CN107977588A - A kind of test method of passive UHF RFID chips protocol capabilities - Google Patents
A kind of test method of passive UHF RFID chips protocol capabilities Download PDFInfo
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- CN107977588A CN107977588A CN201711099836.1A CN201711099836A CN107977588A CN 107977588 A CN107977588 A CN 107977588A CN 201711099836 A CN201711099836 A CN 201711099836A CN 107977588 A CN107977588 A CN 107977588A
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- chip
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- tested
- rfid tag
- tag reader
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/0095—Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly
Abstract
The invention discloses a kind of test method of passive UHF RFID chips protocol capabilities, including the RFID tag reader is set to send instruction to a chip to be tested；The rf signal analysis device is set to gather the RFID tag reader and the radiofrequency signal during the chip communication to be tested；Analyze the radiofrequency signal that collects, and adjust the transmission power of the RFID tag reader to the chip to be tested can correct response critical value；Record the critical value；Next test case is chosen, and is repeated the above steps, until all testing cases finish.Present invention obtains following beneficial effect：The protocol capabilities of passive UHF RFID chips can be carried out with a series of effective tests.
Description
Technical field
The present invention relates to radio frequency tag technology field, more particularly to a kind of test of passive UHF RFID chips protocol capabilities
Method.
Background technology
Radio Frequency Identification Technology is a kind of wireless, cordless the automatic identification skill risen nineteen nineties
Art, is the frontier science and technology project to grow up in recent years.The technology mainly realizes nothing using radiofrequency signal by Space Coupling
Contact information is passed through transmitted information and reaches identifying purpose.The remarkable advantage of Radio Frequency Identification Technology is non-contact
Property, therefore can realize identification automation without manual intervention during completion identification work and be hardly damaged；Recognizable high-speed motion
RF tag, can also identify multiple RF tags at the same time, it is swift and convenient to operate；RF tag is not afraid of oil stain, dust pollution etc.
Adverse circumstances, and non-metallic object can be penetrated and be identified, strong antijamming capability.
In existing radio frequency tag technology, passive UHF RFID (superfrequency RF tag) are widely used in Internet of Things
In, however, due to lacking test equipment and test method to passive UHF RFID at present so that various working index disunities
Passive UHF RFID be mixed use, cause Internet of Things or corresponding use environment job insecurity.
Since the chip of UHF RFID tags is its main working parts, how a system is provided to UHF RFID chips
Effective test method is arranged, becomes the problem of industry.
The content of the invention
For the above-mentioned problems in the prior art, a kind of test of passive UHF RFID chips protocol capabilities is now provided
Method.
To achieve the above object, present invention employs following technical solution：
A kind of test method of passive UHF RFID chips protocol capabilities, wherein, there is provided a RFID tag reader and
One rf signal analysis device, a plurality of test cases are defined according to test event, further comprising the steps of：
Step 1, a test case is chosen；
Step 2, the RFID tag reader parameter is set according to the test case of selection；
Step 3, the rf signal analysis device parameter is set according to the test case of selection, believes the radio frequency
Number analytical equipment works in corresponding signal analysis pattern；
Step 4, the RFID tag reader is made to send instruction to a chip to be tested；
Step 5, make the rf signal analysis device gather the RFID tag reader with the chip to be tested to lead to
Radiofrequency signal during letter；
Step 6, the radiofrequency signal collected is analyzed, and adjusts the transmission power of the RFID tag reader to institute
State chip to be tested can correct response critical value；
Step 7, the critical value is recorded；
Step 8, next test case is chosen, and repeating said steps 2 are to the step 7, until all tests are used
Example is completed.
Another aspect of the present invention, the rf signal analysis device are spectrum analyzer.
Another aspect of the present invention, the working frequency of the RFID tag reader is 920MHz~925MHz.
Another aspect of the present invention, the chip to be tested encapsulate chip for COB, and the COB encapsulation chip includes matching
Network and balun, 0 Ohmic resistance and functional chip.
Another aspect of the present invention, further includes a circulator, described in the rf signal analysis device is connected by feeder line
The first port of circulator, the RFID tag reader connects the second port of the circulator by feeder line, described to treat
Test chip connects the 3rd port of the circulator by feeder line.
Another aspect of the present invention, in the step 6, the method for adjusting the RFID tag reader transmission power is,
The Initial Trans of RFID tag reader send instruction as described above, can not receive completely should for the chip to be tested
Answer, then the transmission power for increasing the RFID tag reader with a pre- fixed step size is complete up to that can receive the chip to be tested
The critical value of whole response, is such as subjected to the complete answer of the chip to be tested, then with the pre- fixed step size reduce described in treat
The transmission power of RFID tag reader is tested, until the critical value of the chip complete answer to be tested can be received.
Another aspect of the present invention, the pre- fixed step size are 0.2dBm.
Another aspect of the present invention, stating test event includes chip identification sensitivity test, chip reading sensitivity test, core
Piece writes sensitivity test, the test of chip maximum transmission power.
Present invention obtains following beneficial effect：
The protocol capabilities of passive UHF RFID chips can be carried out with a series of effective tests.
Brief description of the drawings
Fig. 1 is the test equipment connection structure signal of the test method of the passive UHF RFID chips protocol capabilities of the present invention
Figure；
Fig. 2 is the FB(flow block) of the method for the passive UHF RFID chips protocol capabilities of the present invention.
Embodiment
The invention will be further described with specific embodiment below in conjunction with the accompanying drawings, but not as limiting to the invention.
A kind of test method of passive UHF RFID chips protocol capabilities, as shown in Figure 1 and Figure 2, wherein, there is provided a RFID
2 and one rf signal analysis device 1 of tag read-write equipment, defines a plurality of test cases according to test event, further includes following
Step：
Step 1, a test case is chosen；
Step 2,2 parameter of RFID tag reader is set according to the test case of selection；
Step 3,1 parameter of rf signal analysis device is set according to the test case of selection, makes the radio frequency
Signal analysis device 1 works in corresponding signal analysis pattern；
Step 4, the RFID tag reader 2 is made to send instruction to a chip 5 to be tested；
Step 5, the rf signal analysis device 1 is made to gather the RFID tag reader 2 and the chip 5 to be tested
Radiofrequency signal in communication process；
Step 6, the radiofrequency signal collected is analyzed, and adjusts the transmission power of the RFID tag reader 2 extremely
The chip to be tested 5 can correct response critical value；
Step 7, the critical value is recorded；
Step 8, next test case is chosen, and repeating said steps 2 are to the step 7, until all tests are used
Example is completed.
Another aspect of the present invention, the rf signal analysis device 1 are spectrum analyzer.
Another aspect of the present invention, the working frequency of the RFID tag reader 2 is 920MHz~925MHz.
Another aspect of the present invention, the chip 5 to be tested encapsulate chip for COB, and the COB encapsulation chip includes matching
Network and balun, 0 Ohmic resistance and functional chip.
Another aspect of the present invention, further includes a circulator 3, and the rf signal analysis device 1 connects institute by feeder line
The first port of circulator 3 is stated, the RFID tag reader 2 connects the second port of the circulator 3, institute by feeder line
State the 3rd port that chip 5 to be tested connects the circulator 3 by feeder line.
Another aspect of the present invention, in the step 6, the method for adjusting the RFID tag reader transmission power is,
The Initial Trans of RFID tag reader send instruction as described above, can not receive completely should for the chip to be tested
Answer, then the transmission power for increasing the RFID tag reader with a pre- fixed step size is complete up to that can receive the chip to be tested
The critical value of whole response, is such as subjected to the complete answer of the chip to be tested, then with the pre- fixed step size reduce described in treat
The transmission power of RFID tag reader is tested, until the critical value of the chip complete answer to be tested can be received.
Another aspect of the present invention, the pre- fixed step size are 0.2dBm.
Another aspect of the present invention, stating test event includes chip identification sensitivity test, chip reading sensitivity test, core
Piece writes sensitivity test, the test of chip maximum transmission power.
Illustrate the feasibility of the present invention with specific embodiment below.
Embodiment one
When test event identifies sensitivity test for chip, in step 2, by the initial transmissions work(of RFID tag reader
Rate is arranged to the insertion loss value on -15dBm ledger lines road, and starts the querying command forward link reference time and be arranged to 6.25 μ
S, reverse link frequencies are arranged to 320Khz, and coding mode is arranged to FM0, band lead code.In step 4, instruct and inquired about to start
Order.
Above-mentioned insertion loss value is obtained by Insertion Loss power meter by measuring the pin of chip to be tested.
Test case is frequency point 920.125MHz, 924.875MHz.
In each test case, the corresponding instruction of transmission 10 times is repeated after obtaining critical value, after 10 times send instruction
If the instruction for having more than 50% obtains complete answer, you can thinks that the critical value is effective.
Chip identification sensitivity to be tested subtracts circuit insertion loss value for corresponding critical value.When the knowledge of chip to be tested
When other sensitivity is less than or equal to -14dBm, test passes through, otherwise test crash.
Embodiment two
, can be first by preceding 4 byte regions of the user area of chip to be tested when test event reads sensitivity test for chip
(that is, it should be deposited with same amount of 1 and 0 unified fill by the nybble of 5Ahex, 3Chex, 0Fhex, F0hex filling memory block
Store up block).In step 2, the Initial Trans of RFID tag reader are arranged to the insertion loss value on -14dBm ledger lines road, and
And the startup querying command forward link reference time is arranged to 6.25 μ s, reverse link frequencies are arranged to 320Khz, coding mode
It is arranged to FM0, band lead code.
Above-mentioned insertion loss value is obtained by Insertion Loss power meter by measuring the pin of chip to be tested.
In step 4, instruction includes：
Send the startup querying command for meeting T2 requirements and coding obtains order so that chip to be tested enters open shape
State.
First time reading order is sent to first piece of the user area of chip to be tested memory block, and verifies the data read
It is whether correct；
Second of reading order is sent to last block memory block of the user area of chip to be tested, and verifies the number read
According to whether correct.
The illustrated in table 1 of above-mentioned T2.
Table 1
The correct complete answer that should be first time reading order and second of the complete of reading order in step 6 should
Answer.
Test case is frequency point 920.125MHz, 924.875MHz.
In each test case, the corresponding instruction of transmission 10 times is repeated after obtaining critical value, after 10 times send instruction
If the instruction for having more than 50% obtains complete answer, you can thinks that the critical value is effective.
The reading sensitivity of chip to be tested subtracts circuit insertion loss value for corresponding critical value.When the reading spirit of chip to be tested
When sensitivity is less than or equal to -13dBm, test passes through, otherwise test crash.
Embodiment three
When test event reads sensitivity test for chip.In step 2, by the Initial Trans of RFID tag reader
The insertion loss value on -9dBm ledger lines road is arranged to, and starts the querying command forward link reference time to be arranged to 6.25 μ s, instead
320Khz is arranged to link frequency, coding mode is arranged to FM0, band lead code.
Above-mentioned insertion loss value is obtained by Insertion Loss power meter by measuring the pin of chip to be tested.
In step 4, instruction includes：
Send the startup querying command for meeting T2 requirements and coding obtains order so that chip to be tested enters open shape
State.
First piece of the user area memory block for writing command to chip to be tested for the first time is sent, writes data；
Transmission writes command to last block memory block of the user area of chip to be tested for the second time, writes data.
Then verify whether first time writing commands and second of writing commands write-in are correct by reading order.
Above-mentioned first time writing commands and the data of second of writing commands write-in are by same amount of 1 and 0 unified filling
(that is, the memory block that two words of memory block are filled by 5A3Chex, 0FF0hex).
The illustrated in table 1 of above-mentioned T2.
Correctly the complete answer and second of writing commands for verifying correct first time writing commands are should be in step 6
Complete answer.
Test case is frequency point 920.125MHz, 924.875MHz.
In each test case, the corresponding instruction of transmission 10 times is repeated after obtaining critical value, after 10 times send instruction
If the instruction for having more than 50% obtains complete answer, you can thinks that the critical value is effective.
The sensitivity of writing of chip to be tested subtracts circuit insertion loss value for corresponding critical value.When writing for chip to be tested
When sensitivity is less than or equal to -6dBm, test passes through, otherwise test crash.
Example IV
When test event is tested for chip maximum transmission power, in step 2, by the initial transmissions of RFID tag reader
Power setting is 24dBm, and starts the querying command forward link reference time and be arranged to 6.25 μ s, and reverse link frequencies are set
For 320Khz, coding mode is arranged to FM0, band lead code.In step 4, instruct to start querying command.
In step 6, the output of RFID tag reader is closed before increasing the output power of RFID tag reader every time and is carried
Ripple 200ms, instruction 50ms is sent after increasing the output power of RFID tag reader every time.Increase RFID tag reader every time
The step-length of output power be 0.2dBm.In the present embodiment, the output work of RFID tag reader is not reduced, in increase RFID marks
Output power to the chip to be tested for signing reader can not be correctly after response, and chip to be tested can correct response for the last time for record
The output power of RFID tag reader be critical value.
Test case is frequency point 920.125MHz, 924.875MHz.
In each test case, the corresponding instruction of transmission 10 times is repeated after obtaining critical value, after 10 times send instruction
If the instruction for having more than 50% obtains complete answer, you can thinks that the critical value is effective.
Chip maximum transmission power to be tested subtracts circuit insertion loss value for corresponding critical value.When chip to be tested
When maximum transmission power is more than or equal to 24dBm, test passes through, otherwise test crash.
The foregoing is merely preferred embodiments of the present invention, not thereby limit embodiments of the present invention and protection model
Enclose, to those skilled in the art, should can appreciate that all with made by description of the invention and diagramatic content
Equivalent substitution and obviously change obtained scheme, should be included in protection scope of the present invention.
Claims (8)
1. a kind of test method of passive UHF RFID chips protocol capabilities, it is characterised in that a RFID tag reader is provided
And a rf signal analysis device, a plurality of test cases are defined according to test event, it is further comprising the steps of：
Step 1, a test case is chosen；
Step 2, the RFID tag reader parameter is set according to the test case of selection；
Step 3, the rf signal analysis device parameter is set according to the test case of selection, makes the radiofrequency signal point
Analysis apparatus works in corresponding signal analysis pattern；
Step 4, the RFID tag reader is made to send instruction to a chip to be tested；
Step 5, the rf signal analysis device is made to gather the RFID tag reader and the chip communication mistake to be tested
Radiofrequency signal in journey；
Step 6, the radiofrequency signal collected is analyzed, and the transmission power for adjusting the RFID tag reader is treated to described
Test chip can correct response critical value；
Step 7, the critical value is recorded；
Step 8, next test case is chosen, and repeating said steps 2 are to the step 7, until all test cases are surveyed
Examination finishes.
2. test method as claimed in claim 1, it is characterised in that the rf signal analysis device is spectrum analyzer.
3. test method as claimed in claim 1, it is characterised in that the working frequency of the RFID tag reader is
920MHz~925MHz.
4. test method as claimed in claim 1, it is characterised in that the chip to be tested encapsulates chip for COB, described
COB encapsulation chips include matching network and balun, 0 Ohmic resistance and functional chip.
5. test method as claimed in claim 1, it is characterised in that further include a circulator, the rf signal analysis dress
The first port that the circulator is connected by feeder line is put, the RFID tag reader connects the circulator by feeder line
Second port, the chip to be tested connects the 3rd port of the circulator by feeder line.
6. test method as claimed in claim 1, it is characterised in that in the step 6, adjust the RFID tag reader
The method of transmission power is that the Initial Trans of RFID tag reader send instruction as described above, can not be received described
The complete answer of chip to be tested, then increase the transmission power of the RFID tag reader until can receive with a pre- fixed step size
To the critical value of the chip complete answer to be tested, the complete answer of the chip to be tested is such as subjected to, then with described
Pre- fixed step size reduces the transmission power of the RFID tag reader to be tested, until it is complete to receive the chip to be tested
The critical value of response.
7. test method as claimed in claim 6, it is characterised in that the pre- fixed step size is 0.2dBm.
8. test method as claimed in claim 1, it is characterised in that the test event includes chip identification sensitivity and surveys
Sensitivity test is read in examination, chip, chip writes sensitivity test, the test of chip maximum transmission power.
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| CN201711099836.1A CN107977588A (en) | 2017-11-09 | 2017-11-09 | A kind of test method of passive UHF RFID chips protocol capabilities |
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| CN201711099836.1A CN107977588A (en) | 2017-11-09 | 2017-11-09 | A kind of test method of passive UHF RFID chips protocol capabilities |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112580377A (en) * | 2020-12-21 | 2021-03-30 | 江门市得实计算机外部设备有限公司 | Radio frequency power calibration method, device, equipment and storage medium |
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| CN103838665A (en) * | 2012-11-27 | 2014-06-04 | 中兴通讯股份有限公司 | RFID automated testing system and method |
| CN107064704A (en) * | 2017-03-15 | 2017-08-18 | 北京中科国技信息系统有限公司 | Rfid tag performance test system |
-
2017
- 2017-11-09 CN CN201711099836.1A patent/CN107977588A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103838665A (en) * | 2012-11-27 | 2014-06-04 | 中兴通讯股份有限公司 | RFID automated testing system and method |
| CN107064704A (en) * | 2017-03-15 | 2017-08-18 | 北京中科国技信息系统有限公司 | Rfid tag performance test system |
Non-Patent Citations (2)
| Title |
|---|
| 张乒乒: "《基于自主标准的RFID设备测试研究》", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
| 王明磊等: "《国标超高频射频识别产品符合性测试方法研究》", 《测控技术与仪器仪表》 * |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112580377A (en) * | 2020-12-21 | 2021-03-30 | 江门市得实计算机外部设备有限公司 | Radio frequency power calibration method, device, equipment and storage medium |
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Application publication date: 20180501 |