸出輸入介面或匯流 排介面。 ^另方® ’根據本實施例之自動測試系統的連接模式/訊 號傳遞模式亦可以如第二c圖所示。量測設備24可以是透過 模擬設㈣與控斷算機21連接,亦即上述之接口總線 25、或上述之輸出輸人介面賴流排介面係連胁模擬設備 22 ’由模擬設備負責控制計算機21與量測設備%之間的通 訊’如第二C所示。再者,測試平台23亦可以藉由模擬設備 22與控制汁算機21通訊,或回饋受測訊號挪給控制計 2卜 # 此外’控制計算機21除了依據量測資料242發出命令訊 號外,亦可贿據量測資料調整量測設備24。例如,當受測 訊號232超出量測設備24目前所設定的量測範圍時,控制計 算機21便可發出調整訊號214以調整量測範圍之設定。 據此,本發明之另-具體實施例係—種自動測試方法, 如第三圖示。魏如步驟31G所示,由—計算機發出_命令訊 號至-模擬設備。然後如步驟32〇所示,模擬設儀依據前述之 命令訊號送出-輸入訊號至測試平台。接下來,如步驟咖所 0608D-A41551tw-l〇〇225-完整版 f 14Pmpose Interface Bus; Gpffi) 25, or the above output input interface or bus interface. ^Others' The connection mode/signal transmission mode of the automatic test system according to this embodiment can also be as shown in the second c-picture. The measuring device 24 may be connected to the control computer 21 through the analog device (4), that is, the above-mentioned interface bus 25, or the above-mentioned output input interface, the upstream interface, and the analog device 22' is controlled by the analog device. Communication between 21 and the measuring device % is as shown in the second C. Furthermore, the test platform 23 can also communicate with the control juice machine 21 by the analog device 22, or feed back the measured signal to the control meter 2b. In addition, the control computer 21 sends a command signal according to the measurement data 242. The measurement device 24 can be adjusted according to the measurement data. For example, when the signal under test 232 exceeds the measurement range currently set by the measuring device 24, the control computer 21 can issue an adjustment signal 214 to adjust the setting of the measurement range. Accordingly, another embodiment of the present invention is an automated test method, such as the third illustration. Wei, as shown in step 31G, sends a _ command signal to the analog device. Then, as shown in step 32, the analog device sends and receives signals to the test platform according to the aforementioned command signals. Next, as step coffee shop 0608D-A41551tw-l〇〇225-full version f 14
示’測試平台依據輸入訊號測試一受測設備並產生受測訊號。 再接下來如步驟340所示,量測設備依據受測訊號產生量測資 料並送至計算機,最後如步驟35〇所示,計算機分析量測資料 並進行下一步驟之測試。 本具體實施例之計算機、模擬設備、測試平台、量測設 備及其間相關之訊號如:命令訊號、輸入訊號、受測訊號、量 測資料之相關細節皆如前一實施例與第二A圖或第二C圖所 示’在此不再贅述。 上述第二A圖、第二C圖與第三圖之計算機可具有一軟 體,計算機依據該軟體進行測試,因此在該軟體之運算期間, 計算依據該軟體發出命令訊號與調整量測設備。上述軟體之流 程可以如本發明之再一具體實施例所示,係一自動量測方法, 請参照第四圖。 首先’如步驟510所示,初始化量測設備與測試平台, 以進入測試流程(步驟520至步驟600)。之後如步驟520所示, 計算機以命令訊號透過模擬設備對測試平台設定一數位/類比 轉換器之参數,經過一段延遲時間(如步驟530所示),再由計 算機從量測設備讀取數位/類比轉換器之電壓(如步驟54〇所 示)’並將量測資料儲存(如步驟550所示)。之後,增加數位/ 類比轉換器之参數(如步驟560所示),並比較量測資料是否超 出量測設備之顯示範圍(如步驟570所示),如果大於量測設備 0608D-A41551 tw-100225-完整版 f 15 之頑示範圍,計算機需要發出調整訊號以調整量測設備之量測 範圍(如步驟58〇所示),並等待一段延遲時間(如步驟590所 不)。如果沒有大於量測設備之顯示範圍,檢查是否達到量測 之最大值(如步驟600所示),如果達到量測之最大值,則測試 結束。如果尚未達到量測之最大值,重複上述之測試流程(步 驟520至步驟6〇〇;)。 由上述流程可以得知,計算機依次送出複數個命令訊 號’每一次命令訊號發送後量測設備會產生相應於該命令訊號 之量測資料’並且計算機係於收到相應於命令訊號之量測資料 後送出下一個命令訊號。另外’上述之計算機係於下-次命令 訊號送出前送出調整訊號。 例如,以本發明來量測計算機顯示卡模擬量輸出DAc的 線性度為例,所需要量測的物理量為3個顏色通道(r、g、b)dac 的輸出電壓隨輸入數據的變化特性。依據上述流程,首先初始 化量測設備朗試平台,然後進人戦流程。在職流程中計 算機反覆以命令訊號透過模擬設備對測試平台設定—數位/類 比轉換盗之参數,例如測試流程共經過21。次,每次參數遞增 一增量’直到参數值達到量測之最大值為止。每次的測試流程 中’數位/類比轉換器之参數在被設定後約延遲2〇秒,以便 DAC的輸出電難、定’並進行多次採樣去除噪軸如),還 能讓計算機能夠有足夠的時間從量測設備讀取應的輪出電 0608D-A41551 tw· 100225-完整版 f 16 壓,並且儲存起來。另外,每次的測試流程中,計算機需要檢 查量測設制量_’料輪_超输細= 便需要發㈣魏賴整量測設備的量程,以符合實際需求 =測設備後,另外需要延遲—段時間,以避免量 尚未調整完畢前獻τ—次_試流程。 本發明之自齡m方法射、紐良了以往如人工手動 調整篁測賴(如示波器)並由人為判斷測試結果之傳統測試 方法,將顧步觀全簡單化、料化,具妓好的可重複性。 人,、要根據要求編製好相應的控_序,就㈣讓整個輸入過 程全自動進行,不需要人再進行干預,㈣減低了人的勞動程 度本發月可以自動調整儀器参數並且可以自動計時,並在測 試時間終了後由系統判定測試結果,可防止人為操作不當或因 測試時間鱗科動果失效,以制祕㈣的效果。 發月之實現方案簡單’成本低,只需要將模擬設備連 接原有測試平㈣㈣輸人介面就可正常玉作,不需要額外 的硬體’也不需制測試平台做任何修改,可以充分地利用現 有設備的功能,減少設備成本的投入。 傳統的自動測辩、統f要在職料運行某些特殊的常 駐程式’魏完倾贿真實的運親境。本減係一種純外 邻的1法對測4平台不引入任何的外部干擾,確保量測結果 的真實f例如傳統的測試方法無法以常駐程式關閉測試平 0608D-A41551tw-100225-完整版 f 台後,再重新啟動測試平台,本發明可藉由模擬設備達成該 操作。 ~項 此外,本發明由於採用計算機通用的輸出/輸入介面,因 此只要根據不同的測試修改控制計算機上的軟體,開發系統所 需要的時間很趙,並具有良好的升級性及擴充性,可以用於大 多數計算機插卡電性能的測試。 顯然地,依照上面實施例中的描述,本發明可能有許多 的修正與差異。因此需要在其附加的權利要求項之範圍内加以 理解,除了上述詳細的描述外,本發明還可以廣泛地在其他的 實施例中施行。上述僅為本發明之較佳實施例而已,並非用以 限定本發明之申請專利範圍;凡其它未脫離本發明所揭示之精 神下所完成的等效改變或修飾,均應包含在下述申請專利範圍 内。 【圖式簡單說明】 第一A圖與第一B圖係為先前技術之示意圖; 第二A圖與第二B圖係為一本發明之一具體實施例之功 能方塊不意圖, 第二C圖係第二A圖之另一實施方式之功能方塊示意圖; 第三圖係本發明之另一具體實施例之流程示意圖;以及 第四圖係本發明之再一具體實施例之流程示意圖。 0608D-A41551tw-100225-完整版 f 18 1344584 【主要元件符號說明】 12輸入設備 13測試平台 131受測設備 14量測設備 15適配器 21控制計算機 212命令訊號 214調整訊號 22模擬設備 221命令訊號輸入接口 222輸入訊號 223可編程微控制器 225計算機鍵盤/滑鼠接口 227採樣器 23測試平台 231受測設備 232受測訊號 233受測軟體 24量測設備 25通用接口總線 0608D-A4155 Itw-100225-完整版 fThe test platform tests a device under test based on the input signal and generates a signal to be tested. Then, as shown in step 340, the measuring device generates the measurement data according to the measured signal and sends it to the computer. Finally, as shown in step 35, the computer analyzes the measurement data and performs the test of the next step. The related details of the computer, the analog device, the test platform, the measuring device and the related signals such as the command signal, the input signal, the measured signal, and the measurement data are as in the previous embodiment and the second A picture. Or as shown in the second C diagram, 'will not repeat here. The computer of the second A diagram, the second C diagram and the third diagram may have a software, and the computer performs testing according to the software. Therefore, during the operation of the software, the calculation is performed according to the software to issue a command signal and adjust the measurement device. The process of the above software can be an automatic measurement method as shown in still another embodiment of the present invention. Please refer to the fourth figure. First, as shown in step 510, the measurement device and the test platform are initialized to enter the test flow (steps 520 to 600). Then, as shown in step 520, the computer sets the parameters of the digital/analog converter to the test platform through the analog device through the command signal, after a delay time (as shown in step 530), and then the computer reads the digits from the measuring device/ The voltage of the analog converter (as shown in step 54) is stored and the measurement data is stored (as shown in step 550). Thereafter, the parameters of the digital/analog converter are increased (as shown in step 560), and the measured data is compared to the display range of the measuring device (as shown in step 570), if greater than the measuring device 0608D-A41551 tw-100225 - The intrinsic range of the full version f 15 , the computer needs to issue a tuning signal to adjust the measurement range of the measuring device (as shown in step 58 )), and wait for a delay time (as in step 590). If there is no greater than the display range of the measurement device, check if the maximum value of the measurement is reached (as shown in step 600), and if the maximum value of the measurement is reached, the test ends. If the maximum value of the measurement has not been reached, repeat the above test procedure (steps 520 to 6;). It can be known from the above process that the computer sequentially sends a plurality of command signals. 'After each command signal is sent, the measuring device generates measurement data corresponding to the command signal' and the computer receives the measurement data corresponding to the command signal. Then send the next command signal. In addition, the above computer sends the adjustment signal before the next-order command signal is sent. For example, taking the linearity of the computer display card analog output DAc by the present invention as an example, the physical quantity required to be measured is the variation characteristic of the output voltage of the three color channels (r, g, b) dac with the input data. According to the above process, the measurement device is first initialized and the platform is tested. In the in-service process, the computer repeatedly uses the command signal to set the parameters of the test platform through the analog device—digital/analog conversion parameters, for example, the test process passes through 21. Once, each parameter is incremented by an increment ' until the parameter value reaches the maximum value of the measurement. In each test flow, the parameters of the 'digital/analog converter are delayed by about 2 seconds after being set, so that the output of the DAC is hard, set and multi-sampled to remove the noise axis, etc., and the computer can have Sufficient time to read the appropriate wheel output from the measuring device 0608D-A41551 tw· 100225-full version f 16 pressure, and store it. In addition, each time the test process, the computer needs to check the measurement system _'dray_super-transmission==you need to send (4) Wei Lai's measuring range of the measuring equipment to meet the actual demand = after measuring the equipment, in addition Delay - a period of time to avoid the τ-time_test process before the quantity has not been adjusted. The self-aged m method of the present invention, the new test method of the manual test such as manually adjusting the 篁 赖 (such as an oscilloscope) and judging the test result by human beings, the simplification and materialization of the Gubu view are all good. Repeatability. People, according to the requirements to prepare the appropriate control _ sequence, (4) let the entire input process fully automatic, no need to intervene again, (four) reduce the labor level of the person can automatically adjust the instrument parameters and can automatically time And after the end of the test time, the system determines the test result, which can prevent the artificial operation or the failure of the test time, and the effect of the secret (4). The realization plan of the month is simple 'cost is low, only need to connect the analog equipment to the original test flat (4) (four) the input interface can be normal jade, no additional hardware is required, and no test platform is required to make any modifications, which can be fully Reduce the cost of equipment by leveraging the capabilities of existing equipment. The traditional automatic test and defense system must run some special resident programs in the material industry. This reduction is a pure external neighboring method. It does not introduce any external interference to the 4 platform, ensuring the true f of the measurement results. For example, the traditional test method cannot be closed with the resident program. Flat 0608D-A41551tw-100225-Full version f Thereafter, the test platform is restarted, and the present invention can achieve the operation by the analog device. In addition, the present invention adopts a computer-wide output/input interface, so as long as the software on the computer is modified according to different tests, the time required to develop the system is very good, and has good upgradeability and expandability, and can be used. Tested for electrical performance of most computer cards. Obviously, many modifications and differences may be made to the invention in light of the above description. It is therefore to be understood that within the scope of the appended claims, the invention may be The above are only the preferred embodiments of the present invention, and are not intended to limit the scope of the claims of the present invention; all other equivalent changes or modifications which are not departing from the spirit of the present invention should be included in the following claims. Within the scope. BRIEF DESCRIPTION OF THE DRAWINGS The first A diagram and the first B diagram are schematic diagrams of the prior art; the second A diagram and the second B diagram are a functional block of a specific embodiment of the invention, not intended, the second C BRIEF DESCRIPTION OF THE DRAWINGS FIG. 3 is a functional block diagram of another embodiment of the present invention; FIG. 3 is a flow chart showing another embodiment of the present invention; and FIG. 4 is a flow chart of still another embodiment of the present invention. 0608D-A41551tw-100225-Full version f 18 1344584 [Main component symbol description] 12 input device 13 test platform 131 device under test 14 measurement device 15 adapter 21 control computer 212 command signal 214 adjustment signal 22 analog device 221 command signal input interface 222 input signal 223 programmable microcontroller 225 computer keyboard / mouse interface 227 sampler 23 test platform 231 device under test 232 test signal 233 tested software 24 measurement device 25 general interface bus 0608D-A4155 Itw-100225- complete Edition f
242量測資料 310 —計算機發出一命令訊號至一模擬設備 320模擬設備依據命令訊號送出一輸入訊號至測試平台 330測試平台依據輸入訊號測試一受測設備並產生受測訊號 340量測設備依據受測訊號產生量測資料並送至計算機 350计鼻機分析量測資料並進行下一步驟之測試 510初始化量測設備與測試平台 520設定一數位/類比轉換器之參數 530延遲 540讀取數位/類比轉換器之電壓 550儲存量測資料 560增加數位/類比轉換器之參數 570比較量測資料是否大於量測設備之顯示範圍 580調整量測設備之量測範圍 590延遲 600檢查是否達到量測之最大值 0608D-A4155ltw-10〇225-完整版 f 20242 Measured data 310 - The computer sends a command signal to an analog device 320. The analog device sends an input signal to the test platform according to the command signal. The test platform tests a device under test according to the input signal and generates a signal to be measured 340. The test signal generates measurement data and sends it to the computer 350. The nose machine analyzes the measurement data and performs the test of the next step. The initialization measurement device and the test platform 520 set a parameter of the digital/analog converter 530 delay 540 reading digits/ Analog converter voltage 550 storage measurement data 560 increase the number / analog converter parameter 570 comparison measurement data is greater than the measurement device display range 580 adjustment measurement equipment measurement range 590 delay 600 check whether the measurement is reached The maximum value is 0608D-A4155ltw-10〇225-full version f 20
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CN108319516A (en) * | 2017-12-28 | 2018-07-24 | 上海科梁信息工程股份有限公司 | A kind of test system and test method |
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