CN108195866B - Method for judging silicone rubber aging degree of composite insulator - Google Patents
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- 229920002379 silicone rubber Polymers 0.000 title claims abstract description 69
- 238000000034 method Methods 0.000 title claims abstract description 42
- 230000032683 aging Effects 0.000 title claims abstract description 41
- 239000012212 insulator Substances 0.000 title claims abstract description 34
- 239000002131 composite material Substances 0.000 title claims abstract description 31
- 239000004945 silicone rubber Substances 0.000 title claims abstract description 30
- 125000004430 oxygen atom Chemical group O* 0.000 claims abstract description 30
- 125000004429 atom Chemical group 0.000 claims abstract description 19
- 238000001228 spectrum Methods 0.000 claims abstract description 19
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 12
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 claims abstract description 10
- -1 siloxane functional groups Chemical group 0.000 claims abstract description 10
- 238000004458 analytical method Methods 0.000 claims abstract description 8
- OBNDGIHQAIXEAO-UHFFFAOYSA-N [O].[Si] Chemical group [O].[Si] OBNDGIHQAIXEAO-UHFFFAOYSA-N 0.000 claims abstract description 7
- 125000000524 functional group Chemical group 0.000 claims abstract description 7
- 238000005520 cutting process Methods 0.000 claims abstract description 6
- 125000004469 siloxy group Chemical group [SiH3]O* 0.000 claims abstract description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 13
- 239000004205 dimethyl polysiloxane Substances 0.000 claims description 4
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 claims description 4
- 238000001675 atomic spectrum Methods 0.000 claims description 2
- 238000012545 processing Methods 0.000 claims description 2
- 239000010453 quartz Substances 0.000 claims description 2
- 239000000463 material Substances 0.000 description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- 238000004364 calculation method Methods 0.000 description 5
- 238000012423 maintenance Methods 0.000 description 4
- 230000003647 oxidation Effects 0.000 description 4
- 238000007254 oxidation reaction Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000004132 cross linking Methods 0.000 description 3
- 229920001971 elastomer Polymers 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000000026 X-ray photoelectron spectrum Methods 0.000 description 1
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000006229 carbon black Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000006353 environmental stress Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000005562 fading Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 125000000962 organic group Chemical group 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 239000012763 reinforcing filler Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- KHDSWONFYIAAPE-UHFFFAOYSA-N silicon sulfide Chemical compound S=[Si]=S KHDSWONFYIAAPE-UHFFFAOYSA-N 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
- G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
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Abstract
The invention discloses a method for judging the aging degree of silicone rubber of a composite insulator, which comprises the following steps: s1, cutting a sample from the silicon rubber umbrella skirt of the composite insulator to be tested, and carrying out X-ray photoelectron spectroscopy analysis on the sample to obtain a Si2p energy spectrum of the sample; s2, performing peak-splitting fitting treatment on the Si2p energy spectrum obtained in the step S1 by using a peak-splitting fitting method to obtain four sub-peaks corresponding to the silicon-oxygen functional groups of four configurations of Si atoms in the silicon rubber umbrella skirt; s3, calculating the peak area of each sub-peak, and determining the relative proportion of the siloxy functional groups of each configuration according to the ratio of the peak areas of the sub-peaks; s4, calculating the average number of O atoms around one Si atom according to the relative proportion of the siloxane functional groups with each configuration obtained in the step S3; and S5, judging the aging degree of the silicon rubber in the sample according to the average O atom number. The invention can accurately judge the aging degree of the composite insulator silicon rubber.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the field of analysis and detection, in particular to a method for judging the aging degree of silicone rubber of a composite insulator.
[ background of the invention ]
In the electric power system in China, most of umbrella skirt sheath materials of the composite insulator are silicon rubber, the raw rubber component of the HTV silicon rubber is polyorganosiloxane with high linear polymerization degree, and the HTV silicon rubber is formed by adding increment filler, reinforcing filler, a structural control agent and various auxiliaries, has good mechanical and electrical properties and has unique hydrophobic migration property, so the HTV silicon rubber is widely applied.
The silicon rubber belongs to an organic polymer material, the operation environment is relatively severe, the silicon rubber is influenced by environmental stresses such as high electric field intensity, high pollution, humidity and the like for a long time, an aging phenomenon inevitably occurs after the silicon rubber runs for a period of time, and the normal operation of line equipment is influenced by the deterioration of the performance of the silicon rubber. Therefore, it is necessary to analyze the aging state of the composite insulator shed silicon rubber material operating for a certain period of time by macroscopic and microscopic measurement means, so as to provide a reference basis for the operation and maintenance department to formulate the maintenance strategy of the composite insulator. In the past, whether the silicon rubber is aged or not is generally judged subjectively by a detector, and quantitative and accurate analysis cannot be carried out.
[ summary of the invention ]
The technical problem to be solved by the invention is as follows: the method for judging the aging degree of the silicone rubber of the composite insulator makes up the defects of the prior art, and can judge the aging degree of the silicone rubber of the composite insulator more accurately.
The technical problem of the invention is solved by the following technical scheme:
a method for judging the aging degree of silicone rubber of a composite insulator comprises the following steps: s1, cutting a sample from the silicon rubber umbrella skirt of the composite insulator to be tested, and carrying out X-ray photoelectron spectroscopy analysis on the sample to obtain a Si2p energy spectrum of the sample; s2, performing peak-splitting fitting treatment on the Si2p energy spectrum obtained in the step S1 by using a peak-splitting fitting method to obtain four sub-peaks corresponding to the silicon-oxygen functional groups of four configurations of Si atoms in the silicon rubber umbrella skirt; wherein, the four configurations of the silica functional groups are respectively: first configuration Si (-O)1Second configuration Si (-O)2Third configuration Si (-O)3And a fourth configuration Si (-O)4(ii) a S3, calculating the peak area of each sub-peak, and determining the relative proportion of the siloxy functional groups of each configuration according to the ratio of the peak areas of the sub-peaks; s4, calculating the average number of O atoms around one Si atom according to the relative proportion of the siloxane functional groups with each configuration obtained in the step S3; and S5, judging the aging degree of the silicon rubber in the sample according to the average O atom number.
Compared with the prior art, the invention has the advantages that:
according to the method for judging the aging degree of the composite insulator silicon rubber, the surface of the insulator silicon rubber is subjected to X-ray photoelectron spectroscopy analysis, silicon atom ratios of different configurations are calculated by combining a peak-splitting fitting method, the average number of oxygen atoms around the silicon atoms in the silicon rubber is obtained according to the ratios, so that the oxidation crosslinking degree of the silicon rubber is judged, and the aging degree of the silicon rubber material is further judged. In the judging method, the aging degree is judged according to the average O atom number, quantitative analysis can be realized, and the judging result is more accurate. The method can be used for providing quantitative indexes for composite insulator silicon rubber materials with different aging degrees and providing judgment indexes and bases for operation and maintenance departments to evaluate the running state of the line insulator.
[ description of the drawings ]
Fig. 1 is a schematic diagram of a result after peak fitting in the determination method according to the embodiment of the present invention.
[ detailed description ] embodiments
The present invention will be described in further detail with reference to the following detailed description and accompanying drawings.
The conception of the invention is as follows: the natural aging process of the silicon sulfide rubber is generally oxidation of organic groups of polyorganosiloxane side chains, and the crosslinking degree between silicon-oxygen main chains is increased, macroscopically expressed as umbrella skirt hardening, fading, cracking and the like, and severely serious surfaces are obviously pulverized, and the organic content is greatly reduced. In the determination process, on one hand, the surface of the material is analyzed by utilizing X-ray photoelectron spectroscopy. On the other hand, X-ray photoelectron spectroscopy is combined with a peak fitting technique. This is because, although the relative proportions of silicon atoms and oxygen atoms on the surface of the material can be directly provided by X-ray photoelectron spectroscopy, the oxidation state of silicon atoms in the material cannot be accurately evaluated because the material contains other components containing oxygen and silicon elements (such as aluminum hydroxide, white carbon black, and the like), and therefore, the degree of aging cannot be determined from the relative proportions of silicon atoms and oxygen atoms alone. And by combining peak fitting, the relative proportion of silicon atoms in different chemical environments can be calculated, so that the average oxygen atom number around the silicon atoms can be deduced, and the oxidation crosslinking degree and the aging degree of the surface of the silicon rubber material can be reflected visually.
The specific embodiment provides a method for judging the aging degree of composite insulator silicone rubber, which is used for judging the aging degree of the composite insulator silicone rubber based on the combination of an X-ray photoelectron spectrum and a peak-splitting fitting technology. Based on the X-ray photoelectron spectroscopy analysis of the composite insulator silicon rubber material to be detected, based on the data of an NIST Database (National Institute of standards and Technology Atomic Spectra Database ), the Si2p peak is subjected to peak-splitting fitting to obtain the relative proportion of Si atoms of different configurations, so that the average number of O atoms around the Si atoms is calculated, and the aging degree of the silicon rubber is judged. The determination process is described in detail as follows.
S1, cutting a sample from the silicon rubber umbrella skirt of the composite insulator to be tested, and carrying out X-ray photoelectron spectroscopy analysis on the sample to obtain a Si2p energy spectrum of the sample.
In the step, a rubber cutting knife can be used for cutting a surface layer sample with the thickness of 1-2 mm from the composite insulator silicon rubber shed to be detected, and then an X-ray photoelectron spectrometer is used for carrying out energy spectrum analysis to obtain an Si2p energy spectrum of the sample. The original peak curve shown as the solid line in fig. 1 is the Si2p spectrum of the sample in this embodiment.
S2, performing peak-splitting fitting treatment on the Si2p energy spectrum obtained in the step S1 by using a peak-splitting fitting method to obtain four sub-peaks corresponding to the silicon-oxygen functional groups of four configurations of Si atoms in the silicon rubber umbrella skirt; wherein, the four configurations of the silica functional groups are respectively: first configuration Si (-O)1Second configuration Si (-O)2Third configuration Si (-O)3And a fourth configuration Si (-O)4。
The Si atoms in the silicone rubber sheds exist in four configurations, as shown in the following table:
the raw peak data of the Si2p spectrum of the silicone rubber sample can be considered to be the sum of the 2p spectra of the above four Si atoms of different valence states. Therefore, in this step, the original peak obtained in step S1 is peaked by the peak-splitting fitting technique to obtain the corresponding sub-peaks of the functional groups of the four configurations. The peak splitting fitting process is a continuous iteration process, and finally, the synthesized peak of the four split sub-peaks approaches to the original peak infinitely. After four sub-peaks are obtained, the relative proportion of the silica functional groups with four configurations can be calculated subsequently.
Preferably, in the step, four sub-peaks are obtained by performing peak-splitting fitting processing on the Si2p energy spectrum by a Gauss-Lorentzian (Gaussian-Lorentzian) peak-splitting fitting method. Specifically, the method comprises the following steps:
s21, estimating the binding energy of the four configurations of siloxane functional groups.
The binding energy corresponds to the abscissa in the energy spectrum curve and represents the chemical shift of the Si atom in different configurations. In this embodiment, the NIST database is used to store Polydimethylsiloxane (PDMS) and quartz (SiO)2) As binding energy of the groups of D and Q configurations, and then estimating the binding energy of M with the groups of T configuration from the groups of D and Q configurations using linear interpolation. Since there is some dispersion in the binding energy data of the same kind of substances in the NIST database, the median of the data of the corresponding substances is used as the binding energy. The binding energy of the siloxy functional groups of each configuration is estimated as shown in the following table:
| binding energy/eV | |
| M | 101.5 |
| D | 102.2 |
| T | 102.9 |
| Q | 103.5 |
S22, determining the peak position of the corresponding sub-peak according to the binding energy of the four configurations of the silica functional groups, presetting the full width at half maximum range of the sub-peak corresponding to the four configurations of the silica functional groups, and performing peak-splitting fitting treatment on the Si2p energy spectrum by using a Gauss-Lorentzian peak-splitting fitting method to obtain the four sub-peaks.
In the step, the peak positions (the peak positions are allowed to have errors of +/-0.1 eV) of 4 sub-peaks (respectively corresponding to M/D/T/Q configurations) respectively corresponding to 101.5eV, 102.2eV, 102.9eV and 103.5eV are determined, the half-height width of the sub-peak corresponding to M/D/T is set within 0.5-1.5 eV, and the half-height width of the sub-peak corresponding to Q is set within 0.5-2.7 eV, preferably within 0.5-2.0 eV. According to the peak position and the full width at half maximum, the Gaussian-Lorentzian method can be used for carrying out peak splitting fitting on the original peak of the Si2p energy spectrum of the sample. As shown in fig. 1, the results after peak fitting are shown schematically. In the figure, the solid line shows the Si2p energy spectrum of the sample obtained in step S1, that is, the original peak. The dotted line shows the four sub-peaks separated. The dashed line represents the resultant peak of the four sub-peaks, which is substantially identical to the original peak, thereby indicating that the four sub-peak results obtained by splitting the peak are accurate.
In addition, preferably, the peak fitting process in step S2 may also obtain sub-peaks by performing peak separation directly through XPS peak separation software (XPSpeak41 software). The original peak data of the Si2p energy spectrum is input into software, the data range of the sub-peak is set, and the curve of the sub-peak can be directly obtained from the software.
S3, calculating the peak area of each sub-peak, and determining the relative proportion of the siloxy functional groups of each configuration according to the ratio of the peak areas of the sub-peaks.
In this step, the peak areas (integrated intensities) of the respective sub-peaks are calculated, and the ratio of the peak areas is the relative proportion of the different configurations of the siloxane functional groups.
S4, calculating the average number of O atoms around one Si atom from the relative proportions of the siloxane functional groups of each configuration obtained in step S3.
In the step, for the relative proportion of four functional groups M/D/T/Q obtained by peak separation, the average O atom number around one Si atom can be calculated by weighted average
Wherein, p (M), p (D), p (T), p (Q) respectively represent the proportion of the first configuration, the second configuration, the third configuration and the fourth configuration. Since each O atom bonded to a Si atom is simultaneously bonded to another Si atom, only half of the O atoms can be counted in the calculation of the number of atoms, and thus the above formula is divided by 2 after the addition calculation, thereby expressing the average number of O atoms around one Si atom.
And S5, judging the aging degree of the silicon rubber in the sample according to the average O atom number.
In this step, the average number of O atoms may be compared with a preset threshold value to determine the degree of aging of the silicone rubber in the sample. In order to judge the aging degree of the silicon rubber more finely, two thresholds are set for judgment, so that the aging degree is divided into three grades. Specifically, the average O atom number is compared with a preset first threshold value and a preset second threshold value, and if the average O atom number is larger than the first threshold value, the silicone rubber is judged to be seriously aged; if the value is less than or equal to the first threshold value and greater than or equal to a second threshold value, judging that the silicone rubber is slightly aged; and if the value is smaller than the second threshold value, judging that the silicone rubber is not aged. The specific values of the first threshold and the second threshold can be obtained by summarizing empirical values from the number of O samples corresponding to a large number of silicon rubber samples in known aging states.
In one example, the first threshold is 1.6 and the second threshold is 1.4. Therefore, if the average O atom number of the sample to be tested exceeds 1.6, the silicone rubber to be tested is seriously aged (oxidized and crosslinked); if the silicon rubber does not exceed 1.6 and is more than or equal to 1.4, the silicon rubber is slightly aged; if less than 1.4, it means that no significant aging of the silicone rubber has occurred.
The following table shows the results of calculation and determination for 6 samples of the composite insulator silicone rubber shed.
In the above table, taking sample No. 1 as an example, the calculation procedure of the average O atom number is as follows:
the calculation process is the same for the rest of the samples, which are not listed here.
As can be seen from the data in the table, the evaluation result of the determination method of the present embodiment is consistent with the degree of aging of the composite insulator silicone rubber material evaluated by other methods, and the more severe the degree of aging is, the larger the value of the average O atom number is, and the two have positive correlation. The judgment method of the specific embodiment can be used for giving quantitative indexes to composite insulator silicon rubber materials with different aging degrees, and providing quantitative and accurate judgment indexes and bases for operation and maintenance departments to evaluate the running state of the line insulator.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several alternatives or obvious modifications can be made without departing from the spirit of the invention, and all equivalents in performance or use should be deemed to fall within the scope of the invention.
Claims (7)
1. A method for judging the aging degree of silicone rubber of a composite insulator is characterized by comprising the following steps: the method comprises the following steps:
s1, cutting a sample from the silicon rubber umbrella skirt of the composite insulator to be tested, and carrying out X-ray photoelectron spectroscopy analysis on the sample to obtain a Si2p energy spectrum of the sample;
s2, performing peak-splitting fitting treatment on the Si2p energy spectrum obtained in the step S1 by using a peak-splitting fitting method to obtain four sub-peaks corresponding to the silicon-oxygen functional groups of four configurations of Si atoms in the silicon rubber umbrella skirt; wherein, the four configurations of the silica functional groups are respectively: first configuration Si (-O)1Second configuration Si (-O)2Third configuration Si (-O)3And a fourth configuration Si (-O)4(ii) a Wherein, S2 includes the following steps:
s21, estimating the binding energy of the four configurational silica functional groups;
s22, determining peak positions of corresponding sub-peaks according to the binding energy of four configurations of silicon-oxygen functional groups, presetting the full width at half maximum of the sub-peaks corresponding to the four configurations of silicon-oxygen functional groups, and performing peak-splitting fitting processing on the Si2p energy spectrum by using a Gauss-Lorentzian peak-splitting fitting method to obtain the four sub-peaks, wherein the peak position of the sub-peak corresponding to the second configuration is determined to be within a range of 102.2eV +/-0.1 eV, the peak position of the sub-peak corresponding to the fourth configuration is determined to be within a range of 103.5eV +/-0.1 eV, the peak position of the sub-peak corresponding to the first configuration is determined to be within a range of 101.5eV +/-0.1 eV, and the peak position of the sub-peak corresponding to the third configuration is determined to be within a range of 102.9eV +/-0.1 eV; presetting the half-height width ranges of sub-peaks corresponding to the silica functional groups of the first configuration, the second configuration and the third configuration to be 0.5-1.5 eV, and presetting the half-height width ranges of sub-peaks corresponding to the silica functional groups of the fourth configuration to be 0.5-2.7 eV;
s3, calculating the peak area of each sub-peak, and determining the relative proportion of the siloxy functional groups of each configuration according to the ratio of the peak areas of the sub-peaks;
s4, calculating the average number of O atoms around one Si atom according to the relative proportion of the siloxane functional groups with each configuration obtained in the step S3;
and S5, judging the aging degree of the silicon rubber in the sample according to the average O atom number, wherein the more serious the aging degree is, the larger the value of the average O atom number is, and the positive correlation exists between the average O atom number and the silicon rubber.
2. The method for judging the degree of aging of silicone rubber for a composite insulator according to claim 1, wherein: in S21, Polydimethylsiloxane (PDMS) and quartz (SiO) in NIST atomic spectrum database2) The binding energy data of (a) are taken as the binding energies of the siloxane functional groups of the second configuration and the fourth configuration, respectively, and a linear interpolation method is adopted for the binding energies of the second configuration and the fourth configurationThe binding energy of the first and third configurations of the siloxane functionality was estimated.
3. The method for judging the degree of aging of silicone rubber for a composite insulator according to claim 2, characterized in that: in S21, the binding energy of the second configuration was estimated to be 102.2eV, the binding energy of the fourth configuration was estimated to be 103.5eV, the binding energy of the first configuration was estimated to be 101.5eV, and the binding energy of the third configuration was estimated to be 102.9 eV.
4. The method for judging the degree of aging of silicone rubber for a composite insulator according to claim 1, wherein: the half-height width range of a sub-peak corresponding to the silica functional group with the fourth configuration is preset to be 0.5-2.0 eV.
5. The method for judging the degree of aging of silicone rubber for a composite insulator according to claim 1, wherein: in S4, the average number of O atoms around one Si atom is calculated according to the following formula
Wherein, in the step (A),
，
，
，
respectively representing the proportions of the first configuration, the second configuration, the third configuration and the fourth configuration.
6. The method for judging the degree of aging of silicone rubber for a composite insulator according to claim 1, wherein: in S5, the average number of O atoms is compared with a preset threshold value to determine the degree of aging of the silicone rubber in the sample.
7. The method for judging the degree of aging of silicone rubber for a composite insulator according to claim 6, wherein: comparing the average O atom number with a preset first threshold value and a preset second threshold value, and if the average O atom number is larger than the first threshold value, judging that the silicone rubber is seriously aged; if the value is less than or equal to the first threshold value and greater than or equal to a second threshold value, judging that the silicone rubber is slightly aged; and if the value is smaller than the second threshold value, judging that the silicone rubber is not aged.
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| CN110954793B (en) * | 2019-12-10 | 2021-06-01 | 西安交通大学 | Composite insulator umbrella skirt aging detection method and detection device based on spectral imaging |
| CN117452165A (en) * | 2023-11-17 | 2024-01-26 | 国网青海省电力公司海南供电公司 | Composite insulator surface insulation performance evaluation method based on novel leakage current separation technology |
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