CN108000389B - Integrated circuit Constant Acceleration Test fixture - Google Patents
Integrated circuit Constant Acceleration Test fixture Download PDFInfo
- Publication number
- CN108000389B CN108000389B CN201711215503.0A CN201711215503A CN108000389B CN 108000389 B CN108000389 B CN 108000389B CN 201711215503 A CN201711215503 A CN 201711215503A CN 108000389 B CN108000389 B CN 108000389B
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- Prior art keywords
- integrated circuit
- cushion block
- pedestal
- acceleration test
- groove
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B11/00—Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N19/00—Investigating materials by mechanical methods
- G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of integrated circuit Constant Acceleration Test fixtures, belong to ic test technique field.The integrated circuit Constant Acceleration Test fixture includes pedestal and ebonite cushion block;The side of the pedestal is provided with installation fixation hole, the installation fixation hole with centrifuge for being connected and fixed, the other side of the pedestal is provided with the first groove, the ebonite cushion block is fixed in the first groove of the pedestal by glue sticking, the ebonite cushion block is towards being arranged multiple second grooves in the opposite side of the pedestal, any second groove is used to accommodate the protruding parts on integrated circuit, and the protruding parts include at least one of soldered ball, welding column, needle, discrete device.It solves the problems, such as that the applicability in current Constant Acceleration Test for the fixed form of securing integrated circuit is limited, has achieved the effect that the scope of application for improving integrated circuit Constant Acceleration Test fixture.
Description
Technical field
The present invention relates to ic test technique field, in particular to a kind of integrated circuit Constant Acceleration Test folder
Tool.
Background technique
Constant Acceleration Test is a kind of effective means for checking the defect of integrated circuit, main integrated by measurement
The mechanical strength of the bonding of the internal components such as circuit package and internal metallization and lead system, chip or substrate metal is real
It is existing.
With the development of integrated circuit technique, the functions such as monolithic integrated optical circuit, hydrid integrated circuit increase, and packaging density mentions
It rises, package dimension is increasing, and seal area accounting increases, and shape is also more complicated, and Constant Acceleration Test is from thousands of g to tens of thousands of
g.Currently, there are three types of fixed forms in integrated circuit Constant Acceleration Test: 1, " burying micromicrofarad ", integrated circuit is put into sealing
In canister and it is full of fine quartz sand;2, integrated circuit is directly affixed on the wall of centrifuge;3, will be collected by mechanical clamp
It is fixed in centrifuge at circuit.
However, the first fixed form (that is, burying micromicrofarad) easily causes integrated circuit large scale cover board or thin coverplate
Deformation, applicability is limited.In other two kinds of fixed forms, large scale, big quality integration circuit are easy because sealing on integrated circuit
Fill ontology protrusion, cause its local stress under high acceleration it is excessive cause gas leakage even encapsulation main body cracking, applicability by
Limit.As described above, the applicability of several fixed forms provided at present is limited.
Summary of the invention
Applicability in order to solve the problems, such as the mode of several securing integrated circuits provided in the prior art is limited, this
Inventive embodiments provide a kind of integrated circuit Constant Acceleration Test fixture.The integrated circuit Constant Acceleration Test fixture
Including pedestal and ebonite cushion block;
The side of the pedestal is provided with installation fixation hole, and the installation fixation hole with centrifuge for being connected and fixed, institute
The other side for stating pedestal is provided with the first groove,
The ebonite cushion block is fixed in the first groove of the pedestal by glue sticking, and the ebonite cushion block is described in
Multiple second grooves are set in the opposite side of pedestal, any second groove is used to accommodate the protruding parts on integrated circuit,
The protruding parts include at least one of soldered ball, welding column, needle, discrete device.
Optionally, the ebonite cushion block uses soft magnetism polyurethane rubber.
Optionally, be additionally provided with strong magnetic sticking piece in first groove, the strong magnetic sticking piece by adhesive layer respectively with the bottom
Seat, ebonite cushion block, which are pasted, to be fixed.
Optionally, the ebonite cushion block is towards being provided with two-sided adherency glue film in the opposite side of the pedestal.
Optionally, the ebonite cushion block is towards being provided with third groove, the third groove in the opposite side of the pedestal
It is inside provided with adhesive layer, the third groove is connect by adhesive layer with cover board screening glass, and the third groove is also a housing for
The seal cover board of integrated circuit.
Optionally, the ebonite cushion block is towards being provided with two-sided adherency glue film, the cover board in the opposite side of the pedestal
Screening glass is provided with two-sided adherency glue film in the opposite side of the pedestal.
Optionally, the ebonite cushion block is Shore hardness 45A ~ 85A.
Optionally, the hardness of the ebonite cushion block and the quality of integrated circuit are positively correlated, the hardness of the ebonite cushion block
It is negatively correlated with the contact area of integrated circuit.
Technical solution provided in an embodiment of the present invention has the benefit that
By providing a kind of integrated circuit Constant Acceleration Test fixture comprising pedestal and ebonite cushion block;The one of pedestal
Side is provided with installation fixation hole, and installation fixation hole with centrifuge for being connected and fixed;The other side of pedestal is provided with the first groove,
Ebonite cushion block is fixed in the first groove of pedestal by glue sticking, and the ebonite cushion block is multiple towards being arranged in the opposite side of pedestal
Second groove, any second groove are used to accommodate protruding parts on integrated circuit, protruding parts said here include soldered ball,
At least one of welding column, needle, discrete device.Solve in Constant Acceleration Test in the related technology integrated circuit because bury it is husky this
Seal cover board caused by kind of fixed form deforms, because the exits such as welding column are easy to appear damage, part caused by other fixed forms
Stress is excessive cause gas leakage even encapsulation main body cracking the problem of, to solve in current Constant Acceleration Test for fixing
The limited problem of the applicability of the fixed form of integrated circuit has reached and has improved the suitable of integrated circuit Constant Acceleration Test fixture
With the effect of range.
Detailed description of the invention
To describe the technical solutions in the embodiments of the present invention more clearly, make required in being described below to embodiment
Attached drawing is briefly described, it should be apparent that, drawings in the following description are only some embodiments of the invention, for
For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings other
Attached drawing.
Fig. 1 is a kind of schematic diagram of the integrated circuit Constant Acceleration Test fixture provided in one embodiment of the invention;
Fig. 2 be provided in another embodiment of the present invention it is a kind of having a size of 1.27mm pitch CPGA208 core cavity towards next part
At the schematic diagram of circuit Constant Acceleration Test fixture;
Fig. 3 be provided in further embodiment of the present invention it is a kind of having a size of 2.54mm pitch, 7.62mm width
The schematic diagram of CDIP28 integrated circuit Constant Acceleration Test fixture.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with attached drawing to embodiment party of the present invention
Formula is described in further detail.
As shown in Figure 1, the embodiment of the invention provides a kind of integrated circuit Constant Acceleration Test fixture, the integrated circuit
Constant Acceleration Test fixture includes pedestal 1 and ebonite cushion block 2.The side of pedestal 1 is provided with installation fixation hole 11, and installation is fixed
Hole 11 with centrifuge for being connected and fixed;The other side of pedestal 1 is provided with the first groove, and ebonite cushion block 2 is fixed by glue sticking
In the first groove of pedestal 1, the ebonite cushion block 2 is towards being arranged multiple second grooves 21 in the opposite side of pedestal 1, and any second
Groove 21 is used to accommodate the protruding parts 32 on integrated circuit 3, and protruding parts 32 said here include soldered ball, welding column, needle, divide
At least one of vertical device, discrete device said here can be the device of such as capacitor, diode etc..
The integrated circuit Constant Acceleration Test fixture provided in an embodiment of the present invention solves constant in the related technology add
Integrated circuit is because of the deformation of seal cover board 31 caused by burying husky this fixed form in speed trial, because welding caused by other fixed forms
The exits such as column be easy to appear damage, local stress it is excessive cause gas leakage even encapsulation main body cracking the problem of, to solve
Problem limited for the applicability of the fixed form of securing integrated circuit in Constant Acceleration Test at present has reached raising collection
At the effect of the scope of application of circuit Constant Acceleration Test fixture.
In one example, ebonite cushion block 2 is towards being provided with third groove 22, third groove 22 in the opposite side of pedestal 1
It is inside provided with adhesive layer 5, third groove 22 is fixedly connected by adhesive layer 5 with cover board screening glass 23, and third groove 22 is also used to
The seal cover board 31 of integrated circuit 3 is accommodated, the cover board screening glass 23 in third groove 22 is used to protect the sealing cover of integrated circuit 3
Plate 31 avoids seal cover board 31 from being squeezed and deform.
In one example, as shown in Figure 1, being additionally provided with strong magnetic sticking piece 4 in the first groove, strong magnetic sticking piece 4 is divided by adhesive layer 5
It does not paste and fixes with pedestal 1, ebonite cushion block 2.
It is a kind of the constant of system in package integrated circuit for having upper and lower core cavity having a size of 1.27mm pitch CCGA88 with Fig. 1
Acceleration test fixture schematic diagram comes for example, it has strong magnetic sticking piece 4, cover board screening glass 23.Its pedestal 1 is hard using 2A11
Aluminium (or other model duralumin) is process, and strong magnetic sticking piece 4 is made into using 4mm ~ 8mm neodymium iron boron, strong magnetic sticking piece 4 and passes through room
The cured AB glue of temperature is adhesively fixed with pedestal 1.Ebonite cushion block 2 is the Shore hardness 70A polyurethane rubber using 6mm ~ 10mm thickness,
According to made of CCGA88 encapsulation main body dimensioned.Ebonite cushion block 2 is towards being arranged multiple second grooves in the opposite side of pedestal 1
21 and third groove 22.Second groove 21 of any of multiple second groove 21 is used to accommodate the protruding portion on integrated circuit 3
Position 32, and the depth of any one second groove 21 is identical as the depth of the protruding parts 32, the width of the second groove 21 is relatively prominent
The width at position 32 big 0.08mm ~ 0.15 mm out.For example, the second groove 21 can also be used to accommodate integrated circuit capacitor etc.
Part 33.Ebonite cushion block 2 is adhesively fixed by the AB glue of room temperature curing with strong magnetic sticking piece 4.Cover board screening glass 23 passes through room temperature curing
AB glue and ebonite cushion block 2 be adhesively fixed in third groove 22, cover board screening glass 23 be 0.50mm ~ 1.50mm it is thick 304 not
Become rusty steel, and cover board screening glass 23 is 1.50mm ~ 2.00mm bigger than integrated circuit 3.
When carrying out Constant Acceleration Test using integrated circuit Constant Acceleration Test fixture as shown in Figure 1, first will
Integrated circuit Constant Acceleration Test fixture is fixed on centrifuge, then CCGA88 encapsulation integrated circuit cover board is faced close to collection
At circuit Constant Acceleration Test fixture, inhales by magnetic force on ebonite cushion block 2, then start Constant Acceleration Test, it is constant
It is removed after acceleration test structure.It is fixed temporarily integrated circuit 3 by using magnetic force, realizes that integrated circuit 3 is placed straight
It connects and sticks and remove, save and bury husky or clamp fixing step, save the operation of user.Epicoele, cavity of resorption carry out two sides respectively
To Constant Acceleration Test.
In one example, ebonite cushion block 2 is towards being provided with two-sided adherency glue film 41 in the opposite side of pedestal 1.
For example, Fig. 2 be provide according to embodiments of the present invention one kind having a size of 1.27mm pitch CPGA208 core downward
The schematic diagram of integrated circuit Constant Acceleration Test fixture, embedded with cover board screening glass 23, adherency glue film 41 on ebonite cushion block 2.Its
Pedestal 1 is process using 2A11 duralumin (or other model duralumin), and ebonite cushion block 2 is using thick using 10mm ~ 15mm
Shore hardness 65A polyurethane rubber, according to made of CPGA208 encapsulation main body dimensioned.Specifically, according to CPGA208
The size of the cover plate third groove 22 is processed on ebonite cushion block 2, the third groove 22 add cover board screening glass 23 after depth
It is identical as the encapsulation main body of the cover board of CPGA208, width 0.08mm big compared with encapsulation main body width ~ 0.15 mm.Wherein, cover board is protected
Bluff piece 23 is 304 stainless steels of 1.00mm ~ 2.00mm thickness, and cover board screening glass 23 is 0.50mm ~ 1.00mm bigger than integrated circuit 3, with
Ebonite cushion block 2 is adhesively fixed by the AB glue of room temperature curing.Its ebonite cushion block 2(includes on cover board screening glass 23) patch one layer it is two-sided
Adhere to glue film 41.
When carrying out Constant Acceleration Test using integrated circuit Constant Acceleration Test fixture as shown in Figure 2, first will
The integrated circuit Constant Acceleration Test fixture is fixed on centrifuge, then CPGA208 encapsulation integrated circuit cover board is faced folder
Tool sticks on ebonite cushion block 2, then starts Constant Acceleration Test, removes after Constant Acceleration Test structure.By adopting
With adherency glue film 41 come interim securing integrated circuit 3, realize that integrated circuit 3 placed directly sticks and remove, save bury it is husky or
Clamp fixing step saves the operation of user.
In one example, ebonite cushion block 2 uses soft magnetism polyurethane rubber.By the way that ebonite cushion block 2 is used the poly- ammonia of soft magnetism
Ester rubber solves the problems, such as that the cover board of integrated circuit in current Constant Acceleration Test deforms.Optionally, ebonite cushion block
2 are adhesively fixed by the AB glue of room temperature curing with pedestal 1.
For example, a kind of CDIP28 integrated circuit having a size of 2.54mm pitch, 7.62mm width as shown in Figure 3 is permanent
Determine the schematic diagram of acceleration test fixture, pedestal 1 is process, ebonite using 2A11 duralumin (or other model duralumin)
Cushion block 2 is the soft magnetism polyurethane rubber that thick, Shore hardness is 70A using 5mm ~ 12mm, the size according to CDIP28 encapsulation main body
And its made of the dimensioned of cover board.Ebonite cushion block 2 is towards being provided with third groove 22 in the opposite side of pedestal 1, the third
Groove 22 be used for accommodate in CDIP28(figure marked using label 3) seal cover board 31, the depth and sealing of the third groove 22
The height of cover board is identical.Ebonite cushion block 2 is fixedly connected by adhesive layer 5 with pedestal 1.
If be additionally provided in first groove in CDIP28 integrated circuit Constant Acceleration Test fixture as shown in Figure 3
Strong magnetic sticking piece, strong magnetic sticking piece by adhesive layer 5 respectively with pedestal 1, ebonite cushion block 2 paste fix, then technical staff using should
When CDIP28 integrated circuit Constant Acceleration Test fixture, integrated circuit Constant Acceleration Test fixture is first fixed on centrifuge
On, then that CDIP28 encapsulation integrated circuit cover board faced fixture is close, inhales by magnetic force on ebonite cushion block 2, then starts perseverance
Determine acceleration test, is removed after Constant Acceleration Test structure.It is fixed temporarily integrated circuit by using magnetic force, realizes collection
It directly sticks and removes at what circuit was placed, save and bury husky or clamp fixing step, save the operation of user.
Optionally, the hardness of ebonite cushion block 2 eliminates big ruler within Shore hardness 45A ~ 85A in the embodiment of the present invention
Tradition duralumin fixture caused by size difference between very little 3 individual of integrated circuit rigidly causes close caused by stress raisers
Leak sealing gas even porcelain body breakage problem.
In several of the above embodiments where, duralumin can be used in pedestal 1, and polyurethane rubber can be used in ebonite cushion block 2.It can be according to collection
At the quality and contact area of circuit 3 come the hardness that determines the hardness of ebonite cushion block 2, and determine Shore hardness 45A ~
In 85A.Wherein, the hardness of ebonite cushion block 2 and the quality of integrated circuit 3 are positively correlated, the hardness and integrated circuit of ebonite cushion block 2
3 contact area is negatively correlated.For example, multiple integrated circuits identical for contact area are integrated for quality is big
The hardness of ebonite cushion block 2 in the integrated circuit Constant Acceleration Test fixture of circuit design wants larger;For identical in quality
Multiple integrated circuits, for hard in the integrated circuit Constant Acceleration Test fixture of the small IC design of contact area
The hardness of rubber mat block 2 wants larger.
In several of the above embodiments where, strong magnetic sticking piece 4 uses 2mm ~ 12mm thickness neodymium iron boron strong magnet;Adhere to the thickness of glue film 41
At 20 μm ~ 100 μm.
In several of the above embodiments where, the width of third groove 22 it is 0.08mm big compared with the protruding parts 32 of integrated circuit 3 ~
0.15 mm is in order to placing;The width of the second groove 21 in ebonite cushion block 2 relative to projecting part the big 0.10mm of width with
Upper ,+0.10 mm of mm ~+0.25 of depth is to protect exit 32.
The serial number of the above embodiments of the invention is only for description, does not represent the advantages or disadvantages of the embodiments.
Those of ordinary skill in the art will appreciate that realizing that all or part of the steps of above-described embodiment can pass through hardware
It completes, relevant hardware can also be instructed to complete by program, the program can store in a kind of computer-readable
In storage medium, storage medium mentioned above can be read-only memory, disk or CD etc..
The foregoing is merely presently preferred embodiments of the present invention, is not intended to limit the invention, it is all in spirit of the invention and
Within principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (6)
1. a kind of integrated circuit Constant Acceleration Test fixture, which is characterized in that the integrated circuit Constant Acceleration Test folder
Tool includes pedestal and ebonite cushion block;
The side of the pedestal is provided with installation fixation hole, and the installation fixation hole with centrifuge for being connected and fixed, the bottom
The other side of seat is provided with the first groove,
The ebonite cushion block is fixed in the first groove of the pedestal by glue sticking, and the ebonite cushion block is towards the pedestal
Opposite side on multiple second grooves are set, any second groove is used to accommodate the protruding parts on integrated circuit, described
Protruding parts include at least one of soldered ball, welding column, needle, discrete device;
Wherein, the ebonite cushion block uses soft magnetism polyurethane rubber, and the ebonite cushion block is towards setting in the opposite side of the pedestal
It is equipped with third groove, adhesive layer is provided in the third groove, the third groove is connected by adhesive layer and cover board screening glass
It connects, the third groove is also a housing for the seal cover board of integrated circuit.
2. integrated circuit Constant Acceleration Test fixture according to claim 1, which is characterized in that in first groove
It is additionally provided with strong magnetic sticking piece, the strong magnetic sticking piece is pasted with the pedestal, ebonite cushion block respectively by adhesive layer to be fixed.
3. integrated circuit Constant Acceleration Test fixture according to claim 1, which is characterized in that ebonite cushion block court
Two-sided adherency glue film is provided in the opposite side of the pedestal.
4. integrated circuit Constant Acceleration Test fixture according to claim 1, which is characterized in that ebonite cushion block court
Two-sided adherency glue film is provided in the opposite side of the pedestal, the cover board screening glass is arranged in the opposite side of the pedestal
There is two-sided adherency glue film.
5. integrated circuit Constant Acceleration Test fixture according to claim 1, which is characterized in that the ebonite cushion block is
Shore hardness 45A~85A.
6. integrated circuit Constant Acceleration Test fixture according to claim 5, which is characterized in that the ebonite cushion block
Hardness and the quality of integrated circuit are positively correlated, and the hardness of the ebonite cushion block and the contact area of integrated circuit are negatively correlated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201711215503.0A CN108000389B (en) | 2017-11-28 | 2017-11-28 | Integrated circuit Constant Acceleration Test fixture |
Applications Claiming Priority (1)
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CN201711215503.0A CN108000389B (en) | 2017-11-28 | 2017-11-28 | Integrated circuit Constant Acceleration Test fixture |
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CN108000389A CN108000389A (en) | 2018-05-08 |
CN108000389B true CN108000389B (en) | 2019-09-24 |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101358991A (en) * | 2007-08-01 | 2009-02-04 | 中国电子科技集团公司第五十八研究所 | Method for detecting uniform acceleration of microelectronic device |
CN101408488A (en) * | 2008-10-31 | 2009-04-15 | 中国电子科技集团公司第五十八研究所 | Method for testing constant acceleration of microelectronic device |
CN203479620U (en) * | 2013-09-30 | 2014-03-12 | 贵州航天计量测试技术研究所 | Constant accelerated speed test protection clamp of integrated circuit |
CN104006941A (en) * | 2014-05-06 | 2014-08-27 | 北京时代民芯科技有限公司 | Constant accelerated speed testing device for CBGA encapsulated circuit |
CN106461702A (en) * | 2014-04-21 | 2017-02-22 | 英特尔公司 | Alignment fixtures for integrated circuit packages |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7791708B2 (en) * | 2006-12-27 | 2010-09-07 | Asml Netherlands B.V. | Lithographic apparatus, substrate table, and method for enhancing substrate release properties |
-
2017
- 2017-11-28 CN CN201711215503.0A patent/CN108000389B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101358991A (en) * | 2007-08-01 | 2009-02-04 | 中国电子科技集团公司第五十八研究所 | Method for detecting uniform acceleration of microelectronic device |
CN101408488A (en) * | 2008-10-31 | 2009-04-15 | 中国电子科技集团公司第五十八研究所 | Method for testing constant acceleration of microelectronic device |
CN203479620U (en) * | 2013-09-30 | 2014-03-12 | 贵州航天计量测试技术研究所 | Constant accelerated speed test protection clamp of integrated circuit |
CN106461702A (en) * | 2014-04-21 | 2017-02-22 | 英特尔公司 | Alignment fixtures for integrated circuit packages |
CN104006941A (en) * | 2014-05-06 | 2014-08-27 | 北京时代民芯科技有限公司 | Constant accelerated speed testing device for CBGA encapsulated circuit |
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CN108000389A (en) | 2018-05-08 |
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