CN107483110A - A kind of multichannel light emission module PI curve acquisition method and system - Google Patents
A kind of multichannel light emission module PI curve acquisition method and system Download PDFInfo
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- CN107483110A CN107483110A CN201710720304.9A CN201710720304A CN107483110A CN 107483110 A CN107483110 A CN 107483110A CN 201710720304 A CN201710720304 A CN 201710720304A CN 107483110 A CN107483110 A CN 107483110A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/077—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using a supervisory or additional signal
- H04B10/0779—Monitoring line transmitter or line receiver equipment
Abstract
The invention discloses a kind of multichannel light emission module PI curve acquisition method and system, by obtaining the optical power value for each passage that light emission module is at a temperature of set environment, each passage light emitting devices is under different operating current value, the optical power value of each passage and the PI curves of light emitting devices working current value are generated;Judge that the optical power value on each curve whether in the range of setting performance number, if it is not, then readjusting the structure of light emission module, re-executes above-mentioned steps.Therefore, method of the invention, solve the problems, such as to lack PI curve numerical procedures present in prior art, the PI curves of each passage can be obtained simultaneously;And can whether qualified according to PI curve detections optical transceiver module, if unqualified, optical transceiver module is adjusted again, is advantageous to the screening in advance of defective products, greatly improves the qualification rate of product, reduces mass loss.
Description
Technical field
The invention belongs to optical communication technology field, is to be related to a kind of multichannel light emission module PI curves to obtain specifically
Take method and system.
Background technology
The working current value Ia of optical power value P and light emitting devices relation curve(That is PI curves)It is light with Extinction ratio
The important technical indicator of transmitter module.
At present in the coupled system of industry or equipment, PI relation curves and ER solution are not calculated, without simultaneously
Processing(Obtain data, calculate generation and automatic decision, storage)The PI curves of each passage of multichannel light emission module and disappear
Solution of the light than ER, it is unfavorable for the screening in advance of defective products.
The content of the invention
The invention provides a kind of multichannel light emission module PI curve acquisition methods, solve and lack PI in the prior art
The problem of curve numerical procedure, the PI curves of each passage can be obtained simultaneously.
In order to solve the above technical problems, the present invention is achieved using following technical proposals:
A kind of multichannel light emission module PI curve acquisition methods, methods described include:
(1)Acquisition light emission module is at a temperature of set environment, each passage light emitting devices is each under different operating current value
The optical power value of passage;Minimum setting electric current value≤working current value≤maximum setting electric current value;
(2)Generate the optical power value of each passage and the PI curves of working current value;
(3)Judge the optical power value of each curve whether in the range of setting performance number;
If it is not, then readjust the structure of light emission module, return to step(1).
Further, the step(1)Specifically include:The working current value of light emitting devices is controlled from minimum setting electric current
Value increases to maximum setting electric current value, obtains the optical power value of each passage under each working current value.
Further, digital regulation resistance is changed by the input parameter for the digital regulation resistance for changing light emission module
Resistance value, so as to change the working current value of the light emitting devices of each passage of light emission module, make its working current value from minimum
Setting electric current value increases to maximum setting electric current value.
Further, methods described also includes:
When the optical power value on each curve is being set in the range of performance number,
(4)Selected working current value Ia and regulation current value Ib;
(5)Calculate Imin=Ia-Ib/2, Imax=Ia+Ib/2;
(6)According to corresponding to the PI curves of each passage at a temperature of set environment obtain Imin respectively optical power value Pmin,
Performance number Pmax corresponding to Imax;
(7)Calculate Extinction ratio=10Log of each passage(Pmax/Pmin).
Further, in the step(7)Afterwards, methods described also includes:
(8)Whether the extinction ratio for judging to calculate is in the range of setting extinction ratio;
If it is not, then readjust the structure of light emission module, return to step(1).
Preferably, the structure for readjusting light emission module, is specifically included:Adjust the coupling position of light emitting devices
Put, or re-replace light emitting devices.
Further, in step(4)In, Ia=(Minimum setting electric current value+maximum setting electric current value)/2.
Preferably, the extinction ratio scope that sets is the dB of 1dB~10.
A kind of multichannel light emission module PI curve acquisition systems, the system include:
Power supply, for being powered for light emission module;
Multichannel optical power meter, the optical power value of each passage for obtaining light emission module;
Control module, the working current value of the light emitting devices of each passage for controlling light emission module is from minimum setting electric current
Value increases to maximum setting electric current value;
Memory module, for storing working current value and corresponding optical power value;
Generation module, for generating the optical power value of each passage and the PI curves of working current value;
PI curve judge modules, for judging the optical power value on each curve whether in the range of setting performance number.
Further, the system also includes:
Chosen module, for selecting working current value Ia and regulation current value Ib;
Computing module, for calculating Imin=Ia-Ib/2, Imax=Ia+Ib/2;
Maximum/small-power value acquisition module, for being obtained respectively according to the PI curves of each passage at a temperature of set environment
Performance number Pmax corresponding to optical power value Pmin, Imax corresponding to Imin;
Extinction ratio computing module, for calculating Extinction ratio=10Log of each passage(Pmax/Pmin);
Whether extinction ratio judge module, the extinction ratio for judging to calculate are being set in the range of extinction ratio.
Compared with prior art, the advantages and positive effects of the present invention are:The multichannel light emission module PI of the present invention is bent
Line acquisition methods and system, by obtain light emission module at a temperature of set environment, each passage light emitting devices is in different works
Make the optical power value of each passage under current value;Generate the optical power value and light emitting devices working current value of each passage
PI curves;Judge the optical power value on each curve whether in the range of setting performance number;If it is not, then readjust light transmitting
The structure of module, re-executes above-mentioned steps;Therefore, the method for the present embodiment, solves and lacks PI present in prior art
The problem of curve numerical procedure, the PI curves of each passage can be obtained simultaneously;And it can be received and dispatched according to PI curve detections light
Whether module is qualified, if unqualified, optical transceiver module is adjusted again, is advantageous to the screening in advance of defective products, significantly
The qualification rate of product is improved, reduces mass loss.
After the embodiment of the present invention is read in conjunction with the figure, the other features and advantages of the invention will become more clear
Chu.
Brief description of the drawings
Fig. 1 is the flow of one embodiment of multichannel light emission module PI curve acquisition methods proposed by the invention
Figure;
Fig. 2 is resistance value Ra and input parameter α graph of a relation;
Fig. 3 is operating current Ia and resistance value Ra graph of a relation;
Fig. 4 is optical power value P and working current value Ia graph of relation;
Fig. 5 is the structured flowchart of one embodiment of multichannel light emission module PI curve acquisition systems proposed by the invention.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, below with reference to drawings and examples,
The present invention is described in further detail.
The multichannel light emission module PI curve acquisition methods of the present invention, power supply are powered to light emission module, light hair
Each passage Output optical power of module is penetrated, the luminous power of each passage is accessed into Multichannel optical power meter using optical patchcord, it is more
Channel optical power meter detects to obtain the performance number of each passage, and then computer records, judged the optical power value of each passage.
The multichannel light emission module PI curve acquisition methods of the present embodiment, mainly comprise the steps, referring to Fig. 1 institutes
Show.
Step S11:Acquisition light emission module is at a temperature of set environment, each passage light emitting devices is in different operating electric current
The optical power value of each passage under value;Minimum setting electric current value≤working current value≤maximum setting electric current value.
A light emitting devices is respectively provided with each passage of light emission module(Such as laser), light emitting devices is in work
Light extraction is issued as current value.
The acquisition of PI relation curves is, it is necessary to obtain the luminous power P under the conditions of different operating current value Ia, and establish both
Corresponding relation.
The working current value of the light emitting devices of each passage is controlled to increase to maximum setting electric current from minimum setting electric current value
Value, the optical power value of each passage under each working current value is obtained by Multichannel optical power meter, then record storage is not
Optical power value P under same working current value Ia and different operating current value Ia.Because working current value Ia is bigger, luminous power
P is bigger, therefore, when working current value increases to maximum setting electric current value from minimum setting electric current value, the luminous power P of acquisition
By small and big, it is easy to the generation of the record and later stage PI curve of data.
Because data sample amount is more, the PI curves of generation are more accurate, therefore, in order to obtain as far as possible more working current values
It is as small as possible with optical power value, the stepped intervals of working current value.The scope of working current value(I.e. minimum setting electric current value, most
The value of big setting electric current value)It can be set.
In the present embodiment, for the ease of changing working current value, by controlling the digital regulation resistance in light emission module
Input parameter α change the resistance value of digital regulation resistance, so as to changing the work of the light emitting devices of each passage of light emission module
Make current value Ia, its working current value is increased to maximum setting electric current value from minimum setting electric current value.
Digital regulation resistance uses digital control scheme adjusting resistance value.For example, input parameter α and resistance value Ra relation for Ra=
300/(α-2), by changing α value, so as to change Ra.For example, resistance value Ra and input parameter α relation is as shown in Fig. 2 work
Make electric current Ia and resistance value Ra relation as shown in figure 3, in figure 3, under same Ra values, temperature T is higher, and Ia is bigger, temperature T=-
To be bottom one, Ia-Ra relation curves during temperature T=- 80 DEG C are topmost one for Ia-Ra relation curves at 40 DEG C.
Digital regulation resistance is arranged in Optical Receivers, changes the input parameter α of potentiometer, so as to change digital current potential
The resistance value of device, and then change the working current value Ia of each passage light emitting devices.For example, in the constant situation of operating voltage
Under, be connected by the connection in series-parallel of other resistance inside digital regulation resistance and Optical Receivers, Ia and α relation be the α of Ia=9/
(150-α), α ∈ [10,90], calculated according to the formula, obtain Ia ∈ [0.643mA, 13.5 mA].
α value is controlled since 1, every setting time(Such as 20 ms~30ms)Add 1, until increasing to 90;So that
Working current value Ia gradually increases to 13.5 mA since 0.643mA.Record each working current value Ia, and each work
Make the optical power value of each passage under current value Ia.
Step S12:Generate the optical power value of each passage and the PI curves of light emitting devices working current value.
It is raw according to the optical power value of each passage under the working current value Ia and each working current value Ia recorded
Into optical power value and the relation curve of working current value, i.e. PI curves, as shown in Figure 4.
Step S13:Judge the optical power value of each curve whether in the range of setting performance number.
Judge the optical power value of the PI curves of each passage whether in the range of setting performance number.
If it is not, the PI curves of explanation light emission module are unqualified, it is necessary to readjust the structure of light emission module, return walks
Rapid S11.
Readjusting the structure of light emission module includes many aspects, such as the coupling position of adjustment light emitting devices and optical port
Put, or re-replace light emitting devices etc..The light that light emitting devices is sent projects through optical port, transmission at most channel optical power
Meter.
If so, the PI curves of i.e. each passage are qualified, illustrate that the PI curves of light emission module are qualified.
The multichannel light emission module PI curve acquisition methods of the present embodiment, by obtaining light emission module in set environment
At a temperature of, the optical power value of each passage of each passage light emitting devices under different operating current value;Generate each passage
The PI curves of optical power value and light emitting devices working current value;Judge the optical power value on each curve whether in setting work(
In the range of rate value;If it is not, then readjusting the structure of light emission module, above-mentioned steps are re-executed;Therefore, the side of the present embodiment
Method, solve the problems, such as to lack PI curve numerical procedures present in prior art, the PI that can obtain each passage simultaneously is bent
Line;And can whether qualified according to PI curve detections optical transceiver module, if unqualified, optical transceiver module is adjusted again
It is whole, be advantageous to the screening in advance of defective products, greatly improve the qualification rate of product, reduce mass loss.
At a temperature of each set environment, if the structure for readjusting light emission module reaches setting number(Such as 2 times)Afterwards,
The PI curves of light emission module are still unqualified, then judge the product for waste product, and flow terminates, without carrying out subsequent step again.
Set environment temperature can be configured according to the actual requirements, for example, being that the limit is high by set environment temperature setting
Temperature or limit low temperature, step S11~S13 is performed, obtain the PI curves of limit high temperature or each passage under limit low temperature, so
Judge whether product is qualified according to PI curves afterwards, so as to which the defective products under the conditions of extremely temperature is screened in advance.
In the present embodiment, change set environment temperature, re-execute step S11~S13, obtain varying environment temperature
Under each passage PI curves, it is hereby achieved that full warm area(Full warm area, i.e., from limit low temperature to the scope of limit high temperature)
Under the conditions of each passage PI curves.
When the optical power value on each PI curves is being set in the range of performance number, PI curves can also be utilized to calculate and disappeared
Light compares ER.Following step is specifically included, it is shown in Figure 1.
Step S14:Selected working current value Ia and regulation current value Ib.
Working current value Ia is selected, under the operating current, light emitting devices is in linear work area.In the present embodiment,
Selected working current value Ia=(Minimum setting electric current value+maximum setting electric current value)/ 2, i.e. working current value Ia takes median,
To cause Imin that S15 calculates and Imax also to cause light emitting devices to be located at linear work area.Such as Ia=4.5mA.Ib according to
Actual demand is selected, such as Ib=2mA.
Step S15:Calculate Imin=Ia-Ib/2, Imax=Ia+Ib/2.
Under Imin and Imax, light emitting devices is located at linear work area.
Step S16:The luminous power according to corresponding to the PI curves of each passage at a temperature of set environment obtain Imin respectively
Performance number Pmax corresponding to value Pmin, Imax.
Step S17:Calculate Extinction ratio=10Log of each passage(Pmax/Pmin).
For example, the performance number corresponding to optical power value P1min, Imax according to corresponding to the PI curves of passage 1 obtain Imin
P1max, ER1=10Log(P1max/P1min).
The performance number P2max corresponding to optical power value P2min, Imax according to corresponding to the PI curves of passage 2 obtain Imin,
ER2=10Log(P2max/P2min).
Using above-mentioned steps, the ER values of each passage under varying environment temperature conditionss can be obtained.
Step S18:Whether the extinction ratio for judging to calculate is in the range of setting extinction ratio.
Judge the extinction ratio of each passage whether in the range of setting extinction ratio.
If it is not, then illustrating that the Extinction ratio of light emission module is unqualified, it is necessary to readjust the structure of light emission module, return
Return step S11.
Readjusting the structure of light emission module includes many aspects, such as the coupling position of adjustment light emitting devices and optical port
Put, or re-replace light emitting devices etc..
If so, the extinction ratio of i.e. each passage is qualified, then illustrate that the Extinction ratio of light emission module is qualified, terminate stream
Journey.
In the present embodiment, extinction ratio scope is set as the dB of 1dB~10.Within the range, the performance of light emission module compared with
It is good, avoid influenceing the sensitivity of Optical Receivers.
The method of the present embodiment, using the PI curves of each passage, the extinction ratio of each passage is calculated, and can root
It is whether qualified according to extinction ratio detection optical transceiver module, if unqualified, optical transceiver module is adjusted again, greatly improves production
The qualification rate of product, reduce mass loss.
At a temperature of each set environment, if the structure for readjusting light emission module reaches setting number(Such as 2 times)Afterwards,
The ER of light emission module is still unqualified, then judges the product for waste product, flow terminates.
The method of the present embodiment, can be in coupling procedure(That is the optical registration process of light emitting devices and optical port), to full temperature
The PI curves and Extinction ratio of all passages of multichannel light emission module under the conditions of area calculate and judge in real time;Can be with
Defective products is screened and isolated in advance, yield rate is greatly improved and reduces mass loss.The method of the present embodiment can extensive use
The development and production of multichannel light emission module in optical communications industry.
The method of the present embodiment, automatically and simultaneously detect the optical power value P of each passage of multichannel light emission module;Automatically
And the PI relation curves of each passage of generation multichannel light emission module are calculated simultaneously;Automatically and simultaneously calculate multichannel light hair
Penetrate the Extinction ratio value of each passage of module;Calculate the PI relation curves and ER under the conditions of full warm area;Automatically and simultaneously by above-mentioned light
The data such as performance number P, PI relation curve and ER values are judged, stored.
The method of the present embodiment, realize luminous power P, the PI relation curve and ER of each passage of multichannel light emission module
Calculating, judgement and storage data function, effectively improve production efficiency.
The method of the present embodiment, solve the problems, such as to lack PI curves and ER numerical procedures present in prior art, can
To obtain the PI curves of each passage simultaneously, and the ER values of each passage are further calculated, condition of different temperatures can be obtained
Under each passage PI curves and ER values;And can whether qualified according to PI curves and ER values detection optical transceiver module, if
It is unqualified, then optical transceiver module is adjusted again, is advantageous to the screening in advance of defective products, greatly improves the qualified of product
Rate, reduce mass loss.
Based on the design of above-mentioned multichannel light emission module PI curve acquisition methods, the present embodiment also proposed a kind of more logical
Road light emission module PI curve acquisition systems, the system include power supply, Multichannel optical power meter, control module, storage
Module, generation module, PI curves judge module, chosen module, computing module, maximum/small-power value acquisition module, extinction ratio meter
Module, extinction ratio judge module etc. are calculated, it is shown in Figure 5.
Power supply, for being powered for light emission module.
Multichannel optical power meter, the optical power value of each passage for obtaining light emission module.
Control module, the working current value of the light emitting devices of each passage for controlling light emission module are set from minimum
Current value increases to maximum setting electric current value.
Memory module, for storing working current value and corresponding optical power value.
Generation module, for generating the optical power value of each passage and the PI curves of working current value.
PI curve judge modules, for judging the optical power value on each curve whether in the range of setting performance number.
Chosen module, for selecting working current value Ia and regulation current value Ib;
Computing module, for calculating Imin=Ia-Ib/2, Imax=Ia+Ib/2;
Maximum/small-power value acquisition module, for being obtained respectively according to the PI curves of each passage at a temperature of set environment
Performance number Pmax corresponding to optical power value Pmin, Imax corresponding to Imin;
Extinction ratio computing module, for calculating Extinction ratio=10Log of each passage(Pmax/Pmin);
Whether extinction ratio judge module, the extinction ratio for judging to calculate are being set in the range of extinction ratio.
Control module, memory module, generation module, PI curves judge module, chosen module, computing module, maximum/small work(
Rate value acquisition module, extinction ratio computing module, extinction ratio judge module, are integrated in same computer.
The course of work of specific multichannel light emission module PI curve acquisition systems, launches in above-mentioned multichannel light
It is described in detail in module PI curve acquisition methods, it will not go into details herein.
The multichannel light emission module PI curve acquisition systems of the present embodiment, by obtaining light emission module in set environment
At a temperature of, the optical power value of each passage of each passage light emitting devices under different operating current value;Generate each passage
The PI curves of optical power value and light emitting devices working current value;Judge the optical power value on each curve whether in setting work(
In the range of rate value;If it is not, then readjusting the structure of light emission module, above-mentioned steps are re-executed;Therefore, the side of the present embodiment
Method, solve the problems, such as to lack PI curve numerical procedures present in prior art, the PI that can obtain each passage simultaneously is bent
Line;And can whether qualified according to PI curve detections optical transceiver module, if unqualified, optical transceiver module is adjusted again
It is whole, be advantageous to the screening in advance of defective products, greatly improve the qualification rate of product, reduce mass loss.Utilize the PI of each passage
Curve, the extinction ratio of each passage is calculated, and can whether qualified according to extinction ratio detection optical transceiver module, if not conforming to
Lattice, then optical transceiver module is adjusted again, greatly improves the qualification rate of product, reduce mass loss.
The above embodiments are merely illustrative of the technical solutions of the present invention, rather than is limited;Although with reference to foregoing reality
Example is applied the present invention is described in detail, for the person of ordinary skill of the art, still can be to foregoing implementation
Technical scheme described in example is modified, or carries out equivalent substitution to which part technical characteristic;And these are changed or replaced
Change, the essence of appropriate technical solution is departed from the spirit and scope of claimed technical solution of the invention.
Claims (10)
- A kind of 1. multichannel light emission module PI curve acquisition methods, it is characterised in that:Methods described includes:(1)Acquisition light emission module is at a temperature of set environment, each passage light emitting devices is each under different operating current value The optical power value of passage;Minimum setting electric current value≤working current value≤maximum setting electric current value;(2)Generate the optical power value of each passage and the PI curves of light emitting devices working current value;(3)Judge the optical power value of each curve whether in the range of setting performance number;If it is not, then readjust the structure of light emission module, return to step(1).
- 2. according to the method for claim 1, it is characterised in that:The step(1)Specifically include:The working current value of control light emitting devices increases to maximum setting electric current value from minimum setting electric current value, obtains each work Make the optical power value of each passage under current value.
- 3. according to the method for claim 2, it is characterised in that:By the input for the digital regulation resistance for changing light emission module Parameter changes the resistance value of digital regulation resistance, so as to changing the operating current of the light emitting devices of each passage of light emission module Value, makes its working current value increase to maximum setting electric current value from minimum setting electric current value.
- 4. according to the method in any one of claims 1 to 3, it is characterised in that:Methods described also includes:When the optical power value on each curve is being set in the range of performance number,(4)Selected working current value Ia and regulation current value Ib;(5)Calculate Imin=Ia-Ib/2, Imax=Ia+Ib/2;(6)According to corresponding to the PI curves of each passage at a temperature of set environment obtain Imin respectively optical power value Pmin, Performance number Pmax corresponding to Imax;(7)Calculate Extinction ratio=10Log of each passage(Pmax/Pmin).
- 5. according to the method for claim 4, it is characterised in that:In the step(7)Afterwards, methods described also includes:(8)Whether the extinction ratio for judging to calculate is in the range of setting extinction ratio;If it is not, then readjust the structure of light emission module, return to step(1).
- 6. according to the method for claim 5, it is characterised in that:The structure for readjusting light emission module, specific bag Include:The coupling position of light emitting devices is adjusted, or re-replaces light emitting devices.
- 7. according to the method for claim 4, it is characterised in that:In step(4)In, Ia=(Minimum setting electric current value+maximum Setting electric current value)/2.
- 8. according to the method for claim 5, it is characterised in that:The extinction ratio scope that sets is the dB of 1dB~10.
- A kind of 9. multichannel light emission module PI curve acquisition systems, it is characterised in that:The system includes:Power supply, for being powered for light emission module;Multichannel optical power meter, the optical power value of each passage for obtaining light emission module;Control module, the working current value of the light emitting devices of each passage for controlling light emission module is from minimum setting electric current Value increases to maximum setting electric current value;Memory module, for storing working current value and corresponding optical power value;Generation module, for generating the optical power value of each passage and the PI curves of working current value;PI curve judge modules, for judging the optical power value on each curve whether in the range of setting performance number.
- 10. system according to claim 9, it is characterised in that:The system also includes:Chosen module, for selecting working current value Ia and regulation current value Ib;Computing module, for calculating Imin=Ia-Ib/2, Imax=Ia+Ib/2;Maximum/small-power value acquisition module, for being obtained respectively according to the PI curves of each passage at a temperature of set environment Performance number Pmax corresponding to optical power value Pmin, Imax corresponding to Imin;Extinction ratio computing module, for calculating Extinction ratio=10Log of each passage(Pmax/Pmin);Whether extinction ratio judge module, the extinction ratio for judging to calculate are being set in the range of extinction ratio.
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101013924A (en) * | 2005-11-21 | 2007-08-08 | 英特尔公司 | Controlling optical power and extincation ratio of a semiconductor laser |
CN201344841Y (en) * | 2009-01-22 | 2009-11-11 | 武汉电信器件有限公司 | Optical power, drive current and voltage graphic instrument for semiconductor laser |
CN102340350A (en) * | 2011-10-31 | 2012-02-01 | 索尔思光电(成都)有限公司 | DDMI (digital diagnostic monitoring interface) optical module transmitter circuit and optical power monitoring method for same |
CN106324469A (en) * | 2016-09-30 | 2017-01-11 | 深圳新飞通光电子技术有限公司 | Multiplex PIV (peak inverse voltage) testing system suitable for optical transmitter module and testing method of multiplex PIV testing system |
CN106441806A (en) * | 2016-08-31 | 2017-02-22 | 中国人民解放军国防科学技术大学 | Semiconductor laser degradation testing and service life prediction experimental platform |
-
2017
- 2017-08-21 CN CN201710720304.9A patent/CN107483110A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101013924A (en) * | 2005-11-21 | 2007-08-08 | 英特尔公司 | Controlling optical power and extincation ratio of a semiconductor laser |
CN201344841Y (en) * | 2009-01-22 | 2009-11-11 | 武汉电信器件有限公司 | Optical power, drive current and voltage graphic instrument for semiconductor laser |
CN102340350A (en) * | 2011-10-31 | 2012-02-01 | 索尔思光电(成都)有限公司 | DDMI (digital diagnostic monitoring interface) optical module transmitter circuit and optical power monitoring method for same |
CN106441806A (en) * | 2016-08-31 | 2017-02-22 | 中国人民解放军国防科学技术大学 | Semiconductor laser degradation testing and service life prediction experimental platform |
CN106324469A (en) * | 2016-09-30 | 2017-01-11 | 深圳新飞通光电子技术有限公司 | Multiplex PIV (peak inverse voltage) testing system suitable for optical transmitter module and testing method of multiplex PIV testing system |
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Application publication date: 20171215 |