CN107843832A - The method of testing of passive UHF RFID label tags write time - Google Patents
The method of testing of passive UHF RFID label tags write time Download PDFInfo
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- CN107843832A CN107843832A CN201711099838.0A CN201711099838A CN107843832A CN 107843832 A CN107843832 A CN 107843832A CN 201711099838 A CN201711099838 A CN 201711099838A CN 107843832 A CN107843832 A CN 107843832A
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- China
- Prior art keywords
- tested
- rfid label
- write line
- read write
- tag read
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
Abstract
The invention discloses a kind of method of testing of passive UHF RFID label tags write time, including RFID label tag read write line is sent instruction to a label to be tested, label to be tested is in open state；Make rf signal analysis device collection RFID label tag read write line and the radiofrequency signal during label communication to be tested；RFID label tag read write line is sent first time writing commands to first piece of memory block of label to be tested, and record the deadline of first time writing commands；RFID label tag read write line is sent first time reading order to first piece of memory block of label to be tested, have verified that whether first time writing commands succeed；RFID label tag read write line is sent second of writing commands to last block memory block of label to be tested, and record the deadline of second of writing commands；RFID label tag read write line is sent second of reading order to last block memory block of label to be tested, have verified that whether second of writing commands succeeds.Present invention obtains following beneficial effect：The write time of passive UHF RFID label tags can be tested.
Description
Technical field
The present invention relates to radio frequency tag technology field, more particularly to a kind of passive UHF RFID label tags specular scattering intensity to survey
Method for testing.
Background technology
REID is a kind of wireless, cordless the automatic identification skill risen nineteen nineties
Art, it is the frontier science and technology project to grow up in recent years.The technology mainly realizes nothing using radiofrequency signal by Space Coupling
Contact information transmission and pass through transmitted information and reach identifying purpose.The remarkable advantage of REID is non-contact
Property, therefore can realize identification automation without manual intervention during completion identification work and be hardly damaged；Recognizable high-speed motion
RF tag, can also identify multiple RF tags simultaneously, it is swift and convenient to operate；RF tag is not afraid of oil stain, dust pollution etc.
Adverse circumstances, and non-metallic object can be penetrated and be identified, strong antijamming capability.
In existing radio frequency tag technology, passive UHF RFID (superfrequency RF tag) are widely used in Internet of Things
In, however, due to lacking test equipment and method of testing to passive UHF RFID at present so that various working index disunities
Passive UHF RFID be mixed use, cause Internet of Things or corresponding use environment job insecurity.
The content of the invention
For the above-mentioned problems in the prior art, a kind of test of passive UHF RFID label tags write time is now provided
Method.
To achieve the above object, present invention employs following technical scheme：
A kind of method of testing of passive UHF RFID label tags write time, wherein, there is provided a RFID label tag read write line and one
Rf signal analysis device, comprises the following steps：
Step 1, a plurality of test cases are defined according to test event, and chooses a test case；
Step 2, the RFID label tag read write line parameter is set according to the test case of selection；
Step 3, the rf signal analysis device parameter is set according to the test case of selection, believes the radio frequency
Number analytical equipment works in corresponding signal analysis pattern；
Step 4, the RFID label tag read write line is made to be sent out in a wireless form to a label to be tested being placed in anechoic chamber,
Instruction is sent, the label to be tested is in open state；
Step 5, make the rf signal analysis device gather the RFID label tag read write line with the label to be tested to lead to
Radiofrequency signal during letter；
Step 6, the RFID label tag read write line transmission first time writing commands are made to first piece of the label to be tested
Memory block, and record the deadline of the first time writing commands；
Step 7, the RFID label tag read write line transmission first time reading order is made to first piece of the label to be tested
Memory block, has verified that whether the first time writing commands succeed；
Step 8, make the RFID label tag read write line send second of writing commands to the label to be tested last
Block memory block, and record the deadline of second of writing commands；
Step 9, make the RFID label tag read write line send second of reading order to the label to be tested last
Block memory block, has verified that whether second of writing commands succeed；
Step 10, next test case is chosen, and repeating said steps 2 are to the step 9, until all tests are used
Example is completed.
Another aspect of the present invention, in addition to antenna and circulator, the input interface of the rf signal analysis device connect
The first port of the circulator is connect, the radio frequency interface of the RFID label tag read write line connects the second port of the circulator,
3rd port of the circulator connects the antenna, and the antenna is arranged in the anechoic chamber, the label to be tested
It is placed in the anechoic chamber, and there is preset distance with the antenna.
Another aspect of the present invention, the rf signal analysis device are VSA.
Another aspect of the present invention, the working frequency of the RFID label tag read write line for 840MHz~845MHz and/or
920MHz~925MHz.
Another aspect of the present invention, 2.5 meters of the anechoic chamber, internal diameter.
Another aspect of the present invention, the preset distance are 1 meter.
Another aspect of the present invention, in the step 2, the RFID label tag read write line transmission power is arranged to described to be measured
A little sensitivity+2dBm of test-object label.
Another aspect of the present invention, in the step 4, the instruction is meets the startup querying command and coding of T2 requirements
Obtain the combination of order.
Another aspect of the present invention, in the step 6, the method that records the deadline of the first time writing commands
To measure the first time writing commands and terminating the time interval to the label response starting to be tested, and preserve；And institute
State in step 8, the method for recording the deadline of second of writing commands is to measure second of writing commands to terminate
To the time interval of the label response starting to be tested, and preserve.
Another aspect of the present invention, the antenna gain are 8.5dBi.
Present invention obtains following beneficial effect：
The write time of passive UHF RFID label tags can be tested.
Brief description of the drawings
Fig. 1 is the FB(flow block) of the passive UHF RFID label tags write time method of testing of the present invention；
Fig. 2 is the structural representation of the passive UHF RFID label tags write time test device of the present invention.
Embodiment
The invention will be further described with specific embodiment below in conjunction with the accompanying drawings, but not as limiting to the invention.
The present invention provides a kind of method of testing of passive UHF RFID label tags write time, as shown in Figure 1 and Figure 2, wherein,
One RFID label tag read write line 2 and a rf signal analysis device 1 are provided, comprised the following steps：
Step 1, a plurality of test cases are defined according to test event, and chooses a test case；
Step 2, the parameter of the RFID label tag read write line 2 is set according to the test case of selection；
Step 3, the parameter of the rf signal analysis device 1 is set according to the test case of selection, makes described penetrate
Frequency signal analysis device 1 works in corresponding signal analysis pattern；
Step 4, the RFID label tag read write line 2 is made to be placed in anechoic chamber, 6 label to be tested 5 to one in a wireless form
Instruction is sent, the label to be tested 5 is in open state；
Step 5, the rf signal analysis device 1 is made to gather the RFID label tag read write line 2 and the label 5 to be tested
Radiofrequency signal in communication process；
Step 6, the RFID label tag read write line 2 is made to send first time writing commands to the first of the label 5 to be tested
Block memory block, and record the deadline of the first time writing commands；
Step 7, the RFID label tag read write line 2 is made to send first time reading order to the first of the label 5 to be tested
Block memory block, has verified that whether the first time writing commands succeed；
Step 8, the RFID label tag read write line 2 is made to send second of writing commands last to the label 5 to be tested
One piece of memory block, and record the deadline of second of writing commands；
Step 9, make the RFID label tag read write line send second of reading order to the label 5 to be tested last
Block memory block, has verified that whether second of writing commands succeed；
Step 10, next test case is chosen, and repeating said steps 2 are to the step 9, until all tests are used
Example is completed.
Another aspect of the present invention, in addition to antenna 4 and circulator 3, the input interface of the rf signal analysis device 1
The first port of the circulator 3 is connected, the radio frequency interface of the RFID label tag read write line 2 connects the second of the circulator 3
Port, the 3rd port of the circulator 3 connect the antenna 4, and the antenna 4 is arranged in the anechoic chamber, 6, described to treat
Test label 5 is placed in the anechoic chamber, 6, and has preset distance with the antenna 4.
Another aspect of the present invention, the rf signal analysis device 1 are VSA.
Another aspect of the present invention, the working frequency of the RFID label tag read write line for 840MHz~845MHz and/or
920MHz~925MHz.
Another aspect of the present invention, 2.5 meters of the internal diameter of the anechoic chamber, 6.
Another aspect of the present invention, the preset distance can be that RFID label tag read write line 2 communicates frequently with label 5 to be tested
Three times of rate wavelength, preferable preset distance may be configured as 1 meter.
Another aspect of the present invention, in the step 2, the transmission power of the RFID label tag read write line 2 is arranged to described
A little sensitivity+2dBm of label 5 to be tested.
Another aspect of the present invention, in the step 4, the instruction is meets the startup querying command and coding of T2 requirements
Obtain the combination of order.
Above-mentioned T2 illustrated in table 1.
Table 1
Another aspect of the present invention, in the step 6, the method that records the deadline of the first time writing commands
To measure the first time writing commands and terminating the time interval to the response of label 5 starting to be tested, and preserve；And
In the step 8, the method for recording the deadline of second of writing commands is to measure second of writing commands knot
The time interval that beam originates to the response of label 5 to be tested, and preserve.
Another aspect of the present invention, the gain of the antenna 4 is 8.5dBi.
Another aspect of the present invention, the polarization mode of antenna 4 are circular polarisation.
Illustrate the feasibility of the present invention with specific embodiment below.
Test case is 920.125MHz, 924.875MHz two frequency bins.The parameter of RFID label tag read write line is arranged to, and is opened
The dynamic querying command forward link reference time is：6.25 μ s, reverse link frequencies are：320Khz, coded system are：FM0, with before
Leading code.
In this embodiment, judge that label write time to be tested whether satisfactory method is, appointing in test case
The write time of one frequency label to be tested then tests less than 100ms to be passed through, otherwise test crash.
Preferred embodiments of the present invention are the foregoing is only, not thereby limit embodiments of the present invention and protection model
Enclose, to those skilled in the art, should can appreciate that all with made by description of the invention and diagramatic content
Scheme obtained by equivalent substitution and obvious change, should be included in protection scope of the present invention.
Claims (10)
1. a kind of method of testing of passive UHF RFID label tags write time, it is characterised in that a RFID label tag read write line is provided
And a rf signal analysis device, comprise the following steps：
Step 1, a plurality of test cases are defined according to test event, and chooses a test case；
Step 2, the RFID label tag read write line parameter is set according to the test case of selection；
Step 3, the rf signal analysis device parameter is set according to the test case of selection, makes the radiofrequency signal point
Analysis apparatus works in corresponding signal analysis pattern；
Step 4, make the RFID label tag read write line send to a label to be tested being placed in anechoic chamber, in a wireless form to refer to
Order, makes the label to be tested be in open state；
Step 5, the rf signal analysis device is made to gather the RFID label tag read write line and the label communication mistake to be tested
Radiofrequency signal in journey；
Step 6, the RFID label tag read write line is made to send first piece storage of the first time writing commands to the label to be tested
Area, and record the deadline of the first time writing commands；
Step 7, the RFID label tag read write line is made to send first piece storage of the first time reading order to the label to be tested
Area, has verified that whether the first time writing commands succeed；
Step 8, make the RFID label tag read write line send second of writing commands to last block of the label to be tested to deposit
Storage area, and record the deadline of second of writing commands；
Step 9, make the RFID label tag read write line send last block of second of reading order to the label to be tested to deposit
Storage area, has verified that whether second of writing commands succeed；
Step 10, next test case is chosen, and repeating said steps 2 are to the step 9, until all test cases are surveyed
Examination finishes.
2. method of testing as claimed in claim 1, it is characterised in that also including antenna and circulator, the radiofrequency signal point
The input interface of analysis apparatus connects the first port of the circulator, described in the radio frequency interface connection of the RFID label tag read write line
The second port of circulator, the 3rd port of the circulator connect the antenna, and the antenna is arranged at the anechoic chamber,
Interior, the label to be tested is placed in the anechoic chamber, and has preset distance with the antenna.
3. method of testing as claimed in claim 1, it is characterised in that the rf signal analysis device is Vector Signal Analysis
Instrument.
4. method of testing as claimed in claim 1, it is characterised in that the working frequency of the RFID label tag read write line is
840MHz~845MHz and/or 920MHz~925MHz.
5. method of testing as claimed in claim 1, it is characterised in that 2.5 meters of the anechoic chamber, internal diameter.
6. method of testing as claimed in claim 2, it is characterised in that the preset distance is 1 meter.
7. method of testing as claimed in claim 1, it is characterised in that in the step 2, the RFID label tag read write line transmitting
Power setting is a little sensitivity+2dBm of the label to be tested.
8. method of testing as claimed in claim 1, it is characterised in that in the step 4, what the instruction required to meet T2
Start querying command and coding obtains the combination of order.
9. method of testing as claimed in claim 1, it is characterised in that in the step 6, record the first time writing commands
The method of deadline be to measure the first time writing commands to terminate between the time of the label to be tested response starting
Every, and preserve；And in the step 8, the method for recording the deadline of second of writing commands is, measurement described the
Secondary writing commands terminate the time interval to the label response starting to be tested, and preserve.
10. method of testing as claimed in claim 2, it is characterised in that the antenna gain is 8.5dBi.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711099838.0A CN107843832A (en) | 2017-11-09 | 2017-11-09 | The method of testing of passive UHF RFID label tags write time |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711099838.0A CN107843832A (en) | 2017-11-09 | 2017-11-09 | The method of testing of passive UHF RFID label tags write time |
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| CN107843832A true CN107843832A (en) | 2018-03-27 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101750553A (en) * | 2008-12-10 | 2010-06-23 | 中国科学院自动化研究所 | Benchmark testing system and method for RFID label operating level |
| CN101782608A (en) * | 2009-11-11 | 2010-07-21 | 中国科学院自动化研究所 | Radio frequency identification device (RFID) label response frequency standard test system and method |
| CN101931472A (en) * | 2009-06-10 | 2010-12-29 | 中国科学院自动化研究所 | Benchmark test system and method for adjacent channel interference resisting capacity of RFID reader-writer |
| CN203069749U (en) * | 2012-12-27 | 2013-07-17 | 广州中大微电子有限公司 | Radio frequency identification devices (RFID) reader chip process testing system |
-
2017
- 2017-11-09 CN CN201711099838.0A patent/CN107843832A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101750553A (en) * | 2008-12-10 | 2010-06-23 | 中国科学院自动化研究所 | Benchmark testing system and method for RFID label operating level |
| CN101931472A (en) * | 2009-06-10 | 2010-12-29 | 中国科学院自动化研究所 | Benchmark test system and method for adjacent channel interference resisting capacity of RFID reader-writer |
| CN101782608A (en) * | 2009-11-11 | 2010-07-21 | 中国科学院自动化研究所 | Radio frequency identification device (RFID) label response frequency standard test system and method |
| CN203069749U (en) * | 2012-12-27 | 2013-07-17 | 广州中大微电子有限公司 | Radio frequency identification devices (RFID) reader chip process testing system |
Non-Patent Citations (1)
| Title |
|---|
| 张乒乒: "基于自主标准的RFID设备测试研究", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
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