CN101750553A - Benchmark testing system and method for RFID label operating level - Google Patents
Benchmark testing system and method for RFID label operating level Download PDFInfo
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Abstract
The invention relates to a benchmark testing system and a method for RFID label operating level. The benchmark testing system comprises a support for labels to be tested, a transceiver and reference antenna support, wherein a transceiver and reference antenna is placed in a standard testing environment. A circulator, a spectrum analyzer, an RFID signal generator and a power meter are placed outside the standard testing environment. The method is that an RFID label chip and the antenna are viewed as a whole body, the input level and the output level of an RFID label system are measured through the transceiver and reference antenna by adopting the transmission formula of electromagnetic waves in a free space, the minimum level capable of activating the operation of an RFID label is calculated and the theoretical reading distance of the RFID label is estimated. Through the scientific, repetitive and comparable non-contact measurement of the RFID label power consumption which is one of important indicators determining the performance of the RFID label, the problems that the existing technical indicators are ambiguous and the error of the testing results is great, and assistant decision basis is provided for users to select RFID label products according to the different application requirements.
Description
Technical field
The present invention relates to the field tests technical field of REID, relate in particular to a kind of Benchmark test system and method for RFID label operation level.
Background technology
The RFID full name is radio-frequency (RF) identification (Radio Frequency Identification), is a kind of non-contact automatic identification technology that utilizes radio-frequency technique to realize.The RFID label has that volume is little, read or write speed is fast, shape is various, long service life, reusable, memory capacity big, can penetrate characteristics such as non-conductive material, can realize multiple goal identification and moving target identification in conjunction with rfid interrogator, further tracking by can also realizing article in the global range with combining of Internet technology and information is shared.The RFID technology is applied to industries such as logistics, manufacturing, public information service, can significantly improve management and operational paradigm, reduces cost.
The RFID technology has become the focus of IT field at present, and numerous mechanisms and enterprise are all wideling popularize this technology.Along with the develop rapidly of RFID technology, the manufacturer of Related product increases gradually, and the kind of RFID label has also risen to hundreds of, and is constantly releasing new product.In order in various RFID label, to select can satisfy the product of user's demand, just need carry out special test to the performance index of RFID product, RFID label power consumption promptly is one of important performance indexes of RFID label product.RFID label power consumption is meant regards RFID label chip and label antenna as a system, measures the minimum emissive power level that activates the work of RFID label, and reads the measurement index of distance as RFID label theory with this measured value.The minimum emissive power level that activates the work of RFID label is more little, just represents that the power consumption of RFID label inside is low more, and when one timing of read write line emissive power, the theory of this RFID label reads distance will be farther.
As everyone knows, the RFID label is made of label chip and two major parts of label antenna, by integral body of the bonding formation of conducting resinl technology.In order to improve the distance that reads of the overall performance performance of RFID label, particularly RFID label, just must effectively reduce the power consumption of label chip and the impedance matching of raising label antenna.Wherein, the RFID label antenna can keep reasonable impedance matching on the basis of specialization design and extensiveization processing.Therefore, under same environmental conditions, reading of RFID label is relevant with the power consumption of RFID label chip apart from main, and power consumption is more little, and it is far away more that theory reads distance.Direct measurement to RFID label chip power consumption is a relatively process of difficulty.Usually in chip production merchant performance history, can reserve test contact specially on wafer (wafer), the voltage and current value of use probe measurement input and output just can calculate the power consumption of chip.But after wafer cuts into millimetre-sized RFID label chip, just be difficult to use again the pin of probe contact chip; After further RFID label chip and label antenna being packaged together, just there is not external contact therefore can only adopt replacement scheme to measure indirectly for directly measuring.
For a RFID label generally speaking, the energy of outside input RFID label should equate with energy and the external energy sum of exporting of RFID label backscattering that the RFID label consumes.On identical external environment parameters and identical resonance frequency, the energy of RFID label consumption can be thought to equate, therefore if can measure the energy of outside input RFID label and the energy that the backscattering of RFID label is externally exported, then can indirect calculation go out the energy that the RFID label consumes, be RFID label operation level, above test process generally can be described as the benchmark test of RFID label operation level.
The purpose of benchmark test is by method of testing reasonable in design, testing process and testing tool a certain performance index of one class testing object to be tested, and guarantees that result that test obtains is comparable, repeatably.Use reference test method that the operation level of RFID label is tested, not only can obtain the operation level relative value of a RFID label product, can also be by comparing with the operation level of other RFID label product, thereby provide the rank that different money RFID label theories read distance, pick out the product that meets user's demand most.
In the at present existing technical scheme of electronic product being carried out power consumption test, comprise test macro to mobile terminal power consumption, to the method and apparatus of battery charge effect and electronic product power consumption test, to the device of USB device power consumption test etc., but above technical scheme all needs to carry out physical connection with equipment under test, is difficult to realize the power consumption test to the RFID label.Minimum unblocked level for measure R FID label under non-contacting condition, EPCglobal Inc. has proposed a kind of alternative method of testing in the Static Test Method for Applied Tag PerformanceTesting (Rev 1.9.5) of issue on July 21st, 2008, use the test parameter of read rate as the minimum unblocked level that judges whether to reach the RFID label, promptly constantly reduce the emissive power of read write line, and calculate the ratio that reads number of success and total reading times.When this ratio less than 0.5 the time, use dipole antenna to replace RFID label to be tested, and will this moment the reading of dipole antenna as the minimum operation level of RFID label.Make to test in this way and have two shortcomings: one to be to use read rate be not very strong as the science of evaluation index, because even read rate is lower than 0.5, the RFID label backscattering energy of still having an opportunity can not illustrate that be exactly the minimum operation level of RFID label this moment; The 2nd, the test process relative complex when using dipole antenna to replace RFID label to be tested, can show as the repeatable relatively poor of test result because equipment precision, manual operation etc. produce bigger error in practical operation.
Therefore, be badly in need of a kind of reference test method and test macro of new RFID label operation level at present, can be more scientifically and repeatably the power consumption of RFID label and theory be read distance and assess.
Summary of the invention
In order to solve prior art problems, the present invention is that purpose is that requirement can be more scientifically and repeatably read distance to the power consumption of RFID label and theory and assessed, and a kind of Benchmark test system and method for testing of new RFID label operation level is provided for this reason.
The Benchmark test system and the method for a kind of RFID label operation level of the present invention, its objective is that one of important indicator to decision RFID tag performance---RFID label power consumption is carried out scientifically and repeatably, comparable non-cpntact measurement, solve the problem that technical indicator is indeterminate, the test result error is big in the current techniques scheme, thereby select the RFID label product that the aid decision making foundation is provided according to the different application demand for the user.
The Benchmark test system and the method for a kind of RFID label operation level of the present invention, its principle is to regard RFID label chip and antenna as a total system, utilize the propagation formula of electromagnetic wave at free space, incoming level and output level by reference antenna and dual-mode antenna difference measure R FID tag system, thereby extrapolate the minimum levels that can activate the work of RFID label, and utilize this index that the theory of RFID label is read apart from assessing.
In order to reach described purpose, the Benchmark test system of a kind of RFID label operation level of the present invention, comprise the standard testing environment, label support to be measured, the dual-mode antenna support, the reference antenna support, dual-mode antenna, circulator, spectrum analyzer, the RFID signal generator, reference antenna and power meter, label support wherein to be measured, the dual-mode antenna support, the reference antenna support, dual-mode antenna, reference antenna places in the standard testing environment, circulator, spectrum analyzer, the RFID signal generator, power meter places outside the standard testing environment, dual-mode antenna and circulator, reference antenna links to each other by radio frequency feed line respectively with power meter, the radiofrequency signal that circulator unidirectional delivery RFID signal generator is sent is to dual-mode antenna, and the radiofrequency signal unidirectional delivery that dual-mode antenna is passed back is to spectrum analyzer, dual-mode antenna is vertically fixed on dual-mode antenna support top, the reference antenna vertical fixing is in reference antenna support top, dual-mode antenna, the extended line of the radiating surface geometric center position of reference antenna meets at the summit of label support to be measured, and dual-mode antenna equates with the horizontal range of dual-mode antenna to the summit of label support to be measured to reference antenna.
Described label support to be measured, dual-mode antenna support and reference antenna support all adopt the low and specific inductive capacity of conductivity to make less than 1.5 material.
Described dual-mode antenna is E plane and all symmetrical linear polarization wideband omnidirectional antenna of H plane pattern in the calibration tape wide region.
Described reference antenna is the standard-gain horn antenna of gain more than 10dBi, and in the calibration tape wide region, the gain of reference antenna remains unchanged substantially.
Described spectrum analyzer is to write down the also instrument of display radio signal transient waveform.
Described RFID signal generator, being meant can be with the instrument of predeterminated frequency and default power emission rfid interrogator signal.
Described power meter is the instrument that can measure the peak power of certain default frequency in a period of time.
Described circulator, spectrum analyzer, RFID signal generator, power meter place outside the standard testing environment, and the electromagnetic radiation that the radio frequency interface of these instruments and power interface send can not cause change to the electromagnetic environment in the standard testing environment.
In order to reach described purpose, the reference test method of a kind of RFID label operation level of the present invention may further comprise the steps:
Step (1): in one group of same money RFID label to be tested, randomly draw N (N 〉=10) as test sample book, be called label { T to be measured
0, T
1..., T
N, at first with label T to be measured
0Be positioned over the top of label support to be measured;
Step (2): the frequency of setting spectrum analyzer, RFID signal generator and power meter is the working frequency range of RFID label, start spectrum analyzer to accepting state, power meter is to maximum hold mode, and RFID signal simulator emissive power is preset as peak power output;
Step (3): the RFID signal simulator does not comprise the rfid interrogator inquiry instruction (QUERY) of anti-collision algorithm according to current transmission frequency and one of power emission;
Step (4): this instruction is one-way transmitted to dual-mode antenna through circulator, and propagates in the standard testing environment, triggers the spectrum analyzer opening entry simultaneously;
Step (5): the electromagnetic signal waveform that spectrum analyzer dual-mode antenna of 1 second after the unidirectional reception rfid interrogator of circulator inquiry transmitting instructions receives, and be presented on the screen of spectrum analyzer;
Step (6): the electromagnetic signal waveform that dual-mode antenna is received carries out demodulation, then the emissive power of RFID signal simulator is reduced a unit of adjustment as the response signal that successfully demodulates the RFID label, reenters step (3), otherwise enters step (7);
Step (7): the electromagnetic signal strength that receives by power meter read-record reference antenna;
Step (8): label to be measured is replaced with next test sample book, repeat step (2), finish until all label tests to be measured to step (7);
Step (9): calculate the arithmetic mean of the power meter reading of N label to be measured, and convert, obtain the minimum operation level of RFID label according to the gain and the insertion loss of reference antenna and radio frequency feed line.
Described label to be measured is positioned over the top of label support to be measured, the geometric center that is meant label to be measured and the geometric center line of dual-mode antenna and reference antenna are on a straight line parallel with standard testing environment ground, and the geometric center of this line and label to be measured intersects vertically.
One of described RFID signal simulator emission does not comprise the rfid interrogator inquiry instruction of anti-collision algorithm, be meant that the interior RFID label of read range is after receiving this rfid interrogator inquiry instruction, can in the shortest time, send response signal, and send again after need not to wait for a period of time.
The described electromagnetic signal waveform that dual-mode antenna is received carries out demodulation, is meant with the waveform peak power subtraction signal continuous wave average power on power-time diagram greater than-70dBm, and can resolves according to the air interface communications protocol.
The invention has the beneficial effects as follows:
1) by the incoming level and the output level of reference antenna and dual-mode antenna difference measure R FID tag system, provides a kind of system scientifically and repeatably, can the power consumption and the theory of RFID label be read apart from effectively assessing;
2) test process carries out in the standard testing environment, and electromagnetic environment is stable, and major equipment all is maintained fixed, and it is few to be subjected to the artificial interference factor in the measurement, test result repeatable more intense;
3) use the linear polarization wideband omnidirectional antenna lower, that directional diagram is symmetrical that gains as dual-mode antenna, label to be measured and reference antenna are placed the two ends of dual-mode antenna, avoid reference antenna to treat mark and sign antenna generation coupling and interference, adopt the standard-gain horn antenna of gain more than 10dBi as the reference antenna simultaneously, the signal resolution height can remedy the influence far away of reference antenna distance label to be measured.
Description of drawings
Fig. 1 is the Benchmark test system synoptic diagram of RFID label operation level provided by the invention, and wherein 1 is that standard testing environment, 2 is that label support to be measured, 3 is that dual-mode antenna support, 4 is that reference antenna support, 5 is that dual-mode antenna, 6 is that circulator, 7 is that spectrum analyzer, 8 is that RFID signal generator, 9 is that reference antenna, 10 is a power meter.
Fig. 2 is the reference test method process flow diagram of RFID label operation level provided by the invention.
Fig. 3 is spectrum analyzer electromagnetic signal power provided by the invention-time waveform demodulation synoptic diagram.
Embodiment
For making the purpose, technical solutions and advantages of the present invention clearer, below in conjunction with specific embodiment, and with reference to accompanying drawing, the present invention is described in more detail.
The present invention regards RFID label chip and antenna as a total system, utilize the propagation formula of electromagnetic wave at free space, incoming level and output level by reference antenna and dual-mode antenna difference measure R FID tag system, thereby extrapolate the minimum levels that can activate the work of RFID label, and utilize this index that the theory of RFID label is read apart from assessing.By to one of important indicator of decision RFID tag performance---RFID label power consumption is carried out scientifically and repeatably, comparable non-cpntact measurement, can solve the problem that technical indicator is indeterminate in the current techniques scheme, the test result error is big, thereby select the RFID label product that the aid decision making foundation is provided according to the different application demand for the user.
For a RFID label generally speaking, the energy of outside input RFID label should equate with energy and the external energy sum of exporting of RFID label backscattering that the RFID label consumes.On identical external environment parameters and identical resonance frequency, the energy of RFID label consumption can be thought to equate, therefore reduce the energy of outside input RFID label gradually, when the energy of the external output of RFID label backscattering just reduces to zero, then the energy of outside input this moment RFID label just equals the energy that the RFID label consumes, i.e. RFID label operation level.
As shown in Figure 1, the Benchmark test system of a kind of RFID label operation level of the present invention, comprise standard testing environment 1, label support 2 to be measured, dual-mode antenna support 3, reference antenna support 4, dual-mode antenna 5, circulator 6, spectrum analyzer 7, RFID signal generator 8, reference antenna 9 and power meter 10, label support 2 wherein to be measured, dual-mode antenna support 3, reference antenna support 4, dual-mode antenna 5, reference antenna 9 places in the standard testing environment 1, circulator 6, spectrum analyzer 7, RFID signal generator 8, power meter 10 places outside the standard testing environment 1, dual-mode antenna 5 and circulator 6, reference antenna 9 links to each other by radio frequency feed line respectively with power meter 10, the radiofrequency signal that circulator 6 unidirectional delivery RFID signal generators 8 are sent is to dual-mode antenna 5, and the radiofrequency signal unidirectional delivery that dual-mode antenna 5 is passed back is to spectrum analyzer 7, dual-mode antenna 5 is vertically fixed on dual-mode antenna support 3 tops, reference antenna 9 vertical fixing are in reference antenna support 4 tops, dual-mode antenna 5, the extended line of the radiating surface geometric center position of reference antenna 9 meets at the summit of label support 2 to be measured.
In one embodiment of the invention, standard testing environment 1 is based upon long 6 meters, and is wide 3 meters, in high 3 meters fully anechoic chambers; Label support 2 to be measured, dual-mode antenna support 3 and reference antenna support 4 all adopt the low and specific inductive capacity of conductivity to make less than 1.5 polystyrene material; The geometric center line of the geometric center of label to be measured and dual-mode antenna 5 and reference antenna 9 on a straight line parallel with standard testing environment 1 ground, 1.5 meters apart from ground; Dual-mode antenna 5 selects 155 millimeters of diameters, 140 millimeters of height, frequency of operation to bore biconical antenna, its E plane and the equal left-right symmetric of H plane pattern at the vertical polarization dish of 800～2000MHz; Reference antenna 9 select gain for 11dBi, be of a size of the linear polarization standard-gain horn antenna of 380x500x470 millimeter, in 800～1000MHz bandwidth range, the change in gain of this reference antenna is in 0.5dB, in 840～845MHz, 920～925MHz bandwidth range (Chinese ultrahigh frequency RFID equipment uses frequency range), the change in gain of this reference antenna is in 0.1dB; Dual-mode antenna 5 equates with the horizontal range of dual-mode antenna 5 to the summit of label support 2 to be measured to reference antenna 9, is 1 meter; The real-time spectrum analyzer RSA3308A that spectrum analyzer 7 is selected for use, RFID signal generator 8 select vector signal generator ESG E4438C, and power meter 10 is selected the hand-held spectrum analyzer N9340A of Agilent company.
In order to make test result have repeatability, just need to guarantee that the environmental parameter in the test process keeps stable, promptly need a standard testing environment 1.The place of so-called standard testing environment 1 can be fully anechoic chamber, semi-anechoic chamber, also can be open space.In an embodiment of the present invention, select fully anechoic chamber to test, circulator 6, spectrum analyzer 7, RFID signal generator 8, power meter 10 all place outside the fully anechoic chamber, and the electromagnetic radiation that the radio frequency interface of these instruments and power interface send can not cause change to the electromagnetic environment in the standard testing environment.And in one group of complete test, the temperature of place environment all remains on 23 ± 3 ℃, and humidity is 30～50%, and illuminance is in the low-light level condition, and basic environmental parameter also can keep stable.
As shown in Figure 2, Fig. 2 is the reference test method process flow diagram of RFID label operation level provided by the invention.As one embodiment of the present of invention, may further comprise the steps:
Step 201: in one group of same money RFID label to be tested, randomly draw N (N 〉=10) as test sample book, get N=10 in the present embodiment, be called label { T to be measured
0, T
1..., T
10, at first with label T to be measured
0Be positioned over the top of label support 2 to be measured;
Step 202: the frequency of setting spectrum analyzer 7, RFID signal generator 8 and power meter 10 is the working frequency range of RFID label, mid point 842.5MHz as 840～845MHz, or the mid point 922.5MHz of 920～925MHz, start spectrum analyzer 7 to the power trigger accepting state, power meter 10 is to the maximum hold mode of frequency spectrum, and the emissive power of RFID signal simulator 8 is preset as peak power output+20dBm;
Step 203:RFID signal simulator 8 does not comprise the rfid interrogator inquiry instruction (QUERY) of anti-collision algorithm according to current transmission frequency and one of power emission, for example at the test that meets ISO/IEC 18000-6C standard RFID label, parameter Q in the rfid interrogator inquiry instruction is made as 0, and the time slot counter that the RFID label promptly is set is 2
0-1=0, the RFID label in the reach will send the RN16 response signal in first response time slot after receiving this inquiry instruction, and send after need not to wait for a period of time again;
Step 204:RFID read write line inquiry instruction is one-way transmitted to dual-mode antenna 5 through circulator 6, and propagates in standard testing environment 1, and this command signal triggers the triggering template of spectrum analyzer 7 simultaneously;
Step 205: after the triggering template of spectrum analyzer 7 started, spectrum analyzer 7 was the electromagnetic signal waveform that 1 second dual-mode antenna 5 receives through circulator 6 unidirectional reception length, and the power-time diagram of this waveform is presented on the screen of spectrum analyzer 7;
Step 206: electromagnetic signal power-time waveform that dual-mode antenna 5 receives is carried out demodulation, promptly use the waveform peak power subtraction signal continuous wave average power on power-time diagram, if this difference is greater than-70dBm, and obtain the RN16 signal of RFID label response after resolving according to the air interface communications protocol of for example ISO/IEC 18000-6C defined by the mode that artificial or science software for calculation is handled automatically, think that then demodulation is successful, this moment, the emissive power with RFID signal simulator 8 reduced a unit of adjustment, the minimum unit of adjustment of the vector signal generator ESG E4438C of Agilent company can reach 0.02dBm, requirement according to measuring accuracy, unit of adjustment in the present embodiment is made as 0.1dBm, reenter step 203 after the adjustment, otherwise enter step 207;
Step 207: the electromagnetic signal strength P that receives by power meter 10 read-record reference antennas 9
RX-i(wherein i is the test sample book numbering, i=1, and 2 ..., 10) because power meter is in the maximum hold mode of frequency spectrum always, therefore the full-scale reading of this moment is the maximal value of the electromagnetic signal strength that reference antenna 9 receives;
Step 208: label to be measured is replaced with next test sample book, repeat step 202～step 207, until all label { T to be measured
0, T
1..., T
10All the test finish;
Step 209: the arithmetic mean that calculates power meter 10 readings of 10 labels to be measured
(wherein i is the test sample book numbering, i=1, and 2 ..., 10), and according to the gain of reference antenna 9 and radio frequency feed line and insert loss and convert, obtain the minimum operation level of RFID label.In the present embodiment, the gain of reference antenna 9 is 11dBi, and it is 1.2dB that the radio frequency feed line between reference antenna 9 and the power meter 10 inserts loss, the P that calculates
RX-average=1.6dBm then minimum the operation level of this RFID label is P
ON=1.6-11+1.2=-8.2dBm.Further, also can be according to the propagation formula of electromagnetic wave at free space
The theory of deriving this RFID label reads distance, promptly
Wherein D is that the theory of RFID label reads distance, and EIRP is the effective isotropic radiated power of rfid interrogator.The minimum operation level of RFID label is more little, then represents the power consumption of this RFID label more little, and it is just far away more that its theory reads distance.For instance, the minimum operation level benchmark results of supposing a RFID label A is P
ON-A=-8.2dBm, the minimum operation level benchmark results of another RFID label B is P
ON-B=-10.6dBm, according to the propagation formula of electromagnetic wave at free space, under the frequency of operation of 2W EIRP, 922.5MHz, the theory of RFID label A reads distance and is D
A=2.97m, the theory of RFID label B reads distance and is D
B=3.92m, then the conclusion of benchmark test can be described as: the minimum operation level of RFID label B is lower than the minimum operation level of RFID label A, and the power consumption of RFID label B is lower, has farther theory and reads distance.
As shown in Figure 3, Fig. 3 is spectrum analyzer electromagnetic signal power provided by the invention-time waveform demodulation synoptic diagram, comprising: the waveform 301 that the RFID signal simulator starts, the waveform 302 of RFID signal simulator emission rfid interrogator inquiry instruction, the signal continuous wave waveform 303 of RFID signal simulator emission, the RN16 signal maximum power point 304 of RFID label response, the difference 305 of the signal continuous wave power value of the RN16 signal maximum power value of RFID label response and the emission of RFID signal simulator.In the reference test method step 203～step 206 of a kind of RFID label operation level of the present invention, the electromagnetic signal waveform that receives when spectrum analyzer 7, and after being presented at the power-time diagram of this waveform on the screen, can see on this figure that at first RFID signal generator 8 starts and launches a rfid interrogator inquiry that does not comprise anti-collision algorithm and instruct, if RFID label to be measured has afterwards produced the response of RN16, and the size of difference 305 surpasses-70dBm, then 304 positions demodulate response signal by manually-operated or science software for calculation in the drawings, can think that demodulation is successful this moment, the emissive power of RFID signal generator 8 is reduced a 0.1dBm, reenter step 203 after the adjustment, otherwise enter step 207.
Describing above is to be used to realize the present invention and embodiment, scope of the present invention should not described by this and limit, it should be appreciated by those skilled in the art,, all belong to claim of the present invention and come restricted portion in any modification or partial replacement that does not depart from the scope of the present invention.
Claims (12)
1. the Benchmark test system of a RFID label operation level, it is characterized in that: comprise standard testing environment (1), label support to be measured (2), dual-mode antenna support (3), reference antenna support (4), dual-mode antenna (5), circulator (6), spectrum analyzer (7), RFID signal generator (8), reference antenna (9) and power meter (10), wherein:
Label support to be measured (2), dual-mode antenna support (3), reference antenna support (4), dual-mode antenna (5), reference antenna (9) place in the standard testing environment (1);
Circulator (6), spectrum analyzer (7), RFID signal generator (8), power meter (10) place outside the standard testing environment;
Dual-mode antenna (5) links to each other by radio frequency feed line respectively with power meter (10) with circulator (6), reference antenna (9);
Circulator (6) links to each other with RFID signal generator (8), and the radiofrequency signal that circulator (6) unidirectional delivery RFID signal generator (8) is sent is to dual-mode antenna (5);
Circulator (6) links to each other with spectrum analyzer (7), and the radiofrequency signal unidirectional delivery that dual-mode antenna (5) is passed back arrives spectrum analyzer (7);
Dual-mode antenna (5) is vertically fixed on dual-mode antenna support (3) top, reference antenna (9) vertical fixing is in reference antenna support (3) top, the extended line of the radiating surface geometric center position of dual-mode antenna (5), reference antenna (9) meets at the summit of label support to be measured (2), and dual-mode antenna (5) equates with the horizontal range of dual-mode antenna (5) to the summit of label support to be measured (2) to reference antenna (9).
2. the Benchmark test system of RFID label operation level according to claim 1 is characterized in that: described label support to be measured (2), dual-mode antenna support (3) and reference antenna support (4) adopt the low and specific inductive capacity of conductivity less than 1.5 material.
3. the Benchmark test system of RFID label operation level according to claim 1 is characterized in that: described dual-mode antenna (5) is that E plane and H plane pattern are symmetrical linear polarization wideband omnidirectional antenna in the calibration tape wide region.
4. the Benchmark test system of RFID label operation level according to claim 1, it is characterized in that: described reference antenna (9), be the standard-gain horn antenna of gain more than 10dBi, in the calibration tape wide region, the gain of reference antenna remains unchanged substantially.
5. the Benchmark test system of RFID label operation level according to claim 1 is characterized in that: described spectrum analyzer (7) is to write down the also instrument of display radio signal transient waveform.
6. the Benchmark test system of RFID label operation level according to claim 1 is characterized in that: described RFID signal generator (8) is can be with the instrument of predeterminated frequency and default power emission rfid interrogator signal.
7. the Benchmark test system of RFID label operation level according to claim 1 is characterized in that: described power meter (10) is the instrument that can measure the peak power of certain default frequency in a period of time.
8. the Benchmark test system of RFID label operation level according to claim 1 is characterized in that: the radio frequency interface of described circulator (6), spectrum analyzer (7), RFID signal generator (8) and power meter (10) and the electromagnetic radiation that power interface sends do not cause change to the electromagnetic environment in the standard testing environment.
9. the reference test method of a RFID label operation level may further comprise the steps:
Step (1): randomly draw N in one group of same money RFID label to be tested, N 〉=10 are called label { T to be measured as test sample book
0, T
1..., T
N, at first with label T to be measured
0Be positioned over the top of label support to be measured;
Step (2): the frequency of setting spectrum analyzer, RFID signal generator and power meter is the working frequency range of RFID label, start spectrum analyzer to accepting state, power meter is to maximum hold mode, and RFID signal simulator emissive power is preset as peak power output;
Step (3): the RFID signal simulator does not comprise the rfid interrogator inquiry instruction (QUERY) of anti-collision algorithm according to current transmission frequency and one of power emission;
Step (4): this instruction is one-way transmitted to dual-mode antenna through circulator, and propagates in the standard testing environment, triggers the spectrum analyzer opening entry simultaneously;
Step (5): the electromagnetic signal waveform that spectrum analyzer dual-mode antenna of 1 second after the unidirectional reception rfid interrogator of circulator inquiry transmitting instructions receives, and be presented on the screen of spectrum analyzer;
Step (6): the electromagnetic signal waveform that dual-mode antenna is received carries out demodulation, then the emissive power of RFID signal simulator is reduced a unit of adjustment as the response signal that successfully demodulates the RFID label, reenters step (3), otherwise enters step (7);
Step (7): the electromagnetic signal strength that receives by power meter read-record reference antenna;
Step (8): label to be measured is replaced with next test sample book, repeat step (2)～step (7), finish until all label tests to be measured;
Step (9): calculate the arithmetic mean of the power meter reading of N label to be measured, and convert, obtain the minimum operation level of RFID label according to the gain and the insertion loss of reference antenna and radio frequency feed line.
10. the reference test method of RFID label operation level according to claim 9, it is characterized in that: described label to be measured is positioned over the top of label support to be measured, the geometric center line of geometric center and dual-mode antenna and reference antenna that is label to be measured is on a straight line parallel with standard testing environment ground, and the geometric center of this line and label to be measured intersects vertically.
11. the reference test method of RFID label operation level according to claim 9, it is characterized in that: one of described RFID signal simulator emission does not comprise the rfid interrogator inquiry instruction of anti-collision algorithm, be RFID label in the read range after receiving this rfid interrogator inquiry instruction, in first response time slot, promptly send response signal.
12. the reference test method of RFID label operation level according to claim 9, it is characterized in that: the described electromagnetic signal waveform that dual-mode antenna is received carries out demodulation, being to use power---waveform peak power subtraction signal continuous wave average power on the time diagram is greater than-70dBm, and resolves according to the air interface communications protocol.
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