CN104615539A - Measurement parameter processing method and system - Google Patents
Measurement parameter processing method and system Download PDFInfo
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Abstract
The invention provides a measurement parameter processing method and system. The measurement parameter processing method comprises the steps that pre-defined measurement parameters are identified by calling a general parameter processing assembly, so that the parameter types of the measurement parameters are obtained; according to the parameter types of the measurement parameters, display controls corresponding to the measurement parameters are generated; according to the parameter type of the measurement parameters, effectiveness verification is conducted on the measurement parameters; parameter conversion is conducted on the pre-defined measurement parameters passing effectiveness verification; the display controls are loaded according to a preset order and the types by calling an automatic loading assembly, parameter information obtained after conversion of the parameters is displayed, and then processing of the measurement parameters is completed. By the adoption of the measurement parameter processing method and system, the coupling of software in a comprehensive measuring instrument is lowered, the stability of the software in the comprehensive measuring instrument is improved, and the measurement parameter self-adaptive function is achieved, the workload of workers for identifying the measurement parameters is lightened, the sense of approval of users for the comprehensive measuring instrument is improved, the operation processes of the measurement parameters are unified, and the use limitation is lowered for the users.
Description
Technical field
The present invention relates to communication technical field, particularly relate to a kind of disposal route and system of test parameter.
Background technology
Terminal comprehensive tester, referred to as comprehensive test instrument, it is a kind of measurement instrument being widely used in the fields such as Terminal Design, research and development, production, be mainly used to test terminal RF index, comprise honeycomb standard and non-cellular standard, and use capable of being combined, meet other terminal subtest function, such as some protocol functions, business, power consumption, reliability testing etc.Comprehensive test instrument also can be applicable to the authentication test of terminal radio frequency consistency simultaneously.Comprehensive test instrument can be tested the many aspects of terminal, the corresponding function that it is supported is also very abundant, and each test function needs from the human-computer interaction interface of comprehensive test instrument to configure corresponding test parameter to realize the test to the different situation of terminal and different condition, therefore the configuration of test parameter is for extremely important terminal test.Comprehensive test instrument must show test parameter and manage, and inside can be limited the type of test parameter and scope and protect, to allow user can configure required test parameter correctly, easily simultaneously.
At present, comprehensive test instrument human-computer interaction interface program is for the process neither one harmonized programme of test parameter and mechanism, often a newly-increased business function just adds corresponding user interface (UserInterface under normal circumstances, UI), comprise the configuration of corresponding test parameter, developer all will carry out the work shown in Fig. 1 when adding each test parameter in UI.
First, test parameter is defined, then carry out the four aspect work of interpolation UI, validity check, type conversion and Parameter transfer.Wherein, add in UI and need to add control and layout regulation, need in validity check write check code and add prompting interface and information, operation layer is needed to change to contact bed in type conversion, and contact bed is to operation layer conversion, Parameter transfer needs host computer to be delivered to contact bed and contact bed is delivered to host computer.
When adopting classic method to realize test parameter configuration human-computer interaction interface, unavoidably need to carry out UI and add and validity check two key steps.
When multiple test parameter combines, manual interpolation UI, increase validity check are all by the work of at substantial, each business function has the test parameter of some, several at least, tens at most, when business function is many, the test parameter quantity of required configuration also can significantly increase.
Developer add or amendment test parameter time all need the work each test parameter being carried out to repetition, such as: newly-built corresponding control, test parameter validity to be verified etc.
Different developers can with the style of oneself and characteristic when adding configuration testing parameter, and such as the font of test parameter display is different, and the transfer mode of test parameter is different etc.
When adding test parameter in enormous quantities and develop, the operation can omitted test parameter aspect because of carelessness unavoidably, such as: the format conversion mistake etc. forgetting the verification to test parameter validity, test parameter.
Summary of the invention
The invention provides a kind of disposal route and system of test parameter, need the workload of manually adding UI and validity check large with the test parameter processing scheme solved in traditional comprehensive test instrument, bound of parameter face display disunity, and easily there is the problem of mistake in manual operation.
In order to solve the problem, the invention discloses a kind of disposal route of test parameter, comprising:
Call parameters common processing component identifies predefined test parameter, obtains the parameter type of described test parameter;
Parameter type according to described test parameter generates the display control corresponding with described test parameter; And according to the parameter type of described test parameter, validation verification is carried out to described test parameter;
Parameter Switch is carried out to the predefined test parameter by validation verification;
Call the automatic charging assembly of control and load described display control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
Correspondingly, the invention also discloses a kind of disposal system of test parameter, it is characterized in that, comprising:
Parameter type identification module, identifies predefined test parameter for call parameters common processing component, obtains the parameter type of described test parameter;
Display control generation module, generates the display control corresponding with described test parameter for the parameter type according to described test parameter;
Validation verification module, carries out validation verification for the parameter type according to described test parameter to described test parameter;
Parameter Switch module, for carrying out Parameter Switch to the predefined test parameter by validation verification;
Loaded and displayed module, load described display control for calling the automatic charging assembly of control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
Compared with background technology, the present invention includes following advantage:
Technical solution of the present invention comprises operation layer parameter general procedure mechanism and UI layer parameter display control autoloading system.Adopt these two kinds of mechanism UI layer and operation layer can be separated, reduce the coupling of software in comprehensive test instrument, improve the stability of software in comprehensive test instrument.
Call parameters common processing component identifies predefined test parameter, achieves the adaptation function of test parameter, decreases the workload of artificial cognition test parameter.
Parameter type according to test parameter generates the display control corresponding with test parameter, make the interface display style of test parameter unified, be conducive to improving man-machine interaction experience, improve the acceptance of user to comprehensive test instrument, and the operating process of unified test parameter, reduce the use threshold of user.
Accompanying drawing explanation
Fig. 1 is the treatment mechanism schematic diagram of the traditional test parameter in background technology;
Fig. 2 is the frame diagram of technical solution of the present invention;
Fig. 3 is the workflow diagram of the parameter common processing component in the present invention;
Fig. 4 is the process method step process flow diagram of a kind of test parameter in the embodiment of the present invention one;
Fig. 5 is the process method step process flow diagram of a kind of test parameter in the embodiment of the present invention two;
Fig. 6 is the disposal system structural representation of a kind of test parameter in the embodiment of the present invention three;
Fig. 7 is the disposal system structural representation of a kind of test parameter in the embodiment of the present invention four.
Embodiment
For enabling above-mentioned purpose of the present invention, feature and advantage become apparent more, and below in conjunction with the drawings and specific embodiments, the present invention is further detailed explanation.
Test parameter in technical solution of the present invention is that comprehensive test instrument carries out functional test to terminal or chip, or needs the parameter of configuration when carrying out consistance authentication test to terminal radio frequency.
The framework of technical solution of the present invention as shown in Figure 2, comprise the parameter general procedure mechanism of operation layer and the parameter display control autoloading system of UI layer, adopt these two kinds of mechanism UI layer and operation layer can be separated, reduce the coupling of the software of comprehensive test instrument, improve the stability of software.Wherein, the parameter general procedure mechanism of operation layer realizes the definition of test parameter by parameter common processing component, being provided with test parameter control container in UI layer, for storing the test parameter control of generation, and mutual transmission can being realized between operation layer and UI layer.
1, parameter general procedure mechanism
Parameter general procedure mechanism realizes the adaptive Core Feature of test parameter.Parameter common processing component is developed according to parameter general procedure mechanism in comprehensive test instrument master control interface program.Utilize this assembly to carry out self-adaptive processing to the test parameter imported, will originally need the redundant operation manually carrying out processing to transfer to interface program automatically to process, the concrete thought of this assembly be:
(1) defined in program inside by test parameter, the attribute such as initial value, effective range, type of setting test parameter, then calls test parameter common processing component.
(2) type that parameter common processing component defines according to test parameter generates corresponding display control, and is added in the test parameter control container of UI layer by this control.
(3) there is in parameter general purpose module the validity check function of different classes of test parameter, different checking process can be performed according to the difference of test parameter type, such as: to the test parameter of int type can check test parameter value whether in effective range, whether type error; Whether the decimal digits of the test parameter meeting check test parameter value of double type is met the demands.
(4) parameter common processing component also has the processing capacity to test parameter collection, when user defines test parameter according to group, all test parameters in this group can process by parameter common processing component, and generate form controls and add in test parameter control container, and differentiation process is carried out to different test parameter in group.
The idiographic flow of parameter common processing component as shown in Figure 3.After to test parameter definition, judge whether parameter common processing component supports the parameter type of the test parameter defined, if do not support, then generation error prompting; If support, then processed by the test parameter of parameter common processing component to definition, generate the display control of test parameter, validity check is carried out to test parameter, then perform the parameter type conversion of test parameter.Wherein, the display control of test parameter can be sent in the test parameter control container of UI layer after generating the display control of test parameter and store.
2, parameter display control autoloading system
The automatic charging assembly of parameter display control is the pith of human-computer interaction interface program at UI layer work-in parameters common processing component.Parameter common processing component joins in the test parameter control container of UI layer after generating display control corresponding to dissimilar test parameter.Test parameter controls all in test parameter control container is automatically loaded on interface and shows by the automatic charging assembly of parameter display control after the program of comprehensive test instrument starts, and specific implementation flow process is:
1) rational deployment is carried out to human-computer interaction interface, mark off the viewing area of special display test parameter control.
2) introduce the concept of test parameter control container at UI layer, the test parameter control corresponding to all test parameters needing display is all brought in test parameter control container and manages.
3) after the interface program of comprehensive test instrument starts, the test parameter control in test control container is loaded into the zones of different at interface by parameter display control automatic charging assembly in order with classification.
Below by disposal route and the system of enumerating several specific embodiment and introduce in detail a kind of test parameter provided by the invention.
Embodiment one
Introduce the disposal route of a kind of test parameter that the embodiment of the present invention provides in detail.
With reference to Fig. 4, show the process method step process flow diagram of a kind of test parameter in the embodiment of the present invention.
Step 100, call parameters common processing component identifies predefined test parameter, obtains the parameter type of described test parameter.
Described parameter common processing component is the Core Feature assembly of the embodiment of the present invention, utilizes described parameter common processing component can carry out self-adaptive processing to predefined test parameter.
The test function that described predefined test parameter and comprehensive test instrument carry out in advance has corresponding relation, realizes different test functions, needs pre-defined different test parameter.
Step 102, the parameter type according to described test parameter generates the display control corresponding with described test parameter; And according to the parameter type of described test parameter, validation verification is carried out to described test parameter.
Described display control is used for showing described test parameter at the human-computer interaction interface of comprehensive test instrument, and different test parameters may correspond to different display controls.
Described validation verification is validation test parameter to the whether effective proof procedure of the functional test of comprehensive test instrument, utilizes the test parameter of definition error cannot realize the functional test of comprehensive test instrument.
Step 104, carries out Parameter Switch to the predefined test parameter by validation verification.
Described Parameter Switch can be the conversion of parameter type, is specifically as follows and test parameter is transformed into contact bed from operation layer, or be transformed into operation layer by contact bed, realizes the mutual conversion between operation layer and contact bed.
Step 106, call the automatic charging assembly of control and load described display control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
The automatic charging assembly of described control is the pith coordinating above-mentioned parameter common processing component, is mainly used in display control load and be shown on the human-computer interaction interface of comprehensive test instrument, realizes the information displaying of test parameter.
The order preset and classification can have corresponding relation with the test parameter required for concrete test function, wherein, the order preset can be the loading sequence of the display control of test parameter, and default classification can be the loading classification of the display control of test parameter.
In sum, embodiment of the present invention technical scheme comprises operation layer parameter general procedure mechanism and UI layer parameter display control autoloading system.Adopt these two kinds of mechanism UI layer and operation layer can be separated, reduce the coupling of software in comprehensive test instrument, improve the stability of software in comprehensive test instrument.
Call parameters common processing component identifies predefined test parameter, achieves the adaptation function of test parameter, decreases the workload of artificial cognition test parameter.
Parameter type according to test parameter generates the display control corresponding with test parameter, make the interface display style of test parameter unified, be conducive to improving man-machine interaction experience, improve the acceptance of user to comprehensive test instrument, and the operating process of unified test parameter, reduce the use threshold of user.
Embodiment two
Introduce the disposal route of a kind of test parameter that the embodiment of the present invention provides in detail.
With reference to Fig. 5, show the process method step process flow diagram of a kind of test parameter in the embodiment of the present invention.
Step 200, judges whether parameter common processing component supports predefined test parameter; If support, then perform step 202; If do not support, then flow process terminates.
Described parameter common processing component can support most conventional test parameter, for new test parameter, if parameter common processing component is not supported, the relevant information of new test parameter can be added in parameter common processing component, realize the support scope expansion of parameter common processing component.
Wherein, described predefined test parameter can comprise initial parameter value, parameter effective range and parameter type etc.
Step 202, call parameters common processing component identifies predefined test parameter, obtains the parameter type of described test parameter.
Described parameter common processing component is the Core Feature assembly of the embodiment of the present invention, utilizes described parameter common processing component can carry out self-adaptive processing to predefined test parameter.
The test function that described predefined test parameter and comprehensive test instrument carry out in advance has corresponding relation, realizes different test functions, needs pre-defined different test parameter.
Step 204, the parameter type according to described test parameter generates the display control corresponding with described test parameter, is stored in control container by described display control; And according to the parameter type of described test parameter, validation verification is carried out to described test parameter.
Described display control is used for showing described test parameter at the human-computer interaction interface of comprehensive test instrument, and different test parameters may correspond to different display controls.
Described validation verification is validation test parameter to the whether effective proof procedure of the functional test of comprehensive test instrument, utilizes the test parameter of definition error cannot realize the functional test of comprehensive test instrument.
Step 206, carries out Parameter Switch to the predefined test parameter by validation verification.
Described Parameter Switch can be the conversion of parameter type, is specifically as follows and test parameter is transformed into contact bed from operation layer, or be transformed into operation layer by contact bed, realizes the mutual conversion between operation layer and contact bed.
Step 208, calls the viewing area that the automatic charging assembly of control marks off the display control corresponding with described test parameter.
Described viewing area can be the region on the human-computer interaction interface of comprehensive test instrument, and different test parameters may correspond to the viewing area of different size, position and incidence relation.Wherein, between partial test parameter, there is association, so viewing area corresponding to test parameter that there is association also can have incidence relation, as nest relation, overlapping relation etc.
Step 210, call the automatic charging assembly of control and load described display control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
The automatic charging assembly of described control is the pith coordinating above-mentioned parameter common processing component, is mainly used in display control load and be shown on the human-computer interaction interface of comprehensive test instrument, realizes the information displaying of test parameter.
Preferably, described step 210 can be:
Call the automatic charging assembly of described control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display in the viewing area that display control is corresponding.
The order preset and classification can have corresponding relation with the test parameter required for concrete test function, wherein, the order preset can be the loading sequence of the display control of test parameter, and default classification can be the loading classification of the display control of test parameter.
In sum, embodiment of the present invention technical scheme comprises operation layer parameter general procedure mechanism and UI layer parameter display control autoloading system.Adopt these two kinds of mechanism UI layer and operation layer can be separated, reduce the coupling of software in comprehensive test instrument, improve the stability of software in comprehensive test instrument.
Call parameters common processing component identifies predefined test parameter, achieves the adaptation function of test parameter, decreases the workload of artificial cognition test parameter.
Parameter type according to test parameter generates the display control corresponding with test parameter, make the interface display style of test parameter unified, be conducive to improving man-machine interaction experience, improve the acceptance of user to comprehensive test instrument, and the operating process of unified test parameter, reduce the use threshold of user.
The embodiment of the present invention also has good extendability, can increase the parameter type that parameter common processing component is not supported fast, simply.
Embodiment three
Introduce the disposal system of a kind of test parameter that the embodiment of the present invention provides in detail.
With reference to Fig. 6, show the disposal system structural representation of a kind of test parameter in the embodiment of the present invention.
The disposal system of described test parameter can comprise: parameter type identification module 300, display control generation module 302, validation verification module 304, Parameter Switch module 306, loaded and displayed module 308.
Introduce the relation between the function of each module and each module below respectively in detail.
Parameter type identification module 300, identifies predefined test parameter for call parameters common processing component, obtains the parameter type of described test parameter.
Display control generation module 302, generates the display control corresponding with described test parameter for the parameter type according to described test parameter.
Validation verification module 304, carries out validation verification for the parameter type according to described test parameter to described test parameter.
Parameter Switch module 306, for carrying out Parameter Switch to the predefined test parameter by validation verification.
Loaded and displayed module 308, load described display control for calling the automatic charging assembly of control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
In sum, embodiment of the present invention technical scheme comprises operation layer parameter general procedure mechanism and UI layer parameter display control autoloading system.Adopt these two kinds of mechanism UI layer and operation layer can be separated, reduce the coupling of software in comprehensive test instrument, improve the stability of software in comprehensive test instrument.
Call parameters common processing component identifies predefined test parameter, achieves the adaptation function of test parameter, decreases the workload of artificial cognition test parameter.
Parameter type according to test parameter generates the display control corresponding with test parameter, make the interface display style of test parameter unified, be conducive to improving man-machine interaction experience, improve the acceptance of user to comprehensive test instrument, and the operating process of unified test parameter, reduce the use threshold of user.
Embodiment four
Introduce the disposal system of a kind of test parameter that the embodiment of the present invention provides in detail.
With reference to Fig. 7, show the disposal system structural representation of a kind of test parameter in the embodiment of the present invention.
The disposal system of described test parameter can comprise: judge module 400, parameter type identification module 402, display control generation module 404, display control memory module 406, validation verification module 408, Parameter Switch module 410, viewing area divide module 412, loaded and displayed module 414.
Introduce the relation between the function of each module and each module below respectively in detail.
Judge module 400, for identifying predefined test parameter at described parameter type identification module 402 call parameters common processing component, before obtaining the parameter type of described test parameter, judge whether described parameter common processing component supports described test parameter.
Preferably, described predefined test parameter can comprise initial parameter value, parameter effective range and parameter type etc.
If support, then described parameter type identification module 402 performs call parameters common processing component and identifies predefined test parameter, obtains the operation of the parameter type of described test parameter.
Parameter type identification module 402, identifies predefined test parameter for call parameters common processing component, obtains the parameter type of described test parameter.
Display control generation module 404, generates the display control corresponding with described test parameter for the parameter type according to described test parameter.
Display control memory module 406, after generating the display control corresponding with described test parameter at described display control generation module 404 according to the parameter type of described test parameter, is stored in described display control in control container.
Validation verification module 408, carries out validation verification for the parameter type according to described test parameter to described test parameter.
Parameter Switch module 410, for carrying out Parameter Switch to the predefined test parameter by validation verification.
Viewing area divides module 412, for calling the automatic charging assembly of control in described loaded and displayed module 414 according to the order preset with before classification loads described display control, call the viewing area that the automatic charging assembly of described control marks off the display control corresponding with described test parameter.
Loaded and displayed module 414, load described display control for calling the automatic charging assembly of control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
Preferably, described loaded and displayed module 414 calls the automatic charging assembly of described control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display in the viewing area that display control is corresponding.
In sum, embodiment of the present invention technical scheme comprises operation layer parameter general procedure mechanism and UI layer parameter display control autoloading system.Adopt these two kinds of mechanism UI layer and operation layer can be separated, reduce the coupling of software in comprehensive test instrument, improve the stability of software in comprehensive test instrument.
Call parameters common processing component identifies predefined test parameter, achieves the adaptation function of test parameter, decreases the workload of artificial cognition test parameter.
Parameter type according to test parameter generates the display control corresponding with test parameter, make the interface display style of test parameter unified, be conducive to improving man-machine interaction experience, improve the acceptance of user to comprehensive test instrument, and the operating process of unified test parameter, reduce the use threshold of user.
The embodiment of the present invention also has good extendability, can increase the parameter type that parameter common processing component is not supported fast, simply.
For system embodiment, due to itself and embodiment of the method basic simlarity, so description is fairly simple, relevant part illustrates see the part of embodiment of the method.
Each embodiment in this instructions all adopts the mode of going forward one by one to describe, and what each embodiment stressed is the difference with other embodiments, between each embodiment identical similar part mutually see.
Above to disposal route and the system of a kind of test parameter that the embodiment of the present invention provides, be described in detail, apply specific case herein to set forth principle of the present invention and embodiment, the explanation of above embodiment just understands method of the present invention and core concept thereof for helping; Meanwhile, for one of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.
Claims (12)
1. a disposal route for test parameter, is characterized in that, comprising:
Call parameters common processing component identifies predefined test parameter, obtains the parameter type of described test parameter;
Parameter type according to described test parameter generates the display control corresponding with described test parameter; And according to the parameter type of described test parameter, validation verification is carried out to described test parameter;
Parameter Switch is carried out to the predefined test parameter by validation verification;
Call the automatic charging assembly of control and load described display control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
2. method according to claim 1, is characterized in that, described predefined test parameter comprises initial parameter value, parameter effective range and parameter type.
3. method according to claim 1, is characterized in that, described in call the automatic charging assembly of control according to the order preset with before classification loads described display control, described method also comprises:
Call the viewing area that the automatic charging assembly of described control marks off the display control corresponding with described test parameter.
4. method according to claim 3, is characterized in that, described in call the automatic charging assembly of control and load described display control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, comprising:
Call the automatic charging assembly of described control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display in the viewing area that display control is corresponding.
5. method according to claim 1, is characterized in that, after the described parameter type according to described test parameter generates the display control corresponding with described test parameter, described method also comprises:
Described display control is stored in control container.
6. method according to claim 1, is characterized in that, described call parameters common processing component identifies predefined test parameter, and before obtaining the parameter type of described test parameter, described method also comprises:
Judge whether described parameter common processing component supports described test parameter;
If support, then perform call parameters common processing component and predefined test parameter is identified, obtain the operation of the parameter type of described test parameter.
7. a disposal system for test parameter, is characterized in that, comprising:
Parameter type identification module, identifies predefined test parameter for call parameters common processing component, obtains the parameter type of described test parameter;
Display control generation module, generates the display control corresponding with described test parameter for the parameter type according to described test parameter;
Validation verification module, carries out validation verification for the parameter type according to described test parameter to described test parameter;
Parameter Switch module, for carrying out Parameter Switch to the predefined test parameter by validation verification;
Loaded and displayed module, load described display control for calling the automatic charging assembly of control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display, completes test parameter process.
8. system according to claim 7, is characterized in that, described predefined test parameter comprises initial parameter value, parameter effective range and parameter type.
9. system according to claim 7, is characterized in that, described system also comprises:
Viewing area divides module, for calling the automatic charging assembly of control in described loaded and displayed module according to the order preset with before classification loads described display control, call the viewing area that the automatic charging assembly of described control marks off the display control corresponding with described test parameter.
10. system according to claim 9, is characterized in that, described loaded and displayed module calls the automatic charging assembly of described control according to the order preset and classification, the parameter information after Parameter Switch is carried out in display in the viewing area that display control is corresponding.
11. systems according to claim 7, is characterized in that, described system also comprises:
Display control memory module, after generating the display control corresponding with described test parameter at described display control generation module according to the parameter type of described test parameter, is stored in described display control in control container.
12. systems according to claim 7, is characterized in that, described system also comprises:
Judge module, for identifying predefined test parameter at described parameter type identification module call parameters common processing component, before obtaining the parameter type of described test parameter, judge whether described parameter common processing component supports described test parameter;
If support, then described parameter type identification module execution call parameters common processing component identifies predefined test parameter, obtains the operation of the parameter type of described test parameter.
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Application publication date: 20150513 |