CN107430061B - Techniques for temperature control of polarimeter sample chambers - Google Patents
Techniques for temperature control of polarimeter sample chambers Download PDFInfo
- Publication number
- CN107430061B CN107430061B CN201680021520.8A CN201680021520A CN107430061B CN 107430061 B CN107430061 B CN 107430061B CN 201680021520 A CN201680021520 A CN 201680021520A CN 107430061 B CN107430061 B CN 107430061B
- Authority
- CN
- China
- Prior art keywords
- sample
- sample tube
- thermal
- tube adapter
- thermal assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/0332—Cuvette constructions with temperature control
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
An apparatus characterized by: a sample tube adapter made of a conductive material having a first portion to contain and contact a sample tube having a sample therein and a second portion to provide a thermal path for heat transfer to and from the sample tube and a thermal assembly for performing sample analysis; and a sample support rail that receives the sample tube adapter to provide physical support for the sample tube, orients the sample tube adapter relative to the thermal assembly such that there is contact between the sample tube adapter and the thermal assembly to provide a thermal path for heat transfer to and from the sample tube and the thermal assembly, and aligns the sample tube adapter relative to the light source such that there is registration between the sample tube and a light beam provided by the light source, all for performing sample analysis.
Description
Cross Reference to Related Applications
This application claims the benefit of U.S. provisional application No.62/117,296 (attorney docket No.911-022.003-1// NB & S-X0002US), filed on 17.2.2015, which is incorporated herein by reference in its entirety.
Technical Field
The present invention relates to a technique for implementing a peltier controlled sample in a polarimeter.
Background
As will be understood by those skilled in the art, a polarimeter is an instrument known in the art for measuring the optical activity exhibited by an optically active substance. In operation, the plane of polarization of a linearly polarized light beam may rotate when passing through an optically active substance, and the rotation may be determined by the specific substance, the concentration of that substance, and the optical path length of the light through the substance contained in the sample chamber, whereby the concentration of the specific substance may be calculated by the measured rotation. The optical rotation may also be affected by the temperature of the substance contained in the sample chamber, and therefore it may be desirable and in many cases required by regulatory regulations that the temperature of the sample substance be controlled at a set point for accurate measurement.
In this context, and by way of example, some known techniques for implementing peltier control of a sample using such a polarimeter may include the following:
known techniques for implementing peltier-controlled samples in polarimeters may include the use of a sample chamber of cylindrical tubing in order to minimize the amount of sample material, known as "dead volume", in the chamber but not in the optical path. Flanges are provided at opposite ends of the sample chamber, with a beam aperture in each flange for allowing the polarized beam to pass through. The dimensions of these flanges are typically standard dimensions for properly positioning the sample chamber in the optical path when a pair of flanges are seated on a housing formed by parallel rails. The flange may be removed from the sample chamber to allow cleaning of the sample chamber. Temperature control of the sample material is achieved by circulating water in a water jacket around the outer surface of the sample chamber containing the sample material. The water jacket is formed by an external pipe communicating with a water pipe connected to a water source at a predetermined temperature. However, as can be appreciated by those skilled in the art, such a water temperature control system including a water jacket and a cooling pipe is complicated in structure. Furthermore, as will also be appreciated by those skilled in the art, connecting and disconnecting tubing while washing the chamber and changing samples is inconvenient, and changing the temperature set point can take a long time.
Other known techniques for implementing peltier control of a sample in a polarimeter may include thermoelectric temperature control techniques such as a thermoelectric cooler (TEC). For example, the temperature of one side of a typical plate-shaped TEC device is controllable by current. Heat can be made to flow through the device in either direction as desired. The TEC elements with heat sinks are arranged to be thermally conductive to a rectangular chamber mount that houses a rectangular sample chamber. The polarized light beam passes through the sample chamber via an aperture provided in the housing. The solid TEC elements appear to eliminate the complexity and inconvenience of the water plumbing required in conventional cylindrical chamber samples. Furthermore, the temperature of the seat and thus of the sample chamber can be easily and quickly controlled at the set point. However, rectangular sample chambers have a large dead volume and require a large sample volume to fill. This is costly when the measured substance is expensive. Another problem with this rectangular design is represented by: the cell holders do not work with conventional standard cylindrical sample cells commonly used in the industry. Furthermore, such designs are not capable of controlling the temperature within the temperature range required by the relevant regulatory regulations.
Other known techniques for implementing peltier-controlled samples in polarimeters may also include the use of a combination of a tilted flat-bottom plate and a single horizontal rail, for example, where the tilted flat-bottom plate is made of a thermally conductive material for transferring heat between a Thermal Electrical Conductor (TEC) and the material within the sample chamber, where the tilted flat-bottom plate is biased to force the sample chamber against the single horizontal rail, and the combination positions the sample chamber at a predetermined location such that the polarized light beam passes longitudinally through the sample chamber.
Other known techniques for implementing peltier-controlled samples in polarimeters may also include: a combination of a slanted flat bottom plate and a stopper or sidewall is used to position the sample chamber at a predetermined location such that the polarized light beam passes longitudinally through the sample chamber.
Other known techniques for implementing peltier-controlled samples in polarimeters may also include the use of a combination of parallel rails and a base plate with a dovetail connection to the base plate mounted above the sample chamber, where the base plate is not fixed relative to the beam path and has no positioning function related to the beam path.
Other techniques for achieving peltier control of a sample using such polarimeters are also known in the art, but are not set forth herein, such techniques including, for example, those set forth in the prior art provided to the patent office during the prosecution of the present application.
Disclosure of Invention
By way of example, the present invention provides a novel and unique technique for implementing peltier-controlled samples in a polarimeter.
According to some embodiments, and by way of example, the present invention may comprise or take the form of an apparatus configured to perform sample analysis on a sample contained in a sample tube, characterized by the combination of a sample tube adaptor and a sample support rail.
The sample tube adapter can be made of a conductive material and configured with a first portion to at least partially contain and contact a sample tube having a sample therein and a second portion to provide a thermal path for heat transfer to and from the sample tube and the thermal assembly for performing sample analysis.
The sample support rail may be configured to:
receiving a sample tube adapter to provide physical support for a sample tube for performing sample analysis,
orienting the sample tube adapter relative to the thermal assembly such that there is contact between a second portion of the sample tube adapter and a portion of the thermal assembly so as to provide a thermal path for heat transfer back and forth between the sample tube and the thermal assembly for performing sample analysis, and
the sample tube adapter is aligned relative to the light source such that there is registration (registration) between the sample tube and the light beam provided by the light source for performing sample analysis.
The invention may include one or more of the following features:
the first portion of the sample tube adapter may include a curved inner surface to rest on and contact a curved outer surface of a sample tube having a sample therein.
The second portion of the sample tube adapter can include a planar surface to contact a temperature control plate of the thermal assembly.
The sample tube adapter may include two end raised flange portions configured to rest on and be supported by the sample support rail.
The curved inner surface may be U-shaped, for example, to contain and enclose a sample tube.
The sample support rails may be configured to extend parallel to each other, including, for example, extending parallel to a longitudinal axis of the sample tube.
The sample tube adapter can include a curved exterior surface configured to rest on and contact a curved exterior surface of a sample tube having a sample therein. The curved outer surface may be semi-cylindrical, e.g. having substantially the shape of the longitudinal half of a cylinder.
The second portion of the sample tube adapter may include two downwardly extending blades that straddle a vertical blade extending upwardly from a temperature control plate of the thermal assembly to provide a thermal path for heat transfer back and forth between the sample tube and the thermal assembly for performing sample analysis.
The second portion of the sample tube adapter may include a downwardly extending blade having a blade surface that abuts a temperature control plate of the thermal assembly to provide a thermal path for heat transfer to and from the sample tube and the thermal assembly for performing sample analysis.
The second portion of the sample tube adapter may include two downwardly extending blades, each blade having a corresponding blade surface that abuts a corresponding temperature control plate of the thermal assembly, respectively, to provide a thermal path for heat transfer to and from the sample tube and the thermal assembly for performing sample analysis.
The apparatus may include a thermal assembly, for example, having a combination of a temperature control plate, a peltier device, and a heat sink.
The apparatus may comprise a light source for providing a light beam, for example including where the light source is a laser and the light beam is a laser beam. The light source may also comprise an incandescent lamp for providing an incandescent light beam, or a Light Emitting Diode (LED) for providing an LED light beam.
The apparatus may include a thermal assembly and a light source; and may further comprise an instrument rack configured to fixedly mount the sample support rail relative to the thermal assembly and the light source such that when the sample support rail receives the sample tube adapter, the sample support rail orients the sample tube adapter relative to the thermal assembly such that there is contact between a second portion of the sample tube adapter and a portion of the thermal assembly so as to provide a thermal path for heat transfer to and from the sample tube and the thermal assembly for performing sample analysis; and the sample support rail aligns the sample tube adapter relative to the light source such that there is registration between the sample tube and the light beam provided by the light source for performing sample analysis.
The apparatus may include a detector/analyzer configured to receive the light beam passing through the sample tube and perform sample analysis.
Drawings
The drawings include the following figures, which are not necessarily drawn to scale:
fig. 1 includes fig. 1A and 1B, where fig. 1A shows a view of a polarimeter along its longitudinal axis, and where fig. 1B shows a perspective view of the polarimeter shown in fig. 1A, according to some embodiments of the present invention.
Fig. 2 includes fig. 2A and fig. 2B, wherein fig. 2A shows a view of a polarimeter along its longitudinal axis, and wherein fig. 2B shows a perspective view of the polarimeter shown in fig. 2A, according to some embodiments of the present invention.
Fig. 3, including fig. 3A and 3B, wherein fig. 3A shows a view of a polarimeter along its longitudinal axis, and wherein fig. 3B shows a perspective view of the polarimeter shown in fig. 3A, according to some embodiments of the invention.
Fig. 4 includes fig. 4A and 4B, wherein fig. 4A shows a view of a polarimeter along its longitudinal axis, and wherein fig. 4B shows a perspective view of the polarimeter shown in fig. 4A, according to some embodiments of the present invention.
Fig. 5 includes fig. 5A and 5B, wherein fig. 5A shows a view of a polarimeter along its longitudinal axis, and wherein fig. 5B shows a perspective view of the polarimeter shown in fig. 5A, according to some embodiments of the present invention.
Fig. 6 is a diagram of the polarimeter shown in fig. 1B arranged relative to an instrument housing according to some embodiments of the present invention.
Detailed Description
1. Three key elements of the overall system
In general, the following is a technical or detailed description of implementing peltier-controlled samples in a polarimeter, according to some embodiments of the present invention. By way of example and consistent with that shown in the figures (including fig. 1-6), an overall system, apparatus or device may be configured to provide the following three key elements for sample analysis:
a. physical support of the sample tube;
b. registration between the sample tube and the beam; and
c. a thermal path for transferring heat to or from the sample tube.
The structure and function of the basic components or parts of the invention for implementing these three key elements for sample analysis are described in more detail below.
2. Component parts or portions
By way of example and consistent with that shown in fig. 1-6, and in accordance with some embodiments of the present invention, a polarimeter, generally indicated as (7, 10, 20, 30, 40), may include the following components or portions:
a. a sample support rail (1, 11, 21, 31, 41),
b. a temperature control plate (2, 12, 22, 32, 42),
c. peltier devices (3, 13, 23, 33, 43),
d. a heat sink (4, 14, 24, 34, 44),
e. sample tubes (5, 15, 25, 35, 45), and
f. sample tube adapters (6, 16, 26, 36, 46).
As an example, fig. 6 shows an overall system, apparatus or device, generally indicated as (100), having a polarimeter (7) arranged relative to a frame-like structure or instrument rack (102) for performing sample analysis, e.g., consistent with the description below.
3. Functional description of parts or details
The basic function of a component or part is described as follows:
a. the sample support rails (1, 11, 21, 31, 41) provide two of three key elements for both standard polarimeter sample tubes and sample tube adapters (6, 16, 26, 36, 46), including:
the first key element: physical support for sample tubes (5, 15, 25, 35, 45), and
the second key element is as follows: registration between sample tubes (5, 15, 25, 35, 45) and light beams (not shown).
b. A temperature control plate (2, 12, 22, 32, 42) contacts the sample tube adaptor (6, 16, 26, 36, 46) providing:
a third key element, namely a thermal path for transferring heat to or from the sample tube (5, 15, 25, 35, 45).
c. The peltier device (3, 13, 23, 33, 43) provides a means to pump heat to or from the temperature control plate (2, 12, 22, 32, 42).
d. The heat sink (4, 14, 24, 34, 44) provides a means of absorbing or dissipating heat pumped via the peltier device (3, 13, 23, 33, 43).
e. Sample tubes (5, 15, 25, 35, 45) contain the sample to be analyzed.
f. The sample tube adaptor (6, 16, 26, 36, 46) is made of a thermally conductive material and combines three key elements (see 1a, 1b and 1c above) to provide the physical and thermal environment required for sample analysis. Sample tube adapters (6, 16, 26, 36, 46) may be made in different sizes to accommodate any length, diameter, shape, or form of sample tube. The "cotton-reel" design allows the sample tube adaptor (6, 16, 26, 36, 46) to rest on the sample support rail (1, 11, 21, 31, 41) with minimal contact area, thereby limiting heat leakage to the sample support rail (1, 11, 21, 31, 41).
g. According to some embodiments of the present invention, a standard polarimeter tube may be used without thermal control.
4. Description of the construction of parts or details
The basic structure of the component or part is as follows:
a. the temperature control plate (2, 12, 22, 32, 42), the peltier device (3, 13, 23, 33, 43) and the heat sink (4, 14, 24, 34, 44) are structurally combined to form one assembly (also called "thermal assembly") and supported by the instrument rack, for example, in accordance with what is shown in fig. 1-5.
b. Sample tube adapters (6, 16, 26, 36, 46) physically rest on the sample support rails (1, 11, 21, 31, 41), e.g., in accordance with the description set forth below.
i. For the embodiments shown in fig. 1 and 2, the position of the thermal assembly can be adjusted laterally to ensure proper mating between the temperature control plate (2, 12) and the sample tube adapter (6, 16).
For the embodiments shown in fig. 3, 4, and 5, a proper fit between the temperature control plate (22, 32, 42) and the sample tube adapter (26, 36, 46) will typically require pre-positioning of the thermal assembly during product assembly.
c. The sample tube (5, 15, 25, 35, 45) physically rests on the sample tube adapter (6, 16, 26, 36, 46), e.g., in accordance with the illustrations of fig. 1-5.
d. The sample tube (5, 15, 25, 35, 45) may be combined with or designed as part of a sample tube adaptor (6, 16, 26, 36, 46) forming one specific assembly, e.g. in accordance with the illustrations of fig. 1-5.
FIGS. 1 and 2
Fig. 1 illustrates an apparatus, generally designated 7, for implementing some embodiments of the present invention. As an example, in fig. 1a sample tube adapter (6) is shown, having a U-shaped part (6a) and a part (6b) with a flat surface (6b') for contacting the temperature control plate (2). As marked in fig. 1A, the U-shaped portion (6a) has a U-shaped inner surface (6a') and a U-shaped outer surface (6a ") arranged between two raised flange portions (6 c). As marked in fig. 1B, each raised flange portion (6c) has a corresponding raised flange portion surface (6 c'). The U-shaped inner surface (6a') rests on the outer surface (5a) of the sample tube (5). The two raised flange portions (6c) rest on the sample support rail (1) and are supported by the sample support rail (1), for example, in accordance with that shown in fig. 1. The contact between the sample tube adapter (6) and the temperature control plate (2) is maintained by a proximity/friction fit.
Fig. 2 illustrates an apparatus, generally designated 10, for implementing some embodiments of the present invention. As an example, in fig. 2, the sample tube adapter (16) has a U-shaped portion (16a) and a portion (16b) with a flat surface (16b') for contacting the temperature control plate (22). The U-shaped portion (16a) has a U-shaped inner surface (16a') which rests on the cylindrical outer surface (15a) of the sample tube (15) between the two raised outer flange portions (15 b). As marked in fig. 2B, the two raised outer flange portions (15B) each have a corresponding raised outer flange portion surface (15B') that respectively rests on and is supported by the sample support rail (1), e.g., in accordance with fig. 2. Contact between the sample tube adapter (16) and the temperature control plate (12) is maintained by a proximity/friction fit.
Fig. 1 and 2 show an embodiment that can be considered as a preferred implementation, which has the following advantages:
i. the thermal assembly (see section 4 (a)) is arranged above the sample level, which provides a degree of protection against sample leakage;
the position of the thermal assembly (see 5(a)) is adjustable relative to the sample tube adaptor (6, 16) to provide the best possible thermal contact;
sample leaks accumulate at the bottom of the instrument chamber and can be easily removed;
these embodiments are easy to build and maintain; and
the "over saddle" arrangement in fig. 2 allows thermal control of tubes up to the maximum possible diameter.
By way of example, and for purposes of discussion herein, the term "U-shaped" is understood to mean having a shape substantially similar to the letter "U".
FIG. 3
Fig. 3 illustrates an apparatus, generally designated 20, for implementing some embodiments of the present invention. As an example, in fig. 3, the sample tube adapter (26) has a U-shaped portion (26a) and two blades (26b, 26c) extending downward, the two blades (26b, 26c) spanning a vertical blade (22a) on the temperature control plate (22). The vertical blades (22a) on the temperature control plate (22) are configured and dimensioned to fit within the two blades (26b, 26c) of the U-shaped portion (26 a). As labeled in fig. 3B, the U-shaped portion (26a) has a U-shaped inner surface (26a') and a U-shaped outer surface (26a ") disposed between two raised flange portions (26 c). As labeled in fig. 3B, each raised flange portion (26c) has a corresponding raised flange portion surface (26 c'). The U-shaped inner surface (26a') rests on the outer surface (25a) of the sample tube (25). The two raised flange portions (26c) rest on the sample support rail (21) and are supported by the sample support rail (21), for example, in accordance with fig. 3. Contact between the two downwardly extending blades (26b, 26c) of the sample tube adapter (26) and the vertical blade (22a) of the temperature control plate (22) allows heat transfer, and contact between them is maintained by a proximity/friction fit. The same level of sample tube adapter (26) versatility (as set forth in section 3(f) above) applies.
FIG. 4
Fig. 4 illustrates an apparatus, generally designated 30, for implementing some embodiments of the present invention. As an example, in fig. 4, the sample tube adapter (36) has a U-shaped portion (36a) connected to one blade (36b) extending downward, the blade (36b) abutting the temperature control plate (32). Contact between the sample tube adapter (36) and the temperature control plate (32) may be maintained by, for example, a spring or magnetic force. The same level of sample tube adaptor (36) versatility (as set forth in section 3(f) above) applies.
Similar to that shown in fig. 3, the embodiment of fig. 4 includes a U-shaped portion (36a), the U-shaped portion (36a) having a U-shaped inner surface (36a') and a U-shaped outer surface (36a ") disposed between two raised flange portions (36c), as labeled in fig. 4B. Each raised flange portion (36c) has a corresponding raised flange portion surface (36c'), as labeled in fig. 4B. The U-shaped inner surface (36a') rests on the outer surface (35a) of the syringe tube (35). The two raised flange portions (36c) rest on the sample support rail (31) and are supported by the sample support rail (31), for example, in accordance with fig. 4.
FIG. 5
Fig. 5 illustrates an apparatus, generally designated 40, for implementing some embodiments of the present invention. As an example, in fig. 5, the sample tube adapter (46) has a U-shaped portion (46a) connected to two blades (46b, 46c) extending downward, the two blades (46b, 46c) being placed between two temperature control plates (42). Contact between the sample tube adapter (46) and the temperature control plate (42) is maintained by a proximity/friction fit. The same level of sample tube adaptor (36) versatility (as set forth in section 3(f) above) applies.
Similar to that shown in fig. 3 and 4, the embodiment of fig. 5 includes a U-shaped portion (46a), the U-shaped portion (46a) having a U-shaped inner surface (46a') and a U-shaped outer surface (46a ") disposed between two raised flange portions (46c), as labeled in fig. 5B. Each raised flange portion (46c) has a corresponding raised flange portion surface (46c'), as labeled in fig. 5B. The U-shaped inner surface (46a') rests on the outer surface (45a) of the sample tube (45). The two raised flange portions (46c) rest on the sample support rail (41) and are supported by the sample support rail (41), for example, in accordance with fig. 5.
Note that in the embodiments shown in figures 3, 4 and 5, the thermal assembly is located below the sample support rails (1, 11, 21, 31, 41) and therefore may be more susceptible to sample contamination.
Sample support rail (1, 11, 21, 31, 41)
The sample support rails (1, 11, 21, 31, 41) shown in fig. 1-5 are configured to extend as parallel sample support rails. Furthermore, the sample support rails (1, 11, 21, 31, 41) are shaped like cylindrical rods, each extending along parallel axes. As an example, the embodiments shown herein have one or more curved surfaces of the sample tube adapter (6, 16, 26, 36, 46) physically resting on corresponding curved surfaces of the sample support rail (1, 11, 21, 31, 41) and supported by corresponding full surfaces of the sample support rail (1, 11, 21, 31, 41).
FIG. 6
Fig. 6 shows an integrated apparatus (100) having a light source (120) and a polarimeter (7) arranged relative to a frame-like structure or instrument housing (102) for performing sample analysis, e.g., consistent with the description below. In fig. 6, only the basic components of the polarimeter (7) are labeled to reduce clutter in the drawing, including, for example: a sample support rail (1), a temperature control plate (2), a Peltier device (3), a heat sink (4), a sample tube (5), a sample tube adapter (6) and a detector/analyzer (8) for performing sample analysis. See the description associated with fig. 1 for a more detailed description. In fig. 6, a frame-like structure or instrument rack (102) is coupled on the bottom to the sample support rail (1) and on the top to a thermal assembly, which may include, for example, a peltier device (3), a heat sink (4), a sample tube (5), as shown.
By way of example, and consistent with that shown in fig. 6, one or more frame members, such as elements (104, 106), may be coupled to one sample support rail (1), and one or more frame members, such as element (105), may be coupled to another sample support rail (1). To reduce clutter, only one frame member is shown coupled to another sample support rail (1). However, the scope of the invention is not intended to be limited by the frame-like structure or type, kind or structural arrangement between the instrument rack (102) and the sample support rail (1). Some embodiments are envisioned, and the scope of the present invention is intended to include: a frame-like structure or other type, kind or structural arrangement between the instrument rack (102) and the sample support rail (1) now known or developed in the future.
By way of example, and consistent with that shown in fig. 6, one or more frame members, such as elements (108, 110), may be coupled to one or more of components (2), (3), and (4) on each side of the thermal assembly. However, the scope of the invention is not intended to be limited by the type, kind or structural arrangement between the frame-like structure or the instrument rack (102) and the thermal assembly. Some embodiments are envisioned, and the scope of the present invention is intended to include: other types, kinds, or structural arrangements between the frame-like structure or instrument rack (102) and the thermal assembly, now known or to be developed in the future. For example, one or more frame members, such as elements (108, 110), may be coupled to one component, such as element (2), on each side of the thermal assembly.
As an example, and consistent with that shown in fig. 6, one or more frame members, such as element (112), may be coupled to light source (120). However, the scope of the invention is not intended to be limited to a frame-like structure or type, kind or structural arrangement between the instrument rack (102) and the light source (120). Furthermore, the light source (120) may take the form of a laser for providing laser light L to the sample tube (5), for example in accordance with what is shown in fig. 6. Further, the scope of the invention is intended to include the use of incandescent lamps or LEDs, and embodiments are contemplated in which incandescent lamps or LEDs are used. Indeed, the scope of the invention is not intended to be limited by the type or kind of light source used, and may include other types or kinds of light sources now known or later developed in the future.
As will be appreciated based on the above-described structure between the frame-like structure or instrument rack (102), the sample support rail (1), and the thermal assemblies (2), (3), and (4), in operation, a sample tube adapter (6) having a sample tube (5) may be removably disposed or placed between the sample support rail (1) and the thermal assemblies (2), (3), and (4) for performing sample analysis. When a sample tube adaptor (6) with a sample tube (5) rests on the sample support rail (1) and is physically supported by the sample support rail (1), there is registration between the sample tube (5) and the light (L) from the light source (120), and there is also a thermal path for transferring heat between the sample tube (5) and the thermal assemblies (2), (3) and (4) via the sample tube adaptor (6), e.g. in order to provide the above-mentioned three key elements for sample analysis (see the above paragraphs 1(a), (b) and (c). As will be appreciated by those skilled in the art, sample analysis may include heating the sample contained in the sample tube (5) using thermal assemblies (2), (3), and (4), and/or interrogating the sample contained in the sample tube (5) using a light source (120). The scope of the invention is not intended to be limited by the type or kind of sample analysis performed. Embodiments are contemplated, and the scope of the invention is intended to include: many different types or kinds of sample analysis techniques are currently known or will be developed in the future.
As will be appreciated by those skilled in the art, the overall apparatus (100) shown in fig. 6 may also include other types or kinds of components that are not shown or described because, for example, they do not form part of the potential inventions disclosed herein. By way of example, such other types or kinds of components may include one or more controllers for thermal components or light sources, etc.
Detectors/analyzers are known in the art, and the scope of the present invention is not intended to be limited to any particular type or kind of detector/analyzer now known or later developed in the future.
Scope of the invention
It should be understood that any of the features, characteristics, alternatives, or modifications described herein with respect to a particular embodiment may also be applied, used, or incorporated with any other embodiment described herein, unless otherwise indicated herein. In addition, the drawings herein are not drawn to scale.
Although the present invention is described with respect to a centrifugal pump, the scope of the present invention is intended to include the use of other types or kinds of pumps either currently known or later developed in the future.
While the invention has been described and illustrated with respect to exemplary embodiments thereof, the foregoing and various other additions and omissions may be made in or to the present invention without departing from the spirit and scope of the present invention.
Claims (15)
1. An apparatus configured to perform sample analysis on a sample, the sample being contained in a sample tube, the apparatus comprising:
a combination of a sample tube adapter and a plurality of sample support rails;
the sample tube adapter is made of a conductive material and is configured with a first portion to at least partially contain and contact a sample tube having a sample therein and a second portion to provide a thermal path for heat transfer to and from the sample tube and a thermal assembly for performing sample analysis; and is
Wherein the plurality of sample support rails are configured to:
receiving the sample tube adapter to provide physical support for the sample tube for performing the sample analysis,
orienting the sample tube adapter relative to the thermal assembly such that there is contact between the second portion of the sample tube adapter and a portion of the thermal assembly so as to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis, and
aligning the sample tube adapter relative to a light source such that there is registration between the sample tube and a light beam provided by the light source for performing the sample analysis,
wherein the thermal assembly is configured above a horizontal position of the sample, and the position of the thermal assembly is laterally adjustable relative to the sample tube adapter.
2. The apparatus of claim 1, wherein the first portion of the sample tube adapter has a curved inner surface to rest on and contact a curved outer surface of the sample tube having the sample therein.
3. The apparatus of claim 1, wherein the second portion of the sample tube adapter has a flat surface to contact a temperature control plate of the thermal assembly.
4. The apparatus of claim 1, wherein the sample tube adapter has two end raised flange portions configured to rest on and be supported by the plurality of sample support rails.
5. The device of claim 2, wherein the curved inner surface is U-shaped.
6. The apparatus of claim 1, wherein the plurality of sample support rails are configured to extend parallel to one another.
7. The apparatus of claim 1, wherein the sample tube adapter has a curved exterior surface configured to rest on and contact a curved exterior surface of the sample tube having the sample therein.
8. The apparatus of claim 1, wherein the apparatus comprises the thermal assembly having a combination of a temperature control plate, a peltier device, and a heat sink.
9. The apparatus of claim 1, wherein the apparatus comprises the light source for providing the light beam.
10. The device of claim 1, wherein the beam is a laser beam, or an incandescent beam, or an LED beam.
11. The device of claim 1, wherein the device comprises the thermal assembly and the light source; and further comprising an instrument rack configured to mount the plurality of sample support rails relative to the thermal assembly and the light source such that when the plurality of sample support rails receive the sample tube adapter, the plurality of sample support rails orient the sample tube adapter relative to the thermal assembly such that there is contact between the second portion of the sample tube adapter and the portion of the thermal assembly so as to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis; and the plurality of sample support rails align the sample tube adapter relative to the light source such that there is registration between the sample tube and a light beam provided by the light source for performing the sample analysis.
12. The apparatus of claim 1, wherein the apparatus comprises a detector/analyzer configured to receive the light beam passing through the sample tube and perform the sample analysis.
13. An apparatus configured to perform sample analysis on a sample, the sample being contained in a sample tube, the apparatus comprising:
a combination of a sample tube adapter and a plurality of sample support rails;
the sample tube adapter is made of a conductive material and is configured with a first portion to at least partially contain and contact a sample tube having a sample therein and a second portion to provide a thermal path for heat transfer to and from the sample tube and a thermal assembly for performing sample analysis; and is
Wherein the plurality of sample support rails are configured to:
receiving the sample tube adapter to provide physical support for the sample tube for performing the sample analysis,
orienting the sample tube adapter relative to the thermal assembly such that there is contact between the second portion of the sample tube adapter and a portion of the thermal assembly so as to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis, and
aligning the sample tube adapter relative to a light source such that there is registration between the sample tube and a light beam provided by the light source for performing the sample analysis,
wherein the second portion of the sample tube adapter comprises two downwardly extending blades that straddle a vertical blade extending upwardly from a temperature control plate of the thermal assembly to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis.
14. An apparatus configured to perform sample analysis on a sample, the sample being contained in a sample tube, the apparatus comprising:
a combination of a sample tube adapter and a plurality of sample support rails;
the sample tube adapter is made of a conductive material and is configured with a first portion to at least partially contain and contact a sample tube having a sample therein and a second portion to provide a thermal path for heat transfer to and from the sample tube and a thermal assembly for performing sample analysis; and is
Wherein the plurality of sample support rails are configured to:
receiving the sample tube adapter to provide physical support for the sample tube for performing the sample analysis,
orienting the sample tube adapter relative to the thermal assembly such that there is contact between the second portion of the sample tube adapter and a portion of the thermal assembly so as to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis, and
aligning the sample tube adapter relative to a light source such that there is registration between the sample tube and a light beam provided by the light source for performing the sample analysis,
wherein the second portion of the sample tube adapter comprises a downwardly extending blade having a blade surface abutting a temperature control plate of the thermal assembly to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis.
15. An apparatus configured to perform sample analysis on a sample, the sample being contained in a sample tube, the apparatus comprising:
a combination of a sample tube adapter and a plurality of sample support rails;
the sample tube adapter is made of a conductive material and is configured with a first portion to at least partially contain and contact a sample tube having a sample therein and a second portion to provide a thermal path for heat transfer to and from the sample tube and a thermal assembly for performing sample analysis; and is
Wherein the plurality of sample support rails are configured to:
receiving the sample tube adapter to provide physical support for the sample tube for performing the sample analysis,
orienting the sample tube adapter relative to the thermal assembly such that there is contact between the second portion of the sample tube adapter and a portion of the thermal assembly so as to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis, and
aligning the sample tube adapter relative to a light source such that there is registration between the sample tube and a light beam provided by the light source for performing the sample analysis,
wherein the second portion of the sample tube adapter comprises two downwardly extending blades, each blade having a corresponding blade surface that respectively abuts a corresponding temperature control plate of the thermal assembly to provide the thermal path for heat transfer to and from the sample tube and the thermal assembly for performing the sample analysis.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562117296P | 2015-02-17 | 2015-02-17 | |
| US62/117,296 | 2015-02-17 | ||
| PCT/US2016/018228 WO2016133991A1 (en) | 2015-02-17 | 2016-02-17 | Technique for temperature controlling polarimeter sample cells |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107430061A CN107430061A (en) | 2017-12-01 |
| CN107430061B true CN107430061B (en) | 2020-11-06 |
Family
ID=56689153
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201680021520.8A Active CN107430061B (en) | 2015-02-17 | 2016-02-17 | Techniques for temperature control of polarimeter sample chambers |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9562845B2 (en) |
| EP (1) | EP3259575B1 (en) |
| CN (1) | CN107430061B (en) |
| WO (1) | WO2016133991A1 (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN85104622A (en) * | 1985-06-15 | 1986-12-10 | 株式会社堀场制作所 | Stopple coupon |
| US5146283A (en) * | 1991-03-26 | 1992-09-08 | Andros Incorporated | Spectrophotometer sample cell |
| JPH1194732A (en) * | 1997-09-19 | 1999-04-09 | Matsushita Electric Ind Co Ltd | Sample cell and polarimeter, urea-inspecting apparatus using the same |
| CN1215162A (en) * | 1997-09-09 | 1999-04-28 | 松下电器产业株式会社 | Sampling box, polaristrobometer and rotation angle measuring method |
| CN1340382A (en) * | 1999-11-18 | 2002-03-20 | 实验仪器科技有限公司 | Device for tank for cooling contained liquid sample to be analyzed, especially for cooling contained petroleum product |
| CN101424617A (en) * | 2007-12-18 | 2009-05-06 | 宁波大学 | Polarimeter test-tube constant temperature jacket apparatus convenient for use |
| JP2012255663A (en) * | 2011-06-07 | 2012-12-27 | Jasco Corp | Optical analyzer with power-saving mode function |
Family Cites Families (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2221184A1 (en) | 1972-04-29 | 1973-11-08 | Bodenseewerk Geraetetech | TUBE CUVETTE FOR FLAMELESS ATOMIC ABSORPTION |
| US4066365A (en) | 1976-05-28 | 1978-01-03 | The Perkin-Elmer Corporation | Temperature control apparatus |
| US4180739A (en) | 1977-12-23 | 1979-12-25 | Varian Associates, Inc. | Thermostatable flow cell for fluorescence measurements |
| DE3208744A1 (en) | 1982-03-11 | 1983-09-22 | Philips Patentverwaltung Gmbh, 2000 Hamburg | TUBE COVETTE FOR THE ATOMIC ABSORPTION SPECTROMETRY |
| US4699514A (en) | 1983-02-25 | 1987-10-13 | Ulrich Schmidt | Multibeam measuring device |
| DE3573018D1 (en) | 1984-09-25 | 1989-10-19 | Richard Distl | Measurement arrangement for analysing electromagnetic radiation |
| DE3516529A1 (en) | 1985-05-08 | 1986-11-27 | Gesellschaft für Strahlen- und Umweltforschung mbH, München, 8042 Neuherberg | Unit for the turbidimetric measurement and control of microorganism cultures |
| IT1233398B (en) | 1989-03-24 | 1992-03-27 | Sotelco Di Zaglio F & C S N C | OPTICAL METER SUITABLE FOR DETERMINING THE PERCENTAGE OF FAT IN MILK. |
| US5436457A (en) | 1993-06-10 | 1995-07-25 | Horiba, Ltd. | Infrared gas analyzer |
| JPH07146295A (en) | 1993-11-19 | 1995-06-06 | Kyoto Daiichi Kagaku:Kk | Immunoanalysis method and device by raman spectral measurement |
| US5509733A (en) * | 1993-12-21 | 1996-04-23 | Ta Instruments, Inc. | Infrared heated differential thermal analyzer |
| DE19545018A1 (en) * | 1995-12-02 | 1997-06-05 | Marcel Kastler | Polarimeter for observation of angle of rotation in reactions |
| JP3180701B2 (en) | 1997-02-07 | 2001-06-25 | 日本電気株式会社 | Semiconductor laser device |
| EP1260267A3 (en) | 1998-08-13 | 2005-09-21 | Symyx Technologies | Method for processing reaction mixtures in parallel |
| US7108970B2 (en) | 2000-01-07 | 2006-09-19 | Transform Pharmaceuticals, Inc. | Rapid identification of conditions, compounds, or compositions that inhibit, prevent, induce, modify, or reverse transitions of physical state |
| US20010039014A1 (en) | 2000-01-11 | 2001-11-08 | Maxygen, Inc. | Integrated systems and methods for diversity generation and screening |
| DE10016023C2 (en) | 2000-03-31 | 2003-01-30 | Glukomeditech Ag | Flow measuring cell and its use |
| IL153860A0 (en) | 2000-07-10 | 2003-07-31 | N D T Instr Ltd | Method and apparatus for determining the composition of fluids |
| JP4002720B2 (en) | 2000-11-22 | 2007-11-07 | 独立行政法人科学技術振興機構 | Single cell long-term culture microscope |
| JP2003110180A (en) | 2001-07-25 | 2003-04-11 | Furukawa Electric Co Ltd:The | Semiconductor laser module and method and apparatus for measuring light |
| JP4149701B2 (en) | 2001-12-10 | 2008-09-17 | 岡野電線株式会社 | Semiconductor laser module |
| GB0205347D0 (en) | 2002-03-07 | 2002-04-24 | Svanborg Catharina | Biologically active complex |
| US6717665B2 (en) * | 2002-03-13 | 2004-04-06 | Rudolph Research Analytical | Polarimeter |
| CN1768258B (en) * | 2003-03-28 | 2010-10-13 | 西铁城控股株式会社 | Optical rotation measuring instrument |
| JP2005140585A (en) | 2003-11-05 | 2005-06-02 | Fujitsu Ltd | Polarization state measuring device |
| JP2006072171A (en) | 2004-09-06 | 2006-03-16 | Hitachi Ltd | Optical module |
| CA2584824A1 (en) | 2004-10-22 | 2006-05-04 | Vanderbilt University | On-chip polarimetry for high-throughput screening of nanoliter and smaller sample volumes |
| US7075652B1 (en) | 2004-11-12 | 2006-07-11 | Ibet, Inc. | Apparatus and method for measuring temperature dependent properties of liquid |
| CN2816798Y (en) * | 2005-03-31 | 2006-09-13 | 洪承栋 | Novel disc polarimeter |
| US7468788B2 (en) | 2005-06-21 | 2008-12-23 | Stheno Corporation | Systems and methods for chiral detection and analysis |
| US8663575B2 (en) | 2005-08-19 | 2014-03-04 | Canadian Blood Services | Sample holder for dynamic light scattering |
| DE102006028516B3 (en) | 2006-05-31 | 2007-10-04 | Hanno Wachernig | Cuvette for measuring particles of sample moving in cuvette comprises bearing with partial bearings for receiving forces running at angle to longitudinal axis through ends of cuvette |
| CN101424616B (en) | 2007-12-18 | 2010-08-11 | 宁波大学 | Polarimeter test-tube constant temperature jacket apparatus convenient for installation and removal |
| CN101561386A (en) * | 2009-05-22 | 2009-10-21 | 吴江金达精工机械有限公司 | Temperature-controlled polarimeter |
| DE102009033979A1 (en) | 2009-07-16 | 2011-01-20 | Schmidt & Haensch Gmbh & Co. | Device for focusing wavelength adjustment of emitted optical radiation |
| DE102011005807B4 (en) | 2011-03-18 | 2017-02-16 | Anton Paar Gmbh | Cuvette and optical measuring device |
| CN202583058U (en) * | 2012-05-25 | 2012-12-05 | 石家庄学院 | Improved constant-temperature optical rotation testing instrument |
| US9194857B2 (en) * | 2012-06-04 | 2015-11-24 | Serveron Corporation | Sealing apparatus for electrical apparatus oil sampler and conditioner for solid state sensors |
-
2016
- 2016-02-17 WO PCT/US2016/018228 patent/WO2016133991A1/en active Application Filing
- 2016-02-17 US US15/045,712 patent/US9562845B2/en active Active
- 2016-02-17 CN CN201680021520.8A patent/CN107430061B/en active Active
- 2016-02-17 EP EP16752960.1A patent/EP3259575B1/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN85104622A (en) * | 1985-06-15 | 1986-12-10 | 株式会社堀场制作所 | Stopple coupon |
| US5146283A (en) * | 1991-03-26 | 1992-09-08 | Andros Incorporated | Spectrophotometer sample cell |
| CN1215162A (en) * | 1997-09-09 | 1999-04-28 | 松下电器产业株式会社 | Sampling box, polaristrobometer and rotation angle measuring method |
| JPH1194732A (en) * | 1997-09-19 | 1999-04-09 | Matsushita Electric Ind Co Ltd | Sample cell and polarimeter, urea-inspecting apparatus using the same |
| CN1340382A (en) * | 1999-11-18 | 2002-03-20 | 实验仪器科技有限公司 | Device for tank for cooling contained liquid sample to be analyzed, especially for cooling contained petroleum product |
| CN101424617A (en) * | 2007-12-18 | 2009-05-06 | 宁波大学 | Polarimeter test-tube constant temperature jacket apparatus convenient for use |
| JP2012255663A (en) * | 2011-06-07 | 2012-12-27 | Jasco Corp | Optical analyzer with power-saving mode function |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107430061A (en) | 2017-12-01 |
| US20160245740A1 (en) | 2016-08-25 |
| US9562845B2 (en) | 2017-02-07 |
| EP3259575B1 (en) | 2023-08-02 |
| EP3259575A1 (en) | 2017-12-27 |
| EP3259575A4 (en) | 2018-08-01 |
| WO2016133991A1 (en) | 2016-08-25 |
| EP3259575C0 (en) | 2023-08-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP1915606B1 (en) | Sample holder for dynamic light scattering | |
| US8062592B2 (en) | Electrophoresis apparatus using capillary array and a sample tray | |
| KR101750118B1 (en) | Optical measurement device | |
| US6717665B2 (en) | Polarimeter | |
| JP2012093350A (en) | Analyzer | |
| JP2019075434A (en) | Prober device and wafer chuck | |
| CN107430061B (en) | Techniques for temperature control of polarimeter sample chambers | |
| US9683929B2 (en) | Optical measuring system for measuring optical polarization properties of a sample | |
| CN108120683B (en) | Adjustable light source device for biochemical analyzer | |
| JP2019090672A (en) | Cell for x-ray analysis, and x-ray analysis device | |
| US8641882B2 (en) | Capillary column cartridge | |
| EP1155295B1 (en) | High temperature differential refractometry apparatus | |
| US11351553B2 (en) | Heating mechanism for biochemical reaction device | |
| US20220221333A1 (en) | Photometer optical coupling for a dual incubation ring using a periscope design | |
| CN210690393U (en) | Front light-splitting silicon photocell biochemical analyzer | |
| CN111386154A (en) | Vial holder for cooling and temperature adjustment and sample temperature adjusting device using the same | |
| US11733156B2 (en) | Semiconductor package for free-space coupling of radiation and method | |
| CN108226043B (en) | Measuring unit and measuring system for water quality monitoring | |
| Trivellin et al. | Analysis and design of SARS-CoV-2 disinfection chambers based on UVC LEDs | |
| JP2019124562A (en) | Measuring device | |
| JP2010170869A (en) | Photomultiplier tube retention device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |