CN108231130B - eMMC test method and device - Google Patents
eMMC test method and device Download PDFInfo
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- CN108231130B CN108231130B CN201611159212.XA CN201611159212A CN108231130B CN 108231130 B CN108231130 B CN 108231130B CN 201611159212 A CN201611159212 A CN 201611159212A CN 108231130 B CN108231130 B CN 108231130B
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
Abstract
The embodiment of the invention discloses an eMMC testing method and a device, wherein the method comprises the following steps: when a data format creating event is detected, acquiring a format name and a format attribute input by a user; creating a new data format according to the format name and the format attribute; and determining and storing the bit field information of the new data format according to the content input by the user. By adopting the technical scheme, the embodiment of the invention enables a user to create a new data format in the eMMC test development platform in a self-defined mode, thereby enriching the resolvable data format of the eMMC test development platform and realizing extensible data format resolution.
Description
Technical Field
The embodiment of the invention relates to the technical field of detection of electronic products, in particular to an eMMC testing method and device.
Background
The eMMC (embedded Multi Media card) is an embedded multimedia card. eMMC is a standard specification of an embedded memory that is established by the MMC association and is mainly used for electronic products such as mobile phones and tablet computers. The eMMC integrates a controller in the package that provides a standard interface and manages the flash memory, allowing the handset vendor to focus on other parts of the product development and reduce the time to market for the product.
As the application of the eMMC becomes more and more extensive, the performance test requirement for the eMMC becomes more and more urgent. The performance test of the eMMC mainly comprises the following steps: power supply test, signal test, power consumption test, stability test and the like. At present, the eMMC performance test mostly adopts a chip test method, that is, the eMMC performance test is connected with an intelligent device through a chip test socket, so as to test the basic read-write function of the eMMC performance test. However, the existing eMMC test method is single in analysis format and poor in expandability.
Disclosure of Invention
In view of this, embodiments of the present invention provide an eMMC testing method and apparatus to solve the technical defect of single parsing format in the conventional eMMC testing method.
In a first aspect, an embodiment of the present invention provides an eMMC test method, including:
when a data format creating event is detected, acquiring a format name and a format attribute input by a user;
creating a new data format according to the format name and the format attribute;
and determining and storing the bit field information of the new data format according to the content input by the user.
In a second aspect, an embodiment of the present invention further provides an eMMC testing apparatus, including:
the detection module is used for acquiring a format name and a format attribute input by a user when a data format creating event is detected;
the creating module is used for creating a new data format according to the format name and the format attribute;
and the storage module is used for determining and storing the bit field information of the new data format according to the content input by the user.
According to the technical scheme provided by the embodiment of the invention, a new data format is created by acquiring the format name and the format attribute input by the user, and the bit field information of the created data format is determined and stored according to the content input by the user. By adopting the technical scheme, the embodiment of the invention enables a user to create a new data format in the eMMC test development platform in a self-defined mode, thereby enriching the resolvable data format of the eMMC test development platform and realizing extensible data format resolution.
Drawings
Fig. 1 is a schematic flow chart of an eMMC testing method according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of an eMMC testing apparatus according to a second embodiment of the present invention;
fig. 3 is a schematic view of an operation interface for creating a new data format according to a third embodiment of the present invention;
fig. 4 is a schematic diagram of a dialog box for creating a new data format according to a third embodiment of the present invention;
fig. 5 is a schematic view of an operation interface for adding new data format bit field information according to a third embodiment of the present invention;
fig. 6 is a schematic diagram of a dialog box for adding new data format bit field information according to a third embodiment of the present invention.
Detailed Description
The technical scheme of the invention is further explained by the specific implementation mode in combination with the attached drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Before discussing exemplary embodiments in more detail, it should be noted that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although a flowchart may describe the steps as a sequential process, many of the steps can be performed in parallel, concurrently or simultaneously. In addition, the order of the steps may be rearranged. The process may be terminated when its operations are completed, but may have additional steps not included in the figure. The processes may correspond to methods, functions, procedures, subroutines, and the like.
Example one
Fig. 1 is a flowchart of an eMMC testing method according to an embodiment of the present invention, where the method is applicable to an eMMC test and may be executed by an eMMC testing apparatus, where the apparatus may be implemented by software and/or hardware and may be generally integrated in an eMMC testing platform. As shown in fig. 1, the method includes:
and step 110, when a data format creating event is detected, acquiring a format name and a format attribute input by a user.
For example, in the eMMC test, some data generally needs to be parsed according to a certain format, and in this embodiment, after a user triggers a data format creation event, the user may custom input a name and an attribute of the created data format. For example, the user may click on the relevant button to create the data format in the corresponding eMMC test platform, and enter the name of the created data format and describe the attributes of the created data format in the corresponding dialog box.
And step 120, creating a new data format according to the format name and the format attribute.
Illustratively, the corresponding data format is generated according to the added data format name and format attribute input by the user.
Illustratively, the bit field information is used to further define the created new data format, and after creating the data format, the user may input the bit field information of the created data format, and the eMMC test platform stores the bit field information input by the user.
Optionally, the bit field information of the new data format includes the data type of the bit field and the amount of data of each data type.
Optionally, the data type of the bit field includes at least one of a bit, an unsigned 8 bit integer, an unsigned 16 bit integer, and an unsigned 32 bit integer.
Illustratively, the data types of the above bit fields may be represented as bit, uint8, uint16, and uint32, respectively.
Optionally, the bit field information of the new data format further includes a bit field name and a flag bit indicating whether each type is visible.
In the eMMC test method, a general eMMC test development platform can analyze parameters, CSD and EXT _ CSD data, and the analyzable data format is single and cannot meet the analysis requirements of users on other data formats.
According to the technical scheme provided by the embodiment, a new data format is created by acquiring the format name and the format attribute input by the user, and the bit field information of the created new data format is determined and stored according to the content input by the user. The user can create a new data format in the eMMC test development platform in a self-defined mode, so that the interpretable data format of the eMMC test development platform is richer, and extensible data format analysis is realized.
Example two
Fig. 2 is a schematic structural diagram of an eMMC testing apparatus according to a second embodiment of the present invention, where the eMMC testing apparatus may be implemented by software and/or hardware, and may perform an eMMC test by executing an eMMC testing method. As shown in fig. 2, the apparatus may include:
the detecting module 210 is configured to, when a data format creating event is detected, obtain a format name and a format attribute input by a user;
a creating module 220, configured to create a new data format according to the format name and the format attribute;
the storage module 230 is used for determining and storing the bit field information of the new data format according to the content input by the user.
According to the technical scheme provided by the embodiment, a new data format is created by acquiring the format name and the format attribute input by the user, and the bit field information of the created data format is determined and stored according to the content input by the user. The user can create a new data format in the eMMC test development platform in a self-defined mode, so that the interpretable data format of the eMMC test development platform is richer, and extensible data format analysis is realized.
On the basis of the above-described embodiment, the bit field information of the new data format includes the data type of the bit field and the amount of data of each data type.
On the basis of the above-described embodiment, the data type of the bit field includes at least one of a bit, an unsigned 8-bit integer, an unsigned 16-bit integer, and an unsigned 32-bit integer.
On the basis of the above embodiment, the bit field information of the new data format further includes a bit field name and a flag bit whether each type is visible.
EXAMPLE III
In this embodiment, a ViperHost v1.0emmc test development platform is taken as an example to exemplarily explain the technical solutions provided by the above embodiments, and fig. 3 is a schematic diagram of an operation interface for creating a new data format according to a third embodiment of the present invention; fig. 4 is a schematic diagram of a dialog box for creating a new data format according to a third embodiment of the present invention; fig. 5 is a schematic view of an operation interface for adding new data format bit field information according to a third embodiment of the present invention; fig. 6 is a schematic diagram of a dialog box for adding new data format bit field information according to a third embodiment of the present invention. As shown in fig. 3 to 6, the operation flow for creating a new data format in the ViperHost v1.0emmc test development platform is as follows:
clicking the right button at the "Struct List" in the interface shown in fig. 3 to select "Add Struct" from the pop-up Dialog box, the display interface pops up a "Struct Add Dialog" Dialog box shown in fig. 4, the user can fill in the Dialog box "Struct Name", i.e. the Name of the new data format to be created, and "Struct Comment", i.e. format attribute information, and after the completion of the filling, the user can click to determine, i.e. the "OK" button in fig. 4, the mc test development platform stores the format Name and format attribute of the new data format, "Struct Add Dialog" disappears, the interface shown in fig. 5 is displayed, in the interface shown in fig. 5, the filling Name of the new data format is selected, clicking the right button, selecting "Add Field", the Dialog box shown in fig. 6 is popped up, the bit Field information of the new data format can be added in the interface, i.e. the user can select "Add Dialog" Field "Name" in the "find" Field "shown in fig. 6, "Field Type", "Field Size", "Field visual", and "Field Comment".
It should be noted that "Field Name" refers to a bit Field Name, and "Field Type" refers to a data Type of the bit Field, where the data Type of the bit Field includes: the "Field Size" is the data quantity of the new data format, the "Field Visible" is the flag bit whether the data format is Visible or not, the user can select the flag bit to be Visible (Visible) or INVISIBLE (INVISIBLE), and the "Field Comment" is the attribute interpretation of the bit domain information.
After the user inputs the above information in the interface shown in fig. 6, clicking a confirmation button, that is, an "OK" button in fig. 6, completes creation of a new data format, and at this time, the eMMC test development platform may be used to analyze the newly added data format. The user can create a new data format in the eMMC test development platform in a self-defined mode, so that the interpretable data format of the eMMC test development platform is richer, and extensible data format analysis is realized.
The eMMC test apparatus provided in the above embodiment may execute the eMMC test method provided in any embodiment of the present invention, and has functional modules and beneficial effects corresponding to the execution of the method. For technical details that are not described in detail in the above embodiments, reference may be made to an eMMC test method provided in any embodiment of the present invention.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (4)
1. An eMMC test method, comprising:
when a data format creating event is detected, acquiring a format name and a format attribute input by a user;
creating a new data format according to the format name and the format attribute;
determining and storing the bit field information of the new data format according to the content input by the user;
the bit field information of the new data format comprises the data type of the bit field and the amount of data of each data type;
the bit field information of the new data format also includes a bit field name and a flag bit for whether each of the types is visible.
2. The method of claim 1, wherein the data type of the bit field comprises: at least one of a bit, an unsigned 8 bit integer, an unsigned 16 bit integer, and an unsigned 32 bit integer.
3. An eMMC test device, comprising:
the detection module is used for acquiring a format name and a format attribute input by a user when a data format creating event is detected;
the creating module is used for creating a new data format according to the format name and the format attribute;
the storage module is used for determining and storing the bit field information of the new data format according to the content input by the user;
the bit field information of the new data format comprises the data type of the bit field and the amount of data of each data type;
the bit field information of the new data format also includes a bit field name and a flag bit for whether each of the types is visible.
4. The apparatus of claim 3, wherein the data types of the bitfield comprise: at least one of a bit, an unsigned 8 bit integer, an unsigned 16 bit integer, and an unsigned 32 bit integer.
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