CN109406922B - Electronic product and testing method and device thereof - Google Patents
Electronic product and testing method and device thereof Download PDFInfo
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- CN109406922B CN109406922B CN201710697046.7A CN201710697046A CN109406922B CN 109406922 B CN109406922 B CN 109406922B CN 201710697046 A CN201710697046 A CN 201710697046A CN 109406922 B CN109406922 B CN 109406922B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
Abstract
The invention relates to an electronic product and a test method and a test device thereof, wherein the electronic product comprises a product body and an identification device arranged on the product body; the identification means comprises: an identification port at least for receiving a test complete instruction; the identification circuit is electrically connected with the identification port; the identification circuit comprises an initial state and a test completion state; the identification circuit has different circuit states in an initial state and a test completion state; the identification circuit is used for switching from the initial state to the test completion state when the test completion instruction is received. Above-mentioned electronic product is provided with identification means on the product body and can improves efficiency of software testing and can improve the yields of product.
Description
Technical Field
The invention relates to the technical field of product testing, in particular to an electronic product and a testing method and device thereof.
Background
In the production process of electronic products such as OLED (Organic Light-Emitting Diode), point defects, row defects, column defects or other defects due to particles (particles) may occur. Therefore, it is necessary to test the electronic products by a test method such as aging test, and to screen and repair the defective products. The conventional product testing method cannot mark the electronic product, so that after the untested product and the tested product are mixed, all the products must be tested again, which causes serious reduction of the working efficiency.
Disclosure of Invention
In view of the above, there is a need for an electronic product, a testing method and a testing apparatus thereof, which can improve testing efficiency.
An electronic product comprises a product body and an identification device arranged on the product body; the identification means comprises:
an identification port at least for receiving a test complete instruction; and
the identification circuit is electrically connected with the identification port; the identification circuit comprises an initial state and a test completion state; the identification circuit has different circuit states in an initial state and a test completion state; the identification circuit is used for switching from the initial state to the test completion state when the test completion instruction is received.
The electronic product is provided with the identification device on the product body. The identification device includes an identification port and an identification circuit. The identification circuit is switched from the initial state to the test completion state when the identification port receives the test completion instruction. Because the identification circuit has different circuit states in the initial state and the test completion state, whether the electronic product completes the test or not can be judged by detecting the state of the identification circuit, so that the problem of repeated test on the same electronic product can be avoided, and the test efficiency can be improved.
In one embodiment, the identification circuit comprises a switching circuit; the switch circuit is in a closed state when the identification circuit is in the initial state; the switch circuit is in an off state when the identification circuit is in the test completion state.
In one embodiment, the identification circuit is arranged on a circuit board of a component to be tested of the product body; the identification circuit comprises a power circuit, a grounding circuit and an identification circuit which are arranged on the circuit board; the identification circuit is connected between the power supply circuit and the grounding circuit, is in a connected state when the identification circuit is in the initial state, and is in a disconnected state when the identification circuit is in the test completion state;
preferably, the maximum allowable current of the identification line is smaller than the maximum allowable currents of the power supply line and the ground line; the test completion instruction is a level signal and is used for fusing the identification circuit when being output to the identification circuit.
In one embodiment, the identification line has a resistance greater than the resistances of the ground line and the power line;
preferably, the identification line has a width smaller than the widths of the ground line and the power line, and the identification line has the same thickness as the ground line and the power line.
In one embodiment, the identification circuit has a width less than or equal to 0.085 mm.
In one embodiment, the identification port is further configured to receive a detection instruction; the detection instruction is used for detecting the current circuit state of the identification circuit.
A method for testing an electronic product according to any one of the preceding embodiments, comprising:
testing the electronic product; and
and generating a test completion instruction when the test is completed and outputting the test completion instruction to the identification port.
In one embodiment, the method further comprises the following steps:
detecting the identification circuit and outputting a detection result;
determining the current state of the identification circuit according to the detection result;
when the identification circuit is in an initial state, identifying the electronic product as a product to be tested, testing the product to be tested, and generating a test completion instruction to be output to the identification port when the test is completed;
and when the identification circuit is in a test completion state, identifying the electronic product as a tested product.
A testing apparatus for an electronic product according to any one of the preceding embodiments, comprising processing circuitry and testing circuitry; the processing circuit is used for controlling the test circuit to test the electronic product, and generating a test completion instruction to be output to the identification port when the test is completed.
In one embodiment, the device further comprises a detection circuit;
the detection circuit is used for detecting the identification circuit and outputting a detection result;
the processing circuit is connected with the detection circuit and used for determining the current state of the identification circuit according to the detection result; the processing circuit is further used for identifying the electronic product as a product to be tested when the identification circuit is in an initial state, controlling the test circuit to test the product to be tested, and generating a test completion instruction to output to the identification port when the test is completed; the processing circuit is further used for identifying the electronic product as a tested product when the identification circuit is in a test completion state.
Drawings
Fig. 1 is a schematic structural diagram of an electronic product in an embodiment;
FIG. 2 is a schematic diagram of an embodiment of an identification circuit;
FIG. 3 is a flow chart of a method for testing an electronic product according to an embodiment;
FIG. 4 is a flowchart of a method for testing an electronic product according to another embodiment;
FIG. 5 is a schematic diagram of an embodiment of an apparatus for testing an electronic product;
FIG. 6 is a circuit diagram of an apparatus for testing an electronic product according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Referring to fig. 1, the electronic product in the embodiment includes a product body 110 and an identification device 120 disposed on the product body 110. The product body 110 may be any electronic product that needs to be subjected to a performance test, such as a mobile phone, a tablet, a digital camera, an earphone, a sound box, a television, and other terminal electronic devices. The product body 110 may also be a local component device on the terminal electronic device, such as a display screen, a driving circuit, and the like.
The identification device 120 includes an identification port 122 and an identification circuit 124. The identification port 122 is electrically connected to the identification circuit 124, as shown in FIG. 1. It should be understood that the location of the identification device 120, the identification port 122, and the identification circuit 124 on the product body 110 is illustrative.
The identification port 122 is at least for receiving a test complete instruction. The test completion instruction is issued by the test apparatus. Specifically, the testing device is used for performing performance testing on the product body 110, such as performing burn-in testing on the display screen. When the testing device completes the corresponding test on the product body 110, the test completion instruction is generated to the identification port 122.
The identification circuit 124 includes two states, an initial state and a test complete state. The initial state is the state of the identification circuit 124 after it is prepared. The identification circuit 124 has different circuit states in the initial state and the test complete state. The circuit state may be a connection state of the circuit or a disconnection state of the circuit, or both may be included. For example, in one embodiment, identification circuit 124 may be in a connected state in an initial state and in a disconnected state when the test is complete. In other embodiments, the identification circuit 124 may be formed of a plurality of status cells, each having connected and disconnected states. The identification circuit 124 is illustrated as having two status cells. The first state unit can be connected and the second state unit can be disconnected when the identification circuit 124 is in the initial state, and the first state unit can be disconnected and the second state unit can be connected when the identification circuit 124 is in the test completion state. In another embodiment, the identification circuit 124 may be configured to have both the first state cell and the second state cell in the off state when the test is complete. It is understood that the circuit state of the identification circuit 124 may vary with the circuit configuration, and is not limited to the above-described embodiment.
The identification circuit 124 is configured to switch from the initial state to the test complete state when receiving the test complete command.
The electronic product is provided with an identification device 120 on the product body 110. The identification device 120 includes an identification port 122 and an identification circuit 124. Identification circuit 124 switches from the initial state to the test complete state when identification port 122 receives a test complete instruction. Because the identification circuit 124 has different circuit states in the initial state and the test completion state, whether the electronic product completes the test can be judged by detecting the state of the identification circuit 124, so that the problem of repeated tests on the same electronic product can be avoided, and the test efficiency can be improved. In addition, the state switching of the identification circuit 124 is controlled by the testing device, manual participation is not needed, the testing efficiency can be improved, and the occurrence of manual misoperation can be effectively avoided.
In one embodiment, the identification circuit 124 may include a switching circuit. The switch circuit is in a closed state when the identification circuit 124 is in the initial state and in an open state when the identification circuit 124 is in the test complete state. Therefore, the state recognition of the identification circuit 124 can be achieved by detecting the on-off state of the switch unit.
In one embodiment, the structure of the identification circuit 124 is shown in FIG. 2. The identification circuit 124 is disposed on a circuit board of the part to be tested of the product body 110. The identification circuit 124 includes a power supply line VCC, a ground line GND, and an identification line 200 provided on a circuit board. The power supply line VCC and the ground line GND are both used for being connected with a testing device. The identification line 200 is connected between the power supply line VCC and the ground line GND. When the identification circuit 124 is in the initial state, the identification circuit 200 is in the connected state, and when the identification circuit 124 is in the test completion state, the identification circuit 200 is in the disconnected state.
In one embodiment, the maximum allowable current of the identification line 200 is less than the maximum allowable current of the power supply line VCC and the ground line GND. At this time, the test completion instruction is a level signal for supplying a current having a current value larger than the maximum allowable current of the identification circuit 200 and smaller than the maximum allowable current of the power supply line VCC and the ground line GND when being output to the identification circuit 124, thereby blowing the identification circuit 200. Therefore, in the present embodiment, when the identification circuit 124 is in the initial state, the identification line 200 is in the connection state; when the identification circuit 124 is in the test complete state, the identification line 200 is in the blown state. The state of the identification circuit 124 can be determined by identifying the state of the identification line 200. The identification circuit 124 can be detected by a microscope to determine whether it is blown or not, so as to determine the current state of the identification circuit 124 and further determine whether the electronic product has completed the testing process. In one embodiment, the status of the pins of the processing device electrically connected to the identification port 122 may also be used to determine whether the product has been tested. For example, when the corresponding pin is detected to be in the Floating state (Floating state), it is confirmed that the identification circuit 124 is in the test completion state.
In one embodiment, the line width of the identification line 200 is smaller than the minimum line width of the power line VCC and the ground line GND, as shown in fig. 2. The identification line 200 has the same thickness as the power supply line VCC and the ground line GND. Optionally, the line width of the identification line 200 is less than or equal to 0.085 mm. The wider the line width of the identification line 200, the more the fusing current is required to be, the less fusing is easy, so that the power consumption of the test apparatus may increase, thereby inconveniently reducing the power consumption in the test process. In one embodiment, the line width of the identification line 200 is 0.005 mm. In another embodiment, the line width of the identification wire 200 is 0.007 mm. Alternatively, the line width of the identification line 200 may also be 0.012mm or 0.060 mm. In one embodiment, the identification circuit 200, the power circuit VCC, and the ground circuit GND are made of the same conductive material, such as graphene, ITO, aluminum, or copper.
In one embodiment, the identification port 122 is also used to receive detection instructions. The detection instruction may be issued by a detection circuit for detecting the circuit state of the identification circuit 124. The detection instruction can detect the current circuit state of the identification circuit 124, for example, determine whether it is in a connected state or a disconnected state, that is, determine whether the electronic product completes the test.
An embodiment of the present invention further provides a method for testing an electronic product, which can be used for testing the electronic product in any of the foregoing embodiments. The flow chart of the test method is shown in fig. 3, and comprises the following steps:
step S310, testing the electronic product.
According to the test requirements of the electronic products, corresponding performance tests are carried out on the electronic products, such as aging tests on display screens and the like.
Step S320, generating a test completion instruction when the test is completed, and outputting the test completion instruction to the identification port of the electronic device.
Compared with the traditional test process, the test method needs to generate a test completion instruction to the identification port after the test is completed, so that the identification circuit is controlled to switch the state.
According to the testing method, the state of the identification circuit in the identification device on the electronic product can be switched and controlled while the product test is completed, so that the circuit state of the identification circuit on the tested electronic product is different from the circuit state of the identification circuit on the untested electronic product, and whether the electronic product completes the test process can be well distinguished, so that the problem of repeated test on the same electronic product can be solved, the testing efficiency can be improved, and the yield of the product can be improved.
In an embodiment, the testing method further includes the following steps, as shown in fig. 4.
Step S410, detects the identification circuit and outputs the detection result.
In the process of detecting the identification circuit, the circuit state of the identification circuit can be observed by a microscope or the like or detected by the state of a pin of equipment electrically connected with the identification circuit. When testing is performed through the state of the pins of the equipment electrically connected with the identification circuit, the corresponding test circuit sends a detection instruction to the identification port. I.e. the identification port may also be used to receive the detection instruction. The detection instruction is used for detecting the circuit state of the identification circuit and acquiring a corresponding detection result.
Step S420, determining the current state of the identification circuit according to the detection result.
In one embodiment, reference circuit state values that identify the circuit in an initial state and a test complete state may be pre-stored. Thus, the detection result may be compared to a corresponding reference circuit state value to determine the state in which the identification circuit is. When the identification circuit is in the initial state, performing step S430 and step S440; when the identification circuit is in the test completion state, step S450 is performed.
And step S430, identifying the electronic product as a product to be tested.
Step S440, testing the product to be tested, and generating a test completion instruction and outputting the test completion instruction to the identification port of the electronic device when the test is completed.
Step S450, the electronic product is identified as the tested product.
By the test method, whether the product is tested or not can be identified, so that only the product to be tested, namely the untested product, is tested, the problem of repeated testing on the same electronic product is solved, the test efficiency can be improved, and the yield of the product can be improved.
An embodiment of the present invention further provides a testing apparatus for an electronic product, which can be used to test the electronic product in any of the foregoing embodiments. The test apparatus is shown in fig. 5, and includes a test circuit 510 and a processing circuit 520. The processing circuit 520 is configured to control the test circuit 510 to test the electronic product, and generate a test completion instruction to output to the identification port of the electronic product when the test is completed.
In one embodiment, the testing apparatus further includes a detection circuit 530, as shown in fig. 5. The detection circuit 530 is used for detecting the identification circuit and outputting a detection result. In one embodiment, the detection circuit 530 may be a circuit structure including a microscope. Therefore, the circuit state of the identification circuit is detected by the microscope and the detection result is output. In other embodiments, the detection circuit 530 may also send a detection instruction to the identification port. The detection instruction is used for detecting the circuit state of the identification circuit. The processing circuit 520 is connected to the detection circuit 530 for determining the current status of the identification circuit according to the detection result. The processing circuit 520 is further configured to identify the electronic product as a product to be tested when the identification circuit is in the initial state, control the test circuit 510 to test the product to be tested, and generate a test completion instruction to output to the identification port of the electronic device when the test is completed. The processing circuit 520 is further configured to identify the electronic product as a tested product when the identification circuit is in a test complete state. In one embodiment, the detection circuit 530 may also be integrated within the processing circuit 520.
FIG. 6 is a block diagram of a test apparatus in an embodiment. In this embodiment, the electronic product is a display screen. The identification circuit employs the circuit shown in fig. 2. The detection circuit is integrated on the processing circuit 600. In this embodiment, the processing circuit 600 includes a microprocessor MCU and its peripheral circuits (including power supplies). A GPIO and ground pin on the processing circuit 600 are connected to VCC and GND in the identification circuit on the display screen through the flexible circuit board FPC. Before aging, GPIO _ A is identified through program setting, if the level is low, the product is not aged, and then an aging program is entered to age the product. And after the aging is finished, the GPIO _ A is pulled high, and the identification circuit is blown. If the GPIO _ A is detected to be in the Floating state, the identification circuit is blown, and the product is aged.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. An electronic product comprises a product body and is characterized by also comprising an identification device arranged on the product body; the identification means comprises:
an identification port at least for receiving a test complete instruction; the identification circuit is electrically connected with the identification port; the identification circuit comprises an initial state and a test completion state; the identification circuit has different circuit states in an initial state and a test completion state; the identification circuit is used for switching from the initial state to the test completion state when the test completion instruction is received;
the identification circuit comprises a power circuit, a grounding circuit and an identification circuit which are arranged on the circuit board; the identification circuit is connected between the power supply circuit and the grounding circuit, is in a connected state when the identification circuit is in the initial state, and is in a disconnected state when the identification circuit is in the test completion state; the maximum allowable current of the identification line is smaller than the maximum allowable currents of the power supply line and the grounding line; the test completion instruction is a level signal and is used for fusing the identification circuit when being output to the identification circuit.
2. The electronic product of claim 1, wherein the identification circuit comprises a switching circuit; the switch circuit is in a closed state when the identification circuit is in the initial state; the switch circuit is in an off state when the identification circuit is in the test completion state.
3. The electronic product according to claim 1, wherein the identification circuit is provided on a circuit board of a component to be tested of the product body.
4. The electronic product according to claim 1, wherein the identification line has a resistance greater than resistances of the ground line and the power supply line; the identification line has a width smaller than the width of the ground line and the width of the power line, and has the same thickness as the ground line and the power line.
5. The electronic product of claim 4, wherein the identification circuit has a width less than or equal to 0.085 mm.
6. The electronic product of claim 1, wherein the identification port is further configured to receive a detection instruction; the detection instruction is used for detecting the current circuit state of the identification circuit.
7. A method for testing an electronic product according to any one of claims 1 to 6, comprising:
testing the electronic product; and
and generating a test completion instruction when the test is completed and outputting the test completion instruction to the identification port.
8. The method of claim 7, further comprising:
detecting the identification circuit and outputting a detection result;
determining the current state of the identification circuit according to the detection result;
when the identification circuit is in an initial state, identifying the electronic product as a product to be tested, testing the product to be tested, and generating a test completion instruction to be output to the identification port when the test is completed;
and when the identification circuit is in a test completion state, identifying the electronic product as a tested product.
9. A test device for an electronic product according to any one of claims 1 to 6, comprising a processing circuit and a test circuit; the processing circuit is used for controlling the test circuit to test the electronic product, and generating a test completion instruction to be output to the identification port when the test is completed.
10. The test device of claim 9, further comprising a detection circuit;
the detection circuit is used for detecting the identification circuit and outputting a detection result;
the processing circuit is connected with the detection circuit and used for determining the current state of the identification circuit according to the detection result; the processing circuit is further used for identifying the electronic product as a product to be tested when the identification circuit is in an initial state, controlling the test circuit to test the product to be tested, and generating a test completion instruction to output to the identification port when the test is completed; the processing circuit is further used for identifying the electronic product as a tested product when the identification circuit is in a test completion state.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710697046.7A CN109406922B (en) | 2017-08-15 | 2017-08-15 | Electronic product and testing method and device thereof |
| PCT/CN2018/085170 WO2019033793A1 (en) | 2017-08-15 | 2018-04-28 | Electronic product, and testing method and device therefor |
| TW107114654A TWI702541B (en) | 2017-08-15 | 2018-04-30 | Electronic product and its testing method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201710697046.7A CN109406922B (en) | 2017-08-15 | 2017-08-15 | Electronic product and testing method and device thereof |
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| CN109406922A CN109406922A (en) | 2019-03-01 |
| CN109406922B true CN109406922B (en) | 2020-09-22 |
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| CN (1) | CN109406922B (en) |
| TW (1) | TWI702541B (en) |
| WO (1) | WO2019033793A1 (en) |
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| CN110169597A (en) * | 2019-05-14 | 2019-08-27 | 筑思有限公司 | Electronic cigarette and its smoking set |
| CN112133072B (en) * | 2020-09-23 | 2021-07-06 | 中国兵器工业集团第二一四研究所苏州研发中心 | Test system and test method for LoRa wireless data acquisition device |
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| CN101149411A (en) * | 2006-09-22 | 2008-03-26 | 深圳富泰宏精密工业有限公司 | Portable electronic device test system and method |
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- 2018-04-30 TW TW107114654A patent/TWI702541B/en active
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Also Published As
| Publication number | Publication date |
|---|---|
| CN109406922A (en) | 2019-03-01 |
| WO2019033793A1 (en) | 2019-02-21 |
| TW201828159A (en) | 2018-08-01 |
| TWI702541B (en) | 2020-08-21 |
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Address after: 215300, 188, Feng Feng Road, Kunshan hi tech Zone, Suzhou, Jiangsu, Kunshan Patentee after: Suzhou Qingyue Photoelectric Technology Co., Ltd Address before: 215300, 188, Feng Feng Road, Kunshan hi tech Zone, Suzhou, Jiangsu, Kunshan Patentee before: Kunshan Visionox Technology Co.,Ltd. |
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