CN107852434B

CN107852434B - Record tears the structure of machine open, tears machine testing method and PCB open

Info

Publication number: CN107852434B
Application number: CN201580082267.2A
Authority: CN
Inventors: 王兆杰
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2015-08-06
Filing date: 2015-08-06
Publication date: 2019-08-27
Anticipated expiration: 2035-08-06
Also published as: CN107852434A; WO2017020297A1

Abstract

A kind of record electronic product tears the structure of machine open, tears machine testing method, whole-machine test method and PCB open, record electronic product tear open machine structure include: CPU M GPIO distinguish cabling to PCB surface layer formed leak copper, the leakage copper of every GPIO is broken as two parts (1,2), M >=2；The M GPIO passes through resistance (R) connection power end (VDD) respectively；Gating switch, for gating the leakage copper when gating switch is pressed, and, the leakage copper that the gating switch is adjacent to be gated when being pressed twice is different；The gating switch is pressed when electronic product is assembled as bare machine, is bounced when electronic product is split machine.The structure is able to record and detects that the machine of tearing open of electronic product operates, and then can apply it in the system test of electronic product, solves the problems, such as that the sequential testing process of electronic product possibly can not detect that electronic product tears new failure caused by machine maintenance open.

Description

Record tears the structure of machine open, tears machine testing method and PCB open

Technical field

The present invention relates to field of communication technology, in particular to a kind of structure for recording machine of tearing open tears machine testing method and printing open Circuit board (Printed Circuit board, abbreviation PCB).

Background technique

The electronic products such as mobile phone, tablet computer need to carry out a series of test after production and assembly are at complete machine, to guarantee The quality of electronic product.It takes the mobile phone as an example, needs successively to carry out burn-in test, audio automatic test after being assembled into complete machine (AT), antenna measurement (MT), power consumption test (PT), cell-phone function test (MMI), write-in IMEI number (CW), factory reset (MC) etc. test items, the mobile phone that all test items such as all pass through and examine appearance not collide with, is dirty at the failures can just wrap Take on factory.Above test item is that sequence carries out, when mobile phone has passed through the test of a certain project, even if subsequent torn open The operations such as machine maintenance will not retest the test item passed through again.

Inventors have found that possibly can not to detect that electronic product is torn open new caused by machine maintenance for such sequential testing process Failure.Such as a certain mobile phone finds failure when proceeding to test item rearward, carries out mobile phone for this failure and tears machine dimension open Forward test item failure may be introduced for mobile phone during repairing, passed through before no longer being retested due to mobile phone Forward test item, so that failure caused by tearing machine maintenance newly open as mobile phone can not be detected accurately.For example, if certain proficiency Machine finds antenna failure when carrying out antenna measurement, carries out tearing machine maintenance open to mobile phone, may cause mobile phone when ressembling mobile phone Audio failure, such as: loudspeaker deviation, foam be damaged and the failures such as foreign matters enter loudspeaker, loudspeaker falls off such as release paper, But although the mobile phone after maintenance introduces audio failure, since mobile phone has passed through audio automatic test, the mobile phone after maintenance Audio automatic test will not be carried out again, but re-starts antenna measurement and test item later, after repairing in this way Mobile phone will be unable to detect this audio failure, and the packaging of failure machine is caused to dispatch from the factory.

Summary of the invention

Provided in the embodiment of the present invention it is a kind of record tear open machine structure, tear machine testing method and processor open, be able to record And detect that the machine of tearing open of electronic product operates, and then can apply it in the system test of electronic product, it solves electronics and produces The sequential testing process of product possibly can not detect the problem of electronic product tears new failure caused by machine maintenance open.

In order to solve the above-mentioned technical problem, the embodiment of the invention discloses following technical solutions:

In a first aspect, providing a kind of structure for recording electronic product and tearing machine open, comprising:

The M universal input output GPIO of central processor CPU distinguishes cabling to the surface layer of printing board PCB, forms M A leakage copper, the corresponding leakage copper of every GPIO are broken as two parts, M >=2；The M GPIO passes through resistance respectively and connects power end；

Gating switch, for gating at least one of described leakage copper leakage copper when the gating switch is pressed, and, it is described The leakage copper that gating switch is adjacent to be gated when being pressed twice is different；The gating switch is assembled as bare machine in electronic product When be pressed, bounced when electronic product is split machine.

With reference to first aspect, in a first possible implementation of that first aspect, the M leakage copper ring shape is uniformly divided Cloth；

The gating switch is pressing rotary switch, and the pressing rotary switch includes pressing lever and rotation axis, described turn Moving axis bottom is provided with N number of sheet metal, and 1≤N≤M-1, each sheet metal is corresponding with a leakage position for copper, each described A leakage copper is connected in sheet metal；When the pressing lever is pressed, the rotation axis is driven to rotate, so that each sheet metal is led Next leakage copper of the logical current leakage copper on rotation axis direction of rotation, the current leakage copper are that the sheet metal is rotated in rotation axis The leakage copper of preceding conducting.

The first possible implementation with reference to first aspect, in a second possible implementation of that first aspect, institute Pressing rotary switch patch is stated on PCB, also, when electronic product is assembled as bare machine, the pressing lever be maintained at by Pressure condition, when electronic product is split machine, the pressing lever is bounced.

Second aspect, the embodiment of the present invention provide one kind and tear machine testing method open, comprising:

Read the voltage status of the M universal input output GPIO of central processor CPU；

The voltage status of M GPIO of reading is compared with the voltage status of the M GPIO of storage；Storage The voltage status of the M GPIO is the voltage status of the preceding M GPIO once read；

When comparison result is identical, determine that electronic product does not tear machine open；

When comparison result is different, determine that electronic product is split machine.

In conjunction with second aspect, in second aspect in the first possible implementation, further includes:

Use the voltage status for the M GPIO that the voltage status of this M GPIO read updates storage.

The third aspect, the embodiment of the present invention provide one kind and tear machine detecting device open, comprising:

Reading unit, the M universal input for reading central processor CPU export the voltage status of GPIO；

Comparing unit, the voltage status of the M GPIO for reading the reading unit and the M GPIO of storage Voltage status be compared；The voltage status of the M GPIO of storage is the voltage of the preceding M GPIO once read State；

As a result judging unit, for determining that electronic product does not tear machine open when the comparison result of the comparing unit is identical； When the comparison result of the comparing unit is different, determine that electronic product is split machine.

In conjunction with the third aspect, in the third aspect in the first possible implementation, further includes:

Updating unit is updated storage for this voltage status of the M GPIO read using the reading unit The M GPIO voltage status.

Fourth aspect, the embodiment of the present invention provides a kind of printing board PCB, including the above first aspect and its possibility are in fact Any record electronic product tears the structure of machine open in existing mode, wherein

The central processor CPU, for reading the voltage status of the M GPIO；By the voltage of M GPIO of reading State is compared with the voltage status of the M GPIO of storage；The voltage status of the M GPIO of storage is preceding primary The voltage status of the M GPIO read；When comparison result is identical, determine that electronic product does not tear machine open；Work as comparison result When being different, determine that electronic product is split machine.

In conjunction with fourth aspect, in fourth aspect in the first possible implementation, the CPU is also used to: using this The voltage status for the M GPIO that the voltage status of the M GPIO read updates storage.

5th aspect, the embodiment of the present invention provide a kind of whole-machine test method, comprising:

At least when executing a test item of system test, the M universal input output of central processor CPU is read The voltage status of GPIO；

When comparison result is different, determines that electronic product is split machine, return to first test item weight of system test System test newly is carried out to electronic product；

When comparison result is identical, continue one test item.

In conjunction with the 5th aspect, the 5th aspect the first possible implementation in, further includes:

6th aspect, the embodiment of the present invention provide a kind of system test device, comprising:

Reading unit, at least when executing a test item of system test, reading the M of central processor CPU The voltage status of a universal input output GPIO；

Test cell is returned for determining that electronic product is split machine when the comparison result of the comparing unit is different First test item of system test carries out system test to electronic product again；When comparison result be it is identical when, continue into The one test item of row.

In conjunction with the 6th aspect, the 6th aspect the first possible implementation in, further includes:

Updating unit, the M GPIO that the voltage status of the M GPIO for being read using this is updated storage Voltage status.

7th aspect, the embodiment of the present invention provides a kind of printing board PCB, including the above first aspect and its possibility are in fact Any record electronic product tears the structure of machine open in existing mode, wherein

The central processor CPU, at least when executing a test item of system test, reading M of CPU The voltage status of universal input output GPIO；By the voltage of the voltage status of M GPIO of reading and the M GPIO of storage State is compared；The voltage status of the M GPIO of storage is the voltage status of the preceding M GPIO once read； When comparison result is different, determines that electronic product is split machine, return to first test item of system test again to electronics Product carries out system test；When comparison result is identical, continue one test item.

In conjunction with the 7th aspect, the 7th aspect the first possible implementation in, the CPU is also used to:

In the embodiment of the present invention, it includes: the M GPIO difference cabling of CPU to PCB's that record electronic product, which tears the structure of machine open, Surface layer, forms M leakage copper, and the corresponding leakage copper of every GPIO is broken as two parts, M >=2；The M GPIO passes through resistance respectively Connect power end；Gating switch, for gating at least one of described leakage copper leakage copper when the gating switch is pressed, and, The leakage copper that the gating switch is adjacent to be gated when being pressed twice is different；The gating switch is assembled as in electronic product It is pressed when bare machine, is bounced when electronic product is split machine.When assembling again due to tearing machine open every time, gating switch is pressed, gating Switch is different from the machine assembling leakage copper of backgating is torn open before tearing machine open, to be produced by the leakage copper that gating switch gates to record electronics The whether split machine of product.

Detailed description of the invention

In order to illustrate the technical solution of the embodiments of the present invention more clearly, required use in being described below to embodiment Attached drawing be briefly described, it should be apparent that, for those of ordinary skills, in not making the creative labor property Under the premise of, it is also possible to obtain other drawings based on these drawings.

Fig. 1 is that the embodiment of the present invention leaks copper schematic diagram；

Fig. 2 is the connection relationship diagram between the GPIO and power end of CPU of the embodiment of the present invention；

Fig. 2A is pressing lever of embodiment of the present invention structural schematic diagram；

Fig. 2 B is rotation shaft structure of embodiment of the present invention schematic diagram；

Fig. 2 C is shell mechanism of embodiment of the present invention schematic diagram；

Fig. 2 D is that the embodiment of the present invention presses rotary switch overall structure diagram；

Fig. 2 E is that pressing lever of the embodiment of the present invention presses rotary switch structure schematic diagram when being pressed；

Fig. 3 A is a kind of schematic top plan view for leaking copper distribution；

Fig. 3 B is a kind of structural schematic diagram of rotation axis bottom plan view；

Fig. 3 C is second of structural schematic diagram of rotation axis bottom plan view；

Fig. 3 D is the third structural schematic diagram of rotation axis bottom plan view；

Fig. 4 is that the embodiment of the present invention tears machine testing method flow schematic diagram open；

Fig. 5 is that the embodiment of the present invention tears machine detecting device structural schematic diagram open；

Fig. 6 is whole-machine test method of embodiment of the present invention flow diagram；

Fig. 7 is system test of embodiment of the present invention apparatus structure schematic diagram.

Specific embodiment

Technical solution in embodiment in order to enable those skilled in the art to better understand the present invention, and make of the invention real The above objects, features, and advantages for applying example can be more obvious and easy to understand, with reference to the accompanying drawing to technical side in the embodiment of the present invention Case is described in further detail.

Firstly, illustrating that record electronic product of the embodiment of the present invention tears the structure of machine open, which includes:

M universal input of central processing unit (CPU, Central Processing Unit) exports (GPIO, General Purpose Input Output) cabling is to the surface layer of PCB respectively, forms M leakage copper, and the corresponding leakage copper of every GPIO is broken as Two parts, M >=2；The M GPIO passes through resistance respectively and connects power end；

Wherein, a leakage copper in the embodiment of the present invention refers to that a GPIO cabling to the surface layer of PCB, exposes the copper on surface layer Line part.The corresponding copper that leaks of every GPIO refers to the leakage copper that the GPIO cabling is formed to the surface layer of PCB.Every GPIO is corresponding Leakage copper be broken as two parts, refer to leakage copper two parts separate, be not connected to.

Wherein, the specific value of M can independently be set in practical applications, and the embodiment of the present invention is not intended to limit.

Wherein, each GPIO cabling to the leakage copper that the surface layer of PCB is formed may refer to shown in Fig. 1, which is broken as 1,2 Two parts have small distance between two parts, and the value embodiment of the present invention of this distance is not intended to limit, can be in reality It is independently set in, since leakage copper disconnects, so the cabling of GPIO namely being broken as two parts；The M GPIO and electricity of CPU Circuit connecting relation between source may refer to shown in Fig. 2, wherein and the cabling of M GPIO has the part of a disconnection, and M GPIO is separately connected the first end of resistance R, and the second end of resistance R connects power end VDD, A, B, C, D is shown in FIG. 2 Totally 4 GPIO.Under the connection relationship of Fig. 1, the cabling of M GPIO is disconnected, and the voltage of M GPIO is 0；If some The cabling of GPIO is switched on namely gating switch gates the corresponding leakage copper of the GPIO, and the two parts for leaking copper are switched on, the GPIO's Voltage high is VDD, and the voltage of the GPIO changes.

Optionally, the M leakage copper can be uniformly distributed in a ring on PCB, and at this moment, gating switch can be pressing rotation Turn on pass.Pressing rotary switch may include pressing lever and rotation axis, and rotation axis bottom is provided with N number of sheet metal, 1≤N≤M- 1, each sheet metal is corresponding with a leakage position for copper, and two parts of a leakage copper are connected in each sheet metal；Pressing lever is pressed When, rotation axis rotation is driven, so that next leakage copper of the current leakage copper of each sheet metal conducting on rotation axis direction of rotation, often The current leakage copper of a sheet metal is the leakage copper that the sheet metal is connected before rotation axis rotates.

Hereinafter, pressing rotary switch is illustrated by Fig. 2A~Fig. 2 E.

Pressing rotary switch includes: shell, pressing lever and rotation axis；Wherein, whether pressing lever control rotation axis rotates, outside The angle and direction that shell control rotation axis rotates each time；

A is that one kind of pressing lever can be able to achieve front view, the top and bottom perspective views of structure, the pressing lever 20 referring to fig. 2 Bottom for the cylindrical body of lower hollow, cylindrical body has well-regulated sawtooth 21, and the outer surface of cylindrical body, which is provided with, to be uniformly distributed Strip press press strip 22；

B is that one kind of rotation axis can be able to achieve front view, rearview, top view, bottom view and the right view of structure referring to fig. 2 Figure, the rotation axis 30 are the cylindrical body of lower hollow, and the outer surface of cylindrical body is provided with equally distributed close to the position of bottom The gib block 31 of strip, and the outer surface of cylindrical body is provided with a protrusion 32 close to the position of bottom, the bottom of protrusion 32 is set It is equipped with sheet metal 33, the sheet metal 33 is realized in the form of metal clips in Fig. 2 B.

C referring to fig. 2 is the top view of shell, the cross-sectional view on the direction B-B, and shell 40 is hollow "convex" shaped structure, The inner surface of the convex portion 41 of shell 40 is provided with the deep trouth 42 and shallow slot 43 being spaced apart from each other.40 bottom internal centre bit of shell It installs and is equipped with cylinder 44 (being not shown in Fig. 2 C), spring 45 (being not shown in Fig. 2 C) is cased on cylinder 44.

It is the structural relation figure of pressing lever 20, rotation axis 30,40 cooperating of shell referring to fig. 2 shown in D；Wherein, it rotates 30 sets of axis on cylinder 44 and spring 45,20 sets of pressing lever in rotation axis 30, pressing lever 20 by press strip 22 correspondence be embedded in In the deep trouth 42 of shell 40；The gib block 31 of rotation axis 30 is also corresponding in the deep trouth 42 or shallow slot 43 of shell 40.

Specifically, the gib block 31 of rotation axis 30 is embedded in the deep trouth 42 of shell 40 when pressing lever 20 is not pressed, due to The effect of spring, the top of gib block 31 resist pressing lever 20 by press strip 21, referring to fig. 2 shown in D；Pressing lever 20 is pressed When, pressing lever 20 pushes the gib block 31 of rotation axis 30 to exit from deep trouth by press strip 21, and rotation axis 30 is along shallow slot 43 Edge rotation, until gib block 31 reaches the position of next deep trouth 42, referring to shown in 2E, at this point, since pressing lever 20 is still located In the state that is pressed, therefore, although gib block 31 turns to the position of next deep trouth 42, and it is not embedded into deep trouth 42, directly It is not pressed to pressing lever 20, gib block 31 is just embedded in the deep trouth 42；And so on, realize the pressing and rotation of rotation axis.

Wherein, the quantity by press strip, gib block and deep trouth is usually identical, and the quantity decides the rotation of rotation axis Angle.For example, the quantity by press strip, gib block and deep trouth is 3, then rotation axis is each in schematic diagram shown in Fig. 2A~2F The angle of rotation is 120 degree；Alternatively, being for example 4 by the quantity of press strip, gib block and deep trouth, then rotation axis rotates every time Angle is 90 degree.In addition, it is identical with the quantity of the GPIO with leakage copper by the quantity of press strip, gib block and deep trouth, such as It is also 4 by the quantity of press strip, gib block and deep trouth when there is the GPIO quantity of leakage copper to be 4 in Fig. 2 and Fig. 3 A.

Wherein, M leakage copper can be uniformly distributed in a ring on PCB refers to: in M leakage copper between two neighboring leakage copper Angle is identical, and M leakage copper is identical at a distance from annular center point.

The position of N number of sheet metal of rotation axis bottom setting can be correspondingly arranged according to the position of leakage copper, position here Corresponding to refer to pressing rotary switch when certain is once pressed, the position that each sheet metal leaks copper with one is overlapped, so that golden Belong to two parts that piece connects the leakage copper, so that the leakage copper is connected.

As an example it is assumed that M is 4, referring to shown in Fig. 3 A, 4 GPIO, corresponding to 4 leakage copper A1, A2, A3, A4 can be in Cross distribution, and 4 leakage copper are identical at a distance from cross searching point.

Correspondingly, the value of N can be 1 or 2 or 3；

Referring to shown in Fig. 3 B, it is assumed that N value is 1, and the position of sheet metal B1 setting should be ensured that: in certain primary pressing, Sheet metal B1 should be overlapped with the position of some the leakage copper in leakage copper A1, A2, A3, A4；Shown in Fig. 3 B, sheet metal B1 setting with Leak the position that copper A1 is overlapped；

Referring to shown in Fig. 3 C, it is assumed that N value is 2, and the position of sheet metal B1, B2 setting should be ensured that: in some pressing When, sheet metal B1, B2 should be overlapped with the position of some the leakage copper in leakage copper A1, A2, A3, A4 respectively.For example, shown in Fig. 3 C, The position being overlapped with leakage copper A1 is arranged in sheet metal B1, and the position being overlapped with leakage copper A2 is arranged in sheet metal B2.In other realizations In mode, the position being overlapped with leakage copper A1 is arranged in sheet metal B1, and the position being overlapped with leakage copper A3 is arranged in sheet metal B2, namely Be to say: as long as each sheet metal, which is arranged in, leaks the position that copper is overlapped with one, the positional relationship between sheet metal is not limited.

Referring to shown in Fig. 3 D, it is assumed that N value is 3, and the position of sheet metal B1, B2, B3 setting should be ensured that: press at some When pressure, sheet metal B1, B2, B3 should be overlapped with the position of some the leakage copper in leakage copper A1, A2, A3, A4 respectively.For example, Fig. 3 D Shown, the position being overlapped with leakage copper A1 is arranged in sheet metal B1, and the position being overlapped with leakage copper A2, sheet metal is arranged in sheet metal B2 The position being overlapped with leakage copper A3 is arranged in B3.

When M value is other values, the value and setting position for leaking copper and sheet metal can refer to Fig. 3 A~Fig. 3 D Citing, which is not described herein again.

In addition, rotation axis rotation is driven when the pressing lever of pressing rotary switch is pressed, so that the conducting of each sheet metal is worked as Next leakage copper of the preceding leakage copper on rotation axis direction of rotation, the current leakage copper of each sheet metal are that the sheet metal turns in rotation axis The leakage copper be connected before dynamic.In one possible implementation, if leakage copper ring shape is uniformly distributed, pressing lever is pressed every time When, rotation axis can be driven to rotate 360/M degree according to some rotation direction.It is illustrated below.

Continue to use the citing of Fig. 3 A~Fig. 3 D, it is assumed that quantity and the position for leaking copper are as shown in Figure 3A, press rotary switch Pressing lever drives rotary shaft according to being rotated clockwise, then:

If N value is 1, when certain pressing lever for once pressing rotary switch is pressed, the sheet metal B1 under rotation axis connects Two parts of leakage copper A1 are connect, conducting leakage copper A1, when pressing lever is pressed next time, pressing lever should drive rotation axis to turn clockwise It is dynamic, so that sheet metal B1 is rotated to leakage copper A1 next leakage copper in the clockwise direction namely the leakage position copper A2, conducting Copper A2 is leaked, and so on.For angle, under the scene shown in Fig. 3 A, when pressing lever is pressed every time, rotation axis should be driven Rotate clockwise 360/4=90 degree angle.

The case where N value is 2,3 is similar, and which is not described herein again.

In one possible implementation, in order to enable pressing rotary switch quilt when electronic product is assembled as bare machine Pressing, is bounced when electronic product is split machine, and the pressing rotary switch can be with patch on PCB, also, works as electronic product quilt When being assembled into bare machine, pressing lever is maintained at pressing state, and when electronic product is split machine, pressing lever is bounced.For example, can be On the backboard of bare machine press rotary switch pressing lever corresponding position heat a raised points, so as to when electronic product be assembled into it is naked When machine, raised points can be pressed onto pressing lever, and pressing rotary switch is allowed to be maintained at the state being pressed.

In the present embodiment, when assembling again due to tearing machine open every time, gating switch is pressed, and gating switch is before tearing machine open and tears machine open The leakage copper for assembling backgating is different, to record the whether split machine of electronic product by the leakage copper of gating switch gating.

Voltage due to leaking the GPIO that copper is not gated on is 0, and the voltage for the GPIO being strobed is VDD, thus gating switch When the leakage copper difference of gating, the voltage status of GPIO is also inevitable different, is based on this, and CPU can pass through the voltage shape of reading GPIO State determines the leakage copper of gating switch gating, and then may be implemented to tear machine testing open.Machine is torn open based on above record electronic product Structure, machine testing method provided in an embodiment of the present invention of tearing open is shown in Figure 4, this method comprises:

Step 401: reading the voltage status of the M GPIO of CPU；

Step 402: the voltage status of the voltage status of M GPIO of reading and the M GPIO of storage is compared Compared with；The voltage status of the M GPIO of storage is the voltage status of the preceding M GPIO once read；

Step 403: when comparison result is identical, determining that electronic product does not tear machine open；

Step 404: when comparison result is different, determining that electronic product is split machine.

It optionally, can also include: to be updated using the voltage status of this M GPIO read after step 402 The voltage status of the M GPIO of storage.

Wherein, the executing subject of the method for the embodiment of the present invention can be CPU.Wherein, CPU triggering executes this method The opportunity embodiment of the present invention is not intended to limit, such as CPU can execute this method when powering on every time, can also be in certain specific shapes This method, etc. is executed under state.

In the present embodiment, the voltage status of the M GPIO of CPU is read, by the voltage status and storage of M GPIO of reading The voltage status of M GPIO be compared, the whether split machine of electronic product is determined according to comparison result, to realize electricity Sub- product tears machine testing open.

Based on above method, the embodiment of the present invention also provides one kind and tears machine detecting device open, shown in Figure 5, the device 500 Include:

Reading unit 510, the voltage status of the M GPIO for reading CPU；

Comparing unit 520, the voltage status of the M GPIO for reading the reading unit and the M of storage are a The voltage status of GPIO is compared；The voltage status of the M GPIO of storage is the preceding M GPIO once read Voltage status；

As a result judging unit 530, for determining that electronic product is not torn open when the comparison result of the comparing unit is identical Machine；When the comparison result of the comparing unit is different, determine that electronic product is split machine.

Optionally, which can also include:

Tear the structure of machine open based on above record electronic product, the embodiment of the present invention also provides a kind of whole-machine test method, It is shown in Figure 6, this method comprises:

Step 601: at least when executing a test item of system test, reading the voltage shape of the M GPIO of CPU State；

Step 602: the voltage status of the voltage status of M GPIO of reading and the M GPIO of storage is compared Compared with；The voltage status of the M GPIO of storage is the voltage status of the preceding M GPIO once read；

Step 603: when comparison result is different, determining that electronic product is split machine, return to first survey of system test Examination project carries out system test to electronic product again；

Step 604: when comparison result is identical, continuing the test of one test item.

Optionally, can also include: after step 602

Wherein it is possible to carry out tearing machine testing open when executing each test item of system test, certain can also executed It carries out tearing machine testing open when the test item of one or certain several system test, it is preferable that only can execute system test most It carries out tearing machine testing open when the latter test item.

It in the present embodiment, at least carries out tearing machine testing open when executing a test item of system test, determines that electronics produces Product are split machine, and first test item for returning to system test carries out system test to electronic product again, to produce in electronics Product are capable of detecting when the new failure when tearing new failure caused by machine maintenance open, reduce the failure rate of electronic product.

It corresponding to the above method, the embodiment of the present invention also provides a kind of system test device, and it is shown in Figure 7, it should Device 700 includes:

Reading unit 710, at least when executing a test item of system test, reading the M GPIO's of CPU Voltage status；

Comparing unit 720, the voltage status of the M GPIO for reading the reading unit and the M of storage are a The voltage status of GPIO is compared；The voltage status of the M GPIO of storage is the preceding M GPIO once read Voltage status；

Test cell 730, for determining that electronic product is split machine when the comparison result of the comparing unit is different, First test item for returning to system test carries out system test to electronic product again；When comparison result is identical, after It is continuous to carry out one test item.

Optionally, which can also include:

The embodiment of the present invention also provides a kind of PCB, tears the structure of machine open including the record electronic product, wherein

The CPU, for reading the voltage status of the M GPIO；By the voltage status and storage of M GPIO of reading The voltage status of the M GPIO be compared；Storage the M GPIO voltage status be it is preceding once read it is described The voltage status of M GPIO；When comparison result is identical, determine that electronic product does not tear machine open；When comparison result is different, really Determine electronic product and is split machine.

Optionally, the CPU can be also used for: be updated storage using the voltage status of this M GPIO read The M GPIO voltage status.

In the present embodiment, when assembling again due to tearing machine open every time, gating switch is pressed, and gating switch is before tearing machine open and tears machine open The leakage copper for assembling backgating is different, to record the whether split machine of electronic product by the leakage copper of gating switch gating；In turn, In the present embodiment, the voltage status of the M GPIO of CPU is read, by the voltage status of M GPIO of reading and the M of storage The voltage status of GPIO is compared, and the whether split machine of electronic product is determined according to comparison result, to realize electronics production Product tear machine testing open.

The CPU, at least when executing a test item of system test, reading the voltage of the M GPIO of CPU State；The voltage status of M GPIO of reading is compared with the voltage status of the M GPIO of storage；The institute of storage The voltage status for stating M GPIO is the voltage status of the preceding M GPIO once read；When comparison result is different, really Determine electronic product and be split machine, first test item for returning to system test carries out system test to electronic product again；When than When relatively result is identical, continue one test item.

Optionally, the CPU can be also used for:

In the present embodiment, when assembling again due to tearing machine open every time, gating switch is pressed, and gating switch is before tearing machine open and tears machine open The leakage copper for assembling backgating is different, to record the whether split machine of electronic product by the leakage copper of gating switch gating；In turn, In the present embodiment, at least carries out tearing machine testing open when executing a test item of system test, determines that electronic product is split machine, First test item for returning to system test carries out system test to electronic product again, to tear machine maintenance open in electronic product Caused by new failure when be capable of detecting when the new failure, reduce the failure rate of electronic product.

The client after sale that the embodiment of the present invention can be applied to the terminals such as mobile phone moves back machine and guarantee etc., detects the terminal of client Whether had and tear machine operation open, client voluntarily tears machine open and not moves back machine and guarantee；It can also be applied to the system test stage of production line, Whether detection system test stage each step tears machine maintenance operation open, to having the terminal for tearing machine operation open from the system test first step Suddenly it is tested.

It is required that those skilled in the art can be understood that the technology in the embodiment of the present invention can add by software The mode of general hardware platform realize.Based on this understanding, the technical solution in the embodiment of the present invention substantially or Say that the part that contributes to existing technology can be embodied in the form of software electrical product, which produces Product can store in storage medium, such as ROM/RAM, magnetic disk, CD, including some instructions are with so that a computer is set Standby (can be personal computer, server or the network equipment etc.) executes certain of each embodiment of the present invention or embodiment Method described in a little parts.

All the embodiments in this specification are described in a progressive manner, same and similar portion between each embodiment Dividing may refer to each other, and each embodiment focuses on the differences from other embodiments.Especially for system reality For applying example, since it is substantially similar to the method embodiment, so being described relatively simple, related place is referring to embodiment of the method Part explanation.

The embodiments of the present invention described above are not intended to limit the scope of the present invention.It is any in the present invention Spirit and principle within made modifications, equivalent substitutions and improvements etc., should all be included in the protection scope of the present invention.

Claims

1. the structure that a kind of record electronic product tears machine open characterized by comprising

The M universal input output GPIO of central processor CPU distinguishes cabling to the surface layer of printing board PCB, forms M leakage Copper, the corresponding leakage copper of every GPIO are broken as two parts, M >=2；The M GPIO passes through resistance respectively and connects power end；

Gating switch, for gating at least one of described leakage copper leakage copper when the gating switch is pressed, and, the gating It is different to switch the adjacent leakage copper gated when being pressed twice；Gating switch quilt when electronic product is assembled as bare machine Pressing, is bounced when electronic product is split machine.

2. structure according to claim 1, which is characterized in that the M leakage copper ring shape is uniformly distributed；

The gating switch is pressing rotary switch, and the pressing rotary switch includes pressing lever and rotation axis, the rotation axis Bottom is provided with N number of sheet metal, and 1≤N≤M-1, each sheet metal is corresponding with a leakage position for copper, each metal A leakage copper is connected in piece；When the pressing lever is pressed, the rotation axis is driven to rotate, so that each sheet metal conducting is worked as Next leakage copper of the preceding leakage copper on rotation axis direction of rotation, the current leakage copper are that the sheet metal is leading in rotation axis rotation Logical leakage copper.

3. structure according to claim 2, which is characterized in that the pressing rotary switch patch is worked as on PCB When electronic product is assembled as bare machine, the pressing lever is maintained at pressing state, when electronic product is split machine, the pressing Bar bounces.

4. one kind tears machine testing method open characterized by comprising

Read the voltage status of the M universal input output GPIO of central processor CPU, M >=2；

The voltage status of M GPIO of reading is compared with the voltage status of the M GPIO of storage；What is stored is described The voltage status of M GPIO is the voltage status of the preceding M GPIO once read；

5. according to the method described in claim 4, it is characterized by further comprising:

6. one kind tears machine detecting device open characterized by comprising

Reading unit, the M universal input for reading central processor CPU export the voltage status of GPIO, M >=2；

Comparing unit, the electricity of the M GPIO of the voltage status and storage of the M GPIO for reading the reading unit Pressure condition is compared；The voltage status of the M GPIO of storage is the voltage shape of the preceding M GPIO once read State；

As a result judging unit, for determining that electronic product does not tear machine open when the comparison result of the comparing unit is identical；Work as institute State comparing unit comparison result be it is different when, determine that electronic product is split machine.

7. device according to claim 6, which is characterized in that further include:

Updating unit, for the institute that updates storage of voltage status using this M GPIO read of the reading unit State the voltage status of M GPIO.

8. a kind of printing board PCB, which is characterized in that torn open including the described in any item record electronic products of Claims 1-4 The structure of machine, wherein

The central processor CPU, for reading the voltage status of the M GPIO, M >=2；By the electricity of M GPIO of reading Pressure condition is compared with the voltage status of the M GPIO of storage；The voltage status of the M GPIO of storage is previous The voltage status of the M GPIO of secondary reading；When comparison result is identical, determine that electronic product does not tear machine open；It is tied when comparing When fruit is different, determine that electronic product is split machine.

9. PCB according to claim 8, which is characterized in that the CPU is also used to: the M read using this The voltage status for the M GPIO that the voltage status of GPIO updates storage.

10. a kind of whole-machine test method characterized by comprising

At least when executing a test item of system test, the M universal input output GPIO of central processor CPU is read Voltage status, M >=2；

When comparison result is different, determine that electronic product is split machine, first test item for returning to system test is again right Electronic product carries out system test；

When comparison result is identical, continue one test item.

11. according to the method described in claim 10, it is characterized by further comprising:

12. a kind of system test device characterized by comprising

Reading unit, M at least when executing a test item of system test, reading central processor CPU are logical With the voltage status of input and output GPIO, M >=2；

Test cell, for determining that electronic product is split machine, returning to complete machine when the comparison result of the comparing unit is different First test item of test carries out system test to electronic product again；When comparison result is identical, continue institute State a test item.

13. device according to claim 12, which is characterized in that further include:

Updating unit, the electricity for the M GPIO that the voltage status of the M GPIO for being read using this is updated storage Pressure condition.

14. a kind of printing board PCB, which is characterized in that including the described in any item record electronic products of Claims 1-4 Tear the structure of machine open, wherein

The central processor CPU, M at least when executing a test item of system test, reading CPU are general The voltage status of input and output GPIO, M >=2；By the electricity of the voltage status of M GPIO of reading and the M GPIO of storage Pressure condition is compared；The voltage status of the M GPIO of storage is the voltage shape of the preceding M GPIO once read State；When comparison result is different, determines that electronic product is split machine, return to first test item of system test again to electricity Sub- product carries out system test；When comparison result is identical, continue one test item.

15. PCB according to claim 14, which is characterized in that the CPU is also used to: