CN102539970A - RFID (radio frequency identification) equipment testing method and system - Google Patents
RFID (radio frequency identification) equipment testing method and system Download PDFInfo
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Abstract
The invention provides an RFID (radio frequency identification) equipment testing method and a system, wherein the system includes a signal generating device used for generating test signals as per a predetermined rule, a digital to analog conversion device is used for converting the test signals to mid-frequency analog signals, a signal transmit-receive device is used for sending the mid-frequency analog signals to a radio frequency tag and receiving response signals from the radio frequency tag, an analog to digital conversion device is used for converting the response signals to mid-frequency digital signals, and a performance detection device is used for detecting the performance of the radio frequency tag as per the mid-frequency digital signals. Through adopting the RFID equipment testing method and the system provided by the invention, the testing efficiency can be improved.
Description
Technical field
The present invention relates to the REID field, particularly, relate to a kind of RFID apparatus testing method and system.
Background technology
RF identification (RFID) is a kind of short-range wireless communication technologies of low-power consumption, and the composition of rfid system comprises electronic tag and two parts of read write line at least.Wherein, stored the data of definition format in the electronic tag, in practical application, electronic tag is attached to object surfaces to be identified; The data that read write line can contactlessly read and discern in the electronic tag to be preserved realize the management functions such as collection, processing and teletransmission to object identification information through computing machine and network.
Rfid system is an organic whole of realizing identification automatically and data acquisition function, and the detection of rfid system is comprised the test to electronic tag and read write line.Concrete content measurement comprises: the measurement of radio frequency parameter, modulation parameter, time sequence parameter and command parameter.The RFID detection technique is one of RFID key application technology, and quick, high efficiency test is necessary to rfid system.
RF identification detection system of the prior art comprises read write line simulator and electronic tag simulator.The read write line simulator is used to detect electronic tag to be measured; Existing rfid test system is simulated the read write line of different frequency, different agreement respectively; Form the read write line simulator of multiple different performance, be used for detecting electronic tag to be measured then, owing to receive the restriction of tested person interface capacity and testing software operational mode; Can only adopt serial test job pattern; Can not test multiple devices simultaneously, cause the waste of system hardware resources, existing test macro only can carry out the performance test of RF tag and read write line simultaneously.
That is to say that there is the lower problem of efficient in existing RFID test macro.
Summary of the invention
The fundamental purpose of the embodiment of the invention is to provide a kind of RFID apparatus testing method and system, to solve the lower problem of RFID test system and test efficient of the prior art.
To achieve these goals, the embodiment of the invention provides a kind of RFID device test system, and this system comprises: signal generating apparatus is used for generating test signal according to pre-defined rule; Digiverter is used for converting said test signal into analog intermediate frequency signal; Signal receiving/transmission device is used for said analog intermediate frequency signal is sent to RF tag and receives the response signal from said RF tag; Analog-digital commutator is used for converting said response signal into digital intermediate frequency signal; Device for detecting performance is used for detecting according to said digital intermediate frequency signal the performance of said RF tag.
Above-mentioned signal generating apparatus specifically is used for: generate RFID baseband I Q signal.
Above-mentioned digiverter comprises: plate carries Digital Up Convert and A/D converter.
Above-mentioned signal receiving/transmission device comprises: upconverter is used for said digital intermediate frequency signal is sent to RF tag; Low-converter is used to receive the response signal from said RF tag.
Above-mentioned signal receiving/transmission device also comprises: antenna, be connected with low-converter with said upconverter respectively, and be used for receiving and sending signal.
Above-mentioned analog-digital commutator comprises: plate carries Digital Down Convert and D/A converter.
Above-mentioned signal generating apparatus is a fpga chip.
The embodiment of the invention also provides a kind of RFID apparatus testing method, and said method comprises: generate test signal according to pre-defined rule; Convert said test signal into analog intermediate frequency signal; Said analog intermediate frequency signal is sent to RF tag, and receives the response signal from said RF tag; Convert said response signal into digital intermediate frequency signal; Detect the performance of said RF tag according to said digital intermediate frequency signal.
Above-mentioned test signal is a RFID baseband I Q signal.
Above-mentioned test signal is generated by fpga chip.
By means of technique scheme one of at least; Send to tested RF tag after converting analog intermediate frequency signal into through the test signal that generates according to pre-defined rule; And detect the performance of RF tag according to the feedback signal of this RF tag; Than the lower problem of RFID test system and test efficient of the prior art, the present invention can improve testing efficiency.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art; The accompanying drawing of required use is done to introduce simply in will describing embodiment below; Obviously, the accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills; Under the prerequisite of not paying creative work property, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the structured flowchart according to the RFID device test system of the embodiment of the invention;
Fig. 2 is the structured flowchart according to the signal receiving/transmission device of the embodiment of the invention;
Fig. 3 is the test system hardware part configuration diagram according to the embodiment of the invention;
Fig. 4 is based on the actual hardware configuration diagram of Fig. 3;
Fig. 5 is the testing software configuration diagram according to the embodiment of the invention;
Fig. 6 is the concrete structure synoptic diagram according to the test macro of the embodiment of the invention;
Fig. 7 is the software architecture synoptic diagram according to the rfid interrogator test of the embodiment of the invention;
Fig. 8 is the process flow diagram according to the RFID apparatus testing method of the embodiment of the invention.
Embodiment
To combine the accompanying drawing in the embodiment of the invention below, the technical scheme in the embodiment of the invention is carried out clear, intactly description, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills are not making the every other embodiment that is obtained under the creative work prerequisite, all belong to the scope of the present invention's protection.
Because the testing efficiency of existing RFID test macro is not high, based on this, the embodiment of the invention provides a kind of RFID apparatus testing method and system, to address the above problem.Below in conjunction with accompanying drawing the present invention is elaborated.
Embodiment one
The embodiment of the invention provides a kind of RFID device test system, and Fig. 1 is the structured flowchart of this system, and is as shown in Figure 1, and this system comprises:
Signal receiving/transmission device 13 is used for analog intermediate frequency signal is sent to RF tag and receives the response signal from RF tag;
Analog-digital commutator 14 is used for converting response signal into digital intermediate frequency signal;
Device for detecting performance 15 is used for the performance according to digital intermediate frequency signal detection RF tag.
Wherein, pre-defined rule can be decided according to actual test event.
Can find out by above description; Send to tested RF tag after converting analog intermediate frequency signal into through the test signal that signal generating apparatus is generated according to pre-defined rule; And do as one likes ability pick-up unit detects the performance of RF tag according to the feedback signal of this RF tag; Because pre-defined rule can be decided according to actual test event, than the lower problem of RFID test system and test efficient of the prior art, the embodiment of the invention can improve testing efficiency simultaneously.
What above-mentioned signal generating apparatus specifically generated is RFID baseband I Q signal.
Digiverter specifically comprises: plate carries Digital Up Convert and A/D converter.Accordingly, analog-digital commutator specifically comprises: plate carries Digital Down Convert and D/A converter.
As shown in Figure 2, signal receiving/transmission device 13 comprises: upconverter 131 is used for analog intermediate frequency signal is sent to RF tag; Low-converter 132 is used to receive the response signal from RF tag.When tool topic is implemented, can be respectively upconverter with low-converter is provided with antenna, be used for receiving and the transmission signal.
Above-mentioned signal generating apparatus is FPGA (Field-Programmable Gate Array, a field programmable gate array) chip, adopts FPGA can improve the testing efficiency of system.
In order to understand the embodiment of the invention better, below describe the embodiment of the invention in detail with hardware components and software section respectively.
Fig. 3 is the test system hardware part configuration diagram of the embodiment of the invention; As shown in Figure 3; This system comprises: embedded master controller, FPGA BBP, signal receiver and radio-frequency transmissions equipment; These four parts are through the open high-speed bus transmission signals order of PXI/PXI Express, and the signal transmitter sends test massage to the RFID unit under test, and signal receiver receives the response signal from the RFID unit under test.
Fig. 4 is based on the actual hardware configuration diagram of Fig. 3, describes the test process of this test macro below in conjunction with Fig. 3, Fig. 4.
PC master controller (perhaps embedded master controller) sends instruction and gives each functional module; The FPGA BBP generates RFID baseband I Q signal in real time by FPGA; Carry DUC through plate again and D/A converter is converted into intermediate-freuqncy signal; Send the radio-frequency-up-converter modulation to, on radio-frequency carrier, give the RFID unit under test through cable or antenna transmission.The signal that returns from unit under test sends the FPGA BBP to after the radio frequency down-conversion device is converted into intermediate-freuqncy signal; Carry A/D and DDC is converted into digital baseband IQ signal through plate, deliver to the analysis that the PC master controller carries out Physical layer and protocol side parameters through bus at last.
Fig. 5 is the testing software configuration diagram, and is as shown in Figure 5, and the testing software framework totally is divided into three layers, is followed successively by from bottom to up: hardware driving layer, FPGA development layer and main frame (HOST) development layer.Wherein: the hardware driving layer is mainly accomplished the communication function between testing tool and the main frame; The FPGA development layer is mainly realized RFID protocol emulation function, comprises CRC, digital signal encoding and decoding, digital modulation and demodulation etc.; The main frame development layer is divided into a plurality of functional modules, mainly is hardware controls, Physical layer test, protocol layer test and workflow management, particularly:
The hardware controls module realizes the control to modularized hardware, comprises the configuration, triggering collection of hardware etc.;
The Physical layer test module is realized the physical parameter test to signal, mainly comprises the various Measurement and analysis of time domain, frequency domain and modulation domain;
The protocol layer test module is realized the protocol parameter test to signal, mainly comprises data analysis and frame structure analysis etc.;
The workflow management module then cooperates with professional automatic test workflow management software (like TestStand), realizes the management of RFID communication test project and the generation of test report etc.
Software and hardware analysis through said system; The RFID standard need be set up the real-time communication of microsecond level between transponder and label; Therefore this test adopts FPGA to combine upper and lower frequency converter to realize the real-time communication process; Plate carries FPGA and is used to set up real-time communication, and the HOST processor is used for the subsequent analysis of signal.
Fig. 6 is the concrete structure synoptic diagram of the test macro of the embodiment of the invention; As shown in Figure 6; System is divided into hardware components and software section; Wherein: hardware components is made up of antenna, low-converter, upconverter, ADC (analog to digital signal converter) and DAC (digital and analog signaling converter), realizes catching and emission function of radiofrequency signal; Software section is realized the functions such as encoding and decoding of signal by main frame and FPGA programming.
FPGA generates instruction, encodes, and carries DUC through plate afterwards and DAC is converted into intermediate-freuqncy signal, sends upconverter to and is modulated on the radio-frequency carrier and outwards sends through antenna.The answer signal that receives is after low-converter is converted into intermediate-freuqncy signal; Carry ADC and DDC is converted into digital baseband signal through plate; Answer signal is delivered to controller and is carried out the Physical layer test after demodulation, digitizing, the Physical layer test comprises real time spectral analysis, time domain waveform parameter measurement; Also deliver to controller by the decoded information of FPGA simultaneously and carry out the protocol layer test.
Need to prove that because the requirement of test, whole real-time Communication for Power process need is accomplished at Millisecond, and next bar instruction of read write line read-write need be used the signal that returns before the label usually.For instance; Must correctly comprise last 16 random numbers in replying in the ACK instruction; And the reaction time should be within 3-20Tpri (several approximately microseconds are to tens microseconds); Otherwise communication will be failed, and therefore adopt the mode that generates instruction in advance can't accomplish real-time communication, and test macro must have the ability that in the extremely short time, generates instruction in real time.So operate on the HOST processor differently with the ordinary procedure core code, the core code of this test platform operates among the FPGA.
Combine the plate of customized justice to carry decision-making just because of the processing capability in real time that has adopted FPGA; The digital filtering of various complicacies, modulation and demodulation, encoding and decoding, CRC and logic control algorithm are able on FPGA hardware level, move; The system that could make has high real-time performance, could realize the real-time acknowledgement mechanism that requires in the agreement.
In practical operation, can the function of LabVIEW FPGA pattern development environment LabVIEW have been expanded in the FPGA application, for field programmable gate array (FPGA) chip provides the pattern development function.Labview is a kind of pattern development environment, has high performance modularized hardware, through LabVIEW FPGA, can on main frame, develop the FPGA program, and uses compiler to generate final hardware identification code.Make the core code among the HOST to be transplanted on the FPGA, and then whole tempo of development is accelerated greatly.
Below be the test process that example is described test macro with the uniformity test of test macro.
(1) card reader testing protocol consistency
The read write line RF index of stipulating in the ISO/IEC 18000-6 Type C standard mainly comprises read write line digital coding, RF envelope waveform, introduction signal, power on and following electrical waveform, forward link time T3, T4.Fig. 7 is the software architecture synoptic diagram of rfid interrogator test, and as shown in Figure 7, concrete test process is:
(1) collects the read write line signal by receiving antenna; Through behind the low-converter; Carry out digital collection by the AD transducer again; On main frame, the digital signal that collects is carried out operations such as spectrum analysis then, thereby can realize the Physical layer test of read write line signal, like the test of read write line radio-frequency performance etc.;
(2) in FPGA, the digital signal that collects is carried out the demodulation sign indicating number according to modulation and the coding rule stipulated in the ISO/IEC 18000-6 Type C standard; On main frame, record relevant parameters then through programming; And contrast with consensus standard, thereby can realize the protocol layer test of read write line signal;
(3) signal of analytical solution mediation decoding is sent into information in the RFID state machine of finishing in advance, produces corresponding label return signal, realizes the communication performance test of read write line, and in order to guarantee real-time communication, this process realizes in FPGA.
Content measurement comprises:
(1) read write line digital coding
Read write line sends the Query order, catches the read write line signal and carries out demodulating and decoding, data-0 in the measurement read write line Query order in the introduction signal and the time parameter of data-1.
(2) read write line RF envelope
Testing procedure is similar to read write line digital coding test, behind the decoded signal that obtains the Query order, parameters is measured: comprise depth of modulation, RF envelope ripple, RF envelope rise time, RF envelope fall time and RF pulse width.
(3) read write line introduction signal
After obtaining the decoded signal of Query order, the introduction signal is analyzed again, be divided into delimiter, data-0, RTcal, TRcal signal, measure its time respectively, judge whether the protocol compliant requirement.
(4) read write line time parameter T3, T4
Guarantee that when sending order Query order back will be followed by QueryRep or QueryAdjust order.When " do not have and respond " state, read write line will be waited for the T1+T3 time, must construct test scene, occur " no response state ".At this moment the desirable Q=3 of read write line Q value, and number of tags is 1, and read write line is read continuously, identifying so in front has very big probability and occurs " no response state ".After accomplishing above-mentioned work; Catch waveform, seek the inventory procedure waveform that Query and continuous a plurality of QueryRep constitute, and demodulation; From the Query waveform, should obtain the TRcal time span; From the Query command code, can obtain DR, thereby obtain the back, and then indirect calculation can get time parameter T3 to link frequency and time parameter T1.
Test T4 mainly needs read write line before the Query order, to send the Select order.Because the Select order is and forward link and the back sequential between link is irrelevant, so the time interval between select order and the Query order is T4.
(2) label protocol uniformity test
Content measurement comprises: the test of label demodulation ability, link frequency test, the test of reflected signal dutycycle, the test of introduction signal waveform, back are to link time parameter T1, T2 time test.
Testing procedure comprises:
(1) label demodulation ability test
The simulation read write line sends the Query order to label under phase overturn amplitude modulation(PAM) (PR-ASK) mode, catch the backscattered signal of label, and whether tags detected has response.
(2) label link frequency test
Read write line sends the Qurey order to label, catches the backscattered signal of label, and the signal that analyzing tags returns calculates frequency tolerance and frequency displacement during the label repercussion scattering.
(3) tag reflection signal dutyfactor test
Read write line sends the Query order to label, when being arranged on the Miller4 modulation coding mode, catches the backscattered signal of label, the whether protocol compliant requirement of tags detected reflected signal dutycycle.For example, it is 45% that dutycycle is answered minimum, is up to 50%, and nominal value is 50%.
(4) tag reflection signal targeting signal waveform testing
Read write line sends the Query order to label, when the Miller4 modulation coding mode, catches the backscattered signal of label, and it is 1 that the TRext value is set, and whether the preamble of tags detected reflected signal is identical with agreement.
(5) back is to link time parameter T1, T2 test
The emulation read write line sends the Query order, the T1 time before the analytical calculation outgoing label reflection RN16; The emulation read write line sends Inventory Sequence order, and analysis meter is calculated the T1 time before the ACK order back tag reflection EPC; Emulation read write line transmission Inventory Sequence order, analysis meter gets the T1 time before calculating Rep_RN order back tag reflection Handle.With T1 time and restriction ratio, the whether T1 time requirement of protocol compliant regulation.The emulation read write line sends the Query order, receive the label response after, by sending the ACK order behind the T2 limit value of agreement regulation, whether test label has response.
(3) card reader RF consistency test
Card reader RF consistency test mainly is that the frequency spectrum performance of read write line is tested, and the frequency spectrum index that needs to analyze comprises: read write line channel center frequency, channel width, channel occupancy bandwidth, face power leakage ratio, maximum transmission power ERP, frequency modulation performance etc.
Read write line radio frequency testing project is tested time domain and the frequency domain characteristic that to use Labview coding test card reader to send signal.
Test result is not directly compared with " 800MHz～900MHz frequency range RF identification (RFID) technical application regulation (try) " (letter portion has [2007] No. 205), detect the whether conformance with standard requirement of frequency spectrum parameter of correspondence.Utilize the result of read write line frequency spectrum performance test, can instruct the user to select to meet of the requirement of location radio regulatory organization, also can be used to assess the interoperability of rfid system the rfid interrogator spectral characteristic.
Below be the test process that example is described test macro with the HIST of test macro.
HIST is to utilize the interactive working method of the radio frequency of RFID label and read write line, the collaborative work ability between test Devices to test and other equipment.For example: the read write line of model to be measured is to the literacy of other electronic tags; The read write attribute of the electronic tag of model to be measured in the effective working distance scope of other read write lines; The read write line of model to be measured reads other read write lines and writes reliability of label data etc.HIST can be divided into: single read write line to single label, single read write line to many labels, many read write lines to single label, many read write lines to many labels.
The HIST content specifically comprises following two aspects:
(1) label test
RFID label test comprises: operating distance test, label antenna uniformity test, the minimum field strength measurement of working, discern sensitivity, read sensitivity and write sensitivity test etc.
(1) operating distance test
Label is placed on from read write line different distance place, and read write line sends the Query order to label, and whether tags detected can return signal (this signal is RN16); Send the ACK order to label again; Detect test macro and whether can receive complete PC+EPC+CRC16 signal, and CRC is errorless, if can; Then explanation is at this moment within normal range of operation, find can operate as normal range boundary just obtain the operating distance test value.
(2) label antenna uniformity test
The label antenna uniformity test is also referred to as the test of label antenna directivity.The purpose of label antenna uniformity test is to measure the backscatter intensity deviation of a plurality of samples on different distance of same model RFID label product.
Principle of work is: in ideal space, through changing the distance between a plurality of test label samples and the emitting antenna, observe each distance RFID label backscatter intensity standard deviation sum of sample down.Utilize the result of RFID label antenna uniformity test; Can obtain the RFID label backscatter intensity mean value of a plurality of samples under each distance and draw RFID label backscatter intensity-distance Curve; The successful reading machine that can also obtain this RFID label product can and guide the user to select the stronger RFID label product of consistance with the trend map of variable in distance.
(3) tag recognition sensitivity and read-write sensitivity test
The sensitivity of label is the least energy of instigating label to work, and comprises identification sensitivity, reads sensitivity and write sensitivity.Because label is in passive working method; Its energy must be provided by incident magnetic field; Therefore can change the read write line signal emissive porwer of simulation; Up to label can be by correct identification, read or write, record the magnetic field intensity of label present position this moment again, be label identification, read or write sensitivity.
(2) read write line test
The read write line test comprises: the readwrite performance test under read write line spectrum measurement, single label and the many label condition etc.
(1) readwrite performance test
Realize read-write operation according to the browsing process of read write line of stipulating in the ISO/IEC 18000-6C standard and label control read write line, through the signal that captures is analyzed, thereby judge the correctness of read-write single label and many labels.
Concrete testing procedure is following:
1) read write line and label all are put in the test environment, the control read write line sends order and realizes the read and write process of read write line to label.
2) test macro is caught the allied signal waveform of whole process read write line and label, and respectively to the analysis of decoding of read write line order and tag response.Whole waveform should comprise following signal content:
Read write line sends the Query order, and label returns RN16;
Read write line sends the ACK order, and label returns the PC+EPC+CRC16 order;
Read write line sends Req_RN (RN16+CRC16) order, and label returns Handle+CRC16;
Read write line sends the Read order, and label returns Header+ data+Handle+CRC16;
Read write line sends Req_RN (Handle+CRC16) order, and label returns RN16+CRC16;
Read write line sends the Write order, and label returns Header+Handle+CRC16.
Header according in Read order and the Write order back label return signal judges whether read-write operation is successful.
Can be known that by above description this test macro can carry out the performance test of radio-frequency recognition system, consistance and HIST can realize automatic online measuring ability and report generation function at a high speed.
Embodiment two
The embodiment of the invention also provides a kind of RFID apparatus testing method, and is as shown in Figure 8, and this method comprises:
Step 801 generates test signal according to pre-defined rule;
Step 802 converts test signal into analog intermediate frequency signal;
Step 803 sends to analog intermediate frequency signal RF tag, and receives the response signal from RF tag;
Step 804 converts response signal into digital intermediate frequency signal;
Step 805 is according to the performance of digital intermediate frequency signal detection RF tag.
Can find out by above description; Send to tested RF tag after converting analog intermediate frequency signal into through the test signal that generates according to pre-defined rule; And detect the performance of RF tag according to the feedback signal of this RF tag, and this pre-defined rule can be decided according to actual test event; Than the lower problem of RFID test system and test efficient of the prior art, the embodiment of the invention can improve testing efficiency.
Particularly, above-mentioned test signal is a RFID baseband I Q signal, and this test signal can be generated by fpga chip.
The concrete implementation procedure of above-mentioned each step can repeat no more with reference to the description in the above-mentioned enforcement one here.
In sum, the embodiment of the invention increases switch unit and radio-frequency channel through optimizing software and hardware configuration; With the ability that realizes accomplishing in the same time multinomial test assignment; Thereby can shorten the integrated testability time greatly, improve testing efficiency, test macro not only can be carried out the performance test of radio-frequency recognition system simultaneously; And can carry out RF consistency and HIST, overcome the low problem of testing efficiency of the prior art.
One of ordinary skill in the art will appreciate that all or part of step that realizes in the foregoing description method can instruct relevant hardware to accomplish through program; This program can be stored in the computer read/write memory medium, such as ROM/RAM, magnetic disc, CD etc.
Above-described specific embodiment; The object of the invention, technical scheme and beneficial effect have been carried out further explain, and institute it should be understood that the above is merely specific embodiment of the present invention; And be not used in qualification protection scope of the present invention; All within spirit of the present invention and principle, any modification of being made, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. a RFID device test system is characterized in that, described system comprises:
Signal generating apparatus is used for generating test signal according to pre-defined rule;
Digiverter is used for converting said test signal into analog intermediate frequency signal;
Signal receiving/transmission device is used for said analog intermediate frequency signal is sent to RF tag and receives the response signal from said RF tag;
Analog-digital commutator is used for converting said response signal into digital intermediate frequency signal;
Device for detecting performance is used for detecting according to said digital intermediate frequency signal the performance of said RF tag.
2. system according to claim 1 is characterized in that, described signal generating apparatus specifically is used for: generate RFID baseband I Q signal.
3. system according to claim 1 is characterized in that, described digiverter comprises:
Plate carries Digital Up Convert and A/D converter.
4. system according to claim 1 is characterized in that, described signal receiving/transmission device comprises:
Upconverter is used for said digital intermediate frequency signal is sent to RF tag;
Low-converter is used to receive the response signal from said RF tag.
5. system according to claim 4 is characterized in that, described signal receiving/transmission device also comprises:
Antenna is connected with low-converter with said upconverter respectively, is used for receiving and sending signal.
6. system according to claim 1 is characterized in that, described analog-digital commutator comprises:
Plate carries Digital Down Convert and D/A converter.
7. system according to claim 1 is characterized in that, described signal generating apparatus is a fpga chip.
8. a RFID apparatus testing method is characterized in that, described method comprises:
Generate test signal according to pre-defined rule;
Convert said test signal into analog intermediate frequency signal;
Said analog intermediate frequency signal is sent to RF tag, and receives the response signal from said RF tag;
Convert said response signal into digital intermediate frequency signal;
Detect the performance of said RF tag according to said digital intermediate frequency signal.
9. method according to claim 8 is characterized in that, described test signal is a RFID baseband I Q signal.
10. method according to claim 8 is characterized in that described test signal is generated by fpga chip.
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