CN108234039B - Method and system for self-detecting on-chip function of baseband processor of direct sequence spread spectrum transponder - Google Patents
Method and system for self-detecting on-chip function of baseband processor of direct sequence spread spectrum transponder Download PDFInfo
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Abstract
A method and a system for self-detecting functions of a baseband processor chip of a direct sequence spread spectrum transponder are disclosed, wherein the method comprises the following steps: initializing a transponder baseband processing part in a chip; generating an information sequence; carrying out spread spectrum modulation on the information bit and the P paths of pseudo-random sequences; BPSK modulation is carried out on the P paths of bit sequences after the spread spectrum; combining the P paths of BPSK signals to obtain a test excitation transponder baseband processing part; and respectively sending the P paths of binary information bits demodulated by the transponder baseband processing part to P test output pins for output. The invention utilizes the chip embedded circuit to generate the input excitation and control signal of the tested circuit, the output monitoring signal is easy to interpret, the problems of high cost, low efficiency and high requirement on the capability of testers of the direct sequence spread spectrum transponder baseband processor after packaging are solved, and the correctness detection of the chip function can be quickly completed without other complex test equipment and devices.
Description
Technical Field
The invention relates to a chip detection method, in particular to an on-chip function self-detection method for a baseband processor of a direct sequence spread spectrum transponder.
Background
The direct sequence spread spectrum transponder baseband processor is a core device of a satellite measurement and control subsystem, and has the advantages of large chip scale, complex function and short development period, thereby bringing great challenges to the function detection after chip packaging. At present, the common function detection methods of the baseband processor chip of the direct sequence spread spectrum transponder include the following three methods: the method comprises a function detection method based on Automatic Test Equipment (ATE), a function detection method based on special responder ground detection equipment and a function detection method based on a field programmable logic gate array (FPGA) device test module. The first method is a function detection method based on Automatic Test Equipment (ATE), and the method loads a simulation input waveform after chip layout and wiring to a chip input pin through the ATE, and judges whether the chip function is normal or not by comparing whether the actual output of the chip is consistent with the simulation output or not. The method has the disadvantages that the simulation comparison time of the ATE equipment is limited by the storage space, the output comparison time is generally only dozens of milliseconds, the coverage rate of test functions is low, many functions cannot be tested, the ATE tester is expensive, and the test cost is high. The second method is a function detection method based on special transponder ground detection equipment, and the method simulates satellite uplink measurement and control signals through a complex digital signal processing algorithm, then carries out interference, attenuation, down-conversion and analog-to-digital conversion, inputs the signals to a transponder baseband processor, and simultaneously outputs chip output signals to a control computer for resolving to detect the functions and the performances of the chip. The method has the disadvantages that numerous auxiliary devices such as a signal source, an attenuator, an up-down converter, an industrial control computer and the like are needed, the system debugging is complex, the test preparation period is long, and the functional detection after the chip packaging is mainly on whether the function is correct or not, rather than the comprehensive performance test. The third method is a function detection method based on a Field Programmable Gate Array (FPGA) device test module, and the method develops a set of codes capable of running on the FPGA according to the core function of the responder to complete the generation of input signals of the responder and monitor output signals so as to judge whether the output meets expectations. The method has the defects that an FPGA chip and a development tool need to be additionally purchased, an FPGA test circuit board is manufactured, the test cost is increased, meanwhile, testers are required to be capable of developing and debugging FPGA codes, and the time for detecting the functions of the chip is undoubtedly increased.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the method and the system for on-chip function self-detection of the baseband processor of the direct sequence spread spectrum transponder solve the problems of high cost and low efficiency of function detection of the baseband processor of the direct sequence spread spectrum transponder after packaging, and can quickly complete the detection of the functional correctness of a chip without other complex test equipment and devices.
The technical solution of the invention is as follows: a method for self-detecting the on-chip function of a baseband processor of a direct sequence spread spectrum transponder comprises the following steps:
(1) initializing a transponder baseband processing part in a chip, and configuring a P-path pseudo-random code sequence for the transponder baseband processing part;
(2) generating a self-checking information sequence;
(3) performing spread spectrum modulation on the information sequence in the step (2) and the P paths of pseudo-random sequences to obtain P paths of bit sequences after spread spectrum;
(4) carrying out BPSK modulation on the P paths of bit sequences after the spread spectrum is carried out to obtain P paths of BPSK signals;
(5) combining the P paths of BPSK signals to obtain a test excitation transponder baseband processing part;
(6) p paths of binary information bits demodulated by a base band processing part of the responder are respectively sent to P test output pins for output; if the information output by the pin is consistent with the bit waveform of the self-checking information sequence in the step (2), the chip function self-checking is passed; otherwise, the chip function self-test fails.
Further, the initialization in step (1) includes configuring a P-way pseudo-random code sequence, a capture integration period and code phase dwell time, a capture threshold, a loop integration period, a code frequency word and a carrier frequency word for the transponder baseband processing section, and placing the chip in a functional self-detection mode.
Further, the information sequence generated in the step (2) is 1/0 alternate binary sequence.
Further, the P-way pseudo-random code sequences are all mutually uncorrelated balanced Gold codes.
Further, the BPSK modulation procedure in step (4) is to output the carrier sequence after pi in the symbol period when the input symbol is 0, and directly output the carrier if the current input symbol is 1.
Further, the signal combining in the step (5) is to sum the P BPSK signal samples at the sample output time
Further, if the waveform of the P-path binary information bits demodulated in the step (6) is consistent with that of the input information bits, the chip function self-check is passed; if the waveform of the demodulated P-path information bit is inconsistent with that of the input information bit, the self-checking of the chip function fails; the P test output pins can be multiplexed with the normal signal output pins.
A function self-detection system on chip of a direct-sequence spread-spectrum transponder baseband processor is characterized in that an excitation signal generation and control module and an input/output multiplexing module are embedded in the direct-sequence spread-spectrum transponder baseband processor;
embedding an excitation signal generation and control module, initializing a baseband processing part of a baseband processor of the direct sequence spread spectrum transponder, generating a self-checking information sequence, performing spread spectrum modulation and demodulation, and performing combined processing to obtain test excitation; the signal is sent to a baseband processing part of a transponder baseband processor through an input/output multiplexing module;
p paths of binary information bits demodulated by a baseband processing part of the transponder baseband processor are respectively sent to P test output pins for output; if the information output by the pin is consistent with the bit waveform of the self-checking information sequence in the step (2), the chip function self-checking is passed; otherwise, the chip function self-test fails.
Compared with the prior art, the invention has the following advantages:
firstly, because the invention uses the internal logic of the chip to generate the input excitation of the tested circuit, the ATE equipment is not needed to provide the test input, the chip can be subjected to the function test for a long time, the coverage rate of the function test is improved, and the test cost is reduced;
secondly, because the test excitation can be generated inside the device, the waveform of the output monitoring signal is easy to judge and read, and the packaged function detection experiment can be completed without complex special responder ground detection equipment, so that the test progress is accelerated;
secondly, the invention only needs to provide clock and power supply signals externally, does not need other devices to provide excitation and output detection, reduces the manufacturing cost of the chip test board, and greatly reduces the requirements on testers.
Drawings
FIG. 1 is a diagram of a transponder baseband processor chip architecture with on-chip functional self-test;
FIG. 2 is a block diagram of an excitation and control generation module embedded in a transponder baseband processor
Detailed Description
In order to achieve the above purpose, in the code design stage of the baseband processor of the direct-spread-spectrum transponder, the excitation signal generation and control module and the input/output multiplexing module are embedded into the baseband processor of the direct-spread-spectrum transponder; when the function is detected after packaging, under the function test mode, the invention firstly carries out exclusive OR on the information bit sequence and the multipath spread spectrum code sequence respectively, the multipath exclusive OR output sequence carries out Binary Phase Shift Keying (BPSK) modulation respectively, then, the multipath modulation output signal is combined into one path and sent to the baseband processing part of the direct spread transponder, the information bit finally received by the baseband processing part of the direct spread transponder is output, and the function self-detection is completed by comparing whether the received and sent information waveforms are consistent.
Referring to fig. 1 and 2, the present invention includes information sequence generation, pseudo random sequence generator, spread spectrum modulation, BPSK modulation, combiner, transponder baseband processing section and output multiplexing, all of which are integrated on one chip. The self-checking information sequence generation, the pseudo-random sequence generator, the spread spectrum modulation, the BPSK modulation and the combining function are realized through an excitation signal generation and control module. Description of the drawings: the normal input of the chip in fig. 1 refers to an intermediate frequency sampling sequence (which is an integer sequence) input from the outside of the chip when the chip is in a non self-test mode.
The method for self-detecting the function on the chip of the baseband processor of the direct sequence spread spectrum transponder comprises the following steps:
(1) and initializing a baseband processing part of the transponder in the chip. Configuring a P-path pseudo-random code sequence, a capture integral period and code phase dwell time, a capture threshold, a loop integral period, code frequency words and carrier frequency words for a base band processing part of the transponder, and placing a chip in a functional self-detection mode;
(2) and generating a self-checking information sequence. The information sequence is 1/0 alternate binary bit sequence;
(3) and carrying out spread spectrum modulation on the binary bit sequence and the P paths of pseudo-random sequences. Respectively carrying out exclusive OR on the information sequence and different pseudo-random code sequences of the P paths, and outputting a spread binary bit sequence, wherein the pseudo-random sequences used for spread spectrum modulation are mutually uncorrelated balanced Gold codes;
(4) and carrying out BPSK modulation on the P paths of bit sequences after the spread spectrum. For each path of BPSK modulator, when the input code element is 0, outputting the carrier sequence after inverted pi in the code element period, if the current input code element is 1, directly outputting the carrier;
(5) and combining the P paths of BPSK signals to obtain a baseband processing part of the test excitation transponder. Summing P paths of BPSK output sampling points at the sampling point output time of each path of modulation signal to obtain a combined signal, and sending the combined signal to a baseband processing part of the direct sequence spread spectrum transponder;
(6) and respectively sending the P paths of binary information bits demodulated by the transponder baseband processing part to P test output pins for output. If the demodulated information bit is consistent with the bit waveform of the self-checking information sequence in the step (2), the chip function self-checking is passed; if the waveform of the demodulated P-path information bit is inconsistent with that of the input information bit, the self-checking of the chip function fails; the test output pin can be multiplexed with the normal signal output pin
Examples
The detailed implementation steps of the invention are as follows:
In the embodiment of the invention, the whole system clock is 56 MHz; the pseudo-random code is P ═ 4 groups of uncorrelated balanced gold codes, the code length is 1023, and the code rate is 10.23 MChip/s; the acquisition integration period is 2.5us, the code phase dwell time is 0.5ms, the acquisition threshold is 70, the tracking loop integration period is 0.1ms, and the carrier frequency is 14 MHz; the chip function self-checking pin is arranged at a high level, and the chip is in a function self-checking mode at the moment.
Step 2, generating a self-checking information bit sequence to be sent;
the information bits generated in the embodiment of the invention are 01 alternating sequences, and the information rate is 2 Kbps;
step 3, spread spectrum modulation is carried out on the information bit, the information sequence and 4 paths of different pseudo-random code sequences are respectively subjected to exclusive OR, and 4 paths of spread spectrum binary bit sequences are output;
the spread spectrum modulation in the embodiment of the invention refers to that the information sequence and the 4-path pseudo-random code sequence are subjected to exclusive OR operation, the output binary bit sequence rate is 10.23Mbps, wherein the 4-path pseudo-random sequences used by the spread spectrum modulation are mutually unrelated balance Gold codes;
and 4, carrying out BPSK modulation on the 4 paths of spread binary bit sequences, outputting the carrier sequence after pi inversion in a code element period when the input code element of each path of BPSK modulator is 0, and directly outputting the carrier if the current input code element is 1.
In the embodiment of the invention, the four paths of BPSK modulators can share one carrier wave generator, four carrier wave sample values of {128, 0, -128, 0} are stored in the carrier wave generator and are sequentially read out at the rate of each sample point of 56MHz to form a carrier wave of a 14MHz period; the output carrier sample sequence after the pi inversion is-128, 0, 128, 0 }; the symbol period input to the BPSK modulator is 97.8 ns.
Step 5, combining the 4 paths of BPSK signals, and summing the 4 paths of BPSK output samples at the output moment of each path of modulation signal sample to obtain a baseband processing part of the test excitation direct sequence spread spectrum transponder;
in the embodiment of the invention, the sampling point rate of each path of BPSK signal is 56MHz, and the total sampling point rate is four paths.
Step 6, respectively sending 4 paths of information bits demodulated by a baseband processing part of the transponder to 4 test output pins, and if the demodulated information bits are consistent with the bit waveform of the self-checking information sequence in the step (2), enabling the chip function to pass the self-checking; and (3) if the waveforms of the demodulated 4 paths of information bits are inconsistent with the self-checking information sequence bit in the step (2), the chip function self-checking fails.
The demodulated information bit in the embodiment of the present invention is a binary bit output after the combined signal generated in step 5 is demodulated by the transponder baseband processing part and processed by bit synchronization/frame synchronization, that is, the self-checking information sequence generated in step (2); the 4 test output pins and the normal signal output pins are multiplexed, and when the chip is in a functional test mode, the 4 test output pins output the bit sequences demodulated by the 4 channels; the 4-way output sequence should be a square wave with a period of 1ms, and if not, the chip function detection is failed.
The invention has not been described in detail in part of the common general knowledge of those skilled in the art.
Claims (8)
1. A method for self-detecting the on-chip function of a baseband processor of a direct sequence spread spectrum transponder is characterized by comprising the following steps:
(1) initializing a transponder baseband processing part in a chip, and configuring a P-path pseudo-random code sequence for the transponder baseband processing part;
(2) generating a self-checking information sequence;
(3) performing spread spectrum modulation on the self-checking information sequence in the step (2) and the P paths of pseudo-random sequences to obtain P paths of bit sequences after spread spectrum;
(4) carrying out BPSK modulation on the P paths of bit sequences after the spread spectrum is carried out to obtain P paths of BPSK signals;
(5) combining the P paths of BPSK signals to obtain a test excitation transponder baseband processing part;
(6) p paths of binary information bits demodulated by a base band processing part of the responder are respectively sent to P test output pins for output; if the information output by the pin is consistent with the bit waveform of the self-checking information sequence in the step (2), the chip function self-checking is passed; otherwise, the chip function self-test fails.
2. The on-chip functional self-test method for the baseband processor of a direct spread spectrum transponder according to claim 1, wherein: the initialization in the step (1) comprises the steps of configuring a P-path pseudo-random code sequence, capturing an integral period and code phase dwell time, a capturing threshold, a loop integral period, code frequency words and carrier frequency words for a transponder baseband processing part, and placing a chip in a functional self-detection mode.
3. The on-chip functional self-test method for the baseband processor of a direct spread spectrum transponder according to claim 1, wherein: the information sequence generated in said step (2) is 1/0 alternating binary sequences.
4. The on-chip functional self-test method for the baseband processor of a direct spread spectrum transponder according to claim 1, wherein: the P-way pseudorandom code sequences are all mutually uncorrelated balanced Gold codes.
5. The on-chip functional self-test method for the baseband processor of a direct spread spectrum transponder according to claim 1, wherein: the BPSK modulation process in step (4) is to output the carrier sequence after pi in the symbol period when the input symbol is 0, and directly output the carrier if the current input symbol is 1.
6. The on-chip functional self-test method for the baseband processor of a direct spread spectrum transponder according to claim 1, wherein: in the step (5), the signal combining is to sum the P BPSK signal samples at the sample point output time.
7. The on-chip functional self-test method for the baseband processor of a direct spread spectrum transponder according to claim 1, wherein: and (4) multiplexing the P test output pins and the normal signal output pin in the step (6).
8. A function self-detection system on a direct sequence spread spectrum transponder baseband processor chip is characterized in that: comprises an excitation signal generating and controlling module and an input/output multiplexing module; the excitation signal generation and control module and the input/output multiplexing module are embedded in the transponder baseband processor;
the excitation signal generation and control module initializes a baseband processing part of a transponder baseband processor, generates a self-checking information sequence, performs spread spectrum modulation on the self-checking information sequence and a P-path pseudo-random sequence to obtain a P-path bit sequence after spread spectrum, performs BPSK modulation on the P-path bit sequence after spread spectrum to obtain a P-path BPSK signal, and combines the P-path BPSK signal to obtain test excitation; the signal is sent to a baseband processing part of a transponder baseband processor through an input/output multiplexing module;
p paths of binary information bits demodulated by a baseband processing part of the transponder baseband processor are respectively sent to P test output pins for output; if the information output by the pin is consistent with the bit waveform of the self-checking information sequence, the chip function self-checking is passed; otherwise, the chip function self-test fails.
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