US10578492B2 - Polarimeter for detecting polarization rotation - Google Patents
Polarimeter for detecting polarization rotation Download PDFInfo
- Publication number
- US10578492B2 US10578492B2 US16/146,523 US201816146523A US10578492B2 US 10578492 B2 US10578492 B2 US 10578492B2 US 201816146523 A US201816146523 A US 201816146523A US 10578492 B2 US10578492 B2 US 10578492B2
- Authority
- US
- United States
- Prior art keywords
- polarization
- light
- polarimeter
- reaction
- refractive index
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000010287 polarization Effects 0.000 title claims abstract description 164
- 238000005259 measurement Methods 0.000 claims abstract description 52
- 238000001514 detection method Methods 0.000 claims abstract description 45
- 239000011149 active material Substances 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims description 16
- 230000005540 biological transmission Effects 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 238000004458 analytical method Methods 0.000 description 9
- 238000001069 Raman spectroscopy Methods 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- WQZGKKKJIJFFOK-GASJEMHNSA-N Glucose Natural products OC[C@H]1OC(O)[C@H](O)[C@@H](O)[C@@H]1O WQZGKKKJIJFFOK-GASJEMHNSA-N 0.000 description 4
- 239000008103 glucose Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 235000013361 beverage Nutrition 0.000 description 3
- 239000003814 drug Substances 0.000 description 3
- 235000013305 food Nutrition 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 150000001413 amino acids Chemical class 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 150000003431 steroids Chemical class 0.000 description 2
- 235000000346 sugar Nutrition 0.000 description 2
- 229940088594 vitamin Drugs 0.000 description 2
- 229930003231 vitamin Natural products 0.000 description 2
- 235000013343 vitamin Nutrition 0.000 description 2
- 239000011782 vitamin Substances 0.000 description 2
- 235000001014 amino acid Nutrition 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 150000008163 sugars Chemical class 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/02—Polarimeters of separated-field type; Polarimeters of half-shadow type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/04—Polarimeters using electric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
Definitions
- Apparatuses consistent with example embodiments relate to a polarimeter, and more particularly, to a polarimeter for detecting a polarization rotation by using an optically active material.
- a polarimeter may be used to determine a concentration of an optically active material such as steroids, amino acids, vitamins, polymers, sugars, and the like, in a sample.
- an optically active material such as steroids, amino acids, vitamins, polymers, sugars, and the like.
- a rotation angle of polarized light passing through the optically active material may be measured.
- an additional device such as a Faraday rotator is often needed to increase the rotation angle measurement sensitivity by using the optically active material.
- a longer reaction length may be used to obtain a sufficient polarization rotation. This approach, however, makes a system complex and bulky.
- One or more example embodiments may provide a polarimeter in which a rotation angle measurement sensitivity of polarized light passing through an optically active material is high and a form factor is improved.
- a polarimeter includes a light source unit configured to irradiate light of a specific polarization onto a measurement object including an optically active material; an anisotropic meta surface element configured to split reaction light, obtained by reacting the light of the specific polarization irradiated from the light source unit with the measurement object, into first and second reaction light according to polarization; a detection unit configured to detect the first and second reaction light separated by the anisotropic meta surface element according to polarization; and a determination unit configured to calculate a rotation angle of the polarization caused by the measurement object by comparing detection signals of the first and second reaction light detected by the detection unit.
- the anisotropic meta surface element may split the reaction light into the first reaction light of a first polarization and the second reaction light of a second polarization orthogonal to the first reaction light.
- the specific polarization may be the same as one of the first polarization and the second polarization.
- the first polarization and the second polarization may be linear polarizations orthogonal to each other.
- the anisotropic meta surface element may be a phase mask having a sub wavelength structure.
- the anisotropic meta surface element may include a low refractive index dielectric substrate and an array of high refractive index three dimensional shapes, having sub wavelength structures, disposed on the low refractive index dielectric substrate.
- a polarization reaction of incident light to the anisotropic meta surface element may be determined based on a size difference between two axes of each of the high refractive index dielectric three-dimensional shapes.
- the anisotropic meta surface element may be located on a light-receiving surface of the detection unit.
- the light source unit may include a light source configured to emit light and a polarizer configured to polarize the light emitted from the light source unit and output the light of the specific polarization, and only the light of the specific polarization may be irradiated to the measurement object.
- the polarizer may include a meta surface polarizer.
- the meta surface polarizer may include a low refractive index dielectric substrate and an array of high refractive index dielectric three dimensional shapes, having sub wavelength structures, disposed on the substrate.
- a reaction of the polarization of incident light to the meta surface polarizer may be determined by a size difference between two axes of each of the high refractive index dielectric three-dimensional shapes.
- the specific polarization may be a linear polarization.
- the detection unit may include a plurality of detectors, each configured to detect one of the first reaction light and the second reaction light.
- Each of the plurality of detectors may include one of a photodiode, a PMT detector, a photodiode linear array, and an image sensor.
- the detection unit may include a single detector, the single detector including one of a photodiode linear array and an image sensor.
- the polarimeter may further include a spectrometer configured to measure light scattered from the measurement object.
- the measurement object may include an optically active material.
- FIG. 1 schematically shows a configuration of a polarimeter according to an example embodiment
- FIG. 2 illustrates a light path in which reaction light, incident from a measurement object, splits into first reaction light of a first polarization and second reaction light of a second polarization orthogonal thereto according to polarization by an anisotropic meta surface element of FIG. 1 ;
- FIG. 3A is a schematic perspective view illustrating an example of an anisotropic meta surface element that may be applied to a polarimeter of FIG. 1 ;
- FIG. 3B is a plan view showing an array of high refractive index dielectric three-dimensional shapes of FIG. 3A ;
- FIG. 3C is a plan view showing a high refractive index dielectric three-dimensional shape of FIG. 3A ;
- FIG. 4 illustrates that reaction light is received by splitting reaction light into first reaction light of a first polarization and second reaction light of a second polarization according to polarization by the anisotropic meta surface element of FIG. 2 ;
- FIGS. 5, 6, and 7 schematically show configurations of polarimeters according to example embodiments.
- FIG. 1 schematically shows a configuration of a polarimeter according to an example embodiment.
- the polarimeter includes a light source unit 1 , an anisotropic meta surface element 70 , a detection unit 100 , and a determination unit 150 .
- the light source unit 1 irradiates light of a specific polarization Pa toward a measurement object 50 including an optically active material.
- the anisotropic meta surface element 70 splits reaction light 51 , obtained by the light of the specific polarization Pa emitted from the light source unit 1 reacting with the measurement object 50 , into reaction light 71 and reaction light 75 according to polarization.
- the detection unit 100 detects the reaction light 71 and reaction light 75 obtained by splitting by the anisotropic meta surface element 70 according to the polarization.
- the determination unit 150 calculates a rotation angle of the polarization by the measurement object 50 by comparing detection signals of the reaction light 71 and the reaction light 75 detected by the detection unit 100 .
- the determination unit may comprise a memory and a processor configured to execute software stored in the memory and thereby perform operations, as would be understood by one of skill in the art, on signals received from the detection unit.
- the polarimeter according to the present example embodiment may obtain a characteristic of the measurement object 50 by measuring the polarization rotation by the measurement object 50 .
- the measurement object 50 may include the optically active material.
- a polarization direction and an angle of incident light are influenced by a type and concentration of a material of the measurement object 50 including the optically active material, and thus the polarization rotation by the measurement object 50 may be measured using the polarimeter of the present example embodiment, thereby enabling a glucose analysis or a chemical analysis in food, beverages, and medicine fields.
- the concentration of, for example, steroids, amino acids, vitamins, sugar and the like may be characterized by measuring the polarization rotation by the measurement object 50 using the polarimeter of the present example embodiment.
- the light source unit 1 includes a light source 10 which emits light and a polarizer 30 .
- the light source 10 emits light of a predetermined polarization.
- the predetermined polarization may be arbitrary polarization.
- the predetermined polarization may be any one of a linear polarization, a circular polarization, and an elliptical polarization.
- the polarizer 30 produces light of the specific polarization Pa with respect to the light emitted from the light source 10 such that only the light of the specific polarization Pa is irradiated onto the measurement object 50 .
- the polarizer 30 may include, for example, a meta surface polarizer.
- the meta surface polarizer is a phase mask having a sub-wavelength structure.
- the meta surface polarizer may include an array of high refractive index dielectric three-dimensional shapes, each having a sub wavelength structure, disposed on a low refractive index dielectric substrate.
- the high refractive index is higher than the low refractive index.
- the meta surface polarizer may control a reaction to polarization based on a size difference between two axes of the high refractive index dielectric three-dimensional shape.
- the meta surface polarizer may be arranged to emit light of, for example, linear polarization with respect to the light incident from the light source 10 .
- the meta surface polarizer may include elliptical posts, for example, as the high refractive index dielectric three-dimensional shapes, and an elliptical post array may be arranged such that light of, for example, a linear polarization is emitted, when the light incident from the light source 10 is incident thereon.
- the polarizer 30 may include a general polarizer that allows only light of the specific polarization Pa to pass therethrough, from the light incident from the light source 10
- the light source 10 itself may be configured to emit light of the specific polarization Pa to be irradiated onto the measurement object 50 .
- the polarizer 30 may be omitted.
- the light source unit 1 may further include a filter 20 between the light source 10 and the polarizer 30 .
- the filter 20 may transmit only light of a wavelength band that provides good reactivity with the measurement object 50 .
- the filter 20 may be omitted when the light source 10 itself emits only the light of the wavelength band that provides good reactivity with the measurement object 50 .
- the light of the specific polarization Pa for example light of a linear polarization
- the light source 10 is output from the light source 10 , transmitted through the polarizer 30 , and is incident on the measurement object 50 .
- the incident light reacts with the measurement object 50 .
- the reaction light 51 is thereby output from the measurement object 50 .
- the anisotropic meta surface element 70 may split the reaction light 51 , incident from the measurement object 50 , into first reaction light 71 of a first polarization Pb and second reaction light 75 of a second polarization Pc orthogonal thereto.
- the first polarization Pb and the second polarization Pc may be linear polarizations orthogonal to each other.
- the first polarization Pb may be a horizontal linear polarization
- the second polarization Pc may be a vertical linear polarization.
- the first polarization Pb may be a vertical linear polarization
- the second polarization Pc may be a horizontal linear polarization.
- the anisotropic meta surface element 70 may be a phase mask having sub wavelength structures to split the polarization light 51 into the first reaction light 71 of the first polarization Pb and the second reaction light 75 of the second polarization Pc, and may include a meta surface 70 a having a large birefringence.
- the anisotropic meta surface element 70 may be implemented as a phase mask having a sub wavelength structure, for example, by including an array of high refractive index dielectric three-dimensional shapes of sub wavelength structure on a low refractive index dielectric substrate.
- a low refractive index dielectric substrate for example, a silicon oxide substrate may be used.
- the high refractive index dielectric three-dimensional shapes may be formed of, for example, amorphous silicon.
- a reaction of the reaction light 51 with the anisotropic meta surface element 70 may be controlled by controlling a size difference between the two axes of the high refractive index dielectric three-dimensional shapes.
- the anisotropic meta surface element 70 may include high refractive index dielectric three-dimensional shapes 230 which are elliptical posts 250 , disposed in an array on a low refractive index dielectric substrate 210 , as shown in FIG. 3A .
- the reaction of the reaction light 51 with anisotropic meta surface element 70 may be controlled by controlling a size difference between a major axis and a minor axis of an elliptical cross-section of the elliptical posts 250 .
- the reaction of the reaction light 51 with the anisotropic meta surface element 70 may also be controlled according to an angle formed by the major axis of the elliptical cross-section of the elliptical posts 250 with a direction of the first polarization Pb of the first reaction light 71 or a direction of the second polarization Pc of the second reaction light 75 .
- a silicon oxide substrate for example, may be used as the low refractive index dielectric substrate 210 .
- the high refractive index dielectric three-dimensional shapes 230 may be formed of, for example, amorphous silicon.
- FIG. 3A schematically illustrates an example of the anisotropic meta surface element 70 that may be applied to a polarimeter of FIG. 1
- FIG. 3A is a perspective view illustrating the array of high refractive index dielectric three-dimensional shapes 230 included in the anisotropic meta surface element 70
- FIG. 3B is a plan view showing the array of the high refractive index dielectric three-dimensional shapes 230 of FIG. 3A
- FIG. 3C is a plan view showing a single high refractive index dielectric three-dimensional shape 230 of FIG. 3A .
- the high refractive index dielectric three-dimensional shapes 230 may be elliptical posts 250 formed on the low refractive index dielectric substrate 210 .
- each elliptical post 250 may be formed in a sub wavelength scale such that the meta surface 70 a as shown in FIG. 2 is formed by an array of the elliptical posts 250 .
- the meta surface 70 a of the anisotropic meta surface element 70 is configured as a sub wavelength artificial structure and may be an array of high refractive index dielectric three-dimensional shapes 230 , each having a sub wavelength dimension, for example, an array of the elliptical posts 250 .
- the term sub wavelength refers to a dimension smaller than a wavelength of the light to be incident thereon—i.e. the light to be polarized and split by the anisotropic meta surface element 70 .
- At least one dimension of each of the high refractive index dielectric three-dimensional shapes 230 may be a sub wavelength dimension, for example, a dimension equal to or less than ⁇ /2 when the wavelength of the light to be polarized and split by the anisotropic meta surface element 70 is ⁇ .
- a major axis diameter Da, a minor axis diameter Db, and spacing distances a 1 and a 2 of FIG. 3B between the elliptical posts 250 may be a sub wavelength dimension, for example, a dimension equal to or less than ⁇ /2.
- FIG. 3B is a plan view showing a part of an array of a high dielectric constant three-dimensional shapes forming the anisotropic meta surface element 70 and illustrates an example in which major axes of high dielectric constant three-dimensional shapes, that is, the elliptical posts 250 , form a predetermined angle with respect to an x axis.
- major axes of high dielectric constant three-dimensional shapes that is, the elliptical posts 250
- the angle between a major axis direction of the ellipse of each of the elliptical posts 250 with the x axis may be controlled.
- the reaction of the incident light with the anisotropic meta surface element 70 may be controlled by controlling a size difference between the diameter Da of the major axis and the diameter Db of the minor axis.
- the reaction of the incident light with the anisotropic meta surface element 70 may be controlled by controlling an angle formed between the major axis of each elliptic post 250 forming a meta surface of the anisotropic meta surface element 70 and a direction of the first polarization Pb of the first reaction light 71 and a direction of the first polarization Pb of the second reaction light 75 .
- the reaction of the incident light with the anisotropic meta surface element 70 may be controlled by controlling an angle ⁇ formed by the major axis of each elliptic post 250 forming the meta surface of the anisotropic meta surface element 70 with the x axis.
- the angle ⁇ represents the angle formed by the major axis of the elliptical post 250 with the x axis.
- FIG. 4 illustrates a situation in which the reaction light 51 is received by splitting the reaction light 51 according to polarization into the first reaction light 71 of the first polarization Pb, for example, a horizontal linear polarization and the second reaction light 75 of the second polarization Pc, for example, a vertical linear polarization by the anisotropic meta surface element 70 .
- FIG. 4 shows a comparison of a simulation result and an actual measurement when the anisotropic meta surface element 70 is designed to split the reaction light 51 into the first reaction light 71 and the second reaction light 75 at an angle of about 10 degrees and when the separated first reaction light 71 and second reaction light 75 , is detected for example, at a distance Rd of about 1.5 mm.
- the incident reaction light 51 may be split according to polarization into the first reaction light 71 of the horizontal linear polarization and the second reaction light 75 of the vertical linear polarization, and a result may be obtained that the simulation result and the actual measurement are similar to each other.
- the polarimeter to which the anisotropic meta surface element 70 is applied since a meta surface may be formed on a flat surface to have a high birefringence, the polarimeter may be implemented in a small size.
- the specific polarization Pa of light radiated from the light source unit 1 to the measurement object 50 may be the same as any one of the first polarization Pb and the second polarization Pc of the first reaction light 71 and the second reaction light 75 , respectively.
- the specific polarization Pa may be one of the first polarization Pb and the second polarization Pc.
- FIGS. 1 and 2 illustrate an example in which the specific polarization Pa is a vertical linear polarization, the first polarization Pb of the first reaction light 71 is a horizontal linear polarization, and the second polarization Pc of the second reaction light 75 is the vertical linear polarization.
- the specific polarization Pa may be the horizontal linear polarization, and one of the first polarization Pb and the second polarization Pc may be the vertical linear polarization, and the other one may be the horizontal linear polarization.
- the specific polarization Pa may be, for example, one circular polarization, and one of the first polarization Pb and the second polarization Pc may be the one circular polarization, and the other one may be another orthogonal circular polarization.
- the detection unit 100 may include a plurality of detectors each detecting on of the reaction light 71 and the reaction light 75 , having been separated according to polarization by the anisotropic meta surface element 70 .
- the plurality of detectors may include, for example, a photodiode, a photodiode linear array, a PMT detector or an image sensor.
- the detection unit 100 may include a first detector 101 detecting the first reaction light 71 of the first polarization Pb and a second detector 103 detecting the second reaction light 75 of the second polarization Pc.
- the first reaction light 71 and the second reaction light 75 may be split by the anisotropic meta surface element 70 to form a predetermined angle with each other, and thus the first reaction light 71 and the second reaction light 75 may be incident on the detection unit 100 at different incident angles.
- the first detector 101 and the second detector 103 may each include a point detector or a region detector.
- at least one of the first detector 101 and the second detector 103 may include a photodiode, a photo multiplier tube (PMT) detector, a photodiode linear array, or an image sensor.
- the photodiode and the PMT detector may correspond to point detectors.
- the photodiode linear array and the image sensor correspond to region detectors.
- Detection signals of the reaction light 71 and the reaction light 75 detected by the detection unit 100 are compared in the determination unit 150 .
- the determination unit 150 may calculate a rotation angle of the polarization caused by the measurement object 50 by comparing the detection signals of the reaction light 71 and the reaction light 75 .
- the determination unit 150 may compare a first detection signal S 1 of the first detector 101 to a second detection signal S 2 of the second detector 103 to calculate the rotation angle of the polarization due to the measurement object 50 .
- the polarimeter may split the reaction light 51 of the measurement object 50 into the first reaction light 71 of the first polarization Pb, for example, a horizontal linear polarization and the second reaction light 75 of the second polarization Pc, for example, a vertical linear polarization using the anisotropic meta surface element 70 having a large birefringence, may compare the relative intensities of the first reaction light 71 and the second reaction light 75 , and may thereby calculate the rotation angle of the polarization.
- the first reaction light 71 of the first polarization Pb for example, a horizontal linear polarization
- the second reaction light 75 of the second polarization Pc for example, a vertical linear polarization using the anisotropic meta surface element 70 having a large birefringence
- the anisotropic meta surface element 70 may be used as a polarization splitter, thereby implementing a small-sized polarimeter having a high sensitivity.
- the polarimeter according to an example embodiment may be applied to a glucose analysis and a chemical analysis in food, beverages, and medicine fields.
- the polarimeter according to an example embodiment may be applied to a small-sized glucose detector having a high sensitivity, etc.
- FIG. 5 schematically shows a configuration of a polarimeter according to another example embodiment. As compared with FIG. 1 , there is a difference that the polarimeter of FIG. 5 further includes a spectrometer 60 to detect scattered light such as Raman scattered light from the measurement object 50 .
- a spectrometer 60 to detect scattered light such as Raman scattered light from the measurement object 50 .
- an analysis accuracy of the measurement object 50 may be further improved by combining Raman spectroscopic information and polarization rotation information.
- a Raman spectroscopic signal of the spectrometer 60 may be input to the determination unit 150 .
- the determination unit 150 may combine the Raman spectroscopic information and the polarization rotation information, and thus analysis information of the measurement object 50 may be obtained.
- a separate processing unit may be further provided to combine the Raman spectroscopic signal input from the spectrometer 60 and the polarization rotation information input from the determination unit 150 , and thus the analysis information of the measurement object 50 may be obtained.
- FIGS. 1 and 5 show an example in which the detection unit 100 includes a plurality of detectors, for example, the first detector 101 detecting the first reaction light 71 of the first polarization Pb and the second detector 103 detecting the second reaction light 75 of the second polarization Pc, respectively, to detect the reaction light 71 and the reaction light 75 .
- the polarimeter according to an example embodiment may include a single detector 110 or 130 in the detection unit 100 , as shown in FIG. 6 and FIG. 7 .
- FIG. 6 shows a case in which the detector 100 includes a photodiode linear array as the single detector 110 .
- FIG. 7 shows a case in which the detector 100 includes an image sensor as the single detector 130 .
- FIGS. 6 and 7 illustrate an example in which the spectrometer 60 is additionally provided as shown in FIG. 5 .
- a structure excluding the spectrometer 60 as shown in FIG. 1 , may be provided.
- the detection unit 100 may apply the photodiode linear array or the image sensor as the single detectors 110 and 130 in order to independently detect the reaction light 71 and the reaction light 75 which have been split according to polarization and are incident at different incident angles, for example, the first reaction light 71 of the first polarization Pb and the second reaction light 75 of the second polarization Pc.
- the detection unit 100 includes a single detectors 110 of 130 as shown in FIGS. 6 and 7
- the first detection signal S 1 of the first reaction light 71 and the second detection signal S 2 of the second reaction light 75 detected by the single detectors 110 and 130 are input to the determination unit 150 .
- the determination unit 150 compares the input first detection signal S 1 and second detection signal S 2 and calculates the rotation angle of the polarization.
- the anisotropic meta surface element 70 may be located on a light receiving surface of the detection unit 100 .
- the anisotropic meta surface element 70 may be located on the light receiving surface of the detection unit 100 since no physical distance is required to split the reaction light 51 of the measurement object 50 according to polarization.
- a polarimeter with a more compact size may be implemented.
- polarimeter since an anisotropic meta surface element having a meta surface is applied to a polarization splitter, a small-sized polarimeter having a high rotation angle measurement sensitivity of polarized light passing through an optically active material may be implemented, thereby improving a form factor of the polarimeter.
- the polarimeter may be applied to a glucose analysis and a chemical analysis in food, beverage and medicine fields.
Abstract
Description
Claims (18)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16/146,523 US10578492B2 (en) | 2017-09-29 | 2018-09-28 | Polarimeter for detecting polarization rotation |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762565603P | 2017-09-29 | 2017-09-29 | |
KR1020170154982A KR102623515B1 (en) | 2017-09-29 | 2017-11-20 | Polarimeter for detecting polarization rotation |
KR10-2017-0154982 | 2017-11-20 | ||
US16/146,523 US10578492B2 (en) | 2017-09-29 | 2018-09-28 | Polarimeter for detecting polarization rotation |
Publications (2)
Publication Number | Publication Date |
---|---|
US20190101448A1 US20190101448A1 (en) | 2019-04-04 |
US10578492B2 true US10578492B2 (en) | 2020-03-03 |
Family
ID=65895990
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US16/146,523 Active US10578492B2 (en) | 2017-09-29 | 2018-09-28 | Polarimeter for detecting polarization rotation |
Country Status (1)
Country | Link |
---|---|
US (1) | US10578492B2 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200008630A (en) | 2017-05-24 | 2020-01-28 | 더 트러스티스 오브 콜롬비아 유니버시티 인 더 시티 오브 뉴욕 | Broadband achromatic flat optical component by distributed engineered dielectric metasurface |
JP7461294B2 (en) | 2017-08-31 | 2024-04-03 | メタレンズ,インコーポレイテッド | Transmissive metasurface lens integration |
US20190049781A1 (en) * | 2018-10-05 | 2019-02-14 | Intel Corporation | High efficiency quantum dot liquid crystal displays |
IL272180B (en) * | 2020-01-22 | 2022-07-01 | Evgeny Seider | An apparatus for non-invasive measurement of glucose in blood |
CN112344883B (en) * | 2020-10-30 | 2023-04-07 | 京东方科技集团股份有限公司 | Angle detector and imaging device |
CN113946009B (en) * | 2021-10-27 | 2023-10-03 | 中国科学院光电技术研究所 | Super-structured surface device and design and preparation method thereof |
CN114280716B (en) * | 2021-12-21 | 2024-03-08 | 深圳迈塔兰斯科技有限公司 | Component for optical isolator, optical isolator and device |
US11927769B2 (en) * | 2022-03-31 | 2024-03-12 | Metalenz, Inc. | Polarization sorting metasurface microlens array device |
Citations (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6327037B1 (en) * | 1997-11-12 | 2001-12-04 | Chien Chou | Optical rotation angle polarimeter |
US20030223064A1 (en) * | 2002-05-31 | 2003-12-04 | Michael Anderson | Method and system for canceling system retardance error in an ophthalmological polarimeter |
US20050018290A1 (en) * | 2001-04-05 | 2005-01-27 | Ferenc Kiss | Colour filter means having optical activity under the influence of a polarized light |
US6927853B2 (en) * | 2001-10-28 | 2005-08-09 | Jena-Wave Gmbh | Method and arrangement for optical stress analysis of solids |
US20060193044A1 (en) * | 2005-02-07 | 2006-08-31 | Blum Joel R | Conical refraction polarimeter |
US20070146632A1 (en) * | 2003-08-06 | 2007-06-28 | Arizona Board Of Reg, On Behalf Of The Univ. Of Az | Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications |
US7245952B2 (en) | 2004-01-13 | 2007-07-17 | The University Of Toledo | Noninvasive birefringence compensated sensing polarimeter |
US20090231583A1 (en) * | 2007-09-14 | 2009-09-17 | Roger Smith | Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums |
US20100259759A1 (en) * | 2007-11-28 | 2010-10-14 | Doron Goldberg | Polarimeter employing a fizeau interferometer |
US20110261441A1 (en) * | 2010-04-26 | 2011-10-27 | University Of Southampton | Spectral Filter |
US8718734B2 (en) | 2007-11-07 | 2014-05-06 | The University Of Toledo | Non-invasive polarimetric apparatus and method for analyte sensing in birefringent media |
US20140152988A1 (en) * | 2012-11-30 | 2014-06-05 | Industrial Technology Research Institute | System and method for measuring the rotation angle of optical active substance |
US20150002791A1 (en) * | 2013-06-26 | 2015-01-01 | Samsung Display Co., Ltd. | Polarizer, a display panel having the same and a method of manufacturing the same |
US9116302B2 (en) | 2008-06-19 | 2015-08-25 | Ravenbrick Llc | Optical metapolarizer device |
US20160341859A1 (en) | 2015-05-22 | 2016-11-24 | Board Of Regents, The University Of Texas System | Tag with a non-metallic metasurface that converts incident light into elliptically or circularly polarized light regardless of polarization state of the incident light |
JP6057606B2 (en) | 2012-03-19 | 2017-01-11 | 旭化成株式会社 | Optical element and manufacturing method thereof |
US20170351017A1 (en) * | 2016-06-01 | 2017-12-07 | Wuhan China Star Optoelectronics Technology Co., Ltd. | POLARIZING FILM and DISPLAY DEVICE HAVING the POLARIZING FILM |
US20180307132A1 (en) * | 2017-04-17 | 2018-10-25 | Washington University | Systems and methods for performing optical imaging using a tri-spot point spread function (psf) |
-
2018
- 2018-09-28 US US16/146,523 patent/US10578492B2/en active Active
Patent Citations (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6327037B1 (en) * | 1997-11-12 | 2001-12-04 | Chien Chou | Optical rotation angle polarimeter |
US20050018290A1 (en) * | 2001-04-05 | 2005-01-27 | Ferenc Kiss | Colour filter means having optical activity under the influence of a polarized light |
US6927853B2 (en) * | 2001-10-28 | 2005-08-09 | Jena-Wave Gmbh | Method and arrangement for optical stress analysis of solids |
US20030223064A1 (en) * | 2002-05-31 | 2003-12-04 | Michael Anderson | Method and system for canceling system retardance error in an ophthalmological polarimeter |
US20070146632A1 (en) * | 2003-08-06 | 2007-06-28 | Arizona Board Of Reg, On Behalf Of The Univ. Of Az | Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications |
US7245952B2 (en) | 2004-01-13 | 2007-07-17 | The University Of Toledo | Noninvasive birefringence compensated sensing polarimeter |
US20060193044A1 (en) * | 2005-02-07 | 2006-08-31 | Blum Joel R | Conical refraction polarimeter |
US20090231583A1 (en) * | 2007-09-14 | 2009-09-17 | Roger Smith | Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums |
US8718734B2 (en) | 2007-11-07 | 2014-05-06 | The University Of Toledo | Non-invasive polarimetric apparatus and method for analyte sensing in birefringent media |
US20100259759A1 (en) * | 2007-11-28 | 2010-10-14 | Doron Goldberg | Polarimeter employing a fizeau interferometer |
US9116302B2 (en) | 2008-06-19 | 2015-08-25 | Ravenbrick Llc | Optical metapolarizer device |
US20110261441A1 (en) * | 2010-04-26 | 2011-10-27 | University Of Southampton | Spectral Filter |
JP6057606B2 (en) | 2012-03-19 | 2017-01-11 | 旭化成株式会社 | Optical element and manufacturing method thereof |
US20140152988A1 (en) * | 2012-11-30 | 2014-06-05 | Industrial Technology Research Institute | System and method for measuring the rotation angle of optical active substance |
US20150002791A1 (en) * | 2013-06-26 | 2015-01-01 | Samsung Display Co., Ltd. | Polarizer, a display panel having the same and a method of manufacturing the same |
US20160341859A1 (en) | 2015-05-22 | 2016-11-24 | Board Of Regents, The University Of Texas System | Tag with a non-metallic metasurface that converts incident light into elliptically or circularly polarized light regardless of polarization state of the incident light |
US20170351017A1 (en) * | 2016-06-01 | 2017-12-07 | Wuhan China Star Optoelectronics Technology Co., Ltd. | POLARIZING FILM and DISPLAY DEVICE HAVING the POLARIZING FILM |
US20180307132A1 (en) * | 2017-04-17 | 2018-10-25 | Washington University | Systems and methods for performing optical imaging using a tri-spot point spread function (psf) |
Non-Patent Citations (2)
Title |
---|
Arbabi et al., "Dielectric Metasurfaces for Complete Control of Phase and Polarization with Subwavelength Spatial Resolution and High Transmission", Nature Nanotechnology, Aug. 3, 2015, 27 pages. |
Zhao et al. ("Optical polarization beam splitting through anisotropic metamaterial slab realized by layered metal-dielectric system", 2007 Asia Optical Fiber Comunication and Optoelectronics Conference) (Year: 2007). * |
Also Published As
Publication number | Publication date |
---|---|
US20190101448A1 (en) | 2019-04-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10578492B2 (en) | Polarimeter for detecting polarization rotation | |
KR102623515B1 (en) | Polarimeter for detecting polarization rotation | |
US10444300B2 (en) | Magnetic field measuring device and method for manufacturing magnetic field measuring device | |
US20180066991A1 (en) | Polarization-selective scattering antenna arrays based polarimeter | |
KR20200000435A (en) | Mobile terminal | |
JP6825237B2 (en) | Magnetic field measuring device, manufacturing method of magnetic field measuring device | |
US7889339B1 (en) | Complementary waveplate rotating compensator ellipsometer | |
US7812955B2 (en) | Sample analysis apparatus and analysis method | |
JP4455024B2 (en) | Birefringence measuring device | |
US10393579B2 (en) | Miniature spectrometer and a spectroscopic method | |
US8107075B2 (en) | Optical characteristic measuring apparatus and optical characteristics measuring method | |
US10667692B2 (en) | Coherent optical imaging for detecting neural signatures and medical imaging applications using common-path coherent optical techniques | |
JP6878553B2 (en) | Semiconductor wafer inspection and weighing systems and methods | |
US8976354B2 (en) | Polarization state measurement apparatus and polarization state measurement method | |
US6483584B1 (en) | Device for measuring the complex refractive index and thin film thickness of a sample | |
US6417924B1 (en) | Surface plasmon sensor obtaining total reflection break angle based on difference from critical angle | |
US9535200B2 (en) | Complete-stokes fourier-domain imaging polarimeter | |
US8976360B2 (en) | Surface plasmon sensor and method of measuring refractive index | |
KR102007004B1 (en) | Apparatus for measuring three dimensional shape | |
KR100336696B1 (en) | Apparatus and method for detecting polarization | |
JP5991230B2 (en) | Phase difference measuring method and apparatus | |
JP4173628B2 (en) | Surface plasmon resonance measuring device | |
US9823183B2 (en) | Extending the range of turbidity measurement using polarimetry | |
Lombardo et al. | An auto-aligning photopolarimeter | |
KR101198012B1 (en) | Surface plasmon resonance Bio-sensor scheme using active feedback |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
AS | Assignment |
Owner name: CALIFORNIA INSTITUTE OF TECHNOLOGY, CALIFORNIA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:LEE, DUHYUN;FARAON, ANDREI;ARBABI, EHSAN;AND OTHERS;SIGNING DATES FROM 20180924 TO 20180927;REEL/FRAME:047030/0762 Owner name: SAMSUNG ELECTRONICS CO., LTD., KOREA, REPUBLIC OF Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:LEE, DUHYUN;FARAON, ANDREI;ARBABI, EHSAN;AND OTHERS;SIGNING DATES FROM 20180924 TO 20180927;REEL/FRAME:047030/0762 |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 4 |