CN108010557A - Passive UHF RFID chips store the test method of erasable number - Google Patents
Passive UHF RFID chips store the test method of erasable number Download PDFInfo
- Publication number
- CN108010557A CN108010557A CN201711126487.8A CN201711126487A CN108010557A CN 108010557 A CN108010557 A CN 108010557A CN 201711126487 A CN201711126487 A CN 201711126487A CN 108010557 A CN108010557 A CN 108010557A
- Authority
- CN
- China
- Prior art keywords
- memory area
- chip
- predetermined memory
- rfid tag
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/0722—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips comprising an arrangement for testing the record carrier
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Credit Cards Or The Like (AREA)
Abstract
The invention discloses the test method that a kind of passive UHF RFID chips store erasable number, including, the predetermined memory area of the RFID tag reader to a chip to be tested is set to send writing commands repeatedly to be repetitively written one first tentation data, until the predetermined memory area is fully written；The predetermined memory area of the RFID tag reader to the chip to be tested is set to send writing commands repeatedly to be repetitively written one second tentation data, the predetermined memory area is read to verify whether second tentation data writes success, first tentation data is repetitively written again, and verify whether first tentation data writes success, repeat the above steps a pre-determined number.Present invention obtains following beneficial effect：The erasable number of storage that can be to the predetermined memory area of passive UHF RFID chips is effectively tested.
Description
Technical field
The present invention relates to radio frequency tag technology field, more particularly to a kind of passive UHF RFID chips to store erasable number
Test method.
Background technology
Radio Frequency Identification Technology is a kind of wireless, cordless the automatic identification skill risen nineteen nineties
Art, is the frontier science and technology project to grow up in recent years.The technology mainly realizes nothing using radiofrequency signal by Space Coupling
Contact information is passed through transmitted information and reaches identifying purpose.The remarkable advantage of Radio Frequency Identification Technology is non-contact
Property, therefore can realize identification automation without manual intervention during completion identification work and be hardly damaged；Recognizable high-speed motion
RF tag, can also identify multiple RF tags at the same time, it is swift and convenient to operate；RF tag is not afraid of oil stain, dust pollution etc.
Adverse circumstances, and non-metallic object can be penetrated and be identified, strong antijamming capability.
In existing radio frequency tag technology, passive UHF RFID (superfrequency RF tag) are widely used in Internet of Things
In, however, due to lacking test equipment and test method to passive UHF RFID at present so that various working index disunities
Passive UHF RFID be mixed use, cause Internet of Things or corresponding use environment job insecurity.
Since the chip of UHF RFID tags is its main working parts, how a system is provided to UHF RFID chips
Effective test method is arranged, becomes the problem of industry.
The content of the invention
For the above-mentioned problems in the prior art, a kind of passive UHF RFID chips are now provided and store erasable number
Test method.
To achieve the above object, present invention employs following technical solution：
A kind of passive UHF RFID chips store the test method of erasable number, wherein, there is provided a RFID tag reader
And a rf signal analysis device, a plurality of test cases are defined according to test event, it is further comprising the steps of：
Step 1, a test case is chosen；
Step 2, the RFID tag reader parameter is set according to the test case of selection；
Step 3, the rf signal analysis device parameter is set according to the test case of selection, believes the radio frequency
Number analytical equipment works in corresponding signal analysis pattern；
Step 4, the predetermined memory area of the RFID tag reader to a chip to be tested is made to send writing commands repeatedly
To be repetitively written one first tentation data, until the predetermined memory area is fully written；
Step 5, make the rf signal analysis device gather the RFID tag reader with the chip to be tested to lead to
Radiofrequency signal during letter；
Step 6, the RFID tag reader is made to send write-in life repeatedly to the predetermined memory area of the chip to be tested
Order is to be repetitively written one second tentation data, until the predetermined memory area is fully written, then makes the RFID tag reader
Reading order is sent to the chip to be tested, reads the predetermined memory area to verify whether second tentation data writes
Success, the test crash if unsuccessful, and exit；
Step 7, the RFID tag reader is made to send write-in life repeatedly to the predetermined memory area of the chip to be tested
Order is to be repetitively written first tentation data, until the predetermined memory area is fully written, then reads and writes the RFID tag
Device sends reading order to the chip to be tested, reads the predetermined memory area to verify whether first tentation data is write
Enter success, the test crash if unsuccessful, and exit；
Step 8, repeating said steps 4 are to step 7 pre-determined number；
Step 9, next test case is chosen, and repeating said steps 2 are to the step 8, until all tests are used
Example is completed.
Another aspect of the present invention, the rf signal analysis device are spectrum analyzer.
Another aspect of the present invention, the working frequency of the RFID tag reader is 920MHz~925MHz.
Another aspect of the present invention, the chip to be tested encapsulate chip for COB, and the COB encapsulation chip includes matching
Network and balun, 0 Ohmic resistance and functional chip.
Another aspect of the present invention, further includes a circulator, described in the rf signal analysis device is connected by feeder line
The first port of circulator, the RFID tag reader connects the second port of the circulator by feeder line, described to treat
Test chip connects the 3rd port of the circulator by feeder line.
Another aspect of the present invention, first tentation data are character 0x00.
Another aspect of the present invention, second tentation data are character 0xFF.
Another aspect of the present invention, the predetermined memory area correspond to the test case.
Another aspect of the present invention, the pre-determined number are 100,000 times.
Present invention obtains following beneficial effect：
The erasable number of storage that can be to each memory block of passive UHF RFID chips is effectively tested.
Brief description of the drawings
Fig. 1 is that the test equipment connection structure for the test method that the passive UHF RFID chips of the present invention store erasable number is shown
It is intended to；
Fig. 2 is the FB(flow block) for the test method that the passive UHF RFID chips of the present invention store erasable number.
Embodiment
The invention will be further described with specific embodiment below in conjunction with the accompanying drawings, but not as limiting to the invention.
The present invention provides the test method that a kind of passive UHF RFID chips store erasable number, as shown in Figure 1 and Figure 2, its
In, there is provided a RFID tag reader 2 and a rf signal analysis device 1, define a plurality of tests according to test event and use
Example, it is further comprising the steps of：
Step 1, a test case is chosen；
Step 2,2 parameter of RFID tag reader is set according to the test case of selection；
Step 3, the parameter of the rf signal analysis device 1 is set according to the test case of selection, makes described penetrate
Frequency signal analysis device 1 works in corresponding signal analysis pattern；
Step 4, the RFID tag reader 2 is made to send write-in life repeatedly to the predetermined memory area of a chip 5 to be tested
Order is to be repetitively written one first tentation data, until the predetermined memory area is fully written；
Step 5, the rf signal analysis device 1 is made to gather the RFID tag reader 2 and the chip 5 to be tested
Radiofrequency signal in communication process；
Step 6, the predetermined memory area of the RFID tag reader 2 to the chip 5 to be tested is made to send write-in repeatedly
Order is to be repetitively written one second tentation data, until the predetermined memory area is fully written, then reads and writes the RFID tag
Device 2 sends reading order to the chip 5 to be tested, reads the predetermined memory area whether to verify second tentation data
Write successfully, the test crash if unsuccessful, and exit；
Step 7, the predetermined memory area of the RFID tag reader 2 to the chip 5 to be tested is made to send write-in repeatedly
Order is to be repetitively written first tentation data, until the predetermined memory area is fully written, then reads the RFID tag
Write device 2 and send reading order to the chip 5 to be tested, read the predetermined memory area to verify that first tentation data is
It is no to write successfully, the test crash if unsuccessful, and exit；
Step 8, repeating said steps 4 are to step 7 pre-determined number；
Step 9, next test case is chosen, and repeating said steps 2 are to the step 8, until all tests are used
Example is completed.
Another aspect of the present invention, the rf signal analysis device 1 are spectrum analyzer.
Another aspect of the present invention, the working frequency of the RFID tag reader 2 is 920MHz~925MHz.
Another aspect of the present invention, the chip 5 to be tested encapsulate chip for COB, and the COB encapsulation chip includes matching
Network and balun, 0 Ohmic resistance and functional chip.
Another aspect of the present invention, further includes a circulator 3, and the rf signal analysis device 1 connects institute by feeder line
The first port of circulator 3 is stated, the RFID tag reader 2 connects the second port of the circulator 3, institute by feeder line
State the 3rd port that chip 5 to be tested connects the circulator 3 by feeder line.
Another aspect of the present invention, first tentation data are character 0x00.
Another aspect of the present invention, second tentation data are character 0xFF.
Another aspect of the present invention, the predetermined memory area correspond to the test case.
Another aspect of the present invention, the pre-determined number are 100,000 times.
Illustrate the feasibility of the present invention with specific embodiment below.
It is 920.125MHz by the working frequency points of RFID tag reader in step 2, starts querying command forward chaining roadbed
6.25 μ s are arranged between punctual, reverse link frequencies are arranged to 320Khz, and coding mode is arranged to FM0, band lead code.
In step 4, before writing commands, first pass through and meet that the startup querying command of T2 requirements and coding obtain order and make
Chip to be tested is in open state.
The illustrated in table 1 of above-mentioned T2.
Table 1
Then, the transmission power of RFID tag reader is arranged to 0dBm, it is pre- with first to send writing commands repeatedly
Fixed number is full according to predetermined memory area is write, and erasing operation has been carried out equivalent to predetermined memory area.
In step 6, RFID tag reader writes predetermined memory area to send writing commands repeatedly, with the second tentation data
It is full, write operation has been carried out again equivalent to predetermined memory area, whether the second tentation data for then reading write-in writes success,
Verify whether this write operation succeeds, as unsuccessful, represent erasable test crash.
In step 7, RFID tag reader to send writing commands repeatedly, again with the first tentation data by predetermined storage
Area is write completely, and erasing operation has been carried out again equivalent to predetermined memory area, and whether the first tentation data for then reading write-in is write
Enter success, that is, verify whether this erasing operation succeeds, as unsuccessful, represent erasable test crash.
Above-mentioned first tentation data and the second tentation data preferably select that there are the data of more apparent feature to be tested in order to read
Card is such as reading neither the first tentation data is nor the second predetermined number such as in the second tentation data of verification for the first time
According to, then can determine whether first time erasing operation fail, can determine whether if what is read is the first tentation data step 6 write operation lose
Lose.
As preferred embodiment, the first tentation data is 0x00, and the second tentation data is 0xFF.
, still can not be successfully erasable after test chip carries out electrification reset as treated for 5 times repeatedly after the erasable failure of generation, then
Chip testing fails.Power on reset operation such as within 5 times recovers chip can be successfully erasable, then restarts erasable survey
Examination.
Above-mentioned predetermined memory area corresponds to test case, and test case of the invention can carry out write operation for chip to be tested
All user areas, including record information area, code area, place of safety, user area.
The erasable number of operations of success such as all user areas of chip to be tested is more than 100,000 times, then test passes through, otherwise
Test crash.
The foregoing is merely preferred embodiments of the present invention, not thereby limit embodiments of the present invention and protection model
Enclose, to those skilled in the art, should can appreciate that all with made by description of the invention and diagramatic content
Equivalent substitution and obviously change obtained scheme, should be included in protection scope of the present invention.
Claims (9)
1. a kind of passive UHF RFID chips store the test method of erasable number, it is characterised in that provide a RFID tag and read
Device and a rf signal analysis device are write, a plurality of test cases are defined according to test event, it is further comprising the steps of：
Step 1, a test case is chosen；
Step 2, the RFID tag reader parameter is set according to the test case of selection；
Step 3, the rf signal analysis device parameter is set according to the test case of selection, makes the radiofrequency signal point
Analysis apparatus works in corresponding signal analysis pattern；
Step 4, the predetermined memory area of the RFID tag reader to a chip to be tested is made to send writing commands repeatedly with anti-
Make carbon copies into one first tentation data, until the predetermined memory area is fully written；
Step 5, the rf signal analysis device is made to gather the RFID tag reader and the chip communication mistake to be tested
Radiofrequency signal in journey；
Step 6, make predetermined memory area from the RFID tag reader to the chip to be tested send repeatedly writing commands with
One second tentation data is repetitively written, until the predetermined memory area is fully written, then makes the RFID tag reader to institute
State chip to be tested and send reading order, read the predetermined memory area to verify whether second tentation data is written to
Work(, the test crash if unsuccessful, and exit；
Step 7, make predetermined memory area from the RFID tag reader to the chip to be tested send repeatedly writing commands with
Be repetitively written first tentation data, until the predetermined memory area is fully written, then make the RFID tag reader to
The chip to be tested sends reading order, reads the predetermined memory area to verify whether first tentation data is written to
Work(, the test crash if unsuccessful, and exit；
Step 8, repeating said steps 4 are to step 7 pre-determined number；
Step 9, next test case is chosen, and repeating said steps 2 are to the step 8, until all test cases are surveyed
Examination finishes.
2. test method as claimed in claim 1, it is characterised in that the rf signal analysis device is spectrum analyzer.
3. test method as claimed in claim 1, it is characterised in that the working frequency of the RFID tag reader is
920MHz~925MHz.
4. test method as claimed in claim 1, it is characterised in that the chip to be tested encapsulates chip for COB, described
COB encapsulation chips include matching network and balun, 0 Ohmic resistance and functional chip.
5. test method as claimed in claim 1, it is characterised in that further include a circulator, the rf signal analysis dress
The first port that the circulator is connected by feeder line is put, the RFID tag reader connects the circulator by feeder line
Second port, the chip to be tested connects the 3rd port of the circulator by feeder line.
6. test method as claimed in claim 1, it is characterised in that first tentation data is character 0x00.
7. test method as claimed in claim 1, it is characterised in that second tentation data is character 0xFF.
8. test method as claimed in claim 1, it is characterised in that the predetermined memory area corresponds to the test case.
9. test method as claimed in claim 1, it is characterised in that the pre-determined number is 100,000 times.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711126487.8A CN108010557A (en) | 2017-11-15 | 2017-11-15 | Passive UHF RFID chips store the test method of erasable number |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711126487.8A CN108010557A (en) | 2017-11-15 | 2017-11-15 | Passive UHF RFID chips store the test method of erasable number |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108010557A true CN108010557A (en) | 2018-05-08 |
Family
ID=62052629
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711126487.8A Pending CN108010557A (en) | 2017-11-15 | 2017-11-15 | Passive UHF RFID chips store the test method of erasable number |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108010557A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104360199A (en) * | 2014-11-21 | 2015-02-18 | 国家电网公司 | Ultrahigh-frequency-band RFID testing system |
| CN104573791A (en) * | 2012-11-02 | 2015-04-29 | 弗莱克斯电子有限责任公司 | Embedded high frequency RFID |
| CN104658613A (en) * | 2014-12-30 | 2015-05-27 | 中国电子科技集团公司第四十七研究所 | EEPROM durability test method and EEPROM durability test device |
-
2017
- 2017-11-15 CN CN201711126487.8A patent/CN108010557A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104573791A (en) * | 2012-11-02 | 2015-04-29 | 弗莱克斯电子有限责任公司 | Embedded high frequency RFID |
| CN104360199A (en) * | 2014-11-21 | 2015-02-18 | 国家电网公司 | Ultrahigh-frequency-band RFID testing system |
| CN104658613A (en) * | 2014-12-30 | 2015-05-27 | 中国电子科技集团公司第四十七研究所 | EEPROM durability test method and EEPROM durability test device |
Non-Patent Citations (1)
| Title |
|---|
| 张兵兵: ""基于自主标准的RFID设备测试研究"", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8810369B2 (en) | Finding sensor data in an RFID network | |
| CN102539970A (en) | RFID (radio frequency identification) equipment testing method and system | |
| CN104091184B (en) | Electronic label detecting method and system | |
| JP2007538296A (en) | Contactless card | |
| CN112364954A (en) | Method and system for managing and controlling equipment in office building based on RFID (radio frequency identification) radio-frequency reader-writer | |
| CN107833593A (en) | A kind of method of testing of passive UHF RFID chips memory capacity | |
| CN107748853A (en) | Passive UHF RFID label tags read write line method of testing | |
| CN107908986A (en) | Passive UHF radio frequency label read-write machines multi-tag recognition capability test device | |
| CN108010557A (en) | Passive UHF RFID chips store the test method of erasable number | |
| CN104869534A (en) | Method based on mobile phone application remote detection smart card and system thereof | |
| CN107977588A (en) | A kind of test method of passive UHF RFID chips protocol capabilities | |
| CN107798262A (en) | Passive UHF RFID label tags read write line sensibility testing arrangement and method | |
| CN107832642A (en) | Passive UHF RFID tag sensibility testing arrangement and method | |
| CN108062491A (en) | A kind of test method of passive UHF RFID chips modulation depth | |
| CN107991549A (en) | Passive UHF RFID tags anti-interference capability testing device and method | |
| CN107907748A (en) | Passive UHF RFID tags specular scattering strength test method | |
| Zeng et al. | Assessing the feasibility of passive and BAP RFID communications on construction site scenarios | |
| CN107944310A (en) | A kind of passive UHF RFID tags State Transferring test method | |
| Fabiyi et al. | Mobile platform for livestock monitoring and inspection | |
| CN107911148A (en) | Active UHF RFID tags equivalent radiation power test device and method | |
| CN107843832A (en) | The method of testing of passive UHF RFID label tags write time | |
| CN107832643A (en) | A kind of method of testing of passive UHF RFID chips antistatic effect | |
| CN205320071U (en) | Communication optical fiber device management system based on wireless radio frequency identification technology | |
| CN203012737U (en) | Power asset inspection system | |
| CN107958170A (en) | Passive UHF RFID tags reader protocol capabilities test device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180508 |