CN107723688A - 一种制备(002)取向的azo透明导电薄膜的方法 - Google Patents
一种制备(002)取向的azo透明导电薄膜的方法 Download PDFInfo
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Abstract
本发明涉及一种制备(002)取向的AZO透明导电薄膜的制备方法。这种薄膜光电性能优异。本发明采用下述技术方案:1)将二水乙酸锌溶解在乙二醇甲醚溶剂中,加入一定量的乙醇胺和九水硝酸铝,反应制得AZO前驱体溶胶;2)将前驱体溶胶旋涂于基片上,得到AZO凝胶薄膜,高温处理后重复旋涂多次;3)将AZO薄膜在空气中500‑550℃预处理30‑60min,然后在95N2/5H2混合气体中,压强1.31×105Pa,500‑550℃烧结30‑60min,降至室温后即可得到(002)取向生长的AZO薄膜。AZO薄膜的电阻率可达1.27×10‑3Ωcm,在可见光范围内平均透光率高于90%。
Description
技术领域
本发明涉及透明导电薄膜技术领域,具体涉及一种采用溶胶-凝胶工艺制备(002)取向的AZO透明导电薄膜。
背景技术
透明导电氧化物(TCO)薄膜因具有透光率高、导电性好等优点,在太阳能电池、平板显示器、发光二极管、电磁防护屏等光电器件方面具有广泛的应用前景。目前产业化的透明导电薄膜主要是掺锡氧化铟(ITO)薄膜,但是ITO中的铟元素属于稀有金属,其储量有限,价格昂贵且有毒性,不利于环保,大大限制了其大规模使用。近年来掺铝氧化锌(AZO)薄膜的研究引起了高度重视,已经有许多文献报道。AZO薄膜表现出了良好的光电性能,且具有原料丰富,无毒、环保等优点,有望成为ITO薄膜的替代者。目前AZO薄膜的制备方法有多种,主要有磁控溅射法、脉冲激光沉积法、原子层沉积、化学气象沉积、喷雾热解法和溶胶凝胶法等。在众多的制备工艺中,溶胶-凝胶方法制备薄膜具有设备成本低,工艺简单,成膜均匀,便于控制元素掺杂等优点。但是溶胶-凝胶法制备的AZO薄膜电阻率通常偏高一点,还需改进工艺,进一步提高薄膜的电导率。根据文献报道,沿c轴取向生长能够提高薄膜的致密度,减少载流子的晶界散射,大幅降低AZO薄膜的电阻率。但是,目前AZO薄膜的取向生长多采用磁控溅射或脉冲沉积等昂贵的物理方法制备,不宜规模化生产。而采用溶胶-凝胶方法一般不易制备出取向生长的AZO薄膜,通常需要借助衬底基片取向或者晶籽缓冲层诱导来完成取向生长,使得AZO薄膜的制备受到限制。
发明内容
本发明的目的是提供了一种(002)取向的光电性能优异的AZO薄膜制备方法。采用溶胶-凝胶旋涂工艺在石英、玻璃片等基片上沉积凝胶膜,经过后期在N2/H2混合气体中退火处理,获得了电阻率极低,在可见光区透光率很高的(002)取向的AZO透明导电薄膜。本发明的制备方法设备成本低,工艺简单,原料丰富,制备的AZO薄膜光电性能优异。
本发明采用下述技术方案:
1)前驱体胶体制备:
将二水乙酸锌溶解在乙二醇甲醚溶剂中,加入一定量的乙醇胺作为稳定剂,搅拌溶解后,加入适量的九水硝酸铝,50-70℃恒温水浴搅拌3-4h后,然后过滤,将过滤后的溶胶老化60-80h,得到金属离子浓度为0.2-0.6mol/L的AZO前驱体溶胶;
2)AZO薄膜的制备:
将步骤1)制得的前驱体溶胶,采用旋涂方法沉积在清洗过的基片上,得到AZO凝胶薄膜,在空气中400-500℃预处理8-15min,然后降至室温,再重复旋涂,得到一定厚度的AZO薄膜;
3)AZO薄膜在高纯95N2/5H2混合气体中的退火处理:
将步骤2)制备的AZO薄膜放入管式炉中,从室温开始加热,升温速率为3-5℃/min,首先500-550℃预处理30-60min,然后在保持500-550℃情况下抽真空至低于10Pa,接着充入高纯95N2/5H2混合气体,然后再抽真空至低于10Pa,接着再次充入高纯95N2/5H2混合气体,如此反复抽真空3-5次后,充入高纯95N2/5H2混合气体,压强保持在1.31×105Pa,继续在500-550℃烧结30-60min,烧结完毕,在保持压强的情况下,停止加热,自然冷却至室温,停止通气,即可得到(002)取向生长的AZO薄膜。
上述的方法,步骤1)中,所述的Zn2+:乙醇胺按摩尔比为1:1。
上述的方法,步骤1)中,所述的Al3+/(Zn2++Al3+)按摩尔比为0.5-2.5%。
上述的方法,步骤2)中,所述的旋涂工艺参数为3000rpm,旋涂时间20s,重复旋涂次数为15-25次。
以现有的技术相比,本发明的有益效果是:本发明提供的溶胶-凝胶法合成(002)取向的透明导电AZO薄膜制备方法,采用价格低廉的二水乙酸锌和九水硝酸铝为原料,大大降低了制备透明导电薄膜的成本,薄膜制备技术具有操作简单,设备便宜以及容易规模化生产等优点,此外,还便于精确掺杂,成膜均匀性好,有望在石英、玻璃等基片上大面积生长光电性能优异的(002)取向的AZO薄膜。相较于磁控溅射、脉冲沉积等昂贵的物理方法,或者借助衬底基片取向以及利用晶籽缓冲层等诱导法制备取向生长AZO薄膜,本发明的制备取向生长AZO薄膜的技术更为简单实用。本发明制备的(002)取向的AZO薄膜的电阻率可达1.27×10-3Ωcm,在可见光范围内平均透光率高于90%,具有优异的光电性能。
附图说明
图1是实施例1中AZO薄膜在95N2/5H2混合气体退火的XRD图。
图2是实施例1、实施例2、实施例3和实施例4中AZO薄膜的XRD图。
图3是实施例1、实施例2、实施例3和实施例4中AZO薄膜电阻率图。
图4是实施例1中AZO薄膜在可见光区的透射率图。
具体实施方式
为了更好的理解本发明,下面结合附图和具体实施例,对本发明进行详细说明。应当理解,此处所述的具体实例只是用于解释本发明,并不仅仅局限于下面的几个实例。
实施例1
一种制备(002)取向的AZO透明导电薄膜的方法,包括如下步骤:
1)按照化学组成Zn0.9875Al0.0125Ox元素的化学计量比称量二水乙酸锌和九水硝酸铝,先将二水乙酸锌加入到乙二醇甲醚中,室温搅拌溶解后加入乙醇胺,Zn2+:乙醇胺摩尔比为1∶1,室温搅拌20min后,加入九水硝酸铝,然后60℃恒温水浴搅拌3-4h,自然降至室温继续搅拌2h,过滤,得到金属离子(Zn2++Al3+)浓度为0.5mol/L的AZO前驱体溶胶,老化72小时后待用;
2)将石英基片依次用去离子水、丙酮和无水乙醇超声清洗,每次超声10min。清洗后的基片用高纯N2吹干待用;
3)将步骤1)得到的溶胶采用旋涂方法在步骤2)得到的石英基片上旋涂成膜,旋涂工艺参数为3000rpm,旋涂时间20s,把涂有胶体膜基片放入管式炉中,在大气环境下500℃热处理10min,然后自然冷却至室温,再次旋涂、热处理,重复20次,得到理想厚度的AZO薄膜;
4)将步骤3)制备的AZO薄膜放入管式炉中,从室温开始加热,以5℃/min的升温速率升温到530℃,530℃预处理40min;
5)利用机械泵抽真空,将石英管内压强抽至低于10Pa,然后充入高纯95N2/5H2混合气体,压强升至1.31×105Pa,再次启动机械泵抽取真空,如此反复3-5次后充入高纯95N2/5H2混合气体,压强保持在1.31×105Pa,继续在530℃烧结1h,烧结完成后在保持压强1.31×105Pa的情况下,停止加热,自然冷却至室温,,得到AZO薄膜。制备的AZO薄膜为(002)取向的六方纤锌矿结构。薄膜表面平整光滑,无裂纹无空洞。通过霍尔效应测试AZO薄膜的电阻率为1.27×10-3Ωcm,比空气中退火处理薄膜的电阻降低了三个量级,利用光谱仪测试薄膜在可见光范围内的平均透光率高于90%。参见附图1、附图2、附图3和附图4。
实施例2
将实施例1中步骤1)化学组分配比改为Zn0.99Al0.01Ox,按化学计量比称量二水乙酸锌和九水硝酸铝,其余过程同实施例1相同。制备的AZO薄膜为(002)取向的六方纤锌矿结构。通过霍尔效应测试AZO薄膜的电阻率为1.98×10-3Ωcm。参见附图2和附图3。
实施例3
将实施例1中步骤1)化学组分配比改为Zn0.985Al0.015Ox,按化学计量比称量二水乙酸锌和九水硝酸铝,其余过程同实施例1相同。制备的AZO薄膜为(002)取向的六方纤锌矿结构。通过霍尔效应测试AZO薄膜的电阻率为3.25×10-3Ωcm。参见附图2和附图3。
实施例4
将实施例1中步骤1)化学组分配比改为Zn0.993Al0.007Ox,按化学计量比称量二水乙酸锌和九水硝酸铝,其余过程同实施例1相同。制备的AZO薄膜为(002)取向的六方纤锌矿结构。通过霍尔效应测试AZO薄膜的电阻率为2.50×10-3Ωcm。参见附图2和附图3。
作为对比实验,制备了空气中退火处理的AZO薄膜,同实施例1中的1-3)步骤相同,将制备的AZO薄膜放入管式炉中,以5℃/min的升温速率升温到530℃,在大气环境中530℃退火处理100min,得到AZO薄膜,通过霍尔效应测试AZO薄膜的电阻率为1.3Ωcm,利用光谱仪测试在可见光范围内薄膜的平均透光率约为88%。其相结构明显异于实施例1中制备AZO薄膜的相结构,其光电性能和实施例1中制备AZO薄膜的光电性能相比也有明显的差距,尤其是电阻率相差了三个数量级。参见附图1,附图3和附图4。
Claims (5)
1.一种制备(002)取向的AZO透明导电薄膜的方法,其特征在于制备的AZO薄膜为(002)取向生长,且其光电性能优异,主要包括以下步骤:
1)前驱体胶体制备:
将二水乙酸锌溶解在乙二醇甲醚溶剂中,加入一定量的乙醇胺作为稳定剂,搅拌溶解后,加入适量的九水硝酸铝,50-70℃恒温水浴搅拌3-4h后,然后过滤,将过滤后的溶胶老化60-80h,得到金属离子浓度为0.2-0.6mol/L的AZO前驱体溶胶;
2)AZO薄膜的制备:
将步骤1)制得的前驱体溶胶,采用旋涂方法沉积在清洗过的基片上,得到AZO凝胶薄膜,在空气中400-500℃预处理8-15min,然后降至室温,再重复旋涂,得到一定厚度的AZO薄膜;
3)AZO薄膜在高纯95N2/5H2混合气体中的退火处理:
将步骤2)制备的AZO薄膜放入管式炉中,从室温开始加热,升温速率为3-5℃/min,首先500-550℃预处理30-60min,然后在保持500-550℃情况下抽真空至低于10Pa,接着充入高纯95N2/5H2混合气体,然后再抽真空至低于10Pa,接着再次充入高纯95N2/5H2混合气体,如此反复抽真空3-5次后,充入高纯95N2/5H2混合气体,压强保持在1.31×105Pa,继续在500-550℃烧结30-60min,烧结完毕,在保持压强的情况下,停止加热,自然冷却至室温,停止通气,即可得到(002)取向生长的AZO薄膜。
2.按照权利要求1所述的一种制备(002)取向的AZO透明导电薄膜的方法,其特征在于:步骤1)所述的Zn2+:乙醇胺按摩尔比为1:1。
3.按照权利要求1所述的一种制备(002)取向的AZO透明导电薄膜的方法,其特征在于:步骤1)所述的Al3+:(Zn2++Al3+)按摩尔比为0.5%-2.5%。
4.按照权利要求1所述的一种制备(002)取向的AZO透明导电薄膜的方法,其特征在于:步骤2)所述的基片为玻璃片或石英片。
5.按照权利要求1所述的一种制备(002)取向的AZO透明导电薄膜的方法,其特征在于:步骤2)所述的基片清洗过程为将玻璃片或石英基片依次放入去离子水、丙酮和无水乙醇中,超声清洗10min,然后用高纯氮气吹干。
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CN106435533A (zh) * | 2016-08-02 | 2017-02-22 | 辽宁大学 | 一种制备高性能azo透明导电薄膜的方法 |
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CN102330075A (zh) * | 2011-09-26 | 2012-01-25 | 中国地质大学(武汉) | 一种ZnO基透明导电薄膜的制备方法 |
CN102646759A (zh) * | 2012-05-04 | 2012-08-22 | 深圳市科聚新材料有限公司 | 一种透明导电氧化物薄膜的制备方法 |
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