CN102479333A - Non-contact IC card instruction test system and method - Google Patents
Non-contact IC card instruction test system and method Download PDFInfo
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- CN102479333A CN102479333A CN2010105588806A CN201010558880A CN102479333A CN 102479333 A CN102479333 A CN 102479333A CN 2010105588806 A CN2010105588806 A CN 2010105588806A CN 201010558880 A CN201010558880 A CN 201010558880A CN 102479333 A CN102479333 A CN 102479333A
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Abstract
The invention provides a non-contact IC card instruction test system and method. The test system consists of a non-contact protocol instruction test suite, an upper computer test platform, and a non-contact IC card protocol instruction test device. The test suite is used for running a test script through an upper computer test platform, and selecting an execution script after testing the normal communication between a card and the test device. A protocol test instruction in the script is transmitted by upper computer test platform software to the test device through an I/O port; a microcontroller in the test device transmits an instruction to a card reader chip according to the configured parameters and context; and the card reader chip achieves data interaction with the non-contact IC card through antenna coupling, then transmits the response data of the non-contact IC card back to the microcontroller in the test device. The microcontroller transmits the result back to the upper computer test platform software; and a test executer analyzes the response data according to test response of the protocol instruction and generates a test report.
Description
Technical field
The present invention relates to the instruction testing system, relate in particular to a kind of non-contact IC card instruction testing system and method.
Background technology
Along with the development of integrated circuit technique, the application of non-contact IC card is more and more universal.How to ensure in application that IC-card sheet and CR (or card reader) carry out data interaction according to the protocol instructions of specific criteria (international standard/domestic standard/industry standard etc.) definition; The accuracy and the security that guarantee data trade in the application process are more and more important, especially the test phase before large-scale production.
Test to radio frequency protocol in the non-contact IC card communication can be divided into test of RF radio frequency waveform and protocol instructions test.The test of RF radio frequency waveform relates to passive extracting RF radio frequency waveform and analyzes, and initiatively generates expectation RF radio frequency waveform etc.Its measuring technology threshold is higher, radio frequency testing that offshore company of a few family can provide complete professional radio frequency testing opertaing device or research and development is only arranged in the market with FPGA (field programmable gate array) integrated circuit board.The protocol instructions test is primarily aimed at the protocol instructions degree of conformity and tests, and current external mechanism for testing has also been set up the advantage to protocol instructions test aspect according to the advantage of above-mentioned radio frequency testing equipment, has set up the protos test suite PROTOS that meets respective standard.The difficulty that the protocol instructions test platform is built by general producer is that the protocol layer of commercial CR (also can claim card reader) has been encapsulated as automatic the processing; Even the open protocol processing layer realizes that the controlled CR of protocol layer can not satisfy the test request of current how contactless standard.
How to set up low-cost and the reproducible device that satisfies the basic test demand; Can simplify simultaneously the interaction characteristic between non-contact IC card and CR interface again; Strengthen the protocol instructions testing process, the cost that reduces proving installation becomes the technical matters that the present invention will solve.
Summary of the invention
The object of the invention provides a kind of non-contact IC card instruction testing system and method, is applied to the test of non-contact radio-frequency IC-card.Adopt test macro provided by the invention and method, can simplify the radio frequency interface interaction feature between non-contact IC card and CR, strengthen protocol instructions test and flow process, can reduce test macro and testing cost simultaneously, satisfy application demand.
A kind of non-contact IC card instruction testing system comprises contactless protocol instructions protos test suite PROTOS, host computer test platform and non-contact IC card protocol instructions proving installation.Wherein non-contact IC card protocol instructions proving installation is made up of MCU microcontroller, card reader chip, antenna transmission module and antenna receiver module.
Contactless protocol instructions protos test suite PROTOS makes up based on the international non-contact testing standard of ISO/IEC 10373-6, comprises in ISO/IEC 14443 standards parameter scanning and fault simultaneously and implants unusual use-case external member.
The present invention also provides a kind of non-contact IC card instruction testing method, comprises following content:
(1) protos test suite PROTOS operation REQB instruction testing script;
(2) host computer test platform software resolve the REQB instruction and under pass to proving installation;
(3) proving installation sends and instructs REQB and non-contact IC card to carry out communication;
(4) response data ATQB is back to software test platform;
(5) analyzing responding ATQB test data generates test report.
REQB seeks card for request and instructs, and ATQB seeks card and replys for replying.Protos test suite PROTOS is through moving test script on host computer test platform software, test execution person at first configuration testing device carries out pretest, begins to select all or part of script behind test card and the proving installation normal communication, single step or execution at full speed.Protocol test instruction in the script is transferred to proving installation through host computer test platform software through the I/O interface; Microcontroller is transferred to card reader chip according to the parameter and the context of co-text of configuration with instruction in the proving installation; Card reader chip is passed through the data interaction of antenna coupling completion and non-contact IC card, and
The non-contact IC card response data is back to the microcontroller in the proving installation.Microcontroller returns the result to host computer test platform software, and test execution person obtains test result according to the test response of protocol instructions to response data analysis, writes test report automatically.
The host computer test platform designs based on proving installation and protos test suite PROTOS, and test process is recorded in the test log, carries out and finishes to generate automatically test report.
Adopt non-contact IC card instruction testing system and method provided by the present invention; Can effectively simplify the radio frequency interface interaction feature between non-contact IC card and CR; Strengthen protocol instructions test and flow process; Simultaneously can reduce cost of testing system and testing cost, satisfy contactless product demand in Test Application.
Description of drawings
Fig. 1 non-contact IC card instruction testing system architecture diagram
Fig. 2 non-contact IC card instruction testing method synoptic diagram.
Specific embodiments
Below in conjunction with each accompanying drawing, the summary of the invention that the present invention is proposed carries out detailed description:
Fig. 1 is the structured flowchart of a kind of non-contact IC card instruction testing provided by the invention system, has wherein comprised contactless protocol instructions protos test suite PROTOS, host computer test platform, non-contact IC card protocol instructions proving installation and has carried out the non-contact IC card of data communication with this system.Wherein, comprise MCU microcontroller, card reader chip, antenna transmission module and several parts of antenna receiver module in the non-contact IC card protocol instructions proving installation.Carrying out agreement REQB (seeking the card instruction) test with the non-contact IC card that adopts ISO/IEC 14443TypeB international standard below is example, carries out detailed explanation:
Make up non-contact IC card protocol instructions proving installation, comprise card reader chip type selecting, pcb board design and three major part modules of microcontroller firmware design.Wherein card reader chip is selected RC632, is the product of NXP company, can support ISO/IEC 14443TypeA also can support the card reader chip of ISO/IEC 14443TypeB.Have 32 pins, relate to address bus, data bus, Reset input, crystal oscillator output, modulation system selection, collision detection output, serial data input, receive serial digital output terminal behind the signal decoding, digital baseband signal sends output terminal, baseband demodulation digital signal input end, RF enable signal output terminal, interrupt output, sheet selects input end etc.Pcb board design comprises the serial ports design, with the Interface design of card reader chip, with the radio-frequency antenna Interface design, with the design of MCU microcontroller interface, with the Interface design of clock chip, with the Interface design of feed circuit etc.Whole testing device has comprised proving installation veneer, MCU microcontroller, card reader chip, antenna transmission module and receiver module etc.The MCU microcontroller is realized interfaces processing such as reading card machine chip, serial ports.Microcontroller firmware function comprises: with the upper machine communication function, read the card reader chip register, write Card Reader machine chip register, send instruction, receive response etc.
Structure is based on the non-contact testing standard agreement instruction testing external member of ISO/IEC 10373-6 standard.The protocol instructions of Type category-A type comprises: REQA, Select, RATS, PPS, I_Block, R (ACK), R (NAK), S (DeSelect), S (WTX) etc.; The protocol instructions of Type category-B type comprises REQB, SLOT_MARKER, ATTRIB, I_Block, R (ACK), R (NAK), S (DeSelect), S (WTX) etc.Test case comes from the concrete design in the testing standard ISO/IEC 10373-6 standard.
Execution is loaded into the protocol instructions protos test suite PROTOS in the host computer test platform software, generates test report.After accomplishing the preparation of proving installation and protos test suite PROTOS, connect proving installation placement testing contactless IC-card and build test environment, operation host computer test platform software; Carry out the test case script under the protos test suite PROTOS; Seek card instruction REQB like test protocol, instruction word is " REQB ", and resolving the back at test platform is " 050000 "; Test platform software is given the MCU microcontroller through the RS232 serial ports with data down transmission; The MCU microcontroller imports data into card reader chip, and card reader chip is through the mutual of exterior antenna completion and non-contact IC card and return the IC response data, and the MCU microcontroller returns response data to host computer test platform software.This moment, test execution person obtained the value of the response ATQB of REQB, and other protocol instructions tests are according to similar process flow operation.
Claims (5)
1. a non-contact IC card instruction testing system is characterized in that said test macro comprises contactless protocol instructions protos test suite PROTOS, host computer test platform and non-contact IC card protocol instructions proving installation.
2. a kind of non-contact IC card instruction testing as claimed in claim 1 system is characterized in that said non-contact IC card protocol instructions proving installation comprises MCU microcontroller, card reader chip, antenna transmission module and antenna receiver module.
3. non-contact IC card instruction testing method is characterized in that comprising following content:
(1) protos test suite PROTOS operation REQB instruction testing script;
(2) host computer test platform software resolve the REQB instruction and under pass to proving installation;
(3) proving installation sends and instructs REQB and non-contact IC card to carry out communication;
(4) response data ATQB is back to software test platform;
(5) analyzing responding ATQB instruction testing data generate test report.
4. a kind of non-contact IC card instruction testing method as claimed in claim 3 is characterized in that the international non-contact testing standard of the structure of said contactless protocol instructions protos test suite PROTOS based on ISO/IEC 10373-6.
5. a kind of non-contact IC card instruction testing method as claimed in claim 3 is characterized in that said host computer test platform designs based on proving installation and protos test suite PROTOS, and test process is recorded in the test log, carries out and finishes to generate automatically test report.
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| CN2010105588806A CN102479333A (en) | 2010-11-25 | 2010-11-25 | Non-contact IC card instruction test system and method |
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| CN2010105588806A CN102479333A (en) | 2010-11-25 | 2010-11-25 | Non-contact IC card instruction test system and method |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104748781A (en) * | 2015-04-22 | 2015-07-01 | 航天科技控股集团股份有限公司 | Car instrument testing platform test parameter setting method |
| CN105676106A (en) * | 2015-12-31 | 2016-06-15 | 东信和平科技股份有限公司 | Non-contact intelligent card chip model automatic detection system and method |
| CN107632248A (en) * | 2016-07-19 | 2018-01-26 | 上海华虹集成电路有限责任公司 | Contact type intelligent card the whole series compatibility test system |
| CN108182061A (en) * | 2017-12-29 | 2018-06-19 | 新开普电子股份有限公司 | All-purpose card card script tests system |
| CN110197089A (en) * | 2019-05-23 | 2019-09-03 | 深圳市创自技术有限公司 | Reader detection method, equipment and computer readable storage medium |
| CN110969031A (en) * | 2019-12-04 | 2020-04-07 | 楚天龙股份有限公司 | Test system of non-contact intelligent IC card |
| CN111579959A (en) * | 2019-02-15 | 2020-08-25 | 深圳市汇顶科技股份有限公司 | Chip verification method, device and storage medium |
| CN112183124A (en) * | 2020-09-17 | 2021-01-05 | 深圳市银通商智能卡有限公司 | Non-contact IC card radio frequency protocol and application test method |
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| CN101661552A (en) * | 2009-09-03 | 2010-03-03 | 公安部第一研究所 | Non-contact IC card radio frequency protocol and application testing method |
| CN201623819U (en) * | 2010-03-30 | 2010-11-03 | 福建新大陆通信科技股份有限公司 | Simulated smart card for detecting conditional access smart card slot in set-top box |
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| US20060276989A1 (en) * | 2005-05-19 | 2006-12-07 | Ludwig Clifford V | System for testing smart cards and method for same |
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| CN201623819U (en) * | 2010-03-30 | 2010-11-03 | 福建新大陆通信科技股份有限公司 | Simulated smart card for detecting conditional access smart card slot in set-top box |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104748781A (en) * | 2015-04-22 | 2015-07-01 | 航天科技控股集团股份有限公司 | Car instrument testing platform test parameter setting method |
| CN105676106A (en) * | 2015-12-31 | 2016-06-15 | 东信和平科技股份有限公司 | Non-contact intelligent card chip model automatic detection system and method |
| CN107632248A (en) * | 2016-07-19 | 2018-01-26 | 上海华虹集成电路有限责任公司 | Contact type intelligent card the whole series compatibility test system |
| CN108182061A (en) * | 2017-12-29 | 2018-06-19 | 新开普电子股份有限公司 | All-purpose card card script tests system |
| CN111579959A (en) * | 2019-02-15 | 2020-08-25 | 深圳市汇顶科技股份有限公司 | Chip verification method, device and storage medium |
| CN110197089A (en) * | 2019-05-23 | 2019-09-03 | 深圳市创自技术有限公司 | Reader detection method, equipment and computer readable storage medium |
| CN110969031A (en) * | 2019-12-04 | 2020-04-07 | 楚天龙股份有限公司 | Test system of non-contact intelligent IC card |
| CN112183124A (en) * | 2020-09-17 | 2021-01-05 | 深圳市银通商智能卡有限公司 | Non-contact IC card radio frequency protocol and application test method |
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Application publication date: 20120530 |