CN108234039A - A kind of direct expansion answering machine baseband processor on piece function self-sensing method and system - Google Patents
A kind of direct expansion answering machine baseband processor on piece function self-sensing method and system Download PDFInfo
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- CN108234039A CN108234039A CN201711267258.8A CN201711267258A CN108234039A CN 108234039 A CN108234039 A CN 108234039A CN 201711267258 A CN201711267258 A CN 201711267258A CN 108234039 A CN108234039 A CN 108234039A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
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Abstract
A kind of direct expansion answering machine baseband processor on piece function self-sensing method and system：Initialize answering machine baseband processing portion in chip；Generate information sequence；Information bit and P roads pseudo-random sequence are subjected to band spectrum modulation；BPSK modulation is carried out to the P roads bit sequence after spread spectrum；P roads bpsk signal is combined, obtained test and excitation send answering machine baseband processing portion；Send the P roads binary information bit that answering machine baseband processing portion demodulates to P test output pin output respectively.The present invention embeds circuit to generate the input stimulus of circuit-under-test and control signal using chip, it is simple to export monitoring signals interpretation, solving the problems, such as direct expansion answering machine baseband processor, Function detection is of high cost after packaging, efficiency is low, high to tester's Capability Requirement, in the case where not needing to other complicated test equipments and device, the correctness detection to chip functions can be rapidly completed.
Description
Technical field
The present invention relates to a kind of chip detecting method, especially a kind of direct expansion answering machine baseband processor on piece function self-test
Survey method.
Background technology
Direct expansion answering machine baseband processor is the core devices of Satellite TT subsystem, and chip-scale is big, and function is complicated,
Lead time is short, and huge challenge is brought for the Function detection after chip package.At present, direct expansion answering machine baseband processor chip
Common function detection method have following three kinds：Function detecting method based on automated test device (ATE) is answered based on special
Answer the function detecting method of machine ground checkout equipment and the function based on field programmable gate (FPGA) device testing module
Detection method.First method, based on the function detecting method of automated test device (ATE), this method will by ATE equipment
Emulation input waveform after chip layout wiring is loaded into chip input pin, while compare chip reality output and simulation data
Whether unanimously judge whether chip functions are normal.This method is disadvantageous in that ATE device emulation comparison times are stored
Space limits, and the output of general only a few tens of milliseconds compares duration, and test function coverage rate is low, and many functions can not test,
And it is expensive during ATE test machines, testing cost is high.Second method, the Function detection based on specific response machine ground checkout equipment
Method, this method are to simulate satellite uplink measurement and control signal by complicated digital signal processing algorithm, then pass through plus interfere,
Decay, later down coversion, answering machine baseband processor is inputed to after analog-to-digital conversion, while chip signal output is counted to control
Calculation machine is resolved, and comes detection chip function and performance.This method, which is disadvantageous in that, needs numerous ancillary equipments, such as
Signal source, attenuator, Up/Down Conversion device and industrial control computer etc., system debug is complicated, and the test preparatory period is long, and in chip
Function detection after encapsulation focuses on whether function correct rather than comprehensive test of performance.The third method, based on existing
The function detecting method of field programmable logic gate (FPGA) device testing module, this method are opened according to the Core Feature of answering machine
Send out a set of to complete the generation of answering machine input signal, while can supervise output signal with code running on the FPGA
It surveys, so as to judge whether output meets expection.The deficiency of this method is to need extra purchase fpga chip and developing instrument, make
Make FPGA test circuit plates, increase testing cost, at the same also require tester can develop with FPGA Debugging code, undoubtedly
Also it can increase the time of chip functions detection.
Invention content
The technology of the present invention solves the problems, such as：In place of overcome the deficiencies in the prior art, a kind of direct expansion answering machine base is provided
Provided with processor on piece function self-sensing method and system solve direct expansion answering machine baseband processor Function detection cost after packaging
It high, the problem of efficiency is low, in the case where not needing to other complicated test equipments and device, can be rapidly completed to chip functions
The detection of correctness.
The present invention technical solution be：A kind of direct expansion answering machine baseband processor on piece function self-sensing method, packet
Include the following steps：
(1) answering machine baseband processing portion in chip is initialized, P roads pseudo noise code is configured for answering machine baseband processing portion
Sequence；
(2) self-test information sequence is generated；
(3) information sequence in step (2) and P roads pseudo-random sequence are subjected to band spectrum modulation, the P roads ratio after being spread
Special sequence；
(4) BPSK modulation is carried out to the P roads bit sequence after spread spectrum, obtains P roads bpsk signal；
(5) P roads bpsk signal is combined, obtained test and excitation send answering machine baseband processing portion；
(6) the P roads binary information bit that answering machine baseband processing portion demodulates is sent to P test output pin respectively
Output；If the information of pin output is consistent with the bit pattern of self-test information sequence in step (2), chip functions self-test is led to
It crosses；Otherwise, chip functions fail self-test.
Further, the initialization in the step (1) includes P roads pseudo noise code is configured for answering machine baseband processing portion
Sequence, capture integration period and code phase residence time, detection threshold, loop integral period, code frequency word and carrier frequency word,
And chip is placed in function self-test pattern.
Further, the information sequence generated in the step (2) is 1/0 alternate binary sequence.
Further, P roads pseudo-random code sequence is all orthogonal balance Gold code.
Further, in the step (4) BPSK modulated process be when input symbols are 0, then it is defeated in code-element period
Go out down the carrier wave sequence after π, if present input code member is 1, directly export carrier wave.
Further, signal combining is exactly in sampling point output time in the step (5), and P roads bpsk signal sampling point is asked
With
Further, the step (6) if in the P roads binary information bit that demodulates and input information bits waveform
Unanimously, then chip functions self-test passes through；If the P roads information bit and input information bits waveform that demodulate are inconsistent, core
Piece function fail self-test；P test output pin can be multiplexed with normal signal output pin.
A kind of direct expansion answering machine baseband processor on piece function self-check system, it is embedding in direct expansion answering machine baseband processor
Enter pumping signal to generate and control module, input/output Multiplexing module；
Embedded pumping signal generates and control module, initializes the baseband processing portion of direct expansion answering machine baseband processor,
Self-test information sequence is generated, and carries out band spectrum modulation, demodulation, test and excitation is obtained after combining processing；It is multiplexed by input/output
Module is sent to the baseband processing portion of answering machine baseband processor；
The P roads binary information bit that the baseband processing portion of answering machine baseband processor demodulates send P test respectively
Output pin exports；If the information of pin output is consistent with the bit pattern of self-test information sequence in step (2), chip work(
Energy self-test passes through；Otherwise, chip functions fail self-test.
Compared with the prior art, the present invention has the following advantages：
First, since the present invention generates using chip interior logic the input stimulus of circuit-under-test, do not need to ATE equipment
Test input is provided, can functional test be carried out to chip for a long time, improve the coverage rate of functional test, reduce test into
This；
Second, since the inside of the present invention can generate test and excitation, the monitoring signals waveform of output is easy to interpretation, is not required to
Specific response machine prosecutor equipment that will be complicated can complete the Function detection experiment after encapsulation, accelerate testing progress；
Second, due to the present invention only need it is external clock, power supply signal are provided, do not need to other devices and excitation and defeated be provided
Go out detection, reduce the cost of manufacture of chip testing plate, while the requirement to tester is greatly reduced.
Description of the drawings
Fig. 1 is the answering machine baseband processor chip structure figure on piece function self-test；
Fig. 2 is the excitation and control generation module structure chart that answering machine baseband processor embeds
Specific embodiment
To achieve these goals, the present invention need to will be encouraged in the Code Design stage of direct expansion answering machine baseband processor
Signal generates and control module, input/output Multiplexing module are embedded into direct expansion answering machine baseband processor；Work(after packaging
When can detect, under function testing mode, information bit sequence is first carried out exclusive or by the present invention with multipath spread-spectrum code sequence respectively,
Multichannel exclusive or output sequence carries out binary phase shift keying (BPSK) modulation respectively, and later, multiplexing output signal is combined into one
Direct expansion answering machine baseband processing portion is given on road, and the information bit that direct expansion answering machine baseband processing portion is eventually received is defeated
Go out, whether waveform of receiving and sending messages by comparing unanimously completes function self-test.
Referring in particular to attached drawing 1 and the present invention of attached drawing 2 include information sequence generation, pseudo-random sequence generator, band spectrum modulation,
BPSK modulation, combining, answering machine baseband processing portion and output multiplexing composition, above section are all integrated in chip piece
On.Above-mentioned self-test information sequence generation, pseudo-random sequence generator, band spectrum modulation, BPSK modulation, combining function are believed by encouraging
Number generate and control module realize.Explanation：Normally input is referred to when chip is in non-Auto-Sensing Mode chip in Fig. 1, core
The externally input if sampling sequence of piece (being integer sequence).
The method of direct expansion answering machine baseband processor on piece function self-test, includes the following steps：
(1) answering machine baseband processing portion in chip is initialized.P roads pseudo noise code is configured for answering machine baseband processing portion
Sequence, capture integration period and code phase residence time, detection threshold, loop integral period, code frequency word and carrier frequency word,
Chip is placed in function self-test pattern；
(2) self-test information sequence is generated.Information sequence is 1/0 alternate binary bit sequence；
(3) binary bit sequence and P roads pseudo-random sequence are subjected to band spectrum modulation.The information sequence puppet different from P roads
Random code sequence carries out exclusive or, binary bit sequence after output is spread, the pseudorandom sequence wherein used in band spectrum modulation respectively
Row are all orthogonal balance Gold codes；
(4) BPSK modulation is carried out to the P roads bit sequence after spread spectrum.For per BPSK modulators all the way, working as input code
When member is 0, then export the carrier wave sequence after π in code-element period, if present input code member is 1, directly by carrier wave
Output；
(5) P roads bpsk signal is combined, obtained test and excitation send answering machine baseband processing portion.It modulates and believes on every road
Number sampling point output time, P roads BPSK output samples are summed, obtained combining signal send direct expansion answering machine baseband processing section
Point；
(6) the P roads binary information bit that answering machine baseband processing portion demodulates is sent to P test output pin respectively
Output.If the information bit demodulated is consistent with self-test information sequence bit pattern in step (2), chip functions self-test is led to
It crosses；If the P roads information bit and input information bits waveform that demodulate are inconsistent, chip functions fail self-test；It tests defeated
Going out pin can be multiplexed with normal signal output pin
Embodiment
The detailed implementation steps of the present invention are as follows：
Step 1, answering machine baseband processing portion initializes, and initialization refers to 4 road pseudo-random code sequences, capture integration is configured
Period and code phase residence time, detection threshold, track loop integration period, pseudo- code frequency and carrier frequency, by chip functions
Self-test pin is placed in function self-test pattern.
Whole system clock 56MHz in the embodiment of the present invention；The pseudo noise code balance gold code orthogonal for P=4 groups,
Code length is 1023, bit rate 10.23MChip/s；Capture integration period 2.5us, code phase residence time 0.5ms, capture
Thresholding 70, track loop integration period are 0.1ms, carrier frequency 14MHz；Chip functions self-test pin is placed in high level, at this time
Chip is in function Auto-Sensing Mode.
Step 2, the self-test information bit sequence to be sent is generated；
The information bit generated in the embodiment of the present invention is 01 alternate sequence, information rate 2Kbps；
Step 3, information bit is subjected to band spectrum modulation, the information sequence pseudo-random code sequence different from 4 tunnels carries out respectively
Exclusive or, binary bit sequence after 4 tunnels of output are spread；
Band spectrum modulation refers to information sequence and 4 road pseudo-random code sequences carrying out xor operation in the embodiment of the present invention, defeated
The binary bit sequence rate gone out is 10.23Mbps, and 4 tunnel pseudo-random sequences wherein used in band spectrum modulation are all mutual not phases
The balance Gold code of pass；
Step 4, BPSK modulation are carried out to 4 tunnel binary bit sequences after spread spectrum, for per BPSK modulators all the way,
When input symbols are 0, then export the carrier wave sequence after π in code-element period, if present input code member is 1, directly
It connects and exports carrier wave.
Four road BPSK modulators can share a carrier generator in the embodiment of the present invention, store in carrier generator
{ 128,0, -128,0 } four carrier wave sample values, and sequential read out with rates of the 56MHz per sampling point, form the load in 14MHz periods
Wave；The outgoing carrier sampling point sequence after π is { -128,0,128,0 }；Inputting the code-element period of BPSK modulators is
97.8ns。
Step 5,4 road bpsk signal combining, in every road modulated signal sampling point output time, 4 road BPSK output samples are asked
With obtained test and excitation send direct expansion answering machine baseband processing portion；
The sample rate of every bpsk signal all the way is 56MHz in embodiments of the present invention, totally four tunnels.
Step 6, the 4 road information bits that answering machine baseband processing portion demodulates are sent to 4 test output pins respectively, such as
The information bit that fruit demodulates is consistent with self-test information sequence bit pattern in step (2), then chip functions self-test passes through；If
Self-test information sequence bit pattern is inconsistent in the 4 road information bits and step (2) that demodulate, then chip functions fail self-test.
The information bit demodulated in embodiments of the present invention refers to that the combining signal that step 5 generates passes through answering machine base band
The binary bits exported after process part demodulation, bit synchronization/frame synchronization process, i.e., the self-test information generated in step (2)
Sequence；4 test output pins and the multiplexing of normal signal output pin, when chip is in function testing mode, 4
Test output pin just exports the bit sequence that 4 tunnels demodulate；4 road output sequences should be the square wave for being 1ms in the period, if not
If being, illustrate that chip functions detection does not pass through.
Unspecified part of the present invention belongs to common sense well known to those skilled in the art.
Claims (8)
1. a kind of direct expansion answering machine baseband processor on piece function self-sensing method, it is characterised in that include the following steps：
(1) answering machine baseband processing portion in chip is initialized, P roads pseudo noise code sequence is configured for answering machine baseband processing portion
Row；
(2) self-test information sequence is generated；
(3) information sequence in step (2) and P roads pseudo-random sequence are subjected to band spectrum modulation, the P roads bit sequence after being spread
Row；
(4) BPSK modulation is carried out to the P roads bit sequence after spread spectrum, obtains P roads bpsk signal；
(5) P roads bpsk signal is combined, obtained test and excitation send answering machine baseband processing portion；
(6) send P test output pin defeated respectively the P roads binary information bit that answering machine baseband processing portion demodulates
Go out；If the information of pin output is consistent with the bit pattern of self-test information sequence in step (2), chip functions self-test is led to
It crosses；Otherwise, chip functions fail self-test.
2. a kind of direct expansion answering machine baseband processor on piece function self-sensing method according to claim 1, feature exist
In：Initialization in the step (1) includes P roads pseudo-random code sequence, capture integration is configured for answering machine baseband processing portion
Period and code phase residence time, detection threshold, loop integral period, code frequency word and carrier frequency word, and chip is placed in
Function self-test pattern.
3. a kind of direct expansion answering machine baseband processor on piece function self-sensing method according to claim 1, feature exist
In：The information sequence generated in the step (2) is 1/0 alternate binary sequence.
4. a kind of direct expansion answering machine baseband processor on piece function self-sensing method according to claim 1, feature exist
In：P roads pseudo-random code sequence is all orthogonal balance Gold code.
5. a kind of direct expansion answering machine baseband processor on piece function self-sensing method according to claim 1, feature exist
In：BPSK modulated process is when input symbols are 0 in the step (4), then exports the carrier wave after π in code-element period
Sequence if present input code member is 1, directly exports carrier wave.
6. a kind of direct expansion answering machine baseband processor on piece function self-sensing method according to claim 1, feature exist
In：Signal combining is exactly in sampling point output time in the step (5), and P roads bpsk signal sampling point is summed.
7. a kind of direct expansion answering machine baseband processor on piece function self-sensing method according to claim 1, feature exist
In：The step (6) if in the P roads binary information bit that demodulates it is consistent with input information bits waveform, chip work(
Energy self-test passes through；If the P roads information bit and input information bits waveform that demodulate are inconsistent, chip functions self-test is lost
It loses；P test output pin can be multiplexed with normal signal output pin.
8. a kind of direct expansion answering machine baseband processor on piece function self-check system, it is characterised in that：In direct expansion answering machine base band
Embedded pumping signal generates and control module, input/output Multiplexing module in processor；
Embedded pumping signal generates and control module, initializes the baseband processing portion of direct expansion answering machine baseband processor, generates
Self-test information sequence, and band spectrum modulation, demodulation are carried out, obtain test and excitation after combining processing；Pass through input/output Multiplexing module
It send to the baseband processing portion of answering machine baseband processor；
The P roads binary information bit that the baseband processing portion of answering machine baseband processor demodulates send P test output respectively
Pin exports；If the information of pin output is consistent with the bit pattern of self-test information sequence in step (2), chip functions are certainly
Inspection passes through；Otherwise, chip functions fail self-test.
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| CN201711267258.8A CN108234039B (en) | 2017-12-05 | 2017-12-05 | Method and system for self-detecting on-chip function of baseband processor of direct sequence spread spectrum transponder |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111044886A (en) * | 2019-12-09 | 2020-04-21 | 北京时代民芯科技有限公司 | DDR2/3 PHY BIST data channel test vector generation method |
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| CN205081770U (en) * | 2015-09-28 | 2016-03-09 | 深圳市中兴微电子技术有限公司 | Direct current parameter testing device |
| CN105553754A (en) * | 2015-12-08 | 2016-05-04 | 重庆金美通信有限责任公司 | Wireless communication equipment testability design method |
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|---|---|---|---|---|
| EP1542028A1 (en) * | 2002-09-17 | 2005-06-15 | Advantest Corporation | Performance board and test system |
| CN104618135A (en) * | 2014-12-26 | 2015-05-13 | 沈阳理工大学 | Distributive data link communication testing system for spread-spectrum system |
| CN205081770U (en) * | 2015-09-28 | 2016-03-09 | 深圳市中兴微电子技术有限公司 | Direct current parameter testing device |
| CN105553754A (en) * | 2015-12-08 | 2016-05-04 | 重庆金美通信有限责任公司 | Wireless communication equipment testability design method |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111044886A (en) * | 2019-12-09 | 2020-04-21 | 北京时代民芯科技有限公司 | DDR2/3 PHY BIST data channel test vector generation method |
| CN111044886B (en) * | 2019-12-09 | 2022-05-13 | 北京时代民芯科技有限公司 | DDR2/3 PHY BIST data channel test vector generation method |
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