CN105182013B - A kind of display panel test fixture - Google Patents

Abstract

An embodiment of the present invention provides a display panel test fixture, which relates to the field of display device manufacturing, and can test a display panel without removing peripheral materials of the display device, thereby shortening a defect analysis cycle of the display device and saving production costs. The display panel test fixture includes: a test fixture body for clamping the edge of the display panel to be tested; at least one probe fixed on the test fixture body, each probe includes a contact end and a connection end, and the contact end is used for It is in contact with the test point on the display panel to be tested, and the connection end is used to connect with the test device; the probe fixing structure connected with the test fixture body is used to fix at least one probe on the test fixture body.

Description

A display panel test fixture

technical field

The invention relates to the field of display device manufacturing, in particular to a display panel test fixture.

Background technique

With the advancement of technology and the improvement of people's living standards, electronic devices have developed rapidly. Among them, the rapid popularization of smart mobile terminals has made small-size, high-resolution screens gradually become mainstream products in the field of display panels. Due to the small size and high wiring density of small-sized display devices, higher requirements are placed on the production and testing of display panel manufacturers.

The method for testing the display panel is generally divided into a cell test (Cell Test) and a module test (Module). In order to improve the detection efficiency and reduce the false detection and missed detection caused by the deviation of the probe during the box-forming process inspection, the small-size display device is designed with a special test point for the box-forming process test. However, when these special test points are used for box-making process testing and module testing, products that have no abnormality in the box-making process test will be detected abnormally during the module test, or products that are detected abnormally during the box-making process test will be detected abnormally during the module test. Check for normal conditions. In order to solve the above problems, it is necessary to verify the above-mentioned abnormal display device, and when the display panel is detected on the box-forming process test equipment, it is necessary to remove the peripheral materials of the display device (such as PCB (Printed Circuit Board, printed circuit board, etc.) ), COF (Chip On Flex or Chip On Film, chip on film), etc.).

However, the cost of the peripheral materials of the display device is high and cannot be reused after removal, and the process of removing the peripheral materials also requires manual operations, resulting in high production costs of the display device.

Contents of the invention

Embodiments of the present invention provide a display panel testing jig, which can test the display panel without removing the peripheral materials of the display device, shorten the defect analysis cycle of the display device, and save production costs.

In order to achieve the above object, embodiments of the present invention adopt the following technical solutions:

An embodiment of the present invention provides a display panel test fixture, including:

The test fixture body is used to clamp the edge of the display panel to be tested;

At least one probe fixed on the test fixture body, each of the probes includes a contact end and a connection end, the contact end is used to contact the test point on the display panel to be tested, the The connecting end is used to connect with the test device;

The probe fixing structure connected with the test fixture body is used to fix at least one probe on the test fixture body.

Optionally, the test fixture body includes:

The first clamping plate and the second clamping plate, the first clamping plate includes a first clamping head, the second clamping plate includes a second clamping head, the first clamping head and the second clamping head are oppositely arranged, and the first clamping plate includes a second clamping head. The splint and the second splint are used to clamp the edge of the display panel to be tested;

connecting the first clamping plate and the clamping shaft of the second clamping plate, so that the first clamping plate and the second clamping plate are relatively rotated by the clamping shaft;

An elastic device connected to both the first splint and the second splint, the elastic device is respectively connected to the side of the first splint close to the second splint and the second splint close to the first splint One side of the clamp is connected to provide clamping force for the first chuck and the second chuck.

Optionally, the elastic device is a spring.

Optionally, the first chuck and the second chuck are U-shaped chucks or Y-shaped chucks.

Optionally, the test fixture body also includes:

The anti-skid strip arranged on the side of the first chuck close to the second chuck, and the anti-skid strip arranged on the side of the second chuck close to the first chuck, the anti-skid strip is used to prevent The display panel testing jig slides off from the edge of the display panel to be tested when clamping the edge of the display panel to be tested.

Optionally, the display panel test fixture also includes:

The probe fixture connected with the test fixture body is used to control the arrangement of at least one of the probes, and make the contact end of at least one of the probes close to the test point on the display panel to be tested touch;

The probe fixture fixing structure connected with the probe fixture is used to fix the probe fixture on the test fixture body.

Optionally, the side of the probe fixture close to the test fixture body includes at least one wire management groove arranged along the extension direction of the test fixture body, and one wire management groove fixes one of the probes, so The wire management slots do not overlap with the probe clamp fixing structure in spatial position, and the number of the wire management slots is greater than or equal to the number of the probes.

Optionally, the wire management groove is an arc-shaped groove, a triangular groove or a quadrangular groove.

Optionally, if the side of the probe fixture close to the test fixture body includes two or more wire management grooves, the wire management grooves are evenly distributed on the probe holder.

A display panel test fixture provided by an embodiment of the present invention includes: a test fixture body for clamping the edge of the display panel to be tested; at least one probe fixed on the test fixture body, each probe The needles all include a contact end and a connection end, the contact end is used to contact the test point on the display panel to be tested, and the connection end is used to connect with the test device; the probe fixing structure connected with the test fixture body is used to connect the At least one probe is secured to the test fixture body.

Based on the description of the above-mentioned embodiments, since at least one elastic probe is fixed on the test fixture body, the test point on the display panel to be tested can be connected with the test device through the elastic probe, so that even if the material on the periphery of the display device is not removed The display panel can be tested, thereby shortening the defect analysis period of the display device and saving production cost.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

FIG. 1 is a schematic top view structure diagram of a display panel test fixture provided by an embodiment of the present invention;

Fig. 2 is a side view structural schematic diagram of a display panel test fixture provided by an embodiment of the present invention;

FIG. 3 is a partially enlarged structural schematic diagram of a display panel test fixture provided by an embodiment of the present invention;

FIG. 4 is a schematic top view of another display panel test fixture provided by an embodiment of the present invention;

Fig. 5 is a cross-sectional view along the AA' direction of another display panel test fixture provided by the embodiment of the present invention;

Fig. 6 is a second cross-sectional view along the AA' direction of another display panel test fixture provided by the embodiment of the present invention;

Fig. 7 is a third cross-sectional view along the AA' direction of another display panel test fixture provided by the embodiment of the present invention;

8 is a schematic diagram of two display panel test fixtures provided by an embodiment of the present invention clamped in the horizontal direction of the display panel to be tested for testing;

9 is a schematic diagram of two display panel test fixtures provided by an embodiment of the present invention, one clamped in the horizontal direction of the display panel to be tested, and the other clamped in the vertical direction of the display panel to be tested for testing;

Marks in the figure: 1-display panel test fixture; 10-test fixture body; 11-elastic probe; 12-elastic probe fixing bolt; 110-contact end of elastic probe; 111-connecting end of elastic probe; 100 -the first splint; 1000-the first clamp; 101-the second clamp; 1010-the second clamp; 102-fixture shaft; 103-elastic device; Fixture bolt; 130-line slot; 2-display panel to be tested.

Detailed ways

The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

It should be noted that the "upper" and "lower" described in the embodiments of the present invention are only used to illustrate the present invention with reference to the drawings, and are not used as limiting terms.

The probe described in the embodiment of the present invention is a contact medium for electrical testing, whether it is an ordinary metal probe, a rotating probe, or an elastic probe with a telescopic function, all belong to the scope of protection of this application. The following embodiments are described with the probe as the elastic probe; likewise, the fixing structure (such as the fixing structure of the probe and the fixing structure of the probe clamp) described in the embodiment of the present invention can be any bolt, nut, etc. For the fasteners that play a fixing role, the following embodiments of the present invention are described by using the probe fixing structure as the probe fixing bolt, and the probe clamp fixing structure as the probe clamp fixing bolt.

An embodiment of the present invention provides a display panel test fixture 1. The top view of the display panel test fixture 1 is shown in FIG. 1. The display panel test fixture 1 includes:

The test fixture body 10 is used to clamp the edge of the display panel to be tested.

At least one elastic probe 11 fixed on the test fixture body 10, each elastic probe 11 includes a contact end 110 (the part marked by the dotted line in the figure) and a connection end 111 (the part marked by the dotted line in the figure) , the contact end 110 is used to contact the test point on the display panel to be tested, and the connection end 111 is used to connect with the test device.

The elastic probe fixing bolt 12 connected with the test fixture body 10 is used to fix at least one elastic probe 11 on the test fixture body 10 .

It should be noted that, in the display panel test fixture 1 provided by the embodiment of the present invention, when the test fixture body 10 is clamped on the edge of the display panel to be tested, at least one elastic probe 11 fixed on the test fixture body 10 contacts the Measure the test points on the display panel, so that the test points on the display panel to be tested are connected with the test device through elastic probes 11, so that the display panel can be tested even without removing the peripheral material of the display device, thereby shortening the life of the display device. Bad analysis cycle, saving production cost.

Specifically, the side view of the display panel test fixture 1 is shown in FIG. 2 , and the test fixture body 10 includes:

The first clamping plate 100 and the second clamping plate 101, the first clamping plate 100 includes a first clamping head 1000, the second clamping plate 101 includes a second clamping head 1010, the first clamping head 1000 and the second clamping head 1010 are arranged oppositely, the first clamping plate 100 And the second clamping plate 101 is used to clamp the edge of the display panel to be tested.

The clamp shaft 102 connecting the first clamping plate and the second clamping plate makes the first clamping plate 100 and the second clamping plate 101 relatively rotate through the clamping shaft 102 .

The elastic device 103 connected to the first splint 100 and the second splint 101, the elastic device 103 is respectively connected to the side of the first splint 100 close to the second splint 101 and the side of the second splint 101 close to the first splint 100, It is used to provide clamping force to the first chuck 1000 and the second chuck 1010 .

The first clamping head 1000 and the second clamping head 1010 provide clamping force through the elastic device 103, so that the first clamping plate 100 and the second clamping plate 101 can clamp the edge of the display panel to be tested.

Preferably, the elastic device 103 is a spring.

It should be noted that the elastic device 103 provided in the embodiment of the present invention is a spring, and the spring may be a coil spring or a hook spring, which is not limited in the present invention. Similarly, the elastic device 103 provided in the embodiment of the present invention may also be other devices capable of providing clamping force to the first chuck 1000 and the second chuck 1010 , which is not limited in the present invention.

Specifically, the first chuck 1000 and the second chuck 1010 are U-shaped chucks or Y-shaped chucks.

Specifically, the enlarged view of the side view of the display panel test fixture 1 (the part marked by the circle frame in FIG. 2 ) is shown in FIG. 3 , and the test fixture body 10 also includes:

The anti-slip strip 104 arranged on the side of the first clamp 1000 close to the second clamp 1010, and the anti-slip strip 104 provided on the side of the second clamp 1010 close to the first clamp 1000, the anti-slip strip 104 is used to prevent the display panel from testing The fixture slides off from the edge of the display panel to be tested when clamping the edge of the display panel to be tested.

Further, as shown in FIG. 4 , the display panel test fixture 1 also includes:

The probe fixture 13 connected with the test fixture body 10 is used to control the arrangement of at least one elastic probe 11 and make the contact end 110 of at least one elastic probe 11 closely contact with the test point on the display panel to be tested.

The probe fixture fixing bolt 14 connected with the probe fixture 13 is used to fix the probe fixture 13 on the test fixture body 10 .

Specifically, as shown in FIG. 5 , the cross-sectional view along the AA' direction in FIG. 4 , the side of the probe fixture 13 close to the test fixture body 10 includes at least one wire management groove 130 arranged along the extending direction of the test fixture body 10, One elastic probe 11 is fixed in one wire management groove 130 , the wire management groove 130 does not overlap with the fixing bolt 14 of the elastic probe clamp in space, and the number of wire management grooves 130 is greater than or equal to the number of elastic probes 11 . Wherein, the wire management groove 130 is an arc-shaped groove.

Optionally, as shown in FIG. 6 , the wire management groove 130 may also be a triangular groove, or as shown in FIG. 7 , the wire management groove 130 may also be a quadrilateral groove.

It should be noted that the shape of the above-mentioned wire management groove 130 is only an optional solution for the shape of the wire management groove provided by the embodiment of the present invention, and the shape of the wire management groove 130 is not limited to the circular arc groove, triangular shape provided by the embodiment of the present invention. The slots and quadrilateral slots may also be polygonal slots or irregular shapes, which are not limited in the present invention.

Preferably, if the probe fixture 13 includes two or more wire management grooves 130 on the side close to the test fixture body 10 , the wire management grooves 130 are evenly distributed on the probe holder 13 .

It should be noted that an elastic probe 11 passes through the wire management groove 130, the width of the wire management groove 130 is slightly larger than the width of the elastic probe 11, and the height of the wire management groove 130 is slightly greater than the height of the elastic probe 11, To play the role of fixing the elastic probe 11.

When using the display panel test fixture 1 provided by the embodiment of the present invention to test the display panel to be tested, according to the size of the display panel to be tested and the spacing of the test points, the elastic probes 11 are selectively passed through the wire management of the probe fixture 13 The groove 130 is in contact with the test points on the display panel to be tested. When manufacturing the display panel test fixture 1 , by adjusting the number and spacing of the wire management slots 130 of the probe fixture 13 , the display panel test fixture 1 can be adapted to different display panels to be tested.

During the test, it is only necessary to remove the UV (Ultraviolet Rays, ultraviolet light) curing glue on the surface of the display panel to be tested, and selectively pass the elastic probe 11 through the probe holder 13 according to the number and position of the test electrodes of the display screen. The wire groove 130 may be in one-to-one correspondence with the test points on the display panel to be tested.

At the same time, the display panel test fixture 1 with a clip-like structure provided by the embodiment of the present invention can be flexibly clamped at any position of the display panel to be tested: for example, as shown in Figure 8, two embodiments of the present invention provide All display panel test fixtures 1 are clamped in the horizontal direction of the display panel 2 to be tested for testing; Orientation, one clip is tested in the vertical direction of the display panel to be tested.

A display panel test fixture provided by an embodiment of the present invention includes: a test fixture body for clamping the edge of the display panel to be tested; at least one probe fixed on the test fixture body, each probe The needles all include a contact end and a connection end, the contact end is used to contact the test point on the display panel to be tested, and the connection end is used to connect with the test device; the probe fixing structure connected with the test fixture body is used to connect the At least one probe is secured to the test fixture body.

Based on the description of the above-mentioned embodiments, since at least one elastic probe is fixed on the test fixture body, the test point on the display panel to be tested can be connected with the test device through the elastic probe, so that even if the material on the periphery of the display device is not removed The display panel can be tested, thereby shortening the defect analysis period of the display device and saving production cost.

The above is only a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Anyone skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present invention. Should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be determined by the protection scope of the claims.

Claims (9)

1. a kind of display panel test fixture, which is characterized in that including：

Test fixture ontology, for clamping the edge of display panel to be measured；

At least one probe being fixed on the test fixture ontology, each described probe include contact jaw and connection End, the contact jaw with the test point on the display panel to be measured for being in contact, and the connecting pin is used for and test device It is connected；

The probe fixed structure being connected with the test fixture ontology, at least one probe to be fixed on the survey It tries in chuck body；

The test fixture ontology includes：

First clamping plate and second clamping plate, the first clamping plate include the first collet, and the second clamping plate includes the second collet, described First collet and second collet are oppositely arranged, and the first clamping plate and the second clamping plate are used to clamp the display to be measured The edge of panel；

Connect the clamp shaft of the first clamping plate and the second clamping plate so that the first clamping plate and the second clamping plate pass through The clamp shaft relatively rotates；

The display panel test fixture further includes：

The probe clamp being connected with the test fixture ontology, the probe clamp are set to first collet and the folder Between tool axis and close to the side of the clamp shaft, for controlling the arrangement of at least one probe, and make at least one institute The contact jaw and the test point on the display panel to be measured for stating probe are in close contact.

2. display panel test fixture according to claim 1, which is characterized in that the test fixture ontology further includes：

The elastic device being all connected with the first clamping plate and the second clamping plate, the elastic device press from both sides respectively with described first Plate is connected close to the side of the second clamping plate with the second clamping plate close to the side of the first clamping plate, described for giving First collet and second collet provide grip force.

3. display panel test fixture according to claim 2, which is characterized in that the elastic device is spring.

4. the display panel test fixture according to Claims 2 or 3, which is characterized in that first collet and described The shape that two collets are formed is U-shaped or Y-shaped.

5. display panel test fixture according to claim 2, which is characterized in that the test fixture ontology further includes：

First collet is arranged on close to the tread plate of the second collet side and to be arranged on second collet close The tread plate of the first collet side, the tread plate are used to prevent the display panel test fixture described to be measured in clamping It is slid during the edge of display panel from the edge of the display panel to be measured.

6. display panel test fixture according to claim 1, which is characterized in that the display panel test fixture also wraps It includes：

The probe clamp fixed structure being connected with the probe clamp, for the probe clamp to be fixed on the test clip Have on ontology.

7. display panel test fixture according to claim 6, which is characterized in that the probe clamp is close to the test Include the trunking that at least one extending direction along the test fixture ontology is set in the one side of chuck body, described in one Trunking fixes a probe, and the trunking is no overlapping on spatial position with the probe clamp fixed structure, The quantity of the trunking is more than or equal to the quantity of the probe.

8. display panel test fixture according to claim 7, which is characterized in that the trunking is arc-shaped slot, three Angle-shaped groove or quadrangle slot.

9. display panel test fixture according to claim 7 or 8, which is characterized in that if the probe clamp is close to institute It states and includes more than two trunkings in the one side of test fixture ontology, then the trunking is evenly distributed on the probe clamp On.