CN108241353B - Function test clamp for electronic controller - Google Patents
Function test clamp for electronic controller Download PDFInfo
- Publication number
- CN108241353B CN108241353B CN201611214937.4A CN201611214937A CN108241353B CN 108241353 B CN108241353 B CN 108241353B CN 201611214937 A CN201611214937 A CN 201611214937A CN 108241353 B CN108241353 B CN 108241353B
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- CN
- China
- Prior art keywords
- clamping mechanism
- plate
- interlocking
- electronic controller
- probe assembly
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The invention discloses a function test fixture of an electronic controller, which comprises: the device comprises a first clamping mechanism, a second clamping mechanism and an interlocking mechanism; the first clamping mechanism and the second clamping mechanism clamp a first tested port and a second tested port which are located in different directions of the same electronic controller under the driving of external force, and the clamping sequence of the first tested port and the second tested port is determined by the interlocking mechanism. The invention can clamp the electronic controller with more than two test connection ports facing different directions, and is suitable for normal temperature test and high temperature test of the electronic controller. The invention has the advantages of simple structure, small overall dimension, light weight, convenient transportation, convenient field use and low manufacturing cost.
Description
Technical Field
The invention relates to the field of electronics, in particular to a function test clamp of an electronic controller, which is used for connecting a test port of the electronic controller when the electronic controller performs function test.
Background
The functional test of the electronic controller is divided into two steps, namely, the functional test is carried out on a Printed Circuit Board Assembly (PCBA) of the controller at normal temperature and the functional test is carried out on a product assembled with a shell at high temperature. Since components on the PCBA can only withstand slight stresses during testing, which would otherwise increase the risk of potential product failure, a product having more than two test connection ports (e.g., more than two connectors) oriented in different directions (as shown in fig. 1) is provided. The existing clamp is very complex in structure and difficult to debug, the later maintenance and the maintenance of the clamp are also very inconvenient, two different clamps are required for respectively clamping the PCBA and a product with a shell in normal-temperature testing and high-temperature testing, the existing clamp is more used for automatic production equipment, and the existing clamp is not suitable for manual operation and is not convenient for single-product testing. If the orientation of the connection port tested by the electronic controller changes, the overall design of the automation equipment needs to be changed, so that the applicability of the existing clamp structure is limited.
Disclosure of Invention
The invention aims to solve the technical problem of providing an electronic controller function test fixture which can clamp an electronic controller with more than two test connection ports and the test connection ports facing different directions.
The invention aims to solve another technical problem of providing the electronic controller function test fixture which is suitable for normal-temperature test and high-temperature test of the electronic controller.
In order to solve the technical problem, the invention provides a function test fixture for an electronic controller, which comprises: the device comprises a first clamping mechanism I, a second clamping mechanism II and an interlocking mechanism III;
first fixture I and second fixture II are located the first port under measuring and the second port under measuring of different orientations to same electronic controller under the exogenic drive and form the centre gripping, and the first port under measuring and the second port under measuring centre gripping order are decided by interlocking mechanism III.
The first clamping mechanism I comprises a supporting upright post 1, a panel 2, a first eccentric wheel mechanism 3, a guide connecting seat 4, a lifting plate 5, a linear bearing 6, a guide shaft 7, a first test probe assembly 8, a right guide fixing plate 9, a left guide fixing plate 10 and a guide pin 11;
the panel 2 is supported through the support post 1, first eccentric mechanism 3 is through fixing on the panel 2, first eccentric mechanism 3 is connected through direction connecting seat 4 with lifter plate 5, connecting seat 4 adopts the rolling fit to be connected with first eccentric mechanism 3, connecting seat 4 is fixed on lifter plate 5, linear bearing 6 is installed on lifter plate 5, guiding axle 7 lock solid is on panel 2, guiding axle 7 can slide in linear bearing 6, first test probe subassembly 8 and leading positive round pin 11 are fixed respectively on panel 2, right direction fixed plate 9 and left direction fixed plate 10 are fixed on lifter plate 5.
The second clamping mechanism II comprises a mounting plate 12, a linear guide rail 13, a connector limiting plate 14, a second test probe assembly 15, a second eccentric wheel mechanism 16, a connecting plate 17 and a limiting pin 18;
the linear guide rail 13 is fixed on the mounting plate 12, the connector limiting plate 14 and the second test probe assembly 15 are fixed on a sliding block of the linear guide rail 13, the second test probe assembly 15 is connected with the second eccentric mechanism 16, the connector limiting plate 14 and the second eccentric mechanism 16 are connected together through a connecting plate 17, and the connector limiting plate 14 and the test probe assembly 15 can move relatively by rotating the second eccentric mechanism 16.
The interlocking mechanism III comprises an interlocking block 19, an interlocking pin 20 and a connecting rod 21;
the interlock block 19 is fixed under the second test probe assembly 15, the interlock pin 20 is fixed on the connection rod 21, the connection rod 21 is fixed on the elevating plate 5, and the interlock pin ascends or descends along with the elevating plate 5 when it ascends or descends.
The linear bearing 6 is arranged on the lifting plate 5 by adopting a clamp spring for a shaft.
In a further improvement, the mounting plate 12 is provided with a positioning groove, and the linear guide rail 13 is accurately positioned through the positioning groove.
In a further improvement, in the initial position, the interlocking pin 20 is inserted into the interlocking block 19, the second clamping mechanism II is locked, the first eccentric mechanism 3 is rotated to enable the lifting plate 5 to move downwards to the working position, the interlocking pin 20 is withdrawn from the interlocking block 19, the second clamping mechanism II is unlocked, the second eccentric mechanism 16 is rotated to enable the second test probe assembly 15 to move to the working position, the step of the interlocking block 19 moves to the lower side of the interlocking pin 20, and the first clamping mechanism I is locked.
The first clamping mechanism I is a vertical clamping mechanism, and the second clamping mechanism II is a horizontal clamping mechanism.
The invention can realize connection test for more than two test connection ports with different directions positioned in the same electronic controller. The control of the connection sequence of the first clamping mechanism I and the second clamping mechanism II is achieved through the interlocking mechanism III, wherein the first clamping mechanism I is responsible for connecting test connection ports in the vertical direction and the near vertical direction (the vertical direction is larger than minus 45 degrees to 45 degrees for the reference), and the second clamping mechanism II is responsible for connecting test connection ports in the horizontal direction and the near horizontal vertical direction (the horizontal direction is minus 45 degrees to 45 degrees for the reference). The connection can ensure that components on the PCBA are hardly affected by external force. The second clamping mechanism II can ensure that the external force borne by the components on the electronic controller is only negligible to the friction force of the linear guide rail, and ensure that the electronic controller is not damaged by the external force.
The invention clamps and positions the connector port of the electronic controller, and does not generate a positioning relation with the PCBA (normal temperature state) of the electronic controller and the shell (high temperature state) of the electronic controller, so the invention can be compatible to be used in the two process states.
In addition, the invention can adopt manual control, so that the action sequence of the first clamping mechanism I and the second clamping mechanism II can be controlled, and higher applicability can be provided. The invention has the advantages of simple structure, small overall dimension, light weight, convenient transportation, convenient field use and low manufacturing cost.
Drawings
The invention will be described in further detail with reference to the following detailed description and accompanying drawings:
figure 1 is a schematic diagram of a PCBA configuration having connectors of two different orientations.
Fig. 2 is a schematic diagram of the overall structure of the present invention.
Fig. 3 is a schematic diagram of the overall structure of the present invention.
Fig. 4 is a schematic structural diagram of the first clamping mechanism of the invention.
FIG. 5 is a first schematic structural diagram of a second clamping mechanism of the present invention.
FIG. 6 is a second schematic structural view of a second clamping mechanism of the present invention.
Fig. 7 is a third schematic view of the overall structure of the present invention, which shows the initial position of the present invention.
Fig. 8 is a fourth schematic view of the overall structure of the present invention, showing the working position of the present invention.
Fig. 9 is a schematic view of the interlocking mechanism.
Reference numerals
A is the first connector (vertical connector)
B is a second connector (horizontal connector)
B1 is the male part of the connector
I is a first holding mechanism (vertical holding mechanism)
II is a second holding mechanism (horizontal holding mechanism)
III is an interlocking mechanism
1 is a supporting column
2 is a panel
3 is a first eccentric wheel mechanism (lifting eccentric wheel mechanism)
4 is a guide connecting seat
5 is a lifting plate
6 is a linear bearing
7 is a guide shaft
8 is a first test probe assembly (vertical test probe assembly)
9 is a right guide fixing plate
10 is a left guide fixing plate
11 is a pilot pin
12 is a mounting plate
13 is a linear guide
14 is a connector limit plate
15 is a second test probe assembly (horizontal test probe assembly)
16 is a second eccentric wheel mechanism (horizontal eccentric wheel mechanism)
17 is a connecting plate
18 is a limit pin
19 is an interlocking block
20 is an interlocking pin
21 is a connecting rod
22 is a handle
Detailed Description
As shown in fig. 2 and 3, an embodiment of the fixture for testing the function of the electronic controller provided by the invention comprises: the device comprises a first clamping mechanism I, a second clamping mechanism II and an interlocking mechanism III; in this embodiment, the first clamping mechanism i is a vertical clamping mechanism, and the second clamping mechanism ii is a horizontal clamping mechanism.
First fixture I and second fixture II are located the first port under measuring and the second port under measuring of different orientations to same electronic controller under the exogenic drive and form the centre gripping, and the first port under measuring and the second port under measuring centre gripping order are decided by interlocking mechanism III. Wherein the external force can be provided in various forms as long as the external force can drive the first and second eccentric mechanisms 3 and 16 to rotate. In this embodiment, the driving portion adopts a handle 22, and the handle 22 is pulled to drive the first eccentric wheel mechanism 3 and the second eccentric wheel mechanism 16 to form external force driving. Other forms of drive may also be provided, such as a motor drive or the like.
As shown in fig. 4, the first clamping mechanism i includes a support column 1, a panel 2, a first eccentric mechanism 3, a guide connection seat 4, a lifting plate 5, a linear bearing 6, a guide shaft 7, a first test probe assembly 8, a right guide fixing plate 9, a left guide fixing plate 10 and a guide pin 11; the first eccentric wheel mechanism 3 is a lifting eccentric wheel mechanism;
the panel 2 is supported through the support post 1, first eccentric mechanism 3 passes through the fix with screw on panel 2, first eccentric mechanism 3 is connected through direction connecting seat 4 with lifter plate 5, connecting seat 4 adopts the roll fit with first eccentric mechanism 3 to be connected, connecting seat 4 uses the screw connection to fix on lifter plate 5, linear bearing 6 adopts the axle to use the jump ring to install on lifter plate 5, guiding axle 7 passes through the screw lock solid on panel 2, guiding axle 7 can slide in linear bearing 6, first test probe subassembly 8 and leading positive round pin 11 are respectively through the fix with screw on panel 2, right side direction fixed plate 9 and left side direction fixed plate 10 pass through the fix with screw on lifter plate 5. The first eccentric wheel mechanism 3 is rotated to drive the lifting plate 5 to vertically move downwards, the first connector A is guided to an accurate position through the guide pin 11 in the descending process, the first test probe assembly 8 is inserted into the first connector A after the first eccentric wheel mechanism 3 is rotated to the accurate position, the first connector A is connected with the first clamping mechanism I, and the connector B is simultaneously descended to a preset height;
as shown in fig. 5 and 6, the second clamping mechanism ii includes a mounting plate 12, a linear guide rail 13, a connector limit plate 14, a second test probe assembly 15, a second eccentric mechanism 16, a connecting plate 17 and a limit pin 18; the second eccentric wheel mechanism 16 is a horizontal eccentric wheel mechanism.
The linear guide rail 13 is fixed on a positioning groove on the mounting plate 12 and accurately positioned and locked through screws, the connector limiting plate 14 and the second test probe assembly 15 are respectively fixed on a sliding block of the linear guide rail 13 through screws, the second test probe assembly 15 and the second eccentric mechanism 16 are connected through screws, the connector limiting plate 14 and the second eccentric mechanism 16 are connected together through a connecting plate 17, and the connector limiting plate 14 and the test probe assembly 15 can move relatively by rotating the second eccentric mechanism 16. The fixed point on the connector B that the connector limiting plate 14 is stuck to is, for example, a bump B1 in fig. 1, the second test probe assembly 15 is inserted into the second connector B after the second eccentric mechanism 16 is rotated to the right position, the second connector B completes the connection with the second clamping mechanism clamping ii, and the external force borne by the components on the PCBA in the process is only the friction force of the linear guide rail and can be ignored. The stopper pin 18 is used to limit the moving range of the connector stopper plate 14, and is used to ensure that the connector stopper plate 14 can smoothly clamp a fixed point on the connector B;
the interlocking mechanism III comprises an interlocking block 19, an interlocking pin 20 and a connecting rod 21;
the interlocking block 19 is fixed below the second test probe assembly 15 by screws, the interlocking pin 20 is fixed on the connecting rod 21 by screws, the connecting rod 21 is fixed on the elevating plate 5 by screws, and the interlocking pin is raised or lowered along with the elevating plate 5 when it is raised or lowered.
The linear bearing 6 is arranged on the lifting plate 5 by adopting a clamp spring for a shaft.
In a further improvement, the mounting plate 12 is provided with a positioning groove, and the linear guide rail 13 is accurately positioned through the positioning groove.
In a further improvement, in the initial position, the interlocking pin 20 is inserted into the interlocking block 19, the second clamping mechanism II is locked, the first eccentric mechanism 3 is rotated to enable the lifting plate 5 to move downwards to the working position, the interlocking pin 20 is withdrawn from the interlocking block 19, the second clamping mechanism II is unlocked, the second eccentric mechanism 16 is rotated to enable the second test probe assembly 15 to move to the working position, the step of the interlocking block 19 moves to the lower side of the interlocking pin 20, and the first clamping mechanism I is locked.
The present invention has been described in detail with reference to the specific embodiments and examples, but these are not intended to limit the present invention. Many variations and modifications may be made by one of ordinary skill in the art without departing from the principles of the present invention, which should also be considered as within the scope of the present invention.
Claims (4)
1. An electronic controller functional test fixture, comprising: at least one first clamping mechanism (I), a second clamping mechanism (II) and an interlocking mechanism (III);
the first clamping mechanism (I) and the second clamping mechanism (II) clamp a first tested port and a second tested port which are positioned in different directions of the same electronic controller under the driving of external force, and the clamping sequence of the first tested port and the second tested port is determined by the interlocking mechanism (III);
the first clamping mechanism (I) comprises a supporting upright post (1), a panel (2), a first eccentric wheel mechanism (3), a guide connecting seat (4), a lifting plate (5), a linear bearing (6), a guide shaft (7), a first test probe assembly (8), a right guide fixing plate (9), a left guide fixing plate (10) and a guide pin (11);
the panel (2) is supported by a supporting upright post (1), a first eccentric wheel mechanism (3) is fixed on the panel (2) by a screw, the first eccentric wheel mechanism (3) is connected with a lifting plate (5) by a guide connecting seat (4), the connecting seat (4) is connected with the first eccentric wheel mechanism (3) in a rolling fit manner, the connecting seat (4) is fixed on the lifting plate (5), a linear bearing (6) is installed on the lifting plate (5), a guide shaft (7) is locked on the panel (2), the guide shaft (7) can slide in the linear bearing (6), a first test probe assembly (8) and a guide pin (11) are respectively fixed on the panel (2), and a right guide fixing plate (9) and a left guide fixing plate (10) are fixed on the lifting plate (5);
the second clamping mechanism (II) comprises a mounting plate (12), a linear guide rail (13), a connector limiting plate (14), a second test probe assembly (15), a second eccentric mechanism (16), a connecting plate (17) and a limiting pin (18);
the linear guide rail (13) is fixed on the mounting plate (12), the connector limiting plate (14) and the side surface test probe assembly (15) are fixed on a sliding block of the linear guide rail (13), the second test probe assembly (15) is connected with the second eccentric wheel mechanism (16), the connector limiting plate (14) and the second eccentric wheel mechanism (16) are connected together through a connecting plate (17), and the connector limiting plate (14) and the test probe assembly (15) can move relatively by rotating the second eccentric wheel mechanism (16);
the interlocking mechanism (III) comprises an interlocking block (19), an interlocking pin (20) and a connecting rod (21);
the interlocking block (19) is fixed below the second test probe assembly (15), the interlocking pin (20) is fixed on a connecting rod (21), the connecting rod (21) is fixed on the lifting plate (5), and the interlocking pin ascends or descends along with the lifting plate (5) when the lifting plate (5) ascends or descends;
when the test probe assembly is at the initial position, the interlocking pin (20) is inserted into the interlocking block (19), the second clamping mechanism (II) is locked, the first eccentric wheel mechanism (3) is rotated to enable the lifting plate (5) to move downwards to the working position, the interlocking pin (20) is withdrawn from the interlocking block (19), the second clamping mechanism (II) is unlocked, the second eccentric wheel mechanism (16) is rotated to enable the second test probe assembly (15) to move to the working position, the step of the interlocking block (19) moves to the position below the interlocking pin (20), and the first clamping mechanism (I) is locked.
2. The electronic controller functionality test fixture of claim 1, wherein: the linear bearing (6) is arranged on the lifting plate (5) by adopting a clamp spring for a shaft.
3. The electronic controller functionality test fixture of claim 1, wherein: the mounting plate (12) is provided with a positioning groove, and the linear guide rail (13) is accurately positioned through the positioning groove.
4. The electronic controller functionality test fixture of any of claims 1-3, wherein: the first clamping mechanism (I) is a vertical clamping mechanism, and the second clamping mechanism (II) is a horizontal clamping mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611214937.4A CN108241353B (en) | 2016-12-26 | 2016-12-26 | Function test clamp for electronic controller |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611214937.4A CN108241353B (en) | 2016-12-26 | 2016-12-26 | Function test clamp for electronic controller |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108241353A CN108241353A (en) | 2018-07-03 |
| CN108241353B true CN108241353B (en) | 2020-10-23 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611214937.4A Active CN108241353B (en) | 2016-12-26 | 2016-12-26 | Function test clamp for electronic controller |
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| CN (1) | CN108241353B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110727262B (en) * | 2019-10-31 | 2020-10-30 | 长春工大检测技术有限责任公司 | Up-down transmission mechanism for testing electronic control unit of automobile engine |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4107387A1 (en) * | 1991-03-08 | 1992-09-10 | Protech Automation Gmbh | Test arrangement for electrical components - has contact elements protruding from carrier and pressed against contacts of component by actuator with oppositely movable sliders |
| KR100555066B1 (en) * | 2005-08-25 | 2006-02-24 | 허길만 | A loading/unloading equipment of memory module |
| CN103546609B (en) * | 2013-10-30 | 2016-02-17 | 深圳市鑫信腾科技有限公司 | A kind of automatic test equipment for mobile terminal function test |
| CN204116394U (en) * | 2014-10-28 | 2015-01-21 | 惠州市德赛西威汽车电子有限公司 | A kind of function test fixture of automobile electronics |
| DE102015208411A1 (en) * | 2015-05-06 | 2016-11-10 | Robert Bosch Gmbh | Electronic module and method and apparatus for testing an electronic module |
| CN204832255U (en) * | 2015-07-13 | 2015-12-02 | 常州博瑞电力自动化设备有限公司 | Circuit board test fixture |
| CN105182013B (en) * | 2015-08-28 | 2018-07-10 | 京东方科技集团股份有限公司 | A kind of display panel test fixture |
| CN105424987B (en) * | 2015-12-11 | 2019-01-01 | 苏州世纪福智能装备股份有限公司 | Electric connector electrical detection fixture and electric connector electrical testing system |
| CN106199091B (en) * | 2016-07-22 | 2019-05-31 | 京东方科技集团股份有限公司 | Electrical functions test device, system and method |
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| CN108241353A (en) | 2018-07-03 |
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