CN105588957A - Test seat - Google Patents
Test seat Download PDFInfo
- Publication number
- CN105588957A CN105588957A CN201410635334.6A CN201410635334A CN105588957A CN 105588957 A CN105588957 A CN 105588957A CN 201410635334 A CN201410635334 A CN 201410635334A CN 105588957 A CN105588957 A CN 105588957A
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- China
- Prior art keywords
- test
- plate body
- conduction plate
- test bench
- insulating barrier
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Abstract
The invention relates to a test seat. The test seat comprises a seat body, a supporting seat, a conductive plate body, test probes and insulation layers, wherein the supporting seat is arranged on the seat body for supporting a tested object, the conductive plate body is placed on the seat body and is disposed above the supporting seat for moving relative to the seat body so as to be close to or far away from the supporting seat, the test probes are arranged on the conductive plate body in a penetrating manner, the test probes extend out of one lower surface of the conductive plate body for contact with electrical contacts when the conductive plate body is close to the supporting seat, and the insulation layers are arranged on the test probes or the conductive plate body for separating the test probes and the conductive plate body. Therefore, the test seat can prevent the tested object from damage due to electrostatic discharge and can improve the problem of decreased test accuracy.
Description
Technical field
The present invention is about a kind of test bench, especially about the test in order to test with the object of electrical contactSeat.
Background technology
Along with scientific and technological development, universalness is to individual user for electronic installation, and common electronic installation comprisesDesktop computer, notebook computer, intelligent mobile phone and panel computer etc., wherein, those electronic installationsIn all include at least one circuit board, and on circuit board, at least one electronic component can be set, those electronic componentsCan carry out specific function, and jointly operate by those electronic components, make electronic installation be able to be driven andRunning. Wherein, on circuit board, include multiple conductive junction points, to be electrically connected at those electronic components.
For electronic installation manufacturer, electronic installation must be through test so that guarantee can in manufacture processNormal work. And the test of electronic installation comprises the test of the circuit board to electronic installation and to having manufacturedElectronic installation carry out the test of integrality, be for fear of installing in group of electronic devices to the test of circuit boardAfter becoming, find that circuit board defectiveness exists, must dismantle that electronic installation wastes in man-hour that debug causesDisappearance.
Next the structure of the test bench of testing circuit board is described. Refer to Fig. 1, its knot that is existing test benchStructure schematic diagram. Existing test bench 1 comprises pedestal 11, load bearing seat 12, plastics plate body 13 and multiple testProbe 14, load bearing seat 12 is arranged on pedestal 11, and its function is the tested circuit board 10 of carrying. MouldFlitch body 13 is arranged on pedestal 11 and is positioned at the top of load bearing seat 12, and the function of plastics plate body 13 is for establishingPut multiple test probes 14 thereon, wherein plastics plate body 13 can be in response to user's operation with respect to seatBody 11 moves, to approach or away from load bearing seat 12. Multiple test probes 14 be arranged on plastics plate body 13 andMultiple test probes 14 are vertical with the lower surface of plastics plate body 14, make multiple test probes 14 can be in plasticsWhen plate body 13 approaches load bearing seat 12, contact with the circuit board 10 on load bearing seat 12.
When circuit board 10 is placed on load bearing seat 12 and wish when tested, user's operation and make plastic plateBody 13 moves down, and multiple test probe 14 respectively with circuit board 10 on corresponding multiple electrical contacts(not being shown in figure) contact. Power supply afterwards give circuit board 10 with on circuit for detecting plate 10 multiple electricallyThe electrical functionality (such as resistance value, capacitance or inductance value etc.) of contact, last, capture those electrical functionalityActual numerical value and with default electrical numeric ratio, and judge that those electrical contacts are normal or abnormal, with certainlyWhether determine circuit board 10 by test. In the process of testing circuit board 10, due to multiple test probes 14Contact with multiple electrical contacts respectively and cause the movement of negative ion and can produce static discharge effect, it is madeThe probability that becomes circuit board 10 to damage is very high.
Therefore, need a kind of test bench of avoiding damaging because of static discharge measured object.
Summary of the invention
The technical problem to be solved in the present invention is, for prior art above shortcomings, provides a kind ofAvoid damaging because of static discharge the test bench of measured object.
The technical solution adopted for the present invention to solve the technical problems is to provide a kind of test bench, in order to test oneMeasured object, and on this measured object, there is an electrical contact, this test bench comprises pedestal, load bearing seat, conductive plateBody, test probe and insulating barrier. This load bearing seat is arranged on this pedestal, in order to carry this measured object. ShouldConduction plate body is arranged on this pedestal and is positioned at the top of this load bearing seat, in order to move and to connect with respect to this pedestalNear or away from this load bearing seat. This test probe is arranged on this conduction plate body and this test probe stretches out in this and leadsA lower surface of electroplax body, contacts with this electrical contact when being used to this conduction plate body and approaching this load bearing seat. ShouldInsulating barrier is arranged on this test probe maybe on this conduction plate body, in order to separate this test probe and this conductionPlate body.
Preferably, this insulating barrier is arranged on an outer surface of this test probe, and separate this test probe withAnd this conduction plate body and avoid leaky.
Preferably, this insulating barrier is to be formed by dielectric ink, and is arranged at this with coating method or mode of printingOn this outer surface of test probe.
Preferably, this test probe comprises outer tube, inner tube, flexible member and needle shaft, and this insulating barrier arrangesOn an outer surface of this outer tube; This interior tube portion is placed in this outer tube; This flexible member is placed in that this is interiorIn pipe, in order to an elastic force to be provided; This needle shaft part be placed in this inner tube and a first end of this needle shaft withThis flexible member contact, and one second end of this needle shaft contacts with this electrical contact; Wherein being somebody's turn to do when this needle shaftWhen the second end contacts with this electrical contact, this needle shaft is pushed against and can move with respect to this inner tube by this electrical contact.
Preferably, in the time that this second end of this needle shaft contacts with this electrical contact, an electric current mat of this measured objectFlow to this needle shaft, this inner tube and this outer tube by this electrical contact, and this electric current is arranged on this outer tubeThis insulating barrier intercepts to avoid entering this conduction plate body, thus the leaky of avoiding.
Preferably, this conduction plate body has a perforate, and this perforate runs through this conduction plate body, and this insulating barrier is establishedBe placed on the sidewall of this perforate, to separate this test probe and this conduction plate body.
Preferably, this insulating barrier is that dielectric ink forms, and is arranged at this with coating method or mode of printing and opensOn this sidewall in hole.
Preferably, in the time that this test probe contacts with this electrical contact, an electric current of this measured object is by this electricityProperty contact flow to this test probe, and this electric current be arranged at this insulating barrier in this perforate intercept to avoid intoEnter this conduction plate body, thus the leaky of avoiding.
Preferably, this load bearing seat has multiple fixed cylinders, in order to through corresponding multiple in this measured objectFixing perforate, and fix this measured object on this load bearing seat.
Preferably, this conduction plate body is made with metal material.
Test bench of the present invention is by replacing traditional plastics plate body with conduction plate body, and solves the asking of static dischargeTopic, and insulating barrier be set between plate body and separate test probe and conduct electricity plate body in test probe and conduction,Leak electricity to avoid electric current to be conducted to conduction plate body by test probe. Therefore, test bench of the present invention can be sameTime solve the problem of static discharge and electric leakage, not only can guarantee that measured object is not damaged in test process,And can avoid producing the problem that test accuracy declines.
Brief description of the drawings
Fig. 1 is the structural representation of existing test bench.
Fig. 2 is the structural representation of test bench of the present invention in the first preferred embodiment.
Fig. 3 is that conduction plate body and the structure of test probe in the first preferred embodiment of test bench of the present invention dividedSeparate schematic diagram.
Fig. 4 is the partial structurtes schematic diagram of test bench of the present invention in the first preferred embodiment.
Fig. 5 is the part that the test probe of test bench of the present invention contacts with measured object in the first preferred embodimentStructural representation.
Fig. 6 is that conduction plate body and the structure of test probe in the second preferred embodiment of test bench of the present invention dividedSeparate schematic diagram.
Detailed description of the invention
In view of the problem of prior art, the invention provides a kind of test bench that solves prior art problem. FirstThe structure of first simple declaration test bench of the present invention. Please refer to Fig. 2 and Fig. 3, Fig. 2 is that the present invention testsThe structural representation of seat in a preferred embodiment, and conduction plate body and test that Fig. 3 is test bench of the present inventionThe STRUCTURE DECOMPOSITION schematic diagram of probe in the first preferred embodiment. Test bench 2 of the present invention comprises pedestal 21, holdsCarry seat 22, conduction plate body 23, multiple test probe 24, multiple insulation corresponding to multiple test probes 24Layer 25 (please refer to Fig. 4) and transmission line 26. Load bearing seat 22 is arranged on pedestal 21, and its function isCarrying measured object 20, conduction plate body 23 is arranged on pedestal 21 and is positioned at the top of load bearing seat 22, conductive plateBody 23 can move with respect to pedestal 21 in response to user's operation, to approach or away from load bearing seat 22. ManyIndividual test probe 24 is arranged on conduction plate body 23 and multiple test probe 24 stretches out in conduction plate body 23Lower surface 231, makes multiple test probes 24 in the time that conduction plate body 23 approaches load bearing seat 22, with load bearing seatMeasured object 20 on 22 contacts. The function of insulating barrier 25 is for separating multiple test probes 24 and conduction plate body23. The function of transmission line 26 is for to set up being connected between test bench 2 and computer system (not being shown in figure),And the test data of transmission measured object 20 is to computer system. In this preferred embodiment, conduction plate body 23 isMade with metal material, and measured object 20 is for having the circuit board of multiple electrical contacts 201.
The invention that next test bench 2 of the present invention be described is sent out and is thought. Put because static can occur existing test bench 1The problem of electricity, therefore adopt with the made conduction plate body 23 of metal material conduction in test bench 2 of the present inventionPlate body 23 has conductive effect, and its bootable negative ion moves and avoids static discharge to damage measured object20. But the conductive effect of conduction plate body 23 causes measured object 20 that leaky can occur on the contrary, withThe problem that causes test accuracy to decline. The problem declining in order to solve test accuracy, tests in the present inventionIn seat 2, multiple insulating barriers 25 are set, to stop leaky to occur.
Please refer to Fig. 2～Fig. 4, Fig. 4 is the partial structurtes of test bench of the present invention in a preferred embodimentSchematic diagram. Conduction plate body 23 has the multiple perforates 232 corresponding to multiple test probes 24, and Fig. 3 only showsA test probe 24 and corresponding perforate 232. Test probe 24 comprise outer tube 241, inner tube 242,Flexible member 243, needle shaft 244 and connecting line 245, inner tube 242 parts are placed in outer tube 241, bulletProperty element 243 is placed in inner tube 242, and its function is for providing an elastic force. In needle shaft 244 parts are accommodatingPipe 242 first end 2441 interior and needle shaft 244 contacts with flexible member 243, and the second end of needle shaft 2442442 contact with the electrical contact 201 on measured object 20 in the time that conduction plate body 23 approaches load bearing seat 22. MultipleInsulating barrier 25 is arranged at respectively on the outer surface 2411 of corresponding outer tube 241, and connecting line 245 is arranged atOn outer tube 241 and be electrically connected at transmission line 26. In this preferred embodiment, insulating barrier 25 is by insulating oilChina ink and forming, and is arranged at coating method or mode of printing on the outer surface 2411 of outer tube 241. By this,Outer tube 241 does not contact with the perforate 232 of conduction plate body 23, but can pass perforate 232. And test probe 24Be arranged in the perforate 232 of conduction plate body 23, and insulating barrier 25 is separated the situation of outer tube 241 and perforate 232As shown in Figure 4.
Next the operation situation that explanation utilizes test bench 2 of the present invention to carry out the test of measured object 20. Please be simultaneouslyConsult Fig. 2～Fig. 5, the test probe that Fig. 5 is test bench of the present invention in the first preferred embodiment with measured objectThe partial structurtes schematic diagram of contact. In the time of user's wish test measured object 20, first place measured object 20 in holdingCarry on seat 22 the fixing perforate that makes the multiple fixed cylinders 221 on load bearing seat 22 pass respectively measured object 20202, to fix measured object 20 on load bearing seat 22. Next, operate and make to conduct electricity plate body 23 toward moving downMoving, and the second end 2442 of multiple needle shaft 244 respectively with measured object 20 on corresponding multiple electrical contacts201 contacts. Now, cannot move because measured object 20 is fixed, make electrical contact 201 apply onePushing force is to needle shaft 244, that is needle shaft 244 is pushed against by electrical contact 201 and can be with respect to inner tube 242Mobile, meanwhile, the first end 2441 of needle shaft 244 pushes against flexible member 243, and flexible member 243 is pressedContract and accumulation elastic force.
After measured object 20 is fixed in load bearing seat 20, user carries out powered operation, makes measured object 20Conducted electricity, now, multiple test probes 24 can detect respectively the electrical number of corresponding electrical contact 201Value (such as resistance value, capacitance or inductance value etc.). Afterwards, those electrical numerical value can be by connecting line 245And transmission line 26 is transferred to computer system. On the other hand, test program is installed in computer system, itsRecord default electrical numerical value, in the time that computer system receives electrical numerical value, can be by itself and default electrical numerical valueRelatively judge that whether measured object 20 is by test. Wherein, when electrical numerical value equals or close to default electricallyWhen numerical value, test program can judge that electrical contact is normal, and determines that measured object 20 is by test. Otherwise, electricityProperty numerical value when excessive with default electrical numerical value difference, test program judges that electrical contact is abnormal, and determines quiltSurvey thing 20 not by test.
After the test of measured object 20 completes, user operates and controls conduction plate body 23 away from load bearing seat22, to take out measured object 20, meanwhile, multiple test probes 24 are no longer pushed against, and in response to flexible member243 discharge elastic forces and test probe 24 are returned back to not by the position before pushing and pressing. Afterwards, user can be putDeposit a measured object on load bearing seat 22, to carry out the test of next measured object.
What need special instruction has two, the first, in multiple test probes 24 respectively with corresponding electrical contact 201When contact, the electric current that the measured object 20 being conducted electricity is produced by electrical contact 201 flow to needle shaft 244, inPipe 242 and outer tube 241, finally this electric current is intercepted by the insulating barrier 25 on outer tube 241, to avoid electric leakagePhenomenon occurs. Therefore, in the test process of test bench 2 of the present invention, not only can not be subject to electrostatic discharge effect, alsoCan there is not leaky. The second, in this preferred embodiment, insulating barrier 25 is arranged at outside outer tube 241On surface 2411, but non-as limit. In another preferred embodiment, insulating barrier 35 is arranged at conductive plateOn the sidewall 2321 of the perforate 232 of body 23, as shown in Figure 6. When test probe 24 through perforate 232 andBe arranged in conduction plate body 23 on time, insulating barrier 35 also can separate test probe 24 and conduction plate body 23 andAvoid test probe 24 to contact with conduction plate body 23, to avoid electric leakage to occur.
Known according to foregoing, test bench of the present invention by with conduction plate body replace traditional plastics plate body,And solve the problem of static discharge, and between plate body, insulating barrier is set and separates test with conducting electricity in test probeProbe and conduction plate body, to avoid electric current to be conducted to conduction plate body by test probe. Therefore, the present inventionTest bench can solve the problem of static discharge and electric leakage simultaneously, not only can not damage measured object, and can not produceThe problem that raw test accuracy declines.
The foregoing is only preferred embodiment of the present invention, not in order to limit claim scope of the present invention,Therefore all other do not depart from the equivalence change completing under disclosed spirit or modifies, and all should compriseIn scope of patent protection of the present invention.
Claims (10)
1. a test bench, in order to test a measured object, and has an electrical contact, its spy on this measured objectLevy and be, this test bench comprises:
Pedestal;
Load bearing seat, is arranged on this pedestal, in order to carry this measured object;
Conduction plate body, is arranged on this pedestal and is positioned at the top of this load bearing seat, in order to move with respect to this pedestalMoving and approach or away from this load bearing seat;
Test probe, is arranged on this conduction plate body and this test probe stretches out in a following table of this conduction plate bodyFace, contacts with this electrical contact when being used to this conduction plate body and approaching this load bearing seat; And
Insulating barrier, is arranged on this test probe maybe on this conduction plate body, in order to separate this test probe andThis conduction plate body.
2. test bench as claimed in claim 1, is characterized in that, this insulating barrier is arranged at this test probeAn outer surface on, and separate this test probe and this conduction plate body.
3. test bench as claimed in claim 2, is characterized in that, this insulating barrier is to be formed by dielectric ink,And be arranged at coating method or mode of printing on this outer surface of this test probe.
4. test bench as claimed in claim 2, is characterized in that, this test probe comprises:
Outer tube, this insulating barrier is arranged on an outer surface of this outer tube;
Inner tube, part is placed in this outer tube;
Flexible member, is placed in this inner tube, in order to an elastic force to be provided; And
Needle shaft, part is placed in this inner tube and a first end of this needle shaft contacts with this flexible member, and is somebody's turn to doOne second end of needle shaft contacts with this electrical contact; Wherein when this second end and this electrical contact of this needle shaft connectWhile touching, this needle shaft is pushed against and can move with respect to this inner tube by this electrical contact.
5. test bench as claimed in claim 4, is characterized in that, when this second end and this electricity of this needle shaftProperty contact when contact, an electric current of this measured object flow to this needle shaft, this inner tube and should by this electrical contactOuter tube, and this insulating barrier that this electric current is arranged on this outer tube intercepts to avoid entering this conduction plate body.
6. test bench as claimed in claim 1, is characterized in that, this conduction plate body has a perforate, shouldPerforate runs through this conduction plate body, and this insulating barrier is arranged on the sidewall of this perforate, to separate this test probeAnd this conduction plate body.
7. test bench as claimed in claim 6, is characterized in that, this insulating barrier is that dielectric ink forms,And be arranged at coating method or mode of printing on this sidewall of this perforate.
8. test bench as claimed in claim 6, is characterized in that, when this test probe and this electrical contactWhen contact, an electric current of this measured object flow to this test probe by this electrical contact, and this electric current is set upThis insulating barrier in this perforate intercepts to avoid entering this conduction plate body.
9. test bench as claimed in claim 1, is characterized in that, this load bearing seat has multiple fixed cylinders,In order to pass corresponding multiple fixing perforate in this measured object, and fix this measured object on this load bearing seat.
10. test bench as claimed in claim 1, is characterized in that, this conduction plate body is with metal materialMade.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410635334.6A CN105588957B (en) | 2014-11-12 | 2014-11-12 | Test bench |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410635334.6A CN105588957B (en) | 2014-11-12 | 2014-11-12 | Test bench |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105588957A true CN105588957A (en) | 2016-05-18 |
| CN105588957B CN105588957B (en) | 2019-03-22 |
Family
ID=55928698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410635334.6A Expired - Fee Related CN105588957B (en) | 2014-11-12 | 2014-11-12 | Test bench |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105588957B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106199081A (en) * | 2016-08-25 | 2016-12-07 | 安徽汇展热交换系统股份有限公司 | A kind of Hi-pot Tester auxiliary fixture |
| CN107436382A (en) * | 2016-05-27 | 2017-12-05 | 上海北京大学微电子研究院 | Static discharge current waveforms detection system and method for testing |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3975680A (en) * | 1975-06-25 | 1976-08-17 | Honeywell Information Systems, Inc. | Non-contact coupling plate for circuit board tester |
| US5204615A (en) * | 1991-10-24 | 1993-04-20 | Interconnect Devices, Inc. | Module attachment for printed circuit board test fixtures |
| US6384618B1 (en) * | 2000-03-15 | 2002-05-07 | Advanced Micro Devices, Inc. | Chip scale electrical test fixture with isolation plate having an angled test hole |
| CN1495870A (en) * | 1994-11-15 | 2004-05-12 | ��ķ�����عɷ�����˾ | Composite intermediate connection element of microelectronic component and its making method |
| US20050168231A1 (en) * | 2003-12-24 | 2005-08-04 | Young-Gon Kim | Methods and structures for electronic probing arrays |
| US20090007688A1 (en) * | 2006-02-03 | 2009-01-08 | Bae Systems Plc | Damage Sensors |
| US20110282593A1 (en) * | 2010-05-14 | 2011-11-17 | Apple Inc. | Weld check stations |
| TWI416115B (en) * | 2009-11-16 | 2013-11-21 | ||
| TW201403073A (en) * | 2012-06-18 | 2014-01-16 | Jae-Hak Lee | Test socket with conductive powder having through-hole and fabrication method thereof |
| CN203587616U (en) * | 2013-09-05 | 2014-05-07 | 致茂电子股份有限公司 | Detection device with biaxial positioning mechanism |
| TWM485408U (en) * | 2014-04-22 | 2014-09-01 | Chroma Ate Inc | Chip inspection device having horizontal positioning mechanism |
-
2014
- 2014-11-12 CN CN201410635334.6A patent/CN105588957B/en not_active Expired - Fee Related
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3975680A (en) * | 1975-06-25 | 1976-08-17 | Honeywell Information Systems, Inc. | Non-contact coupling plate for circuit board tester |
| US5204615A (en) * | 1991-10-24 | 1993-04-20 | Interconnect Devices, Inc. | Module attachment for printed circuit board test fixtures |
| CN1495870A (en) * | 1994-11-15 | 2004-05-12 | ��ķ�����عɷ�����˾ | Composite intermediate connection element of microelectronic component and its making method |
| US6384618B1 (en) * | 2000-03-15 | 2002-05-07 | Advanced Micro Devices, Inc. | Chip scale electrical test fixture with isolation plate having an angled test hole |
| US20050168231A1 (en) * | 2003-12-24 | 2005-08-04 | Young-Gon Kim | Methods and structures for electronic probing arrays |
| US20090007688A1 (en) * | 2006-02-03 | 2009-01-08 | Bae Systems Plc | Damage Sensors |
| TWI416115B (en) * | 2009-11-16 | 2013-11-21 | ||
| US20110282593A1 (en) * | 2010-05-14 | 2011-11-17 | Apple Inc. | Weld check stations |
| TW201403073A (en) * | 2012-06-18 | 2014-01-16 | Jae-Hak Lee | Test socket with conductive powder having through-hole and fabrication method thereof |
| CN203587616U (en) * | 2013-09-05 | 2014-05-07 | 致茂电子股份有限公司 | Detection device with biaxial positioning mechanism |
| TWM485408U (en) * | 2014-04-22 | 2014-09-01 | Chroma Ate Inc | Chip inspection device having horizontal positioning mechanism |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107436382A (en) * | 2016-05-27 | 2017-12-05 | 上海北京大学微电子研究院 | Static discharge current waveforms detection system and method for testing |
| CN106199081A (en) * | 2016-08-25 | 2016-12-07 | 安徽汇展热交换系统股份有限公司 | A kind of Hi-pot Tester auxiliary fixture |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105588957B (en) | 2019-03-22 |
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| CF01 | Termination of patent right due to non-payment of annual fee |