CN107589076A - Infrared polarization binary channels spectral measurement system - Google Patents
Infrared polarization binary channels spectral measurement system Download PDFInfo
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- CN107589076A CN107589076A CN201711033534.4A CN201711033534A CN107589076A CN 107589076 A CN107589076 A CN 107589076A CN 201711033534 A CN201711033534 A CN 201711033534A CN 107589076 A CN107589076 A CN 107589076A
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Abstract
The invention discloses a kind of infrared polarization binary channels spectral measurement system, including infrared light supply, the light of described infrared light supply transmitting is incident to interferometer after the first speculum collimation with directional light, the parallel interference light of interferometer outgoing converges to sample annex through the second speculum and is emitted again, 3rd speculum is used to the interference signal light containing sample annex sample message reflexing to beam splitter, interference signal light is divided into the orthogonal reflection of two beams through beam splitter, transmitted light is emitted to first respectively, second polarizer, first, second detector is respectively used to first, the outgoing beam of second polarizer is converted to electric signal.Parallel band and vertical bands of a spectrum of the sample under Infrared irradiation are obtained simultaneously, thus accurately calculates the degree of orientation of sample.
Description
Technical field
The invention belongs to infrared spectrometry technical field, more particularly to a kind of infrared polarization binary channels spectral measurement system
System.
Background technology
The stretching orientation of high molecular polymer is the premise of strain inducing crystallization, has an impact to its physical property, typically grinds
Studying carefully the method for polymer orientation has X-ray ray methods, polarized infrared light spectrometry (infrared dichroism method) etc..IR polarized spectrum
For method in recent years in the research of polymer using relatively more, advantage is can to measure the orientation of different polymer architectures, is studied not
With the polymer architecture under stretching, processing and heat treatment condition, this is that other method does not possess.Characteristic group shakes in molecule
During dynamic transition, absorption be certain frequency infrared light, so as to produce infrared absorption, be reflected on infrared spectrum and will appear as phase
Answer the absworption peak of frequency.Characteristic group change of dipole moment in vibration processes is referred to as transition away from infrared absorption spectroscopy in molecule
The absorption intensities of bands of a spectrum and dipole moment it is square directly proportional, when polarised light electric vector parallel to transition away from when, produce maximum
Absorb, the absorption band is referred to as parallel band, and perpendicular to transition away from when be absorbed as zero, the absorption band is referred to as vertical spectrum
Band.For the high polymer for crystallizing and being orientated, some groups on strand have certain directionality.In such sample
The change (i.e. the change of polarization direction) of infrared light incident direction can make absorption intensity that very big difference occur, and show dichroic
Property.By the parallel band for measuring polymer molecule and vertical bands of a spectrum, so as to calculate the dichroism of bands of a spectrum when polymer-like
The degree of orientation of product.The polarized infrared light spectral apparatus of conventional measurement dichroic ratio, can only once be surveyed on a polarization direction
Sample infrared absorbency, wait when measuring the infrared absorbency on another polarization direction, the molecularly oriented of sample in experiment condition such as
Temperature, pressure etc. can change, and cause measurement result inaccurate.One kind is needed to measure high molecular polymer simultaneously to this
Parallel band and vertical bands of a spectrum system of the sample under Infrared irradiation, for accurately calculating the orientation of high molecular polymer sample
Degree.
The content of the invention
It is an object of the invention to provide a kind of parallel band of the sample under Infrared irradiation and vertical of measuring simultaneously
The infrared polarization binary channels spectral measurement system of bands of a spectrum.
To achieve these goals, the present invention takes following technical scheme：A kind of infrared polarization binary channels spectral measurement system
System, including infrared light supply, the light that described infrared light supply is launched are incident to dry with directional light after being collimated through the first speculum
Interferometer, the parallel interference light of interferometer outgoing converge to sample annex through the second speculum and are emitted again, and the 3rd speculum is used for will
Interference signal light containing sample annex sample message reflexes to beam splitter, and interference signal light is divided into two beams through beam splitter and mutually hung down
Straight reflection, transmitted light are emitted to first, second polarizer respectively, and first, second detector is respectively used to inclined by first, second
The outgoing beam of device of shaking is converted to electric signal.
In above-mentioned technical proposal, parallel interference light irradiating sample annex is produced by interferometer first, so as to be contained
The interference signal light of sample message, interference signal light are reflexed on beam splitter through the 3rd speculum, and beam splitter is inclined with first, second
The device that shakes forms binary channels polarized systems, and light beam forms the reflection containing sample message, transmission partially respectively through first, second polarizer
Shake interference signal, then converts optical signals to electric signal by the detection of first, second detector, so as to obtain simultaneously
Parallel band and vertical bands of a spectrum of the sample under Infrared irradiation, thus accurately calculate the degree of orientation of sample.
Brief description of the drawings
Fig. 1 is present system schematic diagram.
Embodiment
The present invention is made further instructions with reference to accompanying drawing 1：
A kind of infrared polarization binary channels spectral measurement system, including infrared light supply 1, the light of described infrared light supply 1 transmitting
Line is incident to interferometer 3 after the first speculum 2 collimation with directional light, and the parallel interference light that interferometer 3 is emitted is anti-through second
Penetrate mirror 4 and converge to sample annex 5 and be emitted again, the 3rd speculum 6 is used for the interference signal light containing the sample message of sample annex 5
Reflex to beam splitter 7, interference signal light be divided to through beam splitter 7 be emitted to first respectively for the orthogonal reflection of two beams, transmitted light,
Second polarizer 8,9, first, second detector 12,13 are respectively used to the outgoing beam conversion of first, second polarizer 8,9
For electric signal.Parallel interference light irradiating sample annex 5 is produced by interferometer 3 first, it is dry containing sample message so as to obtain
Flashlight is related to, interference signal light is reflexed on beam splitter 7 through the 3rd speculum 6, the polarizer 8 of beam splitter 7 and first, second, 9 structures
Into binary channels polarized systems, light beam forms the reflection containing sample message, transmission-polarizing respectively through first, second polarizer 8,9
Interference signal, electric signal is then converted optical signals to by the detection of first, second detector 12,13, so as to simultaneously
Parallel band and vertical bands of a spectrum of the sample under Infrared irradiation are obtained, thus accurately calculates the degree of orientation of sample.
Divide between described the first polarizer 8 and the first detector 12 between the second polarizer 9 and the second detector 13
Not She You the four, the 5th speculums 10,11 be used to outgoing beam converging to first, second detector 12,13.Provided with
4th, the 5th speculum 10,11 is used to visit by the outgoing beam reflecting focal of first, second polarizer 8,9 to first, second
Survey on device 12,13, be easy to detector to accurately detect optical signal.
First, second described detector 12,13 is connected with first, second preamplifier 14,15 respectively, multi pass acquisition
Unit 16 transmits signals to computer 17 after receiving the amplified signal that first, second preamplifier 14,15 transmits.The
First, the second detector 12,13 converts optical signals to electric signal, in order to ensure the transmission stability of electric signal, provided with first,
Two preamplifiers 14,15 are used to convert electrical signals to amplified signal, and subsequent signal collects transmission by multi pass acquisition unit 16
To computer 17, computer 17 pre-enters programmed algorithm, and analysis in real time draws parallel band of the sample under Infrared irradiation
With vertical bands of a spectrum.
Sample infrared absorbency A of the sample annex under orthogonal polarized light and parallel polarized light is calculated by infrared spectrogram⊥
And A∥, so as to obtain the infrared dichroism of sample spectra ratio：R=A∥/A⊥, when institute's test sample product are uniaxial polymers, model
Using simplest hypothesis：All polymer molecular chains arrange along draw direction, the vibrational transition of spectrum away from molecule chain rivet
Into the conical distribution of fixed angle, θ, then the infrared dichroism ratio of spectrum is：R ＇=2cot2θ, generally with orientation function f come
The degree of orientation of strand is represented, if the strand for there are f fractions in polymer is fully oriented, remaining 1~f fractions are
Arbitrary distribution.Calculation is as follows：
The degree of orientation of accurate judgement sample is calculated more than.
In order to ensure the stability of system, specific layout pattern is as follows：Described beam splitter 7 is infrared beam splitter and light beam
Incident angle is 45 °, and the beam incident angle degree of first, second polarizer 8,9 is all 90 °, and first, second polarizer 8,9 is all
Infrared polarizer and it is mutually perpendicular to arrange.Light beam is incident to after beam splitter 7 to produce is emitted to the after reflection and transmitted light beam respectively
First, the second polarizer 8,9.
The first, second, third, fourth, the 5th described speculum 2,4,6,10,11 is off-axis throwing face mirror, for red
The light reflection of wave section.
Claims (5)
1. a kind of infrared polarization binary channels spectral measurement system, including infrared light supply (1), it is characterised in that：Described infrared light
The light of source (1) transmitting is incident to interferometer (3) after the first speculum (2) collimation with directional light, interferometer (3) outgoing
Parallel interference light converges to sample annex (5) through the second speculum (4) and is emitted again, and the 3rd speculum (6) is used to that sample will to be contained
The interference signal light of annex (5) sample message reflexes to beam splitter (7), and it is mutual that interference signal light through beam splitter (7) is divided into two beams
Vertical reflection, transmitted light are emitted to first, second polarizer (8,9) respectively, and first, second detector (12,13) is used respectively
In the outgoing beam of first, second polarizer (8,9) is converted into electric signal.
2. infrared polarization binary channels spectral measurement system according to claim 1, it is characterised in that：The first described polarization
Between device (8) and the first detector (12) the four, the 5th are respectively equipped between the second polarizer (9) and the second detector (13)
Speculum (10,11) is used to outgoing beam converging to first, second detector (12,13).
3. infrared polarization binary channels spectral measurement system according to claim 2, it is characterised in that：Described first,
Two detectors (12,13) are connected with first, second preamplifier (14,15) respectively, multi pass acquisition unit (16) reception first,
Computer (17) is transmitted signals to after the amplified signal that second preamplifier (14,15) transmits.
4. infrared polarization binary channels spectral measurement system according to claim 1, it is characterised in that：Described beam splitter
(7) it is 45 ° for infrared beam splitter and beam incident angle degree, the beam incident angle degree of first, second polarizer (8,9) is all 90 °,
First, second polarizer (8,9) is all infrared polarizer and is mutually perpendicular to arrange.
5. infrared polarization binary channels spectral measurement system according to claim 1, it is characterised in that：Described first,
2nd, the three, the four, the 5th speculums (2,4,6,10,11) are off-axis throwing face mirror, and the light for infrared band reflects.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711033534.4A CN107589076A (en) | 2017-10-30 | 2017-10-30 | Infrared polarization binary channels spectral measurement system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711033534.4A CN107589076A (en) | 2017-10-30 | 2017-10-30 | Infrared polarization binary channels spectral measurement system |
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| Publication Number | Publication Date |
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| CN107589076A true CN107589076A (en) | 2018-01-16 |
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| CN201711033534.4A Withdrawn CN107589076A (en) | 2017-10-30 | 2017-10-30 | Infrared polarization binary channels spectral measurement system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111007007A (en) * | 2019-11-30 | 2020-04-14 | 中国船舶重工集团公司第七一七研究所 | Switchable infrared spectrum polarization imaging device and measurement method thereof |
| CN111781169A (en) * | 2019-04-03 | 2020-10-16 | 阳程科技股份有限公司 | Polarized light alignment detection device and detection method |
| CN113295642A (en) * | 2021-05-17 | 2021-08-24 | 中国科学院合肥物质科学研究院 | Mid-infrared spectrum measurement system and method for ammonia molecule absorption line parameters |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6483135A (en) * | 1987-09-25 | 1989-03-28 | Hitachi Ltd | Measuring apparatus of polarized infrared ray for thin film |
| CN104880418A (en) * | 2015-05-29 | 2015-09-02 | 江汉大学 | Spectrum detecting system |
| CN106092905A (en) * | 2016-06-21 | 2016-11-09 | 北京化工大学 | A kind of Polarized infrared light spectrometer |
-
2017
- 2017-10-30 CN CN201711033534.4A patent/CN107589076A/en not_active Withdrawn
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6483135A (en) * | 1987-09-25 | 1989-03-28 | Hitachi Ltd | Measuring apparatus of polarized infrared ray for thin film |
| CN104880418A (en) * | 2015-05-29 | 2015-09-02 | 江汉大学 | Spectrum detecting system |
| CN106092905A (en) * | 2016-06-21 | 2016-11-09 | 北京化工大学 | A kind of Polarized infrared light spectrometer |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111781169A (en) * | 2019-04-03 | 2020-10-16 | 阳程科技股份有限公司 | Polarized light alignment detection device and detection method |
| CN111781169B (en) * | 2019-04-03 | 2023-08-22 | 阳程科技股份有限公司 | Polarized light alignment detection device and detection method |
| CN111007007A (en) * | 2019-11-30 | 2020-04-14 | 中国船舶重工集团公司第七一七研究所 | Switchable infrared spectrum polarization imaging device and measurement method thereof |
| CN113295642A (en) * | 2021-05-17 | 2021-08-24 | 中国科学院合肥物质科学研究院 | Mid-infrared spectrum measurement system and method for ammonia molecule absorption line parameters |
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Application publication date: 20180116 |